SLESDL0402-24

SLESDL0402-24 Transient Voltage Suppressors for ESD Protection 0402 ϩ)HDWXUHV ■ ■ ■ ■ ■ ■ ■ ■ 0402inch/ 1005mm foot print Ideal ESD protection for high frequency, low voltage applications. Exceeds testing requirements outlined in IEC 61000-4-2 Ultra low capacitance (1.5pF typ.) Very low leakage current Fast response time Bi-directional MSL 3 Package Dimension ϩ$SSOLFDWLRQV ■ ■ ϩ0HFKDQLFDO 'DWD High Speed Data Ports ( USB 2.0, IEEE 1394 ) Computers & Peripherals ( Cell phone, PDA, HDTV, DVD players ) ϩ6FKHPDWLF 3,1 &RQILJXUDWLRQ www.slkormicro.com 1 ■ Surface mount ■ RoHS Compliant SLESDL0402-24 ϩ$EVROXWH 0D[LPXP 5DWLQJ Rating Symbol Value Units VESD 8 15 kV Lead Soldering Temperature TL 260(10seconds) ℃ Operating Temperature TO -55 to + 125 ℃ Storage Temperature Tstg -40 to + 125 ℃ ESD per IEC 61000-4-2 (Air) ESD per IEC 61000-4-2 (Contact) Conditions ϩ(OHFWULFDO &KDUDFWHULVWLFV Parameter Symbol Conditions Min Typical Continuous Operating Voltage VDC Trigger Voltage VT IEC61000-4-2 8KV contact discharge Leakage Current IL VDC=5V,T=25 ℃ Clamping Voltage VC IEC61000-4-2 8KV contact discharge 65 Capacitance CP Measured at 10MHz 1.5 ESD Pulse Withstand www.slkormicro.com Pulses Max 24 IEC61000-4-2 8KV contact discharge 2 140 1000 Units V V 500 nA 100 V pF SLESDL0402-24 ϩESD Wave From ϩ(OHFWULFDO &KDUDFWHULVWLFV IPP 100% 90% SEVERITY LEVEL AIR DIRCHARGE DIRECT DISCHARGE 1 2KV 2KV 2 4KV 4KV 3 8KV 6KV 4 15KV 8KV IEC61000-4-2 compliant ESD current pulse waveform 10% tr = 0.7 ns to 1ns t 30 ns 60 ns ϩEnvironment Reliability Test Characteristic Test Method and Description High Temperature Storage The specimen shall be subjected to 125±2℃ for 1000±2 hours without load and then stored at room temperature and normal humidity for one or two hours. The change of varistor voltage shall be within 10%. Temperature Cycle The temperature cycle of specified temperature shall be repeated five times and then stored at room temperature and normal humidity for one or two hours. The change of varistor voltage shall be within 10% and mechanical damage shall be examined. High Temperature Load Damp Heat Load/ Humidity Load Low Temperature Storage www.slkormicro.com Step Temperature Period 1 -40±3℃ 30±3min 2 room temperature 1 hour 3 125±3℃ 30±3min 4 room temperature 1 hour After being continuously applied the maximum allowable voltage at 85±2℃ for 1000±2 hours, the specimen shall be stored at room temperature and normal humidity for one or two hours. The change of varistor voltage shall be within 10%. The specimen should be subjected to 40±2℃ and 90~95% RH, the maximum allowable voltage applied for 1000±2 hours and then stored at room temperature and normal humidity for one or two hours. The change of varistor voltage shall be within 10%. The specimen should be subjected to -40±2℃ for 1000±2 hours without load and then stored at room temperature and normal humidity for one or two hours. The change of varistor voltage shall be within 10%. 3 SLESDL0402-24 ϩSoldering Parameters Temperature ( ℃ ) Peak Temp 260℃(3~10sec) 250 225 Peak Temp 245 ℃ (10~20sec) 200 175 150 125 100 Pre-Heat 175 ℃ (60~120sec) 75 25 01:00:00 02:00:00 03:00:00 04:00:00 Time (min) ☆ IR reflow Pb free process suggestion profile (1) The solder recommend is Sn96.5/Ag3.5 and thickness recommend as shown in table 5.3 (2) Ramp-up rate (217℃ to peak) +3℃/second max. (3) Temp. maintain at 175±25℃ 180 seconds max. (4) Temp. maintain above 217℃ 60~150 seconds www.slkormicro.com 4