IRFP440
Data Sheet
January 2002
8.8A, 500V, 0.850 Ohm, N-Channel Power
MOSFET
This N-Channel enhancement mode silicon gate power field
effect transistor is an advanced power MOSFET designed,
tested, and guaranteed to withstand a specified level of
energy in the breakdown avalanche mode of operation. All of
these power MOSFETs are designed for applications such
as switching regulators, switching convertors, motor drivers,
relay drivers, and drivers for high power bipolar switching
transistors requiring high speed and low gate drive power.
These types can be operated directly from integrated
circuits.
Formerly developmental type TA17425.
Ordering Information
PART NUMBER
IRFP440
PACKAGE
TO-247
Features
• 8.8A, 500V
• rDS(ON) = 0.850Ω
• Single Pulse Avalanche Energy Rated
• SOA is Power Dissipation Limited
• Nanosecond Switching Speeds
• Linear Transfer Characteristics
• High Input Impedance
• Related Literature
- TB334 “Guidelines for Soldering Surface Mount
Components to PC Boards”
Symbol
BRAND
D
IRFP440
NOTE: When ordering, include the entire part number.
G
S
Packaging
JEDEC STYLE TO-247
SOURCE
DRAIN
GATE
DRAIN
(FLANGE)
©2002 Fairchild Semiconductor Corporation
IRFP440 Rev. B
IRFP440
Absolute Maximum Ratings
TC = 25oC, Unless Otherwise Specified
Drain to Source Voltage (Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .VDS
Drain to Gate Voltage (RGS = 20kΩ) (Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . VDGR
Continuous Drain Current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ID
TC = 100oC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ID
Pulsed Drain Current (Note 3) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . IDM
Gate to Source Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .VGS
Maximum Power Dissipation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .PD
Linear Derating Factor . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Single Pulse Avalanche Energy Rating (Note 4) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . EAS
Operating and Storage Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . TJ, TSTG
Maximum Temperature for Soldering
Leads at 0.063in (1.6mm) from Case for 10s. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . TL
Package Body for 10s, See Techbrief 334 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Tpkg
IRFP440
500
500
8.8
5.6
35
±20
150
1.2
480
-55 to 150
UNITS
V
V
A
A
A
V
W
W/oC
mJ
oC
300
260
oC
oC
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
1. TJ = 25oC to 125oC.
Electrical Specifications
TC = 25oC, Unless Otherwise Specified
PARAMETER
SYMBOL
Drain to Source Breakdown Voltage
BVDSS
Gate Threshold Voltage
VGS(TH)
Zero-Gate Voltage Drain Current
IDSS
MIN
TYP
MAX
UNITS
VGS = 0V, ID = 250µA (Figure 10)
TEST CONDITIONS
500
-
-
V
VGS = VDS, ID = 250µA
2.0
-
4.0
V
-
-
25
µA
-
-
250
µA
8.8
-
-
A
VDS = Rated BVDSS, VGS = 0V
VDS = 0.8 x Rated BVDSS, VGS = 0V, TJ = 125oC
On-State Drain Current (Note 2)
Gate to Source Leakage
Drain to Source On Resistance (Note 2)
Forward Transconductance (Note 2)
Turn-On Delay Time
Rise Time
Turn-Off Delay Time
Fall Time
ID(ON)
IGSS
rDS(ON)
gfs
td(ON)
tr
VDS > ID(ON) x rDS(ON)MAX, VGS = 10V
VGS = ±20V
-
-
±100
nA
VGS = 10V, ID = 4.9A (Figures 8, 9)
-
0.800
0.850
Ω
5.3
8.2
-
S
-
17
21
ns
-
23
35
ns
-
42
74
ns
VDS ≥ 50V, ID = 4.9A (Figure 12)
VDD = 250V, ID ≈ 8A, RGS = 9.1Ω, RL = 30.1Ω
MOSFET Switching Times are Essentially
Independent of Operating Temperature
td(OFF)
tf
Total Gate Charge
(Gate to Source + Gate to Drain)
Qg
Gate to Source Charge
Qgs
Gate to Drain “Miller” Charge
Qgd
Input Capacitance
CISS
Output Capacitance
Reverse-Transfer Capacitance
VGS = 10V, ID = 8A, VDS = 0.8 x Rated BVDSS
Ig(REF) = 1.5mA (Figure 14) Gate Charge is
Essentially Independent of Operating Temperature
-
18
30
ns
-
42
63
nC
-
7
-
nC
-
22
-
nC
-
1225
-
pF
COSS
-
200
-
pF
CRSS
-
85
-
pF
-
5.0
-
nH
-
12.5
-
nH
-
-
0.83
oC/W
-
-
30
oC/W
VGS = 0V, VDS = 25V, f = 1.0MHz (Figure 11)
Internal Drain Inductance
LD
Measured from the drain
Lead, 6mm (0.25in) from
the Package to the
Center of the Die
Internal Source Inductance
LS
Measured from the
Source Lead, 6mm
(0.25in) from Header to
the Source Bonding Pad
Modified MOSFET
Symbol Showing the
Internal Devices
Inductances
D
LD
G
LS
S
Junction to Case
RθJC
Junction to Ambient
RθJA
©2002 Fairchild Semiconductor Corporation
Free Air Operation
IRFP440 Rev. B
IRFP440
Source to Drain Diode Specifications
PARAMETER
SYMBOL
Continuous Source to Drain Current
ISD
Pulse Source to Drain Current
(Note 3)
ISDM
TEST CONDITIONS
Modified MOSFET
Symbol Showing the
Integral Reverse P-N
Junction Diode
MIN
TYP
MAX
UNITS
-
-
8.8
A
-
-
35
A
-
-
1.8
V
210
460
970
ns
2
4.2
8.9
µC
D
G
S
Source to Drain Diode Voltage (Note 2)
VSD
Reverse Recovery Time
trr
Reverse Recovered Charge
QRR
TJ = 25oC, ISD = 8.8A, VGS = 0V (Figure 13)
TJ = 25oC, ISD = 8.0A, dISD/dt = 100A/µs
TJ = 25oC, ISD = 8.0A, dISD/dt = 100A/µs
NOTES:
2. Pulse test: pulse width ≤ 300µs, duty cycle ≤ 2%.
3. Repetitive rating: pulse width limited by Max junction temperature. See Transient Thermal Impedance curve (Figure 3).
4. VDD = 50V, starting TJ = 25oC, L = 11mH, RG = 50Ω, peak IAS = 8.8A.
Typical Performance Curves
Unless Otherwise Specified
10
1.0
ID, DRAIN CURRENT (A)
POWER DISSIPATION MULTIPLIER
1.2
0.8
0.6
0.4
8
6
4
2
0.2
0
0
0
50
100
25
150
50
TC , CASE TEMPERATURE (oC)
75
100
150
125
TC , CASE TEMPERATURE (oC)
FIGURE 1. NORMALIZED POWER DISSIPATION vs CASE
TEMPERATURE
FIGURE 2. MAXIMUM CONTINUOUS DRAIN CURRENT vs
CASE TEMPERATURE
ZθJC, THERMAL IMPEDANCE
1
0.5
0.2
0.1
0.1
PDM
0.05
0.02
0.01
10-2
10-3
10-5
t1
t2 t2
SINGLE PULSE
NOTES:
DUTY FACTOR: D = t1/t2
PEAK TJ = PDM x ZθJC + TC
10-4
10-3
10-2
0.1
1
10
t1 , RECTANGULAR PULSE DURATION (s)
FIGURE 3. MAXIMUM TRANSIENT THERMAL IMPEDANCE
©2002 Fairchild Semiconductor Corporation
IRFP440 Rev. B
IRFP440
Typical Performance Curves
Unless Otherwise Specified (Continued)
15
102
100µs
1ms
1
10ms
TC = 25oC
TJ = MAX RATED
SINGLE PULSE
0.1
12
VGS = 6.0V
9
VGS = 5.5V
6
VGS = 5.0V
3
DC
0
103
0
50
100
150
200
VDS , DRAIN TO SOURCE VOLTAGE (V)
FIGURE 4. FORWARD BIAS SAFE OPERATING AREA
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
102
VGS = 10V
12
VGS = 6.0V
9
VGS = 5.5V
6
VGS = 5.0V
3
VGS = 4.0V
0
0
VGS = 4.5V
3
6
9
12
VDS , DRAIN TO SOURCE VOLTAGE (V)
15
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
VDS ≥ 50V
10
1
0.1
10-2
0
NORMALIZED DRAIN TO SOURCE
ON RESISTANCE VOLTAGE
8
ON RESISTANCE
rDS(ON), DRAIN TO SOURCE
3.0
5
VGS = 10V
2
VGS = 20V
0
0
8
16
24
ID , DRAIN CURRENT (A)
32
FIGURE 8. DRAIN TO SOURCE ON RESISTANCE vs GATE
VOLTAGE AND DRAIN CURRENT
©2002 Fairchild Semiconductor Corporation
2
4
6
8
VGS , GATE TO SOURCE VOLTAGE (V)
10
FIGURE 7. TRANSFER CHARACTERISTICS
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
4
TJ = 25oC
TJ = 150oC
FIGURE 6. SATURATION CHARACTERISTICS
10
250
FIGURE 5. OUTPUT CHARACTERISTICS
ID(ON), ON STATE DRAIN CURRENT (A)
ID, DRAIN CURRENT (A)
15
VGS = 4.5V
VGS = 4.0V
102
10
VDS , DRAIN TO SOURCE VOLTAGE (V)
1
ID, DRAIN CURRENT (A)
ID, DRAIN CURRENT (A)
10µs
10
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
VGS = 10V
OPERATION IN THIS
REGION IS LIMITED BY rDS(ON)
40
2.4
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
ID = 4.9A, VGS = 10V
1.8
1.2
0.6
0
-60
-40
-20
0
20
40
60
80
100 120 140 160
TJ , JUNCTION TEMPERATURE (oC)
FIGURE 9. NORMALIZED DRAIN TO SOURCE ON
RESISTANCE vs JUNCTION TEMPERATURE
IRFP440 Rev. B
IRFP440
Typical Performance Curves
3000
ID = 250µA
1.15
1.05
0.95
1800
CISS
1200
COSS
0.85
0.75
-60
VGS = 0V, f = 1MHz
CISS = CGS + CGD
CRSS = CGD
COSS ≈ CDS + CGS
2400
C, CAPACITANCE (pF)
NORMALIZED DRAIN TO SOURCE
BREAKDOWN VOLTAGE
1.25
Unless Otherwise Specified (Continued)
600
-40
-20
0
20
40
60
80
0
100 120 140 160
CRSS
1
ISD, SOURCE TO DRAIN CURRENT (A)
gfs, TRANSCONDUCTANCE (S)
12
TJ = 25oC
TJ = 150oC
6
3
0
20
50
100
FIGURE 11. CAPACITANCE vs DRAIN TO SOURCE VOLTAGE
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
VDS ≥ 50V
9
10
VDS , DRAIN TO SOURCE VOLTAGE (V)
FIGURE 10. NORMALIZED DRAIN TO SOURCE BREAKDOWN
VOLTAGE vs JUNCTION TEMPERATURE
15
5
2
TJ , JUNCTION TEMPERATURE (oC)
102
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
10
TJ = 150oC
1
TJ = 25oC
0.1
0
3
6
9
ID , DRAIN CURRENT (A)
12
15
0
FIGURE 12. TRANSCONDUCTANCE vs DRAIN CURRENT
0.3
0.6
0.9
1.2
VSD , SOURCE TO DRAIN VOLTAGE (V)
1.5
FIGURE 13. SOURCE TO DRAIN DIODE VOLTAGE
VGS, GATE TO SOURCE VOLTAGE (V)
20
ID = 8A
16
VDS = 100V
12
VDS = 250V
VDS = 400V
8
4
0
0
12
24
36
48
60
Qg , GATE CHARGE (nC)
FIGURE 14. GATE TO SOURCE VOLTAGE vs GATE CHARGE
©2002 Fairchild Semiconductor Corporation
IRFP440 Rev. B
IRFP440
Test Circuits and Waveforms
VDS
BVDSS
L
tP
VARY tP TO OBTAIN
IAS
+
RG
REQUIRED PEAK IAS
-
VGS
VDS
VDD
VDD
DUT
tP
0V
IAS
0
0.01Ω
tAV
FIGURE 15. UNCLAMPED ENERGY TEST CIRCUIT
FIGURE 16. UNCLAMPED ENERGY WAVEFORMS
tON
tOFF
td(ON)
td(OFF)
tf
tr
RL
VDS
90%
90%
+
RG
-
VDD
10%
10%
0
DUT
90%
VGS
VGS
0
FIGURE 18. RESISTIVE SWITCHING WAVEFORMS
VDS
(ISOLATED
SUPPLY)
CURRENT
REGULATOR
0.2µF
50%
PULSE WIDTH
10%
FIGURE 17. SWITCHING TIME TEST CIRCUIT
12V
BATTERY
50%
VDD
Qg(TOT)
SAME TYPE
AS DUT
50kΩ
Qgd
0.3µF
VGS
Qgs
D
VDS
DUT
G
0
IG(REF)
S
0
IG CURRENT
SAMPLING
RESISTOR
VDS
ID CURRENT
SAMPLING
RESISTOR
FIGURE 19. GATE CHARGE TEST CIRCUIT
©2002 Fairchild Semiconductor Corporation
IG(REF)
0
FIGURE 20. GATE CHARGE WAVEFORMS
IRFP440 Rev. B
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DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT
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DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used herein:
1. Life support devices or systems are devices or
2. A critical component is any component of a life
systems which, (a) are intended for surgical implant into
support device or system whose failure to perform can
the body, or (b) support or sustain life, or (c) whose
be reasonably expected to cause the failure of the life
failure to perform when properly used in accordance
support device or system, or to affect its safety or
with instructions for use provided in the labeling, can be
effectiveness.
reasonably expected to result in significant injury to the
user.
PRODUCT STATUS DEFINITIONS
Definition of Terms
Datasheet Identification
Product Status
Definition
Advance Information
Formative or
In Design
This datasheet contains the design specifications for
product development. Specifications may change in
any manner without notice.
Preliminary
First Production
This datasheet contains preliminary data, and
supplementary data will be published at a later date.
Fairchild Semiconductor reserves the right to make
changes at any time without notice in order to improve
design.
No Identification Needed
Full Production
This datasheet contains final specifications. Fairchild
Semiconductor reserves the right to make changes at
any time without notice in order to improve design.
Obsolete
Not In Production
This datasheet contains specifications on a product
that has been discontinued by Fairchild semiconductor.
The datasheet is printed for reference information only.
Rev. H4