HL-503H3GD
HL-503H3GD
ATTENTION
OBSERVE PRECAUTIONS
FOR HANDLING
ELECTROSTATIC
DISCHARGE
SENSIT IVE
DEVICES
Features
•φ5 LAMP LED
•LOW POWER CONSUMPTION.
•CABINED VIEW ING ANGLE.
•IDEAL FOR BACKLIGHT AND INDICATOR.
•PACKAGE: 1000PCS / BAG.
Description
Package Dimensions
This devices are made with TS InGaN.
5
5.8
1.0
8.7
4.9
1.5MAX
2
1
28.0
2.0~1.0mm
0.5
1:ANODE
2:CATHODE
2.54
2
Dimension Tolerance (UNIT:mm)
Tolerance
Grade
0.5~3
3~6
6~30
30~120
±0.1
±0.2
±0.3
±0.5
Chip
SPEC NO.:
1
Lens Color
Material
Emitting Color
InGaN
Greenish
Yellow
REV NO.:A/2
Color Diffused
DATE:Sep/06/2010
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PAGE:1/4
HL-503H3GD
■Absolute Maximum Rating
Item
Symbol
Value
Unit
Forward Current
IF
20
mA
Peak Forward Current*
IFP
100
mA
Reverse Voltage
VR
5
V
Power Dissipation
PD
80
mW
Electrostatic discharge
ESD
2000
V
Operation Temperature
Topr
-30∽+80
℃
Storage Temperature
Tstg
-30∽+80
℃
Lead Soldering Temperature*
Tsol
Max. 260℃ for 5sec Max.
*IFP Conditions:Pulse Width≤10msec
*Tsol Conditions:3mm from the base of the epoxy bulb
■ Typical Optical/ Electrical Characteristics
Item
Luminous Intensity
Forward Voltage
Viewing
Angle
DominateWavelength
Recommend
Forward Current
Reverse Current
Notes:
Ta=25℃
Symbol Condition Rank
Iv
VF
IF=20mA
Min.
Typ.
Max.
Unit
E
22
30
mcd
F
30
40
mcd
G
40
55
mcd
1.8
2.2
2.6
V
2θ 1/2
--
45
--
deg
λD
565
--
575
nm
IF(rec)
--
--
--
20
mA
IR
Vr=5V
--
--
20
uA
Tolerance :VF±0.1V,λd±2 nm,IV(φV) ±15%,2θ 1/2±15%
SPEC NO.:
REV NO.:A/2
DATE:Sep/06/2010
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HL-503H3GD
■ Reliability Performance
Test Items And Result
Test
Duration
Sample
Size
AC/RE
1000 hrs
22pcs
0/1
100 cycles
22 pcs
0/1
100 cycles
22 pcs
0/1
1000 hrs
22 pcs
0/1
Ta=100℃±5℃
1000 hrs
22 pcs
0/1
Ta=-40℃±5℃
1000 hrs
22 pcs
0/1
1times
22 pcs
0/1
3times
22 pcs
0/1
Test
Classification
Test Item
Test Conditions
Life Test
Room Temperature
DC Operating Life Test
Ta=25℃±5℃,IF
=20mA
100℃±5℃ 5min
↑↓
-40℃±5℃ 5min.
100℃±5℃ 30min
↑↓5min
-40℃±5℃ 30min.
85℃±5℃/85% RH
IF=5mA
Thermal Shock Test
Temperature Cycle Test
Environment
Test
High Temperature &
High Humidity Test
High Temperature
Storage
Low Temperature
Storage
Resistance to
Soldering Heat
Mechanical
Test
Lead Integrity
60
50
40
30
20
10
0
20
40
60
80
100
1.6
1.4
1.2
1.0
0.8
0.6
0.4
-25
120
Forward Current vs.Forward Voltage
50
75
100
125
Luminous Spertrum(Ta=25℃)
2.8
40
Forward Voltage VF(V)
Forward Current If(mA)
25
Forward Voltage vs. Ambient Temperature
50
30
20
10
0
0
Ambient Temperature Ta(℃)
Ambient Temperature Ta(℃)
1.0
1.5
2.0
2.5
3.0
3.5
Forward Voltage VF(V)
SPEC NO.:
4.0
SPECTRAL RADIANCE
100
2.6
RELATIVE RESPONSE
100%=1.642e-G01
Forward Current If(mA)
Relative Intensity vs. Ambient Temperature
Relative Intensity IV%(mcd)
Forward Current vs. Ambient Temperature
0
Temp=260℃max
T=5sec max
Load 2.5N(0.25kgf)
0° ~
90° ~0°
2.4
2.2
2.0
1.8
1.6
-25
0
25
50
75
100
Ambient Temperature Ta(℃)
REV NO.:A/2
125
80
60
40
20
0
400
DATE:Sep/06/2010
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500
600
700
800
PAGE:3/4
nm
HL-503H3GD
Soldering:
1. Manual Of Soldering
The temperature of the iron tip should not be higher than 300℃and Soldering within 3 seconds per
solder-land is to be observed.
2. DIP soldering (Wave Soldering):
Preheating:120℃~150℃,within 120~180 sec.
Operation heating:245℃±5℃ within 5 sec.260℃(Max)
Gradual Cooling (Avoid quenching).
SPEC NO.:
REV NO.:A/2
DATE:Sep/06/2010
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