DISCRETE SEMICONDUCTORS
DATA SHEET
BUJ103AX
Silicon Diffused Power Transistor
Product specification
August 2018
WeEn Semiconductors
Product specification
Silicon Diffused Power Transistor
BUJ103AX
GENERAL DESCRIPTION
High-voltage, high-speed planar-passivated npn power switching transistor in a plastic full-pack envelope intended
for use in high frequency electronic lighting ballast applications, converters, inverters, switching regulators, motor
control systems, etc.
QUICK REFERENCE DATA
SYMBOL
PARAMETER
CONDITIONS
TYP.
MAX.
UNIT
VCESM
VCBO
VCEO
IC
ICM
Ptot
VCEsat
hFEsat
tf
Collector-emitter voltage peak value
Collector-Base voltage (open emitter)
Collector-emitter voltage (open base)
Collector current (DC)
Collector current peak value
Total power dissipation
Collector-emitter saturation voltage
DC current gain
Fall time
VBE = 0 V
0.25
12.5
33
700
700
400
4
8
26
1.0
80
V
V
V
A
A
W
V
ns
MIN.
MAX.
UNIT
-65
-
700
400
700
4
8
2
4
26
150
150
V
V
V
A
A
A
A
W
˚C
˚C
TYP.
MAX.
UNIT
-
4.8
K/W
55
-
K/W
PINNING - SOT186A
PIN
base
2
collector
3
emitter
IC = 3 A; VCE = 5 V
Ic=2A,IB1=0.4A
PIN CONFIGURATION
DESCRIPTION
1
Ths ≤ 25 ˚C
SYMBOL
mb
2
1
3
mb isolated
1 2 3
LIMITING VALUES
Limiting values in accordance with the Absolute Maximum Rating System (IEC 134)
SYMBOL
PARAMETER
CONDITIONS
VCESM
VCEO
VCBO
IC
ICM
IB
IBM
Ptot
Tstg
Tj
Collector to emitter voltage
Collector to emitter voltage (open base)
Collector to base voltage (open emitter)
Collector current (DC)
Collector current peak value
Base current (DC)
Base current peak value
Total power dissipation
Storage temperature
Junction temperature
VBE = 0 V
Ths ≤ 25 ˚C
THERMAL RESISTANCES
SYMBOL
PARAMETER
CONDITIONS
Rth j-hs
Junction to heatsink
with heatsink compound
Rth j-a
Junction to ambient
in free air
August 2018
1
Rev 1.100
WeEn Semiconductors
Product specification
Silicon Diffused Power Transistor
BUJ103AX
ISOLATION LIMITING VALUE & CHARACTERISTIC
Ths = 25 ˚C unless otherwise specified
SYMBOL
PARAMETER
CONDITIONS
Visol
R.M.S. isolation voltage from all
three terminals to external
heatsink
f = 50-60 Hz; sinusoidal
waveform;
R.H. ≤ 65% ; clean and dustfree
Cisol
Capacitance from T2 to external f = 1 MHz
heatsink
MIN.
TYP.
-
MAX.
UNIT
2500
V
-
10
-
pF
MIN.
TYP.
MAX.
UNIT
VBE = 0 V; VCE = VCESMmax
VBE = 0 V; VCE = VCESMmax;
Tj = 125 ˚C
-
-
1.0
2.0
mA
mA
-
-
0.1
0.1
mA
mA
400
-
0.1
-
mA
V
10
12
13.5
-
0.25
0.97
17
20
16
12.5
1.0
1.5
32
32
20
-
V
V
TYP.
MAX.
UNIT
0.52
2.7
0.3
0.6
3.2
0.43
µs
µs
µs
1.2
33
1.33
80
µs
ns
-
1.8
200
µs
ns
STATIC CHARACTERISTICS
Ths = 25 ˚C unless otherwise specified
SYMBOL
PARAMETER
CONDITIONS
1
ICES
ICES
Collector cut-off current
ICBO
ICEO
Collector cut-off current 1
VCBO = VCESMmax(700V)
VCEO = VCEOMmax(400V)
IEBO
VCEOsust
Emitter cut-off current
Collector-emitter sustaining voltage
VCEsat
VBEsat
hFE
hFE
hFEsat
Collector-emitter saturation voltage
Base-emitter saturation voltage
DC current gain
VEB = 7 V; IC = 0 A
IB = 0 A; IC = 10 mA;
L = 25 mH
IC = 3.0 A; IB = 0.6 A
IC = 3.0 A; IB = 0.6 A
IC = 1 mA; VCE = 5 V
IC = 0.5 A; VCE = 5 V
IC = 2 A; VCE = 5 V
IC = 3 A; VCE = 5 V
DC current gain
DYNAMIC CHARACTERISTICS
Ths = 25 ˚C unless otherwise specified
SYMBOL
ton
ts
tf
PARAMETER
CONDITIONS
Switching times (resistive load)
ICon = 2.5 A; IBon = -IBoff = 0.5 A;
RL = 75 ohms; VBB2 = 4 V;
Turn-on time
Turn-off storage time
Turn-off fall time
Switching times (inductive load)
ts
tf
Turn-off storage time
Turn-off fall time
Switching times (inductive load)
ts
tf
Turn-off storage time
Turn-off fall time
ICon = 2 A; IBon = 0.4 A; LB = 1 µH;
-VBB = 5 V
ICon = 2 A; IBon = 0.4 A; LB = 1 µH;
-VBB = 5 V; Tj = 100 ˚C
1 Measured with half sine-wave voltage (curve tracer).
August 2018
2
Rev 1.100
WeEn Semiconductors
Product specification
Silicon Diffused Power Transistor
BUJ103AX
ICon
90 %
+ 50v
100-200R
90 %
IC
10 %
Horizontal
ts
ton
IBon
IB
Vertical
tf
toff
Oscilloscope
10 %
300R
1R
tr
6V
30-60 Hz
30ns
-IBoff
Fig.1. Test circuit for VCEOsust.
Fig.4. Switching times waveforms with resistive load.
VCC
IC / mA
LC
250
200
IBon
LB
100
T.U.T.
-VBB
0
min
VCE / V
VCEOsust
Fig.2. Oscilloscope display for VCEOsust.
Fig.5. Test circuit inductive load.
VCC = 300 V; -VBE = 5 V; LC = 200 uH; LB = 1 uH
VCC
ICon
90 %
IC
RL
VIM
RB
0
10 %
T.U.T.
ts
toff
tp
IB
tf
t
IBon
T
t
-IBoff
Fig.6. Switching times waveforms with inductive load.
Fig.3. Test circuit resistive load. VIM = -6 to +8 V
VCC = 250 V; tp = 20 µs; δ = tp / T = 0.01.
RB and RL calculated from ICon and IBon requirements.
August 2018
3
Rev 1.100
WeEn Semiconductors
Product specification
Silicon Diffused Power Transistor
120
110
BUJ103AX
Normalised Derating
%
with heatsink compound
VBEsat/V
100
1.4
90
1.2
80
70
1.0
60
0.8
P tot
50
40
0.6
30
0.4
20
10
0.2
0
0
20
40
60
80
Ths / C
100
120
0.0
140
0.1
Fig.7. Normalised power dissipation.
PD% = 100⋅PD/PD 25˚C = f (Ths)
100
1
IC/A
10
Fig.10. Base-Emitter saturation voltage.
Solid lines = typ values, VBEsat = f(IC); at IC/IB =4.
h FE
VCEsat/V
5V
0.5
0.4
10
0.3
0.2
Tj = 25 C
1V
0.1
1
0.01
0.1
1
10
0.0
IC / A
0.1
Fig.8. Typical DC current gain. hFE = f(IC)
parameter VCE
1
IC/A
10
Fig.11. Collector-Emitter saturation voltage.
Solid lines = typ values, VCEsat = f(IC); at IC/IB =4.
VCEsat/V
10
2.0
Zth / (K/W)
BU1706AX
0.5
1.6
IC=1A
2A
3A
4A
1
0.2
0.1
0.05
0.1
0.02
1.2
0.8
PD
0.4
0.10
1.00
10.00
0.001
IB/A
Fig.9. Collector-Emitter saturation voltage.
Solid lines = typ values, VCEsat = f(IB); Tj=25˚C.
August 2018
D=
tp
T
0.01
D=0
0.0
0.01
tp
1u
t
T
10u 100u 1m 10m 100m
t/s
1
10
100
Fig.12. Transient thermal impedance.
Zth j-hs = f(t); parameter D = tp/T
4
Rev 1.100
WeEn Semiconductors
Product specification
Silicon Diffused Power Transistor
BUJ103AX
IC (A)
IC (A)
9
100
8
7
Duty Cycle = 0.01
6
10
5
Icm max
4
Ic max
tp =
20us
II
3
(1)
1
2
50us
100us
1
0
200us
0
100
200
300
400
500
600
700
800
900
VCEclamp (V)
I
0.1
Fig.13. Reverse bias safe operating area. Tj ≤ Tj max
500us
1ms
2ms
(2)
DC
III
0.01
VCC
0.001
1
10
100
1,000
VCEclamp (V)
LC
Fig.15. Forward bias safe operating area. Ths ≤ 25 ˚C
IBon
-VBB
VCL
LB
(1)
(2)
I
II
III
T.U.T.
NB:
Fig.14. Test circuit for reverse bias
safe operating area.
Vcl ≤ 1000V; Vcc = 150V; VBB = -5V; LB = 1µH;
Lc = 200µH
August 2018
5
Ptot max and Ptot peak max lines.
Second breakdown limits.
Region of permissible DC operation.
Extension for repetitive pulse operation.
Extension during turn-on in single
transistor converters provided that
RBE ≤ 100 Ω and tp ≤ 0.6 µs.
Mounted with heatsink compound and
30 ± 5 newton force on the centre of the
envelope.
Rev 1.100
WeEn Semiconductors
Product specification
Silicon Diffused Power Transistor
BUJ103AX
MECHANICAL DATA
August 2018
6
Rev 1.100
WeEn Semiconductors
Legal information
Data sheet status
Document
status [1][2]
Product
status [3]
Objective
[short] data
sheet
Development This document contains data from
the objective specification for product
development.
Preliminary
[short] data
sheet
Qualification
This document contains data from the
preliminary specification.
Product
[short] data
sheet
Production
This document contains the product
specification.
[1]
[2]
[3]
Definition
Please consult the most recently issued document before initiating or
completing a design.
The term 'short data sheet' is explained in section "Definitions".
The product status of device(s) described in this document may have
changed since this document was published and may differ in case of
multiple devices. The latest product status information is available on
the Internet at URL http://www.ween-semi.com.
Definitions
Draft — The document is a draft version only. The content is still under
internal review and subject to formal approval, which may result in
modifications or additions. WeEn Semiconductors does not give any
representations or warranties as to the accuracy or completeness of
information included herein and shall have no liability for the consequences
of use of such information.
Short data sheet — A short data sheet is an extract from a full data sheet
with the same product type number(s and title. A short data sheet is
intended for quick reference only and should not be relied upon to contain
detailed and full information. For detailed and full information see the
relevant full data sheet, which is available on request via the local WeEn
Semiconductors sales office. In case of any inconsistency or conflict with the
short data sheet, the full data sheet shall prevail.
Product specification — The information and data provided in a Product
data sheet shall define the specification of the product as agreed between
WeEn Semiconductors and its customer, unless WeEn Semiconductors and
customer have explicitly agreed otherwise in writing. In no event however,
shall an agreement be valid in which the WeEn Semiconductors product
is deemed to offer functions and qualities beyond those described in the
Product data sheet.
Disclaimers
Limited warranty and liability — Information in this document is believed to
be accurate and reliable. However, WeEn Semiconductors does not
give any representations or warranties, expressed or implied, as to the
accuracy or completeness of such information and shall have no liability for
the consequences of use of such information. WeEn Semiconductors takes
no responsibility for the content in this document if provided by an information
source outside of WeEn Semiconductors.
In no event shall WeEn Semiconductors be liable for any indirect, incidental,
punitive, special or consequential damages (including - without limitation lost profits, lost savings, business interruption, costs related to the removal
or replacement of any products or rework charges whether or not such
damages are based on tort (including negligence, warranty, breach of
contract or any other legal theory.
Notwithstanding any damages that customer might incur for any reason
whatsoever, WeEn Semiconductors’ aggregate and cumulative liability
towards customer for the products described herein shall be limited in
accordance with the Terms and conditions of commercial sale of WeEn
Semiconductors.
Right to make changes — WeEn Semiconductors reserves the right to
make changes to information published in this document, including without
limitation specifications and product descriptions, at any time and without
notice. This document supersedes and replaces all information supplied prior
to the publication hereof.
Suitability for use — WeEn Semiconductors products are not designed,
authorized or warranted to be suitable for use in life support, life-critical
or safety-critical systems or equipment, nor in applications where failure
or malfunction of an WeEn Semiconductors product can reasonably
be expected to result in personal injury, death or severe property or
environmental damage. WeEn Semiconductors and its suppliers accept no
liability for inclusion and/or use of WeEn Semiconductors products in such
equipment or applications and therefore such inclusion and/or use is at the
customer’s own risk.
Quick reference data — The Quick reference data is an extract of the
product data given in the Limiting values and Characteristics sections of this
document, and as such is not complete, exhaustive or legally binding.
Applications — Applications that are described herein for any of these
products are for illustrative purposes only. WeEn Semiconductors makes
no representation or warranty that such applications will be suitable for the
specified use without further testing or modification.
Customers are responsible for the design and operation of their applications
and products using WeEn Semiconductors products, and WeEn
Semiconductors accepts no liability for any assistance with applications or
customer product design. It is customer’s sole responsibility to determine
whether the WeEn Semiconductors product is suitable and fit for the
customer’s applications and products planned, as well as for the planned
application and use of customer’s third party customer(s). Customers should
provide appropriate design and operating safeguards to minimize the risks
associated with their applications and products.
WeEn Semiconductors does not accept any liability related to any default,
damage, costs or problem which is based on any weakness or default
in the customer’s applications or products, or the application or use by
customer’s third party customer(s). Customer is responsible for doing all
necessary testing for the customer’s applications and products using WeEn
Semiconductors products in order to avoid a default of the applications
and the products or of the application or use by customer’s third party
customer(s). WeEn does not accept any liability in this respect.
Limiting values — Stress above one or more limiting values (as defined in
the Absolute Maximum Ratings System of IEC 60134) will cause permanent
damage to the device. Limiting values are stress ratings only and (proper)
operation of the device at these or any other conditions above those
given in the Recommended operating conditions section (if present) or the
Characteristics sections of this document is not warranted. Constant or
repeated exposure to limiting values will permanently and irreversibly affect
the quality and reliability of the device.
No offer to sell or license — Nothing in this document may be interpreted
or construed as an offer to sell products that is open for acceptance or the
grant, conveyance or implication of any license under any copyrights, patents
or other industrial or intellectual property rights.
Export control — This document as well as the item(s) described herein
may be subject to export control regulations. Export might require a prior
authorization from competent authorities.
Non-automotive qualified products — Unless this data sheet expressly
states that this specific WeEn Semiconductors product is automotive
qualified, the product is not suitable for automotive use. It is neither qualified
nor tested in accordance with automotive testing or application requirements.
WeEn Semiconductors accepts no liability for inclusion and/or use of nonautomotive qualified products in automotive equipment or applications.
In the event that customer uses the product for design-in and use in
automotive applications to automotive specifications and standards,
customer (a) shall use the product without WeEn Semiconductors’ warranty
of the product for such automotive applications, use and specifications, and
(b) whenever customer uses the product for automotive applications beyond
WeEn Semiconductors’ specifications such use shall be solely at customer’s
own risk, and (c) customer fully indemnifies WeEn Semiconductors for
any liability, damages or failed product claims resulting from customer
design and use of the product for automotive applications beyond WeEn
Semiconductors’ standard warranty and WeEn Semiconductors’ product
specifications.
WeEn Semiconductors
Translations — A non-English (translated version of a document is for
reference only. The English version shall prevail in case of any discrepancy
between the translated and English versions.
Trademarks
Notice: All referenced brands, product names, service names and
trademarks are the property of their respective owners.