White Electronic Designs
WF512K32-XXX5
512Kx32 5V FLASH MODULE, SMD 5962-94612
FEATURES
Access Times of 60, 70, 90, 120, 150ns Packaging • • • • • 66 pin, PGA Type, 1.075" square, Hermetic Ceramic HIP (Package 400(1)). 68 lead, 40mm, Low Capacitance Hermetic CQFP (Package 501)1 68 lead, 40mm, Low Profile 3.5mm (0.140"), CQFP (Package 502)1 68 lead, 22.4mm (0.880") Low Profile CQFP (G2U) 3.5mm (0.140") high, (Package 510)1 68 lead, 22.4mm (0.880") CQFP (G2L) 5.08mm (0.200") high, Package (528) Commercial, Industrial and Military Temperature Ranges 5 Volt Programming. 5V ± 10% Supply. Low Power CMOS, 6.5mA Standby Embedded Erase and Program Algorithms TTL Compatible Inputs and CMOS Outputs Built-in Decoupling Caps for Low Noise Operation Page Program Operation and Internal Program Control Time Weight WF512K32 - XG2UX5 - 8 grams typical WF512K32N - XH1X5 - 13 grams typical WF512K32 - XG4TX51 - 20 grams typical WF512K32-XG2LX5 - 8 grams typical
* This product is subject to change without notice. Note 1: Package Not Recommended for New Design See Flash Programming Application Note 4M5 for algorithms.
1,000,000 Erase/Program Cycles Minimum Sector Architecture • • 8 equal size sectors of 64KBytes each Any combination of sectors can be concurrently erased. Also supports full chip erase
Organized as 512Kx32
FIGURE 1 – PIN CONFIGURATION FOR WF512K32N-XH1X5 Top View
1 I/O8 I/O9 I/O10 A14 A16 A11 A0 A18 I/O0 I/O1 I/O2 11 22 12 WE2# CS2# GND I/O11 A10 A9 A15 VCC CS1# NC I/O3 33 23 I/O15 I/O14 I/O13 I/O12 OE# A17 WE1# I/O7 I/O6 I/O5 I/O4 I/O24 I/O25 I/O26 A7 A12 NC A13 A8 I/O16 I/O17 I/O18 44 34 VCC CS4# WE4# I/O27 A4 A5 A6 WE3# CS3# GND I/O19 55 45 I/O31 I/O30 I/O29 I/O28 A1 A2 56
Pin Description
I/O0-31 A0-18 WE1-4# CS1-4# OE# VCC GND NC Data Inputs/Outputs Address Inputs Write Enables Chip Selects Output Enable Power Supply Ground Not Connected
Block Diagram
A3
WE1# CS1# WE2# CS2# WE3# CS3# WE4# CS4#
I/O23 I/O22 I/O21
OE# A0-18
512K x 8
512K x 8
512K x 8
512K x 8
8
8
8
8
I/O20 66
I/O0-7 I/O8-15 I/O16-23 I/O24-31
March 2006 Rev. 11
1
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White Electronic Designs
WF512K32-XXX5
FIGURE 2 – PIN CONFIGURATION FOR WF512K32-XG4TX51 Top View
NC A0 A1 A2 A3 A4 A5 CS1# GND CS3# WE# A6 A7 A8 A9 A10 VCC
Pin Description
I/O0-31 A0-18 WE# CS1-4# OE# VCC GND NC Data Inputs/Outputs Address Inputs Write Enables Chip Selects Output Enable Power Supply Ground Not Connected
9 8 7 6 5 4 3 2 1 68 67 66 65 64 63 62 61 I/O0 I/O1 I/O2 I/O3 I/O4 I/O5 I/O6 I/O7 GND I/O8 I/O9 I/O10 I/O11 I/O12 I/O13 I/O14 I/O15 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 60 59 58 57 56 55 54 53 52 51 50 49 48 47 46 45 44 I/O16 I/O17 I/O18 I/O19 I/O20 I/O21 I/O22 I/O23 GND I/O24 I/O25 I/O26 I/O27 I/O28 I/O29 I/O30 I/O31
Block Diagram
CS1# WE# OE# A0-18 CS2# CS3# CS4#
512K X 8
512K X 8
512K X 8
512K X 8
CS2# OE# CS4#
VCC
A12
A13
A14
A15 A16
A17
A18
NC NC NC
A11
NC NC
8
8
8
8
I/O0 - 7
I/O8 - 15
I/O16 - 23
I/O24 - 31
Note 1: Package not recommended for new designs
FIGURE 3 – PIN CONFIGURATION FOR WF512K32-XG2UX5 AND WF512K32-XG2LX5 Top View
NC A0 A1 A2 A3 A4 A5 CS3# GND CS4# WE1# A6 A7 A8 A9 A10 VCC
Pin Description
I/O0-31 A0-18 WE1-4# CS1-4# OE# VCC GND NC Data Inputs/Outputs Address Inputs Write Enables Chip Selects Output Enable Power Supply Ground Not Connected
9 8 7 6 5 4 3 2 1 68 67 66 65 64 63 62 61 I/O0 I/O1 I/O2 I/O3 I/O4 I/O5 I/O6 I/O7 GND I/O8 I/O9 I/O10 I/O11 I/O12 I/O13 I/O14 I/O15 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 60 59 58 57 56 55 54 53 52 51 50 49 48 47 46 45 44 2728 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 VCC A11 A12 A13 A14 A15 A16 CS1# OE# CS2# A17 WE2# WE3# WE4# A18 NC NC I/O16 I/O17 I/O18 I/O19 I/O20 I/O21 I/O22 I/O23 GND I/O24 I/O25 I/O26 I/O27 I/O28 I/O29 I/O30 I/O31
Block Diagram
WE1# CS1# WE2# CS2# WE3# CS3# WE4# CS4#
OE# A0-18
512K x 8
512K x 8
512K x 8
512K x 8
8
8
8
8
I/O0-7
I/O8-15
I/O16-23
I/O24-31
March 2006 Rev. 11
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Absolute Maximum Ratings (1)
Parameter Unit
WF512K32-XXX5
CAPACITANCE
TA = +25°C Parameter OE# capacitance WE1-4# capacitance HIP (PGA) CQFP G4T CQFP G2U/G2L CS1-4# capacitance Data# I/O capacitance Address input capacitance Symbol Conditions COE VIN = 0V, f = 1.0 MHz CWE VIN = 0V, f = 1.0 MHz Max Unit 50 pF pF 20 50 15 VIN = 0V, f = 1.0 MHz 20 pF VI/O = 0V, f = 1.0 MHz 20 pF VIN = 0V, f = 1.0 MHz 50 pF
Operating Temperature Supply Voltage Range (VCC) Signal voltage range (any pin except A9) (2) Storage Temperature Range Lead Temperature (soldering, 10 seconds) Data Retention (Mil Temp) Endurance - write/erase cycles (Mil Temp) A9 Voltage for sector protect (VID) (3)
-55 to +125 °C -2.0 to +7.0 V -2.0 to +7.0 V -65 to +150 °C +300 °C 20 years 1,000,000 cycles min. -2.0 to +14.0 V
NOTES: 1. Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2. Minimum DC voltage on input or I/O pins is -0.5V. During voltage transitions,inputs may overshoot Vss to -2.0 V for periods of up to 20ns. Maximum DC voltage on output and I/O pins is Vcc + 0.5V. During voltage transitions, outputs may overshoot to Vcc + 2.0 V for periods of up to 20ns. 3. Minimum DC input voltage on A9 pin is -0.5V. During voltage transitions, A9 may overshoot Vss to -2V for periods of up to 20ns. Maximum DC input voltage on A9 is +13.5V which may overshoot to 14.0 V for periods up to 20ns.
CCS CI/O CAD
This parameter is guaranteed by design but not tested.
RECOMMENDED OPERATING CONDITIONS
Parameter
Supply Voltage Input High Voltage Input Low Voltage Operating Temp. (Mil.) Operating Temp. (Ind.) A9 Voltage for Sector Protect
Symbol
VCC VIH VIL TA TA VID
Min
4.5 2.0 -0.5 -55 -40 11.5
Max
5.5 VCC + 0.5 +0.8 +125 +85 12.5
Unit
V V V °C °C V
DC CHARACTERISTICS
VCC = 5.0V, VSS = 0V, -55°C ≤ TA ≤ +125°C Parameter
Input Leakage Current Output Leakage Current VCC Active Current for Read (1) VCC Active Current for Program or Erase (2) VCC Standby Current VCC Static Current Output Low Voltage Output High Voltage Low VCC Lock-Out Voltage
Sym
ILI ILOx32 ICC1 ICC2 ICC4 ICC3 VOL VOH1 VLKO
Conditions
VCC = 5.5, VIN = GND to VCC CS# = VIH, OE# = VIH, VOUT = GND to VCC CS# = VIL, OE# = VIH, f = 5MHz, VCC = 5.5 CS# = VIH, OE# = VIH VCC = 5.5, CS = VIH, f = 5MHz VCC = 5.5, CS = VIH IOL = 8.0mA, VCC = 4.5 IOH = 2.5mA, VCC = 4.5
Min
Max
10 10 190 240 6.5 0.6 0.45
Units
µA µA mA mA mA mA V V
0.85 X VCC 3.2 4.2
V
DC test conditions: VIL = 0.3V, VIH = VCC - 0.3V NOTES: 1. The ICC current listed includes both the DC operating current and the frequency dependent component (at 5 MHz). The frequency component typically is less than 2 mA/MHz, with OE at VIH. 2. ICC active while Embedded Algorithm (program or erase) is in progress.
March 2006 Rev. 11
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VCC = 5.0V, GND = 0V, -55°C ≤ TA ≤ +125°C
Parameter Write Cycle Time Write Enable Setup Time Chip Select Pulse Width Address Setup Time Data Setup Time Data Hold Time Address Hold Time Chip Select Pulse Width High Duration of Byte Programming Operation (1) Sector Erase Time (2) Read Recovery Time Chip Programming Time Chip Erase Time (3) NOTES: 1. Typical value for tWHWH1 is 7µs. 2. Typical value for tWHWH2 is 1sec. 3. Typical value for Chip Erase Time is 8sec. Symbol Min tAVAV tWLEL tELEH tAVEL tDVEH tEHDX tELAX tEHEL tWHWH1 tWHWH2 tGHEL 0 11 64 tWC tWS tCP tAS tDS tDH tAH tCPH 60 0 40 0 40 0 40 20 300 15 0 11 64 -60 Max Min 70 0 45 0 45 0 45 20 300 15 0 11 64 -70 Max Min 90 0 45 0 45 0 45 20 300 15 -90 Max
WF512K32-XXX5
AC CHARACTERISTICS – WRITE/ERASE/PROGRAM OPERATIONS,CS# CONTROLLED
-120 Min 120 0 50 0 50 0 50 20 300 15 0 11 64 0 11 64 Max Min 150 0 50 0 50 0 50 20 300 15 -150 Max ns ns ns ns ns ns ns ns µs sec ns sec sec Unit
FIGURE. 4 – AC TEST CIRCUIT AC Test Conditions
I OL Current Source
D.U.T. C eff = 50 pf
VZ
1.5V
Parameter Input Pulse Levels Input Rise and Fall Input and Output Reference Level Output Timing Reference Level
Typ VIL = 0, VIH = 3.0 5 1.5 1.5
Unit V ns V V
(Bipolar Supply)
I OH Current Source
Notes: V Z is programmable from -2V to +7V. IOL & IOH programmable from 0 to 16mA. Tester Impedance Z0 = 75 Ω. V Z is typically the midpoint of VOH and VOL. IOL & IOH are adjusted to simulate a typical resistive load circuit. ATE tester includes jig capacitance.
March 2006 Rev. 11
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VCC = 5.0V, GND = 0V, -55°C ≤ TA ≤ +125°C
Parameter Write Cycle Time Chip Select Setup Time Write Enable Pulse Width Address Setup Time Data Setup Time Data Hold Time Address Hold Time Write Enable Pulse Width High Duration of Byte Programming Operation (1) Sector Erase Time (2) Read Recovery Time before Write VCC Set-up Time Chip Programming Time Output Enable Setup Time Output Enable Hold Time (4) Chip Erase Time (3) NOTES: 1. Typical value for tWHWH1 is 7µs. 2. Typical value for tWHWH2 is 1sec. 3. Typical value for Chip Erase Time is 8sec. 4. For Toggle and Data Polling. tOES tOEH 0 10 64 Symbol Min tAVAV tELWL tWLWH tAVWH tDVWH tWHDX tWHAX tWHWL tWHWH1 tWHWH2 tGHWL tVCS 0 50 11 0 10 64 tWC tCS tWP tAS tDS tDH tAH tWPH 60 0 40 0 40 0 40 20 300 15 0 50 11 0 10 64 -60 Max Min 70 0 45 0 45 0 45 20 300 15 0 50 11 -70 Max Min 90 0 45 0 45 0 45 20 300 15 -90 Max
WF512K32-XXX5
AC CHARACTERISTICS – WRITE/ERASE/PROGRAM OPERATIONS,WE# CONTROLLED
-120 Min 120 0 50 0 50 0 50 20 300 15 0 50 11 0 10 64 0 10 64 0 50 11 Max Min 150 0 50 0 50 0 50 20 300 15 -150 Max ns ns ns ns ns ns ns ns µs sec ns µs sec ns ns sec Unit
AC CHARACTERISTICS – WRITE/ERASE/PROGRAM OPERATIONS,WE# CONTROLLED
VCC = 5.0V, -55°C ≤ TA ≤ +125°C
Parameter Read Cycle Time Address Access Time Chip Select Access Time Output Enable to Output Valid Chip Select to Output High Z (1) Output Enable High to Output High Z (1) Output Hold from Address, CS# or OE# Change, whichever is First 1. Guaranteed by design, but not tested Symbol Min tAVAV tAVQV tELQV tGLQV tEHQZ tGHQZ tAXQX tRC tACC tCE tOE tDF tDF tOH 0 60 60 60 30 20 20 0 -60 Max Min 70 70 70 35 20 20 0 -70 Max Min 90 90 90 35 20 20 0 -90 Max Min 120 120 120 50 30 30 0 -120 Max Min 150 150 150 55 35 35 -150 Max ns ns ns ns ns ns ns Unit
March 2006 Rev. 11
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WF512K32-XXX5
FIGURE 5 – AC WAVEFORMS FOR READ OPERATIONS
CS#
OE#
WE#
March 2006 Rev. 11
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White Electronic Designs
WF512K32-XXX5
FIGURE 6 – WRITE/ERASE/PROGRAM OPERATION, WE# CONTROLLED
Data# Polling
CS#
OE#
WE#
D7#
NOTES: 1. PA is the address of the memory location to be programmed. 2. PD is the data to be programmed at byte address. 3. D7# is the output of the complement of the data written to the device (for each chip). 4. DOUT is the output of the data written to the device. 5. Figure indicates last two bus cycles of four bus cycle sequence.
March 2006 Rev. 11
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WF512K32-XXX5
FIGURE 7 – AC WAVEFORMS CHIP/SECTOR ERASE OPERATIONS
tAH Addresses 5555H tAS CS# tGHWL OE# tWP WE# tWPH tCS Data tDS tDH 2AAAH 5555H 5555H 2AAAH SA
AAH
55H
80H
AAH
55H
10H/30H
VCC tVCS
NOTE: 1. SA is the sector address for Sector Erase.
March 2006 Rev. 11
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White Electronic Designs
WF512K32-XXX5
FIGURE 8 – AC WAVEFORMS FOR DATA# POLLING DURING EMBEDDED ALGORITHM OPERATIONS
CS#
t CH t DF t OE
OE# tOEH WE#
tCE
t OH High Z
D7 Data D0-D6 tWHWH 1 or 2
D7#
D7 = Valid Data
D0-D6 = Invalid t OE
D0-D7 Valid Data
March 2006 Rev. 11
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WF512K32-XXX5
FIGURE 9 – ALTERNATE CS# CONTROLLED PROGRAMMING OPERATION TIMINGS
Data# Polling
CS#
OE#
WE#
D7#
Notes: 1. PA represents the address of the memory location to be programmed. 2. PD represents the data to be programmed at byte address. 3. D7# is the output of the complement of the data written to the device (for each chip). 4. DOUT is the output of the data written to the device. 5. Figure indicates the last two bus cycles of a four bus cycle sequence.
March 2006 Rev. 11
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White Electronic Designs
WF512K32-XXX5
PACKAGE 400: 66 PIN, PGA TYPE, CERAMIC HEX-IN-LINE PACKAGE, HIP (H1)
4.60 (0.181)
ALL LINEAR DIMENSIONS ARE MILLIMETERS AND PARENTHETICALLY IN INCHES
March 2006 Rev. 11
11
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White Electronic Designs
WF512K32-XXX5
PACKAGE 510: 68 LEAD, CERAMIC QUAD FLAT PACK, CQFP (G2U)
o
o
The White 68 lead G2U CQFP fills the same fit and function as the JEDEC 68 lead CQFJ or 68 PLCC. But the G2U has the TCE and lead inspection advantage of the CQFP form.
0.940" TYP
ALL LINEAR DIMENSIONS ARE MILLIMETERS AND PARENTHETICALLY IN INCHES
March 2006 Rev. 11
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White Electronic Designs
WF512K32-XXX5
PACKAGE 528: 68 LEAD, CERAMIC QUAD FLAT PACK, CQFP (G2L)
25.15 (0.990) ± 0.25 (0.010) MAX 22.36 (0.880) ± 0.25 (0.010) MAX
5.10 (0.200) MAX 0.25 (0.010) ± 0.10 (0.002)
0.23 (0.009) REF
24.0 (0.946) ± 0.25 (0.010) 2 /9
O O
R 0.127 (0.005)
1.37 (0.054) MIN
0.004
0.89 (0.035) ± 1.14 (0.045)
1.27 (0.050) TYP 0.38 (0.015) ± 0.05 (0.002) 20.31 (0.800) REF
0.940" TYP
ALL LINEAR DIMENSIONS ARE MILLIMETERS AND PARENTHETICALLY IN INCHES
March 2006 Rev. 11
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White Electronic Designs
WF512K32-XXX5
PACKAGE 502: 68 LEAD, CERAMIC QUAD FLAT PACK, LOW PROFILE CQFP (G4T)1
39.6 (1.56) ± 0.38 (0.015) SQ
5.1 (0.200) MAX 1.27 (0.050) ± 0.1 (0.005)
PIN 1 IDENTIFIER Pin 1
12.7 (0.500) ± 0.5 (0.020) 4 PLACES 5.1 (0.200) ± 0.25 (0.010) 4 PLACES 0.25 (0.010) ± 0.05 (0.002)
1.27 (0.050) TYP 38 (1.50) TYP 4 PLACES
0.38 (0.015) ± 0.08 (0.003) 68 PLACES
Note 1: Package Not Recommended for New Design ALL LINEAR DIMENSIONS ARE MILLIMETERS AND PARENTHETICALLY IN INCHES
March 2006 Rev. 11
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ORDERING INFORMATION
WF512K32-XXX5
W F 512K32 X - XXX X X 5 X
LEAD FINISH: Blank = Gold plated leads A = Solder dip leads VPP PROGRAMMING VOLTAGE 5=5V DEVICE GRADE: Q = MIL-STD-883 Compliant M = Military Screened -55°C to +125°C I = Industrial -40°C to +85°C C = Commercial 0°C to +70°C PACKAGE TYPE: H1 = 1.075" sq. Ceramic Hex In Line Package, HIP (Package 400*) G2U = 22.4mm Ceramic Quad Flat Pack, Low Profile CQFP (Package 510) G2L = 22.4mm Ceramic Quad Flat Pack, CQFP (Package 528) G4T1 = 40mm Low Profile CQFP (Package 502) ACCESS TIME (ns) IMPROVEMENT MARK N = No Connect at pins 21 and 39 in HIP for Upgrade ORGANIZATION, 512K x 32 User configurable as 1M x 16 or 2M x 8 FLASH WHITE ELECTRONIC DESIGNS CORP.
Note 1: Package Not Recommended for New Design
March 2006 Rev. 11
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DEVICE TYPE
512K x 32 Flash Module 512K x 32 Flash Module 512K x 32 Flash Module 512K x 32 Flash Module
WF512K32-XXX5
SPEED
150ns 120ns 90ns 70ns
PACKAGE
66 pin HIP (H1) 1.075" sq. 66 pin HIP (H1) 1.075" sq. 66 pin HIP (H1) 1.075" sq. 66 pin HIP (H1) 1.075" sq. 68 lead CQFP Low Profile (G4T)1 68 lead CQFP Low Profile (G4T)1 68 lead CQFP Low Profile (G4T)
1
SMD NO.
5962-94612 01H4X 5962-94612 02H4X 5962-94612 03H4X 5962-94612 04H4X 5962-94612 01HTX1 5962-94612 02HTX1 5962-94612 03HTX1 5962-94612 04HTX1
512K x 32 Flash Module 512K x 32 Flash Module 512K x 32 Flash Module 512K x 32 Flash Module
150ns 120ns 90ns 70ns
68 lead CQFP Low Profile (G4T)1
512K x 32 Flash Module 512K x 32 Flash Module 512K x 32 Flash Module 512K x 32 Flash Module
150ns 120ns 90ns 70ns
68 lead CQFP/J (G2U) 68 lead CQFP/J (G2U) 68 lead CQFP/J (G2U) 68 lead CQFP/J (G2U)
5962-94612 01HZX 5962-94612 02HZX 5962-94612 03HZX 5962-94612 04HZX
512K x 32 Flash Module 512K x 32 Flash Module 512K x 32 Flash Module 512K x 32 Flash Module
150ns 120ns 90ns 70ns
68 lead CQFP (G2L) 68 lead CQFP (G2L) 68 lead CQFP (G2L) 68 lead CQFP (G2L)
5962-94612 01HAX 5962-94612 02HAX 5962-94612 03HAX 5962-94612 04HAX
March 2006 Rev. 11
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