RFP50N06
September 2013
Data Sheet
Features
N-Channel Power MOSFET
60V, 50A, 22 mΩ
• 50A, 60V
These N-Channel power MOSFETs are manufactured using
the MegaFET process. This process, which uses feature
sizes approaching those of LSI integrated circuits gives
optimum utilization of silicon, resulting in outstanding
performance. They were designed for use in applications
such as switching regulators, switching converters, motor
drivers, and relay drivers. These transistors can be operated
directly from integrated circuits.
• rDS(ON) = 0.022Ω
• Temperature Compensating PSPICE® Model
• Peak Current vs Pulse Width Curve
• UIS Rating Curve
• 175oC Operating Temperature
Symbol
Formerly developmental type TA49018.
D
Ordering Information
PART NUMBER
RFP50N06
PACKAGE
TO-220AB
BRAND
G
RFP50N06
S
Packaging
JEDEC TO-220AB
DRAIN
(FLANGE)
©2002 Fairchild Semiconductor Corporation
SOURCE
DRAIN
GATE
RFP50N06 Rev. C0
RFP50N06
Absolute Maximum Ratings TC = 25oC, Unless Otherwise Specified
RFP50N06
Drain to Source Voltage (Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . VDSS
Drain to Gate Voltage (RGS = 20kΩ) (Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . VDGR
Gate to Source Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . VGS
Continuous Drain Current (Figure 2) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .ID
Pulsed Drain Current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . IDM
Pulsed Avalanche Rating . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . EAS
Power Dissipation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . PD
Linear Derating Factor . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Operating and Storage Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . TJ, TSTG
Maximum Temperature for Soldering
Leads at 0.063in (1.6mm) from Case for 10s. . . . . . . . . . . . . . . . . . . . . . . . . . . . TL
Package Body for 10s, see Techbrief 334 . . . . . . . . . . . . . . . . . . . . . . . . . . . . .Tpkg
UNITS
V
V
V
A
60
60
±20
50
(Figure 5)
(Figure 6)
131
0.877
-55 to 175
W
W/oC
oC
oC
oC
300
260
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
1. TJ = 25oC to 150oC.
Electrical Specifications
TC = 25oC, Unless Otherwise Specified
MIN
TYP
MAX
UNITS
Drain to Source Breakdown Voltage
PARAMETER
SYMBOL
BVDSS
ID = 250µA, VGS = 0V (Figure 11)
TEST CONDITIONS
60
-
-
V
Gate to Source Threshold Voltage
VGS(TH)
VGS = VDS, ID = 250µA (Figure 10)
2
-
4
V
-
-
1
µA
TC = 25oC
TC = 150oC
Zero Gate Voltage Drain Current
IDSS
VDS = 60V,
VGS = 0V
-
-
50
µA
Gate to Source Leakage Current
IGSS
VGS = ±20V
-
-
±100
nA
ID = 50A, VGS = 10V (Figures 9)
-
-
0.022
Ω
VDD = 30V, ID = 50A
RL = 0.6Ω, VGS = 10V
RGS = 3.6Ω
(Figure 13)
-
-
95
ns
-
12
-
ns
-
55
-
ns
td(OFF)
-
37
-
ns
tf
-
13
-
ns
Drain to Source On Resistance
rDS(ON)
Turn-On Time
tON
Turn-On Delay Time
td(ON)
Rise Time
tr
Turn-Off Delay Time
Fall Time
Turn-Off Time
tOFF
Total Gate Charge
Qg(TOT)
VGS = 0 to 20V
Gate Charge at 10V
Qg(10)
VGS = 0 to 10V
Threshold Gate Charge
Qg(TH)
VGS = 0 to 2V
Input Capacitance
CISS
Output Capacitance
COSS
Reverse Transfer Capacitance
CRSS
VDD = 48V, ID = 50A,
RL = 0.96Ω
Ig(REF) = 1.45mA
(Figure 13)
VDS = 25V, VGS = 0V
f = 1MHz
(Figure 12)
-
-
75
ns
-
125
150
nC
-
67
80
nC
-
3.7
4.5
nC
-
2020
-
pF
-
600
-
pF
-
200
-
pF
Thermal Resistance Junction to Case
RθJC
(Figure 3)
-
-
1.14
oC/W
Thermal Resistance Junction to Ambient
RθJA
TO-220
-
-
62
oC/W
-
-
-
-
-
Source to Drain Diode Specifications
PARAMETER
Source to Drain Diode Voltage
Reverse Recovery Time
©2002 Fairchild Semiconductor Corporation
MIN
TYP
MAX
UNITS
ISD = 50A
-
-
1.5
V
ISD = 50A, dISD/dt = 100A/µs
-
-
125
ns
SYMBOL
VSD
trr
TEST CONDITIONS
RFP50N06 Rev. C0
RFP50N06
Unless Otherwise Specified
1.2
60
1.0
50
ID , DRAIN CURRENT (A)
POWER DISSIPATION MULTIPLIER
Typical Performance Curves
0.8
0.6
0.4
0.2
40
30
20
10
0
0
0
25
50
75
100
125
TC , CASE TEMPERATURE (oC)
150
25
175
50
75
100
125
150
175
TC , CASE TEMPERATURE (oC)
FIGURE 1. NORMALIZED POWER DISSIPATION vs CASE
TEMPERATURE
FIGURE 2. MAXIMUM CONTINUOUS DRAIN CURRENT vs
CASE TEMPERATURE
2
THERMAL IMPEDANCE
ZθJC, NORMALIZED
1
0.5
0.2
0.1
0.1
PDM
0.05
t1
0.02
0.01
t2
NOTES:
DUTY FACTOR: D = t1/t2
PEAK TJ = PDM x ZθJC x RθJC + TC
SINGLE PULSE
0.01 -5
10
10-4
10-3
10-2
10-1
t1 , RECTANGULAR PULSE DURATION (s)
101
100
FIGURE 3. NORMALIZED MAXIMUM TRANSIENT THERMAL IMPEDANCE
100
100µs
1ms
10
OPERATION IN THIS
AREA MAY BE
LIMITED BY rDS(ON)
10ms
VDSS(MAX) = 60V
1
103
TJ = MAX RATED
SINGLE PULSE
TC = 25oC
1
FOR TEMPERATURES ABOVE 25oC
DERATE PEAK CURRENT
CAPABILITY AS FOLLOWS:
VDS , DRAIN TO SOURCE VOLTAGE (V)
FIGURE 4. FORWARD BIAS SAFE OPERATING AREA
100
175 – T C
I = I 25 ------------------------
150
VGS = 20V
VGS = 10V
TC = 25oC
102
TRANSCONDUCTANCE
MAY LIMIT CURRENT
IN THIS REGION
100ms
DC
10
©2002 Fairchild Semiconductor Corporation
IDM , PEAK CURRENT (A)
ID , DRAIN CURRENT (A)
400
40
10-3
10-2
10-1
100
101
102
t, PULSE WIDTH (ms)
103
104
FIGURE 5. PEAK CURRENT CAPABILITY
RFP50N06 Rev. C0
RFP50N06
Typical Performance Curves Unless Otherwise Specified
(Continued)
300
125
100
ID , DRAIN CURRENT (A)
IAS, AVALANCHE CURRENT (A)
VGS = 10V
STARTING TJ = 25oC
STARTING TJ = 150oC
10
If R = 0
tAV = (L) (IAS) / (1.3 RATED BVDSS - VDD)
VGS = 7V
75
50
0.1
1
VGS = 6V
VGS = 5V
25
If R ≠ 0
tAV = (L/R) ln [(IAS*R) / (1.3 RATED BVDSS - VDD) + 1]
1
0.01
VGS = 8V
100
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
TC = 25oC
VGS = 4V
0
0
10
1.5
tAV, TIME IN AVALANCHE (ms)
3.0
4.5
6.0
7.5
VDS , DRAIN TO SOURCE VOLTAGE (V)
NOTE: Refer to Fairchild Application Notes 9321 and 9322.
FIGURE 6. UNCLAMPED INDUCTIVE SWITCHING CAPABILITY
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
VDD = 15V
100
-55oC
2.5
25oC
NORMALIZED DRAIN TO SOURCE
ON RESISTANCE
ID, DRAIN CURRENT (A)
125
FIGURE 7. SATURATION CHARACTERISTICS
175oC
75
50
25
0
0
1
2
3
4
5
6
7
8
9
2.0
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
VGS = 10V, ID = 50A
1.5
1.0
0.5
0
-80
10
-40
FIGURE 8. TRANSFER CHARACTERISTICS
80
120
160
200
2.0
NORMALIZED DRAIN TO SOURCE
BREAKDOWN VOLTAGE
VGS = VDS, ID = 250µA
NORMALIZED GATE
THRESHOLD VOLTAGE
40
FIGURE 9. NORMALIZED DRAIN TO SOURCE ON
RESISTANCE vs JUNCTION TEMPERATURE
2.0
1.5
1.0
0.5
0
-80
0
TJ , JUNCTION TEMPERATURE (oC)
VGS , GATE TO SOURCE VOLTAGE (V)
-40
0
40
80
120
160
200
TJ , JUNCTION TEMPERATURE (oC)
FIGURE 10. NORMALIZED GATE THRESHOLD VOLTAGE vs
JUNCTION TEMPERATURE
©2002 Fairchild Semiconductor Corporation
ID = 250µA
1.5
1.0
0.5
0
-80
-40
0
40
80
120
160
200
TJ , JUNCTION TEMPERATURE (oC)
FIGURE 11. NORMALIZED DRAIN TO SOURCE BREAKDOWN
VOLTAGE vs JUNCTION TEMPERATURE
RFP50N06 Rev. C0
RFP50N06
(Continued)
VGS = 0V, f = 1MHz
CISS = CGS + CGD
CRSS = CGD
COSS = CDS + CGD
3000
VDS , DRAIN TO SOURCE VOLTAGE (V)
C, CAPACITANCE (pF)
10
60
4000
CISS
2000
COSS
1000
CRSS
0
0
5
10
15
20
VDD = BVDSS
VDD = BVDSS
7.5
45
5.0
30
0.75 BVDSS
0.75 BVDSS
0.50 BVDSS
0.50 BVDSS
0.25 BVDSS
0.25 BVDSS
RL = 1.2Ω
Ig(REF) = 1.45mA
VGS = 10V
15
2.5
VGS , GATE TO SOURCE VOLTAGE (V)
Typical Performance Curves Unless Otherwise Specified
0
0
25
20
VDS , DRAIN TO SOURCE VOLTAGE (V)
Ig(REF)
t, TIME (µs)
Ig(ACT)
80
Ig(REF)
Ig(ACT)
NOTE: Refer to Fairchild Application Notes AN7254 and AN7260.
FIGURE 12. CAPACITANCE vs DRAIN TO SOURCE VOLTAGE
FIGURE 13. NORMALIZED SWITCHING WAVEFORMS FOR
CONSTANT GATE CURRENT
Test Circuits and Waveforms
VDS
BVDSS
L
tP
VARY tP TO OBTAIN
REQUIRED PEAK IAS
+
RG
VDS
IAS
VDD
VDD
-
VGS
DUT
tP
0V
IAS
0
0.01Ω
tAV
FIGURE 14. UNCLAMPED ENERGY TEST CIRCUIT
FIGURE 15. UNCLAMPED ENERGY WAVEFORMS
tON
tOFF
td(ON)
VDS
td(OFF)
tf
tr
VDS
90%
90%
RL
VGS
+
DUT
RGS
VGS
-
VDD
©2002 Fairchild Semiconductor Corporation
10%
90%
VGS
0
FIGURE 16. SWITCHING TIME TEST CIRCUIT
10%
0
10%
50%
50%
PULSE WIDTH
FIGURE 17. SWITCHING WAVEFORMS
RFP50N06 Rev. C0
RFP50N06
Test Circuits and Waveforms
(Continued)
VDS
VDD
RL
Qg(TOT)
VDS
VGS = 20V
VGS
Qg(10)
+
VDD
DUT
Ig(REF)
VGS = 10V
VGS
-
VGS = 2V
0
Qg(TH)
Ig(REF)
0
FIGURE 18. GATE CHARGE TEST CIRCUIT
©2002 Fairchild Semiconductor Corporation
FIGURE 19. GATE CHARGE WAVEFORMS
RFP50N06 Rev. C0
RFP50N06
PSPICE Electrical Model
.SUBCKT RFP50N06 2 1 3
REV 2/22/93
*NOM TEMP = 25oC
CA 12 8 3.68e-9
CB 15 14 3.625e-9
CIN 6 8 1.98e-9
DRAIN
2
LDRAIN
5
DBODY 7 5 DBDMOD
DBREAK 5 11DBKMOD
DPLCAP 10 5 DPLCAPMOD
DPLCAP
+
DBREAK
EVTO
GATE
9
1
LGATE
20
RGATE
18
8
-
RDRAIN
6
8
VTO
16
+
ESG
+
EBREAK 11 7 17 18 64.59
EDS 14 8 5 8 1
EGS 13 8 6 8 1
ESG 6 10 6 8 1
EVTO 20 6 18 8 1
10
6
MOS1
RIN
8
12
LDRAIN 2 5 1e-9
LGATE 1 9 5.65e-9
LSOURCE 3 7 4.13e-9
MOS1 16 6 8 8 MOSMOD M=0.99
MOS2 16 21 8 8 MOSMOD M=0.01
RBREAK 17 18 RBKMOD 1
RDRAIN 5 16 RDSMOD 1e-4
RGATE 9 20 0.690
RIN 6 8 1e9
RSOURCE 8 7 RDSMOD 12e-3
RVTO 18 19 RVTOMOD 1
13
8
S1B
+
EGS 6
- 8
17
EBREAK
18
RSOURCE
+
7
LSOURCE
S2A
14
13
15
17
RBREAK
S2B
13
CA
11
CIN
IT 8 17 1
S1A
DBODY
MOS2
21
3
SOURCE
18
RVTO
CB
14
+
5
EDS 8
-
IT
19
-
VBAT
+
S1A 6 12 13 8 S1AMOD
S1B 13 12 13 8 S1BMOD
S2A 6 15 14 13 S2AMOD
S2B 13 15 14 13 S2BMOD
VBAT 8 19 DC 1
VTO 21 6 0.678
.MODEL DBDMOD D (IS=9.85e-13 RS=4.91e-3 TRS1=2.07e-3 TRS2=2.51e-7 CJO=2.05e-9 TT=4.33e-8)
.MODEL DBKMOD D (RS=1.98e-1 TRS1=2.35E-4 TRS2=-3.83e-6)
.MODEL DPLCAPMOD D (CJO=1.42e-9 IS=1e-30 N=10)
.MODEL MOSMOD NMOS (VTO=3.65 KP=35 IS=1e-30 N=10 TOX=1 L=1u W=1u)
.MODEL RBKMOD RES (TC1=1.23e-3 TC2=-2.34e-7)
.MODEL RDSMOD RES (TC1=5.01e-3 TC2=1.49e-5)
.MODEL RVTOMOD RES (TC1=-5.03e-3 TC2=-5.16e-6)
.MODEL S1AMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-6.75 VOFF=-2.5)
.MODEL S1BMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-2.5 VOFF=-6.75)
.MODEL S2AMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-2.7 VOFF=2.3)
.MODEL S2BMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=2.3 VOFF=-2.7)
.ENDS
NOTE: For further discussion of the PSPICE model consult A New PSPICE Sub-Circuit for the Power MOSFET Featuring Global Temperature
Options; authors, William J. Hepp and C. Frank Wheatley.
©2002 Fairchild Semiconductor Corporation
RFP50N06 Rev. C0
RFP50N06
TRADEMARKS
The following includes registered and unregistered trademarks and service marks, owned by Fairchild Semiconductor and/or its global subsidiaries, and is not
intended to be an exhaustive list of all such trademarks.
Sync-Lock™
F-PFS™
AccuPower™
®
FRFET®
AX-CAP®*
®*
®
SM
BitSiC™
Global Power Resource
PowerTrench
GreenBridge™
PowerXS™
Build it Now™
TinyBoost®
Green FPS™
Programmable Active Droop™
CorePLUS™
TinyBuck®
®
Green FPS™ e-Series™
QFET
CorePOWER™
TinyCalc™
QS™
Gmax™
CROSSVOLT™
TinyLogic®
GTO™
Quiet Series™
CTL™
TINYOPTO™
IntelliMAX™
RapidConfigure™
Current Transfer Logic™
TinyPower™
ISOPLANAR™
DEUXPEED®
™
TinyPWM™
Dual Cool™
Marking Small Speakers Sound Louder
TinyWire™
EcoSPARK®
Saving our world, 1mW/W/kW at a time™
and Better™
TranSiC™
EfficentMax™
SignalWise™
MegaBuck™
TriFault Detect™
ESBC™
SmartMax™
MICROCOUPLER™
TRUECURRENT®*
SMART
START™
MicroFET™
®
SerDes™
Solutions for Your Success™
MicroPak™
SPM®
MicroPak2™
Fairchild®
®
STEALTH™
MillerDrive™
Fairchild Semiconductor
UHC®
SuperFET®
MotionMax™
FACT Quiet Series™
®
Ultra FRFET™
®
SuperSOT™-3
mWSaver
FACT
UniFET™
SuperSOT™-6
OptoHiT™
FAST®
®
VCX™
SuperSOT™-8
OPTOLOGIC
FastvCore™
®
®
VisualMax™
OPTOPLANAR
SupreMOS
FETBench™
VoltagePlus™
SyncFET™
FPS™
XS™
tm
*Trademarks of System General Corporation, used under license by Fairchild Semiconductor.
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RELIABILITY, FUNCTION, OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY
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THEREIN, WHICH COVERS THESE PRODUCTS.
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2.
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PRODUCT STATUS DEFINITIONS
Definition of Terms
Datasheet Identification
Product Status
Definition
Advance Information
Formative / In Design
Datasheet contains the design specifications for product development. Specifications
may change in any manner without notice.
Preliminary
First Production
Datasheet contains preliminary data; supplementary data will be published at a later
date. Fairchild Semiconductor reserves the right to make changes at any time without
notice to improve design.
No Identification Needed
Full Production
Datasheet contains final specifications. Fairchild Semiconductor reserves the right to
make changes at any time without notice to improve the design.
Obsolete
Not In Production
Datasheet contains specifications on a product that is discontinued by Fairchild
Semiconductor. The datasheet is for reference information only.
Rev. I66
©2002 Fairchild Semiconductor Corporation
RFP50N06 Rev. C0