CD4078B
CMOS 8-Input NOR/OR
High-Voltage Types(20-Volt Rating)
DESCRIPTION
CD4078B NOR/OR Gate provides the system designer with direct implementa-tion of the positivelogic
8-input NOR and OR functions and supplements the existing family of CMOS gates.
The CD4078B types are supplied in 14-lead dual-in-line plastic packages (N suffix).14-lead small-outline
packages(M suffixes) and 14 lead thin shrink small-outline packages(MT suffixes).
Features
Medium-Speed Operation: tPHL,tPLH=75ns(typ.) at VDD=10V
Buffered inputs and output
5V,10V and 15V parametric ratings
Standardized symmetrical output characteristics
100% tested for quiescent current at 20V
Maximum input current of 1uA at 18V over fult package-temperature range:100nA at 18V and 25℃
Noise margin (over full package-temperature range): 1V at VDD=5V 2V at VDD=10V 2.5V at VDD=15V
Meets all requirements of JEDEC Tentative Standard No. 13B“Standard Specifications for
Description of B Series CMOS Devices‘’
ORDERING INFORMATION
Device
Package Type
Marking
Packing
Packing Qty
CD4078BE
DIP14
CD4078BE
TUBE
1000pcs/box
CD4078BM /TR
SOP14
CD4078B
REEL
2500pcs/reel
CD4078BMT/TR
TSSOP14
CD4078B
REEL
2500pcs/reel
CONNECTION DIAGRAM
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CD4078B
FUNCTIONAL DIAGRAM
ABSOLUTE MAXIMUM RATINGS
CONDITION
MIN
MAX
Voltages referenced to vss terminal
-0.5V
+20V
Input voltage range all inputs
-0.5V
Vdd+0.5V
DC input current any one input
±10mA
Device dissipation per output
for ta=full package-temperature range(all
transistor
package types)
100mW
operating-temperature range(TA)
-40°C
+85°C
storage temperature range(Tstg)
-65°C
+150°C
Lead temperature(during soldering):
+265°C
at distance 1/16±1/32inch(1.59+079mm)from case for 10s max
ORDERING INFORMATION
Device
Package Type
Marking
Packing
Packing Qty
CD4078BE
DIP14
CD4078BE
TUBE
1000pcs/box
CD4078BM /TR
SOP14
CD4078B
REEL
2500pcs/reel
CD4078BMT/TR
TSSOP14
CD4078B
REEL
2500pcs/reel
RECOMMENDED OPERATING CONDIYIONS
For maximum reliability,nominal operating conditions should be selected so shat operation is laways
within the following ranges:
CHARACTERISTIC
Supply Voltage Range (For TA Full Package Temperature Range)
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Min.
Max.
Units
5
18
V
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CD4078B
DYNAMIC ELECTRICAL CHARACTERISTICS
At TA=25℃;lnput tr tf=20ns,CL=50pf,RL=200kΩ
CHARACTERISTIC
Propagation Delay Time,
tPHL,tPLH
Propagation Time,
tPHL,tPLH
Lnput Caoacitance, CIN
TEST CONDITIONS
VDD VOLTSZ
5
10
15
5
10
15
LIMITS
Any luput
TYP.
MAX.
150
75
55
400
50
40
5
300
150
110
200
100
80
7.5
UNITS
ns
ns
pF
STATIC ELECTRICAL CHARACTCRISTICS
CHARACTER.
ISTIC
Quiescent Device Current,
IDD Max.
Output Low (Sink) Current
lOL Min.
Output High
(Source) Current,
IOH Min.
Output Voitage Lew Level,
VOL Max.
Output Voitage High Level.
VOH Min.
Input Low Voltage.
VIL Max.
Input High Voltage.
VIN Min.
Input Current VIN Max.
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CONDITIONS
VO
(V)
-
-
-
-
0.4
0.5
1.5
4.6
2.5
9.5
13.5
-
-
-
-
-
-
0.5
4.5
1.9
1.5
13.5
0.5
4.5
1.9
1.5
13.5
LIMITS AT INDICATED TEMPERATURES(℃)
0.05
0.05
0.05
1.95
9.95
14.95
4.95
9.95
14.95
+25
Typ.
0.01
0.01
0.01
0.02
1
2.6
6.8
-1
-3.2
-2.6
-6.8
0
0
0
5
10
15
5
1.5
-
-
1.5
-
10
3
-
-
3
-
15
4
-
-
4
-
5
3.5
3.5
-
-
-
10
7
7
-
-
-
15
11
11
-
-
0.18
18
-
±10-5
±0.1
VIN
(V)
0.5
0.10
0.15
0.20
0.5
0.10
0.15
0.5
0.5
0.10
0.15
0.5
0.10
0.15
0.5
0.10
0.15
VDD
(V)
5
10
15
20
5
10
15
5
5
10
15
5
10
15
5
10
15
-
-40
0.25
0.5
1
5
0.61
1.5
4
-0.61
-1.8
-1.5
-4
±0.1
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+85
7.5
15
30
150
0.42
1.1
2.8
-0.42
-1.3
-1.1
-2.8
±1
Min.
-
-
-
-
0.51
1.3
3.4
-0.51
-1.6
-1.3
-3.4
Max.
0.25
0.5
1
5
UNITS
µA
mA
0.05
0.05
0.05
V
V
µA
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CD4078B
TYPICAL CHARA CTERISTIC
Fig.1-Logic diagram.
Fig.2-Typocal output low(sink)current
Fig.3-Minimum output low(sink)current
characteristics.
characteristics.
Fig.4 -Typocal output high(souece)current
Fig.5 -Minimum output high(source)currnt
characteristics.
characteristics.
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CD4078B
Fig.6 -Typocal transition time as a function of load
Fig.7 -Typocal propagation delay time as a function
capacitance.
of load capacirance.
Fig.8 -Schematic diagram.
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CD4078B
Fig.9 -Typocal voltage transfer charac-teristics(NOR
Fig.10 -Typocal dynamic power dissipation as a
output).
function of frequency.
Fig.11 -Quiescent-device-current test circut.
Fig.12 -lnput current test circuit.
Fig.13 -lnput voltage test circuit.
Fig.14 -Dynamic power dissipation test circuit
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CD4078B
Physical Dimensions
DIP-14L
B
L1
L
E
D1
D
d
A
c
a
Dimensions In Millimeters(DIP14L)
A
B
D
D1
E
L
L1
a
c
Min:
6.10
18.94
8.40
7.42
3.10
0.50
3.00
1.50
0.40
Max:
6.68
19.56
9.00
7.82
3.55
0.70
3.60
1.55
0.50
Symbol:
d
2.54 BSC
SOP14L
Q
A
C
C1
B
D
A1
a
0.25
b
Dimensions In Millimeters(SOP14L)
A
A1
B
C
C1
D
Min:
1.35
0.05
8.55
5.80
3.80
0.40
0°
0.35
Max:
1.55
0.20
8.75
6.20
4.00
0.80
8°
0.45
Symbol:
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Q
a
b
1.27 BSC
2022 JULY
CD4078B
Physical Dimensions
TSSOP-14L
Dimensions In Millimeters(TSSOP14L)
A
A1
B
C
C1
D
Min:
0.85
0.05
4.90
6.20
4.30
0.40
0°
0.20
Max:
0.95
0.20
5.10
6.60
4.50
0.80
8°
0.25
Symbol:
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Q
a
b
0.65 BSC
2022 JULY
CD4078B
IMPORTANT STATEMENT:
Huaguan Semiconductor Co,Ltd. reserves the right to change the products and
services provided without notice. Customers should obtain the latest relevant
information before ordering, and verify the timeliness and accuracy of this
information.
Customers are responsible for complying with safety standards and taking safety
measures when using our products for system design and machine manufacturing to
avoid potential risks that may result in personal injury or property damage.
Our products are not licensed for applications in life support, military, aerospace,
etc., so we do not bear the onsequences of the application of these products in these
fields.
Huaguan Semiconductor Co,Ltd. the performance of the semiconductor products
produced by the company can reach the performance indicators that can be applied
at the time of sales. The use of testing and other quality control technologies is limite
d to the quality assurance scope of Huaguan semiconductor. Not all parameters of
each device need to be tested. The above documents are for reference only, and all
are subject to the physical parameters.
Our documentation is only permitted to be copied without any tampering with the
content, so we do not accept any responsibility or liability for the altered documents.
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