X2R026000BZ1HZ-DEHPZ 数据手册
PRELIMINARY SPECIFICATIONS
GP
Customer Part No.:
HELE. Part No: X2R026000BZ1HZ-DEHPZ
Application For:
Products:
Accepted Model:
Type & Freq.: HSX221SR / 26.000MHz
Sample Order No:
Date:
CRYSTAL
2014/02/21
Approved By :
HARMONY ELECTRONICS CORP.
HARMONY ELECTRONICS (THAILAND) CO., LTD.
HARMONY ELECTRONICS (SHENZHEN) CORP., LTD.
HARMONY ELECTRONICS (SUZHOU) CO.,LTD
TAIPEI OFFICE:
公司:(114)
台北市內湖區堤頂大道 2 段 409
號2樓
2F., NO.409, SEC.2, TIDING
BLVD., NEIHU DISTRICT,
TAIPEI CITY 114, TAIWAN
TEL:886-2-26588883
FAX:886-2-26588683
TAIWAN FACTORY:
工廠:(831)
高雄市大寮區大發工業區華東路
39 號
No.39, HWA DONG RD.,
DALLIAO DIST.,DAFA
INDUSTRIAL PARK.,
KAOHSIUNG CITY 831,
TAIWAN
TEL: (07)787-1555-6
FAX: (07)787-1557
THAILAND FACTORY:
66MOO 5,
KAONGU-BEOKPRAI RD.,
T.BEOKPRAI, A. BANPONG,
RAJCHABUREE PROVINCE
70110, THAILAND
TEL: (032)221994-6,
200740-1
FAX: (032)200742
SHENZHEN FACTORY:
深圳市福永鎮塘尾村塘橋路聚源
工業區
QIAO TANG RD., TANGWEI
VILLAGE FU YONG TOWN
SHENZHEN CITY CHINA
TEL: 0755-27309272 /
27309262
FAX: 0755-27309755
Country of origin
Tittle HSX221SR
QUARTZ CRYSTAL SPECIFICATION
Date
Confirm
2014/02/21 F. S. TSAI
Spec. No.
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THAILAND FACTORY
CHINA FACTORY
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U. F. CHEN X2R026000BZ1HZ-DEHPZ
HARMONY
ELECTRONICS
SUZHOU FACTORY:
蘇州市相城區黃埭鎮安民路 5 號
NO.5 ANMING ROAD,
HUANGDAI TOWN,
XIANGCHENG DISTRCT,
SUZHOU CITY, JIANGSU
PROVINCE
TEL:86-512-67592373
FAX:86-512-67592363
CORP.
1
1
HSX221SR
SPECIFICATION
INDEX
ITEM
PAGE
1. QUARTZ CRYSTAL UNIT SPECIFICATION............
3-4
2. MARKING & DIMENSIONS...................
5
3. INSIDE STRUCTURE......................
6
4. EMBOSS CARRIER TAPE&REEL................
a. DIMENSIONS OF CARRIER TAPE...............
7
b. DIMENSIONS OF REEL....................
7-8
c. STORAGE CONDITION....................
8
d. STANDARD PACKING QUANTITY...............
8
e. MATERIAL OF TAPE.....................
8
f. LABEL CONTENTS......................
8
g. TAPING DIMENSION.....................
9
h. JOINT OF TAPE.......................
9
i. RELEASE STRENGHT OF COVER TAPE............
9
j. PACKAGE...........................
10
5. MECHANICAL ENDURANCE..................
10
6. ENVIRONMENTAL ENDURANCE................
11
7. SUPPLEMENT.........................
12-13
8. Flow Chart...........................
14
Country of origin
Tittle HSX221SR
QUARTZ CRYSTAL SPECIFICATION
Date
Confirm
2014/02/21 F. S. TSAI
Spec. No.
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2
1. QUARTZ CRYSTAL UNIT SPECIFICATION
1. Frequency:
26.000000MHz
2. Holder type :
HSX221SR
3. Frequency tolerance:
+/-10 ppm at 25deg.C +/-3deg.C
4. Equivalent resistance:
30 ohms Max. / SERIES
5. Storage temperature range:
-40 deg.C To +85 deg.C
6. Operable temperature range:
-30 deg.C To +85 deg.C
7. Temperature drift:
+/-10ppm
8. Loading capacitance (CL) :
7.0 pF
9. Drive level:
10 μW
10. Shunt Capacitance:
2.0 pF
11. Insulation resistance :
More than 500M ohms at DC 100V
12. Mode of oscillation:
Fundamental
13. Circuit:
Measured in HP/E5100A,S&A 250B
14. Shocking :
Dropping from 120 cm height 3 times on Concrete floor
Variation :
-25 deg.C To +85deg.C
(100uW Max)
Frequency less than +/-5 ppm
Resistance less than +/- 15 ﹪or 2ohms max.
+/- 1ppm max. first year
+/- 1.5ppm max. second year
+/- 2.5ppm max. after 5 years
+/- 5ppm max. after 10 years
15. Aging:
16. Holder
HSX221SR Seam type
17.Dimensions and marking
Refer to page.4
18. Emboss carrier tape & reel
Refer to page.6 and page.7
19. Moisture Sensitivity Level
Level 1
20.Note:
Spurious mode series resistance within: 0.5K ohms(Min) +/-1 MHz
Tuning sensitivity (TS) : 28+/-10% ppm/pF
DLD Spec. : 10nW ~ 100uW, step ratio is √10
DLD2 : 2.5 ohm Max.
DLDH2 : 1.5 ohm Max.
FDLD : 2 ppm Max.
FDLDH : 0.7 ppm Max.
Country of origin
TAIWAN FACTORY
Tittle HSX221SR
THAILAND FACTORY
QUARTZ CRYSTAL SPECIFICATION
CHINA FACTORY
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Date
Spec. No.
Rev.
Page
2014/02/21 F. S. TSAI
Y. W. LEE
HARMONY
U. F. CHEN X2R026000BZ1HZ-DEHPZ
ELECTRONICS
CORP.
1
3
▪
S curve (fL) 3rd order curve fitting coefficient requirement over operation
temperature under per 2 ℃ test [f (T) = C3*(T-T0)^3 + C2*(T-T0)^2 + C1*(T-T0) +
C0 ; T0 = 25 ℃]
–
1st order coefficient : -0.1 ~ -0.35
–
2nd order coefficient : -0.0005 ~ -0.0012
–
3rd order coefficient : 0.000087 ~ 0.00011
▪
Freq. slope error between measured S curve (fL) data and 3rd order curve
fitting data over operation temperature under per 2 ℃ test
–
-10 ℃ ~ 60 ℃ : ±0.05ppm
–
-30 ℃ ~ 85 ℃ : ±0.1ppm
▪
Freq. perturbation : within ± 0.5 ppm
–
Residual error from the freq. vs. temperature curve fit 3rd order. Min. of 1
freq. reading per 2 degree C over operation temperature
▪
Full cycle temperature hysteresis : 0.5ppm Max.
–
Difference in freq. measurement at any temperature when undergoing a
thermal cycle over the entire operation temperature range from -40℃ to
85℃ for per 2 degree test
▪
Small cycle temperature hysteresis : 0.05ppm Max.
–
Difference in freq. measurement at any temperature when undergoing a
thermal cycle of a temperature range of 5℃ for per 1 degree test
Country of origin
Tittle HSX221SR
QUARTZ CRYSTAL SPECIFICATION
Date
Confirm
2014/02/21 F. S. TSAI
Spec. No.
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4
2. HSX221SR MARKING & DIMENSIONS
UNIT: mm
TOLERANCE: +/-0.15
*Marking should be printed as following:
Logo, Nominal Frequency, Manufactured year & month
*Nominal frequency = integer only
( ex. 14.31818 MHz 14 )
*Manufacturing Lot No.
(Y: year) ex. 2000 shall be marked as ‘ 0 ’ (As shown on the Table-1)
(M: month) ex. June shall be marked as ‘ F ‘ (As shown on the Table-2).
Marking : Laser marking.
(Table-1)
Year
2000
2010
0
Code
2001
2011
1
2002
2012
2
2003
2013
3
2004
2014
4
2005
2015
5
2006
2016
6
2007
2017
7
2008
2018
8
2009
2019
9
(Table-2)
Jan.
A
Feb.
B
Mar.
C
Apr.
D
May.
E
Jun.
F
Jul.
G
Aug.
H
Sep.
J
Oct.
K
Country of origin
Tittle HSX221SR
QUARTZ CRYSTAL SPECIFICATION
Date
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2014/02/21 F. S. TSAI
Spec. No.
Nov.
L
Dec.
M
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3. INSIDE STRUCTURE
※Reference drawing
(1) Base:
Alumina Ceramic (Al2O3)
Metallized Pad:
Ni Plating
Au Plating
(2) Lid :
Fe- Ni -Co
(3) Crystal Enclosure Seal:
Seal Seam
(4) Crystal Blank
Rectangular At-Cut Quartz Crystal Blank
(5) Adhesive
Silver Conductive Silicon Resin
(6) PAD
Alumina Ceramic (Ni. Au)
(7) Cover Ring:
Fe-Ni-Co Alloy
(8) Thermistor: Resistance : 100KΩ±1%
The use prohibition chemistry
substance of Table 1 of DHE-0204-1
(HE-QA-24) is not included in this
item.
B-constant : 4250K±1%
(9) Electrode
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Tittle HSX221SR
QUARTZ CRYSTAL SPECIFICATION
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4. HSX221SR EMBOSS CARRIER TAPE & REEL
a.) Dimensions of Carrier Tape
b.) Dimensions of Reel
Country of origin
Tittle HSX221SR
QUARTZ CRYSTAL SPECIFICATION
Date
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(Table-2)
(UNIT: mm)
MARK
DIMENSIONS‧ANGLE
Diameter
A
ψ180+0/-3
Inner Width
W1
9.3+/-0.3
Outer Width
W2
Out Line diameter
B
11.3+/-1.0
ψ60.5+/-0.5
F1
3.0+0.5/-0
F2
4.0+0.5/-0
F3
5.0+0.5/-0
q
C
120deg
ψ13.2+/-0.5
E
3.0+/-0.2
ITEM
FLANCE
HUB
Width
Center
Core slit
Position
Spindle diameter
Key Ditch
Width
c.) Storage condition
Temperature: +40deg.C Max.
Relative Humidity: 80% Max.
d.) Standard packing quantity
3,000PCS / REEL
e.) Material of the tape
Tape
Carrier tape
Top tape
Material
PS Conductive
Polyester
f.) Label contents
Sticks label for every reel.
Country of origin
Tittle HSX221SR
QUARTZ CRYSTAL SPECIFICATION
Date
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g.) Taping dimension
Cover-tape
Leader
Carrier-tape
Cover-tape
Terminal
Carrier-tape
Terminal
The length of cover-tape in the leader is more than 400 mm including empty
embossed area.
After all products were packaged, must remain more than twenty pieces or
400 mm empty area, which should be sealed by cover-tape.
The tip of cover-tape shall be fixed temporary by paper tape and roll around
the core of reel one round.
The empty embossed area which are sealed by top cover-tape must remain
more the 40 mm.
Components
Leader
Emptv compartments
Emptv compartments
Top cover-tape
Embossed Carrier-tape
h.) Joint of tape
The carrier-tape and top cover-tape should not be jointed.
i.) Release strength of cover tape
It has to between 0.1N to 0.7N under following condition.
Pulling direction 165° to 180°
Speed
300mm/min.
Otherwise unless specified.
165°~ 180°
Pulling direction
Other standards shall be based on JIS C 0806-1990.
Country of origin
Tittle HSX221SR
QUARTZ CRYSTAL SPECIFICATION
Date
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2014/02/21 F. S. TSAI
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j.) Package
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Tittle HSX221SR
QUARTZ CRYSTAL SPECIFICATION
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5. Mechanical Performance
Item
Test Methods
Specifications
Code
1
2
Natural Drop
Vibration
A
3
Sealing Tightness
4
Solderability
Dropping from 120 cm height 3 times on Concrete floor
Frequency 10-55Hz, Sine Wave full amplitude of 0.8mm to X, Y and Z
3 axes, Duration of 2 hours to each axis.
Leak Rate 1.0x10-8 Pa-m3/sec. Max. Measured by Helium leak
detector. – Fine Leakage.
After applying ROSIN Flux, dipping in solder bath at
245deg.C+/-5deg.C for 3+/-0.5 sec.
6.
2
3
4
B
Specifications
Code
Test Methods
Humidity
Temperature 60℃+/-2℃,RH 90~95%, Duration of 240 hours.
Back to room temperature first, then in 1~2 hours, the component shall
be checked.
-40deg.C +/-2deg.C, Duration of 240 hours.
Back to the room temperature first, then in 1~2 hours, the component
shall be checked.
+85deg.C +/-2deg.C, Duration of 240 hours.
Back to the room temperature first, then in 1~2 hours, the component
shall be checked.
-40deg.C +/-2deg.C (30min) +85deg.C +/-2deg.C (30min) 25
cycles. Back to the room temperature first, then in 1~2 hours, the
component shall be checked.
Storage in Low
Temperature
Storage in High
Temperature
Temperature cycles
A
A
A
A
Specifications code
Specifications
A
Frequency variation shall be within +/-5ppm and equivalent resistance shall be within
the specification after the test
More than 90% of lead shall be covered by new solder.
B
Country of origin
Tittle HSX221SR
QUARTZ CRYSTAL SPECIFICATION
Date
---
Environment Performance
Item
1
A
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7. Supplement
7.1.Soldering
7.2.Please stay with our proposed reflow condition and do then soldering 2 times max.
Available for Lead Free Soldering
Temperature
260 deg.C
220 deg.C
(3)
160~180deg.C
(2)
(1)
Time
(1) Preheat
160~180 deg.C 120sec.
(2) Primary heat 220
deg.C 60sec.
(3) Peak
260
deg.C 10sec. Max.
7.3.Land pattern layout(Example)
7.4.Solder iron (Example)
Bit temp.:350℃max.,Time:3sec max. ,Each terminal solder a 1 time max.
Country of origin
Tittle HSX221SR
QUARTZ CRYSTAL SPECIFICATION
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7.5.Mounting
This component is designed for automatic insertion.
However, you are requested to do the trial with your insertion machine in order to be sure
of proper operation and no damage of component.
Please pay attention to board warp which may damage the component and cause Soldering
Process.
7.6.Cleaning
Cleaning liquid which corrodes Nickel shall not be used
It may cause the problem on the surface, color, marking etc.
Ultra-sonic cleaning is possible, however, you are requested to check on your board.
Because we only checked as single unit.
7.7.Storage
Please keep away from high temperature and high humidity ,which may cause put solderbility. No
direct Sunlight, No dew as well.
Country of origin
Tittle HSX221SR
QUARTZ CRYSTAL SPECIFICATION
Date
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2014/02/21 F. S. TSAI
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8. Flow Chart
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Tittle HSX221SR
QUARTZ CRYSTAL SPECIFICATION
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REV.
\
No.
DATE
REASON
0
1
2012/12/17
2014/02/21
New
CONTENTS
新增 page4.
20.Note:
▪
S curve (fL) 3rd order curve fitting coefficient requirement
over operation temperature under per 2 ℃ test [f (T) =
C3*(T-T0)^3 + C2*(T-T0)^2 + C1*(T-T0) + C0 ; T0 = 25 ℃]
–
1st order coefficient : -0.1 ~ -0.35
– 2nd order coefficient : -0.0005 ~ -0.0012
–
3rd order coefficient : 0.000087 ~ 0.00011
▪
Freq. slope error between measured S curve (fL) data and 3rd
order curve fitting data over operation temperature under per 2
℃ test
–
-10 ℃ ~ 60 ℃ : ±0.05ppm
–
-30 ℃ ~ 85 ℃ : ±0.1ppm
▪
Freq. perturbation : within ± 0.5 ppm
–
Residual error from the freq. vs. temperature curve
fit 3rd order. Min. of 1 freq. reading per 2 degree C over
operation temperature
▪
Full cycle temperature hysteresis : 0.5ppm Max.
–
Difference in freq. measurement at any temperature
when undergoing a thermal cycle over the entire operation
temperature range from -40℃ to 85℃ for per 2 degree
test
▪
Small cycle temperature hysteresis : 0.05ppm Max.
–
Difference in freq. measurement at any temperature
when undergoing a thermal cycle of a temperature range
of 5℃ for per 1 degree test
Country of origin
Tittle HSX221SR
QUARTZ CRYSTAL SPECIFICATION
Date
Confirm
2014/02/21 F. S. TSAI
Spec. No.
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