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S-8264AAI-I8T1U

S-8264AAI-I8T1U

  • 厂商:

    ABLIC(艾普凌科)

  • 封装:

    SMD8

  • 描述:

    IC BATT PROT LI-ION 2-4CL SNT-8A

  • 数据手册
  • 价格&库存
S-8264AAI-I8T1U 数据手册
S-8264A/B/C Series www.ablic.com BATTERY PROTECTION IC FOR 2-SERIAL TO 4-SERIAL-CELL PACK (SECONDARY PROTECTION) © ABLIC Inc., 2005-2021 Rev.4.6_00 The S-8264A/B/C Series is used for secondary protection of lithium-ion rechargeable batteries, and incorporates a high-accuracy voltage detection circuit and a delay circuit. Short-circuiting between cells makes it possible for serial connection of two cells to four cells.  Features (1) High-accuracy voltage detection circuit for each cell • Overcharge detection voltage n (n = 1 to 4) 4.200 V to 4.800 V (in 50 mV steps) Accuracy : ±25 mV (+25°C), Accuracy : ±30 mV (−5°C to +55°C) • Overcharge hysteresis voltage n (n = 1 to 4) −0.520 ±0.210 V, −0.390 ±0.160 V, −0.260 ±0.110 V, −0.130 ±0.06 V, None (2) Delay times for overcharge detection can be set by an internal circuit only (external capacitors are unnecessary) (3) Output control function via CTL pin (CTL pin is pulled down internally) (S-8264A Series) Output control function via CTL pin (CTL pin is pulled up internally) (S-8264C Series) (4) Output latch function after overcharge detection (S-8264B Series) (5) Output form and logic CMOS output active “H” (6) High withstand voltage Absolute maximum rating 26 V (7) Wide operation voltage range 3.6 V to 24 V (8) Wide operation temperature range −40°C to +85°C (9) Low current consumption • At 3.5 V for each cell 5.0 μA max. (+25°C) • At 2.3 V for each cell 4.0 μA max. (+25°C) (10) Lead-free, Sn 100%, halogen-free*1 *1. Refer to “ Product Name Structure” for details.  Application • Lithium-ion rechargeable battery packs (for secondary protection)  Packages • SNT-8A • 8-Pin TSSOP 1 BATTERY PROTECTION IC FOR 2-SERIAL TO 4-SERIAL-CELL PACK (SECONDARY PROTECTION) S-8264A/B/C Series Rev.4.6_00  Block Diagrams (1) S-8264A Series VDD Overcharge detection comparator 1 SENSE + − Reference voltage 1 VC1 Overcharge detection comparator 2 Oscillator + Overcharge detection/release delay circuit − Reference voltage 2 VC2 Overcharge detection comparator 3 Control logic + − CO Reference voltage 3 VC3 Overcharge detection comparator 4 + − Reference voltage 4 VSS CTL Remark The diodes in the figure are parasitic diodes. Figure 1 2 Rev.4.6_00 BATTERY PROTECTION IC FOR 2-SERIAL TO 4-SERIAL-CELL PACK (SECONDARY PROTECTION) S-8264A/B/C Series (2) S-8264B Series VDD Overcharge detection comparator 1 SENSE + − Reference voltage 1 Overcharge detection comparator 2 VC1 Oscillator + Overcharge detection/release delay circuit − Reference voltage 2 VC2 Overcharge detection comparator 3 Control logic + − SR latch Reference voltage 3 VC3 CO Overcharge detection comparator 4 + − Reference voltage 4 VSS CTL UVLO Remark The diodes in the figure are parasitic diodes. Figure 2 3 BATTERY PROTECTION IC FOR 2-SERIAL TO 4-SERIAL-CELL PACK (SECONDARY PROTECTION) S-8264A/B/C Series Rev.4.6_00 (3)S-8264C Series VDD Overcharge detection comparator 1 SENSE + - Reference voltage 1 VC1 Overcharge detection comparator 2 Oscillator + Overcharge detection/release delay circuit - Reference voltage 2 VC2 Control Overcharge detection comparator 3 logic + - CO Reference voltage 3 VC3 Overcharge detection comparator 4 + - Reference voltage 4 VSS CTL Remark The diodes in the figure are parasitic diodes. Figure 3 4 BATTERY PROTECTION IC FOR 2-SERIAL TO 4-SERIAL-CELL PACK (SECONDARY PROTECTION) S-8264A/B/C Series Rev.4.6_00  Product Name Structure 1. Product Name (1) SNT-8A S-8264 x xx - I8T1 U Environmental code U: Lead-free (Sn 100%), halogen-free *1 Package abbreviation and IC packing specification I8T1: SNT-8A, Tape *2 Serial code Sequentially set from AA to AZ Product type A: Without CO pin output latch function (CTL pin is pulled down internally) B: With CO pin output latch function C: Without CO pin output latch function (CTL pin is pulled up internally) *1. Refer to the tape drawing. *2. Refer to “3. Product Name List”. (2) 8-Pin TSSOP S-8264 x xx - T8T1 x Environmental code U: Lead-free (Sn 100%), halogen-free G: Lead-free (for details, please contact our sales representatives) Package abbreviation and IC packing specification*1 T8T1: 8-Pin TSSOP, Tape Serial code*2 Sequentially set from AA to AZ Product type A: Without CO pin output latch function (CTL pin is pulled down internally) B: With CO pin output latch function C: Without CO pin output latch function (CTL pin is pulled up internally) *1. Refer to the tape drawing. *2. Refer to “3. Product Name List”. 2. Packages Package Name SNT-8A 8-Pin TSSOP Environmental code = G Environmental code = U Package PH008-A-P-SD FT008-A-P-SD FT008-A-P-SD Drawing Code Tape Reel PH008-A-C-SD PH008-A-R-SD FT008-E-C-SD FT008-E-R-SD FT008-E-C-SD FT008-E-R-S1 Land PH008-A-L-SD ⎯ 5 BATTERY PROTECTION IC FOR 2-SERIAL TO 4-SERIAL-CELL PACK (SECONDARY PROTECTION) S-8264A/B/C Series Rev.4.6_00 3. Product Name List (1) S-8264A Series Table 1 SNT-8A Product Name S-8264AAA-I8T1U S-8264AAB-I8T1U S-8264AAC-I8T1U S-8264AAD-I8T1U S-8264AAE-I8T1U S-8264AAF-I8T1U S-8264AAG-I8T1U S-8264AAH-I8T1U S-8264AAI-I8T1U S-8264AAJ-I8T1U S-8264AAK-I8T1U S-8264AAO-I8T1U S-8264AAS-I8T1U S-8264AAT-I8T1U S-8264AAV-I8T1U S-8264AAW-I8T1U Overcharge Detection Voltage [VCU] 4.450 ±0.025 V 4.350 ±0.025 V 4.500 ±0.025 V 4.350 ±0.025 V 4.300 ±0.025 V 4.450 ±0.025 V 4.300 ±0.025 V 4.400 ±0.025 V 4.400 ±0.025 V 4.450 ±0.025 V 4.350 ±0.025 V 4.400 ±0.025 V 4.500 ±0.025 V 4.550 ±0.025 V 4.600 ±0.025 V 4.220 ±0.025 V Overcharge Hysteresis Voltage [VHC] −0.390 ±0.160 V −0.390 ±0.160 V −0.390 ±0.160 V −0.390 ±0.160 V −0.390 ±0.160 V −0.390 ±0.160 V −0.390 ±0.160 V −0.390 ±0.160 V −0.390 ±0.160 V −0.390 ±0.160 V −0.390 ±0.160 V −0.390 ±0.160 V −0.390 ±0.160 V −0.390 ±0.160 V −0.390 ±0.160 V −0.390 ±0.160 V Overcharge Detection Delay Time [tCU] 4.0 ±0.8 s 4.0 ±0.8 s 4.0 ±0.8 s 2.0 ±0.4 s 4.0 ±0.8 s 2.0 ±0.4 s 2.0 ±0.4 s 4.0 ±0.8 s 2.0 ±0.4 s 5.65 ±1.15 s 5.65 ±1.15 s 5.65 ±1.15 s 5.65 ±1.15 s 5.65 ±1.15 s 5.65 ±1.15 s 2.0 ±0.4 s Output Form CMOS output active “H” CMOS output active “H” CMOS output active “H” CMOS output active “H” CMOS output active “H” CMOS output active “H” CMOS output active “H” CMOS output active “H” CMOS output active “H” CMOS output active “H” CMOS output active “H” CMOS output active “H” CMOS output active “H” CMOS output active “H” CMOS output active “H” CMOS output active “H” Table 2 8-Pin TSSOP Product Name S-8264AAA-T8T1x S-8264AAB-T8T1x S-8264AAK-T8T1U Overcharge Detection Voltage [VCU] 4.450 ±0.025 V 4.350 ±0.025 V 4.350 ±0.025 V Overcharge Hysteresis Voltage [VHC] −0.390 ±0.160 V −0.390 ±0.160 V −0.390 ±0.160 V Overcharge Detection Delay Time [tCU] 4.0 ±0.8 s 4.0 ±0.8 s 5.65 ±1.15 s Output Form CMOS output active “H” CMOS output active “H” CMOS output active “H” (2) S-8264B Series Table 3 SNT-8A Product Name S-8264BAA-I8T1U S-8264BAB-I8T1U S-8264BAC-I8T1U Overcharge Detection Voltage [VCU] 4.450 ±0.025 V 4.350 ±0.025 V 4.550 ±0.025 V Overcharge Hysteresis Voltage [VHC] −0.390 ±0.160 V −0.390 ±0.160 V −0.390 ±0.160 V Overcharge Detection Delay Time [tCU] 4.0 ±0.8 s 4.0 ±0.8 s 4.0 ±0.8 s Output Form CMOS output active “H” CMOS output active “H” CMOS output active “H” Table 4 8-Pin TSSOP Product Name S-8264BAB-T8T1x 6 Overcharge Detection Voltage [VCU] 4.350 ±0.025 V Overcharge Hysteresis Voltage [VHC] −0.390 ±0.160 V Overcharge Detection Delay Time [tCU] 4.0 ±0.8 s Output Form CMOS output active “H” Rev.4.6_00 BATTERY PROTECTION IC FOR 2-SERIAL TO 4-SERIAL-CELL PACK (SECONDARY PROTECTION) S-8264A/B/C Series (3) S-8264C Series Table 5 SNT-8A Product Name S-8264CAA-I8T1U S-8264CAB-I8T1U Overcharge Detection Voltage [VCU] 4.450 ±0.025 V 4.220 ±0.025 V Overcharge Hysteresis Voltage [VHC] −0.390 ±0.160 V −0.260 ±0.110 V Overcharge Detection Delay Time [tCU] 2.0 ±0.4 s 2.0 ±0.4 s Output Form CMOS output active “H” CMOS output active “H” Remark 1. Please contact our sales representatives for products other than the above. 2. x: G or U 3. Please select products of environmental code = U for Sn 100%, halogen-free products. 7 BATTERY PROTECTION IC FOR 2-SERIAL TO 4-SERIAL-CELL PACK (SECONDARY PROTECTION) S-8264A/B/C Series Rev.4.6_00  Pin Configurations Table 6 SNT-8A Top view VDD 1 8 CO SENSE 2 7 CTL VC1 3 VC2 4 6 VSS 5 VC3 Pin No. Symbol 1 2 VDD SENSE 3 VC1 4 VC2 5 VC3 6 VSS 7 CTL 8 CO Pin No. 1 2 Symbol VDD SENSE 3 VC1 4 VC2 5 VC3 6 VSS 7 CTL 8 CO Description Positive power input pin Positive voltage connection pin of battery 1 Negative voltage connection pin of battery 1 Positive voltage connection pin of battery 2 Negative voltage connection pin of battery 2 Positive voltage connection pin of battery 3 Negative voltage connection pin of battery 3 Positive voltage connection pin of battery 4 Negative power input pin Negative voltage connection pin of battery 4 CO output control pin (S-8264A/C Series) Overcharge detection latch reset pin (S-8264B Series) FET gate connection pin for charge control Figure 4 Table 7 8-Pin TSSOP Top view VDD SENSE VC1 VC2 8 7 6 5 1 2 3 4 Figure 5 8 CO CTL VSS VC3 Description Positive power input pin Positive voltage connection pin of battery 1 Negative voltage connection pin of battery 1 Positive voltage connection pin of battery 2 Negative voltage connection pin of battery 2 Positive voltage connection pin of battery 3 Negative voltage connection pin of battery 3 Positive voltage connection pin of battery 4 Negative power input pin Negative voltage connection pin of battery 4 CO output control pin (S-8264A/C Series) Overcharge detection latch reset pin (S-8264B Series) FET gate connection pin for charge control BATTERY PROTECTION IC FOR 2-SERIAL TO 4-SERIAL-CELL PACK (SECONDARY PROTECTION) S-8264A/B/C Series Rev.4.6_00  Absolute Maximum Ratings Table 8 (Ta = 25°C unless otherwise specified) Item Symbol VDS VIN VCO Applied Pin VDD SENSE, VC1, VC2, VC3, CTL CO Unit ⎯ Rating VSS − 0.3 to VSS + 26 VSS − 0.3 to VDD + 0.3 VSS − 0.3 to VDD + 0.3 450*1 700*1 −40 to +85 ⎯ −40 to +125 °C Input voltage between VDD and VSS Input pin voltage CO output pin voltage SNT-8A Power dissipation 8-Pin TSSOP Operation ambient temperature PD ⎯ Topr Storage temperature Tstg V V V mW mW °C *1. When mounted on board [Mounted board] (1) Board size : 114.3 mm × 76.2 mm × t1.6 mm (2) Name : JEDEC STANDARD51-7 The absolute maximum ratings are rated values exceeding which the product could suffer physical damage. These values must therefore not be exceeded under any conditions. 800 Power Dissipation (PD) [mW] Caution 8-Pin TSSOP 600 SNT-8A 400 200 0 0 150 100 50 Ambient Temperature (Ta) [°C] Figure 6 Power Dissipation of Package (When Mounted on Board) 9 BATTERY PROTECTION IC FOR 2-SERIAL TO 4-SERIAL-CELL PACK (SECONDARY PROTECTION) S-8264A/B/C Series Rev.4.6_00  Electrical Characteristics 1. Except Detection Delay Time Table 9 Item Symbol Condition (Ta = 25°C unless otherwise specified) Test Test Max. Unit Condition Circuit Min. Typ. VCUn−0.025 VCUn VCUn+0.025 V 1 1 VCUn−0.030 VCUn VCUn+0.030 V 1 1 DETECTION VOLTAGE Overcharge detection voltage n (n = 1, 2, 3, 4) Overcharge hysteresis voltage n*2 (n = 1, 2, 3, 4) INPUT VOLTAGE Operation voltage between VDD and VSS CTL input “H” voltage CTL input “L” voltage INPUT CURRENT Current consumption during operation Current consumption during overdischarge SENSE pin current VC1 pin current VC2 pin current VC3 pin current CTL pin “H” current CTL pin “L” current OUTPUT CURRENT CO pin sink current CO pin source current VCUn 4.200 V to 4.800 V, adjustable, Ta = 25°C 4.200 V to 4.800 V, adjustable, Ta = −5°C to +55°C*1 VHCn ⎯ VHCn−0.210 −0.520 VHCn+0.210 V 1 1 VDSOP ⎯ 3.6 ⎯ 24 V ⎯ ⎯ VCTLH VCTLL ⎯ ⎯ VDD×0.95 ⎯ ⎯ ⎯ ⎯ VDD×0.4 V V 6 6 2 2 IOPE V1 = V2 = V3 = V4 = 3.5 V ⎯ 2.5 5.0 μA 7 4 IOPED V1 = V2 = V3 = V4 = 2.3 V ⎯ 2.0 4.0 μA 7 4 V1 = V2 = V3 = V4 = 3.5 V V1 = V2 = V3 = V4 = 3.5 V V1 = V2 = V3 = V4 = 3.5 V V1 = V2 = V3 = V4 = 3.5 V A/B Series V1 = V2 = V3 = V4 = 3.5 V, VCTL = VDD C Series V1 = V2 = V3 = V4 = 3.5 V VCTL = VDD A/B Series V1 = V2 = V3 = V4 = 3.5 V, VCTL = 0 V C Series V1 = V2 = V3 = V4 = 3.5 V VCTL = 0 V ⎯ −0.3 −0.3 −0.3 1.5 0 0 0 3.2 0.3 0.3 0.3 μA μA μA μA 8 8 8 8 5 5 5 5 1.1 1.5 1.8 μA 8 5 ⎯ ⎯ 0.15 μA 8 5 −0.15 ⎯ ⎯ μA 8 5 −150 −50 −10 μA 8 5 0.4 20 ⎯ ⎯ ⎯ ⎯ mA μA 9 9 6 6 ISENSE IVC1 IVC2 IVC3 ICTLH ICTLL ICOL ICOH VCOP = VSS+0.5 V VCOP = VDD−0.5 V *1. Since products are not screened at high and low temperature, the specification for this temperature range is guaranteed by design, not tested in production. *2. −0.390 ±0.160 V, −0.260 ±0.110 V, −0.130 ±0.060 V, or none, except for −0.520 V hysteresis product circuits. The overcharge release voltage is the total of the overcharge detection voltage (VCUn) and the overcharge hysteresis voltage (VHCn). 10 BATTERY PROTECTION IC FOR 2-SERIAL TO 4-SERIAL-CELL PACK (SECONDARY PROTECTION) S-8264A/B/C Series Rev.4.6_00 2. Detection Delay Time (1) S-8264AAA, S-8264AAB, S-8264AAC, S-8264AAE, S-8264AAH, S-8264BAA, S-8264BAB, S-8264BAC Table 10 (Ta = 25°C unless otherwise specified) Test Test Typ. Max. Unit Condition Circuit Symbol Condition Min. DELAY TIME Overcharge detection delay time Overcharge timer reset delay time Overcharge release delay time CTL pin response time tCU tTR tCL tCTL 3.2 6 51 ⎯ 4.0 12 64 ⎯ 4.8 20 77 2.5 s ms ms ms 2 3 2 4 1 1 1 2 Transition time to Test mode tTST ⎯ ⎯ ⎯ ⎯ V1 = V2 = V3 = V4 = 3.5 V, VDD ≥ VSENSE + 8.5 V ⎯ ⎯ 80 ms 5 3 Item (2) S-8264AAD, S-8264AAF, S-8264AAG, S-8264AAI, S-8264CAA, S-8264CAB Table 11 Item (Ta = 25°C unless otherwise specified) Test Test Typ. Max. Unit Condition Circuit Symbol Condition Min. DELAY TIME Overcharge detection delay time Overcharge timer reset delay time Overcharge release delay time CTL pin response time tCU tTR tCL tCTL 1.6 6 1.6 ⎯ 2.0 12 2.0 ⎯ 2.4 20 3.0 2.5 s ms ms ms 2 3 2 4 1 1 1 2 Transition time to Test mode tTST ⎯ ⎯ ⎯ ⎯ V1 = V2 = V3 = V4 = 3.5 V, VDD ≥ VSENSE + 8.5 V ⎯ ⎯ 80 ms 5 3 (3) S-8264AAJ, S-8264AAK, S-8264AAO, S-8264AAS, S-8264AAT, S-8264AAV Table 12 (Ta = 25°C unless otherwise specified) Test Test Typ. Max. Unit Condition Circuit Symbol Condition Min. DELAY TIME Overcharge detection delay time Overcharge timer reset delay time Overcharge release delay time CTL pin response time tCU tTR tCL tCTL 4.5 8 70 ⎯ 5.65 17 88 ⎯ 6.8 28 110 2.5 s ms ms ms 2 3 2 4 1 1 1 2 Transition time to Test mode tTST ⎯ ⎯ ⎯ ⎯ V1 = V2 = V3 = V4 = 3.5 V, VDD ≥ VSENSE + 8.5 V ⎯ ⎯ 80 ms 5 3 Item (4) S-8264AAW Table 13 Item (Ta = 25°C unless otherwise specified) Test Test Typ. Max. Unit Condition Circuit Symbol Condition Min. DELAY TIME Overcharge detection delay time Overcharge timer reset delay time Overcharge release delay time CTL pin response time tCU tTR tCL tCTL 1.6 6 51 ⎯ 2.0 12 64 ⎯ 2.4 20 77 2.5 s ms ms ms 2 3 2 4 1 1 1 2 Transition time to Test mode tTST ⎯ ⎯ ⎯ ⎯ V1 = V2 = V3 = V4 = 3.5 V, VDD ≥ VSENSE + 8.5 V ⎯ ⎯ 80 ms 5 3 11 BATTERY PROTECTION IC FOR 2-SERIAL TO 4-SERIAL-CELL PACK (SECONDARY PROTECTION) S-8264A/B/C Series Rev.4.6_00  Test Circuits (1) Test Condition 1, Test Circuit 1 Set V1, V2, V3, and V4 to 3.5 V. Overcharge detection voltage 1 (VCU1) is the V1 voltage when CO is “H” after the voltage of V1 has been gradually increased. The overcharge hysteresis voltage (VHC1) is the difference between V1 and VCU1 when CO is “L” after the voltage of V1 has been gradually decreased. Overcharge detection voltage VCUn (n = 2 to 4) and overcharge hysteresis VHCn (n = 2 to 4) can be determined in the same way as when n = 1. (2) Test Condition 2, Test Circuit 1 Set V1, V2, V3, and V4 to 3.5 V and in a moment of time (within 10 μs) increase V1 up to 5.0 V. The overcharge detection delay time (tCU) is the period from when V1 reached 5.0 V to when CO becomes “H”. After that, in a moment of time (within 10 μs) decrease V1 down to 3.5 V. The overcharge release delay time (tCL) is the period from when V1 has reached 3.5 V to when CO becomes “L”. (3) Test Condition 3, Test Circuit 1 Set V1, V2, V3, and V4 to 3.5 V and in a moment of time (within 10 μs) increase V1 up to 5.0 V. This is defined as the first rise. Within tCU − 20 ms after the first rise, in a moment of time (within 10 μs) decrease V1 down to 3.5 V and then in a moment of time (within 10 μs) restore up to 5.0 V. This is defined as the second rise. When the period from when V1 was fallen to the second rise is short, CO becomes “H” after tCU has elapsed since the first rise. If the period from when V1 falls to the second rise is gradually made longer, CO becomes “H” when tCU has elapsed since the second rise. The overcharge timer reset delay time (tTR) is the period from V1 fall till the second rise at that time. (4) Test Condition 4, Test Circuit 2 In the S-8264A/C Series, set V1, V2, V3, and V4 to 3.5 V and V5 to 14 V. The CTL pin response time (tCTL) is the period from when V5 reaches 0 V after V5 is in a moment of time (within 10 μs) decreased down to 0 V to when CO becomes “H”. In the S-8264B Series, set V1, V2, V3, and V4 to 3.5 V and V5 to 14 V after an overvoltage is detected and CO becomes “H”. In a moment of time (within 10 μs) raise V5 from 0 V to 14 V. The CTL pin response time (tCTL) is the period from when V5 becomes 14 V to when CO becomes “L”. (5) Test Condition 5, Test Circuit 3 After setting V1, V2, V3, and V4 to 3.5 V and V5 to 0 V, in a moment of time (within 10 μs) increase V5 up to 8.5 V and decrease V5 again down to 0 V. When the period from when V5 was raised to when it has fallen is short, if an overcharge detection operation is performed subsequently, the overcharge detection time is tCU. However, when the period from when V5 is raised to when it is fallen is gradually made longer, the overcharge detection time during the subsequent overcharge detection operation is shorter than tCU. The transition time to test mode (tTST) is the period from when V5 was raised to when it has fallen at that time. 12 Rev.4.6_00 BATTERY PROTECTION IC FOR 2-SERIAL TO 4-SERIAL-CELL PACK (SECONDARY PROTECTION) S-8264A/B/C Series (6) Test Condition 6, Test Circuit 2 Set V1, V2, V3, and V4 to 3.5 V and V5 to 0 V. The CTL input “H” voltage (VCTLH) is the maximum voltage of V5 when CO is “L” after V5 has been gradually increased. Next, set V5 to 14 V. The CTL input “L” voltage (VCTLL) is the minimum voltage of V5 when CO is “H” after V5 has been gradually decreased. (7) Test Condition 7, Test Circuit 4 The current consumption during operation (IOPE) is the total of the currents that flow in the VDD pin and SENSE pin when V1, V2, V3, and V4 are set to 3.5 V. The current consumption during overdischarge (IOPED) is the total of the currents that flow in the VDD pin and SENSE pin when V1, V2, V3, and V4 are set to 2.3 V. (8) Test Condition 8, Test Circuit 5 The SENSE pin current (ISENSE) is I1, the VC1 pin current (IVC1) is I2, the VC2 pin current (IVC2) is I3, the VC3 pin current (IVC3) is I4, and the CTL pin “H” current (ICTLH) is I5 when V1, V2, V3, and V4 are set to 3.5 V, and V5 to 14 V. The CTL pin “L” current (ICTLL) is I5 when V1, V2, V3, and V4 are set to 3.5 V and V5 to 0 V. (9) Test Condition 9, Test Circuit 6 Set SW1 to OFF and SW2 to ON. The CO pin sink current (ICOL) is I2 when V1, V2, V3, and V4 are set to 3.5 V and V6 to 0.5 V. Set SW1 and SW2 to OFF. Set V1 to V5, set V2, V3, and V4 to 3.0 V, and set V5 to 0.5 V. After tCU has elapsed, set SW1 to ON and SW2 to OFF. I1 is the CO pin source current (ICOH). 13 BATTERY PROTECTION IC FOR 2-SERIAL TO 4-SERIAL-CELL PACK (SECONDARY PROTECTION) S-8264A/B/C Series S-8264A/B/C Series S-8264A/B/C Series VDD CO VDD SENSE CTL V V1 VSS VC1 V4 V2 CO SENSE CTL V1 VC1 VSS VC2 VC3 V5 V V4 V2 VC3 VC2 Rev.4.6_00 V3 V3 Test Circuit 1 Test Circuit 2 S-8264A/B/C Series S-8264A/B/C Series VDD VDD CO CO A V5 SENSE CTL V V1 VC1 VSS V4 V2 VC2 SENSE CTL VC1 VSS VC2 VC3 V1 V4 V2 VC3 V3 V3 Test Circuit 3 Test Circuit 4 V5 A I1 S-8264A/B/C Series I1 A V1 V2 VDD CO SENSE CTL VC1 VSS A A V5 I4 I3 VC2 VC3 V3 VDD I5 I2 A V4 CO SENSE CTL VC1 VSS VC2 VC3 SW2 V1 V2 A V3 Test Circuit 5 Test Circuit 6 Figure 7 14 SW1 S-8264A/B/C Series V4 A I2 V6 V Rev.4.6_00 BATTERY PROTECTION IC FOR 2-SERIAL TO 4-SERIAL-CELL PACK (SECONDARY PROTECTION) S-8264A/B/C Series  Operation Remark Refer to “ Battery Protection IC Connection Example”. 1. Overcharge Detection When the voltage of one of the batteries exceeds the overcharge detection voltage (VCU) during charging under normal conditions and the state is retained for the overcharge detection delay time (tCU) or longer, CO becomes “H”. This state is called overcharge. Connecting FET to the CO pin provides charge control and a second protection. In the S-8264A/C Series, if the voltage of each of the batteries is lower than VCU + the overcharge hysteresis voltage (VHC) and the state is retained for the overcharge release delay time (tCL) or longer, CO becomes “L”. In the S-8264B Series, if the voltage of each of the batteries is lower than VCU + VHC and the state is retained for tCL or longer, the overcharge state is released; however, CO stays at “H”. When the CTL pin is switched from “L” to “H”, CO becomes “L”. 2. Overcharge Timer Reset Operation When an overcharge release noise that forces the voltage of one of the batteries temporarily below VCU is input during tCU from when VCU is exceeded to when charging is stopped, tCU is continuously counted if the time the overcharge release noise persists is shorter than the overcharge timer reset delay time (tTR). Under the same conditions, if the time the overcharge release noise persists is tTR or longer, counting of tCU is reset once. After that, when VCU has been exceeded, counting tCU resumes. 15 BATTERY PROTECTION IC FOR 2-SERIAL TO 4-SERIAL-CELL PACK (SECONDARY PROTECTION) S-8264A/B/C Series Rev.4.6_00 3. CTL Pin The S-8264A/B/C Series has a control pin. The CTL pin is used to control the output voltage of the CO pin. In the S-8264A/C Series, the CTL pin takes precedence over the overcharge detection circuit. In the S-8264B Series, when the CTL pin is switched from “L” to “H”, a reset signal is output to the overcharge detection latch and CO becomes “L”. Table 14 Control via CTL Pin CTL Pin “H” Open “L” “L”→“H” “H”→“L” S-8264A Series Normal state*1 “H” “H” − − CO Pin S-8264B Series Without latch Normal state*1 Normal state*1 Latch reset*2 − S-8264C Series Normal state*1 Normal state*1 “H” − − *1. The state is controlled by the overcharge detection circuit. *2. Latch reset becomes effective when the voltage of each of the batteries is lower than the overcharge detection voltage (VCU) + the overcharge hysteresis voltage (VHC) and the overcharge release delay time (tCL) has elapsed. – CTL *1 + – CTL *1 + Pull-up resistor Pull-down resistor S-8264A/B Series S-8264C Series *1. The reverse voltage “H” to “L” or “L” to “H” of CTL pin is VDD pin voltage − 2.8 V (Typ.), does not have the hysteresis. Figure 8 Internal Equivalent Circuit of CTL Pin Caution 1. In the S-8264A/B Series, since the CTL pin implements high resistance of 8 MΩ to 12 MΩ for pull down, be careful of external noise application. If an external noise is applied, CO may become “H”. Perform thorough evaluation using the actual application. 2. In the S-8264B Series, when the CTL pin is open or “L”, CO latches “H”. When the VDD pin voltage is decreased to the UVLO voltage of 2 V (Typ.) or lower, the latch is reset. 16 BATTERY PROTECTION IC FOR 2-SERIAL TO 4-SERIAL-CELL PACK (SECONDARY PROTECTION) S-8264A/B/C Series Rev.4.6_00 4. Test Mode In the S-8264A/B/C Series, the overcharge detection delay time (tCU) can be shortened by entering the test mode. The test mode can be set by retaining the VDD pin voltage 8.5 V or more higher than the SENSE pin voltage for at least 80 ms (V1 = V2 = V3 = V4 = 3.5 V, Ta = 25°C). The status is retained by the internal latch and the test mode is retained even if the VDD pin voltage is decreased to the same voltage as that of the SENSE pin. When CO becomes “H” when the delay time has elapsed after overcharge detection, the latch for retaining the test mode is reset and the S-8264A/B Series exits from the test mode. VDD pin voltage SENSE pin voltage 8.5 V or more Pin voltage VCUn VHCn Battery voltage (n = 1 to 4) Test mode tTST = 80 ms max. CO pin *1 tCL *1. In the product tCU = 4 s Typ. during normal mode, tCU = 64 ms Typ. In the product tCU = 2 s Typ. during normal mode, tCU = 32 ms Typ. In the product tCU = 5.65 s Typ. during normal mode, tCU = 88 ms Typ. Figure 9 Caution 1. When the VDD pin voltage is decreased to lower than the UVLO voltage of 2 V (Typ.), the S-8264A/B/C Series returns to the normal mode. 2. Set the test mode when no batteries are overcharged. 3. The overcharge release delay time (tCL) is not shortened in the test mode. 4. The overcharge timer reset delay time (tTR) is not shortened in the test mode. 17 BATTERY PROTECTION IC FOR 2-SERIAL TO 4-SERIAL-CELL PACK (SECONDARY PROTECTION) S-8264A/B/C Series Rev.4.6_00  Timing Charts 1. Overcharge Detection Operation (1) S-8264A/C Series VHCn VCUn Battery voltage (n = 1 to 4) CTL pin tTR or longer CO pin tCU or shorter tTR or shorter tCU tCL Figure 10 (2) S-8264B Series VHCn VCUn Battery voltage (n = 1 to 4) Reset operation disabled Reset operation enabled CTL pin CO pin tTR or longer tCU or shorter tTR or shorter tCU Figure 11 18 tCL BATTERY PROTECTION IC FOR 2-SERIAL TO 4-SERIAL-CELL PACK (SECONDARY PROTECTION) S-8264A/B/C Series Rev.4.6_00 2. Overcharge Timer Reset Operation VHCn tTR or shorter tTR or longer tTR or shorter VCUn Battery voltage (n = 1 to 4) tTR CO pin tCU or shorter tCU Timer reset Figure 12 19 BATTERY PROTECTION IC FOR 2-SERIAL TO 4-SERIAL-CELL PACK (SECONDARY PROTECTION) S-8264A/B/C Series Rev.4.6_00  Battery Protection IC Connection Example (1) 4-serial cell SCP EB+ VDD RVDD CVDD SENSE BAT1 BAT2 R1 R2 C1 C2 VC1 S-8264A/B/C VC2 BAT3 R3 Series C3 VC3 BAT4 R4 FET CO DP C4 VSS CTL External input*1 RCTL EB− Figure 13 *1. Refer to Table 14 for setting on external input. Table 15 Constants for External Components No. 1 2 3 4 Caution 20 Part R1 to R4 C1 to C4, CVDD RVDD RCTL Min. 0.1 0.01 50 0 Typ. 1 0.1 100 100 Max. 10 1 500 500 Unit kΩ μF Ω Ω 1. The constants may be changed without notice. 2. It has not been confirmed whether the operation is normal or not in circuits other than the connection example. In addition, the connection example and the constants do not guarantee proper operation. Perform thorough evaluation using the actual application to set the constants. 3. Set the same constants to R1 to R4 and to C1 to C4 and CVDD. 4. Set RVDD, C1 to C4, and CVDD so that the condition (RVDD) × (C1 to C4, CVDD) ≥ 5 × 10−6 is satisfied. 5. Set R1 to R4, C1 to C4, and CVDD so that the condition (R1 to R4) × (C1 to C4, CVDD) ≥ 1 × 10−4 is satisfied. 6. Since “H” may be output at CO transiently when the battery is being connected, connect the positive terminal of BAT1 last in order to prevent the three terminal protection fuse from cutoff. BATTERY PROTECTION IC FOR 2-SERIAL TO 4-SERIAL-CELL PACK (SECONDARY PROTECTION) S-8264A/B/C Series Rev.4.6_00 (2) 3-serial cell SCP EB+ VDD RVDD CVDD SENSE BAT1 BAT2 R1 R2 C1 C2 VC1 S-8264A/B/C VC2 BAT3 R3 Series FET C3 VC3 CO DP VSS CTL External R CTL input*1 EB− Figure 14 *1. Refer to Table 14 for setting on external input. Table 16 Constants for External Components No. 1 2 3 4 Caution Part R1 to R3 C1 to C3, CVDD RVDD RCTL Min. 0.1 0.01 50 0 Typ. 1 0.1 100 100 Max. 10 1 500 500 Unit kΩ μF Ω Ω 1. The constants may be changed without notice. 2. It has not been confirmed whether the operation is normal or not in circuits other than the connection example. In addition, the connection example and the constants do not guarantee proper operation. Perform thorough evaluation using the actual application to set the constants. 3. Set the same constants to R1 to R3 and to C1 to C3 and CVDD. 4. Set RVDD, C1 to C3, and CVDD so that the condition (RVDD) × (C1 to C3, CVDD) ≥ 5 × 10−6 is satisfied. 5. Set R1 to R3, C1 to C3, and CVDD so that the condition (R1 to R3) × (C1 to C3, CVDD) ≥ 1 × 10−4 is satisfied. 6. Since “H” may be output at CO transiently when the battery is being connected, connect the positive terminal of BAT1 last in order to prevent the three terminal protection fuses from cutoff. 21 BATTERY PROTECTION IC FOR 2-SERIAL TO 4-SERIAL-CELL PACK (SECONDARY PROTECTION) S-8264A/B/C Series Rev.4.6_00 (3) 2-serial cell SCP EB+ VDD RVDD CVDD SENSE BAT1 BAT2 R1 R2 C1 C2 VC1 S-8264A/B/C VC2 Series VC3 FET CO DP VSS CTL External input*1 RCTL EB− Figure 15 *1. Refer to Table 14 for setting on external input. Table 17 Constants for External Components No. 1 2 3 4 Caution 22 Part R1 and R2 C1 and C2, CVDD RVDD RCTL Min. 0.1 0.01 50 0 Typ. 1 0.1 100 100 Max. 10 1 500 500 Unit kΩ μF Ω Ω 1. The constants may be changed without notice. 2. It has not been confirmed whether the operation is normal or not in circuits other than the connection example. In addition, the connection example and the constants do not guarantee proper operation. Perform thorough evaluation using the actual application to set the constants. 3. Set the same constants to R1 and R2 and to C1 and C2 and CVDD. 4. Set RVDD, C1 and C2, and CVDD so that the condition (RVDD) × (C1 and C2, CVDD) ≥ 5 × 10−6 is satisfied. 5. Set R1 and R2, C1 and C2, and CVDD so that the condition (R1 and R2) × (C1 and C2, CVDD) ≥ 1 × 10−4 is satisfied. 6. Since “H” may be output at CO transiently when the battery is being connected, connect the positive terminal of BAT1 last in order to prevent the three terminal protection fuse from cutoff. Rev.4.6_00 BATTERY PROTECTION IC FOR 2-SERIAL TO 4-SERIAL-CELL PACK (SECONDARY PROTECTION) S-8264A/B/C Series  Precautions • Do not connect batteries charged with VCU + VHC or higher. If the connected batteries include a battery charged with VCU + VHC or higher, “H” may be output at CO after all pins are connected. • In some application circuits, even if an overcharged battery is not included, the order of connecting batteries may be restricted to prevent transient output of CO detection pulses when the batteries are connected. Perform thorough evaluation with the actual application circuit. • In the S-8264B Series, “H” may be output at CO after all the pins are connected. In this case, set the CTL pin from “L” to “H”. • Before the battery connection, short-circuit the battery side pins RVDD and R1, shown in the figure in “ Battery Protection IC Connection Example”. • The application conditions for the input voltage, output voltage, and load current should not exceed the package power dissipation. • Do not apply to this IC an electrostatic discharge that exceeds the performance ratings of the built-in electrostatic protection circuit. • ABLIC Inc. claims no responsibility for any disputes arising out of or in connection with any infringement of patents owned by a third party by products including this IC. 23 BATTERY PROTECTION IC FOR 2-SERIAL TO 4-SERIAL-CELL PACK (SECONDARY PROTECTION) S-8264A/B/C Series Rev.4.6_00  Example of Application Circuit 1. Overheat Protection via PTC (S-8264A Series) SCP EB+ VDD RVDD CVDD SENSE BAT1 R1 C1 VC1 BAT2 R2 S-8264A C2 VC2 BAT3 R3 Series FET C3 VC3 BAT4 R4 CO DP C4 CCTL VSS CTL PTC EB− Figure 16 Cautions 1. The above connection example will not guarantee successful operation. Perform thorough evaluation using the actual application. 2. A pull-down resistor is included in the CTL pin. To perform overheat protection via the PTC in the S-8264A Series, connect the PTC before connecting batteries. 3. When the power fluctuation is large, connect the power supply of the PTC to the VDD pin of the S-8264A Series. 4. Since “H” may be output at CO transiently when the battery is being connected, connect the positive terminal of BAT1 last in order to prevent the three terminal protection fuse from cutoff. [For SCP, contact] Global Sales & Marketing Division, Dexerials Corporation Gate City Osaki East Tower 8F, 1-11-2 Osaki, Shinagawa-ku, Tokyo, 141-0032, Japan TEL +81-3-5435-3946 Contact Us: http://www.dexerials.jp/en/ [For PTC, contact] Murata Manufacturing Co., Ltd. Thermistor Products Department Nagaokakyo-shi, Kyoto, 617-8555, Japan TEL +81-75-955-6863 Contact Us: http://www.murata.com/contact/index.html 24 Rev.4.6_00 BATTERY PROTECTION IC FOR 2-SERIAL TO 4-SERIAL-CELL PACK (SECONDARY PROTECTION) S-8264A/B/C Series  Characteristics (Typical Data) 1. Detection Voltage vs. Temperature (1) Overcharge Detection Voltage vs. Temperature VCU = 4.3 V 4.40 VCU − VHC [V] VCU [V] 4.35 4.30 4.25 4.20 40 25 0 25 Ta [C] 50 2.0 1.0 40 25 25 Ta [C] 50 40 25 0 25 Ta [C] 50 75 85 3.0 2.0 1.0 75 85 40 25 0 25 Ta [C] 50 75 85 (2) Overcharge Release Delay Time vs. Temperature VDD = 14 V 90 80 tCL [ms] 5.0 tCU [s] 3.75 0.0 0 3. Delay Time vs. Temperature (1) Overcharge Detection Delay Time vs. Temperature VDD = 20 V 6.0 4.0 3.0 2.0 3.80 (2) Current Consumption during Overdischarge vs. Temperature VDD = 9.2 V 4.0 IOPED [μA] IOPE [μA] 3.0 3.85 3.70 75 85 2. Current Consumption vs. Temperature (1) Current Consumption during Normal Operation vs. Temperature VDD = 14 V 4.0 0.0 (2) Overcharge Release Voltage vs. Temperature VHC = 0.52 V 3.90 70 60 50 40 40 25 30 0 25 Ta [C] 50 75 85 40 25 0 25 Ta [C] 50 75 85 25 BATTERY PROTECTION IC FOR 2-SERIAL TO 4-SERIAL-CELL PACK (SECONDARY PROTECTION) S-8264A/B/C Series 4. Output Current vs. Temperature (1) CO Pin Sink Current vs. VDD (2) CO Pin Source Current vs. VDD Ta = 25 °C 10.0 5.0 2.5 0.0 10 15 VDD [V] 5 20 500 250 25 5. CTL Pin vs. Temperature (1) CTL Pin Threshold Voltage vs. Temperature VDD = 14 V 12.0 11.5 0 11.0 10.5 40 25 25 Ta [C] 50 75 85 20 25 12.0 10.0 8.0 6.0 0 10 15 VDD [V] 5 (2) CTL Pin Input Resistance vs. Temperature VDD = 14 V 14.0 RCTL [M] VTH.CTL [V] 700 0 0 26 Ta = 25 °C 1000 ICOH [μA] ICOL [mA] 7.5 10.0 Rev.4.6_00 40 25 0 25 Ta [C] 50 75 85 BATTERY PROTECTION IC FOR 2-SERIAL TO 4-SERIAL-CELL PACK (SECONDARY PROTECTION) S-8264A/B/C Series Rev.4.6_00  Marking Specifications (1) SNT-8A Top view 8 7 6 5 (1) (2) to (4) (1) (2) (3) (4) (5) (6) (7) (8) (5), (6) (7) to (11) Blank Product code (Refer to Product name vs. Product code) Blank Lot number (9) (10) (11) 1 2 3 4 Product name vs. Product code (b) S-8264B Series (a) S-8264A Series Product Name S-8264AAA-I8T1U S-8264AAB-I8T1U S-8264AAC-I8T1U S-8264AAD-I8T1U S-8264AAE-I8T1U S-8264AAF-I8T1U S-8264AAG-I8T1U S-8264AAH-I8T1U S-8264AAI-I8T1U S-8264AAJ-I8T1U S-8264AAK-I8T1U S-8264AAO-I8T1U S-8264AAS-I8T1U S-8264AAT-I8T1U S-8264AAV-I8T1U S-8264AAW-I8T1U (2) Q Q Q Q Q Q Q Q Q Q Q Q Q Q Q Q Product Code (3) (4) 5 A 5 B 5 C 5 D 5 E 5 F 5 G 5 H 5 I 5 J 5 K 5 O 5 S 5 T 5 V 5 W Product Name S-8264BAA-I8T1U S-8264BAB-I8T1U S-8264BAC-I8T1U (2) Q Q Q Product Code (3) (4) 6 A 6 B 6 C (c) S-8264C Series Product Name S-8264CAA-I8T1U S-8264CAB-I8T1U Product Code (2) Q Q (3) 7 7 (4) A B 27 BATTERY PROTECTION IC FOR 2-SERIAL TO 4-SERIAL-CELL PACK (SECONDARY PROTECTION) S-8264A/B/C Series Rev.4.6_00 (2) 8-Pin TSSOP Top view 1 (1) (2) (3) (4) 2 (5) (6) (7) (8) 3 (9) (10) (11) (12) (13) (14) 4 8 7 (1) to (5) (6) to (8) (9) to (14) Product name: S8264 (Fixed) Function code Lot number 6 5 Product name vs. Product code (b) S-8264B Series (a) S-8264A Series Product Name S-8264AAA-T8T1x S-8264AAB-T8T1x S-8264AAK-T8T1U Remark 28 (6) A A A Product Code (7) (8) A A A B A K Product Name S-8264BAB-T8T1x (6) B Product Code (7) (8) A B 1. x: G or U 2. Please select products of environmental code = U for Sn 100%, halogen-free products. 1.97±0.03 8 7 6 5 3 4 +0.05 1 0.5 2 0.08 -0.02 0.48±0.02 0.2±0.05 No. PH008-A-P-SD-2.1 TITLE SNT-8A-A-PKG Dimensions No. PH008-A-P-SD-2.1 ANGLE UNIT mm ABLIC Inc. +0.1 ø1.5 -0 2.25±0.05 4.0±0.1 2.0±0.05 ø0.5±0.1 0.25±0.05 0.65±0.05 4.0±0.1 4 321 5 6 78 Feed direction No. PH008-A-C-SD-2.0 TITLE SNT-8A-A-Carrier Tape No. PH008-A-C-SD-2.0 ANGLE UNIT mm ABLIC Inc. 12.5max. 9.0±0.3 Enlarged drawing in the central part ø13±0.2 (60°) (60°) No. PH008-A-R-SD-1.0 TITLE SNT-8A-A-Reel No. PH008-A-R-SD-1.0 QTY. ANGLE UNIT mm ABLIC Inc. 5,000 0.52 2.01 2 0.52 0.2 0.3 1. 2. 1 (0.25 mm min. / 0.30 mm typ.) (1.96 mm ~ 2.06 mm) 1. 2. 3. 4. 0.03 mm SNT 1. Pay attention to the land pattern width (0.25 mm min. / 0.30 mm typ.). 2. Do not widen the land pattern to the center of the package (1.96 mm to 2.06mm). Caution 1. Do not do silkscreen printing and solder printing under the mold resin of the package. 2. The thickness of the solder resist on the wire pattern under the package should be 0.03 mm or less from the land pattern surface. 3. Match the mask aperture size and aperture position with the land pattern. 4. Refer to "SNT Package User's Guide" for details. 1. 2. (0.25 mm min. / 0.30 mm typ.) (1.96 mm ~ 2.06 mm) TITLE No. PH008-A-L-SD-4.1 SNT-8A-A -Land Recommendation PH008-A-L-SD-4.1 No. ANGLE UNIT mm ABLIC Inc. +0.3 3.00 -0.2 8 5 1 4 0.17±0.05 0.2±0.1 0.65 No. FT008-A-P-SD-1.2 TITLE TSSOP8-E-PKG Dimensions No. FT008-A-P-SD-1.2 ANGLE UNIT mm ABLIC Inc. 4.0±0.1 2.0±0.05 ø1.55±0.05 0.3±0.05 +0.1 8.0±0.1 ø1.55 -0.05 (4.4) +0.4 6.6 -0.2 1 8 4 5 Feed direction No. FT008-E-C-SD-1.0 TITLE TSSOP8-E-Carrier Tape FT008-E-C-SD-1.0 No. ANGLE UNIT mm ABLIC Inc. 13.4±1.0 17.5±1.0 Enlarged drawing in the central part ø21±0.8 2±0.5 ø13±0.5 No. FT008-E-R-SD-1.0 TITLE TSSOP8-E-Reel No. FT008-E-R-SD-1.0 QTY. ANGLE UNIT mm ABLIC Inc. 3,000 13.4±1.0 17.5±1.0 Enlarged drawing in the central part ø21±0.8 2±0.5 ø13±0.5 No. FT008-E-R-S1-1.0 TITLE TSSOP8-E-Reel No. FT008-E-R-S1-1.0 QTY. ANGLE UNIT mm ABLIC Inc. 4,000 Disclaimers (Handling Precautions) 1. All the information described herein (product data, specifications, figures, tables, programs, algorithms and application circuit examples, etc.) is current as of publishing date of this document and is subject to change without notice. 2. The circuit examples and the usages described herein are for reference only, and do not guarantee the success of any specific mass-production design. ABLIC Inc. is not liable for any losses, damages, claims or demands caused by the reasons other than the products described herein (hereinafter "the products") or infringement of third-party intellectual property right and any other right due to the use of the information described herein. 3. ABLIC Inc. is not liable for any losses, damages, claims or demands caused by the incorrect information described herein. 4. Be careful to use the products within their ranges described herein. Pay special attention for use to the absolute maximum ratings, operation voltage range and electrical characteristics, etc. ABLIC Inc. is not liable for any losses, damages, claims or demands caused by failures and / or accidents, etc. due to the use of the products outside their specified ranges. 5. Before using the products, confirm their applications, and the laws and regulations of the region or country where they are used and verify suitability, safety and other factors for the intended use. 6. When exporting the products, comply with the Foreign Exchange and Foreign Trade Act and all other export-related laws, and follow the required procedures. 7. The products are strictly prohibited from using, providing or exporting for the purposes of the development of weapons of mass destruction or military use. ABLIC Inc. is not liable for any losses, damages, claims or demands caused by any provision or export to the person or entity who intends to develop, manufacture, use or store nuclear, biological or chemical weapons or missiles, or use any other military purposes. 8. The products are not designed to be used as part of any device or equipment that may affect the human body, human life, or assets (such as medical equipment, disaster prevention systems, security systems, combustion control systems, infrastructure control systems, vehicle equipment, traffic systems, in-vehicle equipment, aviation equipment, aerospace equipment, and nuclear-related equipment), excluding when specified for in-vehicle use or other uses by ABLIC, Inc. Do not apply the products to the above listed devices and equipments. ABLIC Inc. is not liable for any losses, damages, claims or demands caused by unauthorized or unspecified use of the products. 9. In general, semiconductor products may fail or malfunction with some probability. The user of the products should therefore take responsibility to give thorough consideration to safety design including redundancy, fire spread prevention measures, and malfunction prevention to prevent accidents causing injury or death, fires and social damage, etc. that may ensue from the products' failure or malfunction. The entire system in which the products are used must be sufficiently evaluated and judged whether the products are allowed to apply for the system on customer's own responsibility. 10. The products are not designed to be radiation-proof. The necessary radiation measures should be taken in the product design by the customer depending on the intended use. 11. The products do not affect human health under normal use. However, they contain chemical substances and heavy metals and should therefore not be put in the mouth. The fracture surfaces of wafers and chips may be sharp. Be careful when handling these with the bare hands to prevent injuries, etc. 12. When disposing of the products, comply with the laws and ordinances of the country or region where they are used. 13. The information described herein contains copyright information and know-how of ABLIC Inc. The information described herein does not convey any license under any intellectual property rights or any other rights belonging to ABLIC Inc. or a third party. Reproduction or copying of the information from this document or any part of this document described herein for the purpose of disclosing it to a third-party is strictly prohibited without the express permission of ABLIC Inc. 14. For more details on the information described herein or any other questions, please contact ABLIC Inc.'s sales representative. 15. This Disclaimers have been delivered in a text using the Japanese language, which text, despite any translations into the English language and the Chinese language, shall be controlling. 2.4-2019.07 www.ablic.com
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