Fremont Micro Devices
Preliminary FT25H04/02
FT25H04/02
DATASHEET
© 2014 Fremont Micro Devices Inc.
Confidential Rev1.0
DS25H04/02-page1
Preliminary FT25H04/02
Fremont Micro Devices
CONTENTS
1.
FEATURES ............................................................................................................................................ 3
2.
GENERAL DESCRIPTION .................................................................................................................... 4
3.
MEMORY ORGANIZATION................................................................................................................... 6
4.
DEVICE OPERATION............................................................................................................................ 8
5.
DATA PROTECTION ............................................................................................................................. 8
6.
STATUS REGISTER ............................................................................................................................ 10
7.
COMM ANDS DESCRIPTION ..............................................................................................................11
7.1.
WRITE ENABLE (WREN) (06H) ........................................................................................................ 13
7.2.
WRITE DISABLE (WRDI) (04H)......................................................................................................... 13
7.3.
READ STATUS REGISTER (RDSR) (05H)........................................................................................... 13
7.4.
WRITE STATUS REGISTER (WRSR) (01H)......................................................................................... 14
7.5.
READ DATA BYTES (READ) (03H) .................................................................................................... 14
7.6.
READ DATA BYTES AT HIGHER SPEED (FAST READ) (0BH)................................................................. 15
7.7.
PAGE PROGRAM (PP) (02H)............................................................................................................. 15
7.8.
SECTOR ERASE (SE) (20H).............................................................................................................. 16
7.9.
BLOCK ERASE (BE) (D8H) ............................................................................................................... 17
7.10.
CHIP ERASE (CE) (60/C7H)........................................................................................................... 17
7.11.
READ MANUFACTURE ID/ DEVICE ID (REMS) (90H)........................................................................ 18
7.12.
READ IDENTIFICATION (RDID) (9FH)............................................................................................... 19
8.
ELECTRICAL CHARACTERISTICS ................................................................................................... 20
POWER-ON TIMING ........................................................................................................................... 20
8.1.
8.2.
INITIAL DELIVERY STATE ................................................................................................................... 20
8.3.
DATA RETENTION AND ENDURANCE ................................................................................................... 20
8.4.
LATCH UP CHARACTERISTICS ............................................................................................................ 20
8.5.
ABSOLUTE MAXIMUM RATINGS .......................................................................................................... 21
8.6.
CAPACITANCE MEASUREMENT CONDITION ......................................................................................... 21
8.7.
DC CHARACTERISTICS ..................................................................................................................... 22
8.8.
AC CHARACTERISTICS ..................................................................................................................... 23
9.
ORDERING INFORMATION................................................................................................................ 25
10.
PACKAGE INFORMATION.............................................................................................................. 26
10.1.
PACKAGE SOP8 150MIL................................................................................................................ 26
10.2.
PACKAGE SOP8 208MIL................................................................................................................ 27
10.3.
PACKAGE DIP8 300MIL ................................................................................................................. 28
10.4.
PACKAGE VSOP8 208MIL ............................................................................................................. 29
10.5.
PACKAGE TSSOP8 173MIL ........................................................................................................... 30
11.
REVISION HISTORY........................................................................................................................ 31
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1. FEATURES
4M-bit/2M-bit Serial Flash
y
512K-byte/256K-byte
y
256 bytes per programmable page
Standard SPI
y
High Speed Clock Frequency
y
Standard SPI: SCLK, CS#, SI, SO,
120MHz for fast read with 30PF load
Program/Erase Speed
y
Page Program time: 1.5ms typical
y
Sector Erase time: 150ms typical
y
Block Erase time: 0.8s typical
y
Chip Erase time: 6s/3s typical
Flexible Architecture
y
Sector of 4K-byte
y
Block of 64k-byte
Low Power Consumption
y
10mA maximum active current
y
5uA maximum standby current
Single Power Supply Voltage: Full voltage range:2.7~3.6V
Minimum 100,000 Program/Erase Cycle
Hardware Features
y
8-pin SOP8 (150mil)
y
8-pin SOP8 (200mil)
y
8-pin DIP8 (300mil)
y
8-pin VSOP8 (200mil)
y
8-pin TSSOP8 (173mil)
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Preliminary FT25H04/02
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2. GENERAL DESCRIPTION
The FT25H04/02 (4M-bit/2M-bit) Serial flash supports the standard Serial Peripheral Interface (SPI). SPI
clock frequency of up to 120MHz is supported for fast read command.
CONNECTION DIAGRAM
CS#
1
8
VCC
SO
2
7
NC
Top View
NC
3
6
SCLK
VSS
4
5
SI
8 – LEAD SOP
PIN DESCRIPTION
Pin Name
I/O
Description
CS#
I
Chip Select Input
SO
O
Data Output
Ground
VSS
SI
I
Data Input
SCLK
I
Serial Clock Input
VCC
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Power Supply
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BLOCK DIAGRAM
Write
Control
Logic
SCLK
CS#
SPI
Command
&
Control
Logic
High Voltage
Generators
Page Address
Latch/Counter
© 2014 Fremont Micro Devices Inc.
Flash
Memory
Column Decode And
256-Byte Page Buffer
SI
SO
Write Protect Logic
And Row Decode
Status
Register
Byte Address
Latch/Counter
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3. MEMORY ORGANIZATION
FT25H04/02
Each Device has
Each block has
Each sector has
Each page has
512K/256K
64K
4K
256
bytes
2K/1K
256
16
-
pages
128/64
16
-
-
sectors
8/4
-
-
-
blocks
UNIFORM BLOCK SECTOR ARCHITECTURE
FT25H04 64K Bytes Block Sector Architecture
Block
7
6
……
……
2
1
0
© 2014 Fremont Micro Devices Inc.
Sector
Address range
127
07F000H
07FFFFH
……
……
……
112
070000H
070FFFH
111
06F000H
06FFFFH
……
……
……
96
060000H
060FFFH
……
……
……
……
……
……
……
……
……
……
……
……
……
……
……
……
……
……
47
02F000H
02FFFFH
……
……
……
32
020000H
020FFFH
31
01F000H
01FFFFH
……
……
……
16
010000H
010FFFH
15
00F000H
00FFFFH
……
……
……
0
000000H
000FFFH
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Fremont Micro Devices
FT25H02 64K Bytes Block Sector Architecture
Block
3
2
1
0
© 2014 Fremont Micro Devices Inc.
Sector
Address range
63
03F000H
03FFFFH
……
……
……
48
030000H
030FFFH
47
02F000H
02FFFFH
……
……
……
32
020000H
020FFFH
31
01F000H
01FFFFH
……
……
……
16
010000H
010FFFH
15
00F000H
00FFFFH
……
……
……
0
000000H
000FFFH
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4. DEVICE OPERATION
The FT25H04/02 features a serial peripheral interface on 4 signals bus: Serial Clock (SCLK), Chip
Select (CS#), Serial Data Input (SI) and Serial Data Output (SO). Both SPI bus mode 0 and 3 are supported.
Input data is latched on the rising edge of SCLK and data shifts out on the falling edge of SCLK.
5. DATA PROTECTION
The FT25H04/02 provide the following data protection methods:
Write Enable (WREN) command: The WREN command is set the Write Enable Latch bit (WEL). The
WEL bit will return to reset by the following situation:
y Power-Up
y Write Disable (WRDI)
y Write Status Register (WRSR)
y Page Program (PP)
y Sector Erase (SE) / Block Erase (BE) / Chip Erase (CE)
Software Protection Mode:
y SRWD=0, the Block Protect (BP2, BP1, BP0) bits define the section of the memory array that can be
read but not change
y SRWD=1, the Write Status Register (WRSR) instruction is no longer accepted for execution and the
SRWD bit and Block Protect bits (BP2, BP1, BP0) are read only.
Table1.1 FT25H04 Protected Area Sizes
Status bit
Protect level
Protect Block
0
0(none)
None
0
1
1 (1 block)
Block 7
0
1
0
2 (2 blocks)
Block 6-7
0
1
1
3 (4 blocks)
Block 4-7
1
0
0
4 (8 blocks)
All
1
0
1
5 (All)
All
1
1
0
6 (All)
All
1
1
1
7 (All)
All
BP2
BP1
BP0
0
0
0
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Table1.2 FT25H02 Protected Area Sizes
Status bit
Protect level
Protect Block
0
0(none)
None
0
1
1 (1 block)
Block 3
0
1
0
2 (2 blocks)
Block 2-3
0
1
1
3 (4 blocks)
ALL
BP2
BP1
BP0
0
0
0
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6. STATUS REGISTER
S7
S6
S5
S4
S3
S2
S1
S0
SRWD
Reserved
Reserved
BP2
BP1
BP0
WEL
WIP
The status and control bits of the Status Register are as follows:
WIP bit.
The Write In Progress (WIP) bit indicates whether the memory is busy in program/erase/write status
register progress. When WIP bit sets to 1, the device is busy in program/erase/write status register progress.
When WIP bit sets 0, the device is not in program, erase or write status register .
WEL bit.
The Write Enable Latch (WEL) bit indicates the status of the internal Write Enable Latch. When set to 1,
the internal Write Enable Latch is set. When set to 0, the internal Write Enable Latch is reset and no Write
Status Register, Program or Erase command is accepted.
BP2, BP1, BP0 bits.
The Block Protect (BP2, BP1, BP0) bits are non-volatile. They define the size of the area to be software
protected against Program and Erase commands. These bits are written with the Write Status Register
(WRSR) command. When the Block Protect (BP2, BP1, BP0) bits are set to 1, the relevant memory area (as
defined in Table1.1 or 1.2).becomes protected against Page Program (PP), Sector Erase (SE) and Block
Erase (BE) commands. Chip Erase command will be ignored if one or more of the Block Protect (BP2, BP1,
BP0) bits are 1.
SRWD bit.
The Status Register Write Disable (SRWD) bit is a non-volatile One Time Program(OTP) bit in the status
register that provide another software protection. Once it is set to 1, the Write Status Register (WRSR)
instruction is no longer accepted and the SRWD bit and Block Protect bits (BP2, BP1, BP0) are read only.
SRWD
Status register
Memory
Status register can be written in (WEL
0
bit is set to "1") and the SRWD,
BP2-BP0 bits can be changed
1
The protected area cannot be program
or erase
The SRWD, BP2-BP0 of status register
The protected area cannot be program
bits cannot be changed
or erase
© 2014 Fremont Micro Devices Inc.
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7. COMMANDS DESCRIPTION
All commands, addresses and data are shifted in and out of the device, beginning with the most
significant bit on the first rising edge of SCLK after CS# is driven low. Then, the one-byte command code must
be shifted in to the device, most significant bit first on SI, each bit being latched on the rising edges of SCLK.
See Table2, every command sequence starts with a one-byte command code. Depending on the
command, this might be followed by address bytes, or by data bytes, or by both or none. CS# must be driven
high after the last bit of the command sequence has been shifted in. For the command of Read, Fast Read,
Read Status Register, and Read Device ID, the shifted-in command sequence is followed by a data-out
sequence. CS# can be driven high after any bit of the data-out sequence is being shifted out.
For the command of Page Program, Sector Erase, Block Erase, Chip Erase, Write Status Register, Write
Enable, Write Disable, CS# must be driven high exactly at a byte boundary, otherwise the command is
rejected. That is CS# must driven high when the number of clock pulses after CS# being driven low is an
exact multiple of eight. For Page Program, if at any time the input byte is not a full byte, nothing will happen
and WEL will not be reset.
Table2. Commands
Command Name
Byte1
Byte2
Write Enable
06H
Write Disable
04H
Read Status Register
05H
(S7-S0)
(continuous)
Write Status Register
01H
(S7-S0)
(continuous)
Read Data
03H
A23-A16
A15-A8
A7-A0
(D7-D0)
(Next byte)
(continuous)
Fast Read
0BH
A23-A16
A15-A8
A7-A0
dummy
(D7-D0)
(continuous)
Page Program
02H
A23-A16
A15-A8
A7-A0
(D7-D0)
(Next byte)
Sector Erase
20H
A23-A16
A15-A8
A7-A0
Block Erase
D8H
A23-A16
A15-A8
A7-A0
Chip Erase
C7/60H
Manufacturer/Device ID
90H
dummy
dummy
00H
(MID7-MID0)
(DID7-DID0)
(JDID15-JDI
(JDID7-JDID
Read Identification
9FH
(MID7-MID0)
D8)
0)
© 2014 Fremont Micro Devices Inc.
Byte3
Byte4
Byte5
Byte6
n-Bytes
(continuous)
(continuous)
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Fremont Micro Devices
Table of ID Definitions:
FT25H04
Operation Code
M7-M0
ID15-ID8
9FH
0E
40
90H
0E
ID7-ID0
13
12
FT25H02
Operation Code
M7-M0
ID15-ID8
9FH
0E
40
90H
0E
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ID7-ID0
12
11
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7.1. Write Enable (WREN) (06H)
The Write Enable (WREN) command is for setting the Write Enable Latch (WEL) bit. The Write Enable
Latch (WEL) bit must be set prior to every Page Program (PP), Sector Erase (SE), Block Erase (BE), Chip
Erase (CE) and Write Status Register (WRSR) command. The Write Enable (WREN) command sequence:
CS# goes lowÆSend Write Enable commandÆCS# goes high.
Figure1. Write Enable Sequence Diagram
CS#
0 1 2 3 4 5 6 7
SCLK
Command
SI
06H
High-Z
SO
7.2. Write Disable (WRDI) (04H)
The Write Disable command is for resetting the Write Enable Latch (WEL) bit. The Write Disable
command sequence: CS# goes lowÆSend Write Disable commandÆCS# goes high. The WEL bit is reset by
following condition: Power-up and upon completion of the Write Status Register, Page Program, Sector
Erase, Block Erase and Chip Erase commands.
Figure2. Write Disable Sequence Diagram
CS#
0 1 2 3 4 5 6 7
SCLK
Command
SI
SO
04H
High-Z
7.3. Read Status Register (RDSR) (05H)
The Read Status Register (RDSR) command is for reading the Status Register. The Status Register
may be read at any time, even while a Program, Erase or Write Status Register cycle is in progress. When
one of these cycles is in progress, it is recommended to check the Write In Progress (WIP) bit before sending
a new command to the device. It is also possible to read the Status Register continuously.
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Figure3. Read Status Register Sequence Diagram
CS#
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15
SCLK
Command
SI
05H
S7~S0 out
High-Z
SO
S7~S0 out
7 6 5 4 3 2 1 0 7 6 5 4 3 2 1 0 7
MSB
MSB
7.4. Write Status Register (WRSR) (01H)
The Write Status Register (WRSR) command allows new values to be written to the Status Register.
Before it can be accepted, a Write Enable (WREN) command must previously have been executed. After the
Write Enable (WREN) command has been decoded and executed, the device sets the Write Enable Latch
(WEL).
The Write Status Register (WRSR) command has no effect on S6, S5, S1 and S0 of the Status Register.
CS# must be driven high after the eighth bit of the data byte has been latched in. If not, the Write Status
Register (WRSR) command is not executed. As soon as CS# is driven high, the self-timed Write Status
Register cycle (whose duration is tW) is initiated. While the Write Status Register cycle is in progress, the
Status Register may be read to check the value of the Write In Progress (WIP) bit. The Write In Progress
(WIP) bit is 1 during the self-timed Write Status Register cycle, and is 0 when it is completed. When the cycle
is completed, the Write Enable Latch (WEL) is reset.
The Write Status Register (WRSR) command allows the user to change the values of the Block Protect
(BP2, BP1, BP0) bits, to define the size of the area that is to be treated as read-only, as defined in Table1.1
and 1.2. The Status Register Write Disable (SRWD) bit is a non-volatile One Time Program(OTP) bit, the
Write Status Register (WRSR) command allows the user to set the Status Register Write Disable (SRWD) bit
to 1. The Status Register Write Disable (SRWD) bit allow the device to be put in another Software Protected
Mode. Once the SRWD bit is set to 1, the Write Status Register (WRSR) command is not executed, and the
SRWD bit and Block Protect bits (BP2, BP1, BP0) are read only.
Figure4. Write Status Register Sequence Diagram
CS#
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15
SCLK
SI
Command
Status Register in
01H
7 6 5 4 3 2 1 0
MSB
High-Z
SO
7.5. Read Data Bytes (READ) (03H)
The Read Data Bytes (READ) command is followed by a 3-byte address (A23-A0), each bit being
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latched-in during the rising edge of SCLK. Then the memory content, at that address, is shifted out on SO,
each bit being shifted out, at a Max frequency fR, during the falling edge of SCLK. The first byte addressed
can be at any location. The address is automatically incremented to the next higher address after each byte of
data is shifted out. Therefore, the whole memory can be read with a single Read Data Bytes (READ)
command. During an Erase, Program or Write cycle, Read Data Byte (READ) command will be rejected
without affecting the cycle in progress.
Figure5. Read Data Bytes Sequence Diagram
CS#
0 1 2 3 4 5 6 7 8 9 10 11
24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40
SCLK
Command
SI
24-bit address(A23:A0)
23 22 21 20 19
03H
7 6 5 4 3 2 1 0
MSB
Data Out2
Data Out1
High-Z
SO
MSB
7 6 5 4 3 2 1 0
7.6. Read Data Bytes At Higher Speed (Fast Read) (0BH)
The Read Data Bytes at Higher Speed (Fast Read) command is for quickly reading data out. It is
followed by a 3-byte address (A23-A0) and a dummy byte, each bit being latched-in during the rising edge of
SCLK. Then the memory content, at that address, is shifted out on SO, each bit being shifted out, at a Max
frequency fC, during the falling edge of SCLK. The first byte address can be at any location. The address is
automatically incremented to the next higher address after each byte of data is shifted out.
Figure6. Read Data Bytes at Higher Speed Sequence Diagram
CS#
0 1 2 3 4 5 6 7 8 9 10 11
24 25 26 27 28 29 30 31
SCLK
Command
SI
24-bit address(A23:A0)
23 22 21 20 19
0BH
7 6 5 4 3 2 1 0
MSB
High-Z
SO
CS#
32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55
SCLK
Dummy Byte
SI
7 6 5 4 3 2 1 0
Data Out1
SO
Data Out2
Data Out3
7 6 5 4 3 2 1 0 7 6 5 4 3 2 1 0
MSB
MSB
7.7. Page Program (PP) (02H)
The Page Program (PP) command is for programming the memory. A Write Enable (WREN) command
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must previously have been executed to set the Write Enable Latch (WEL) bit before sending the Page
Program command.
The Page Program (PP) command is entered by driving CS# Low, followed by the command code, three
address bytes and at least one data byte on SI. If the 8 least significant address bits (A7-A0) are not all zero,
all transmitted data that goes beyond the end of the current page are programmed from the start address of
the same page (from the address whose 8 least significant bits (A7-A0) are all zero). CS# must be driven low
for the entire duration of the sequence. The Page Program command sequence: CS# goes lowÆsending
Page Program commandÆ3-byte address on SIÆat least 1 byte data on SIÆ CS# goes high. The command
sequence is shown in Figure7. If more than 256 bytes are sent to the device, previously latched data are
discarded and the last 256 data bytes are guaranteed to be programmed correctly within the same page. If
less than 256 data bytes are sent to device, they are correctly programmed at the requested addresses
without having any effects on the other bytes of the same page. CS# must be driven high after the eighth bit of
the last data byte has been latched in; otherwise the Page Program (PP) command is not executed.
As soon as CS# is driven high, the self-timed Page Program cycle (whose duration is tPP) is initiated.
While the Page Program cycle is in progress, the Status Register may be read to check the value of the Write
In Progress (WIP) bit. The Write In Progress (WIP) bit is 1 during the self-timed Page Program cycle, and is 0
when it is completed. Write Enable Latch (WEL) bit is reset to 0 at the end of the Page Program Cycle..
Page Program (PP) command applied to a page which is protected by the Block Protect (BP2, BP1,
BP0) bit (see Table1.1 or 1.2) is not executed.
Figure7. Page Program Sequence Diagram
CS#
0 1 2 3 4 5 6 7 8 9 10 11
24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39
SCLK
24-bit address(A23:A0)
Command
SI
23 22 21 20 19
02H
Data Byte1
7 6 5 4 3 2 1 0 7 6 5 4 3 2 1 0
MSB
MSB
40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63
2072
2073
2074
2075
2076
2077
2078
2079
CS#
SCLK
Data Byte2
SI
Data Byte3
Data Byte4
7 6 5 4 3 2 1 0 7 6 5 4 3 2 1 0 7 6 5 4 3 2 1 0
MSB
MSB
MSB
Data Byte256
7 6 5 4 3 2 1 0
MSB
7.8. Sector Erase (SE) (20H)
The Sector Erase (SE) command is for erasing the all data of the chosen sector. A Write Enable (WREN)
command must previously have been executed to set the Write Enable Latch (WEL) bit. The Sector Erase
(SE) command is entered by driving CS# low, followed by the command code, and 3-address byte on SI. Any
address inside the sector is a valid address for the Sector Erase (SE) command. CS# must be driven low for
the entire duration of the sequence.
The Sector Erase command sequence: CS# goes lowÆsending Sector Erase commandÆ3-byte
address on SIÆCS# goes high. The command sequence is shown in Figure8. CS# must be driven high after
the eighth bit of the last address byte has been latched in; otherwise the Sector Erase (SE) command is not
executed. As soon as CS# is driven high, the self-timed Sector Erase cycle (whose duration is tSE) is initiated.
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While the Sector Erase cycle is in progress, the Status Register may be read to check the value of the Write In
Progress (WIP) bit. The Write In Progress (WIP) bit is 1 during the self-timed Sector Erase cycle, and is 0
when it is completed. Write Enable Latch (WEL) bit is reset to 0 at the end of the Sector Erase cycle. Sector
Erase (SE) command applied to a sector which is protected by the Block Protect (BP2, BP1, BP0) bit (see
Table1.1 or 1.2) is not executed.
Figure8. Sector Erase Sequence Diagram
CS#
0 1 2 3 4 5 6 7 8 9 10 11
24 25 26 27 28 29 30 31
SCLK
Command
SI
20H
24-bit address(A23:A0)
23 22 21 20 19
7 6 5 4 3 2 1 0
MSB
7.9. Block Erase (BE) (D8H)
The Block Erase (BE) command is for erasing the all data of the chosen block. A Write Enable (WREN)
command must previously have been executed to set the Write Enable Latch (WEL) bit. The Block Erase (BE)
command is entered by driving CS# low, followed by the command code, and three address bytes on SI. Any
address inside the block is a valid address for the Block Erase (BE) command. CS# must be driven low for the
entire duration of the sequence.
The Block Erase command sequence: CS# goes lowÆsend Block Erase command Æ 3-byte address on
SIÆCS# goes high. The command sequence is shown in Figure9. CS# must be driven high after the eighth
bit of the last address byte has been latched in; otherwise the Block Erase (BE) command is not executed. As
soon as CS# is driven high, the self-timed Block Erase cycle (whose duration is tBE) is initiated. While the
Block Erase cycle is in progress, the Status Register may be read to check the value of the Write In Progress
(WIP) bit. The Write In Progress (WIP) bit is 1 during the self-timed Block Erase cycle, and is 0 when it is
completed. Write Enable Latch (WEL) bit is reset to 0 at the end of the Block Erase cycle. Block Erase (BE)
command applied to a block which is protected by the Block Protect (BP2, BP1, BP0) bits (see Table1.1 or 1.2)
is not executed.
Figure9. Block Erase Sequence Diagram
CS#
0 1 2 3 4 5 6 7 8 9 10 11
24 25 26 27 28 29 30 31
SCLK
Command
SI
D8H
24-bit address(A23:A0)
23 22 21 20 19
7 6 5 4 3 2 1 0
MSB
7.10. Chip Erase (CE) (60/C7H)
The Chip Erase (CE) command is for erasing the all data of the chip. A Write Enable (WREN) command
must previously have been executed to set the Write Enable Latch (WEL) bit .The Chip Erase (CE) command
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is entered by driving CS# Low, followed by the command code on Serial Data Input (SI). CS# must be driven
Low for the entire duration of the sequence.
The Chip Erase command sequence: CS# goes lowÆsend Chip Erase commandÆCS# goes high. The
command sequence is shown in Figure10. CS# must be driven high after the eighth bit of the command code
has been latched in, otherwise the Chip Erase command is not executed. As soon as CS# is driven high, the
self-timed Chip Erase cycle (whose duration is tCE) is initiated. While the Chip Erase cycle is in progress, the
Status Register may be read to check the value of the Write In Progress (WIP) bit. The Write In Progress
(WIP) bit is 1 during the self-timed Chip Erase cycle, and is 0 when it is completed. Write Enable Latch (WEL)
bit is reset to 0 at the end of the Chip Erase cycle. The Chip Erase (CE) command is ignored if one or more
sectors are protected by (BP2, BP1, BP0) bits.
Figure10. Chip Erase Sequence Diagram
CS#
0 1 2 3 4 5 6 7
SCLK
Command
SI
60H or C7H
7.11. Read Manufacture ID/ Device ID (REMS) (90H)
The Read Manufacturer/Device ID command is for reading both the JEDEC assigned Manufacturer ID
and the specific Device ID. The command is initiated by driving the CS# pin low and shifting the command
code “90H” followed by a 24-bit address (A23-A0) of 000000H. After which, the Manufacturer ID and the
Device ID are shifted out on the falling edge of SCLK with most significant bit (MSB) first as shown in
Figure11. If the 24-bit address is initially set to 000001H, the Device ID will be read first.
Figure11. Read Manufacture ID/ Device ID Sequence Diagram
CS#
0 1 2 3 4 5 6 7 8 9 10 11
24 25 26 27 28 29 30 31
SCLK
Command
SI
90H
24-bit address(A23:A0)
23 22 21 20 19
7 6 5 4 3 2 1 0
MSB
High-Z
SO
CS#
32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55
SCLK
SI
Manufacturer ID
SO
Device ID
Manufacturer ID
7 6 5 4 3 2 1 0 7 6 5 4 3 2 1 0 7 6 5 4 3 2 1 0
MSB
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7.12. Read Identification (RDID) (9FH)
The Read Identification (RDID) command allows the 8-bit manufacturer identification to be read, followed
by two bytes of device identification. The device identification indicates the memory type in the first byte, and
the memory capacity of the device in the second byte. Any Read Identification (RDID) command while an
Erase or Program cycle is in progress, is not decoded, and has no effect on the cycle that is in progress.
The device is first selected by driving CS# to low. Then, the 8-bit command code for the command is shifted in.
This is followed by the 24-bit device identification, stored in the memory, being shifted out on Serial Data
Output, each bit being shifted out during the falling edge of Serial Clock. The command sequence is shown in
Figure12. The Read Identification (RDID) command is terminated by driving CS# to high at any time during
data output. After CS# is driven high, the device returns to Standby Mode and awaits for new command.
Figure12. Read Identification ID Sequence Diagram
CS#
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 48 49 50 51 52 53 54 55
SCLK
Command
SI
9FH
Memory Type
JDID15-JDID8
7 6 5 4 3 2 1 0 7 6 5 4 3 2 1 0
Manufacturer ID
High-Z
SO
MSB
CS#
16 17 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55
SCLK
SI
SO
Memory Type
Capacity
Manufacturer ID
JDID15-JDID8
JDID7-JDID0
7 6 5 4 3 2 1 0 7 6 5 4 3 2 1 0 7 6 5 4 3 2 1 0
MSB
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8. ELECTRICAL CHARACTERISTICS
8.1. Power-on Timing
Vcc(max)
Program,Erase and Write command are ignored
Chip Selection is not allowed
Vcc(min)
Reset
State
tVSL
Read command
is allowed
Device is fully
accessible
VWI
tPUW
Time
Table3. Power-Up Timing and Write Inhibit Threshold
Symbol
Parameter
Min
Max
Unit
tVSL
VCC(min) To CS# Low
10
us
tPUW
Time Delay Before Write Instruction
1
10
ms
VWI
Write Inhibit Voltage
1
2.5
V
8.2. Initial Delivery State
The device is delivered with the memory array erased: all bits are set to 1(each byte contains FFH).The
Status Register contains 00H (all Status Register bits are 0).
8.3. Data Retention and Endurance
Parameter
Minimum Pattern Data Retention Time
Erase/Program Endurance
Test Condition
Min
Unit
150ć
10
Years
125ć
20
Years
-40 to 85ć
100K
Cycles
8.4. Latch up Characteristics
Parameter
Min
Max
Input Voltage Respect To VSS On I/O Pins
-1.0V
VCC+1.0V
VCC Current
-100mA
100mA
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8.5. Absolute Maximum Ratings
Parameter
Value
Unit
Ambient Operating Temperature
-40 to 85
ć
Storage Temperature
-65 to 150
ć
Output Short Circuit Current
200
mA
Applied Input/Output Voltage
-0.5 to 4.0
V
-0.5 to 4.0
V
VCC
Output timing reference level
Input timing reference level
0.8VCC
0.7VCC
AC Measurement level
0.5VCC
0.2VCC
0.1VCC
Note:Input pulse rise and fall time are