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AZ1345-04F-MS
Semiconductor
Compiance
Features
Protects two or four I/O lines
Low capacitance: 0.5pF Typical between I/O channel
Low leakage current
5V operating voltage
Response time < 1ns
Solid-state silicon avalanche technology
Device meets MSL 1 requirements
RoHS compliant
Applications
High Definition Multi-Media Interface (HDMI)
Digital Visual Interface (DVI)
USB 1.1/2.0/3.0/OTG
IEEE 1394 Firewire Ports
Notebooks & Handhelds
DFN2510
Projection TV & Monitors
Set-top box
Flat Panel Displays
PCI Express
Mechanical Characteristics
DFN2510 package
Flammability Rating: UL 94V-0
Terminal: Matte tin plated.
Packaging: Tape and Reel
High temperature soldering guaranted:260℃/10s
Reel size: 7 inch
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AZ1345-04F-MS
Semiconductor
Compiance
Maximum Ratings And Characteristics @ 25°C Ambient Temperature (unless otherwise noted)
Symbol
Parameter
Value
Units
PPP
Peak Pulse Power (8/20μs)
150
W
IPP
Peak Pulse Current (8/20μs)
5
A
±15
±8
kV
VESD
ESD per IEC 61000-4-2 (Air)
ESD per IEC 61000-4-2 (Contact)
TOPT
Operating Temperature
-55/+150
C
TSTG
Storage Temperature
-55/+150
C
Electrical Characteristics(Tamb=25C)
Symbol
Parameter
Test Condition
VRWM
Reverse Working Voltage
Any I/O pin to GND
VBR
Reverse Breakdown
Voltage
IR
Reverse Leakage Current
IT = 1mA
Any I/O pin to GND
VRWM = 5V
Any I/O pin to GND
VF
Diode Forward Voltage
IF = 15mA
VC1
Clamping Voltage 1
VC2
Clamping Voltage 2
CJ1
Junction Capacitance 1
CJ2
Junction Capacitance 2
Min
Typ
Max
Units
5.0
V
6.0
V
1
μA
1.2
V
IPP = 1A, tp = 8/20μs
Any I/O pin to GND
15.5
V
IPP = 5, tp = 8/20μs
Any I/O pin to GND
25
V
0.3
0.6
pF
0.45
0.8
pF
VR = 0V, f = 1MHz
Between I/O pins
VR = 0V, f = 1MHz
Any I/O pin to GND
0.85
Note: I/O pins are pin 1,2,4,5.
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AZ1345-04F-MS
Semiconductor
Compiance
Electrical Characteristics Curve
www.msksemi.com
AZ1345-04F-MS
Semiconductor
Compiance
PACKAGE MECHANICAL DATA
A
A
b1xN
bbb
1
E/2
C
A1
R0.125
E
C A B
2
DIMENSI
LxN
DIM
2X R0.075 PLACES
7
N
bxN
e
B
SEATING
PLANE
aaa C
A2
D
bbb
D/2
C A B
Dimensions in millimeters
A
A1
A2
b
b1
D
E
e
L
N
aaa
bbb
ONS
INCHES
MIN
MILLIMETERS
NOM MAX
.020
.023
0.00
.001
(.005)
.006
.008
.014
.016
.094
.098
.035
.039
.020 BSC
.012
.015
8
.003
.004
.026
.002
.010
.018
.102
.043
.017
MIN
NOM
MAX
0.50 0.58
0.00 0.03
(0.13)
0.15 0.20
0.35 0.40
2.40 2.50
0.90 1.00
0.50 BSC
0.30 0.38
8
0.08
0.10
0.65
0.05
0.25
0.45
2.60
1.10
0.425
DIMENSIONS
P1
P
Y
Z (C)
(Y1)
G
X
X1
DIM
INCHES
MILLIMETERS
C
(.034)
(0.875)
G
.008
0.20
P
.020
0.50
P1
.039
1.00
X
.008
0.20
X1
.016
0.40
Y
.027
0.675
Y1
(.061)
(1.55)
Z
.061
1.55
NOTES:
CONTROLLING DIMENSIONS ARE IN MILLIMETERS (ANGLES IN DEGREES).
THIS LAND PATTERN IS FOR REFERENCE PURPOSES ONLY.
CONSULT YOUR MANUFACTURING GROUP TO ENSURE YOUR
COMPANY'S MANUFACTURING GUIDELINES ARE MET.
REEL SPECIFICATION
P/N
AZ1345-04F-MS
PKG
DFN2510
QTY
3000
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AZ1345-04F-MS
Semiconductor
Compiance
Attention
■ Any and all MSKSEMI Semiconductor products described or contained herein do not have specifications
that can handle applications that require extremely high levels of reliability, such as life-support systems,
aircraft's control systems, or other applications whose failure can be reasonably expected to result in serious
physical and/or material damage. Consult with your MSKSEMI Semiconductor representative
nearest
you
before using any MSKSEMI Semiconductor products described or contained herein in such applications.
■ MSKSEMI Semiconductor assumes no responsibility for equipment failures that result from using products
at values that exceed, even momentarily, rated values (such as maximum ratings, operating condition ranges, or
other parameters) listed in products specificationsof any andall MSKSEMI Semiconductor products described
orcontained herein.
■ Specifications of any and all MSKSEMI Semiconductor products described or contained herein stipulate the
performance, characteristics, and functions of the described products in the independent state, and are not
guarantees of the performance, characteristics, and functions of the described products as mounted in the
customer’s products or equipment. To verify symptoms and states that cannot be evaluated in an independent
device, the customer should always evaluate and test devices mounted in the customer’sproducts orequipment.
■ MSKSEMI Semiconductor. strives to supply high-quality high-reliability products. However, any and all
semiconductor products fail with someprobability. It is possiblethat these probabilistic failures could give rise to
accidents or events that could endanger human lives, that could give rise to smoke or fire, or that could cause
damage to other property. When designing equipment, adopt safety measures so that these kinds of accidents
or events cannot occur. Such measures include but are not limited to protective circuits anderror prevention
circuitsfor safedesign, redundant design, and structural design.
■ In the event that any or all MSKSEMI Semiconductor products(including technical data, services) described
or contained herein are controlled under any of applicable local export control laws and regulations, such
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accordance with the above law.
■ No part of this publication may be reproduced or transmitted in any form or by any means, electronic or
mechanical, including photocopying and recording, or any information storage or retrieval system, or otherwise,
without the prior written permission of MSKSEMI Semiconductor.
■ Information (including circuit diagrams and circuit parameters) herein is for example only ; it is not
guaranteed for volume production. MSKSEMI Semiconductor believes information herein is accurate and reliable,
but no guarantees are made or implied regarding its use or any infringementsof intellectual property rights or
other rightsof third parties.
■ Any and all information described or contained herein are subject to change without notice due to
product/technology improvement, etc. Whendesigning equipment, referto the "Delivery Specification" for the
MSKSEMI Semiconductor productthat you intend to use.
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