DISCRETE SEMICONDUCTORS
DATA SHEET
BTH151S-650R
Thyristor
High Repetitive Surge
Product specification
March 2001
WeEn Semiconductors
Product specification
Thyristor
High Repetitive Surge
BTH151S-650R
QUICK REFERENCE DATA
GENERAL DESCRIPTION
Passivated thyristor in a plastic envelope,
suitable for surface mounting, intended for
use in applications requiring high
bidirectional blocking voltage capability and
high thermal cycling performance. This
thyristor has a high repetitive surge
specification which makes it suitable for
applications where high inrush currents or
stall currents are likely to occur on a
repetitive basis.
PINNING - SOT428
PIN
cathode
2
anode
3
gate
tab
VDRM, VRRM
IT(AV)
IT(RMS)
ITSM
ITRM
PARAMETER
Repetitive peak off-state
voltages
Average on-state current
RMS on-state current
Non-repetitive peak on-state current
Repetitive peak on-state current
PIN CONFIGURATION
DESCRIPTION
1
SYMBOL
anode
MAX.
UNIT
650
7.5
12
110
60
V
A
A
A
A
SYMBOL
tab
a
k
g
DPAK (SOT428)
LIMITING VALUES
Limiting values in accordance with the Absolute Maximum System (IEC 134).
SYMBOL
PARAMETER
CONDITIONS
MIN.
VDRM,
VRRM
Repetitive peak off-state
voltages
half sine wave;
-
IT(AV)
Average on-state current
Tmb ≤ 103 ˚C
IT(RMS)
ITSM
RMS on-state current
Non-repetitive peak
on-state current
all conduction angles
half sine wave; Tj = 25 ˚C prior to
surge
t = 10 ms
t = 8.3 ms
t = 10ms, τ = 3s, Tmb ≤ 45˚C, no.
of surges = 100k
t = 10 ms
ITM = 20 A; IG = 50 mA;
dIG/dt = 50 mA/μs
ITRM
I2t
dIT/dt
IGM
VGM
VRGM
PGM
PG(AV)
Tstg
Tj
Repetitive peak on-state
current
I2t for fusing
Repetitive rate of rise of
on-state current after
triggering
Peak gate current
Peak gate voltage
Peak reverse gate voltage
Peak gate power
Average gate power
over any 20 ms period
Storage temperature
Operating junction
temperature
MAX.
1
UNIT
650
V
-
7.5
12
A
A
-
110
121
60
A
A
A
-
61
50
A2s
A/μs
-40
-
2
5
5
5
0.5
150
125
A
V
V
W
W
˚C
˚C
1 Although not recommended, off-state voltages up to 800V may be applied without damage, but the thyristor may
switch to the on-state. The rate of rise of current should not exceed 15 A/μs.
March 2001
1
Rev 1.200
WeEn Semiconductors
Product specification
Thyristor
High Repetitive Surge
BTH151S-650R
THERMAL RESISTANCES
SYMBOL
PARAMETER
CONDITIONS
MIN.
TYP.
MAX.
UNIT
Rth j-mb
Thermal resistance
junction to mounting base
Thermal resistance
pcb (FR4) mounted; footprint as in Fig.14
junction to ambient
-
-
1.8
K/W
-
75
-
K/W
Rth j-a
STATIC CHARACTERISTICS
Tj = 25 ˚C unless otherwise stated
SYMBOL
PARAMETER
CONDITIONS
MIN.
TYP.
MAX.
UNIT
IGT
IL
IH
VT
VGT
Gate trigger current
Latching current
Holding current
On-state voltage
Gate trigger voltage
ID, IR
Off-state leakage current
VD = 12 V; IT = 0.1 A
VD = 12 V; IGT = 0.1 A
VD = 12 V; IGT = 0.1 A
IT = 23 A
VD = 12 V; IT = 0.1 A
VD = VDRM(max); IT = 0.1 A; Tj = 125 ˚C
VD = VDRM(max); VR = VRRM(max); Tj = 125 ˚C
0.25
-
2
10
7
1.4
0.6
0.4
0.1
15
40
20
1.75
1.5
0.5
mA
mA
mA
V
V
V
mA
MIN.
TYP.
MAX.
UNIT
50
200
-
130
1000
2
-
V/μs
V/μs
μs
-
70
-
μs
DYNAMIC CHARACTERISTICS
Tj = 25 ˚C unless otherwise stated
SYMBOL
PARAMETER
CONDITIONS
dVD/dt
Critical rate of rise of
off-state voltage
VDM = 67% VDRM(max); Tj = 125 ˚C;
exponential waveform;
Gate open circuit
RGK = 100 Ω
ITM = 40 A; VD = VDRM(max); IG = 0.1 A;
dIG/dt = 5 A/μs
VD = 67% VDRM(max); Tj = 125 ˚C;
ITM = 20 A; VR = 25 V; dITM/dt = 30 A/μs;
dVD/dt = 50 V/μs; RGK = 100 Ω
tgt
Gate controlled turn-on
time
Circuit commutated
turn-off time
tq
Ip = 60 A
10ms
3 s (Minimum)
Fig.1. Repetitive surge conditions. IP=60A (f=50Hz) at Tc=45˚C. Maximum number of cycles n=100k. Repetitive
cycle T=3 seconds minimum.
March 2001
2
Rev 1.200
WeEn Semiconductors
Product specification
Thyristor
High Repetitive Surge
BTH151S-650R
15
Ptot / W
Tmb(max) / C
conduction
angle
degrees
30
60
90
120
180
10
form
factor
120
98
100
time
T
Tj initial = 25 C max
1.9
2.2
107
2.8
ITSM
IT
a = 1.57
a
4
2.8
2.2
1.9
1.57
ITSM / A
80
4
60
116
5
40
20
0
0
1
2
3
4
5
IF(AV) / A
6
7
125
8
0
10
100
Number of half cycles at 50Hz
1
1000
Fig.5. Maximum permissible non-repetitive peak
on-state current ITSM, versus number of cycles, for
sinusoidal currents, f = 50 Hz.
Fig.2. Maximum on-state dissipation, Ptot, versus
average on-state current, IT(AV), where
a = form factor = IT(RMS)/ IT(AV).
1000
1
25
ITSM / A
IT(RMS) / A
20
15
dI T /dt limit
100
10
I TSM
IT
5
time
T
Tj initial = 25 C max
10
10us
100us
0
0.01
10ms
1ms
0.1
1
surge duration / s
T/s
Fig.6. Maximum permissible repetitive rms on-state
current IT(RMS), versus surge duration, for sinusoidal
currents, f = 50 Hz; Tmb ≤ 103˚C.
Fig.3. Maximum permissible rms current IT(RMS) ,
versus mounting base temperature Tmb.
15
10
IT(RMS) / A
1.6
VGT(Tj)
VGT(25 C)
103 C
1.4
10
1.2
1
5
0.8
0.6
0
-50
0
50
Tmb / C
100
0.4
-50
150
Fig.4. Maximum permissible rms current IT(RMS) ,
versus mounting base temperature Tmb.
March 2001
0
50
Tj / C
100
150
Fig.7. Normalised gate trigger voltage
VGT(Tj)/ VGT(25˚C), versus junction temperature Tj.
3
Rev 1.200
WeEn Semiconductors
Product specification
Thyristor
High Repetitive Surge
BTH151S-650R
3
IGT(Tj)
IGT(25 C)
30
IT / A
Tj = 125 C
Tj = 25 C
25
2.5
Vo = 1.06 V
Rs = 0.0304 ohms
2
max
15
1.5
1
10
0.5
5
0
-50
0
50
Tj / C
100
0
150
IL(Tj)
IL(25 C)
0
0.5
1
VT / V
1.5
2
Fig.11. Typical and maximum on-state characteristic.
Fig.8. Normalised gate trigger current
IGT(Tj)/ IGT(25˚C), versus junction temperature Tj.
3
typ
20
10
BT145
2.5
Zth j-mb (K/W)
1
2
0.1
1.5
P
D
1
tp
0.01
0.5
t
0
-50
0
50
Tj / C
100
0.001
10us
150
1ms
10ms
tp / s
0.1s
1s
10s
Fig.12. Transient thermal impedance Zth j-mb, versus
pulse width tp.
Fig.9. Normalised latching current IL(Tj)/ IL(25˚C),
versus junction temperature Tj.
3
0.1ms
IH(Tj)
IH(25 C)
10000
dVD/dt (V/us)
2.5
1000
2
RGK = 100 Ohms
1.5
100
1
gate open circuit
0.5
0
-50
0
50
Tj / C
100
10
150
50
100
150
Tj / C
Fig.10. Normalised holding current IH(Tj)/ IH(25˚C),
versus junction temperature Tj.
March 2001
0
Fig.13. Typical, critical rate of rise of off-state voltage,
dVD/dt versus junction temperature Tj.
4
Rev 1.200
WeEn Semiconductors
Product specification
Thyristor
High Repetitive Surge
BTH151S-650R
MECHANICAL DATA
March 2001
5
Rev 1.200
WeEn Semiconductors
Legal information
Data sheet status
Document
status [1][2]
Product
status [3]
Objective
[short] data
sheet
Development This document contains data from
the objective specification for product
development.
Preliminary
[short] data
sheet
Qualification
This document contains data from the
preliminary specification.
Product
[short] data
sheet
Production
This document contains the product
specification.
[1]
[2]
[3]
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