ics
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YTM32B1LE0x Data Sheet
Yu
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Support: YTM32B1LE05H0MLHT, YTM32B1LE05H0MLFT, YTM32B1LE05H0MLET,
YTM32B1LE05H0MFMR, YTM32B1LE05H0MFMIR, YTM32B1LE04H0MLFT, YTM32B1LE04H0MLET,
YTM32B1LE04H0MFMR
Document Number: YTM32B1LE0x DS
Rev.2.1, 2025/9/1
YUNTU reserves the right to change the production detail specifications as may be required to permit improvements in the design of its products.
Yuntu Microelectronics
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Data Sheet
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AEC-Q100 qualified
ASIL-B compliant
RoHS compliant
ARM Cortex-M0+
– Configurable Nested Vectored Interrupt Controller
(NVIC)
– Single-cycle access to I/O: Up to 50 percent faster
than standard I/O, improves reaction time to
external events allowing bit manipulation and
software protocol emulation
– Two-stage pipeline: Reduced number of cycles per
instruction (CPI), enabling faster branch instruction
and ISR entry, and reducing power consumption
– Excellent code density in comparison to 8-bit and
16-bit MCUs: Reduced flash size, system cost and
power consumption
– 100 percent compatible with ARM Cortex-M0 and a
subset ARM Cortex-M3/M4: Reuse existing
compilers and debug tools
– Simplified architecture: 56 instructions and 17
registers enable easy programming and efficient
packaging of 8/16/32-bit data in memory
– Linear 4 GB address space removes the need for
paging/banking, reducing software complexity
– ARM third-party ecosystem support: Software and
tools to help minimize development time/cost
– Support systick with a 8-bit divider and enablement
4 DMA channels with up to 41 peripheral hardware
trigger sources
DIVSQRT module with 32-bit integer divide and square
root arithmetic operations
Memory
– Up to 128 KB Program Flash (PFlash) with ECC
– Up to 16 KB SRAM with ECC
– Single power supply (2.97 ~ 5.5 V) with full
functional flash program/erase/read operations
Clocks
– Fast IRC (FIRC), up to 48 MHz
– Fast crystal oscillator (FXOSC), range 4~40 MHz
– Slow IRC (SIRC), up to 2 MHz
– Slow crystal oscillator (SXOSC), run at 32.768 KHz
– Low power oscillator (LPO), run at 750 Hz
icr
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•
•
•
•
• Power Management
– Low-power ARM Cortex-M0+ with excellent energy
efficiency
– Support four power modes: Active, Sleep, Deepsleep
and Standby
– Support clock gating for unused modules
– Support specific peripherals remain working in low
power modes
• Mixed-signal Analog
– One Analog-to-Digital Converter (ADC) with 12-bit
1Msps sample rate, it has 16 channels and supports
temperature sensor
– One Analog Comparator (ACMP) with 8-bit DAC
• Communications
– Up to three Universal Asynchronous Receiver
Transmitter (UART) with optional 13-bit break, full
duplex Non-return to Zero (NRZ) and LIN extension
support
– Up to three Serial Port Interface (SPI) with
full-duplex or single-wire bidirectional and master
or slave mode
– Up to two Inter-integrated Circuit (I2C)
– One FlexCAN support CAN2.0A/B and FD
• Reliability, Safety and Security
– Clock Monitor Unit (CMU)
– Internal Watchdog (WDG) with independent clock
source
– Cyclic Redundancy Check (CRC) with 32/16/4-bit
polynomial generator
• Timers
– Up to three Enhanced Timers (eTMR)
– Periodic Timer (pTMR) for RTOS task scheduler time
base for timer modules
– Low Power Timer (lpTMR)
– 16-bit Real Time Clock (RTC)
• Human-Machine Interface
– Up to 58 GPIO pins with interrupt functionality
– Non-Maskable Interrupt (NMI)
• I/O and package
– Support LQFP 64/48/32
– Support QFN 32
• Operating Characteristics
– Voltage range: 2.97V ~ 5.5V
– Ambient temperature range: -40◦ C ~ 125◦ C
le
1 Features
YTM32B1LE0x Data Sheet, REV. 2.1, September 2025
1
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Data Sheet
YTM32B1LE0x Data Sheet, REV. 2.1, September 2025
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12
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Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
4.1 Core Modules . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
4.1.1 ARM Cortex-M0+ . . . . . . . . . . . . . . . . . . . . . . . . . . . .
4.1.2 Nested Vector Interrupt Controller (NVIC) . . . . . . . . .
4.1.3 Debug Controller . . . . . . . . . . . . . . . . . . . . . . . . . . . .
4.2 System Modules. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
4.2.1 System Clock Unit (SCU). . . . . . . . . . . . . . . . . . . . . . .
4.2.2 Power Control Unit (PCU). . . . . . . . . . . . . . . . . . . . . .
4.2.3 Reset Control Unit (RCU) . . . . . . . . . . . . . . . . . . . . . .
4.2.4 IP Controller (IPC) . . . . . . . . . . . . . . . . . . . . . . . . . . .
4.2.5 Direct Memory Access (DMA). . . . . . . . . . . . . . . . . . .
4.2.6 Trigger Multiplex Unit (TMU) . . . . . . . . . . . . . . . . . . .
4.2.7 Chip Integration Module (CIM) . . . . . . . . . . . . . . . . . .
4.3 Memories . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
4.3.1 Embedded Flash Module (EFM) . . . . . . . . . . . . . . . . . .
4.3.2 On-chip SRAM . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
4.4 Analog . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
4.4.1 Analog-to-Digital Converter (ADC) . . . . . . . . . . . . . . .
4.4.2 Analog Comparator (ACMP) . . . . . . . . . . . . . . . . . . . .
4.5 Timer . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
4.5.1 Periodic Timer (pTMR) . . . . . . . . . . . . . . . . . . . . . . . .
4.5.2 Low Power Timer (lpTMR) . . . . . . . . . . . . . . . . . . . . .
4.5.3 Enhanced Timer (eTMR) . . . . . . . . . . . . . . . . . . . . . . .
4.5.4 Real Time Clock (RTC) . . . . . . . . . . . . . . . . . . . . . . . .
4.6 Security, Integrity and Safety . . . . . . . . . . . . . . . . . . . . . . .
4.6.1 Cyclic Redundancy Check (CRC) . . . . . . . . . . . . . . . . .
4.6.2 Watchdog (WDG) . . . . . . . . . . . . . . . . . . . . . . . . . . . .
4.6.3 ECC Management Unit (EMU). . . . . . . . . . . . . . . . . . .
4.7 Operation Unit. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
4.7.1 Divide and Square Root (DIVSQRT). . . . . . . . . . . . . . .
4.8 Communication Interfaces . . . . . . . . . . . . . . . . . . . . . . . . .
4.8.1 Flexible Controller Area Network (FlexCAN) . . . . . . . .
4.8.2 Universal Asynchronous Receiver/Transmitter (UART).
4.8.3 Serial Peripheral Interface (SPI) . . . . . . . . . . . . . . . . . .
4.8.4 Inter-Integrated Circuit (I2C). . . . . . . . . . . . . . . . . . . .
4.9 Human Machine Interface . . . . . . . . . . . . . . . . . . . . . . . . .
4.9.1 General Purpose Input/Output (GPIO) . . . . . . . . . . . . .
4.9.2 Port Controller (PCTRL) . . . . . . . . . . . . . . . . . . . . . . .
5 Ordering Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
5.1 Part Number Information . . . . . . . . . . . . . . . . . . . . . . . . . .
6 Electrical Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
6.1 Ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
6.1.1 Thermal Operating Characteristics . . . . . . . . . . . . . . .
6.1.2 Moisture Handling Ratings . . . . . . . . . . . . . . . . . . . . .
6.1.3 ESD Handling Ratings. . . . . . . . . . . . . . . . . . . . . . . . .
6.2 DC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
6.2.1 Absolute Maximum Ratings . . . . . . . . . . . . . . . . . . . .
6.2.2 Voltage and Current Operating Requirements . . . . . . .
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6.2.3 DC Electrical Specifications at 3.3V . . . . . . . .
6.2.4 DC Electrical Specifications at 5.0V . . . . . . . .
6.2.5 Power and Ground Pins . . . . . . . . . . . . . . . .
6.2.6 POR, LVR and LVD Operating Requirements .
6.2.7 Power Mode Transition Operating Behaviors .
6.2.8 Power Consumption . . . . . . . . . . . . . . . . . . .
6.2.9 Power Sequence . . . . . . . . . . . . . . . . . . . . . .
6.2.9.1 Power Up Sequence . . . . . . . . . . . . . . . .
6.2.9.2 MCU Power Supply Ramp Rate . . . . . . .
6.2.9.3 Power Up Requirements . . . . . . . . . . . .
6.2.10 EMC Performance. . . . . . . . . . . . . . . . . . . .
6.3 AC Characteristics . . . . . . . . . . . . . . . . . . . . . . . .
6.3.1 Power Supply Fluctuation Requirements . . . .
6.3.2 Device Clock Specifications. . . . . . . . . . . . . .
6.3.3 I/O Electrical Characteristics . . . . . . . . . . . . .
6.3.3.1 AC Electrical Characteristics . . . . . . . . .
6.4 Peripheral Operating Requirements and Behaviors
6.4.1 FXOSC(4~40MHz) Characteristics . . . . . . . . .
6.4.2 FIRC(48MHz) Characteristics . . . . . . . . . . . .
6.4.3 SXOSC(32.768KHz) Characteristics . . . . . . . .
6.4.4 SIRC(2MHz) Characteristics . . . . . . . . . . . . .
6.4.5 LPO(750Hz) Characteristics. . . . . . . . . . . . . .
6.4.6 ADC Characteristics . . . . . . . . . . . . . . . . . . .
6.4.7 ACMP Characteristics . . . . . . . . . . . . . . . . . .
6.4.8 SPI Characteristics1 . . . . . . . . . . . . . . . . . . .
6.4.9 NVM Specifications . . . . . . . . . . . . . . . . . . .
6.4.9.1 Flash Command Timing Specifications . .
6.4.9.2 Reliability Specifications . . . . . . . . . . . .
6.4.10 Debug Module Electrical . . . . . . . . . . . . . . .
6.4.10.1 SWD Electrical Specifications. . . . . . . .
6.4.10.2 SWD Input Clock Timing. . . . . . . . . . .
6.4.10.3 SWD Output Data Timing . . . . . . . . . .
6.5 Thermal Attributes. . . . . . . . . . . . . . . . . . . . . . . .
7 Pinouts . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
7.1 IO Signal Description . . . . . . . . . . . . . . . . . . . . . .
7.2 Packages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
7.3 Dimensions . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Data Sheet
YTM32B1LE0x Data Sheet, REV. 2.1, September 2025
ii
Yuntu Microelectronics
2 Overview
ics
YTM32B1LE0x series provide the highly scalable portfolio of ARM® Cortex® -M0+ MCUs in the automotive
industry. With 2.97 ~ 5.5 V supply and focus on exceptional EMC/ESD robustness, YTM32B1LE0x series
devices are well suited to a wide range of applications in electrical harsh environments, and is optimized for
cost-sensitive applications offering low pin count option. The YTM32B1LE0x series offers a broad range of
memory, peripherals and package options. They share common peripherals and pin counts allowing
developers to migrate easily within an MCU family or among the MCU families to take advantage of more
memory or feature integration. This scalability allows developers to standardize on the YTM32B1LE0x series
for their end product platforms, maximizing hardware and software reuse and reducing
time-to-market.
YTM32B1LE0x
System
NVIC
SCU
RCU
IPC
Flash
FIRC
48MHz
SRAM
TMU
DMA
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IOPORT
Clocks
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Serial wire
debug interface
PCU
Memories
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ARM Cortex-M0+
Core
Function
Safety
Analog
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Timers
Communication Human Machine
Interfaces
Interfaces
SIRC
2MHz
LPO
750Hz
FXOSC
4~40MHz
SXOSC
32.768KHz
Operations
eTMR0(8CH)
ADC
x1
CRC
x1
ACMP
x1
M
CMU
eTMR1(8CH)
eTMR2(2CH)
lpTMR
x1
pTMR
x1
EMU
RTC
x1
GPIO
x58
SPI
x3
PCTRL
DIVSQRT
x1
I2C
x2
FlexCAN
x1
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WDG
UART
x3
Figure 1: YTM32B1LE0x Block Diagram
4 Features
The following sections describe the high-level module features for YTM32B1LE0x device.
4.1 Core Modules
4.1.1 ARM Cortex-M0+
• Up to 48 MHz core frequency from 2.97 V to 5.5 V
• Supports up to 32 interrupt request sources
Data Sheet
YTM32B1LE0x Data Sheet, REV. 2.1, September 2025
1
Yuntu Microelectronics
• 2 stage pipeline microarchitecture for reduced power consumption and improved architectural
performance (cycles per instruction)
• Binary compatible instruction set architecture with the Cortex-M0 core
• Thumb instruction set combines high code density with 32-bit performance
• Serial wire debug (SWD) reduces the number of pins required for debugging
• Single cycle 32 bits by 32 bits multiplier
• Up to 32 interrupt sources
• Supports four priority levels for interrupts with two bits in each IPRn registers
• Includes a single non-maskable interrupt
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4.1.3 Debug Controller
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4.1.2 Nested Vector Interrupt Controller (NVIC)
• 2-pin serial wire debug (SWD) provides external debugger interface
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4.2 System Modules
4.2.1 System Clock Unit (SCU)
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• Fast internal RC oscillator (FIRC)
– Up to 48 MHz
– Default system boot clock source
– Support trim for temperature and process
• Slow internal RC oscillator (SIRC)
– Run at 2 MHz
– Can be selected as system clock source
– Always on unless it is forced to be disable in standby mode
– Support trim for temperature and process
• Fast crystal oscillator (FXOSC)
– Support 4~40 MHz crystal
– Can be selected as system clock source
– Support bypass mode
• Slow crystal oscillator (SXOSC)
– 32.768 KHz real time oscillator
– Can’t be selected as system clock
– Provides accurate clock to watchdog(WDG) and real time clock(RTC)
• SCU provides glitch free switcher to select system clock source
• SCU provides system clock dividers to generate core clock, fast bus clock and slow bus clock
• SCU contains 2 CMU blocks
– CMU monitors FXOSC and FIRC clock
– CMU reference clock is SIRC
– CMU can detect frequency out of range, loss of checked clock and loss of reference clock
4.2.2 Power Control Unit (PCU)
• Combination of power management blocks including POR, Bandgap, LVD, Brownout, full power regulator
and low power regulator
• Responsible for sequencing the system enter and exit the Standby mode
• Low Voltage Reset(LVR) for all system relevant power domains
Data Sheet
YTM32B1LE0x Data Sheet, REV. 2.1, September 2025
2
Yuntu Microelectronics
4.2.3 Reset Control Unit (RCU)
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Manage the system power up, pin reset, functional reset and fault reset flow
Record the reset sources of most recent resets
Configurable filter for reset pin
Reset pin filter can work in Active, Sleep, Deepsleep and Standby mode
4.2.4 IP Controller (IPC)
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• Peripheral Bus clock enable
• IPC clock source selection as follow
– FIRC 48 MHz
– FXOSC 4~40 MHz
– SIRC 2 MHz
– SXOSC 32.768 KHz
– LPO 750 Hz
• IPC clock divide values from 1 to 16
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4.2.5 Direct Memory Access (DMA)
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• All address range data transfer from source to destination
• Support separate source/destination data size configuration
– Word(32-bit), half word(16-bit), byte(8-bit) transfer size
• Support separate source/destination address offset configuration
– Address increase/decrease/not change selectable
• Up to 4 DMA channels
– Fix priority and round-robin arbitration
– Support channel to channel link
• Software/Hardware trigger
• Up to 41 peripheral hardware triggers
• Internal data fifo for data transfer
• Support update DMA transfer information from system memory after transfer complete
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4.2.6 Trigger Multiplex Unit (TMU)
• Allow software to select the trigger sources for peripherals as trigger sources
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4.2.7 Chip Integration Module (CIM)
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System function configuration
ADC/ACMP trigger synchronize selection
Software trigger generate
eTMR external clock and fault selection
eTMR channel input/output selection
Chip and die information
4.3 Memories
4.3.1 Embedded Flash Module (EFM)
• 128 KB Program Flash(PFlash) with ECC which supports single error correction (SEC) and double error
detection (DED)
Data Sheet
YTM32B1LE0x Data Sheet, REV. 2.1, September 2025
3
Yuntu Microelectronics
•
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24 MHz single cycle reads of bytes, aligned halfword (16-bit) and aligned word (32-bit)
Automated generation of ECC parity while programming and erasing
Optional interrupt on command completion
Program and erase operations do not require any special power sources other than the normal VDD
supply
4.3.2 On-chip SRAM
4.4 Analog
4.4.1 Analog-to-Digital Converter (ADC)
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Support 12-bit, 10-bit, 8-bit and 6-bit single-ended configurable resolution
Up to 1.0µs for 12-bit resolution conversion time
Support DMA and conversion result FIFO with watermark
Support up to 17 input channels
– 16 channels to measure external analog signals from pad
– 1 channel to measure internal temperature sensor
Support multiple conversion modes
– Single mode: convert one or more channels once a time
– Continuous mode: convert one or more channels until stopped by software
– Discontinuous mode: convert one channel once a time
Support software/hardware trigger for ADC start conversion
Support two low power modes
– Wait mode: prevent ADC overrun when FIFO is full
– Auto off mode: automatic control ADC power off
Support watchdog for conversion result monitoring
Support interrupt generate
– Ready for conversion
– End of sampling
– End of conversion
– End of sequence conversion
– Overrun event
– Watchdog event
Support work and wake up when the whole chip under low power mode
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• 16 KB SRAM with ECC supports single error correction (SEC) and double error detection (DED)
4.4.2 Analog Comparator (ACMP)
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Up to 8 channels
Operational over the entire supply range
Inputs may range from rail to rail
Programmable hysteresis control
Selectable inversion on comparator output
Function mode:
– Common mode
– Sample mode
– Window mode
– Continuous mode
∗ One-shot mode
Data Sheet
YTM32B1LE0x Data Sheet, REV. 2.1, September 2025
4
Yuntu Microelectronics
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∗ Loop mode
• Up to 8 channels can be used to execute automatic comparisons
• Digitally filtered, filter can be bypassed
• Two software selectable performance levels
– Shorter propagation delay at the expense of higher power
– Low power with longer propagation delay
• Functional in low power mode
• Support independent DAC input channel to the comparator
– Optional DAC reference source: internal or external reference source
– 8-bit DAC resolution
• Support several interrupts
– For common/sample/window mode
∗ Generate interrupt on rising-edge, falling-edge or both edges of the comparator output
– For continuous mode
∗ Generate interrupt when the comparison results don’t match expectations
• Interrupt can generate without any clock
• A comparison event can be selected to trigger DMA transfer
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4.5 Timer
Timers can generate interrupts
Four channels of 32-bit timers, each timer has independent timeout periods
Ability to stop in debug mode
Support chain mode to connect multiple timers to a longer timer
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4.5.1 Periodic Timer (pTMR)
4.5.2 Low Power Timer (lpTMR)
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• 16-bit time counter or pulse counter with compare
– Optional interrupt can generate asynchronous wake-up from any low power mode
– Hardware trigger output
– Counter supports free-running mode or reset on compare
• Configurable clock source for prescaler and glitch filter
• Configurable input source for pulse counter
– Rising-edge
– Falling-edge
• Support triggering DMA transfer
4.5.3 Enhanced Timer (eTMR)
• There are three eTMRs with below configurations
– eTMR0: 8 channels
– eTMR1: 8 channels
– eTMR2: 2 channels
• Bus clock and external clock can be the source clock of each eTMR
• Each eTMR contains a 7-bits clock prescaler
• Each eTMR contains a 16-bit counter
• Each channel can be configured as three modes
– Input Capture mode
∗ Support rising edges, falling edges or dual edges
Data Sheet
YTM32B1LE0x Data Sheet, REV. 2.1, September 2025
5
Yuntu Microelectronics
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∗ Support input filter with a prescaler that can be selected for channels, eTMR0: channel 0-3, eTMR1:
channel 0-3, eTMR2: channel 0-1
– Output Compare mode
∗ The output signal can be configured to set, clear or toggle on match point
– PWM mode
∗ Independent mode for each channel
∗ Complementary mode for each pair channels: Pair channels: channel 0-1, channel 2-3, channel 4-5,
channel 6-7
∗ Supports independent deadtime insertion for odd and even channel
∗ Fault control mechanism: eTMR0 and eTMR1 support 4 fault inputs for global fault control
Each eTMR can be configured to generate triggers
– Output triggers on match point
– Output pulse-out with adjustable pulse width
PWM outputs can be controlled by software
Polarity control is available for every channel of each eTMR
Mask control is available for every channel of each eTMR
Synchronized loading of write buffered registers is available in each eTMR
Capture test mode is available in each eTMR
eTMR1 can be configured as quadrature decoder, which supports relative position counting or external
event counting
– Support phase A and phase B input filters
– Contains a independent 16-bits counter with a clock prescaler
– Support 4 up-down counting modes
Support GTB (Global Time Base) for all eTMRs
Support several interrupts
– Channel interrupt (input capture interrupt and output compare interrupt)
– Counter overflow interrupt
– Fault interrupt
Support DMA
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32-bit seconds counter with prescaler of 1 Hz
Support compensation with RTC clock
Lock support of register access for control and alarm register
Selectable of 1 Hz to 128 Hz square wave output
Support two clock sources
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4.5.4 Real Time Clock (RTC)
4.6 Security, Integrity and Safety
4.6.1 Cyclic Redundancy Check (CRC)
• Hardware CRC generator circuit uses
– CRC-32 polynomial:
X 26 + X 23 + X 22 + X 16 + X 12 + X 11 + X 10 + X 8 + X 7 + X 5 + X 4 + X 2 + X + 1
– CRC-16 polynomial: X 16 + X 12 + X 5 + 1
– CRC-4 polynomial: X 4 + X + 1
• Programmable initial seed value
• Accept with 8-bit or 16-bit or 32-bit input data size
• Option to transpose input data or output data (the CRC result) bitwise
• Option for inversion of final CRC result
Data Sheet
YTM32B1LE0x Data Sheet, REV. 2.1, September 2025
6
Yuntu Microelectronics
• 32-bit CPU register programming interface
4.6.2 Watchdog (WDG)
• Support regular or window servicing mode
• Support reset request or interrupt for first timeout
• Support fixed key for dog feeding
4.6.3 ECC Management Unit (EMU)
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• Error injection
– Error injection provides a method for diagnostic coverage of SRAM.
– Error injection uses two-stage enable mechanism.
– Error injection provides support for inducing single-bit or multi-bit inversions on read data when
accessing SRAM
• Error reports
– Error report provides information and optionally interrupt notification on SRAM error events
associated with ECC (Error Correction Code) and parity
– Error report provides count registers which count all correctable error so far
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4.7 Operation Unit
4.7.1 Divide and Square Root (DIVSQRT)
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• Support 32-bit integer divide and square root arithmetic operations
– Divide arithmetic support unsigned and signed 32-bit integer
– Support selectable action to divide-zero
– Square arithmetic support unsigned 32-bit integer
• Input data and result are memory-mapped with easy programming model
– Support data write to start calculation and data read get result
– Support control and status register for calculation
4.8 Communication Interfaces
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4.8.1 Flexible Controller Area Network (FlexCAN)
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• Full implementation of the CAN FD protocol and CAN Specification 2.0 Part B
– Standard data frames
– Extended data frames
– Zero to sixty-four bytes data length
– Programmable bit rate
– Content-related addressing
• Compliant with the ISO 11898-1 standard
• Silicon-proven implementation passing ISO 16845-1:2016 CAN conformance tests
• Flexible mailboxes configurable to store 0 to 8, 16, 32 or 64 bytes data length
• Each mailbox configurable as receive or transmit, all supporting standard and extended messages
• Individual Rx Mask registers per mailbox
• Full-featured Rx FIFO with storage capacity for up to six frames and automatic internal pointer handling
with DMA support
• Transmission abort capability
• Flexible message buffers, totaling 32 message buffers of 8 bytes data length each, configurable as Rx or Tx
Data Sheet
YTM32B1LE0x Data Sheet, REV. 2.1, September 2025
7
Yuntu Microelectronics
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Programmable clock source to the CAN Protocol Engine, either peripheral clock or oscillator clock
RAM not used by reception or transmission structures can be used as general purpose RAM space
Listen-Only mode capability
Programmable Loop-Back mode supporting self-test operation
Programmable transmission priority scheme: lowest ID, lowest buffer number or highest priority
Time stamp based on 16-bit free-running timer
Global network time, synchronized by a specific message
Maskable interrupts
Independence from the transmission medium (an external transceiver is assumed)
Short latency time due to an arbitration scheme for high-priority messages
Low-power modes, with programmable wake-up on bus activity
Transceiver Delay Compensation feature when transmitting CAN FD messages at faster data rates
Remote request frames may be managed automatically or by software
CAN bit time settings and configuration bits can only be written in Freeze mode
Tx mailbox status (lowest priority buffer or empty buffer)
Identifier Acceptance Filter Hit Indicator (IDHIT) register for received frames
SYNCH bit available in Error in Status 1 register to indicate that the FlexCAN is synchronous with CAN
bus
CRC status for transmitted message
Rx FIFO Global Mask register
Selectable priority between mailboxes and Rx FIFO during matching process
Powerful Rx FIFO ID filtering, capable of matching incoming IDs against either 128 extended, 256
standard or 512 partial (8-bit) IDs, with up to 32 ID Filter Table elements
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4.8.2 Universal Asynchronous Receiver/Transmitter (UART)
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Support LIN mode
Transmit/Receive FIFO
Support Transmit/Receive via DMA
Baud rate setting
1-bit or 2-bit STOP size
7-bit, 8-bit, 9-bit or 10-bit frame size
Transmit/Receive polarity setting
Receive data match
Line idle, address match wake-up
Support transmit/receive line switch, single line mode
Hardware flow control support
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4.8.3 Serial Peripheral Interface (SPI)
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Support clock polarity and phase configuration
Configurable frame size
Transmit/Receive FIFO
Support single line mode
Support Master and slave mode
Support Transmit/Receive via DMA
4.8.4 Inter-Integrated Circuit (I2C)
• Support standard, fast and ultra fast mode
• Support 7-bit/10-bit address mode with master and slave
Data Sheet
YTM32B1LE0x Data Sheet, REV. 2.1, September 2025
8
Yuntu Microelectronics
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Support SMBUS mode
Support multi-master arbitration and synchronization
Support Master and slave clock stretching
Transmit/Receive FIFO (Master only)
Analog and digital filter on both SCL and SDA pins
Support Transmit/Receive via DMA
I2C1 do not support slave mode
4.9 Human Machine Interface
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Port Data Input register visible in all digital pin multiplexing modes
Port Data Output register with corresponding set/clear/toggle registers
Port Data Direction register
Port Input Disable register
Pin interrupts
– Interrupt flag and enable registers for each pin, functional in all digital pin multiplexing modes
– Support for interrupt, DMA request or Peripheral Trigger configured per pin
– Support for edge sensitive (rising, falling, both) or level sensitive (low, high) configured per pin
– Asynchronous wake-up in low power modes
– Each pin can be configured for 1 of interrupt, DMA request or trigger output
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4.9.2 Port Controller (PCTRL)
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4.9.1 General Purpose Input/Output (GPIO)
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• Individual pull control fields with pull-up, pulldown and pull-disable support
• Individual drive strength field supporting high and low drive strength
• Individual mux control field supporting analog or pin disabled, GPIO and up to 6 chip-specific digital
functions
• Individual passive filter field supporting enabling and disabling passive filter for specific input
5 Ordering Information
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The following chips are available for ordering.
Product
Table 1: Ordering Information
Memory
Package
IO and ADC channel
Communication
Part number
Flash(KB)
SRAM(KB)
Pin count
Package
GPIOs
(Normal)
ADC channels
FlexCAN
YTM32B1LE05H0MLHT
128KB
16KB
64
LQFP
58
16
1
YTM32B1LE05H0MLFT
128KB
16KB
48
LQFP
43
13
1
YTM32B1LE05H0MLET
128KB
16KB
32
LQFP
28
12
1
YTM32B1LE05H0MFMR
128KB
16KB
32
QFN
28
9
1
YTM32B1LE05H0MFMIR
128KB
16KB
32
QFN
28
9
1
YTM32B1LE04H0MLFT
64KB
8KB
48
LQFP
43
13
1
YTM32B1LE04H0MLET
64KB
8KB
32
LQFP
28
12
1
YTM32B1LE04H0MFMR
64KB
8KB
32
QFN
28
9
1
Data Sheet
YTM32B1LE0x Data Sheet, REV. 2.1, September 2025
9
Yuntu Microelectronics
5.1 Part Number Information
YTM 32 B 1 LE 0 5 H0 M LH I T
Product Status
MCU Type
Product Line
Generation
Level
Major Revision
Memory Size
ics
Reserved
Ambient Temperature
Package
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Optional Mode
Packing
The part numbers field description is shown as below.
ct
Figure 2: Part Numbers Field
Values
YTM: Qualified
YTM Product Status
PTM: Prototype
32
MCU Type
32: 32-bit
B: General
D: Dashboard
P: Powertrain
B
Product Line
V: Vision
N: Network
Z: High voltage, integrity
1
Generation
1st generation product
Hx: High end
Lx
Level
Mx: Middle end
Lx: Low end
0
Major Revision
1st revision
1
2
3
H
2M
4M 6M
5
Memory Size
M
64K 128K 256K
L
8K
16K 32K
H0
Reserved
Reserved
C: -40◦ C ~85◦ C
V: -40◦ C ~105◦ C
M
Ambient Temperature
M: -40◦ C ~125◦ C
W: -40◦ C ~150◦ C
Pin Counts LQFP QFN BGA
32
LE
FM 48
LF
-
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M
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Field Description
le
Table 2: Part Number Field Description
Data Sheet
YTM32B1LE0x Data Sheet, REV. 2.1, September 2025
4
8M
512K
64K
5
1M
128K
-
10
Yuntu Microelectronics
Table 2: Part Number Field Description
LH
Package
I
Optional Mode
T1
Packing
Values
64
LH
100
LL
144
LQ
176
LU
257
289
I: ISELED
T: Trays/Tubes
R: Tape and Reel
-
MH
MM
MQ
-
-
ics
Field Description
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1. The chip mark will not contain packing information
6 Electrical Characteristics
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6.1 Ratings
Parameter
Value
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Symbol
le
6.1.1 Thermal Operating Characteristics
Min.
Typ.
Max.
Unit
TA M−Grade Part
Ambient temperature under bias
-40
–
125
◦C
TJ M−Grade Part
Junction temperature under bias
-40
–
135
◦C
M
6.1.2 Moisture Handling Ratings
Symbol
Min.
Max.
Unit
Notes
Moisture sensitivity level
3
3
–
1
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MSL
Description
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1. Determined according to IPC/JEDEC Standard J-STD-020, Moisture/Reflow Sensitivity Classification for Nonhermetic Solid State Surface Mount
Devices
6.1.3 ESD Handling Ratings
Symbol
VHBM
Description
Min.
Max.
Unit
Notes
-4000
4000
V
1
All pins except the corner pins
-500
500
V
2
Corner pins only
-750
750
V
Latch-up current at ambient temperature of 125 °C
-100
100
mA
Electrostatic discharge voltage, human body model
Electrostatic discharge voltage, charged-device model
VCDM
ILAT
Data Sheet
YTM32B1LE0x Data Sheet, REV. 2.1, September 2025
3
11
Yuntu Microelectronics
Table 5 continued from previous page
Symbol
Description
Latch-up current at ambient temperature of 25 °C
Min.
Max.
Unit
-200
200
mA
Notes
1. Determined according to JEDEC Standard JESD22-A114, Electrostatic Discharge (ESD) Sensitivity Testing Human Body Model (HBM)
2. Determined according to JEDEC Standard JESD22-C101, Field-Induced Charged-Device Model Test Method for Electrostatic-Discharge-Withstand
Thresholds of Microelectronic Components
ics
3. Determined according to JEDEC Standard JESD78, IC Latch-Up Test.
6.2 DC Characteristics
Symbol
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6.2.1 Absolute Maximum Ratings
Description
Supply voltage
IVDD
Maximum current into VDD
VIO
Digital/Analog IO Input voltage
IO
Instantaneous maximum current of single pin
-0.3
5.81
V
–
70
mA
-0.3
VDD + 0.3
V
-25
25
mA
VDD - 0.3
VDD + 0.3
V
le
Analog supply voltage
Unit
Notes
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VDDA
Max.
ct
VDD
Min.
1. 60 seconds lifetime - No restrictions i.e. the part is not held in reset and can switch.
10 hours lifetime - The part is held in reset by an external circuit i.e. the part cannot switch.
M
NOTE:
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• The maximum ratings are the limits to which the device can be subjected without permanently damaging
the device.
• The device is not guaranteed to operate properly at the maximum ratings. Exposure to the absolute
maximum rating conditions for extended periods may affect device reliability.
Yu
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6.2.2 Voltage and Current Operating Requirements
Symbol
Description
Min.
Max. Unit Notes
VDD
Supply voltage
2.97
5.5
V
VDDA
Analog supply voltage
2.97
VDD
V
VREFH
Reference voltage
2.97
VDDA
V
-0.1
0.1
V
VDD − VDDA VDD to VDDA differential voltage
IICIO
Continuous DC input current (positive / negative) that can
be injected into an I/O pin
-1
1
mA
IICcont
Contiguous pin DC injection current — regional limit, includes
sum of positive rejection currents of 16 contiguous pins
–
15
mA
Tramp
MCU supply ramp rate
Data Sheet
YTM32B1LE0x Data Sheet, REV. 2.1, September 2025
5 V/100ms 100 V/ms –
12
Yuntu Microelectronics
1. All pins are internally clamped to VSS and VDD through ESD protection diodes. If VIN is less than VSS – 0.3V or greater than VDD + 0.3V, a current
limiting resistor is required. The negative DC injection current limiting resistor is calculated as R = (VSS –0.3V–VIN )/ |IICIO |. The positive injection
current limiting resistor is calculated as R = [VIN –(VDD + 0.3V)]/ |IICIO |. The actual resistor values should be an order of magnitude higher to
tolerate transient voltages.
6.2.3 DC Electrical Specifications at 3.3V
Value
Parameter
Unit
Min.
Typ.
Max.
VDD
I/O supply voltage
2.97
3.3
4.0
Vih
Input buffer high voltage
0.7 * VDD
–
VDD + 0.3
Vil
Input buffer low voltage
VSS - 0.3
–
0.3 * VDD
Vhys
Input buffer hysteresis
0.1 * VDD
–
0.3 * VDD
V
Ioh
Normal drive I/O current source
capability measured when
pad = (VDD - 0.8V)
5
10
–
mA
Iol
Normal drive I/O current sink
capability measured when
pad = 0.8V
5
Ioh
High drive I/O current source
capability measured when
pad = (VDD - 0.8V)
Iol
High drive I/O current sink
capability measured when
pad = 0.8V
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ct
mA
12
20
–
mA
Hi-Z (Off state) leakage
current (per pin) @25◦ C
–
50
500
nA
Hi-Z (Off state) leakage
current (per pin) @125◦ C
–
–
500
nA
VDD - 0.8
–
VDD
V
Normal drive pad
(2.97V ≤ VDD ≤ 4.0V, IOL = -2.8mA)
VSS
–
0.8
V
Output low current total for
all ports
–
–
50
mA
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10
le
–
Output high voltage
Normal drive pad
(2.97V ≤ VDD ≤ 4.0V, IOH = -2.8mA)
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IOLT
V
20
Output low voltage
Yu
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VOL
V
mA
Ileak
VOH
V
–
12
Notes
ics
Symbol
Input leakage current (per pin) for full temperature range
IIN
Normal pins
–
0.002
0.5
µA
High Drive pins
–
0.005
0.5
µA
RPU
Internal pull-up resistors
20
–
100
kΩ
RPD
Internal pull-down resistors
20
–
105
kΩ
6.2.4 DC Electrical Specifications at 5.0V
Data Sheet
YTM32B1LE0x Data Sheet, REV. 2.1, September 2025
13
Yuntu Microelectronics
Symbol
Value
Parameter
Unit
Min.
Typ.
Max.
I/O supply voltage
4
5
5.5
V
Vih
Input buffer high voltage
0.7 * VDD
–
VDD + 0.3
V
Vil
Input buffer low voltage
VSS - 0.3
–
0.3 * VDD
V
Vhys
Input buffer hysteresis
0.1 * VDD
–
0.3 * VDD
V
Ioh
Normal drive I/O current source
capability measured when
pad = (VDD - 0.8V)
10
20
–
mA
Iol
Normal drive I/O current sink
capability measured when
pad = 0.8V
10
20
–
Ioh
High drive I/O current source
capability measured when
pad = (VDD - 0.8V)
20
30
Iol
High drive I/O current sink
capability measured when
pad = 0.8V
20
30
Hi-Z (Off state) leakage
current (per pin) @25◦ C
–
ro
n
–
mA
ct
mA
500
nA
VDD - 0.8
–
VDD
V
Normal drive pad
(4V ≤ VDD ≤ 5.5V, IOL = -2.8mA)
VSS
–
0.8
V
Output low current total for
all ports
–
–
50
mA
–
icr
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Output high voltage
380
le
–
Normal drive pad
(4V ≤ VDD ≤ 5.5V, IOH = -2.8mA)
Output low voltage
M
IOLT
–
nA
Hi-Z (Off state) leakage
current (per pin) @125◦ C
VOL
mA
500
Ileak
VOH
ics
VDD
Notes
Input leakage current (per pin) for full temperature range
Normal pins
–
0.002
0.5
µA
High drive pins
–
0.005
0.5
µA
RPU
Internal pull-up resistors
20
–
70
kΩ
RPD
Internal pull-down resistors
15
–
70
kΩ
Yu
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IIN
Data Sheet
YTM32B1LE0x Data Sheet, REV. 2.1, September 2025
14
Yuntu Microelectronics
6.2.5 Power and Ground Pins
VSS
Package
C DEC1
C DEC0
C DEC0
VDDA
48 LQFP
VSS
Package
VDDA / VREFH
32 LQFP
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CREF
C DEC0
C DEC1
VDD
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ct
VSS
C DEC1
VDD
ics
VSS
VDD
C DEC1
C DEC1
64 LQFP
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CREF
C DEC1
VREFH
VDD
C DEC0
VDDA
C DEC0
C DEC1
VDD
VREFL
Package
VSS
Package
C DEC1
C DEC0
C DEC1
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VDD
32 QFN
C
Yu
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VDD
0CED
M
VSS
VSS
Figure 3: Pinout Decoupling
Symbol
Description
Min.
Typ.
Max.
Unit
CREF 1,2,3
ADC reference high decoupling capacitance
50
100
200
nF
CDEC0 2,3,4
Recommended decoupling capacitance
for VDD
1
2.2
10
µF
CDEC1 2,3,4
Recommended bypass decoupling
capacitance for VDD
50
100
200
nF
1. For improved performance, it is recommended to use 2.2 µF, 0.1 µF and 1nF capacitors in parallel.
Data Sheet
YTM32B1LE0x Data Sheet, REV. 2.1, September 2025
15
Yuntu Microelectronics
2. All decoupling capacitors should be placed as close as possible to the corresponding supply and ground pins.
3. All decoupling capacitors must be low ESR ceramic capacitors(for example X7R type).
4. The requirement and value of CDEC will be decided by the device application requirement.
6.2.6 POR, LVR and LVD Operating Requirements
Description
Min.
Typ.
Max.
Unit
VPOR
Rising and falling VDD POR detect voltage
2.3
2.5
2.7
V
VLVD
Falling low-voltage threshold(LVDCFG=4)
2.5
2.6
2.7
V
Falling low-voltage threshold(LVDCFG=10)
3.8
4.2
4.5
V
LVD hysteresis(LVD5VHYS=01b)
-2
–
2
%
LVD hysteresis(LVD5VHYS=10b)
-4.2
–
4.2
%
LVD hysteresis(LVD5VHYS=11b)
-8.4
–
8.4
%
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VLVD_HYST
Notes
ics
Symbol
SLEEP -> ACTIVE
FIRC
DEEPSLEEP -> ACTIVE
STANDBY -> ACTIVE
TPOR
Core, bus frequency
Min.
Typ.
Max.
48MHz, 24MHz
–
1µs
–
le
System clock
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Description
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6.2.7 Power Mode Transition Operating Behaviors
FIRC
48MHz, 24MHz
–
5µs
–
FIRC
48MHz, 24MHz
–
40µs
–
FIRC(reset value)
48MHz, 24MHz
–
250µs
–
M
6.2.8 Power Consumption
Symbol
Clock
configuration
ACTIVE
IDD_ACTIVE
FIRC
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Mode
IDD_SLEEP
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SLEEP
DEEPSLEEP IDD_DEEPSLEEP
STANDBY
IDD_STANDBY
–
FIRC
FIRC
Description
Running while(1) loop in flash, all
peripheral clock enabled.
core @48MHz, bus @24MHz VDD =5V
Temperature Min Typ Max Units
≤ 25 °C
–
9.0
14.5
mA
125 °C
–
9.0
14.5
mA
≤ 25 °C
–
3.9
5.0
mA
125 °C
–
4.0
5.0
mA
Deepsleep mode current, VDD =5V
SIRC=1, SXOSC=0
≤ 25 °C
–
100
150
µA
125 °C
–
130
250
µA
Standby mode current, VDD =5V
SIRC=0, SXOSC=0
≤ 25 °C
–
4.0
20
µA
125 °C
–
50
100
µA
Sleep mode current, VDD =5V
6.2.9 Power Sequence
6.2.9.1 Power Up Sequence
Hardwares must follow sequence below to ensure that the chip is powered up properly.
Data Sheet
YTM32B1LE0x Data Sheet, REV. 2.1, September 2025
16
Yuntu Microelectronics
1. VDD must be powered up first.
2. VDDA must be powered up later than or at the same time as VDD.
3. VREFH must be powered up later than or at the same time as VDDA.
T1
ics
T1 > 0
T2 > 0
T2
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VREFH
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6.2.9.2 MCU Power Supply Ramp Rate
ct
Figure 4: Power Sequence
Yu
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M
icr
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During the power-up sequence of MCU, it is critical that the power supply maintains a ramp-rate within the
specified range, starting from VDD_OFF at 0.1V and rising to the MCU’s operational voltage level (VDD ).
Failure to comply with this specification may result in unintended behavior, operational stagnation or even
damage to the MCU.
Data Sheet
YTM32B1LE0x Data Sheet, REV. 2.1, September 2025
17
Yuntu Microelectronics
Tramp(Max.)
Tramp(Min.)
VDD
CORRECT
safe range
VDD_OFF
residual and/or low voltage
- out of range
NOT CORRECT
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VDD_OFF
VDD
le
VDD_OFF
NOT CORRECT
ct
non strictly rising ramp
- out of range
ics
VDD
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VDD
step ramp
- out of range
NOT CORRECT
VDD_OFF
M
Figure 5: Power Supply Ramp Rate
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6.2.9.3 Power Up Requirements
Yu
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It is necessary to ensure that VDD meets the following timing during the power-up process of
YTM32B1LE0x.
Data Sheet
YTM32B1LE0x Data Sheet, REV. 2.1, September 2025
18
Yuntu Microelectronics
A
B
A
B
V4
ics
V3
V1
T2
T3
T4
ct
T1
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V2
A : There is no guarantee of proper functionality when the MCU is in uncertain status.
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B : The MCU operates normally.
Figure 6: Power Up Requirements
Name
V1
Restart threshold voltage
V2
Minimum MCU
operating voltage
5.5
T1
Power up time
T2
Power down time
Data Sheet
2.5
Upper voltage limit of Maximum operating voltage for normal MCU operation
MCU operating normally and interaction with peripherals
Name
T4
The MCU starts working when the power supply
reaches V2.
2.97
Symbol
T3
0.2
Lower voltage limit of Minimum operating voltage for normal MCU operation
MCU operating normally and interaction with peripherals.
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V4
Unit (V)
When restarting the MCU, VDD should keep
below V1 for a period of T3.
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V3
Description
M
Symbol
Description
Rising time of MCU VDD from 0V to V3
10 µs < T1 < 50ms
Drop time of MCU VDD from V3 to V1
10 µs < T2 < 500ms
during the MCU restart/power down process
Restart threshold voltage Minimum duration of MCU VDD below V1,
retain time
when restarting MCU
Restart power up time
Requirement
Rising time of MCU VDD normal operation
from V1 to V3
YTM32B1LE0x Data Sheet, REV. 2.1, September 2025
T3 > 100 µs
10 µs < T4 < 50ms
19
Yuntu Microelectronics
NOTE: The power-up process needs to be restarted if a VDD voltage drop occurs during the T1~T4
power-up process before the VDD voltage reaches the V2 voltage. Restarting the power-up of MCU needs to
ensure that the voltage of VDD continues to drop below V1 and remains there for T3 time.
6.2.10 EMC Performance
Electromagnetic compatibility (EMC) performance is highly dependent on the environment in which the
MCU resides. Board design and layout, circuit topology choices, location and characteristics of external
components, and MCU software operation play a significant role in the EMC performance.
ics
6.3 AC Characteristics
6.3.1 Power Supply Fluctuation Requirements
ct
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1. The power supply fluctuation must be maintained within ± 10% of the power supply voltage, and the
fluctuation frequency should not exceed 100 KHz.
2. The maximum power supply fluctuation should not exceed ± 20% of the power supply voltage, and in
this case, the fluctuation frequency should be less than 30 KHz.
3. Power supply fluctuations exceeding the above requirements may cause chip abnormalities and
require a power-up process according to the requirements outlined in Power Up Requirements.
Description
Min.
Max.
Unit
fcore
System and core clock
–
48
MHz
fbus
Bus clock
–
24
MHz
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Symbol
le
6.3.2 Device Clock Specifications
Notes
M
6.3.3 I/O Electrical Characteristics
6.3.3.1 AC Electrical Characteristics
Yu
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Unless otherwise specified, propagation delays are measured from the 50% to the 50% point, and the rise and
fall times are measured at the 20% and 80% points, as shown in the following figure.
VIH
Input Signal
Low
High
80%
Midpoint1
50%
20%
Fall Time
VIL
The midpoint is VIL ( VIH
Rise Time
VIL) 2
Figure 7: Input Signal Measurement Reference
All digital I/O switching characteristics, unless otherwise specified, assume that the output pins have the
following characteristics.
•
CL = 30pF loads
Data Sheet
YTM32B1LE0x Data Sheet, REV. 2.1, September 2025
20
Yuntu Microelectronics
•
Normal drive strength
6.4 Peripheral Operating Requirements and Behaviors
6.4.1 FXOSC(4~40MHz) Characteristics
The following diagram is Fast Crystal OSC circuit.
MCU
C1
ct
C2
ics
EXTAL
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XTAL
Min.
Typ.
Max.
Unit
2.97
–
5.5
V
–
2.0
–
mA
4
–
40
MHz
0.7*VDD
–
VDD
V
Input high voltage – EXTAL pin in external clock mode,
VDD =3.3V
0.7*VDD
–
VDD
V
Input low voltage – EXTAL pin in external clock mode,
VDD =5V
VSS
–
0.3*VDD
V
Input low voltage – EXTAL pin in external clock mode,
VDD =3.3V
VSS
–
0.3*VDD
V
FXOSC startup time (40MHz oscillator)
–
0.5
3.5
ms
Duty of FXOSC (40MHz oscillator)
40
50
60
%
C1
Load capacitance
–
–
–
pF
C2
Load capacitance
–
–
–
pF
RF
FXOSC internal feedback resistor
400
500
700
kΩ
VPP
Peak-to-peak amplitude of oscillation (40MHz oscillator)
1.2
2.25
VDD
V
VDD
IDDOSC
Description
Supply voltage
FXOSC oscillator
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Symbol
le
Figure 8: FXOSC Diagram
Oscillator frequency
VIH
Input high voltage – EXTAL pin in external clock mode,
VDD =5V
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VIL
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FOSC
TFXOSCSU
DFXOSC
Notes
1
1. Crystal oscillator circuit provides stable oscillations when gmXOSC > 5 * gm_crit. The gm_crit is
defined as: gm_crit=4 * (ESR + RS ) * (2πF)2 * (C0 + CL )2
where:
• gmXOSC is the transcondutance of the internal oscillator circuit
Data Sheet
YTM32B1LE0x Data Sheet, REV. 2.1, September 2025
21
Yuntu Microelectronics
ESR is the equivalent series resistance of the external crystal
RS is the series resistance connected between XTAL pin and external crystal for current limitation
F is the external crystal oscillation frequency
C0 is the shunt capacitance of the external crystal
CL is the external crystal total load capacitance. CL = CS + [ C1 * C2 / (C1 + C2 ) ]
CS is stray or parasitic capacitance on the pin due to any PCB traces
C1 , C2 external load capacitances on EXTAL and XTAL pins.
le
ct
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ics
•
•
•
•
•
•
•
icr
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The internal circuitry of the chip utilizes an ld current source as the load for the amplifier circuit,
with an NMOS transistor serving as the amplifying transistor. When the gain (Gm) of the amplifying
transistor is greater than the intrinsic gain (Gmcrit) of the external crystal oscillator, theoretically,
the crystal oscillator will start to oscillate. Generally, it is required that Gm>5*Gmcrit.
Rfb provides the DC bias point for the input terminal of the amplifying transistor.
Figure 9: Block Diagram of Crystal Oscillator Circuit
M
Table 18: Startup Time - Gain Selection for Gmxosc of 40MHz Crystal Oscillator Circuits
(Simulation)
Yu
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Gain Setting
0
1
2
3
4
5
6
7
Gm (at startup)
Min. Typ. Max.
0
1.4
2.2
3.6
2.8
4.5
7.2
4.2
6.8
10.8
4.9
7.9
12.6
6.2
10.2
16.2
7.6
12.5
19.9
9.1
14.7
23.5
Unit
mS
mS
mS
mS
mS
mS
mS
mS
6.4.2 FIRC(48MHz) Characteristics
Symbol
Description
Min.
Typ.
Max.
Unit
FFIRC
Fast internal reference frequency
–
48
–
MHz
Data Sheet
YTM32B1LE0x Data Sheet, REV. 2.1, September 2025
Notes
22
Yuntu Microelectronics
Table 19 continued from previous page
Description
Min.
Typ.
Max.
Unit
ACCFIRC
FIRC frequency accuracy,
factory trimmed, 25 °C
-1.0
–
1.0
%
FIRC frequence accuracy,
factory trimmed, -40◦ C – 125◦ C
-1.5
–
1.5
%
IFIRC
FIRC operating current
–
250
–
µA
TStartup
Startup time
–
–
20
µs
6.4.3 SXOSC(32.768KHz) Characteristics
Slow crystal oscillator frequency
IDDOSC
SXOSC oscillator
Tstartup
SXOSC startup time (32.768KHz oscillator)
DSXOSC
Duty of SXOSC (32.768KHz oscillator)
Typ.
Max.
Unit
30
32.768
35
KHz
–
4
–
µA
–
–
1
s
ct
FSXOSC
Min.
ro
n
Description
40
50
60
%
–
–
–
pF
le
Symbol
Notes
ics
Symbol
–
–
–
pF
6
8
11
MΩ
0.94
1.2
VDD
V
Load capacitance
C2
Load capacitance
RF
SXOSC internal feedback resistor
VPP
Peak-to-peak amplitude of oscillation (32.768KHz oscillator)
icr
oe
C1
Notes
1
1. Crystal oscillator circuit provides stable oscillations when gmXOSC > 5 * gm_crit. The gm_crit is
defined as: gm_crit=4 * (ESR + RS ) * (2πF)2 * (C0 + CL )2
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gmXOSC is the transcondutance of the internal oscillator circuit. gmXOSC > 10 µS
ESR is the equivalent series resistance of the external crystal
RS is the series resistance connected between XTAL pin and external crystal for current limitation
F is the external crystal oscillation frequency
C0 is the shunt capacitance of the external crystal
CL is the external crystal total load capacitance. CL = CS + [ C1 * C2 / (C1 + C2 ) ]
CS is stray or parasitic capacitance on the pin due to any PCB traces
C1 , C2 external load capacitances on EXTAL and XTAL pins
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•
•
•
•
•
•
•
•
M
where:
Data Sheet
YTM32B1LE0x Data Sheet, REV. 2.1, September 2025
23
ics
Yuntu Microelectronics
ro
n
The internal circuitry of the chip utilizes an ld current source as the load for the amplifier circuit,
with an NMOS transistor serving as the amplifying transistor. When the gain (Gm) of the amplifying
transistor is greater than the intrinsic gain (Gmcrit) of the external crystal oscillator, theoretically,
the crystal oscillator will start to oscillate. Generally, it is required that Gm>5*Gmcrit.
Rfb provides the DC bias point for the input terminal of the amplifying transistor.
Description
Min.
Typ.
Max.
Unit
FSIRC
Slow internal reference frequency
–
2
–
MHz
ACCSIRC
SIRC frequency accuracy,
factory trimmed, 25 °C
-3.0
–
3.0
%
SIRC frequency accuracy,
factory trimmed, 0 °C – 85 °C
-4.0
–
4.0
%
SIRC frequence accuracy,
factory trimmed, −40 °C – 125 °C
-5.0
–
5.0
%
SIRC operating current
–
23
–
µA
–
10
50
µs
M
icr
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Symbol
le
6.4.4 SIRC(2MHz) Characteristics
ct
Figure 10: Block Diagram of Crystal Oscillator Circuit
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ISIRC
Startup time
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TStartup
Notes
6.4.5 LPO(750Hz) Characteristics
Symbol
Description
Min.
Typ.
Max.
Unit
FLPO
Low power oscillator frequency
300
750
2000
Hz
Data Sheet
YTM32B1LE0x Data Sheet, REV. 2.1, September 2025
Notes
24
Yuntu Microelectronics
6.4.6 ADC Characteristics
INTERNAL CIRCUIT SCHEME
EXTERNAL CIRCUIT
VDD
R SMP
R IN
CP
CS
ics
CEXT
VA
Description
VDDA
Analog supply voltage
IVDDA
Analog supply current
∆VDDA
Test condition Min. Typ.
Max.
Unit Notes
5.0
5.5
V
–
2
–
mA
VDD - VDDA
0
–
100
mV
VREFH
Reference voltage
2.97
–
VDDA
V
IREFH
Reference current
–
–
800
µA
VIN
Input voltage
0
–
VREFH
V
RSMP
Sampling switch impedance
–
–
1.5
kΩ
CEXT
External capacitance
50
–
–
nF
CP
Pin capacitance
–
6
–
pF
CS
Sampling capacitance
–
6
7
pF
tu
icr
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le
2.97
M
Symbol
ct
Figure 11: ADC Circuit
ro
n
Note: RIN is the internal resistance of signal source.
Test condition1 Min. Typ. Max. Unit Notes
Description
TSTARTUP
Analog startup time
5
–
–
µs
TSAMPLE
Sampling time
200
–
2000
ns
500
–
2000
ns
Yu
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Symbol
Tsample_TS Tempsensor sampling time
–
1. These parameters of this table can be configured by register, please refer to Reference Manual for details.
Symbol
Description
Test condition
DNL
Differential nonlinear
12-bit resolution
–
±1.0
–
LSB
INL
Integer nonlinear
12-bit resolution
–
±2.0
–
LSB
Data Sheet
Min. Typ. Max. Unit Notes
YTM32B1LE0x Data Sheet, REV. 2.1, September 2025
25
Yuntu Microelectronics
Table 25 continued from previous page
Symbol
Description
ACCTS
Temperature sensor
accuracy
Min. Typ. Max. Unit Notes
-10
Slope of temperature ADC sampling
and voltage curve
frequncy @ 500kHz
K1
FADC
Test condition
◦C
616.9
ADC conversion clock
2
16
2. ADC conversion clock = ADC function clock / [(ipc_divider +1 ) * (adc_clock_div +1)]
VACMP 1
Analog supply voltage
IACMP
Analog supply current
VINOFFSET
Analog input offset voltage
VIN
Analog input voltage
VHYST0
Analog comparator hysteresis 0
VHYST1
MHz
2
ro
n
Description
Test condition Min. Typ. Max. Unit Notes
2.97
5.0
ct
Symbol
/V
ics
1. T = C - K*V, see Reference Manual for details.
6.4.7 ACMP Characteristics
◦C
10
5.5
V
20
40
µA
-10
–
10
mV
VSS
–
VDD
V
12
20
45
mV
Analog comparator hysteresis 1
24
40
85
mV
VHYST2
Analog comparator hysteresis 2
36
60
130
mV
DACDNL
Differential nonlinear
–
±1
–
LSB
M
icr
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le
–
1. ACMP connects to VDD.
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6.4.8 SPI Characteristics1
Yu
n
Num. Symbol
ffunc
1
2
fop
Description
Conditions
Min.
Max.
Unit
Functional frequency
Slave
–
24
MHz
Frequency of operation
Master
–
24
MHz
Master Loopback4
–
24
MHz
Slave
–
12
MHz
Master
–
12
MHz
–
12
MHz
Slave
83.3
–
ns
Master
83.3
–
ns
83.3
–
ns
Slave
–
–
ns
Master
(PCSSCK+1) * tdelay 3 - 22
–
ns
Master Loopback4 (PCSSCK+1) * tdelay 3 - 22
–
ns
–
ns
Master
2
tSCK
SCK period
Master
3
4
Data Sheet
tPCSSCK
tSCKPCS
5
6
PCS to SCK delay
After SCK delay
Loopback4
Loopback4
Slave
–
YTM32B1LE0x Data Sheet, REV. 2.1, September 2025
26
Yuntu Microelectronics
Table 27 continued from previous page
Conditions
Min.
Max.
Unit
3
–
ns
3
(SCKPCS+1) * tdelay - 22
–
ns
Slave
tSCK /2 - 1
tSCK /2 + 1
ns
Master
tSCK /2 - 1
tSCK /2 + 1
ns
Master
Master
5
tWSCK
7
Clock (SCK) high or low time
Master
6
tsetup
Data setup time (inputs)
tholdin
Data hold time (inputs)
tSCK /2 - 1
tSCK /2 + 1
ns
7
–
ns
Master
27
–
ns
5
–
ns
Slave
0
–
ns
Master
0
–
ns
–
ns
tvalid
Data valid (after SCK edge)
Loopback4
Loopback4
Slave
–
33
ns
–
9
ns
–
9
ns
0
–
ns
0
–
ns
0
–
ns
–
2
ns
–
2
ns
Master
Master Loopback4
9
tholdout
Data hold time (outputs)
Slave
Master
tRI/FI
Rise/Fall time input
ct
Master
10
Loopback4
Slave
Master
Master
tRO/FO
Rise/Fall time output
Loopback4
–
2
ns
Slave
–
5
ns
Master
–
5
ns
Master Loopback4
–
5
ns
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11
2
le
Master
8
Loopback4
Slave
Master
7
(SCKPCS+1) * tdelay - 22
Loopback4
ics
Description
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n
Num. Symbol
1. The trace length for the SCK pad should be kept as short as possible when used in Master loopback mode, and it does not support off-board
communication.
M
2. ffunc = SPI functional clock, which is generated from IPC.
3. tdelay = (1/fop ) * 2TXCFG[PRESCALE] .
4. Master Loopback mode - In this mode SCK clock is delayed for sampling the input data which is enabled by setting SPI_CTRL[SPDEN] bit as 1.
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5. Set the PCSSCK configuration bit as 0, for a minimum of 1 delay cycle of SPI delay clock, where PCSSCK ranges from 0 to 255.
6. Set the SCKPCS configuration bit as 0, for a minimum of 1 delay cycle of SPI delay clock, where SCKPCS ranges from 0 to 255.
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7. While selecting odd dividers, ensure Duty Cycle is meeting this parameter.
Data Sheet
YTM32B1LE0x Data Sheet, REV. 2.1, September 2025
27
Yuntu Microelectronics
PCS1
(OUTPUT)
3
2
SCK
(CPOL=0)
(OUTPUT)
10
11
10
11
4
5
5
SCK
(CPOL=1)
(OUTPUT)
MISO
(INPUT)
7
MSB IN2
BIT 6 . . . 1
LSB IN
8
MOSI
(OUTPUT)
MSB OUT2
9
BIT 6 . . . 1
LSB OUT
ro
n
1. If configured as an output.
2. LSBF = 0. For LSBF = 1, bit order is LSB, bit 1, ..., bit 6, MSB.
ics
6
ct
Figure 12: SPI Master Mode Timing (CHPA=0)
PCS1
2
10
3
5
SCK
(CPOL=1)
(OUTPUT)
6
MISO
(INPUT)
5
10
4
11
7
MSB IN2
BIT 6 . . . 1
LSB IN
9
8
PORT DATA MASTER MSB OUT2
M
MOSI
(OUTPUT)
11
icr
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SCK
(CPOL=0)
(OUTPUT)
le
(OUTPUT)
BIT 6 . . . 1
MASTER LSB OUT
PORT DATA
1.If configured as output
2. LSBF = 0. For LSBF = 1, bit order is LSB, bit 1, ..., bit 6, MSB.
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tu
Figure 13: SPI Master Mode Timing (CHPA=1)
Data Sheet
YTM32B1LE0x Data Sheet, REV. 2.1, September 2025
28
Yuntu Microelectronics
ro
n
ics
PCS
Figure 14: SPI Slave Mode Timing (CHPA=0)
ct
PCS
2
5
10
4
11
icr
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5
11
le
10
3
9
8
BIT 6 . . . 1
6
MOSI
7
BIT 6 . . . 1
LSB IN
M
MSB IN
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Figure 15: SPI Slave Mode Timing (CHPA=1)
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6.4.9 NVM Specifications
6.4.9.1 Flash Command Timing Specifications
Symbol
Description
Min.
Typ.
Max.
Unit
Tpgm
Program execution time
46
50
53.5
µs
Terase
Erase execution time
4.0
4.5
5.0
ms
Tchip_erase
Chip erase execution time
30
35
40
ms
Notes
6.4.9.2 Reliability Specifications
Data Sheet
YTM32B1LE0x Data Sheet, REV. 2.1, September 2025
29
Yuntu Microelectronics
Symbol
Description
Min.
Max.
Unit
tnvmretp
Data retention
20
–
years
tnvmcycp
Cycling endurance
100,000
–
cycles
Notes
6.4.10 Debug Module Electrical
Table 30: SWD Full Voltage Range Electricals
Symbol
Description
SWD_CLK frequency
T2
SWD_CLK cycle period
T3
SWD_CLK pulse width
T4
SWD_CLK rise and fall time
T5
SWD_CLK input data setup time to SWD_CLK rise edge
T6
SWD_CLK input data hold time after SWD_CLK rise edge
T7
SWD_CLK high to SWD_DIO output data valid
T8
SWD_CLK high to SWD_DIO output data Hi-Z
Min.
Typ.
Max.
Unit
–
–
20
MHz
ro
n
T1
ics
6.4.10.1 SWD Electrical Specifications
–
–
ns
20
–
–
ns
–
–
3
ns
8
–
–
ns
1.5
–
–
ns
–
–
35
ns
5
–
–
ns
icr
oe
le
ct
50
6.4.10.2 SWD Input Clock Timing
T2
T3
T4
T4
Figure 16: SWD Clock Timing
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M
T3
SWD_CLK
Data Sheet
YTM32B1LE0x Data Sheet, REV. 2.1, September 2025
30
Yuntu Microelectronics
6.4.10.3 SWD Output Data Timing
SWD_CLK
T5
SWD_DIO
T6
Input data valid
SWD_DIO
Output data valid
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T8
ics
T7
SWD_DIO
le
6.5 Thermal Attributes
ct
Figure 17: SWD Data Timing
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Table 31: Thermal Characteristics
Package Family
Unit
RJC
RJB
LQFP32L
89
18
35
◦ C/W
LQFP48L
78
16
32
◦ C/W
LQFP64L
65
13
30
◦ C/W
QFN32L
41
14
16
◦ C/W
tu
QFN
Thermal Resistance
RJA
M
LQFP
Package Type
Yu
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NOTE: Based on environmental simulation per JEDEC standards, the PCB is a JEDEC-compliant 2S2P
board. Data in this table is for reference only.
Data Sheet
YTM32B1LE0x Data Sheet, REV. 2.1, September 2025
31
Yuntu Microelectronics
7 Pinouts
7.1 IO Signal Description
The pinouts signal description is as follows:
Table 32: Pinmux Table
ALT0
ALT1
ALT2
ALT3
ALT4
ALT5
ALT6
ALT7
1
1
-
PTD_1
-
PTD_1 eTMR0_CH3
SPI1_SIN
-
I2C1_SCL
-
TMU_OUT2
2
2
2
-
PTD_0
-
PTD_0 eTMR0_CH2
SPI1_SCK
-
I2C1_SDA
-
TMU_OUT1
3
-
-
-
PTE_11
-
PTE_11 SPI2_PCS0 lpTMR0_ALT1
-
-
-
TMU_OUT5
4
-
-
-
PTE_10
-
PTE_10
CLKOUT
SPI2_PCS1
-
-
-
TMU_OUT4
5
3
-
1
PTE_5
-
PTE_5
TCLK_IN2
-
eTMR1_CH1
CAN0_TX
-
-
6
4
-
2
PTE_4
-
PTE_4
CLKOUT
-
eTMR1_CH0
CAN0_RX
-
-
7
5
3
3
VDD
VDD
-
-
-
-
-
-
-
8
6
4
-
VDDA
VDDA
-
-
-
-
-
-
-
9
-
-
-
VREFH
VREFH
-
-
-
-
-
-
-
-
-
5
-
VREFL
VREFL
-
-
-
-
-
-
-
10
7
6
4
VSS
VSS
-
-
-
-
11
8
7
5
PTB_7
EXTAL
PTB_7
I2C0_SCL
12
9
8
6
PTB_6
XTAL
PTB_6
I2C0_SDA
13
-
-
-
PTE_3
-
14
10
-
7
15
11
-
8
16
12
-
-
PTE_9
17
13
-
9
PTE_8 ACMP0_IN3 PTE_8 eTMR0_CH6
18
14
9
10
PTB_5
19
15
10
11
PTB_4
20
16
11
12
21
17
12
22
-
23
-
24
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n
ct
-
-
UART2_TX
-
-
TMU_OUT2
-
UART2_RX
-
-
TMU_OUT1
icr
oe
le
-
-
SPI1_SIN
-
-
TMU_IN6
ACMP0_OUT
PTD_16 EXTAL32K PTD_16 eTMR0_CH1
-
SPI0_SIN
ACMP0_ACTIVE
-
-
PTD_15 XTAL32K PTD_15 eTMR0_CH0
-
SPI0_SCK
-
-
-
SPI1_SCK
-
-
-
-
-
-
-
-
-
SPI0_PCS1
SPI0_PCS0
CLKOUT
TMU_IN0
-
PTB_4 eTMR0_CH4
SPI0_SOUT
-
-
TMU_IN1
-
PTC_3
ADC0_SE11
PTC_3 eTMR0_CH3
ACMP0_IN4
CAN0_TX
UART0_TX
-
-
-
13
PTC_2
ADC0_SE10
PTC_2 eTMR0_CH2
ACMP0_IN5
CAN0_RX
UART0_RX
-
-
-
-
-
PTD_7 ACMP0_IN6 PTD_7 UART2_TX
eTMR0_CH3
-
-
-
-
-
-
PTD_6 ACMP0_IN7 PTD_6 UART2_RX
eTMR0_CH2
-
-
-
-
18
-
14
PTD_5
lpTMR0_ALT2
-
-
TMU_IN7
-
25
19
13
-
PTC_1 ADC0_SE9 PTC_1 eTMR0_CH1
SPI2_SOUT
SPI2_SIN
-
eTMR1_CH7
-
26
-
14
-
PTC_0 ADC0_SE8 PTC_0 eTMR0_CH0
SPI2_SIN
SPI2_PCS1
-
eTMR1_CH6
-
27
-
-
-
PTC_17 ADC0_SE15 PTC_17 eTMR1_FLT3
-
SPI2_PCS2
-
-
-
28
20
-
-
PTC_16 ADC0_SE14 PTC_16 eTMR1_FLT2
-
SPI2_SCK
-
-
-
29
21
-
-
PTC_15 ADC0_SE13 PTC_15 eTMR1_CH3
SPI2_SCK
SPI2_SOUT
-
TMU_IN8
-
30
22
-
-
PTC_14 ADC0_SE12 PTC_14 eTMR1_CH2
-
SPI2_PCS0
-
TMU_IN9
-
31
23
15
15
PTB_3 ADC0_SE7 PTB_3 eTMR1_CH1
SPI0_SIN
eTMR1_QD_PHA
-
TMU_IN2
-
32
24
16
16
PTB_2 ADC0_SE6 PTB_2 eTMR1_CH0
SPI0_SCK
eTMR1_QD_PHB
-
TMU_IN3
-
33
25
17
17
PTB_1 ADC0_SE5 PTB_1 UART0_TX
SPI0_SOUT
TCLK_IN0
CAN0_TX
-
-
34
26
18
18
PTB_0 ADC0_SE4 PTB_0 UART0_RX
SPI0_PCS0
lpTMR0_ALT3
CAN0_RX
-
-
35
27
-
-
PTC_9
eTMR1_FLT1
-
-
-
-
-
PTE_9 eTMR0_CH7
PTB_5 eTMR0_CH5
M
Yu
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Data Sheet
-
PTE_3 eTMR0_FLT0
ics
1
tu
64
48
32 32
NAME
LQFP LQFP LQFP QFN
-
-
-
PTD_5
-
PTC_9 UART1_TX
YTM32B1LE0x Data Sheet, REV. 2.1, September 2025
32
Yuntu Microelectronics
64
48
32 32
NAME
LQFP LQFP LQFP QFN
ALT0
ALT2
PTC_8 UART1_RX
ALT3
ALT4
ALT5
ALT6
ALT7
eTMR1_FLT0
-
-
-
-
36
28
-
-
PTC_8
37
29
19
19
PTA_7 ADC0_SE3 PTA_7 eTMR0_FLT2
-
RTC_CLKIN
-
-
-
38
-
20
-
PTA_6 ADC0_SE2 PTA_6 eTMR0_FLT1
SPI1_PCS1
-
-
-
-
39
-
-
-
PTE_7
-
SPI1_PCS2
-
-
-
-
40
30
-
20
VSS
VSS
41
31
-
21
VDD
VDD
42
32
-
-
PTB_13
-
PTB_13 eTMR0_CH1
43
-
-
-
PTB_12
-
44
-
-
-
PTD_4
45
33
21
22
46
34
22
47
35
48
PTE_7 eTMR0_CH7
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
PTB_12 eTMR0_CH0
-
-
-
-
-
-
PTD_4 eTMR0_FLT3
-
-
-
PTD_3
-
PTD_3
-
SPI1_PCS0
I2C1_SCL
-
PTD_2
-
PTD_2
-
SPI1_SOUT
23
23
PTA_3
-
PTA_3 eTMR2_CH0
ics
-
ALT1
36
24
24
PTA_2
-
PTA_2 eTMR2_CH1
49
37
25
25
PTA_1
50
38
26
26
PTA_0
51
39
27
-
PTC_7
-
PTC_7 UART1_TX
-
52
40
28
-
PTC_6
-
PTC_6 UART1_RX
-
53
-
-
-
PTE_6
-
PTE_6
54
-
-
-
PTE_2
-
PTE_2 SPI0_SOUT lpTMR0_ALT3
55
41
-
-
PTA_13
-
56
42
-
-
PTA_12
-
57
43
-
27 PTA_11
-
58
44
-
28 PTA_10
-
59
-
-
-
PTE_1
-
60
-
-
-
PTE_0
-
61
45
29
29
PTC_5
62
46
30
30
63
47
31
31
64
48
32
-
eTMR2_CH0
TMU_IN4
NMI_b
I2C1_SDA
eTMR2_CH1
TMU_IN5
-
I2C0_SCL
SPI2_SCK
-
UART0_TX
-
I2C0_SDA
SPI2_SIN
-
UART0_RX
-
ADC0_SE1
PTA_1 eTMR1_CH1
ACMP0_IN1
-
SPI2_SOUT
eTMR1_QD_PHA
-
TMU_OUT0
ADC0_SE0
PTA_0 eTMR1_CH0
ACMP0_IN0
-
SPI2_PCS0
-
-
TMU_OUT3
SPI2_PCS1
CAN0_TX
eTMR1_QD_PHA
-
-
CAN0_RX
eTMR1_QD_PHB
-
-
-
-
-
-
-
-
-
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-
PTA_13 eTMR1_CH7
-
-
UART2_TX
-
-
PTA_12 eTMR1_CH6
-
-
UART2_RX
-
-
PTA_11 eTMR1_CH5
-
I2C1_SCL
ACMP0_ACTIVE
-
-
PTA_10 eTMR1_CH4
-
I2C1_SDA
-
-
-
SPI0_SIN
-
I2C1_SCL
SPI1_PCS0
eTMR1_FLT1
-
PTE_0
SPI0_SCK
TCLK_IN1
I2C1_SDA
SPI1_SOUT
eTMR1_FLT2
-
eTMR1_CH1
-
-
-
PTC_4 ACMP0_IN2 PTC_4 eTMR1_CH0 RTC_CLKOUT
-
-
PTA_5
M
PTE_1
-
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-
PTA_4
-
PTC_5 eTMR2_CH0 RTC_CLKOUT
eTMR1_QD_PHB SWD_CLK
PTA_5
-
TCLK_IN1
-
-
-
RESET_b
PTA_4
-
-
ACMP0_OUT
-
-
SWD_IO
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SPI0_PCS2
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-
Data Sheet
YTM32B1LE0x Data Sheet, REV. 2.1, September 2025
33
Yuntu Microelectronics
7.2 Packages
PTD1
1
PTA1
PTA0
PTC7
PTC6
PTE6
PTE2
PTA13
PTA12
PTA11
PTA10
PTE1
PTE0
PTC5
PTC4
PTA5
PTA4
The information of package pinouts is as follows:
64 63 62 61 60 59 58 57 56 55 54 53 52 51 50 49
48
PTA2
2
47
PTA3
3
46
PTD2
4
45
PTE5
5
44
PTE4
6
43
VDD
7
8
9
64-pin LQFP
VSS
10
PTB7
11
PTB6
12
PTE3
13
PTD16
14
PTD15
15
PTB12
PTB13
41
VDD
40
VSS
39
PTE7
38
PTA6
PTC8
35
PTC9
34
PTB0
16
33
17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32
PTB1
PTB3
PTC14
PTC15
PTC16
PTC0
PTC17
PTC1
PTD5
PTD6
PTD7
PTC2
PTC3
PTB4
PTB5
PTE8
PTB2
PTA7
36
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PTE9
PTD4
42
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VDDA
VREFH
PTD3
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PTE10
ics
PTD0
PTE11
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Figure 18: 64-pin LQFP Package
Data Sheet
YTM32B1LE0x Data Sheet, REV. 2.1, September 2025
34
PTD1
1
48 47 46 45 44 43 42 41 40 39 38 37
36
PTA2
PTD0
2
35
PTA3
PTE5
3
34
PTD2
PTE4
4
33
PTD3
VDD
5
32
PTB13
VDDA
6
31
VDD
VSS
7
30
VSS
PTB7
8
29
PTA7
48-pin LQFP
28
PTC8
10
27
PTC9
PTD15
11
26
PTB0
PTB6
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9
PTD16
PTB2
PTB1
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PTB3
PTC14
PTC15
PTC16
PTC1
PTD5
PTC3
PTC2
PTB5
PTE8
PTB4
25
12
13 14 15 16 17 18 19 20 21 22 23 24
PTE9
ics
PTA1
PTA0
PTC7
PTC6
PTA13
PTA12
PTA11
PTC5
PTA10
PTC4
PTA5
PTA4
Yuntu Microelectronics
PTA5
PTC4
PTC5
PTC6
PTC7
PTA0
PTA1
31
30
29
28
27
26
25
1
PTA4
PTD1
32
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Figure 19: 48-pin LQFP Package
PTA3
22
PTD2
21
PTD3
20
PTA6
6
19
PTA7
7
18
PTB0
17
10 11 12 13 14 15 16
PTB1
9
PTB4
23
3
PTB5
2
VDD
PTB2
PTB3
8
PTC0
PTB7
PTC1
VSSA/VSS
32-pin LQFP
PTC2
5
PTC3
4
VREFL
M
VDDA/VREFH
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PTA2
PTD0
PTB6
Data Sheet
24
Figure 20: 32-pin LQFP Package
YTM32B1LE0x Data Sheet, REV. 2.1, September 2025
35
PTA5
PTC4
PTC5
PTA10
PTA11
PTA0
PTA1
30
29
28
27
26
25
24
PTA2
PTE4
2
23
PTA3
VDD
3
22
PTD3
21
VDD
32-pin QFN
20
VSS
19
PTA7
PTB1
9
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PTB2
8
PTD15
PTB3
PTB0
PTC2
18
17
10 11 12 13 14 15 16
PTD5
7
PTC3
6
PTB4
PTB6
PTD16
PTB5
4
5
PTE8
VSS
PTB7
ics
PTA4
1
31
PTE5
32
Yuntu Microelectronics
Figure 21: 32-pin QFN Package
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Note: The chip mark will not contain packing information(T/R)
Data Sheet
YTM32B1LE0x Data Sheet, REV. 2.1, September 2025
36
Yuntu Microelectronics
7.3 Dimensions
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Package dimensions are as follows:
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PIN 1
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Figure 22: 64pin LQFP
Data Sheet
YTM32B1LE0x Data Sheet, REV. 2.1, September 2025
37
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Yuntu Microelectronics
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PIN 1
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Figure 23: 48pin LQFP
Data Sheet
YTM32B1LE0x Data Sheet, REV. 2.1, September 2025
38
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Yuntu Microelectronics
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PIN 1
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Figure 24: 32pin LQFP
Data Sheet
YTM32B1LE0x Data Sheet, REV. 2.1, September 2025
39
Yuntu Microelectronics
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PIN 1
Special Design Note:
The items marked with "• " (A/D/E/A1) are key characteristics.
The above projects must comply with the management and control
requirements of automotive electronic projects.
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**
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Figure 25: 32pin QFN
Data Sheet
YTM32B1LE0x Data Sheet, REV. 2.1, September 2025
40
Revision History
Revision History
The following table provides a revision history for this document.
1.2
2023/4/28
1.3
2023/5/23
1.4
2023/6/15
1.5
2023/7/21
1.6
2023/8/14
1.7
2023/10/8
1.8
2024/9/20
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2022/12/19
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1.1
Initial version
Changed maximum value from 150 to 135 in the second row of
‘Thermal Operating Characteristics’ table.
Changed VLAT to ILAT in ‘ESD Handling Ratings’ table.
Updated FIRC frequency accuracy information and changed the min value
to -1.5, max value to 1.5 in ‘FIRC(48MHz) Characteristics’ table.
Added the whole chapter of ‘Features’
Updated the value of VHBM in ‘ESD Handling Ratings’
Added the note of 5.8 in ‘Absolute Maximum Ratings’
Updated the contents of ‘Voltage and Current Operating Requirements’
Updated the value of Ileak and IIN of ‘DC Electrical Specifications at 3.3V’
Updated the value of Ileak and IIN of ‘DC Electrical Specifications at 5.0V’
Updated the typical value in ‘Power Consumption’
Corrected the value of Max to Typ in ‘Device Clock Specifications’
Updated the contents of ‘FXOSC(4-40MHz) Characteristics’
Updated the contents of ‘SXOSC(32.768KHz) Characteristics’
Updated the contents of ‘ACMP Characteristics’
Added the new section of ‘Thermal Attributes’
Updated the table in the figure of 32pin QFN
Updated the table of ‘Ordering Information’
Added the pinmux table of YTM32B1LE04x in ‘IO Signal Description’
Added the coplanarity specifications of product in the section of ‘Dimensions’
Added the location information of PIN 1 in the section of ‘Dimensions’
Updated the content in the table of ‘Ordering Information’
Added the new section of ‘Power Up Requirements’
Updated the content in the section of ‘IO Signal Description’
Updated the ordering information and part numbers in ‘Ordering information’
Updated the figure and table in ‘Power and Ground Pins’
Updated the power up time in ‘Power Up Requirements’
Updated the figure and first table in ‘ADC Characteristics’
In section Ordering Information, table ‘Ordering Information’,
removed cost versions.
In subsection Power Consumption, updated the description of ‘SIRC’ core
and ‘FXOSC’ core.
Added the information about ASIL-B in the chapter of ‘Features’
Updated all package dimensions in the section of ‘Dimensions’
Updated supply voltage 2.7V to 2.97V in the whole Data Sheet
Added Min and Max value in subsection of ‘Moisture Handling Ratings’
Added Min and Max value in subsection of ‘ESD Handling Ratings’
Added Min and Max value in subsection of ‘Absolute Maximum Ratings’
Added Min and Max value in subsection of ‘Voltage and Current Operating Requirements’
Added Min and Max value in subsection of ‘DC Electrical Specifications at 3.3V’
Added Min and Max value in subsection of ‘DC Electrical Specifications at 5.0V’
Added Min and Max value in subsection of ‘Power and Ground Pins’
Added Min and Max value in subsection of ‘POR,LVR and LVD Operating Requirements’
Added Min and Max value in subsection of ‘Power Consumption’
Added the whole subsection of ‘Power Supply Fluctuation Requirements’
Added Min and Max value in subsection of ‘FXOSC(4-40MHz) Characteristics’
Added Min and Max value in subsection of ‘FIRC(48MHz) Characteristics’
Added Min and Max value in subsection of ‘SXOSC(32.768KHz) Characteristics’
Added Min and Max value in subsection of ‘SIRC(2MHz) Characteristics’
Added Min and Max value in subsection of ‘LPO(750Hz) Characteristics’
Added Min and Max value in subsection of ‘ADC Characteristics’
Added Min and Max value in subsection of ‘ACMP Characteristics’
Updated Max value of VVDDA and VREFH in subsection of ‘Voltage and Current Operating Requirements’
Updated the description in subsection of ‘Power Supply Fluctuation Requirements’
Updated format of table about gain selection in subsection of ‘FXOSC(4-40MHz) Characteristics’
Removed the subsubsection of ‘Flash High Voltage Current Behaviors’
Added the value of Tramp in subsection of ‘Voltage and Current Operating Requirements’
Added the whole subsubsection of ‘MCU Power Supply Ramp Rate’
Corrected Min value of VIN in subsection of ‘ACMP Characteristics’
Added the whole subsection of ‘SPI Characteristics’
Added the value of RJC , RJB and note in the section of ‘Thermal Attributes’
Corrected the name of PIN9 to ”PTE8” of QFN32 package in section of ’Packages’
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2022/10/17
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1.0
Substantive Change(s)
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Date
2024/12/5
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Rev.No.
2.0
2025/2/27
2.1
2025/9/1
Data Sheet
YTM32B1LE0x Data Sheet, REV. 2.1, September 2025
41
Copyright and Contact
Copyright and Contact
Information in this document is provided solely to enable system and software implementers to use Yuntu
Microelectronics products. There are no express or implied copyright licenses granted hereunder to design
or fabricate any integrated circuits based on the information in this document. Yuntu Microelectronics
reserves the right to change the detail specifications as may be required to permit improvements in the
design of its products.
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Yuntu Microelectronics makes no warranty, representation or guarantee regarding the suitability of its
products for any particular purpose, nor does Yuntu Microelectronics assume any liability arising out of the
application or use of any product or circuit, and specifically disclaims any and all liability, including without
limitation consequential or incidental damages. “Typical” parameters that may be provided in Yuntu
Microelectronics data sheets and/or specifications can and do vary in different applications, and actual
performance may vary over time. All operating parameters, including “typicals,” must be validated for each
customer application by customer’s technical experts. Yuntu Microelectronics does not convey any license
under its patent rights nor the rights of others. Yuntu Microelectronics sells products pursuant to standard
terms and conditions of sale, which can be found at the following address: www.ytmicro.com
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While Yuntu Microelectronics has implemented advanced security features, all products may be subject to
unidentified vulnerabilities. Customers are responsible for the design and operation of their applications
and products to reduce the effect of these vulnerabilities on customer’s applications and products, and Yuntu
Microelectronics accepts no liability for any vulnerability that is discovered. Customers should implement
appropriate design and operating safeguards to minimize the risks associated with their applications and
products.
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Yuntu Microelectronics reserves the right to change the production detail specifications as may be required
to permit improvements in the design of its products.
©2020 - 2025 Jiangsu Yuntu Microelectronics Co., LTD
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How to reach us:
Home Page: www.ytmicro.com