VIS30940
30V N-Channel SGT MOSFET
General Description
Product Summary
• SGT MOSFET Technology
VDS
30V
• Low RDS(ON) at 4.5V VGS
ID
(at VGS=10V)
32A
• Low Gate Charge
RDS(ON)
(at VGS=10V, typ)
4.6mΩ
• High Current Capability
RDS(ON)
(at VGS=4.5V, typ)
5.8mΩ
• RoHS and Halogen-Free Compliant
Applications
• General DC/DC Converters
100% UIS Tested
• VRM Vcore for Notebook and Server
100% Rg Tested
• Load Switch and Battery Power Management
• Motor Drive Bridge Switch
D
Top View
S
S
S
G
G
S
Orderable Part Number
1
8
2
7
3
6
4
5
Package Type
VIS30940
Top View
DFN3.3x3.3
DFN3.3X3.3
D
D
D
D
PIN1
Form
Tape & Reel
Symbol
Drain-Source Voltage
Gate-Source Voltage
TC=25°C
Continuous Drain
Current (5)
5000
Pulsed Drain Current
Continuous Drain
Current
TA=25°C
30
V
VGS
±20
V
32
A
32
A
IAS
EAS
(3)
TC=25°C
PD
TC=100°C
TA=25°C
PDSM
TA=100°C
Junction and Storage Temperature Range
Thermal Characteristics
Parameter
Maximum Junction-to-Ambient
(1)
TJ, TSTG
Symbol
t ≤ 10s
Maximum Junction-to-Ambient (1,4)
Steady-State
Maximum Junction-to-Case
Steady-State
Rev0.61 (12/2021)
VDS
IDSM
TA=100°C
Avalanche Energy L=0.1mH
Power Dissipation (1)
Units
IDM
(3)
Avalanche Current (3)
Power Dissipation (2)
Maximum
ID
TC=100°C
PIN1
Minimum Order Quantity
Absolute Maximum Ratings TA=25°C unless otherwise noted
Parameter
Bottom View
RθJA
RθJC
150
A
20
A
12.5
A
33
54
A
mJ
26
W
10.4
W
3.1
W
1.25
W
°C
-55 to 150
Typ
Max
Units
30
40
°C/W
60
75
°C/W
4
4.8
°C/W
Voltaic Semiconductor Confidential and Proprietary Information
1
VIS30940
30V N-Channel SGT MOSFET
Electrical Characteristics (TJ=25°C unless otherwise noted)
Symbol
Parameter
Conditions
Min
Typ
Max
Units
STATIC PARAMETERS
BVDSS
Drain-Source Breakdown Voltage
ID=250µA, VGS=0V
IDSS
Zero Gate Voltage Drain Current
IGSS
Gate-Body leakage current
VDS=0V, VGS=±20V
VGS(th)
Gate Threshold Voltage
VDS=VGS, ID=250µA
V
VDS=30V, VGS=0V
1
TJ=55°C
VGS=10V, ID=20A
RDS(ON)
30
Static Drain-Source On-Resistance
TJ=125°
VGS=4.5V, ID=20A
5
1.4
μA
±100
nA
1.7
2.3
V
4.6
5.5
6.5
5.8
mΩ
7.5
gFS
Forward Transconductance
VDS=5V, ID=20A
83
S
VSD
Diode Forward Voltage
IS=1A, VGS=0V
0.72
V
IS
Maximum Body-Diode Continuous Current
34
A
DYNAMIC PARAMETERS
Ciss
Input Capacitance
Coss
Output Capacitance
Crss
Reverse Transfer Capacitance
Rg
Gate resistance
VGS=0V, VDS=15V,
f=1MHz
f=1MHz
1575
pF
450
pF
35
pF
2.5
Ω
23.2
nC
10.9
nC
6.9
nC
SWITCHING PARAMETERS
Qg(10V)
Total Gate Charge
Qg(4.5V)
Total Gate Charge
Qgs
Gate Source Charge
VGS=10V, VDS=15V,
ID=20A
Qgd
Gate Drain Charge
1.5
nC
tD(on)
Turn-On Delay Time
8
ns
tr
Turn-On Rise Time
tD(off)
Turn-Off Delay Time
VGS=10V, VDS=15V,
RL=0.75Ω, RGEN=3Ω
5
ns
12
ns
tf
Turn-Off Fall Time
5
ns
trr
Body Diode Reverse Recovery Time
IF=20A, di/dt=200A/μs
22
ns
Qrr
Body Diode Reverse Recovery Charge
IF=20A, di/dt=200A/μs
20
nC
1)
2)
3)
4)
5)
2
RθJA is measured with the device mounted on 1in FR-4 board with 2oz. Copper, in a still air environment with TA =25°C. The Power dissipation PDSM
is based on RθJA t≤ 10s and the maximum allowed junction temperature of 150°C. The value in any given application depends on the user's specific
board design.
The power dissipation PD is based on TJ(MAX)=150°C, using junction-to-case thermal resistance, and is more useful in setting the upper dissipation
limit for cases where additional heatsinking is used.
Single pulse width limited by junction temperature TJ(MAX)=150°C.
RθJA is the sum of the thermal impedance from junction to case RθJC and case to ambient.
The maximum current rating is package limited.
Rev0.61 (12/2021)
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VIS30940
30V N-Channel SGT MOSFET
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS
100
100
3.5V
VDS=5V
4.5V
3V
75
7V
ID (A)
ID (A)
75
50
10V
25
0
0.00
VGS=2.5V
1.00
2.00
3.00
4.00
50
TJ=150°C
25
0
5.00
0.0
1.0
2.0
Fig 1. Typical Output Characteristics
4.0
5.0
6.0
Fig 2. Typical Transfer Characteristics
2000
1.5
1800
1.4
1.3
Ciss
1600
VGS=10V
ID=20A
Capacitance (pF)
Normalized On-Resistance
3.0
VGS (V)
VDS (V)
1.2
1.1
VGS=4.5V
ID=20A
1
1400
1200
1000
800
Coss
600
Crss
400
0.9
0.8
TJ=25°C
200
0
25
50
75
100
125
0
150
0
5
10
TJ, Junction Temperature (℃)
15
20
25
30
VDS (V)
Fig 3. Normalized On-Resistance vs. Temperature
Fig 4. Typical Capacitance vs. VDS
1000
10
9
8
100
6
IS(A)
VGS(V)
7
5
TJ=150°C
10
TJ=25°C
4
3
1
2
1
0
0
5
10
15
20
25
0.1
0
0.2
0.4
Fig 5. Typical Gate Charge vs. VGS
Rev0.61 (12/2021)
0.6
0.8
1
1.2
VSD(V)
Qg(nC)
Fig 6. Typical Source-Drain Diode Forward Voltage
Voltaic Semiconductor Confidential and Proprietary Information
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VIS30940
30V N-Channel SGT MOSFET
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS
35
1000
10μs
RDS(ON)
limited
100μs
10
TJ(MAX)=150℃
TC=25℃
1
1ms
DC
10ms
30
Current Rating ID (A)
ID (A)
100
25
20
15
10
5
0.1
0.01
0.1
1
10
100
0
0
25
50
Fig 7. Maximum Safe Operating Area
ZθJC Normalized Transient
Thermal Resistance
10
1
75
100
125
150
TCASE (℃)
VDS(V)
Fig 8. Maximum Drain Current vs. Case Temperature
In descending order
D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, 0.005, single pulse
D=Ton/T
TJ,PK=TA+PDM∙ZθJC∙RθJC
RθJC=4.8℃/W
0.1
PD
0.01
TON
T
0.001
0.00001
0.0001
0.001
0.01
0.1
1
10
Pulse Width (s)
Fig 9. Normalized Maximum Transient Thermal Impedance, Junction-to-Case
ZθJA Normalized Transient
Thermal Resistance
10
1
In descending order
D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, 0.005, single pulse
D=Ton/T
TJ,PK=TA+PDM∙ZθJA∙RθJA
RθJA=75℃/W
0.1
PD
0.01
TON
T
0.001
0.0001
0.001
0.01
0.1
1
10
100
Pulse Width (s)
Fig 10. Normalized Maximum Transient Thermal Impedance, Junction-to-Ambient
Rev0.61 (12/2021)
Voltaic Semiconductor Confidential and Proprietary Information
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VIS30940
30V N-Channel SGT MOSFET
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS
800
10000
TJ(MAX)=150℃
TC=25℃
1000
Power (W)
Power (W)
600
TJ(MAX)=150℃
TA=25℃
400
100
10
200
0
0.0001
0.001
0.01
0.1
1
1
0.00001
10
0.001
Fig 11. Single Pulse Power Rating Junction-to-Case
10
1000
Fig 12. Single Pulse Power Rating Junction-to-Ambient
30
15.00
25
12.50
20
10.00
RDSON (mΩ)
Power Dissipation (W)
0.1
Pulse Width (s)
Pulse Width (s)
15
10
ID=20A
150℃
7.50
5.00
25℃
5
2.50
0
0
25
50
75
100
125
150
0.00
2.0
4.0
6.0
8.0
10.0
VGS (V)
TCASE (℃)
Fig 13. Maximum Power Rating vs. Temperature
Fig 14. On-Resistance vs. VGS
8
RDSON (mΩ)
7
VGS=4.5V
6
5
VGS=10V
4
3
2
0
10
20
30
40
50
60
ID (A)
Fig 15. On-Resistance vs. Drain Current
Rev0.61 (12/2021)
Voltaic Semiconductor Confidential and Proprietary Information
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VIS30940
30V N-Channel SGT MOSFET
TEST CIRCUIT
BV DSS
VDS
L
IAS
+
VDD
DUT
IAS
Fig16. Unclamped Inductive Test Circuit
Fig17. Unclamped Inductive Waveform
VDS
Qg
VGS
10V
L
DUT
VCC
Qgs
Fig18. Qg Test Circuit
Qgd
Fig19. Qg Waveform
RL
VDS
90%
+
VGS
RG
DUT
VDD
10%
tr
td (o n )
td (o ff)
to n
Fig18. Resistive Switching Test Circuit
Rev0.61 (12/2021)
tf
to ff
Fig19. Switching Time Waveform
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VIS30940
30V N-Channel SGT MOSFET
TEST CIRCUIT
VDS+
VG S
DUT
VDS-
L
ISD
ISD
+
VGS
VDD
IF
dI/ dt
trr
VD D
VD S
Fig20. Diode Recovery Test Circuit
Fig21. Diode Recovery Test Waveform
DFN3.3x3.3 OUTLINE
A2
A
A1
D
DIM
SYMBOL
L3
H
L2
E2
D1
L
E1
E
L1
b
e
Rev0.61 (12/2021)
A
A1
A2
D
D1
E
E1
E2
b
e
L
L1
L2
L3
H
θ
MILLIMITERS
MIN [mm]
MAX [mm]
0.650
0.850
0.152 REF
0~0.05
2.900
3.100
2.300
2.600
2.900
3.100
3.150
3.450
1.535
1.935
0.200
0.400
0.550
0.750
0.300
0.500
0.180
0.480
0~0.100
0~0.100
0.315
0.515
9º
13º
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