TLP559
TOSHIBA Photocoupler GaAℓAs Ired & Photo IC
TLP559
Digital Logic Ground Isolation Line Receiver Microprocessor System Interfaces Switching Power Supply Feedback Control Transistor Inverter
Unit in mm
The TOSHIBA TLP559 consists of a GaAℓAs high−output light emitting diode and a high speed detector of one chip photo diode−transistor. This unit is 8−lead DIP package. TLP559 has no internal base connection, and a faraday shield integrated on the photodetector chip provides an effective common mode noise transient immunity. So this is suitable for application in noisy environmental condition.
• • • •
Isolation voltage: 2500Vrms (min.) Switching speed: tpHL = 0.3μs (typ.) tpLH = 0.5μs (typ.) (RL = 1.9kΩ) TTL compatible UL recognized: UL1577, file No.E67349
TOSHIBA Weight: 0.54g
11−10C4
Pin Configuration (top view)
1 2 3 4 Shield 8 7 6 5 1 : N.C. 2 : Anode 3 : Cathode 4 : N.C. 5 : Emitter 6 : Collector 7 : N.C. 8 : VCC
Schematic
ICC IF 2 VF 3 IO 6 VO 8 VCC
Shield
5
GND
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TLP559
Absolute Maximum Ratings (Ta = 25°C)
Characteristic Forward current Pulse forward current LED Peak transient forward current Reverse voltage Diode power dissipation Output current Detector Peak output current Output voltage Supply voltage Output power dissipation Operating temperature range Storage temperature range Lead solder temperature (10s) Isolation voltage (AC, 1 min., R.H. ≤ 60%) (Note 7) (Note 6) (Note 5) (Note 4) (Note 1) (Note 2) (Note 3) Symbol IF IFP IFPT VR PD IO IOP VO VCC PO Topr Tstg Tsol BVS Rating 25 50 1 5 45 8 16 −0.5~15 −0.5~15 100 −55~100 −55~125 260 2500 Unit mA mA A V mW mA mA V V mW °C °C °C Vrms
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). (Note 1) (Note 2) (Note 3) (Note 4) (Note 5) (Note 6) (Note 7) Derate 0.8mA above 70°C. 50% duty cycle,1ms pulse width. Derate 1.6mA / °C above 70°C. Pulse width ≤ 1μs, 300pps. Derate 0.9mW / °C above 70°C. Derate 2mW / °C above 70°C. Soldering portion of lead: up to 2mm from body of the devise. Device considered a two-terminal device: Pins 1, 2, 3 and 4 shorted together and pins 5, 6, 7 and 8 shorted together.
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Electrical Characteristics (Ta = 25°C)
Characteristic Forward voltage LED Forward voltage temperature coefficient Reverse current Capacitance between terminal Symbol VF ΔVF / ΔTa IR CT IOH (1) Detector High level output current IOH (2) IOH High level supply voltage Current transfer ratio Coupled Low level output voltage Resistance (input−output) Capacotance (input−output) ICCH IO / IF VOL RS CS IF = 16mA IF = 16mA V R = 5V VF = 0, f = 1MHz IF = 0mA, VCC = VO = 5.5V IF = 0mA, VCC = VO = 15V IF = 0mA, VCC = 15V VO = 15V, Ta = 70°C IF = 0mA, VCC = 15V IF = 16mA, VCC = 4.5V VO = 0.4V IF = 16mA, VCC = 4.5V IO = 2.4mA R.H. ≤ 60%, VS = 500VDC VS = 0, f = 1MHz (Note 7) (Note 7) Test Condition Min. ― ― ― ― ― ― ― ― 20 ― 5×10 ―
10
Typ. 1.65 −2 ― 45 3 ― ― 0.01 40 ― 10
14
Max. 1.85 ― 10 ― 500 5 50 1 ― 0.4 ― ―
Unit V mV / °C μA pF nA μA μA % V Ω pF
0.8
Switching Characteristics (Ta = 25°C、VCC = 5V)
Characteristic Propagation delay time (H→ L) Propagation delay time (L→ H) Common mode transient immunity at logic high output Common mode transient immunity at logic high output Symbol tpHL 1 tpLH CMH 2 CML IF = 0mA, VCM = 400Vp−p RL = 4.1kΩ IF =16mA, VCM = 400Vp−p RL = 4.1kΩ IF = 16mA, RL = 1.9kΩ ― 2000 0.3 10000 0.8 ― ― μs V / μs V / μs Test Cir− cuit Test Condition Min. ― Typ. 0.2 Max. 0.8 Unit μs
(Note 8) (Note 8)
−2000 −10000
(Note 8) CML is the maximum rate of fall of the common mode voltage that can be sustained with the output voltage in the logic low state (VO < 0.8V). CMH is the maximum rate of rise of the common mode voltage that can be sustained with the output voltage in the logic high state (VO < 2.0V). (Note 9) Maximum electrostatic discharge voltage for any pins: 100V (C = 200pF, R = 0)
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TLP559
Test Circuit 1: Switching Time Test Circuit
Pulse input PW=100μs Duty ratio=1 / 10 IF monitor
51Ω
IF 1 2 3 4 8 7 6 5 RL
VCC = 5V
IF 0 VO 5V 1.5V tpHL tpLH 1.5V VOL
VO Output monitor
Test Circuit 2: Common Mode Noise Immunity Test Circuit
1 2 3 4 8 7 6 5 VCM Pulse generator ZO=50Ω
320(V) 320(V) CMH = , CML = t r (μs) t f (μs)
VCC=5V VCM RL VO Output monitor VO (IF=0mA) VO (IF=16mA) tr
90% 10% tf
400V
IF
0V
5V 2V 0.8V VOL
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TLP559
IF – VF
100 50 30 Ta = 25°C −2.6
ΔVF / ΔTa – IF
Forward voltage temperature coefficient ΔVF / ΔTa (mV / ℃)
−2.4
(mA)
10 5 3 1 0.5 0.3 0.1 0.05 0.03 0.01 1.0
−2.2
Forward current IF
−2.0
−1.8
−1.6
1.2
1.4
1.6
1.8
2.0
−1.4 0.1
0.3
0.5
1
3
5
10
30
Forward voltage VF
(V)
Forward current IF
(mA)
IOH (1) – Ta
300 10 5 100 3
lO – IF
VCC = 5V VO = 0.4V Ta = 25°C
High level output current IOH (μA)
50 30
(mA)
1 0.5 0.3
10 5 3
Output current
IO
0.1 0.05 0.03
1 0.6 0 40 80 120 160 0.01 0.1 0.3 0.5 1 3 5 10 30 50 100 300
Ambient temperature
Ta (℃)
Forward current IF
(mA)
IO / IF – IF
100 50 30 VCC = 5V VO = 0.4V 1.0 1.2
IO / IF – Ta
Normalized IO / IF
Current transfer ratio IO / IF (%)
Ta = –25°C
0.8
10
25°C
100°C
0.6 Normalized To : IF = 16mA VCC = 4.5V 0.2 VO = 0.4V Ta = 25°C
5 3
0.4
1
0.3
0.5
1
3
5
10
30
50
0 −40
−20
0
20
40
60
80
100
Forward current IF
(mA)
Ambient temperature
Ta (℃)
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TLP559
IO – VO
10 30mA VCC = 5V Ta = 25°C 25mA 5
VO – IF IF
4
VCC =5V
(mA)
(V)
8 20mA 6 15mA
RL VO
Output voltage VO
Output current
IO
3 Ta=25℃ 2 RL=2kΩ 3.9kΩ 1 10kΩ
4
10mA
2
IF=5mA
0
0
1
2
3
4
5
6
7
0 0
4
8
12
16
20
24
Output voltage VO
(V)
Forward current IF
(mA)
tpHL, tpLH – RL
5 3 IF = 16mA VCC = 5V Ta = 25°C
tpLH
Propagation delay time tpLH, tpHL (μs)
1
0.5 0.3
tpHL
0.1
1
3
5
10
30
50
100
Load resistance RL (kΩ)
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RESTRICTIONS ON PRODUCT USE
• The information contained herein is subject to change without notice.
20070701-EN
• TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc. • The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer’s own risk. • The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. • GaAs(Gallium Arsenide) is used in this product. The dust or vapor is harmful to the human body. Do not break, cut, crush or dissolve chemically. • Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations.
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