F501D
600V Depletion-Mode Power MOSFET
General Features
Proprietary Advanced Planar Technology
Depletion Mode (Normally On)
ESD improved Capability
Rugged Polysilicon Gate Cell Structure
Fast Switching Speed
RoHS Compliant
Halogen-free available
BVDSX
RDS(ON),typ.
IDSS
600V
350Ω
12mA
Applications
Synchronous Rectification
Normally-on Switches
Linear Amplifier, Converters
Constant Current Source
Telecom
Ordering Information
Part Number
F501D
Marking
F501D
Package
SOT-23
Brand
Absolute Maximum Ratings
Symbol
TC=25℃ unless otherwise specified
Parameter
F501D
VDSX
Drain-to-Source Voltage[1]
600
VGS
Gate-to-Source Voltage
±20
Unit
V
Continuous Drain Current
0.030
Continuous Drain Current @ Tc=70℃
0.025
Pulsed Drain Current [2]
0.120
ID
IDM
A
Gate source ESD (HBM-C= 100pF, R=1.5k Ω)
300
V
PD
Power Dissipation
0.5
W
TL
Soldering Temperature
Distance of 1.6mm from case for 10 seconds
300
TJ& TSTG
Operating and Storage Temperature Range
-55 to 150
VESD(G-S)
℃
Caution: Stresses greater than those listed in the “Absolute Maximum Ratings” may cause permanent damage to the device.
Thermal Characteristics
Symbol
RθJA
Parameter
Thermal Resistance, Junction-to-Ambient
F501D
Unit
250
K/W
©2016 Perfect Intelligent Power Semiconductor Co., Ltd. All rights reserved. Information and data in this document are owned by PIP
Semiconductors and may not be edited, reproduced, or redistributed in any way without written consent from PIP.
Page 1 / 6
Rev. A.2016
F501D
Electrical Characteristics
OFF Characteristics
Symbol
TJ =25℃ unless otherwise specified
Parameter
Min.
Typ.
Max.
Unit
BVDSX
Drain-to-Source Breakdown Voltage
600
--
--
V
--
--
0.1
ID(OFF)
Drain-to-Source Leakage Current
IGSS
VGS=-15V, ID=250uA
VDS=600V, VGS=-5V
uA
--
--
10
--
--
+100
VDS=480V, VGS=-5V,
TJ =125℃
Gate-to-Source Leakage Current
VGS=+10V, VDS=0V
nA
--
--
-100
ON Characteristics
Symbol
Test Conditions
VGS=-10V, VDS=0V
TJ =25℃ unless otherwise specified
Parameter
Min.
Typ.
Max.
Unit
Test Conditions
12
--
--
mA
VDS=25V, VGS=0V
--
350
700
Ω
VGS=0V, ID=3.0mA[3]
IDSS
Saturated Drain-to-Source Current
RDS(ON)
Static Drain-to-Source
On-Resistance
VGS(OFF)
Gate-to-Source Cut-off Voltage
-2.7
-1.8
-1.0
V
VDS=3V, ID=8.0uA
gfs
Forward Transconductance
0.008
0.017
--
S
VDS=50V, ID =0.01A
Dynamic Characteristics
Symbol
Parameter
Essentially independent of operating temperature
Min.
Typ.
Max.
Ciss
Input Capacitance
--
50
--
Crss
Reverse Transfer Capacitance
--
1.1
--
Coss
Output Capacitance
--
4.5
--
Qg
Total Gate Charge
--
1.1
--
Qgs
Gate-to-Source Charge
--
0.5
--
Qgd
Gate-to-Drain (Miller) Charge
--
0.35
--
Resistive Switching Characteristics
Symbol
Parameter
Unit
Test Conditions
pF
VGS=-5V,
VDS=25V,
f=1.0MHZ
nC
VGS=-5V~+5V,
ID=10mA, VDS=400V
Essentially independent of operating temperature
Min.
Typ.
Max.
td(ON)
Turn-on Delay Time
--
9.9
--
trise
Rise Time
--
50
--
td(OFF)
Turn-Off Delay Time
--
55
--
tfall
Fall Time
--
130
--
Unit
Test Conditions
nS
©2016 Perfect Intelligent Power Semiconductor Co., Ltd. All rights reserved. Information and data in this document are owned by PIP
Semiconductors and may not be edited, reproduced, or redistributed in any way without written consent from PIP.
VDD=300V,
ID=10mA,
VGS= -5V~+5V
RG=6.1Ω
Page 2 / 6
Rev. A.2016
F501D
Source-Drain Body Diode Characteristics
Symbol
IS
ISM
VSD
trr
Qrr
Parameter
Continuous Source Current (Body Diode)
Maximum Pulsed Current (Body Diode)
Diode Forward Voltage
Reverse Recovery Time
Reverse Recovery Charge
TJ=25℃ unless otherwise specified
Min
Typ.
Max.
------
---240
625
0.025
0.100
1.2
---
Unit
Test Conditions
A
Ta=25°C
V
ns
nC
IS=15mA, VGS=-5V
IF=10mA,Tj = 25°C,
dIF/dt=100A/us, VR=300V
Note:
VGSO@IGS= ±1mA(Open Drain) >20
The built-in back-to-back Zener diodes have specifically been designed to enhance not only the device’s ESD capability, but also to make them safely
absorb possible voltage transients that may occasionally be applied from gate to source. In this respect the Zener voltage is appropriate to achieve an
efficient and cost-effective intervention to protect the device’s integrity. These integrated Zener diodes thus avoid the usage of external components.
©2016 Perfect Intelligent Power Semiconductor Co., Ltd. All rights reserved. Information and data in this document are owned by PIP
Semiconductors and may not be edited, reproduced, or redistributed in any way without written consent from PIP.
Page 3 / 6
Rev. A.2016
F501D
Typical Characteristics
©2016 Perfect Intelligent Power Semiconductor Co., Ltd. All rights reserved. Information and data in this document are owned by PIP
Semiconductors and may not be edited, reproduced, or redistributed in any way without written consent from PIP.
Page 4 / 6
Rev. A.2016
F501D
©2016 Perfect Intelligent Power Semiconductor Co., Ltd. All rights reserved. Information and data in this document are owned by PIP
Semiconductors and may not be edited, reproduced, or redistributed in any way without written consent from PIP.
Page 5 / 6
Rev. A.2016
F501D
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Semiconductors and may not be edited, reproduced, or redistributed in any way without written consent from PIP.
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Rev. A.2016