WM2625ID

WM2625 Low Power Dual 8-bit Serial Input DAC Production Data, April 2001, Rev. 1.0 FEATURES • • • • • • • • Dual 8-bit voltage output DAC Single supply from 2.7V to 5.5V Low supply current - 0.8mA typical in slow mode - 1.8mA typical in fast mode DNL ±0.2 LSB, INL ±0.5 LSB (max) Monotonic over temperature DSP compatible serial interface Programmable settling time of 1µs or 3µs typical High impedance reference input buffer DESCRIPTION The WM2625 is a dual 8-bit voltage output, resistor string digital-to-analogue converter. It can operate with supply voltages between 2.7V and 5.5V and can be powered down under software control. Power down reduces current consumption to 1µA. The device has been designed for glueless interface to industry standard microprocessors and DSPs. The WM2625 is programmed with a 16-bit serial word including 4 control bits and 8 data bits. Excellent performance is delivered with a typical DNL of 0.2LSBs. Monotonicity is guaranteed over the operating temperature range. The settling time of the DAC is programmable to allow for optimisation of speed versus power dissipation. The analogue output is buffered by a rail-to-rail amplifier with a gain of two and a Class AB output stage. The reference voltage input features a high impedance buffer which eliminates the need to keep the reference source impedance low. The WM2625 is available in an 8-pin SOIC package. Commercial (0° to 70°C) and Industrial (-40° to 85°C) temperature range variants are available. APPLICATIONS • • • • • Digital servo control loops Industrial process control Battery powered instruments and controls Machine and motion control devices Digital offset and gain adjustment ORDERING INFORMATION DEVICE WM2625CD WM2625ID TEMP. RANGE 0° to 70°C -40° to 85°C PACKAGE 8-pin SOIC 8-pin SOIC BLOCK DIAGRAM REF TYPICAL PERFORMANCE X1 VDD GND X1 0.1 VDD = 5V, VREF = 2.048V, Speed = Fast Mode, TA = 25.5 C 0.08 DNL - Differential Non-Linearity (LSBs) O WM2625 0.06 0.04 0.02 0 -0.02 -0.04 -0.06 -0.08 -0.1 0 32 64 96 128 DIGITAL CODE 160 192 224 256 8 DAC X2 OUTA 8 DIN SCLK NCS SERIAL INTERFACE AND CONTROL LOGIC 2 DAC X2 OUTB POWERDOWN AND SPEED CONTROL WOLFSON MICROELECTRONICS LTD Lutton Court, Bernard Terrace, Edinburgh, EH8 9NX, UK Tel: +44 (0) 131 667 9386 Fax: +44 (0) 131 667 5176 Email: sales@wolfson.co.uk www.wolfsonmicro.com Production Data Datasheets contain final specifications current on publication date. Supply of products conforms to Wolfson Microelectronics’ Terms and conditions. 2001 Wolfson Microelectronics Ltd. WM2625 PIN CONFIGURATION DIN SCLK NCS OUTA 1 2 3 4 8 7 6 5 VDD OUTB REF GND Production Data PIN DESCRIPTION PIN NO 1 2 3 4 5 6 7 8 NAME DIN SCLK NCS OUTA GND REF OUT VDD TYPE Digital input Digital input Digital input Digital input Supply Analogue input Analogue output Supply Serial data input Serial clock input Chip select. This pin is active low. DAC A analogue voltage output Ground Voltage reference input DAC B analogue voltage output Positive power supply DESCRIPTION ABSOLUTE MAXIMUM RATINGS Absolute Maximum Ratings are stress ratings only. Permanent damage to the device may be caused by continuously operating at or beyond these limits. Device functional operating limits and guaranteed performance specifications are given under Electrical Characteristics at the test conditions specified. ESD Sensitive Device. This device is manufactured on a CMOS process. It is therefore generically susceptible to damage from excessive static voltages. Proper ESD precautions must be taken during handling and storage of this device. CONDITION Supply voltage, VDD to GND Digital input voltage Reference input voltage Operating temperature range, TA Storage temperature Soldering lead temperature, 1.6mm (1/16 inch) from package body for 10 seconds WM2625CD WM2625ID -0.3V -0.3V 0°C -40°C -65°C MIN MAX 7V VDD + 0.3V VDD + 0.3V 70°C 85°C 150°C 260°C RECOMMENDED OPERATING CONDITIONS PARAMETER Supply voltage High-level digital input voltage Low-level digital input voltage Reference voltage to REF pin Load resistance Load capacitance Serial clock frequency Operating free-air temperature SYMBOL VDD VIH VIL VREF RL CL fSCLK TA WM2625CD WM2625ID 0 -40 VDD = 2.7V to 5.5V VDD = 2.7V to 5.5V See Note GND 2 100 20 70 85 TEST CONDITIONS MIN 2.7 2 0.8 VDD - 1.5 TYP MAX 5.5 UNIT V V V V kΩ pF MHz °C °C Note: Reference input voltages greater than VDD/2 will cause clipping for large DAC codes. WOLFSON MICROELECTRONICS LTD PD Rev 1.0 April 2001 2 Production Data WM2625 ELECTRICAL CHARACTERISTICS Test Conditions: RL = 10kΩ, CL = 100pF. VDD = 5V ±10%, VREF = 2.048V and VDD = 3V ±10%, VREF = 1.024V over recommended operating freeair temperature range (unless noted otherwise). PARAMETER Static DAC Specifications Resolution Integral non-linearity Differential non-linearity Zero code error Gain error D.C. power supply rejection ratio Zero code error temperature coefficient Gain error temperature coefficient DAC Output Specifications Output voltage range Output load regulation Power Supplies Active supply current Power down supply current Dynamic DAC Specifications Slew rate SR DAC output 10%-90% Slow Fast See Note 9 DAC output 10%-90% Slow Fast See Note 10 DIN = 0 to 1, fCLK = 100kHz, NCS = VDD fs = 102kSPS, fOUT = 1kHz, See Note 11 52 48 0.5 3 V/µs V/µs IDD 2kΩ to 10kΩ load See Note 7 No load, DAC value = 128, all digital inputs 0V or VDD Slow Mode Fast Mode See Note 8 0 VDD - 0.4 0.29 V % FS INL DNL ZCE GE D.C. PSRR See Note 1 See Note 2 See Note 3 See Note 4 See Note 5 See Note 6 See Note 6 -65 10 10 8 ±0.3 ±0.07 ±0.5 ±0.2 ±12 ±0.5 bits LSB LSB mV % FSR mV/V ppm/°C ppm/°C SYMBOL TEST CONDITIONS MIN TYP MAX UNIT 0.8 1.8 1 1 2.3 3 mA mA µA Full-scale settling time ts 3 1 5 54 49 -50 48 50 10 3 µs µs nV-s dB dB Glitch energy Signal to noise ratio Signal to noise and distortion ratio Total harmonic distortion Spurious free dynamic range Reference Reference input resistance Reference input capacitance Reference feedthrough Reference input bandwidth RREFIN CREFIN SNR SINAD THD SFDR -48 dB dB MΩ pF dB 10 5 VREF = 1VPP at 1kHz + 1.024V dc, DAC code 0 VREF = 0.2VPP + 1.024V dc Slow Fast -80 0.525 1.3 -1 -1 8 1 1 MHz MHz µA µA pF Digital Inputs High level input current Low level input current Input capacitance IIH IIL CI Input voltage = VDD Input voltage = 0V WOLFSON MICROELECTRONICS LTD PD Rev 1.0 April 2001 3 WM2625 Production Data Notes: 1. Integral non-linearity (INL) is the maximum deviation of the output from the line between zero and full scale (excluding the effects of zero code and full scale errors). 2. Differential non-linearity (DNL) is the difference between the measured and ideal 1LSB amplitude change of any adjacent two codes. A guarantee of monotonicity means the output voltage always changes in the same direction (or remains constant) as the digital input code. 3. Zero code error is the voltage output when the DAC input code is zero. 4. Gain error is the deviation from the ideal full-scale output excluding the effects of zero code error. 5. Power supply rejection ratio is measured by varying VDD from 4.5V to 5.5V and measuring the proportion of this signal imposed on the zero code error and the gain error. 6. Zero code error and Gain error temperature coefficients are normalised to full-scale voltage. 7. Output load regulation is the difference between the output voltage at full scale with a 10kΩ load and 2kΩ load. It is expressed as a percentage of the full scale output voltage with a 10kΩ load. 8. IDD is measured while continuously writing code 128 to the DAC. For VIH < VDD - 0.7V and VIL > 0.7V supply current will increase. 9. Slew rate results are for the lower value of the rising and falling edge slew rates 10. Settling time is the time taken for the signal to settle to within 0.5LSB of the final measured value for both rising and falling edges. Limits are ensured by design and characterisation, but are not production tested. 11. SNR, SNRD, THD and SPFDR are measured on a synthesised sine wave at frequency fOUT generated with a sampling frequency fs. SERIAL INTERFACE tWL SCLK 1 tSUD DIN D15 tSUCSCK NCS tHD D14 D13 D12 D1 D0 2 tWH 3 4 5 15 16 tSUC16CS Figure 1 Timing Diagram Test Conditions: RL = 10kΩ, CL = 100pF. VDD = 5V ± 10%, VREF = 2.048V and VDD = 3V ± 10%, VREF = 1.024V over recommended operating free-air temperature range (unless noted otherwise). SYMBOL tSUCSCK tSUC16CS tWH tWL tSUD tHD TEST CONDITIONS Setup time, NCS low before first falling SCLK edge Setup time, 16th falling SCLK edge (when data bit D0 is sampled) before NCS rising edge. Pulse duration, SCLK high. Pulse duration, SCLK low. Setup time, data ready before SCLK falling edge. Hold time, data held valid after SCLK falling edge. MIN 10 10 25 25 10 10 TYP MAX UNIT ns ns ns ns ns ns WOLFSON MICROELECTRONICS LTD PD Rev 1.0 April 2001 4 Production Data WM2625 TYPICAL PERFORMANCE GRAPHS 0.2 VDD = 5V, VREF = 2.048V, Speed = Fast Mode, TA = 25.5OC 0.15 0.1 INL - Integral Non-Linearity (LSBs) 0.05 0 -0.05 -0.1 -0.15 -0.2 0 32 64 96 128 DIGITAL CODE 160 192 224 256 Figure 2 Integral Non-Linearity 0.4 0.4 VDD = 3V, VREF = 1V, Input Code = 0 0.35 0.35 VDD = 5V, VREF = 2V, Input Code = 0 0.3 0.3 0.25 OUTPUT VOLTAGE - V OUTPUT VOLTAGE - V 0.25 0.2 0.2 0.15 0.15 0.1 0.1 0.05 0.05 0 0 1 2 3 4 5 ISINK - mA 6 7 8 9 Slow 0 10 Fast 0 1 2 3 4 5 ISINK - mA 6 7 8 Slow 9 10 Fast Figure 3 Sink Current VDD = 3V 2.06 Figure 4 Sink Current VDD = 5V 4.1 VDD = 3V, VREF = 1V, Input Code = 4095 2.055 4.095 VDD = 5V, VREF = 2V, Input Code = 4095 2.05 OUTPUT VOLTAGE - V OUTPUT VOLTAGE - V 0 1 2 3 4 5 ISOURCE - mA 6 7 8 9 Slow 4.09 2.045 4.085 2.04 4.08 2.035 4.075 2.03 4.07 2.025 10 Fast 4.065 0 1 2 3 4 5 ISOURCE - mA 6 7 8 9 Slow 10 Fast Figure 5 Source Current VDD = 3V Figure 6 Source Current VDD = 5V WOLFSON MICROELECTRONICS LTD PD Rev 1.0 April 2001 5 WM2625 DEVICE DESCRIPTION GENERAL FUNCTION Production Data The WM2625 is a dual 8-bit, voltage output DAC operating from a single supply. It uses a resistor string network buffered with an op amp to convert 8-bit digital data to analogue voltage levels (see Block Diagram). The output voltage is determined by the reference input voltage and the input code according to the following relationship: V = 2 VREFIN out ( ) CODE 256 INPUT 1111 : 1000 0001 1111 OUTPUT 2 VREF ( ) 255 256 : 2 VREF ( ) 129 256 256 REF 1000 0000 2 VREF ( ) 128 = V 2 VREF 0111 : 0000 0000 1111 ( ) 127 : 256 1 256 0001 0000 2 VREF () 0V Table 1 Binary Code Table (0V to 2VREF Output), Gain = 2 POWER ON RESET An internal power-on-reset circuit resets the DAC register to all 0s on power-up. BUFFER AMPLIFIER The output buffer has a near rail-to-rail output with short circuit protection and can reliably drive a 2kΩ load with a 100pF load capacitance. EXTERNAL REFERENCE The reference voltage input is buffered which makes the DAC input resistance independent of code. The REF pin has an input resistance of 10MΩ and an input capacitance of typically 5pF. The reference voltage determines the DAC full-scale output. SERIAL INTERFACE Before writing any data to the WM2625, the interface must be enabled by setting NCS to low. Incoming data on DIN (starting with the MSB) is then shifted bit-per-bit into the internal register on the falling edges of SCLK. From there data is loaded into the target latch after 16 bits have been transferred, or when NCS rises. Three internal latches can be addressed: DAC A, DAC B, or the buffer latch. This makes it possible to update both DACs simultaneously or to update one independently of the other (see ‘Addressing the Buffer and DAC Latches’, below). SERIAL CLOCK AND UPDATE RATE Figure 1 shows the device timing. The maximum serial rate is: f SCLK max = 1 = 20 MHz tWH min + tWL min WOLFSON MICROELECTRONICS LTD PD Rev 1.0 April 2001 6 Production Data Since a data word contains 16 bits, the sample rate for one channel is limited to WM2625 1 f s max = 16 × (tWH min + tWL min ) = 1.25MHz For full two-channel operation, where two data words need to be transmitted per sample, this figure is halved to 625kHz. However, the DAC settling time to 8-bit accuracy limits the response time of the analogue output for large input step transitions. SOFTWARE CONFIGURATION OPTIONS Table 2 shows the composition of a 16-bit data word. D11-D4 contains the 8-bit data word, and D14-D13 hold the programmable options. Bits D15 and D12 are used for addressing the different latches. D3 to D0 are unused and should be set to ZERO. D15 D14 D13 D12 D11 D10 D9 D8 D7 D6 R1 SPD PWR R0 New DAC value (8 bits) Table 2 Register Map D5 D4 D3 0 D2 0 D1 0 D0 0 PROGRAMMABLE CONVERTER SPEED SPD (Bit 14) allows for software control of the converter speed. A ONE selects the fast mode, where typical settling time to within ±0.5LSB of the final value is 1µs. a ZERO puts the device into the slow mode, where typical settling time is 3µs. PROGRAMMABLE POWER DOWN The power down function is controlled by PWR (Bit 13). A ZERO configures the device as active, or fully powered up, a ONE sets the device into power down mode. When the power down function is released the device reverts to the DAC code set prior to power down. ADDRESSING THE BUFFER AND DAC LATCHES Data received on the serial interface is routed according to the values of bits R1 and R0, as shown in Table 3 R1 (BIT D15) 0 0 1 1 R0 (BIT D12) 0 1 0 1 Write data to buffer Write data to DAC A and update DAC B with buffer content Reserved REGISTER Write data to DAC B and buffer Table 3 Latch Addressing To update both DACs simultaneously, the data intended for DAC B should first be stored in the buffer. Subsequently, writing data to DAC A will automatically update the DAC B latch from the buffer, so that the analogue output of both DACs will change at the same time. When updating the two channels independently, all data written to the DAC B latch (R1 and R0 set to ZERO) is also copied to the buffer. Thus the automatic update of DAC B when writing to DAC A latch (R1=1, R0=0) does not change the DAC B data. Data should not be written only to the buffer when operating in this mode. EXAMPLES OF OPERATION Simultaneous operation, slow mode: 1. Write data for DAC B to buffer D15 D14 D13 D12 D11 D10 0 0 0 1 D9 D8 D7 D6 New DAC B value D5 D4 D3 0 D2 0 D1 0 D0 0 2. Write new DAC A value and update DAC B from buffer simultaneously D15 D14 D13 D12 D11 D10 1 0 0 0 D9 D8 D7 D6 New DAC A value D5 D4 D3 0 D2 0 D1 0 D0 0 WOLFSON MICROELECTRONICS LTD PD Rev 1.0 April 2001 7 WM2625 Independent operation, fast mode: Set DAC B output (fast mode): D15 D14 D13 D12 D11 D10 0 1 0 0 D9 D8 D7 D6 New DAC B value D5 D4 D3 0 Production Data D2 0 D1 0 D0 0 Set DAC A output (fast mode): D15 D14 D13 D12 D11 D10 1 1 0 0 D9 D8 D7 D6 New DAC A value D5 D4 D3 0 D2 0 D1 0 D0 0 APPLICATIONS INFORMATION LINEARITY, OFFSET, AND GAIN ERROR Amplifiers operating from a single supply can have positive or negative voltage offsets. With a positive offset, the output voltage changes on the first code transition. However, if the offset is negative, the output voltage may not change with the first code, depending on the magnitude of the offset voltage. This is because with the most negative supply rail being ground, any attempt to drive the output amplifier below ground will clamp the output at 0 V. The output voltage then remains at zero until the input code is sufficiently high to overcome the negative offset voltage, resulting in the transfer function shown in Figure 7. Output Voltage 0V Negative Offset DAC code Figure 7 Effect of Negative Offset This offset error, not the linearity error, produces the breakpoint. The transfer function would follow the dotted line if the output buffer could drive below the ground rail. DAC linearity is measured between zero-input code (all input bits at 0) and full-scale code (all inputs at 1), disregarding offset and full-scale errors. However, due to the breakpoint in the transfer function, single supply operation does not allow for adjustment when the offset is negative. In such cases, the linearity is therefore measured between full-scale and the lowest code that produces a positive (non-zero) output voltage. POWER SUPPLY DECOUPLING AND GROUNDING Printed circuit boards with separate analogue and digital ground planes deliver the best system performance. The two ground planes should be connected together at the low impedance power supply source. Ground currents should be managed so as to minimise voltage drops across the ground planes. A 0.1µF decoupling capacitor should be connected between the positive supply and ground pins of the DAC, with short leads as close as possible to the device. Use of ferrite beads may further isolate the system analogue supply from the digital supply. WOLFSON MICROELECTRONICS LTD PD Rev 1.0 April 2001 8 Production Data WM2625 PACKAGE DIMENSIONS D: 8 PIN SOIC 3.9mm Wide Body DM009.B e B 8 5 E H 1 4 L D h x 45o A A1 -C- α C 0.10 (0.004) SEATING PLANE Symbols A A1 B C D e E h H L α REF: Dimensions (mm) MIN MAX 1.35 1.75 0.10 0.25 0.33 0.51 0.19 0.25 4.80 5.00 1.27 BSC 3.80 4.00 0.25 0.50 5.80 6.20 0.40 1.27 o o 8 0 Dimensions (Inches) MIN MAX 0.0532 0.0688 0.0040 0.0098 0.0130 0.0200 0.0075 0.0098 0.1890 0.1968 0.050 BSC 0.1497 0.1574 0.0099 0.0196 0.2284 0.2440 0.0160 0.0500 o o 0 8 JEDEC.95, MS-012 NOTES: A. ALL LINEAR DIMENSIONS ARE IN MILLIMETERS (INCHES). B. THIS DRAWING IS SUBJECT TO CHANGE WITHOUT NOTICE. C. BODY DIMENSIONS DO NOT INCLUDE MOLD FLASH OR PROTRUSION, NOT TO EXCEED 0.25MM (0.010IN). D. MEETS JEDEC.95 MS-012, VARIATION = AA. REFER TO THIS SPECIFICATION FOR FURTHER DETAILS. WOLFSON MICROELECTRONICS LTD PD Rev 1.0 April 2001 9