AP55T10GH
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N-Channel 100-V (D-S) MOSFET
FEATURES
PRODUCT SUMMARY
VDS (V)
RDS(on) ()
100
0.0185 at VGS = 10 V
ID
(A)a
60
Qg (Typ.)
• TrenchFET® Power MOSFET
• 100 % Rg and UIS Tested
38 nC
APPLICATIONS
• Primary Side Switch
• Isolated DC/DC Converter
TO-252
D
G
G
D
S
S
N-Channel MOSFET
Top View
ABSOLUTE MAXIMUM RATINGS (TA = 25 °C, unless otherwise noted)
Parameter
Symbol
Limit
Drain-Source Voltage
VDS
100
Gate-Source Voltage
VGS
± 20
TC = 100 °C
TA = 25 °C
45
ID
9.2b
6.8b
TA = 100 °C
IDM
Pulsed Drain Current
Continuous Source-Drain Diode Current
Single Pulse Avalanche Current
Avalanche Energy
TC = 25 °C
TA = 25 °C
L = 0.1 mH
Maximum Power Dissipation
TA = 25 °C
60a
IS
2b
IAS
45
EAS
101
mJ
136.4
68.2
PD
W
3b
1.5b
TA = 100 °C
TJ, Tstg
Operating Junction and Storage Temperature Range
A
140
TC = 25 °C
TC = 100 °C
V
60a
TC = 25 °C
Continuous Drain Current (TJ = 150 °C)
Unit
°C
- 55 to 175
THERMAL RESISTANCE RATINGS
Parameter
Maximum Junction-to-Ambient
Symbol
b
Maximum Junction-to-Case
Steady State
Typical
Maximum
RthJA
40
50
RthJC
0.85
1.1
Unit
°C/W
Notes:
a. Package limited.
b. Surface mounted on 1" x 1" FR4 board.
1
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SPECIFICATIONS (TJ = 25 °C, unless otherwise noted)
Parameter
Symbol
Test Conditions
Min.
VDS
VGS = 0 V, ID = 250 µA
100
Typ.
Max.
Unit
Static
Drain-Source Breakdown Voltage
VDS Temperature Coefficient
VDS/TJ
VGS(th) Temperature Coefficient
VGS(th)/TJ
Gate-Source Threshold Voltage
ID = 250 µA
VGS(th)
VDS = VGS, ID = 250 µA
Gate-Source Leakage
IGSS
VDS = 0 V, VGS = ± 20 V
Zero Gate Voltage Drain Current
IDSS
On-State Drain Currenta
Drain-Source On-State Resistancea
mV/°C
- 12.5
2.5
5
V
± 100
nA
VDS = 100 V, VGS = 0 V
1
VDS = 100 V, VGS = 0 V, TJ = 125 °C
50
ID(on)
VDS 5 V, VGS = 10 V
RDS(on)
VGS = 10 V, ID = 15 A
gfs
VDS = 15 V, ID = 15 A
Forward Transconductancea
V
110
50
µA
A
0.0185
33
S
Dynamicb
Input Capacitance
Ciss
2400
Output Capacitance
Coss
Reverse Transfer Capacitance
Crss
80
Total Gate Charge
Qg
38
Gate-Source Charge
Qgs
Gate-Drain Charge
Qgd
f = 1 MHz
VDD = 50 V, RL = 1
ID 50 A, VGEN = 10 V, Rg = 1
tr
td(off)
Fall Time
230
pF
70
14
nC
12
td(on)
Rise Time
Turn-Off Delay Time
VDS = 50 V, VGS = 10 V, ID = 50 A
Rg
Gate Resistance
Turn-On Delay Time
VDS = 50 V, VGS = 0 V, f = 1 MHz
tf
1.6
2.5
12
20
10
20
18
35
8
15
ns
Drain-Source Body Diode Characteristics
Continuous Source-Drain Diode
TC = 25 °C
IS
Pulse Diode Forward Currenta
ISM
Body Diode Voltage
VSD
Body Diode Reverse Recovery Time
trr
Body Diode Reverse Recovery Charge
Qrr
Reverse Recovery Fall Time
ta
Reverse Recovery Rise Time
tb
50
100
IS = 15 A
IF = 50 A, dI/dt = 100 A/µs, TJ = 25 °C
A
0.85
1.5
V
80
120
ns
160
240
nC
57
23
ns
Notes:
a. Pulse test; pulse width 300 µs, duty cycle 2 %.
b. Guaranteed by design, not subject to production testing.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
2
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TYPICAL CHARACTERISTICS (25 °C, unless otherwise note)
100
2.0
VGS = 10 V thru 8 V
1.6
I D - Drain Current (A)
I D - Drain Current (A)
80
VGS = 7 V
60
40
20
1.2
0.8
TC = 25 °C
0.4
VGS = 6 V
TC = 125 °C
TC = - 55 °C
0
0.0
0
1
2
3
4
5
0
2
4
6
8
VDS - Drain-to-Source Voltage (V)
VGS - Gate-to-Source Voltage (V)
Output Characteristics
Transfer Characteristics
10
0.036
75
45
R DS(on) - On-Resistance (Ω)
g fs - Transconductance (S)
TC = - 55 °C
60
TC = 25 °C
TC = 125 °C
30
15
0.027
VGS = 10 V
0.018
0.009
0.000
0
0
10
20
30
0
50
40
20
40
60
80
ID - Drain Current (A)
ID - Drain Current (A)
Transconductance
On-Resistance vs. Drain Current
100
3500
0.10
2800
C - Capacitance (pF)
R DS(on) - On-Resistance (Ω)
ID = 15 A
0.08
0.06
0.04
TA = 150 °C
Ciss
2100
1400
700
0.02
Coss
TA = 25 °C
0
0.00
4
5
6
7
8
9
10
Crss
0
20
40
60
80
VGS - Gate-to-Source Voltage (V)
VDS - Drain-to-Source Voltage (V)
On-Resistance vs. Gate-to-Source Voltage
Capacitance
100
3
AP55T10GH
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TYPICAL CHARACTERISTICS (25 °C, unless otherwise noted)
20
2.5
ID = 15 A
VDS = 50 V
15
R DS(on) - On-Resistance
(Normalized)
VGS - Gate-to-Source Voltage (V)
ID = 20 A
VDS = 80 V
10
5
0
0
20
40
80
60
1.0
- 25
0
25
50
75
100
125
150
Qg - Total Gate Charge (nC)
TJ - Junction Temperature (°C)
Gate Charge
On-Resistance vs. Junction Temperature
175
0.7
TJ = 150 °C
0.2
VGS(th) Variance (V)
10
I S - Source Current (A)
VGS = 10 V
1.5
0.5
- 50
100
100
TJ = 25 °C
1
0.1
0.01
0.001
0.0
2.0
- 0.3
ID = 5 mA
- 0.8
- 1.3
- 1.8
0.2
0.4
0.6
0.8
1.0
- 2.3
- 50
1.2
ID = 250 µA
- 25
0
VSD - Source-to-Drain Voltage (V)
25
50
75
100
125
150
175
TJ - Temperature (°C)
Source-Drain Diode Forward Voltage
Threshold Voltage
600
300
500
240
Power (W)
Power (W)
400
180
120
200
TA = 25 °C
60
0
0.001
300
TC = 25 °C
100
0
0.01
0.1
1
10
100
1000
Time (s)
Single Pulse Power, Junction-to-Ambient
0 .001
0.01
0.1
1
10
Time (s)
Single Pulse Power, Junction-to-Case
4
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TYPICAL CHARACTERISTICS (25 °C, unless otherwise noted)
1000
1000
10
1 ms
1
10 ms
100 ms
0.1
1s
10 s
100 s, DC
TA = 25 °C
Single Pulse
0.01
0.1
100
10 µs, 100 µs
Limited
by R DS(on)*
I D - Drain Current (A)
I D - Drain Current (A)
100
1.0
10
100
Limited
by R DS(on)*
1 ms
10 ms
100 ms, DC
1
TC = 25 °C
Single Pulse
0.01
0.1
1.0
10
100
1000
VDS - Drain-to-Source Voltage (V)
* VGS > minimum VGS at which R DS(on) is specified
VDS - Drain-to-Source Voltage (V)
* VGS > minimum VGS at which R DS(on) is specified
Safe Operating Area, Junction-to-Case
Safe Operating Area, Junction-to-Ambient
60
10
50
I D - Drain Current (A)
8
I D - Drain Current (A)
100 µs
10
0.1
1000
10 µs
6
4
2
Package Limited
40
30
20
10
0
0
0
25
50
75
100
125
150
175
TA - Ambient Temperature (°C)
Current Derating**, Junction-to-Ambient
0
25
50
75
100
125
150
175
TC - Case Temperature (°C)
Current Derating**, Junction-to-Case
** The power dissipation PD is based on TJ(max.) = 175 °C, using junction-to-case thermal resistance, and is more useful in settling the upper
dissipation limit for cases where additional heatsinking is used. It is used to determine the current rating, when this rating falls below the package
limit.
5
AP55T10GH
www.VBsemi.tw
TYPICAL CHARACTERISTICS (25 °C, unless otherwise noted)
4.0
180
3.5
160
140
120
2.5
Power (W)
Power (W)
3.0
2.0
1.5
100
80
60
1.0
40
0.5
20
0.0
0
0
25
50
75
100
125
150
TA - Ambient Temperature (°C)
Power Derating**, Junction-to-Ambient
175
0
25
50
75
100
125
150
175
TC - Case Temperature (°C)
Power Derating**, Junction-to-Case
** The power dissipation PD is based on TJ(max) = 175 °C, using junction-to-case thermal resistance, and is more useful in settling the upper
dissipation limit for cases where additional heatsinking is used. It is used to determine the current rating, when this rating falls below the package
limit.
6
AP55T10GH
www.VBsemi.tw
TYPICAL CHARACTERISTICS (25 °C, unless otherwise noted)
Normalized Effective Transient
Thermal Impedance
1
Duty Cycle = 0.5
0.2
0.1
Notes:
0.1
PDM
t1
0.05
t2
1. Duty Cycle, D =
t1
t2
2. Per Unit Base = RthJA = 50 °C/W
0.02
3. TJM - TA = PDMZthJA(t)
Single Pulse
0.01
10 -4
10 -3
10 -2
4. Surface Mounted
10 -1
1
100
10
1000
Square Wave Pulse Duration (s)
Normalized Thermal Transient Impedance, Junction-to-Ambient
1
Normalized Effective Transient
Thermal Impedance
Duty Cycle = 0.5
0.2
0.1
0.1
0.05
0.02
Single Pulse
0.01
10 -4
10 -3
10 -2
10 -1
1
Square Wave Pulse Duration (s)
Normalized Thermal Transient Impedance, Junction-to-Case
7
AP55T10GH
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