MDDG1C120R040K3
1200V N-Channel SiC Power MOSFET
V
Features
VDS
ID(Tc=25℃)
55A
•
•
•
•
•
RDS(on)
40mΩ
High Blocking Voltage with Low On-Resistance
High Speed Switching with Low Capacitances
Easy to Parallel and Simple to Drive
Resistant to Latch-Up
Halogen Free, RoHS Compliant
Package TO-247-3L
Benefits
•
•
•
•
Higher System Efficiency
Reduced Cooling Requirements
Increased Power Density
Increased System Switching Frequency
1
3
Equivalen t Circuit
Applications
•
•
•
•
•
•
2
Solar Inverters
Switch Mode Power Supplies
High Voltage DC/DC converters
Battery Chargers
Motor Drives
Pulsed Power Applications
Maximum Ratings (TC = 25 ˚C unless otherwise specified)
Symbol
Parameter
Value
Unit
Test Conditions
VDSmax
Drain - Source Voltage
1200
V
VGS = 0 V, ID = 100 μA
VGSmax
Gate - Source Voltage
-10/+25
V
Absolute maximum values
VGSop
Gate - Source Voltage
-5/+20
V
Recommended operational values
ID
ID(pulse)
PD
TJ , Tstg
Continuous Drain Current
55
36
A
VGS = 20 V, TC = 25˚C
Note
Fig. 19
VGS = 20 V, TC = 100˚C
Pulsed Drain Current
160
A
Pulse width tP limited by Tjmax
Fig. 22
Power Dissipation
278
W
TC=25˚C, TJ = 150 ˚C
Fig. 20
-55 to
+150
˚C
Operating Junction and Storage Temperature
TL
Solder Temperature
260
˚C
Md
Mounting Torque
1
8.8
Nm
lbf-in
1 / 10
1.6mm (0.063”) from case for 10s
M3 or 6-32 screw
V 1.0
MDDG1C120R040K3
1200V N-Channel SiC Power MOSFET
Electrical Characteristics (TC = 25˚C unless otherwise specified)
Symbol
V(BR)DSS
VGS(th)
Parameter
Drain-Source Breakdown Voltage
Gate Threshold Voltage
IDSS
Zero Gate Voltage Drain Current
IGSS
Gate-Source Leakage Current
RDS(on)
Drain-Source On-State Resistance
Min.
Typ.
Max.
Unit
V
VGS = 0 V, ID = 100 μA
3.2
4
V
VDS = VGS , ID = 10mA
V
VDS = VGS , ID = 10mA,TJ = 150 °C
100
μA
VDS = 1200 V, VGS = 0 V
250
nA
1200
2.0
2.4
1
44
82
18.2
gfs
Transconductance
Ciss
Input Capacitance
2440
Coss
Output Capacitance
171
Crss
Reverse Transfer Capacitance
11
Eoss
Coss Stored Energy
89
EON
Turn-On Switching Energy (Body Diode)
1.7
EOFF
Turn Off Switching Energy (Body Diode)
0.4
EON
Turn-On Switching Energy (External SiC Diode)
1.3
EOFF
Turn Off Switching Energy (External SiC Diode)
0.4
td(on)
Turn-On Delay Time
13
Rise Time
61
Turn-Off Delay Time
25
Fall Time
13
Internal Gate Resistance
1.8
Qgs
Gate to Source Charge
34
Qgd
Gate to Drain Charge
42
Qg
Total Gate Charge
120
tr
td(off)
tf
RG(int)
17.2
2 / 10
52
mΩ
S
Test Conditions
Fig. 11
VGS = 20 V, VDS = 0 V
VGS = 20 V, ID = 40 A
VGS = 20 V, ID = 40 A, TJ = 150 °C
VDS= 20 V, IDS= 40 A
VDS= 20 V, IDS= 40 A, TJ = 150 °C
VGS = 0 V
pF
Note
VDS = 1000 V
Fig.
4,5,6
Fig. 7
Fig.
17,18
f = 1 MHz
μJ
VAC = 25 mV
Fig 16
mJ
VDS = 800 V, VGS = -5/20 V
ID = 40A, RG(ext) = 2.5Ω, L= 99 μH
Fig. 25
VDS = 800 V, VGS = -5/20 V
ID = 40A, RG(ext) = 2.5Ω, L= 99 μH
ns
VDD = 800 V, VGS = -5/20 V
ID = 40 A
RG(ext) = 2.5 Ω, RL = 20 Ω
Timing relative to VDS
Per IEC60747-8-4 pg 83
Ω
f = 1 MHz, VAC = 25 mV
nC
VDS = 800 V, VGS = -5/20 V
ID = 40 A
Per IEC60747-8-4 pg 21
Fig. 27
Fig. 12
V 1.0
MDDG1C120R040K3
1200V N-Channel SiC Power MOSFET
Reverse Diode Characteristics
Symbol
VSD
IS
IS, pulse
Parameter
Diode Forward Voltage
Typ.
Max.
Unit
Test Conditions
4.0
V
VGS = - 5 V, ISD = 20 A, TJ = 25 °C
3.6
V
VGS = - 5 V, ISD = 20 A, TJ = 150 °C
TC= 25 °C
Continuous Diode Forward Current
60
A
Diode Pulse Current
160
A
trr
Reverse Recovery Time
54
ns
Qrr
Reverse Recovery Charge
283
nC
Irrm
Peak Reverse Recovery Current
15
A
Note
Fig. 8, 9,
10
Note 1
VGS = - 5 V,
Pulse width tP limited by Tjmax
VGS = - 5 V, ISD = 40 A TJ = 25 °C
VR = 800 V
dif/dt = 1000 A/µs
Note 1
Note (1): When using SiC Body Diode the maximum recommended VGS = -5V
Thermal Characteristics
Symbol
Parameter
Typ.
Max.
RθJC
Thermal Resistance from Junction to Case
0.33
0.45
RθJC
Thermal Resistance from Junction to Ambient
40
3 / 10
Unit
°C/W
Test Conditions
Note
Fig. 21
V 1.0
MDDG1C120R040K3
1200V N-Channel SiC Power MOSFET
Typical Performance
100
80
VGS = 20V
VGS = 18V
80
VGS = 14V
60
VGS = 12V
40
VGS = 10V
20
0
0.0
2.5
Conditions:
Tj = 25 °C
tp = < 200 µs
VGS = 16V
Drain-Source Current, IDS (A)
Drain-Source Current, IDS (A)
100
Conditions:
Tj = -55 °C
tp = < 200 µs
5.0
7.5
VGS = 12V
60
40
VGS = 10V
20
0.0
2.5
Drain-Source Voltage, VDS (V)
VGS = 14V
VGS = 18V
1.6
VGS = 16V
VGS = 12V
VGS = 20V
60
10.0
Conditions:
IDS = 40 A
VGS = 15 V
tp < 200 µs
1.8
On Resistance, RDS On (P.U.)
Drain-Source Current, IDS (A)
80
7.5
Figure 2. Output Characteristics TJ = 25 °C
2.0
Conditions:
Tj = 150 °C
tp = < 200 µs
5.0
Drain-Source Voltage, VDS (V)
Figure 1. Output Characteristics TJ = -55 °C
100
VGS = 14V
VGS = 16V
0
10.0
VGS = 20V
VGS = 18V
VGS = 10V
40
20
1.4
1.2
1.0
0.8
0.6
0.4
0.2
0
0.0
2.5
5.0
7.5
0.0
10.0
-50
-25
0
25
100
Tj = 150 °C
80
60
Tj = 25 °C
40
Tj = -55 °C
20
0
0
20
40
60
Drain-Source Current, IDS (A)
80
100
125
150
Conditions:
IDS = 40 A
tp < 200 µs
100
On Resistance, RDS On (mOhms)
On Resistance, RDS On (mOhms)
120
Conditions:
VGS = 15 V
tp < 200 µs
120
75
Figure 4. Normalized On-Resistance vs. Temperature
Figure 3. Output Characteristics TJ = 150 °C
140
50
Junction Temperature, Tj (°C)
Drain-Source Voltage, VDS (V)
100
Figure 5. On-Resistance vs. Drain Current
For Various Temperatures
80
VGS = 14 V
VGS = 16 V
60
VGS = 18 V
VGS = 20 V
40
20
0
-50
-25
0
25
50
75
Junction Temperature, Tj (°C)
100
125
150
Figure 6. On-Resistance vs. Temperature
For Various Gate Voltage
4 / 10
V 1.0
MDDG1C120R040K3
1200V N-Channel SiC Power MOSFET
100
TJ = 150 °C
60
TJ = 25 °C
TJ = -55 °C
40
20
0
2
4
6
8
10
12
-6
-4
-3
-2
0
-20
-40
Conditions:
Tj = 25°C
tp < 200 µs
Drain-Source Voltage VDS (V)
-7
-8
0
-60
Junction Temperature TJ (°C)
125
-2
-1
0
0
VGS = 0 V
-40
VGS = -2 V
-60
Drain-Source Voltage VDS (V)
25
-80
-100
Conditions:
IDS = 40 A
IGS = 50 mA
VDS = 800 V
TJ = 25 °C
20
1.0
100
-3
Figure 10. Body Diode Characteristic at 150 ºC
2.0
75
-4
VGS = -5 V
-100
3.0
50
-5
Conditions:
Tj = 150°C
tp < 200 µs
Gate-Source Voltage, VGS (V)
Threshold Voltage, Vth (V)
4.0
-6
-80
Conditons
VGS = VDS
IDS = 10 mA
25
-100
-20
Figure 9. Body Diode Characteristic at 25 ºC
0
-80
Figure 8. Body Diode Characteristic at -55 ºC
-1
5.0
0
-40
Drain-Source Voltage VDS (V)
VGS = -2 V
-25
0
Conditions:
Tj = -55°C
tp < 200 µs
VGS = 0 V
-50
-1
-20
14
VGS = -5 V
0.0
-2
-60
Drain-Source Current, IDS (A)
-5
Drain-Source Current, IDS (A)
-6
-3
VGS = -2 V
Figure 7. Transfer Characteristic for
Various Junction Temperatures
-7
-4
VGS = 0 V
Gate-Source Voltage, VGS (V)
-8
-5
VGS = -5 V
Drain-Source Current, IDS (A)
Drain-Source Current, IDS (A)
80
0
-7
-8
Conditions:
VDS = 20 V
tp < 200 µs
15
10
5
0
-5
150
0
20
40
60
80
100
120
140
Gate Charge, QG (nC)
Figure 11. Threshold Voltage vs. Temperature
Figure 12. Gate Charge Characteristics
5 / 10
V 1.0
MDDG1C120R040K3
1200V N-Channel SiC Power MOSFET
-3
-4
-2
-1
0
VGS = 0 V
-6
0
-20
VGS = 5 V
-40
VGS = 10 V
VGS = 15 V
-5
Drain-Source Current, IDS (A)
-5
Drain-Source Current, IDS (A)
-6
-60
VGS = 20 V
VGS = 0 V
-3
-2
-1
VGS = 5 V
-40
VGS = 20 V
Conditions:
Tj = 25 °C
tp < 200 µs
Drain-Source Voltage VDS (V)
-60
-80
-100
Figure 14. 3rd Quadrant Characteristic at 25 ºC
0
100
0
80
Stored Energy, EOSS (µJ)
-20
Drain-Source Current, IDS (A)
0
VGS = 15 V
VGS = 0 V
VGS = 5 V
VGS = 10 V
-40
VGS = 15 V
VGS = 20 V
-60
60
40
20
-80
Conditions:
Tj = 150 °C
tp < 200 µs
Drain-Source Voltage VDS (V)
0
-100
0
200
Figure 15. 3rd Quadrant Characteristic at 150 ºC
10000
600
800
10000
Ciss
1000
1000
1200
Conditions:
TJ = 25 °C
VAC = 25 mV
f = 1 MHz
1000
Capacitance (pF)
Coss
100
Crss
10
1
400
Drain to Source Voltage, VDS (V)
Figure 16. Output Capacitor Stored Energy
Conditions:
TJ = 25 °C
VAC = 25 mV
f = 1 MHz
Ciss
Capacitance (pF)
0
VGS = 10 V
Figure 13. 3rd Quadrant Characteristic at -55 ºC
-4
-1
-20
-100
Drain-Source Voltage VDS (V)
-5
-2
-80
Conditions:
Tj = -55 °C
tp < 200 µs
-6
-3
-4
0
50
100
Drain-Source Voltage, VDS (V)
Coss
100
Crss
10
150
1
200
0
200
400
600
Drain-Source Voltage, VDS (V)
800
1000
Figure 18. Capacitances vs. Drain-Source
Voltage (0-1000 V)
Figure 17. Capacitances vs. Drain-Source
Voltage (0-200 V)
6 / 10
V 1.0
MDDG1C120R040K3
1200V N-Channel SiC Power MOSFET
300
Conditions:
TJ ≤ 150 °C
50
Maximum Dissipated Power, Ptot (W)
Drain-Source Continous Current, IDS (DC) (A)
60
40
30
20
10
0
-50
-25
0
25
50
75
Case Temperature, TC (°C)
100
125
250
200
150
100
50
0
150
Figure 19. Continuous Drain Current Derating vs.
Case Temperature
-50
-25
0.1
0.05
0.02
0.01
100E-6
1E-3
10E-3
Time, tp (s)
100E-3
1.00
1 ms
100 ms
0.10
1
Conditions:
TC = 25 °C
D = 0,
Parameter: tp
0.1
1
EOn
2
1.5
EOff
1
1000
4
ETotal
EOn
3
2
EOff
1
0.5
0
100
Conditions:
TJ = 25 °C
VDD = 800 V
RG(ext) = 2.5 Ω
VGS = - 5/+20 V
L = 99 μH
5
ETotal
2.5
10
Drain-Source Voltage, VDS (V)
Figure 22. Safe Operating Area
Switching Loss (mJ)
Switching Loss (mJ)
3
150
100 µs
6
Conditions:
TJ = 25 °C
VDD = 600 V
RG(ext) = 2.5 Ω
VGS = - 5/+20 V
L = 99 μH
3.5
125
10 µs
Figure 21. Transient Thermal Impedance
(Junction - Case)
4
100
1 µs
0.01
10E-6
1E-6
4.5
75
10.00
SinglePulse
1E-3
50
Limited by RDS On
0.3
10E-3
25
Case Temperature, TC (°C)
100.00
0.5
100E-3
0
Figure 20. Maximum Power Dissipation Derating vs.
Case Temperature
Drain-Source Current, IDS (A)
Junction To Case Impedance, ZthJC (oC/W)
Conditions:
TJ ≤ 150 °C
0
10
20
30
40
50
Drain to Source Current, IDS (A)
60
70
80
Figure 23. Clamped Inductive Switching Energy vs.
Drain Current (VDD = 600V)
0
0
10
20
30
40
50
Drain to Source Current, IDS (A)
60
70
80
Figure 24. Clamped Inductive Switching Energy vs.
Drain Current (VDD = 800V)
7 / 10
V 1.0
MDDG1C120R040K3
1200V N-Channel SiC Power MOSFET
3.5
3
2.5
2.5
EOn
2
1.5
EOff
1
0
5
10
15
External Gate Resistor RG(ext) (Ohms)
20
25
2
EOn
ETotal with Schottky
1.5
EOn with Schottky
1
EOff with Schottky
110
Conditions:
TJ = 25 °C
VDD = 800 V
IDS = 40 A
VGS = -5/+20 V
100
90
80
0
EOff
0
25
50
75
100
125
Junction Temperature, TJ (°C)
150
175
200
Figure 26. Clamped Inductive Switching Energy vs.
Temperature
Figure 25. Clamped Inductive Switching Energy vs. RG(ext)
Switching Times (ns)
ETotal
0.5
0.5
0
Conditions:
IDS = 40 A
VDD = 800 V
RG(ext) = 2.5 Ω
VGS = -5/+20 V
L = 99 μH
ETotal
Switching Loss (mJ)
Switching Loss (mJ)
3
Conditions:
TJ = 25 °C
VDD = 800 V
IDS = 40 A
VGS = -5/+20 V
L = 99 μH
tr
td(off)
70
60
50
40
tf
30
td(on)
20
10
0
0
5
10
15
External Gate Resistor RG(ext) (Ohms)
20
25
Figure 27. Switching Times vs. RG(ext)
Figure 28. Switching Times Definition
8 / 10
V 1.0
MDDG1C120R040K3
1200V N-Channel SiC Power MOSFET
Test Circuit Schematic
Figure 29. Clamped Inductive Switching
Waveform Test Circuit
ESD Ratings
ESD Test
Resulting Classification
ESD-HBM
3A (4000V - 8000V)
ESD-CDM
C3 (>=1000V)
9 / 10
V 1.0
MDDG1C120R040K3
1200V N-Channel SiC Power MOSFET
Package Dimensions
ASE
Package TO-247-3
A
A1
A2
b
b1
b3
c
D
D1
D2
E
E1
E2
E3
E4
e
N
L
L1
�P
Q
S
T
W
X
4
1
T
V
2
3
U
W
Advanced
Semiconductor
Engineering Weihai, Inc.
PACKAGE
OUTLINE
4.83
2.29
1.91
1.07
1.91
2.87
0.55
20.80
16.25
0.95
15.75
13.10
3.68
1.00
12.38
5.44 BSC
3
19.81
4.10
3.51
5.49
6.04
5.21
2.54
2.16
1.33
2.41
3.38
0.68
21.10
17.65
1.25
16.13
14.15
5.10
1.90
13.43
20.32
4.40
3.65
6.00
6.30
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DWG NO.
98WHP03165A
ISSUE
O
DATE
Sep.05, 2016
.190
.090
.075
.042
.075
.113
.022
.819
.640
.037
.620
.516
.145
.039
.487
.214 BSC
3
.780
.161
.138
.216
.238
.205
.100
.085
.052
.095
.133
.027
.831
.695
.049
.635
.557
.201
.075
.529
.800
.173
.144
.236
.248
Pinout Information:
•
•
•
Pin 1 = Gate
Pin 2, 4 = Drain
Pin 3 = Source
Recommended Solder Pad Layout
TO-247-3
10 / 10
V 1.0