XD2004

XD2002 DIP16 XD2003 DIP16 XD2004 DIP16 XL2003 SOP16 XL2004 SOP16 1 Features • • • • • 1 The 2004 devices have a 10.5-kΩ series base resistor to allow operation directly from CMOS devices that use supply voltages of 6 V to 15 V. The required input current of the 2004 device is below that of the 2003 devices, and the required voltage is less than that required by the XD/L200X device. 500-mA-Rated Collector Current (Single Output) High-Voltage Outputs: 50 V Output Clamp Diodes Inputs Compatible With Various Types of Logic Relay-Driver Applications 2 Applications • • • • • • Relay Drivers Stepper and DC Brushed Motor Drivers Lamp Drivers Display Drivers (LED and Gas Discharge) Line Drivers Logic Buffers 4 Simplified Block Diagram 9 COM 1 16 1B 1C 2 15 2B 3 Description . The XD/L200X devices are high-voltage, high-current Darlington transistor arrays. Each consists of seven NPN Darlington pairs that feature high-voltage outputs with common-cathode clamp diodes for switching inductive loads. 2C 3 14 3B . 3C 4 13 4B 4C 5 12 5B The collector-current rating of a single Darlington pair is 500 mA. The Darlington pairs can be paralleled for higher current capability. Applications include relay drivers, hammer drivers, lamp drivers, display drivers (LED and gas discharge), line drivers, and logic buffers. For 100-V (otherwise interchangeable) versions of the 2003 devices, see the SLRS023 data sheet for the SN75468 and SN75469 devices. 5C 6 11 6B 6C 7 7B The XD/L200X device is designed specifically for use with 14-V to 25-V PMOS devices. Each input of this device has a Zener diode and resistor in series to control the input current to a safe limit. The 2003 devices have a 2.7-kΩ series base resistor for each Darlington pair for operation directly with TTL or 5-V CMOS devices. 1 1 10 7C XD2002 DIP16 XD2003 DIP16 XD2004 DIP16 XL2003 SOP16 XL2004 SOP16 5 Pin Configuration and Functions 1B 2B 3B 4B 5B 6B 7B E 1 16 2 15 3 14 4 13 5 12 6 11 7 10 8 9 1C 2C 3C 4C 5C 6C 7C COM Pin Functions PIN NAME NO. 1B 1 2B 2 3B 3 4B 4 5B 5 6B 6 7B 7 1C 16 2C 15 3C 14 4C 13 5C 12 6C 11 7C 10 COM E (1) I/O (1) DESCRIPTION I Channel 1 through 7 Darlington base input O Channel 1 through 7 Darlington collector output 9 — Common cathode node for flyback diodes (required for inductive loads) 8 — Common emitter shared by all channels (typically tied to ground) I = Input, O = Output 2 XD2002 DIP16 XD2003 DIP16 XD2004 DIP16 XL2003 SOP16 XL2004 SOP16 6 Specifications 6.1 Absolute Maximum Ratings at 25°C free-air temperature (unless otherwise noted) (1) MIN VCC Collector-emitter voltage Clamp diode reverse voltage VI IOK (2) 50 V V Peak collector current, See Figure 4 and Figure 5 500 mA Output clamp current 500 mA Total emitter-terminal current –2.5 A TJ Operating virtual junction temperature XD/L200X –20 70 –40 105 –40 85 –40 105 Lead temperature for 1.6 mm (1/16 inch) from case for 10 seconds (2) V 30 Operating free-air temperature range (1) UNIT 50 Input voltage (2) TA Tstg MAX Storage temperature –65 °C 150 °C 260 °C 150 °C Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. All voltage values are with respect to the emitter/substrate terminal E, unless otherwise noted. 6.2 ESD Ratings VALUE V(ESD) (1) (2) Electrostatic discharge Human body model (HBM), per ANSI/ESDA/JEDEC JS-001 (1) ±2000 Charged device model (CDM), per JEDEC specification JESD22-C101 (2) ±500 UNIT V JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process. 6.3 Recommended Operating Conditions over operating free-air temperature range (unless otherwise noted) VCC Collector-emitter voltage (non-V devices) TJ Junction temperature MIN MAX 0 50 UNIT V –40 125 °C 6.4 Thermal Information XD/L200X THERMAL METRIC (1) D (SOIC) N (PDIP) NS (SO) PW (TSSOP) 16 PINS 16 PINS 16 PINS 16 PINS 73 67 64 108 °C/W UNIT RθJA Junction-to-ambient thermal resistance RθJC(top) Junction-to-case (top) thermal resistance 36 54 n/a 33.6 °C/W RθJB Junction-to-board thermal resistance n/a n/a n/a 51.9 °C/W ψJT Junction-to-top characterization parameter n/a n/a n/a 2.1 °C/W ψJB Junction-to-board characterization parameter n/a n/a n/a 51.4 °C/W (1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application report. 3 XD2002 DIP16 XD2003 DIP16 XD2004 DIP16 XL2003 SOP16 XL2004 SOP16 6.5 Electrical Characteristics: XD/L2002 TA = 25°C PARAMETER TEST FIGURE VI(on) ON-state input voltage Figure 14 VCE = 2 V, VOH High-level output voltage after switching Figure 18 VS = 50 V, IO = 300 mA VCE(sat) Collector-emitter saturation voltage Figure 12 VF Clamp forward voltage ICEX Collector cutoff current XD/L2002 TEST CONDITIONS MIN TYP IC = 300 mA 13 mV IC = 100 mA 0.9 1.1 II = 350 μA, IC = 200 mA 1 1.3 II = 500 μA, IC = 350 mA 1.2 1.6 Figure 15 IF = 350 mA Figure 9 VCE = 50 V, II = 0 50 Figure 10 VCE = 50 V, TA = 70°C II = 0 100 VI = 6 V 500 IC = 500 μA OFF-state input current Figure 10 VCE = 50 V, II Input current Figure 11 VI = 17 V IR Clamp reverse current Figure 14 Ci Input capacitance VR = 50 V 1.7 50 V 2 V μA μA 65 0.82 1.25 TA = 70°C mA 100 VR = 50 V VI = 0, V VS – 20 II = 250 μA, II(off) UNIT MAX μA 50 f = 1 MHz 25 pF 6.6 Electrical Characteristics: 2003 and 2004 TA = 25°C PARAMETER TEST FIGURE TEST CONDITIONS 2003 MIN 2004 TYP MAX MIN TYP IC = 125 mA VI(on) ON-state input voltage Figure 14 VCE = 2 V 2.4 IC = 250 mA 2.7 6 IC = 275 mA 7 Figure 18 VCE(sat) Collector-emitter saturation voltage Figure 13 ICEX Collector cutoff current VS = 50 V, IO = 300 mA 8 VS – 20 VS – 20 IC = 100 mA 0.9 1.1 0.9 1.1 II = 350 μA, IC = 200 mA 1 1.3 1 1.3 II = 500 μA, IC = 350 mA 1.2 1.6 1.2 1.6 Figure 9 VCE = 50 V, II = 0 50 50 Figure 10 VCE = 50 V, TA = 70°C II = 0 100 100 Clamp forward voltage Figure 16 IF = 350 mA II(off) Off-state input current Figure 11 VCE = 50 V, TA = 70°C, II Input current Figure 12 VI = 6 V IC = 500 μA 50 2 65 0.93 Ci Input capacitance Figure 15 VR = 50 V TA = 70°C VI = 0, f = 1 MHz 4 μA 15 2 V μA 65 1.35 VI = 5 V VR = 50 V 1.7 50 VI = 12 V Clamp reverse current V 500 1.7 VI = 3.85 V IR mV II = 250 μA, VF V 3 IC = 350 mA VOH UNIT 5 IC = 200 mA IC = 300 mA High-level output voltage after switching MAX 0.35 0.5 1 1.45 50 50 100 100 25 15 25 mA μA pF XD2002 DIP16 XD2003 DIP16 XD2004 DIP16 XL2003 SOP16 XL2004 SOP16 6.7 Electrical Characteristics: 2003 TA = 25°C PARAMETER VI(on) VOH VCE(sat) ON-state input voltage High-level output voltage after switching Collector-emitter saturation voltage TEST FIGURE Figure 14 VCE = 2 V Figure 18 2003 TEST CONDITIONS MIN 2.4 IC = 250 mA 2.7 IC = 300 mA 3 II = 250 μA, IC = 100 mA II = 350 μA, II = 500 μA, II = 0 ICEX Collector cutoff current Figure 9 VCE = 50 V, VF Clamp forward voltage Figure 16 IF = 350 mA II(off) OFF-state input current Figure 11 VCE = 50 V, II Input current Figure 12 VI = 3.85 V IR Clamp reverse current Figure 15 VR = 50 V Ci Input capacitance VI = 0, MAX IC = 200 mA VS = 50 V, IO = 300 mA Figure 13 TYP VS – 50 1.1 IC = 200 mA 1 1.3 IC = 350 mA 1.2 1.6 1.7 50 15 V 50 μA 2 V μA 65 0.93 f = 1 MHz V mV 0.9 IC = 500 μA UNIT 1.35 mA 50 μA 25 pF 6.8 Electrical Characteristics: 2003 TA = –40°C to 105°C PARAMETER VI(on) VOH VCE(sat) ON-state input voltage High-level output voltage after switching Collector-emitter saturation voltage TEST FIGURE Figure 14 TEST CONDITIONS VCE = 2 V Figure 18 2.9 IC = 300 mA 3 II = 350 μA, II = 500 μA, II = 0 Collector cutoff current Figure 9 VCE = 50 V, Clamp forward voltage Figure 16 IF = 350 mA II(off) OFF-state input current Figure 11 VCE = 50 V, II Input current Figure 12 VI = 3.85 V IR Clamp reverse current Figure 15 VR = 50 V Ci Input capacitance VI = 0, 5 MAX 2.7 IC = 100 mA VF TYP IC = 250 mA II = 250 μA, ICEX MIN IC = 200 mA VS = 50 V, IO = 300 mA Figure 13 2003 VS – 50 1.2 IC = 200 mA 1 1.4 IC = 350 mA 1.2 1.7 1.7 30 15 V 100 μA 2.2 V 1.35 mA 100 μA 25 pF μA 65 0.93 f = 1 MHz V mV 0.9 IC = 500 μA UNIT XD2002 DIP16 XD2003 DIP16 XD2004 DIP16 XL2003 SOP16 XL2004 SOP16 6.9 Electrical Characteristics: 2003 and 2004 over recommended operating conditions (unless otherwise noted) TEST FIGURE PARAMETER TEST CONDITIONS 2003 MIN 2004 TYP MAX MIN TYP MAX IC = 125 mA ON-state input voltage VI(on) Figure 14 VCE = 2 V 5 IC = 200 mA 2.7 IC = 250 mA 2.9 6 IC = 275 mA 7 IC = 300 mA High-level output voltage after switching VCE(sat) Collector-emitter saturation voltage Collector cutoff current ICEX Figure 18 VS = 50 V, IO = 300 mA 8 VS – 50 II = 350 μA, II = 500 μA, Figure 9 VCE = 50 V, II = 0 Figure 10 VCE = 50 V, TA = 70°C II = 0 100 VI = 6 V 500 Clamp forward voltage Figure 16 IF = 350 mA II(off) OFF-state input current Figure 11 VCE = 50 V, TA = 70°C, 0.9 1.2 IC = 200 mA 1 IC = 350 mA 1.2 Figure 12 0.9 1.1 1.4 1 1.3 1.7 1.2 1.6 100 1.7 IC = 500 μA VI = 3.85 V Input current mV IC = 100 mA VF II VS – 50 II = 250 μA, Figure 13 2.3 1.7 65 0.93 Clamp reverse current Ci Input capacitance Figure 15 50 TA = 25°C VR = 50 V VI = 0, f = 1 MHz 15 2 μA V μA 65 1.35 VI = 5 V VR = 50 V V 50 0.35 0.5 1 1.45 VI = 12 V IR V 3 IC = 350 mA VOH UNIT 100 50 100 100 25 15 25 mA μA pF 6.10 Switching Characteristics: XD/L2002, 2003, 2004 TA = 25°C PARAMETER TEST CONDITIONS XD/L2002, 2003, 2004 MIN UNIT TYP MAX tPLH Propagation delay time, low- to high-level output See Figure 17 0.25 1 μs tPHL Propagation delay time, high- to low-level output See Figure 17 0.25 1 μs 6.11 Switching Characteristics: 2003 TA = 25°C PARAMETER TEST CONDITIONS 2003 MIN TYP MAX UNIT tPLH Propagation delay time, low- to high-level output See Figure 17 0.25 1 μs tPHL Propagation delay time, high- to low-level output See Figure 17 0.25 1 μs 6 XD2002 DIP16 XD2003 DIP16 XD2004 DIP16 XL2003 SOP16 XL2004 SOP16 6.12 Switching Characteristics: 2003 TA = –40°C to 105°C PARAMETER 2003 TEST CONDITIONS MIN TYP MAX UNIT tPLH Propagation delay time, low- to high-level output See Figure 17 1 10 μs tPHL Propagation delay time, high- to low-level output See Figure 17 1 10 μs 6.13 Switching Characteristics: 2003, 2004 over recommended operating conditions (unless otherwise noted) PARAMETER 2003, 2004 TEST CONDITIONS MIN TYP MAX UNIT tPLH Propagation delay time, low- to high-level output See Figure 17 1 10 μs tPHL Propagation delay time, high- to low-level output See Figure 17 1 10 μs 6.14 Typical Characteristics VCE(sat) VCE(sat) - Collector-Emitter Saturation Voltage - V VCE(sat) VCE(sat) - Collector-Emitter Saturation Voltage - V 2.5 TA = 25°C 2 II = 250 µA II = 350 µA II = 500 µA 1.5 1 0.5 0 0 100 200 300 400 500 600 700 800 2.5 TA = 25°C II = 250 µA 2 II = 350 µA 1.5 II = 500 µA 1 0.5 0 0 100 200 300 400 500 600 700 800 IC(tot) - Total Collector Current - mA IC - Collector Current - mA Figure 1. Collector-Emitter Saturation Voltage vs Collector Current (One Darlington) Figure 2. Collector-Emitter Saturation Voltage vs Total Collector Current (Two Darlingtons in Parallel) 7 XD2002 DIP16 XD2003 DIP16 XD2004 DIP16 XL2003 SOP16 XL2004 SOP16 Typical Characteristics (continued) 600 500 450 IIC C - Maximum Collector Current - mA RL = 10 Ω TA = 25°C IC IC - Collector Current - mA 400 VS = 10 V 350 VS = 8 V 300 250 200 150 100 50 0 500 N=1 400 N=4 N=3 300 N=2 N=6 200 N = 7 N=5 100 TA = 70°C N = Number of Outputs Conducting Simultaneously 0 25 0 50 75 100 125 150 200 175 0 10 20 30 40 II - Input Current - µA 50 60 70 80 90 100 Duty Cycle - % Figure 3. Collector Current vs Input Current Figure 4. D Package Maximum Collector Current vs Duty Cycle 600 2000 TJ = -40°C to 105°C IIC C - Maximum Collector Current - mA 1800 500 1600 400 Input Current – µA N=1 N=3 N=2 N=4 300 N=5 N=6 N=7 200 1200 1000 Maximum 800 600 100 0 1400 400 TA = 85°C N = Number of Outputs Conducting Simultaneously 0 10 20 30 40 50 60 70 Typical 200 80 0 90 100 2 2.5 Duty Cycle - % 3 3.5 4 Input Voltage – V 4.5 5 Figure 6. Maximum and Typical Input Current vs Input Voltage Figure 5. N Package Maximum Collector Current vs Duty Cycle 500 2.1 V CE = 2 V TJ = -40°C to 105°C TJ = -40°C to 105°C 450 400 Output Current – mA Maximum VCE(sat) Voltage – V 1.9 1.7 1.5 Maximum 1.3 350 300 250 Minimum 200 1.1 150 Typical 0.9 100 200 300 400 100 250 500 350 450 550 650 Input Current – µA Output Current – mA Figure 7. Maximum and Typical Saturated VCE vs Output Current Figure 8. Minimum Output Current vs Input Current 8 XD2002 DIP16 XD2003 DIP16 XD2004 DIP16 XL2003 SOP16 XL2004 SOP16 7 Parameter Measurement Information Open Open VCE ICEX ICEX Open VI Figure 9. ICEX Test Circuit Open II(off) Figure 10. ICEX Test Circuit Open VCE II(on) IC Open VI Figure 11. II(off) Test Circuit Figure 12. II Test Circuit II is fixed for measuring VCE(sat), variable for measuring hFE. Open hFE = II VCE Open IC II VCE VI(on) IC Figure 13. hFE, VCE(sat) Test Circuit VCE Figure 14. VI(on) Test Circuit 9 IC XD2002 DIP16 XD2003 DIP16 XD2004 DIP16 XL2003 SOP16 XL2004 SOP16 Parameter Measurement Information (continued) VR IR VF Open Open Figure 15. IR Test Circuit Figure 16. VF Test Circuit Figure 17. Propagation Delay-Time Waveforms 200 W ≤10 ns ≤5 ns 90% 1.5 V Input VIH (see Note C) 90% 1.5 V 10% 10% 40 µs 0V VOH Output VOL VOLTAGE WAVEFORMS The pulse generator has the following characteristics: PRR = 12.5 kHz, ZO = 50 Ω. CL includes probe and jig capacitance. For testing the 2003 device, 2003 device, and 2003 devices, VIH = 3 V; for the XD/L2002 device, VIH = 13 V; for the 2004 and the 2004 devices, VIH = 8 V. Figure 18. Latch-Up Test Circuit and Voltage Waveforms 10 IF XD2002 DIP16 XD2003 DIP16 XD2004 DIP16 XL2003 SOP16 XL2004 SOP16 8 Detailed Description 8.1 Overview This standard device has proven ubiquity and versatility across a wide range of applications. This is due to integration of 7 Darlington transistors of the device that are capable of sinking up to 500 mA and wide GPIO range capability. The 2003 device comprises seven high-voltage, high-current NPN Darlington transistor pairs. All units feature a common emitter and open collector outputs. To maximize their effectiveness, these units contain suppression diodes for inductive loads. The 2003 device has a series base resistor to each Darlington pair, thus allowing operation directly with TTL or CMOS operating at supply voltages of 5 V or 3.3 V. The 2003 device offers solutions to a great many interface needs, including solenoids, relays, lamps, small motors, and LEDs. Applications requiring sink currents beyond the capability of a single output may be accommodated by paralleling the outputs. This device can operate over a wide temperature range (–40°C to 105°C). 8.2 Functional Block Diagrams All resistor values shown are nominal. The collector-emitter diode is a parasitic structure and should not be used to conduct current. If the collectors go below GND, an external Schottky diode should be added to clamp negative undershoots. COM 7V Output C 10.5 NŸ Input B 7.2 NŸ E 3 NŸ Figure 19. XD/L2002 Block Diagram COM COM Output C RB 2.7 NŸ Input B Output C RB 10.5 NŸ Input B 7.2 NŸ 3 NŸ E 7.2 NŸ 3 NŸ Figure 21. 2004 Block Diagram Figure 20.2003 Block Diagram 11 E XD2002 DIP16 XD2003 DIP16 XD2004 DIP16 XL2003 SOP16 XL2004 SOP16 8.3 Feature Description Each channel of the 2003 device consists of Darlington connected NPN transistors. This connection creates the effect of a single transistor with a very high-current gain (β2). This can be as high as 10,000 A/A at certain currents. The very high β allows for high-output current drive with a very low input current, essentially equating to operation with low GPIO voltages. The GPIO voltage is converted to base current through the 2.7-kΩ resistor connected between the input and base of the predriver Darlington NPN. The 7.2-kΩ and 3-kΩ resistors connected between the base and emitter of each respective NPN act as pulldowns and suppress the amount of leakage that may occur from the input. The diodes connected between the output and COM pin is used to suppress the kick-back voltage from an inductive load that is excited when the NPN drivers are turned off (stop sinking) and the stored energy in the coils causes a reverse current to flow into the coil supply through the kick-back diode. In normal operation the diodes on base and collector pins to emitter will be reversed biased. If these diodes are forward biased, internal parasitic NPN transistors will draw (a nearly equal) current from other (nearby) device pins. 8.4 Device Functional Modes 8.4.1 Inductive Load Drive When the COM pin is tied to the coil supply voltage, 2003 device is able to drive inductive loads and suppress the kick-back voltage through the internal free-wheeling diodes. 8.4.2 Resistive Load Drive When driving a resistive load, a pullup resistor is needed in order for 2003 device to sink current and for there to be a logic high level. The COM pin can be left floating for these applications. 12 XD2002 DIP16 XD2003 DIP16 XD2004 DIP16 XL2003 SOP16 XL2004 SOP16 9 Application and Implementation 9.1 Application Information Typically, the 2003 device drives a high-voltage or high-current (or both) peripheral from an MCU or logic device that cannot tolerate these conditions. This design is a common application of 2003 device, driving inductive loads. This includes motors, solenoids and relays. Figure 22 shows a model for each load type. 9.2 Typical Application 3.3-V Logic 3.3-V Logic 2003 IN1 OUT1 IN2 OUT2 IN3 OUT3 IN4 OUT4 VSUP 3.3-V Logic IN5 OUT5 IN6 OUT6 IN7 OUT7 GND COM VSUP Figure 22. 2003 Device as Inductive Load Driver 9.2.1 Design Requirements For this design example, use the parameters listed in Table 1 as the input parameters. Table 1. Design Parameters DESIGN PARAMETER EXAMPLE VALUE GPIO voltage 3.3 V or 5 V Coil supply voltage 12 V to 48 V Number of channels 7 Output current (RCOIL) 20 mA to 300 mA per channel Duty cycle 100% 13 XD2002 DIP16 XD2003 DIP16 XD2004 DIP16 XL2003 SOP16 XL2004 SOP16 9.2.2 Detailed Design Procedure When using 2003 device in a coil driving application, determine the following: • Input voltage range • Temperature range • Output and drive current • Power dissipation 9.2.2.1 Drive Current The coil voltage (VSUP), coil resistance (RCOIL), and low-level output voltage (VCE(SAT) or VOL) determine the coil current. ICOIL = (VSUP – VCE(SAT)) / RCOIL (1) 9.2.2.2 Low-Level Output Voltage The low-level output voltage (VOL) is the same as VCE(SAT) and can be determined by, Figure 1, Figure 2, or Figure 7. 9.2.2.3 Power Dissipation and Temperature The number of coils driven is dependent on the coil current and on-chip power dissipation. The number of coils driven can be determined by Figure 4 or Figure 5. For a more accurate determination of number of coils possible, use the below equation to calculate 2003 device on-chip power dissipation PD: N PD = å VOLi ´ ILi i=1 where • • N is the number of channels active together VOLi is the OUTi pin voltage for the load current ILi. This is the same as VCE(SAT) (2) To ensure reliability of 2003 device and the system, the on-chip power dissipation must be lower that or equal to the maximum allowable power dissipation (PD(MAX)) dictated by below equation Equation 3. PD(MAX) = (T J(MAX) - TA ) qJA where • • • TJ(max) is the target maximum junction temperature TA is the operating ambient temperature RθJA is the package junction to ambient thermal resistance Limit the die junction temperature of the 2003 device to less than 125°C. The IC junction temperature is directly proportional to the on-chip power dissipation. 14 (3) XD2002 DIP16 XD2003 DIP16 XD2004 DIP16 XL2003 SOP16 XL2004 SOP16 9.2.3 Application Curves 13 12 11 10 9 8 7 6 5 4 3 2 1 0 -0.004 14 12 Output voltage - V Output voltage - V The characterization data shown in Figure 23 and Figure 24 were generated using the 2003 device drivingan OMRON G5NB relay and under the following conditions: VIN = 5 V, VSUP= 12 V, and RCOIL= 2.8 kΩ. 10 8 6 4 2 0 0.004 0.008 Time (s) 0.012 0 -0.004 0.016 D001 Figure 23. Output Response With Activation of Coil (Turnon) 0 0.004 0.008 Time (s) 0.012 0.016 D001 Figure 24. Output Response With De-activation of Coil (Turnoff) 15 XD2002 DIP16 XD2003 DIP16 XD2004 DIP16 XL2003 SOP16 XL2004 SOP16 9.3 System Examples XD/L2002 ULN2002A VSS V 16 1 16 2 15 2 15 3 14 3 14 4 4 13 13 5 12 6 11 7 10 8 9 12 6 11 7 10 8 9 Lam Test TTL Output Figure 25. P-MOS to Load VDD V 1 5 P-MOS Output 2003 VCC Figure 26. TTL to Load VCC V 2004 V 2003 1 16 1 16 2 15 2 15 3 14 3 14 4 13 4 13 5 12 5 12 6 11 6 11 7 10 7 10 8 9 8 9 RP CMOS Output TTL Output Figure 27. Buffer for Higher Current Loads Figure 28. Use of Pullup Resistors to Increase Drive Current 16 XD2002 DIP16 XD2003 DIP16 XD2004 DIP16 XL2003 SOP16 XL2004 SOP16 17 16 XD2002 DIP16 XD2003 DIP16 XD2004 DIP16 XL2003 SOP16 XL2004 SOP16 18 17 XD2002 DIP16 XD2003 DIP16 XD2004 DIP16 XL2003 SOP16 XL2004 SOP16 19