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HF12N65

HF12N65

  • 厂商:

    HL(豪林)

  • 封装:

    TO-220F

  • 描述:

  • 详情介绍
  • 数据手册
  • 价格&库存
HF12N65 数据手册
BVDSS = 650 V RDS(on) typ = 0.53 Ω HF12N65 ID = 12 A 600V N-Channel MOSFET TO-220F FEATURES  Originative New Design 1  Superior Avalanche Rugged Technology  Robust Gate Oxide Technology 2 3 1.Gate 2. Drain 3. Source  Very Low Intrinsic Capacitances  Excellent Switching Characteristics  Unrivalled Gate Charge : 38 nC (Typ.)  Extended Safe Operating Area  Lower RDS(ON) : 0.53 Ω (Typ.) @VGS=10V  100% Avalanche Tested Absolute Maximum Ratings Symbol TC=25℃ unless otherwise specified Parameter Value Units 650 V VDSS Drain-Source Voltage ID Drain Current – Continuous (TC = 25℃) 12* A Drain Current – Continuous (TC = 100℃) 7.4* A IDM Drain Current – Pulsed 48* A VGS Gate-Source Voltage ±30 V EAS Single Pulsed Avalanche Energy (Note 2) 870 mJ IAR Avalanche Current (Note 1) 12 A EAR Repetitive Avalanche Energy (Note 1) 22.5 mJ dv/dt Peak Diode Recovery dv/dt (Note 3) 4.5 V/ns PD Power Dissipation (TC = 25℃) - Derate above 25℃ 51 W TJ, TSTG Operating and Storage Temperature Range TL Maximum lead temperature for soldering purposes, 1/8” from case for 5 seconds (Note 1) 0.41 W/℃ -55 to +150 ℃ 300 ℃ *Drain current limited by maximum junction temperature Thermal Resistance Characteristics Typ. Max. RθJC Symbol Junction-to-Case Parameter -- 2.43 RθCS Case-to-Sink -- -- RθJA Junction-to-Ambient -- 62.5 Units ℃/W HF12N65 Nov 2007 Symbol Parameter unless otherwise specified Test Conditions Min Typ Max Units On Characteristics VGS RDS(ON) Gate Threshold Voltage VDS = VGS, ID = 250 ㎂ 2.0 -- 4.0 V Static Drain-Source On-Resistance VGS = 10 V, ID = 6.0 A -- 0.53 0.65 Ω VGS = 0 V, ID = 250 ㎂ 600 -- -- V ID = 250 ㎂, Referenced to 25℃ -- 0.5 -- V/℃ VDS = 650 V, VGS = 0 V -- -- 1 ㎂ VDS = 480 V, TC = 125℃ -- -- 10 ㎂ Off Characteristics BVDSS Drain-Source Breakdown Voltage ΔBVDSS Breakdown Voltage Temperature Coefficient /ΔTJ IDSS Zero Gate Voltage Drain Current IGSSF Gate-Body Leakage Current, Forward VGS = 30 V, VDS = 0 V -- -- 100 ㎁ IGSSR Gate-Body Leakage Current, Reverse VGS = -30 V, VDS = 0 V -- -- -100 ㎁ -- 1835 2385 ㎊ -- 185 240 ㎊ -- 16 21 ㎊ -- 30 70 ㎱ -- 85 180 ㎱ -- 140 280 ㎱ -- 90 190 ㎱ -- 38 49 nC -- 8 -- nC -- 13 -- nC Dynamic Characteristics Ciss Input Capacitance Coss Output Capacitance Crss Reverse Transfer Capacitance VDS = 25 V, VGS = 0 V, f = 1.0 MHz Switching Characteristics td(on) Turn-On Time tr Turn-On Rise Time td(off) Turn-Off Delay Time tf Turn-Off Fall Time Qg Total Gate Charge Qgs Gate-Source Charge Qgd VDS = 300 V, ID = 12 A, RG = 25 Ω (Note 4,5) VDS = 480V, ID = 12 A, VGS = 10 V (Note 4,5) Gate-Drain Charge Source-Drain Diode Maximum Ratings and Characteristics IS Continuous Source-Drain Diode Forward Current -- -- 12 ISM Pulsed Source-Drain Diode Forward Current -- -- 48 VSD Source-Drain Diode Forward Voltage IS = 12.0 A, VGS = 0 V -- -- 1.4 V trr Reverse Recovery Time -- 420 -- ㎱ Qrr Reverse Recovery Charge IS = 12.0 A, VGS = 0 V diF/dt = 100 A/μs (Note 4) -- 4.9 -- μC Notes ; 1. Repetitive Rating : Pulse width limited by maximum junction temperature 2. L=11mH, IAS=12A, VDD=50V, RG=25Ω, Starting TJ =25°C 3. ISD≤12A, di/dt≤200A/μs, VDD≤BVDSS , Starting TJ =25 °C 4. Pulse Test : Pulse Width ≤ 300μs, Duty Cycle ≤ 2% 5. Essentially Independent of Operating Temperature A HF12N65 Electrical Characteristics TC=25 °C HF12N65 ID, Drain Current [A] ID, Drain Current [A] Typical Characteristics VGS, Gate-Source Voltage [V] VDS, Drain-Source Voltage [V] Figure 1. On Region Characteristics RDS(ON)[Ω], Drain-Source On-Resistance IDR, Reverse Drain Current [A] Figure 2. Transfer Characteristics VSD, Source-Drain Voltage [V] ID, Drain Current [A] Figure 4. Body Diode Forward Voltage Variation with Source Current and Temperature Figure 3. On Resistance Variation vs Drain Current and Gate Voltage 3000 Ciss Ciss = Cgs + Cgd (Cds = shorted) Coss = Cds + Cgd Crss = Cgd Capacitances [pF] 2500 2000 Coss 1500 1000 ∗ Note ; 1. VGS = 0 V 2. f = 1 MHz Crss 500 12 VDS = 120V VGS, Gate-Source Voltage [V] 3500 10 VDS = 300V VDS = 480V 8 6 4 2 * Note : ID = 12.0A 0 10-1 100 101 0 0 4 8 12 16 20 24 28 32 36 VDS, Drain-Source Voltage [V] QG, Total Gate Charge [nC] Figure 5. Capacitance Characteristics Figure 6. Gate Charge Characteristics 40 HF12N65 Typical Characteristics (continued) BVDSS, (Normalized) Drain-Source Breakdown Voltage 3.0 RDS(ON), (Normalized) Drain-Source On-Resistance 2.5 2.0 1.5 1.0 * Note: 1. VGS=10V 2. ID=6.0A 0.5 0.0 -100 -50 0 50 100 150 200 TJ, Junction Temperature[oC] TJ, Junction Temperature [oC] Figure 8. On-Resistance Variation vs Temperature Figure 7. Breakdown Voltage Variation vs Temperature 14 Operation in This Area is Limited by R DS(on) 12 101 100 ID, Drain Current [A] 10 µs 100 µs 1 ms 10 ms 100 ms DC 10-1 * Notes : 1. TC = 25 oC 10-2 100 10 8 6 4 2 2. TJ = 150 oC 3. Single Pulse 101 102 0 25 103 50 75 100 Figure 9. Maximum Safe Operating Area Figure 10. Maximum Drain Current vs Case Temperature D=0.5 100 0.2 * Notes : 1. ZθJC(t) = 2.43 oC/W Max. 2. Duty Factor, D=t1/t2 3. TJM - TC = PDM * ZθJC(t) 0.1 0.05 10-1 0.02 PDM 0.01 t1 single pulse 10-2 -5 10 -4 10 125 TC, Case Temperature [oC] VDS, Drain-Source Voltage [V] ZθJC(t), Thermal Response ID, Drain Current [A] 102 -3 10 -2 10 t2 -1 10 100 t1, Square Wave Pulse Duration [sec] Figure 11. Transient Thermal Response Curve 101 150 HF12N65 Fig 12. Gate Charge Test Circuit & Waveform 50KΩ 12V VGS Same Type as DUT Qg 200nF 10V 300nF VDS VGS Qgs Qgd DUT 3mA Charge Fig 13. Resistive Switching Test Circuit & Waveforms RL VDS VDS 90% VDD RG ( 0.5 rated VDS ) Vin DUT 10V 10% tr td(on) td(off) t on tf t off Fig 14. Unclamped Inductive Switching Test Circuit & Waveforms BVDSS 1 EAS = ---- LL IAS2 -------------------2 BVDSS -- VDD L VDS VDD ID BVDSS IAS RG 10V ID (t) DUT VDS (t) VDD tp Time HF12N65 Fig 15. Peak Diode Recovery dv/dt Test Circuit & Waveforms DUT + VDS _ IS L Driver RG VGS VGS ( Driver ) Same Type as DUT VDD • dv/dt controlled by RG • IS controlled by pulse period Gate Pulse Width D = -------------------------Gate Pulse Period 10V IFM , Body Diode Forward Current IS ( DUT ) di/dt IRM Body Diode Reverse Current VDS ( DUT ) Body Diode Recovery dv/dt Vf Body Diode Forward Voltage Drop VDD HF12N65 Package Dimension TO-220F ±0.20 ±0.20 0. 8± .1 20 2.54±0.20 6.68±0.20 0.70±0.20 12.42±0.20 3.30±0.20 2.76±0.20 1.47max 9.75±0.20 15.87±0.20 φ3 0.80±0.20 2.54typ 2.54typ 0.50±0.20
HF12N65
物料型号:HF12N65

器件简介: - 600V N-Channel MOSFET - 具有原创新设计、优越的雪崩坚固技术、坚固的栅氧技术、非常低的内在电容、卓越的开关特性 - 门极电荷:38 nC(典型值) - 扩展的安全工作区 - 较低的RDS(ON):0.53 Ω(典型值)@VGS=10V - 100%雪崩测试

引脚分配: - 1. Gate(栅极) - 2. Drain(漏极) - 3. Source(源极)

参数特性: - 绝对最大额定值:例如,Voss(漏源电压)650V,IOM(脉冲漏极电流)48A(注1),VGs(栅源电压)±30V等 - 热阻特性:例如,ReJC(结到外壳)2.43°C/W,ReJA(结到环境)62.5°C/W - 电气特性:例如,VGS阈值电压2.0-4.0V,RDS(ON)静态漏源导通电阻0.53-0.65Ω

功能详解: - 包括导通特性、关断特性、动态特性(如输入电容Ciss、输出电容Coss等)、开关特性(如总门极电荷Qg、开通时间td(on)等) - 源-漏二极管最大额定值和特性:例如,连续源-漏二极管正向电流12A,脉冲源-漏二极管正向电流48A

应用信息: - 该MOSFET适用于需要高电压和大电流的应用场合,文档中提供了多种测试电路和波形图,以展示其在不同条件下的性能。

封装信息: - TO-220F封装,文档提供了详细的封装尺寸数据。
HF12N65 价格&库存

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