PESD0521U080
1. Electrical Specification
1-1 Test condition
Varistor voltage
Leakage current
Maximum clamping voltage
Rated peak single pulse transient current
Capacitance
Insulation resistance after reflow soldering
Reflow soldering condition
In = 1 mA DC
Vdc = 5.0V DC
Ic = 1 A
8 / 20 ㎲ waveform, +/- each 1 time induce
10/1000 ㎲ waveform
f = 1MHz, Vrms = 0.5 V
Soldering paste : Tamura (Japan) RMA-20-21L
Stencil : SUS, 120 ㎛ thickness
Pad size : 0.5 (Width) x 0.6 (Length)
0.5 (Distance between pads)
Soldering profile : 260±5 ℃, 5 sec.
1-2 Electrical specification
Maximum allowable continuous DC voltage
5.0
trigger voltage / Varistor voltage / breakdown voltage
100-150
Maximum clamping voltage
Rated peak single pulse transient current
V
V
200
V
Maximum
1
A
Maximum
Nonlinearity coefficient
> 12
Leakage current at continuous DC voltage
< 0.1
㎂
Response time
< 0.5
ns
Varistor voltage temperature coefficient
< 0.05
%/℃
0.8
pF
Capacitance tolerance
-50 to +50
%
Insulation resistance after reflow soldering on PCB
>
10
MΩ
Operating ambient temperature
-55 to +85
℃
Storage temperature
-55 to +125
℃
Capacitance measured at 1MHz
Rev : 01.06.2017
1/5
Typical
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PESD0521U080
1-3 Reliability testing procedures
Reliability
parameter
Pulse current
capability
Electrostatic
discharge
capability
Test
Imax
8/20 ㎲
ESD
C=150 pF,
R=330Ω
Environmenta
l reliability
Thermal shock
Test methods and remarks
Test requirement
IEC 1051-1, Test 4.5.
dVn/Vn≤10%
10 pulses in the same direction at 2
pulses per minute at maximum peak
current
no visible damage
IEC 1000-4-2
dVn/Vn≤10%
Each 10 times in positive/negative
direction in 10 sec at 8KV contact
discharge (Level 4)
no visible damage
IEC 68-2-14
Condition for 1 cycle
Step 1 : Min. –40℃, 30±3 min.
Step 2 : Max. +125℃, 30±3 min.
dVn/Vn≤5%
no visible damage
Number of cycles: 30 times
Low temperature
IEC 68-2-1
Place the chip at -40±5℃ for 1000±
12hrs. Remove and place for 24±2hrs at
room temp. condition, then measure
High temperature
IEC 68-2-2
Place the chip at 125±5℃ for 1000±
24hrs. Remove and place for 24±2hrs at
room temp. condition, then measure
Heat resistance
no visible damage
dVn/Vn≤5%
no visible damage
dVn/Vn≤5%
Apply the rated voltage for 1000±48hrs
at 85±3℃. Remove and place for 24±
2hrs at room temp. condition, then
measure
no visible damage
IEC 68-2-30
dVn/Vn≤10%
Place the chip at 40±2℃ and 90 to 95%
humidity for 1000±24hrs. Remove and
place for 24±2hrs at room temp.
condition, then measure
no visible damage
Pressure cooker
test
Place the chip at 2 atm, 120℃, 85%RH
for 60 hrs. Remove and place for 24±
2hrs at room temp. condition, then
measure
dVn/Vn≤10%
Operating life
Apply the rated voltage for 1000±48hrs
at 125±3℃. Remove and place for 24±
2hrs at room temp. condition, then
measure
Humidity
resistance
Rev : 01.06.2017
IEC 68-2-3
dVn/Vn≤5%
2/5
no visible damage
dVn/Vn≤10%
no visible damage
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PESD0521U080
Mechanical
Solderability
IEC 68-2-58
Solder bath method, 230±5℃, 2s
Reliability
Resistance to
soldering heat
IEC 68-2-58
Bending strength
IEC 68-2-21
dVn/Vn≤5%
Solder bath method,
260±5℃, 10±0.5s, 270±5℃, 3±0.5s
no visible damage
dVn/Vn≤5%
Warp:2mm, Speed:0.5mm/sec, Duration:
10sec. The measurement shall be made
with board in the bent position
Adhesive strength
At least 95% of terminal
electrode is covered by
new solder
IEC 68-2-22
no visible damage
Strength>10 N
Applied force on SMD chip by fracture
from PCB
no visible damage
2. Material Specification
Body
ZnO based ceramics
Internal electrode
Silver – Palladium
External electrode
Silver – Nickel – Tin
Thickness of Ni/Sn plating layer
Nickel > 1 ㎛, Tin > 2 ㎛
3. Dimension Specification
Size
0201
0402
L(mm)
0.6±0.03
1.0±0.10
W(mm)
0.3±0.03
0.5±0.10
T(mm)
≤ 0.3
≤ 0.6
M(mm)
0.15±0.05
0.20±0.10
4. Soldering Recommendations
4-1 Soldering profile
Rev : 01.06.2017
3/5
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PESD0521U080
4-1-1 Pb free solder paste
4-1-2 Repair soldering
-
Allowable time and temperature for making correction with a soldering iron
: 350 ± 10 ℃, 3 sec.
-
Optimum solder amount when corrections are made using a soldering iron
4-2 Soldering guidelines
-
Our chip varistors are designed for reflow soldering only. Do not use flow soldering
-
Use non-activated flux (Cl content 0.2% max.)
-
Follow the recommended soldering conditions to avoid varistor damage.
Rev : 01.06.2017
4/5
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PESD0521U080
4-3 Solder pad layout
5. Storage condition
-
Storage environment must be at an ambient temperature of 25~35 ℃ and an ambient
humidity of 40~60 % RH
-
Chip varistors can experience degradation of termination solderability when subjected to
high temperature of humidity, or if exposed to sulfur or chlorine gases.
-
Avoid mechanical shock (ex. Falling) to the chip varistor to prevent mechanical cracking
inside of the ceramic dielectric due to its own weight.
-
Use chips within 6 months.
If 6 months of more have elapsed, check solderability before use.-
6. Description about package label
Qunatity : 10,000 pcs
- Quantity of shipping chip varistor
Shanghai Leiditech Electronic Co.,Ltd
Email: sale1@leiditech.com
Tel : +86- 021 50828806
Fax : +86- 021 50477059
Rev : 01.06.2017
5/5
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