SIT2002BC-S3-33E-125.000000

SiT2002B High Frequency, Single Chip, SOT23 Oscillator Applications Features ◼ ◼ ◼ ◼ ◼ ◼ ◼ ◼ Any frequency between 115 MHz to 137 MHz accurate to 6 decimal places of accuracy Operating temperature from -40°C to 85°C. Refer to SiT2019 for -40°C to 125°C and SiT2021 for -55°C to 125°C options Excellent total frequency stability as low as ±20 PPM Low power consumption of 4.9 mA typical at 1.8 V LVCMOS/LVTTL compatible output 5-pin SOT23-5: 2.9 mm x 2.8 mm RoHS and REACH compliant, Pb-free, Halogen-free and Antimony-free For AEC-Q100 oscillators, refer to SiT2024 and SiT2025 GEPON, network switches, routers, servers, embedded systems, industrial and medical devices Ethernet, PCI-E, DDR, etc. ◼ ◼ Related products for automotive applications. For aerospace and defense applications SiTime recommends using only Endura™ SiT2044. Electrical Specifications Table 1. Electrical Characteristics All Min and Max limits are specified over temperature and rated operating voltage with 15 pF output load unless otherwise stated. Typical values are at 25°C and nominal supply voltage. Parameters Symbol Min. Typ. Max. Unit Condition Frequency Range Output Frequency Range f 115 – 137 MHz Frequency Stability and Aging Frequency Stability F_stab -20 – +20 PPM -25 – +25 PPM -50 – +50 PPM Inclusive of Initial tolerance at 25°C, 1st year aging at 25°C, and variations over operating temperature, rated power supply voltage and load (15 pF ± 10%). Operating Temperature Range Operating Temperature Range (Ambient) T_use -20 – +70 °C Extended Commercial -40 – +85 °C Industrial Supply Voltage and Current Consumption Supply Voltage Current Consumption OE Disable Current Standby Current Rev 1.03 Vdd Idd I_od I_std 1.62 1.8 1.98 V 2.25 2.5 2.75 V 2.52 2.8 3.08 V 2.7 3.0 3.3 V 2.97 3.3 3.63 V 2.25 – 3.63 V – 6.2 7.5 mA No load condition, f = 125 MHz, Vdd = 2.8 V, 3.0 V, 3.3 V or 2.25 to 3.63 V – 5.5 6.4 mA No load condition, f = 125 MHz, Vdd = 2.5 V – 4.9 5.6 mA No load condition, f = 125 MHz, Vdd = 1.8 V – – 4.3 mA Vdd = 2.5 V to 3.3 V, OE = Low, Output in high Z state – – 4.1 mA Vdd = 1.8 V, OE = Low, Output in high Z state – 2.6 4.3 A – 1.4 2.5 A – 0.6 1.3 A 31 January 2023 Vdd = 2.8 V to 3.3 V, ST = Low, Output is weakly pulled down Vdd = 2.5 V, ST = Low, Output is weakly pulled down Vdd = 1.8 V, ST = Low, Output is weakly pulled down www.sitime.com SiT2002B High Frequency, Single Chip, SOT23 Oscillator Table 1. Electrical Characteristics (continued) Parameters Symbol Min. Typ. Max. Unit Condition LVCMOS Output Characteristics DC 45 – 55 % All Vdds Tr, Tf – 1.0 2.0 ns Vdd = 2.5 V, 2.8 V, 3.0 V or 3.3 V, 20% - 80% – 1.3 2.5 ns Vdd = 1.8 V, 20% - 80% – 1.0 2.0 ns Vdd = 2.25 V - 3.63 V, 20% - 80% Duty Cycle Rise/Fall Time Output High Voltage VOH 90% – – Vdd IOH = -4 mA (Vdd = 3.0 V or 3.3 V) IOH = -3 mA (Vdd = 2.8 V and Vdd = 2.5 V) IOH = -2 mA (Vdd = 1.8 V) Output Low Voltage VOL – – 10% Vdd IOL = 4 mA (Vdd = 3.0 V or 3.3 V) IOL = 3 mA (Vdd = 2.8 V and Vdd = 2.5 V) IOL = 2 mA (Vdd = 1.8 V) Input Characteristics Input High Voltage VIH 70% – – Vdd Pin 1, OE or ST Input Low Voltage VIL – – 30% Vdd Pin 1, OE or ST Input Pull-up Impedance Z_in 50 87 150 k Pin 1, OE logic high or logic low, or ST logic high 2 – – M Pin 1, ST logic low Startup and Resume Timing Startup Time Enable/Disable Time Resume Time T_start – – 5 ms Measured from the time Vdd reaches its rated minimum value T_oe – – 130 ns f = 115 MHz. For other frequencies, T_oe = 100 ns + 3 * clock periods T_resume – – 5 ms Measured from the time ST pin crosses 50% threshold T_jitt – 1.9 3 ps f = 125 MHz, Vdd = 2.5 V, 2.8 V, 3.0 V or 3.3 V – 1.6 4 ps f = 125 MHz, Vdd = 1.8 V – 12 20 ps f = 125 MHz, Vdd = 2.5 V, 2.8 V, 3.0 V or 3.3 V – 14 30 ps f = 125 MHz, Vdd = 1.8 V – 0.5 0.9 ps Integration bandwidth = 900 kHz to 7.5 MHz – 1.3 2 ps Integration bandwidth = 12 kHz to 20 MHz Jitter RMS Period Jitter Peak-to-peak Period Jitter T_pk RMS Phase Jitter (random) T_phj Top View Table 2. Pin Description Pin Symbol Functionality 1 GND Power 2 NC No Connect Output Enable 3 OE / ST /NC Standby No Connect OE / Electrical ground / NC NC GND No connect H[1]: specified frequency output L: output is high impedance. Only output driver is disabled. H or Open[1]: specified frequency output L: output is low (weak pull down). Device goes to sleep mode. Supply current reduces to I_std. Any voltage between 0 and Vdd or Open[1]: Specified frequency output. Pin 3 has no function. 4 VDD Power Power supply voltage[2] 5 OUT Output Oscillator output VDD OUT Figure 1. Pin Assignments Notes: 1. In OE or ST mode, a pull-up resistor of 10 kΩ or less is recommended if pin 3 is not externally driven. If pin 3 needs to be left floating, use the NC option. 2. A capacitor of value 0.1 µF or higher between Vdd and GND is required. Rev 1.03 Page 2 of 16 www.sitime.com SiT2002B High Frequency, Single Chip, SOT23 Oscillator Table 3. Absolute Maximum Limits Attempted operation outside the absolute maximum ratings may cause permanent damage to the part. Actual performance of the IC is only guaranteed within the operational specifications, not at absolute maximum ratings. Min. Max. Unit Storage Temperature Parameter -65 150 °C Vdd -0.5 4 V Electrostatic Discharge – 2000 V Soldering Temperature (follow standard Pb free soldering guidelines) – 260 °C – 150 °C Junction Temperature [3] Note: 3. Exceeding this temperature for extended period of time may damage the device. Table 4. Thermal Consideration[4] Package JA, 4 Layer Board JC, Bottom (°C/W) (°C/W) SOT23-5 421 175 Note: 4. Refer to JESD51 for JA and JC definitions, and reference layout used to determine the JA and JC values in the above table. Table 5. Maximum Operating Junction Temperature[5] Max Operating Temperature (ambient) Maximum Operating Junction Temperature 70°C 80°C 85°C 95°C Note: 5. Datasheet specifications are not guaranteed if junction temperature exceeds the maximum operating junction temperature. Table 6. Environmental Compliance Parameter Condition/Test Method Mechanical Shock MIL-STD-883F, Method 2002 Mechanical Vibration MIL-STD-883F, Method 2007 Temperature Cycle JESD22, Method A104 Solderability MIL-STD-883F, Method 2003 Moisture Sensitivity Level MSL1 @ 260°C Rev 1.03 Page 3 of 16 www.sitime.com SiT2002B High Frequency, Single Chip, SOT23 Oscillator Test Circuit and Waveform Vout Test Point Vdd tr 15 pF (including probe and fixture capacitance) 80% Vdd 4 5 1 2 3 tf 50% Power Supply 0.1µF 20% Vdd High Pulse (TH) Period Vdd 1kΩ Low Pulse (TL) OE/ST Function Figure 2. Test Circuit[6] Figure 3. Output Waveform[6] Note: 6. Duty Cycle is computed as Duty Cycle = TH/Period. Timing Diagrams 90% Vdd Vdd Vdd 50% Vdd [7] T_start Pin 4 Voltage No Glitch during start up T_resume ST Voltage CLK Output CLK Output HZ HZ T_start: Time to start from power-off T_resume: Time to resume from ST Figure 4. Startup Timing (OE/ST Mode) Figure 5. Standby Resume Timing (ST Mode Only) Vdd Vdd 50% Vdd OE Voltage 50% Vdd T_oe OE Voltage T_oe CLK Output CLK Output HZ HZ T_oe: Time to put the output in High Z mode T_oe: Time to re-enable the clock output Figure 7. OE Disable Timing (OE Mode Only) Figure 6. OE Enable Timing (OE Mode Only) Note: 7. SiT2002 has “no runt” pulses and “no glitch” output during startup or resume. Rev 1.03 Page 4 of 16 www.sitime.com SiT2002B High Frequency, Single Chip, SOT23 Oscillator Performance Plots[8] 1.8 2.5 2.8 3.0 3.3 7.5 DUT1 DUT2 DUT3 DUT4 DUT5 DUT6 DUT7 DUT8 DUT9 DUT10 20 7.0 15 Frequency (ppm) Idd (mA) 6.5 6.0 5.5 5.0 4.5 10 5 0 -5 -10 -15 -20 4.0 115 117 119 121 123 125 127 129 131 133 135 -40 137 Figure 8. Idd vs Frequency 1.8 V 2.5 V 2.8 V 3.0 V -30 -20 -10 0 10 20 30 40 50 60 70 80 Figure 9. Frequency vs Temperature, 1.8V 1.8 V 3.3 V 2.5 V 2.8 V 3.0 V 3.3 V 55 54 Duty cycle (%) RMS period jitter (ps) 53 52 51 50 49 48 47 46 45 115 Figure 10. RMS Period Jitter vs Frequency 1.8 V 2.5 V 2.8 V 3.0 V 3.3 V 121 123 125 127 129 131 133 135 137 1.8 V 2.5 V 2.8 V 3.0 V 3.3 V 2.5 2.0 Fall time (ns) Rise time (ns) 119 Figure 11. Duty Cycle vs Frequency 2.5 1.5 1.0 0.5 2.0 1.5 1.0 0.5 0.0 0.0 -40 -30 -20 -10 0 10 20 30 40 50 60 70 80 -40 Figure 12. 20%-80% Rise Time vs Temperature Rev 1.03 117 -30 -20 -10 0 10 20 30 40 50 60 70 80 Figure 13. 20%-80% Fall Time vs Temperature Page 5 of 16 www.sitime.com SiT2002B High Frequency, Single Chip, SOT23 Oscillator Performance Plots[8] 1.8 V 2.5 V 2.8 V 3.0 V 1.8 V 3.3 V 2.5 V 2.8 V 3.0 V 3.3 V 2.0 IPJ (ps) IPJ (ps) 1.8 1.6 1.4 1.2 1.0 115 117 119 121 123 125 127 129 131 133 135 137 Figure 15. RMS Integrated Phase Jitter Random (900 kHz to 20 MHz) vs Frequency[9] Figure 14. RMS Integrated Phase Jitter Random (12 kHz to 20 MHz) vs Frequency[9] Notes: 8. All plots are measured with 15 pF load at room temperature, unless otherwise stated. 9. Phase noise plots are measured with Agilent E5052B signal source analyzer. Rev 1.03 Page 6 of 16 www.sitime.com SiT2002B High Frequency, Single Chip, SOT23 Oscillator Programmable Drive Strength The SiT2002 includes a programmable drive strength feature to provide a simple, flexible tool to optimize the clock rise/fall time for specific applications. Benefits from the programmable drive strength feature are: Improves system radiated electromagnetic interference (EMI) by slowing down the clock rise/fall time. Improves the downstream clock receiver’s (RX) jitter by decreasing (speeding up) the clock rise/fall time. Ability to drive large capacitive loads while maintaining full swing with sharp edge rates. ◼ ◼ ◼ The SiT2002 can support up to 30 pF maximum capacitive loads with drive strength settings. Refer to the Rise/Tall Time Tables (Table 7 to 11) to determine the proper drive strength for the desired combination of output load vs. rise/fall time. SiT2002 Drive Strength Selection Tables 7 through 11 define the rise/fall time for a given capacitive load and supply voltage. For more detailed information about rise/fall time control and drive strength selection, see the SiTime Application Notes section. Reduction by Slowing Rise/Fall Time Figure 16 shows the harmonic power reduction as the rise/fall times are increased (slowed down). The rise/fall times are expressed as a ratio of the clock period. For the ratio of 0.05, the signal is very close to a square wave. For the ratio of 0.45, the rise/fall times are very close to neartriangular waveform. These results, for example, show that the 11th clock harmonic can be reduced by 35 dB if the rise/fall edge is increased from 5% of the period to 45% of the period. trise=0.05 trise=0.1 trise=0.15 trise=0.2 trise=0.25 trise=0.3 trise=0.35 trise=0.4 trise=0.45 10 Harmonic amplitude (dB) 0 -10 -20 1. Select the table that matches the SiT2002 nominal supply voltage (1.8 V, 2.5 V, 2.8 V, 3.0 V, 3.3 V). 2. Select the capacitive load column that matches the application requirement (5 pF to 30 pF) 3. Under the capacitive load column, select the desired rise/fall times. 4. The left-most column represents the part number code for the corresponding drive strength. 5. Add the drive strength code to the part number for ordering purposes. Calculating Maximum Frequency Based on the rise and fall time data given in Tables 7 through 11, the maximum frequency the oscillator can operate with guaranteed full swing of the output voltage over temperature can be determined as follows: Max Frequency = 1 5 x Trf_20/80 where Trf_20/80 is the typical value for 20%-80% rise/fall time. -30 -40 -50 Example 1 -60 Calculate fMAX for the following condition: -70 -80 1 3 5 7 9 11 ◼ Vdd = 3.3 V (Table 11) ◼ Capacitive Load: 30 pF ◼ Desired Tr/f time = 1.31 ns (rise/fall time part number code = F) Harmonic number Figure 16. Harmonic EMI reduction as a Function of Slower Rise/Fall Time Jitter Reduction with Faster Rise/Fall Time Power supply noise can be a source of jitter for the downstream chipset. One way to reduce this jitter is to speed up the rise/fall time of the input clock. Some chipsets may also require faster rise/fall time in order to reduce their sensitivity to this type of jitter. Refer to the Rise/Fall Time Tables (Table 7 to 11) to determine the proper drive strength. Part number for the above example: SiT2002BIF12-18E-137.000000 Drive strength code is inserted here. Default setting is “-” High Output Load Capability The rise/fall time of the input clock varies as a function of the actual capacitive load the clock drives. At any given drive strength, the rise/fall time becomes slower as the output load increases. As an example, for a 3.3 V SiT2002 device with default drive strength setting, the typical rise/fall time is 1ns for 15 pF output load. The typical rise/fall time slows down to 2.6 ns when the output load increases to 45 pF. One can choose to speed up the rise/fall time to 1.83 ns by then increasing the drive strength setting on the SiT2002. Rev 1.03 Page 7 of 16 www.sitime.com SiT2002B High Frequency, Single Chip, SOT23 Oscillator Rise/Fall Time (20% to 80%) vs CLOAD Tables Table 7. Vdd = 1.8 V Rise/Fall Times for Specific CLOAD Table 8. Vdd = 2.5 V Rise/Fall Times for Specific CLOAD Rise/Fall Time Typ (ns) Rise/Fall Time Typ (ns) Drive Strength \ CLOAD 5 pF T 0.93 30 pF Drive Strength \ CLOAD 5 pF 15 pF 30 pF n/a n/a R 1.45 n/a n/a 15 pF E 0.78 n/a n/a B 1.09 n/a n/a U 0.70 1.48 n/a T 0.62 1.28 n/a F or "-": default 0.65 1.30 n/a E 0.54 1.00 n/a U or "-": default 0.43 0.96 n/a F 0.34 0.88 n/a Table 10. Vdd = 3.0 V Rise/Fall Times for Specific CLOAD Table 9. Vdd = 2.8 V Rise/Fall Times for Specific CLOAD Rise/Fall Time Typ (ns) Rise/Fall Time Typ (ns) Drive Strength \ CLOAD 5 pF 15 pF 30 pF Drive Strength \ CLOAD 5 pF 15 pF 30 pF R 1.29 n/a n/a R 1.22 n/a n/a B 0.97 n/a n/a B 0.89 n/a n/a T 0.55 1.12 n/a T or "-": default 0.51 1.00 n/a E 0.44 1.00 n/a E 0.38 0.92 n/a U or "-": default 0.34 0.88 n/a U 0.30 0.83 n/a F 0.29 0.81 1.48 F 0.27 0.76 1.39 Table 11. Vdd = 3.3 V Rise/Fall Times for Specific CLOAD Rise/Fall Time Typ (ns) Drive Strength \ CLOAD 5 pF 15 pF 30 pF R 1.16 n/a n/a B 0.81 n/a n/a T or "-": default 0.46 1.00 n/a E 0.33 0.87 n/a U 0.28 0.79 1.46 F 0.25 0.72 1.31 Note: 10. “n/a” in Table 7 to Table 11 indicates that the resulting rise/fall time from the respective combination of the drive strength and out put load does not provide rail-to-rail swing and is not available. Rev 1.03 Page 8 of 16 www.sitime.com SiT2002B High Frequency, Single Chip, SOT23 Oscillator Pin 1 Configuration Options (OE, ST ̅ ̅ ̅ , or NC) Output on Startup and Resume Pin 3 of the SiT2002 can be factory-programmed to support three modes: Output Enable (OE), standby ( ST ) or No Connect (NC). These modes can also be programmed with the Time Machine using field programmable devices. The SiT2002 comes with gated output. Its clock output is accurate to the rated frequency stability within the first pulse from initial device startup or resume from the standby mode. Output Enable (OE) Mode In addition, the SiT2002 supports “no runt” pulses and “no glitch” output during startup or resume as shown in the waveform captures in Figure 17 and Figure 18. In the OE mode, applying logic Low to the OE pin only disables the output driver and puts it in Hi-Z mode. The core of the device continues to operate normally. Power consumption is reduced due to the inactivity of the output. When the OE pin is pulled High, the output is typically enabled in