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ESD9B5.0ST5G
Semiconductor
Compiance
Feature
80W peak pulse power per line (tP = 8/20μs)
SOD-923 package
Replacement for MLV(0402)
Bidirectional configurations
Response time is typically < 1ns
Low clamping voltage
RoHS compliant
Transient protection for data lines to
EC61000-4-2(ESD) ±30KV(air), ±30KV(contact );
IEC61000-4-4 (EFT) 40A (5/50ns)
Applications
Cellular phones
SOD-923
Portable devices
Digital cameras
Power supplies
Mechanical Characteristics
Lead finish:100% matte Sn(Tin)
Mounting position: Any
Qualified max reflow temperature:260℃
Device meets MSL 1 requirements
Pure tin plating: 7 ~ 17 um
Pin flatness:≤3mil
Electronics Parameter
Symbol
Parameter
VRWM
Peak Reverse Working Voltage
IR
Reverse Leakage Current @ VRWM
VBR
Breakdown Voltage @ IT
IT
Test Current
IPP
Maximum Reverse Peak Pulse Current
VC
Clamping Voltage @ IPP
PPP
Peak Pulse Power
CJ
Junction Capacitance
IF
Forward Current
VF
Forward Voltage @ IF
IPP
VC VBR VRW M
IT
IR
I
IR
IT
VRW M VBR VC
V
IPP
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ESD9B5.0ST5G
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Compiance
Electrical characteristics per line@25℃ (unless otherwise specified)
Parameter
Symbol
Conditions
Min.
Peak Reverse Working Voltage
VRWM
Breakdown Voltage
VBR
It = 1mA
Reverse Leakage Current
IR
VRWM = 5V T=25℃
Maximum Reverse Peak Pulse Current
IPP
Clamping Voltage
VC
IPP=1A
8
V
Clamping Voltage
VC
IPP=3A
13
V
Clamping Voltage
VC
IPP=5A
15
V
Junction Capacitance
Cj
VR=0V f = 1MHz
15
pF
5.6
Typ.
Max.
Units
5
V
7.8
V
1.0
μA
6.7
A
5
12
Absolute maximum rating@25℃
Rating
Symbol
Value
Units
Peak Pulse Power (tp=8/20μs)
Ppp
80
W
Operating Temperature
TJ
-55 to +150
℃
Storage Temperature
TSTG
-55 to +150
℃
Typical Characteristics
100
80
80
60
% Of Rated Power
IPP – Peak Pulse Current - % of
IPP
tf=8μs
100
tP =20μs( IPP /2)
40
20
60
40
20
0
0
5
10
15
20
t - Time -μs
Fig 1.Pulse Waveform
25
30
0
0
25
50
75
100
125
150
TL – Lead Temperature - ℃
Fig 2.Power Derating Curve
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ESD9B5.0ST5G
Semiconductor
Compiance
20
16
7.1
6.9
12
IR(nA)
Breakdown Voltage (V) (VZ @ IZ)
7.3
8
6.7
4
6.5
6.3
-55
+25
0
+150
0
25
50
Temperature (ºC)
75
100
125
150
Temperature (ºC)
Fig 3.Typical Breakdown Voltage vs. Temperature
Fig 4.Typical Leakage Current vs. Temperature
20
1000
Pulse waveform: tp=8/20us
Peak Pulse Power (W)
VC-Clamping Voltage (V)
16
12
8
4
0
0
2
4
6
IPP-Peak pulse current (A)
Fig 5. Clamping voltage vs. Peak pulse current
8
100
10
1
1
10
100
1000
Pulse Duration(us)
Fig 6. Non-Repetitive Peak Pulse Power vs. Pulse time
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ESD9B5.0ST5G
Semiconductor
Compiance
PACKAGE MECHANICAL DATA
Dim
Millimeters
Inches
Min
Nom
Max
Min
Nom
Max
A
0.36
0.40
0.43
0.014
0.016
0.017
b
0.15
0.20
0.25
0.006
0.008
0.010
c
0.07
0.12
0.17
0.003
0.005
0.007
D
0.75
0.80
0.85
0.030
0.031
0.033
E
0.55
0.60
0.65
0.022
0.024
0.026
HE
0.95
1.00
1.05
0.037
0.039
0.041
L
0.05
0.10
0.15
0.002
0.004
0.006
Dimensions: Millimeters
REEL SPECIFICATION
P/N
PKG
QTY
ESD9B5.0ST5G
SOD-923
8000
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ESD9B5.0ST5G
Semiconductor
Compiance
Attention
■ Any and all MSKSEMI Semiconductor products described or contained herein do not have specifications
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aircraft's control systems, or other applications whose failure can be reasonably expected to result in serious
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at values that exceed, even momentarily, rated values (such as maximum ratings, operating condition ranges, or
other parameters) listed in products specificationsof any andall MSKSEMI Semiconductor products described
orcontained herein.
■ Specifications of any and all MSKSEMI Semiconductor products described or contained herein stipulate the
performance, characteristics, and functions of the described products in the independent state, and are not
guarantees of the performance, characteristics, and functions of the described products as mounted in the
customer’s products or equipment. To verify symptoms and states that cannot be evaluated in an independent
device, the customer should always evaluate and test devices mounted in the customer’sproducts orequipment.
■ MSKSEMI Semiconductor. strives to supply high-quality high-reliability products. However, any and all
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or events cannot occur. Such measures include but are not limited to protective circuits anderror prevention
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■ In the event that any or all MSKSEMI Semiconductor products(including technical data, services) described
or contained herein are controlled under any of applicable local export control laws and regulations, such
products must not be exported without obtaining the export license from theauthorities concerned in
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mechanical, including photocopying and recording, or any information storage or retrieval system, or otherwise,
without the prior written permission of MSKSEMI Semiconductor.
■ Information (including circuit diagrams and circuit parameters) herein is for example only ; it is not
guaranteed for volume production. MSKSEMI Semiconductor believes information herein is accurate and
reliable, but no guarantees are made or implied regarding its use or any infringementsof intellectual property
rights or other rightsof third parties.
■ Any and all information described or contained herein are subject to change without notice due to
product/technology improvement, etc. Whendesigning equipment, referto the "Delivery Specification" for the
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