PHOTONIC
DETECTORS INC.
High-Power GaAs Infrared Emitter chip
Peak Wavelength 940 nm,Type PDI-E900
PACKAGE DIMENSIONS inch (mm)
0.013 [0.33] SQ
Ø0.005 [Ø0.13]
BOND PAD
CATHODE
GOLD CONTACT
CATHODE
0.008 [0.20]
GOLD CONTACT
ANODE
FORWARD CURRENT, IF (mA)
940
50
30
0.8
0.8
MAX
1.50
960
980
UNITS
mW
V
V
nm
nm
pF
µS
mS
1.0
0.1
2.0
80
100
60
0
1.2
1.30
10
1.8
20
5
920
1.6
40
1
100
1.4
60
40
0
FORWARD CURRENT vs
FORWARD VOLTAGE
1.2
80
0
20
1000
1.0
100
20
RELATIVE POWER , PO (%)
POWER OUTPUT vs
FORWARD CURRENT
IF = 20 mA
IF = 100 mA
IF = 10 µ A
IF = 100 mA
IF = 100 mA
V R = 0 V,f = 1 MHz
IF = 100 mA
IF = 100 mA
0.8
Ct
tr
tf
IF - FORWARD CURRENT (mA)
Output Power
Forward Voltage
Reverse Breakdown Voltage
Peak Wavelength
Spectral Halfwidth
Terminal Capacitance
Rise Time
Fall Time
λP
D
Dλ
40
WAVELENGTH, λ (nm)
ELECTRO-OPTICAL CHARACTERISTICS (TA=25OC unless otherwise noted)
SYMBOL CHARACTERISTIC
TEST CONDITIONS
MIN
TYP
PO
VF
VR
60
1000
*1/16 inch from case for 3 secs max
80
960
-65
mW
mA
A
V
o
C
o
C
940
160
100
2.5
5
+125
N/A
920
Power Dissipation
Continuous Forward Current
Peak Forward Current (10µs, 10Hz)
Reverse voltage
Storage & Operating Temperature
Soldering Temperature*
SPECTRAL OUTPUT
100
900
Pd
IFP
IFP
VR
To & Ts
TS
APPLICATIONS
Photoelectric switches
Optical encoders
Infrared sources
RELATIVE POWER OUTPUT (%)
DESCRIPTION: The PDI-E900 infrared emitting
FEATURES
High output power diode uses high reliability liquid phase epitaxially
grown GaAs. They are optimized for high power, high
High reliablity
efficiency, and low degradation.
Low degradation
ABSOLUTE MAXIMUM RATING (TA=25OC unless otherwise noted)
SYMBOL
PARAMETER
MIN
MAX
UNITS
V F - FORWARD VOLTAGE - (V)
Information in this technical data sheet is believed to be correct and reliable. However, no responsibility is assumed for possible inaccuracies or omission. Specifications
are subject to change without notice. Optical power and radiant intensity measured using uncapped dimpled TO-46 into integrating sphere.
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