FC40SA50FKP
Vishay Semiconductors
Power MOSFET, 40 A
FEATURES
• Low gate charge Qg results in simple drive requirement • Improved gate, avalanche and dynamic dV/dt ruggedness • Fully characterized capacitance and avalanche voltage and current
SOT-227
• Low RDS(on) • Fully insulated package • UL pending
PRODUCT SUMMARY
VDSS RDS(on) (typical) ID Type Package 500 V 0.084 Ω 40 A Modules - MOSFET SOT-227
• Compliant to RoHS directive 2002/95/EC • Designed and qualified for industrial level
APPLICATIONS
• Switch mode power supply (SMPS) • Uninterruptible power supply • High speed power switching • Hard switched and high frequency circuits
ABSOLUTE MAXIMUM RATINGS
PARAMETER Continuous drain current, VGS at 10 V Pulsed drain current Power dissipation Linear derating factor Gate to source voltage Peak diode recovery dV/dt Operating junction and storage temperature range VGS dV/dt (2) TJ, TStg SYMBOL ID IDM (1) PD TC = 25 °C TEST CONDITIONS TC = 25 °C TC = 100 °C MAX. 40 26 160 430 3.45 ± 30 9.0 - 55 to + 150 W W/°C V V/ns °C A UNITS
Notes (1) Repetitive rating; pulse width limited by maximum junction temperature (see fig. 11) (2) I SD ≤ 40 A, dI/dt ≤ 150 A/μs, VDD ≤ V(BR)DSS, TJ ≤ 150 °C
AVALANCHE CHARACTERISTICS
PARAMETER Single pulse avalanche energy Avalanche current Repetitive avalanche energy SYMBOL EAS (1) IAR
(2)
TYP. -
MAX. 1240 40 43
UNITS mJ A mJ
EAR (2)
Notes (1) Starting T = 25 °C, L = 1.55 mH, R = 25 Ω, I J g AS = 40 A, dV/dt = 5.5 V/ns (see fig. 12a) (2) Repetitive rating; pulse width limited by maximum junction temperature (see fig. 11)
Document Number: 94542 Revision: 12-May-10
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FC40SA50FKP
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THERMAL RESISTANCE
PARAMETER Junction to case Case to sink, flat, greased surface SYMBOL RthJC RthCS TYP. 0.05 MAX. 0.29 UNITS °C/W
Power MOSFET, 40 A
STATIC CHARACTERISTICS (TJ = 25 °C unless otherwise noted)
PARAMETER Drain to source breakdown voltage SYMBOL V(BR)DSS RDS(on)
(1)
TEST CONDITIONS VGS = 0 V, ID = 250 μA Reference to 25 °C, ID = 1 mA VGS = 10 V, ID = 24 A VDS = VGS, ID = 250 μA VDS = 500 V, VGS = 0 V VDS = 400 V, VGS = 0 V, TJ = 125 °C VGS = 30 V VGS = - 30 V
MIN. 500 3.0 -
TYP. 0.60 0.084 -
MAX. 0.10 5.0 50 250 250 - 250
UNITS V V/°C Ω V μA
Breakdown voltage temperature coefficient ΔV(BR)DSS/ΔTJ Static drain to source on-resistance Gate threshold voltage Drain to source leakage current Gate to source forward leakage Gate to source reverse leakage Note (1) Pulse width ≤ 300 μs; duty cycle ≤ 2 % VGS(th) IDSS IGSS
nA
DYNAMIC CHARACTERISTICS (TJ = 25 °C unless otherwise noted)
PARAMETER Forward transconductance Total gate charge Gate to source charge Gate to drain ("Miller") charge Turn-on delay time Rise time Turn-off delay time Fall time Input capacitance Output capacitance Reverse transfer capacitance Output capacitance Effective output capacitance
(1)
SYMBOL gfs Qg Qgd tr
(1)
TEST CONDITIONS VDS = 50 V, ID = 28 A ID = 40 A VDS = 400 V VGS = 10 V; see fig. 6 and 13 VDD = 250 V ID = 40 A Rg = 1.0 Ω VGS = 10 V, see fig. 10 VGS = 0 V VDS = 25 V f = 1.0 MHz, see fig. 5 VGS = 0 V, VDS = 1.0 V, f = 1.0 MHz VGS = 0 V, VDS = 480 V, f = 1.0 MHz VGS = 0 V, VDS = 0 V to 480 V
MIN. 23 -
TYP. 25 140 55 74 8310 960 120 10 170 240 440
MAX. 270 84 130 -
UNITS S
Qgs (1)
(1)
nC
td(on) (1)
(1)
td(off) (1) tf (1) Ciss Coss Crss Coss Coss eff. (2)
ns
pF
Notes Pulse width ≤ 300 μs; duty cycle ≤ 2 % (2) C oss eff. is a fixed capacitance that gives the same charging time as Coss while VDS is rising from 0 to 80 % VDSS
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Document Number: 94542 Revision: 12-May-10
FC40SA50FKP
Power MOSFET, 40 A
Vishay Semiconductors
DIODE CHARACTERISTICS
PARAMETER Continuous source current (body diode) Pulsed source current (body diode) Diode forward voltage Reverse recovery time Reverse recovery charge Reverse recovery current Forward turn-on time SYMBOL IS ISM (1) VSD (2) trr
(2)
TEST CONDITIONS
D
MIN. S
TYP. 620 14 38
MAX. 40
UNITS
MOSFET symbol showing the integral reverse p-n junction diode TJ = 25 °C, IS = 40 A, VGS = 0 V
A
G
160 1 940 21 V ns μC A
-
Qrr IRRM ton
TJ = 25 °C, IF = 47 A; dI/dt = 100 A/μs TJ = 25 °C
Intrinsic turn-on time is negligible (turn-on is dominated by LS + LD)
Notes (1) Repetitive rating; pulse width limited by maximum junction temperature (see fig. 11) (2) Pulse width ≤ 300 μs; duty cycle ≤ 2 %
1000
VGS
15 10 8.0 7.0 6.0 5.5 B O TTO M 5.0 TO P
1000
ID, Drain-to-Source Current (A)
ID, Drain-to-Source Current (A)
100
100
TJ =150°C
10
10
1
5V
TJ =25°C 1 V DS =20V 20μs PULSE WIDTH 0.1
0.1
20 μs PULSE WIDTH TJ=25°C
0.01 0.1 1 10 100
VDS, Drain-to-Source Voltage (V) Fig. 1 - Typical Output Characteristics
4
5
6
7
8
9
10
11
12
V GS , Gate-to-Source Voltage (V)
Fig. 3 - Typical Transfer Characteristics
1000
VG S
3.5
15 10 8.0 7.0 6.0 5.5 5.0 B O TTO M 4.5 TO P
100
RDS(on), Drain-to-Source On Resistance (Normalized)
3.0
ID=24A
ID, Drain-to-Source Current (A)
2.5
2.0
10
1.5
1
4.5 V 20 μs PULSE WIDTH T 150°C
1.0
V GS =10V
0.5
0.1 0.1 1
0.0
10
100
-60 -40 -20
0
20
40
60
80 100 120 140 160
VDS, Drain-to-Source Voltage (V)
TJ , Junction Temperature (°C)
Fig. 2 - Typical Output Characteristics
Fig. 4 - Normalized On-Resistance vs. Temperature
Document Number: 94542 Revision: 12-May-10
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FC40SA50FKP
Vishay Semiconductors
100000
VGS Ciss C rss Coss = 0V, f = 1 MHZ = Cgs + C gd, Cds SHORTED =C gd = Cds + C gd
Power MOSFET, 40 A
1000 OPERATION IN THIS AREA LIMITED BY RDS(on) ID, Drain Current (A)
10000
C, Capacitance(pF)
Ciss
100
1000
100us 10 TC = 25°C TJ = 150°C Single Pulse 1 1ms 10ms
Coss
100
Crss
10 1 10 100 1000
10
100 V DS, Drain-to-Source Voltage (V)
1000
VDS, Drain-to-Source Voltage (V)
Fig. 5 - Typical Capacitance vs. Drain to Source Voltage
20 ID =40A
Fig. 8 - Maximum Safe Operating Area
40
VGS, Gate-to-Source Voltage (V)
15
10
ID, Drain Current (A)
0 100 200 300
30
20
5
10
0
0 25 50 75 100 125 150
QG, Total Gate Charge (nC)
TC, Case Temperature (°C)
Fig. 6 - Typical Gate Charge vs. Gate to Source Voltage
1000
Fig. 9 - Maximum Drain Current vs. Case Temperature
ISD, Reverse Drain Current (A)
100 TJ=150°C 10 TJ=25°C 1
VDS VGS RG
RD
D.U.T. + - VDD
10 V Pulse width ≤ 1 µs Duty factor ≤ 0.1 %
VGS=0
0.1 0.2 0.7 1.2 1.7 VSD, Source-to-Drain Voltage (V)
Fig. 7 - Typical Source Drain Diode Forward Voltage
Fig. 10a - Switching Time Test Circuit
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Document Number: 94542 Revision: 12-May-10
FC40SA50FKP
Power MOSFET, 40 A
Vishay Semiconductors
VDS 90 %
10 % VGS td(on) tr td(off) tf
Fig. 10b - Switching Time Waveforms
1.000
Thermal Response ( ZthJC
0.100
D = 0.50 0.30 0.10
R1 R1
J
R2 R2
R3 R3
C
J
0.010
0.05 0.02 0.01 SINGLE PULSE (THERMAL RESPONSE)
Ri (°C/W) 0.161 0.210 0.147
τi (sec) 0.000759 0.017991 0.06094
1
1
2
2
3
3
Ci= i Ri Ci i Ri
Notes: 1. Duty factor D = t1/t2 2. Peak TJ=PDM x ZthJC + TC 0.01 0.1 1
0.001 0.00001
0.0001
0.001
t1, Rectangular Pulse Duration (s)
Fig. 11 - Maximum Effective Transient Thermal Impedance, Junction to Case
3000 EAS, Single Pulse Avalanche Energy (mJ)
TOP
2500
BOTTOM
ID ... 18A 26A 40A
15 V
2000 1500
VDS
1000
L
Driver
RG
500
20 V
D.U.T
IAS tp
25 50 75 100 125 150 S tarting TJ, Junction Tem perature (°C)
+ - VDD
A
0
0.01 Ω
Fig. 12a - Maximum Avalanche Energy vs. Drain Current
Fig. 12b - Unclamped Inductive Test Circuit
Document Number: 94542 Revision: 12-May-10
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FC40SA50FKP
Vishay Semiconductors
Power MOSFET, 40 A
V(BR)DSS tp RL
+
VGS
D.U .T.
-
VDS
1 mA IAS
ID
Fig. 12c - Unclamped Inductive Waveforms
Fig. 13a - Gate Charge Test Circuit
QG VGS V QGS QGD
VG
Charge
Fig. 13b - Basic Gate Charge Waveform
D.U.T.
+
3
Circuit layout considerations • Low stray inductance • Ground plane • Low leakage inductance current transformer
+
2
-
-
4
+
1 RG • • • • dV/dt controlled by RG Driver same type as D.U.T. ISD controlled by duty factor "D" D.U.T. - Device under test
+ VDD
Fig. 13c - Peak Diode Recovery dV/dt Test Circuit
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Document Number: 94542 Revision: 12-May-10
FC40SA50FKP
Power MOSFET, 40 A
Vishay Semiconductors
Driver Gate Drive P.W. Period D=
P.W. Period VGS=10V
*
D.U.T. ISD Waveform Reverse Recovery Current Body Diode Forward Current di/dt D.U.T. VDS Waveform Diode Recovery dv/dt
VDD
Re-Applied Voltage Inductor Curent
Body Diode
Forward Drop
Ripple ≤ 5%
ISD
* VGS = 5V for Logic Level Devices
Fig. 14 - For N-Channel Power MOSFETs
ORDERING INFORMATION TABLE
Device code
F
1 1 2 3 4 5 6 7 8 -
C
2
40
3
S
4
A
5
50
6
FK
7
P
8
Power MOSFET Generation 6.2/6.3 MOSFET silicon DBC construction Current rating (40 = 40 A) Single switch (see Circuit Configuration table) SOT-227 Voltage rating (50 = 500 V) MOSFET K speed None = Standard production P = Lead (Pb)-free
Document Number: 94542 Revision: 12-May-10
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FC40SA50FKP
Vishay Semiconductors
CIRCUIT CONFIGURATION
CIRCUIT CIRCUIT CONFIGURATION CODE CIRCUIT DRAWING
Lead assignment S D 3 2 S G
Power MOSFET, 40 A
D (3)
Single switch no diode
S
G (2)
4 1
S (1-4)
LINKS TO RELATED DOCUMENTS Dimensions Packaging information www.vishay.com/doc?95036 www.vishay.com/doc?95037
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Document Number: 94542 Revision: 12-May-10
Outline Dimensions
Vishay Semiconductors
SOT-227
DIMENSIONS in millimeters (inches)
38.30 (1.508) 37.80 (1.488) Ø 4.40 (0.173) Ø 4.20 (0.165) 4 4 x M4 nuts -A3 6.25 (0.246) 12.50 (0.492) 1 7.50 (0.295) 15.00 (0.590) 30.20 (1.189) 29.80 (1.173) 8.10 (0.319) 4x 7.70 (0.303) 2.10 (0.082) 1.90 (0.075) 2 R full 25.70 (1.012) 25.20 (0.992) -BChamfer 2.00 (0.079) x 45°
0.25 (0.010) M C A M B M 2.10 (0.082) 1.90 (0.075) -C0.12 (0.005)
12.30 (0.484) 11.80 (0.464)
Notes • Dimensioning and tolerancing per ANSI Y14.5M-1982 • Controlling dimension: millimeter
Document Number: 95036 Revision: 28-Aug-07
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Vishay
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