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AP-CF256MR9NS-NRA

AP-CF256MR9NS-NRA

  • 厂商:

    APACERMEMORYAMERICA(宇瞻科技)

  • 封装:

    -

  • 描述:

    MEM CARD COMPACTFLASH 256MB SLC

  • 数据手册
  • 价格&库存
AP-CF256MR9NS-NRA 数据手册
Halogen-free CompactFlash Series 5 Specifications for Industrial CompactFlash Card December 4th, 2013 Version 1.3 Apacer Technology Inc. 1F, No.32, Zhongcheng Rd., Tucheng Dist., New Taipei City, Taiwan, R.O.C Tel: +886-2-2267-8000 www.apacer.com Fax: +886-2-2267-2261 Compact Flash 5 series AP-CFxxxxRXXS-XXXXXXA Features:  CompactFlash Association Specification Revision 4.1 Standard Interface – 512 bytes per sector – ATA command set compatible – ATA transfer mode supports: PIO Mode 6 Multiword DMA Mode 4 Ultra DMA Mode 5 PCMCIA UDMA Mode 5  –  – –  Temperature ranges 0°C to 70°C for operation (Standard) -40°C to 85°C for operation (Extended) -40°C to 100°C for storage – – Operating voltage 3.3 V 5.0 V – – Power consumption (typical)** Active mode: 175 mA Standby mode: 3 mA – Connector Type 50 pins female – Physical Dimensions 36.4mm x 42.8mm x 3.3mm – – – – – – – – – – Endurance (TBW: Terabytes Written) 128 MB: 0.5 TBW 256 MB: 1.1 TBW 512 MB: 2.3 TBW 1 GB: 4.5 TBW 2 GB: 9.1 TBW 4 GB: 18.2 TBW 8 GB: 36.5 TBW 16 GB: 73.0 TBW 32 GB: 146.0 TBW 64 GB: 292.1 TBW   Capacities 128, 256, 512 MB 1, 2, 4, 8, 16, 32, 64 GB  Performance Sustained read: Up to 55 MB/sec Sustained write: Up to 42 MB/sec  Intelligent ATA/IDE module Wear-leveling algorithms to substantially increase longevity of flash media – Built-in BCH ECC capable of correcting up to 24 bits in 1,024 byte data – Flash block management – Power failure management – Supports S.M.A.R.T commands  –  – – –  NAND Flash Type: SLC  Halogen free *Performance and power consumption may vary depending on host system configurations. 1 © 2013 Apacer Technology Inc. Rev. 1.3 Compact Flash 5 series AP-CFxxxxRXXS-XXXXXXA Table of Contents 1. GENERAL DESCRIPTION .................................................................................................... 4 1.1 INTELLIGENT COMPACTFLASH MODULE ..............................................................................................................4 1.1.1 Wear-leveling algorithms .............................................................................................................................4 1.1.2 S.M.A.R.T. Technology .................................................................................................................................4 1.1.3 Built-in Hardware ECC ................................................................................................................................4 1.1.4 Flash Block Management .............................................................................................................................4 1.1.5 Power Failure Management .........................................................................................................................5 2. FUNCTIONAL BLOCK .......................................................................................................... 5 3. PIN ASSIGNMENTS ............................................................................................................... 6 4. PRODUCT SPECIFICATION ................................................................................................ 8 4.1 CAPACITY .............................................................................................................................................................8 4.2 PERFORMANCE .....................................................................................................................................................8 4.3 ENVIRONMENTAL SPECIFICATIONS .......................................................................................................................9 4.4 CERTIFICATION & COMPLIANCE ...........................................................................................................................9 4.5 ENDURANCE ........................................................................................................................................................9 5. SOFTWARE INTERFACE .................................................................................................. 10 5.1 CF-ATA COMMAND SET ....................................................................................................................................10 6. ELECTRICAL SPECIFICATION ...................................................................................... 12 6.1 AC/DC CHARACTERISTICS .................................................................................................................................12 6.1.1 General DC Characteristics .......................................................................................................................12  CompactFlash Interface I/O at 5.0V ..................................................................................................................... 13  CompactFlash Interface I/O at 3.3V ..................................................................................................................... 13  Non-CF Interface I/O Pins.................................................................................................................................... 13 6.1.2 General AC Characteristics........................................................................................................................14  Attribute Memory Read Timing ........................................................................................................................... 14  Attribute Memory Write Timing .......................................................................................................................... 15  Common Memory Read Timing........................................................................................................................... 16  Common Memory Write Timing.......................................................................................................................... 17  I/O Read Timing................................................................................................................................................... 18  I/O Write Timing.................................................................................................................................................. 19  True IDE PIO Mode Read/Write Timing ............................................................................................................. 20  True IDE Multiword DMA Mode Read/Write Timing......................................................................................... 22  Ultra DMA Signal Usage in Each Interface Mode ............................................................................................... 23  Ultra DMA Data Burst Timing Requirements...................................................................................................... 23  Ultra DMA Data Burst Timing Descriptions........................................................................................................ 24  Ultra DMA Sender & Recipient IC Timing Requirements................................................................................... 25  Ultra DMA AC Signal Requirements................................................................................................................... 26  Ultra DMA Data-in Burst Initiation Timing......................................................................................................... 27  Sustained Ultra DMA Data-in Burst Timing ........................................................................................................ 28  Ultra DMA Data-in Burst Host Pause Timing...................................................................................................... 28  Ultra DMA Data-in Burst Device Termination Timing........................................................................................ 29  Ultra DMA Data-in Burst Host Termination Timing ........................................................................................... 30  Ultra DMA Data-out Burst Initiation Timing ....................................................................................................... 31  Sustained Ultra DMA Data-out Burst Timing ...................................................................................................... 32 2 © 2013 Apacer Technology Inc. Rev. 1.3 Compact Flash 5 series AP-CFxxxxRXXS-XXXXXXA        Ultra DMA Data-out Burst Device Pause Timing ................................................................................................ 32 Ultra DMA Data-out Burst Device Termination Timing...................................................................................... 33 Ultra DMA Data-out Burst Host Termination Timing ......................................................................................... 34 Flash Interface AC Characteristics ....................................................................................................................... 35 Command Latch Cycle ......................................................................................................................................... 35 Address Latch Cycle............................................................................................................................................. 36 Input Data Latch Cycle......................................................................................................................................... 36 7. MECHANICAL SPECIFICATIONS .................................................................................. 37 7.1 DIMENSIONS .......................................................................................................................................................37 8. PRODUCT ORDERING INFORMATION ........................................................................ 38 8.1 PRODUCT CODE DESIGNATIONS .........................................................................................................................38 8.2VALID COMBINATIONS ........................................................................................................................................39 3 © 2013 Apacer Technology Inc. Rev. 1.3 Compact Flash 5 series AP-CFxxxxRXXS-XXXXXXA 1. General Description Apacer’s value-added Industrial CompactFlash Card offers high performance, high reliability and powerefficient storage. Regarding standard compliance, this CompactFlash Card complies with CompactFlash specification revision 4.1, supporting transfer modes up to Programmed Input Output (PIO) Mode 6, Multiword Direct Memory Access (DMA) Mode 4, Ultra DMA Mode 5, and PCMCIA Ultra DMA Mode 5. Apacer’s value-added CFC provides complete PCMCIA – ATA functionality and compatibility. Apacer ‘s CompactFlash technology is designed for applications in Point of Sale (POS) terminals, telecom, IP-STB, medical instruments, surveillance systems, industrial PCs and handheld applications such as the new generation of Digital Single Lens Reflex (DSLR) cameras. 1.1 Intelligent CompactFlash Module 1.1.1 Wear-leveling algorithms Flash memory devices differ from Hard Disk Drives (HDDs) in terms of how blocks are utilized. For HDDs, when a change is made to stored data, like erase or update, the controller mechanism on HDDs will perform overwrites on blocks. On the other hand, NAND flash storage adopts flash as their primary media. Unlike HDDs, flash blocks cannot be overwritten and each P/E cycle wears down the lifespan of blocks gradually. Repeatedly program/erase cycles performed on the same memory cells will eventually cause some blocks to age faster than others. This would bring flash storages to their end of service term earlier. Wear leveling is an important mechanism that level out the wearing of blocks so that the wearing-down of blocks can be almost evenly distributed. This will increase the lifespan of SSDs. Commonly used wear leveling types are Static and Dynamic. 1.1.2 S.M.A.R.T. Technology S.M.A.R.T. is an acronym for Self-Monitoring, Analysis and Reporting Technology, an open standard allowing disk drives to automatically monitor their own health and report potential problems. It protects the user from unscheduled downtime by monitoring and storing critical drive performance and calibration parameters. Ideally, this should allow taking proactive actions to prevent impending drive failure. Apacer SMART feature adopts the standard SMART command B0h to read data from the drive. When the Apacer SMART Utility running on the host, it analyzes and reports the disk status to the host before the device is in critical condition. 1.1.3 Built-in Hardware ECC This CompactFlash card employs BCH Error Correction Code (ECC) algorithms. This on-chip hardware BCH-ECC engines is 13/24 bit programmed that can correct up to 24-bit errors per 1,024 byte data. This built-in hardware ECC performs parity generation and error detection/correction for data integrity. 1.1.4 Flash Block Management Contemporary process technology is unable to guarantee total reliability of NAND flash memory array. When a flash memory device leaves factory, it comes with a highly minimal number of initial bad block during production or out-of-factory as there is no currently known technology that produce flash chips free of bad blocks. On the other hand, bad blocks may develop during program/erase cycles. When host performs program/erase command on a block, bad block may appear in Status Register. Since bad blocks are inevitable, the solution is to keep them in control. Apacer flash devices are programmed with ECC, block mapping technique and S.M.A.R.T to reduce invalidity or error. Once bad blocks are detected, data in those blocks will be transferred to free blocks and error will be corrected by designated algorithms. 4 © 2013 Apacer Technology Inc. Rev. 1.3 Compact Flash 5 series AP-CFxxxxRXXS-XXXXXXA 1.1.5 Power Failure Management Power Failure Management plays a crucial role when experiencing unstable power supply. Power disruption may occur when users are storing data into the SSD. In this urgent situation, the controller would run multiple write-to-flash cycles to store the metadata for later block rebuilding. This urgent operation requires about several milliseconds to get it done. At the next power up, the firmware will perform a status tracking to retrieve the mapping table and resume previously programmed NAND blocks to check if there is any incompleteness of transmission 2. Functional Block The CompactFlash Card (CFC) includes a controller and flash media, as well as the CompactFlash standard interface. Figure 2-1 shows the functional block diagram. Figure 2-1: Functional block diagram 5 © 2013 Apacer Technology Inc. Rev. 1.3 Compact Flash 5 series AP-CFxxxxRXXS-XXXXXXA 3. Pin Assignments Table 3-1 lists the pin assignments with respective signal names for the 50-pin configuration. A “#” suffix indicates the active low signal. The pin type can be input, output or input/output. Table 3-1: Pin assignments (1 of 2) Pin No. 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 Memory card mode Signal name GND D3 D4 D5 D6 D7 #CE1 A10 #OE A9 A8 A7 VCC A6 A5 A4 A3 A2 A1 A0 D0 D1 D2 WP #CD2 #CD1 D11 D12 D13 D14 D15 #CE2 #VS1 #IORD #IOWR #WE RDY/-BSY VCC #CSEL #VS2 RESET Pin I/O type I/O I/O I/O I/O I/O I I I I I I I I I I I I I I/O I/O I/O O O O I/O I/O I/O I/O I/O I O I I I O I O I I/O card mode Signal name GND D3 D4 D5 D6 D7 #CE1 A10 #OE A9 A8 A7 VCC A6 A5 A4 A3 A2 A1 A0 D0 D1 D2 #IOIS16 #CD2 #CD1 D11 D12 D13 D14 D15 #CE2 #VS1 #IORD #IOWR #WE #IREQ VCC #CSEL #VS2 RESET Pin I/O type I/O I/O I/O I/O I/O I I I I I I I I I I I I I I/O I/O I/O O O O I/O I/O I/O I/O I/O I O I I I O I O I True IDE mode Signal name GND D3 D4 D5 D6 D7 #CS0 1 A10 #ATA SEL 1 A9 1 A8 1 A7 VCC 1 A6 1 A5 1 A4 1 A3 A2 A1 A0 D0 D1 D2 #IOCS16 #CD2 #CD1 D11 D12 D13 D14 D15 #CS1 #VS1 #IORD #IOWR #WE INTRQ VCC #CSEL #VS2 #RESET Pin I/O type I/O I/O I/O I/O I/O I I I I I I I I I I I I I I/O I/O I/O O O O I/O I/O I/O I/O I/O I O I I I O I O I 6 © 2013 Apacer Technology Inc. Rev. 1.3 Compact Flash 5 series AP-CFxxxxRXXS-XXXXXXA Table 3-1: Pin assignments (2 of 2) Pin No. 42 43 44 45 46 47 48 49 50 1. 2. Memory card mode Signal name #WAIT #INPACK #REG BVD2 BVD1 D8 D9 D10 GND Pin I/O type O O I O O I/O I/O I/O - I/O card mode Signal name #WAIT #INPACK #REG #SPKR #STSCHG D8 D9 D10 GND Pin I/O type O O I O O I/O I/O I/O - True IDE mode Signal name IORDY 2 DMARQ 2 DMACK #DASP #PDIAG D8 D9 D10 GND Pin I/O type O O I I/O I/O I/O I/O I/O - The signal should be grounded by the host. Connection required when UDMA is in use. 7 © 2013 Apacer Technology Inc. Rev. 1.3 Compact Flash 5 series AP-CFxxxxRXXS-XXXXXXA 4. Product Specification 4.1 Capacity Capacity specification of the Compact Flash Card series (CFC) is available as shown in Table 4-1. It lists the specific capacity and the default numbers of heads, sectors and cylinders for each product line. Table 4-1: Capacity specifications Capacity Total bytes 128 MB 1 Cylinders Heads Sectors Max LBA 128,450,560 980 8 32 250,880 256 MB 256,901,120 980 16 32 501,760 512 MB 512,483,328 993 16 63 1,000,944 1GB 1,024,966,656 1,986 16 63 2,001,888 2GB 2,048,901,120 3,970 16 63 4,001,760 4GB 4,110,188,544 7,964 16 63 8,027,712 8GB 8,195,604,480 15,880 16 63 16,007,040 16GB 16,391,340,032 16,383 16 63 32,014,336 32GB 32,019,316,736 16,383 16 63 62,537,728 64 GB 64,030,244,864 16,383 16 83 125,059,072 Notes: Display of total bytes varies from operating systems. Cylinders, heads or sectors are not applicable for these capacities. Only LBA addressing applies Notes: 1 GB = 1,000,000,000 bytes; 1 sector = 512 bytes. LBA count addressed in the table above indicates total user storage capacity and will remain the same throughout the lifespan of the device. However, the total usable capacity of the SSD is most likely to be less than the total physical capacity because a small portion of the capacity is reserved for device maintenance usages. 4.2 Performance Performances of the CF cards are listed in Table 4-2 Table 4-2: Performance specifications Capacity 128 MB 256 MB 512 MB 1 GB 2 GB 4 GB 8 GB 16 GB 32 GB 64 GB Sustained read (MB/s) 21 24 47 45 55 55 55 48 57 50 Sustained write (MB/s) 6 6 22 19 25 35 42 38 27 26 Performance Notes: performance may vary depending on flash configurations or host system settings. 8 © 2013 Apacer Technology Inc. Rev. 1.3 Compact Flash 5 series AP-CFxxxxRXXS-XXXXXXA 4.3 Environmental Specifications Environmental specification of the Compact Flash Card series (CFC) follows the MIL-STD-810F standards, as shown in Table 4-3. Table 4-3: Environmental specifications Environment Temperature Specification Operation 0°C to 70°C; -40°C to 85°C (Extended Temperature) Storage -40°C to 100°C Humidity 10 to 90% RH (non-condensing) Vibration (Non-Operation) Shock (Non-Operation) Sine wave : 10~2000Hz, 15G (X, Y, Z axes) Half sine wave 1,500G (X, Y, Z ; All 6 axes) 4.4 Certification & Compliance The CompactFlash card complies with the following global standards:      CE FCC Halogen-free CompactFlash Association Specification Revision 4.1 EMC 4.5 Endurance The endurance of a storage device is predicted by TeraBytes Written based on several factors related to usage, such as the amount of data written into the drive, block management conditions, and daily workload for the drive. Thus, key factors, such as Write Amplifications and the number of P/E cycles, can influence the lifespan of the drive. Capacity TeraBytes Written 128 MB 0.5 256 MB 1.1 512 MB 2.3 1 GB 4.5 2 GB 9.1 4 GB 18.2 8 GB 36.5 16 GB 73.0 32 GB 146.0 64 GB 292.1 Notes:  The measurement assumes the data written to the SSD for test is under a typical and constant rate.  The measurement follows the standard metric: 1 TB (Terabyte) = 1000 GB. 9 © 2013 Apacer Technology Inc. Rev. 1.3 Compact Flash 5 series AP-CFxxxxRXXS-XXXXXXA 5. Software Interface 5.1 CF-ATA Command Set Table 5-1: CFC-ATA command set Command Code Protocol Request Sense 03h Non-data Write-Sector(s)-Without-Erase 38h PIO data-out Erase-Sector(s) C0h Non-data Write-Multiple-Without-Erase CDh PIO data-out Translate-Sector 87h PIO data-in Set Features Enable/Disable 8-bit transfer EFh Non-data Execute Drive Diagnostic 90h Device diagnostic Flush-Cache E7h Non-data Identify Device ECh PIO data-in Read DMA C8h DMA Read-Multiple C4h PIO data-in Read Sector(s) 20h or 21h PIO data-in Read Verify Sector(s) 40h or 41h Non-data Set Feature EFh Non-data Set Multiple Mode C6h Non-data Write DMA CAh DMA Write Multiple C5h PIO data-out 30h or 31h PIO data-out NOP 00h Non-data Read-Buffer E4h PIO data-in Write Buffer E8h PIO data-out Check Power Mode E5h or 98h Non-data Idle E3h or 97h Non-data Idle-Immediate E1h or 95h Non-data Sleep E6h or 99h Non-data Standby E2h or 96h Non-data Standby Immediate E0h or 94h Non-data Security Set Password F1h PIO data-out Security Unlock F2h PIO data-out Security Erase Prepare F3h Non-data Write Sectors(s) 10 © 2013 Apacer Technology Inc. Rev. 1.3 Compact Flash 5 series AP-CFxxxxRXXS-XXXXXXA Security Erase Unit F4h PIO data-out Security Freeze Lock F5h Non-data Security Disable Password F6h PIO data-out SMART Disable Operations B0h Non-data SMART Enable/Disable Autosave B0h Non-data SMART Enable Operations B0h Non-data SMART Return Status B0h Non-data SMART Execute Off-line Immediate B0h Non-data SMART Read Data B0h PIO data-in Read Native Max Address F8h Non-data Set Max Address F9h Non-data Set Max Set Password F9h PIO data-out Set Max Lock F9h Non-data Set Max Freeze Lock F9h Non-data Set Max Unlock F9h PIO data-out Format Track 50h PIO data-out Initialize Drive Parameters 91h Non-data Recalibrate 1Xh Non-data Seek 7Xh Non-data Wear Level F5h Non-data Write Verify 3Ch PIO data-out 11 © 2013 Apacer Technology Inc. Rev. 1.3 Compact Flash 5 series AP-CFxxxxRXXS-XXXXXXA 6. Electrical Specification Caution: Absolute Maximum Stress Ratings – Applied conditions greater than those listed under “Absolute Maximum Stress Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these conditions or conditions greater than those defined in the operational sections of this data sheet is not implied. Exposure to absolute maximum stress rating conditions may affect device reliability. Table 6-1: Operating range Standard Operating Temperature 0°C to +70°C Extended Operating Temperature Supply voltage -40°C to +85°C 5 4.75-5.25V) V± 5% ( 3.3V ± 5% (3.135-3.465V) Table 6-2: Absolute maximum power pin stress ratings Parameter Symbol Input Power Voltage on any pin except VDD with respect to GND VDD V Conditions -0.3V min. to 6.5V max. -0.5V min. to VDD + 0.5V max. 6.1 AC/DC Characteristics The following section provides general AC/DC characteristics of this CompactFlash card. 6.1.1 General DC Characteristics 12 © 2013 Apacer Technology Inc. Rev. 1.3 Compact Flash 5 series AP-CFxxxxRXXS-XXXXXXA  CompactFlash Interface I/O at 5.0V Symbol Minimum Maximum Unit Supply Voltage High Level Output Voltage Low Level Output Voltage High Level Input Voltage Parameter Vcc VOH VOL VIH 4.5 Vcc-0.8 5.5 Low Level Input Voltage VIL Pull-up Resistance Pull-down Resistance RPU RPD 0.8 1.70 73 97 V V V V V V V kOhm kOhm  0.8 4.0 2.92 50 50 Non-Schmitt trigger Schmitt trigger Non-Schmitt trigger Schmitt trigger CompactFlash Interface I/O at 3.3V Symbol Minimum Maximum Unit Supply Voltage High Level Output Voltage Low Level Output Voltage High Level Input Voltage Parameter Vcc VOH VOL VIH 2.97 Vcc-0.8 3.63 Low Level Input Voltage VIL Pull-up Resistance Pull-down Resistance RPU RPD 52.7 47.5 0.6 1.25 141 172 V V V V V V V kOhm kOhm Symbol Minimum Maximum Unit Vcc VOH VOL VIH 2.7 2.4 3.6 V V V V V V V kOhm kOhm  Remark 0.8 2.4 2.05 Remark Non-Schmitt trigger Schmitt trigger Non-Schmitt trigger Schmitt trigger Non-CF Interface I/O Pins Parameter Supply Voltage High Level Output Voltage Low Level Output Voltage High Level Input Voltage Low Level Input Voltage VIL Pull-up Resistance Pull-down Resistance RPU RPD 0.4 2.0 1.4 2.0 0.8 1.2 0.8 40 40 Remark Non-Schmitt trigger Schmitt trigger Non-Schmitt trigger Schmitt trigger Note: the Schmitt trigger includes CompactFlash I/O pins such as CE1#, CE2#, HREG#, HOE#, HIOE#, HWE# and HIOW#, as well as non CompactFlash I/O pins like RST#, T0, T1, and T2. 13 © 2013 Apacer Technology Inc. Rev. 1.3 Compact Flash 5 series AP-CFxxxxRXXS-XXXXXXA 6.1.2 General AC Characteristics  Attribute Memory Read Timing Item Read Cycle Time Address Access Time Card Enable Access Time Output Enable Access Time Output Disable Time from CEx# Output Disable Time from HOE# Address Setup Time Output Enable Time from CEx# Output Enable Time from HOE# Data Valid from Address Change Symbol tc (R) ta (HA) ta (CEx) ta (HOE) tdis (CEx) tdis (HOE) tsu (HA) ten (CEx) ten (HOE) tv (HA) Min. (ns) 300 Max. (ns) 300 300 150 100 100 30 5 5 0 Notes: all time intervals are in nanoseconds. HD refers to the data provided by the CompactFlash card to the system. The CEx# signal or both of the HOE# and the HWE# signal are de-asserted between consecutive cycle operations. 14 © 2013 Apacer Technology Inc. Rev. 1.3 Compact Flash 5 series AP-CFxxxxRXXS-XXXXXXA  Attribute Memory Write Timing Item Symbol Min. (ns) Write Cycle Time tc (W) 250 Write Pulse Width tw (HWE) 150 Address setup Time tsu (HA) 30 Write Recovery Time trec (HWE) 30 Data Setup Time for HWE# tsu (HD-HWEH) 80 Data Hold Time th (HD) 30 Max. (ns) Notes: all time intervals are in nanoseconds. HD refers to the data provided by the CompactFlash card to the system. 15 © 2013 Apacer Technology Inc. Rev. 1.3 Compact Flash 5 series AP-CFxxxxRXXS-XXXXXXA  Common Memory Read Timing Cycle Time Mode 250 ns Min. Max. 120 ns Min. Max. 100 ns Min. Max. 80 ns Item Symbol Min. Max. Output Enable Access Time ta (HOE) 125 60 50 45 Output Disable Time from HOE# tdis (HOE) 100 60 50 45 Address Setup Time tsu (HA) 30 15 10 10 Address Hold Time th (HA) 20 15 15 10 CEx# Setup before HOE# tsu (CEx) 5 5 5 5 CEx# Hold following HOE# th (CEx) 20 15 15 10 Wait Delay falling from HOE# tv (IORDYHOE) 35 35 35 Na Data Setup for Wait Release tv (IORDY) 0 0 0 Na Wait Width Time tw (IORDY) 350 350 350 Na Note: IORDY is not supported in this 80 ns mode. The maximum load on IORDY is 1 LSTTL with a 50 pF (40 pF below 120 nsec cycle time) total load. All time intervals are in nanoseconds. HD refers to the data provided by the CompactFlash card to the system. The IORDY signal can be ignored when the HOE# cycle-to-cycle time is greater than the Wait Width Time. The Max Wait Width Time can be determined from the Card Information Structure (CIS). Although adhering to the PCM-CIA specification, the Wait Width Time is intentionally designed to be lower in this specification. 16 © 2013 Apacer Technology Inc. Rev. 1.3 Compact Flash 5 series AP-CFxxxxRXXS-XXXXXXA  Common Memory Write Timing Cycle Time Mode 250 ns Max. 120 ns Min. Max. 100 ns Item Symbol Min. Data Setup before HWE# tsu (HDHWEH) 80 50 40 30 Data Hold following HWE# th (HD) 30 15 10 10 HWE# Pulse Width tw (HWE) 150 70 60 55 Address Setup Time tsu (HA) 30 15 10 10 CEx# Setup before HWE# tsu (CEx) 5 5 5 5 Write Recovery Time trec (HWE) 30 15 15 15 Address Hold Time th (HA) 20 15 15 15 CEx# Hold following HWE# th (CEx) 20 15 15 10 Wait Delay falling from HWE# tv (IIORDYHWE) HWE# High from Wait Release tv (IORDY) Wait Width Time tw (IORDY) 35 35 0 0 350 Min. Max. 80 ns 35 0 350 Min. Max. Na Na 350 Na Note: IORDY is not supported in this 80 ns mode. The maximum load on IORDY is 1 LSTTL with a 50 pF (40 pF below 120 nsec cycle time) total load. All time intervals are in nanoseconds. HD refers to the data provided by the CompactFlash card to the system. The IORDY signal can be ignored when the HWE# cycle-to-cycle time is greater than the Wait Width Time. The Max Wait Width Time can be determined from the Card Information Structure (CIS). Although adhering to the PCM-CIA specification, the Wait Width Time is intentionally designed to be lower in this specification. 17 © 2013 Apacer Technology Inc. Rev. 1.3 Compact Flash 5 series AP-CFxxxxRXXS-XXXXXXA  I/O Read Timing Cycle Time Mode 250 ns Min. Max. 120 ns Min. Min. Symbol Data Delay after HIOE# td (HIOE) Data Hold following HIOE# th (HIOE) 0 5 5 5 HIOE# Width Time tw (HIOE) 165 70 65 55 Address Setup before HIOE# tsuHA (HIOE) 70 25 25 15 Address Hold following HIOE# thHA (HIOE) 20 10 10 10 CEx# Setup before HIOE# tsuCEx (HIOE) 5 5 5 5 CEx# Hold following HIOE# thCEx (HIOE) 20 10 10 10 HREG# Setup before HIOE# tsuHREG (HIOE) 5 5 5 5 HREG# Hold following HIOE# thHREG (HIOE) 0 0 0 0 Wait Delay falling from HIOE# tdIORDY (HIOE) 35 35 35 Na Data Delay from Wait Rising td (IORDY) 0 0 0 na Wait Width Time tw (IORDY) 350 350 350 Na 50 Max. 80 ns Item 100 Max. 100 ns Min. 50 Max. 45 Note: IORDY is not supported in this 80 ns mode. Maximum load on IORDY is 1 LSTTL with a 50 pF (40 pF below 120 nsec cycle time) total load. All time intervals are in nanoseconds. Although minimum time from IORDY high to HIOE# high is 0 nsec, the minimum HIOE# width is still met. HD refers to data provided by the CompactFlash Card to the system. Although following PCMCIA specification, the Wait Width Time is intentionally lower in this specification. 18 © 2013 Apacer Technology Inc. Rev. 1.3 Compact Flash 5 series AP-CFxxxxRXXS-XXXXXXA  I/O Write Timing Cycle Time Mode 250 ns Max. 120 ns Min. Max. 100 ns Item Symbol Min. Data Setup before HIOW# tsu (HIOW) 60 20 20 15 Data Hold following HIOW# th (HIOW) 30 10 5 5 HIOW# Width Time tw (HIOW) 165 70 65 65 Address Setup before HIOW# tsuHA (HIOW) 70 25 25 15 Address Hold following HIOW# thHA (HIOW) 20 20 10 10 CEx# Setup before HIOW# tsuCEx (HIOW) 5 5 5 5 CEx# Hold following HIOW# thCEx (HIOW) 20 20 10 10 HREG# Setup before HIOW# tsuHREG (HIOW) 5 5 5 5 HREG# Hold following HIOW# thHREG (HIOW) 0 0 0 0 Wait Delay falling from HIOW# tdIORDY (HIOW) HIOW# high from Wait High tdHIOW (IORDY) Wait Width Time tw (IORDY) 35 35 0 0 350 Min. Max. 80 ns 35 0 350 Min. Max. na na 350 na Note: IORDY is not supported in this 80 ns mode. The maximum load on IORDY is 1 LSTTL with a 50 pF (40 pF below 120 nsec cycle time) total load. All time intervals are in nanoseconds. Although minimum time from IORDY high to HIOW# high is 0 nsec, the minimum HIOW# width is still met. HD refers to data provided by the CompactFlash Card to the system. 19 © 2013 Apacer Technology Inc. Rev. 1.3 Compact Flash 5 series AP-CFxxxxRXXS-XXXXXXA  True IDE PIO Mode Read/Write Timing Item Symbol Mode 0 Mode 1 Mode 2 Mode 3 Mode 4 Mode 5 Mode 6 Cycle Time (Min.) t0 600 383 240 180 120 100 80 Address Valid to HIOE# / HIOW# Setup (Min.) t1 70 50 30 30 25 15 10 HIOE# / HIOW# (Min.) t2 165 125 100 80 70 65 55 HIOE# / HIOW# (Min.) Register (8-bit) t2 290 290 290 80 70 65 55 HIOE# / HIOW# Recovery Time (Min.) t2i - - - 70 25 25 20 HIOW# Data Setup (Min.) t3 60 45 30 30 20 20 15 HIOW# Data Hold (Min.) t4 30 20 15 10 10 5 5 HIOE# Data Setup (Min.) t5 50 35 20 20 20 15 10 HIOE# Data Hold (Min.) t6 5 5 5 5 5 5 5 HIOE# Data Tristate (Max.) t6Z 30 30 30 30 30 20 20 Address Valid to IOCS16# Assertion (Max.) t7 90 50 40 n/a n/a n/a n/a Address Valid to IOCS16# released (Max.) t8 60 45 30 n/a n/a n/a n/a HIOE# / HIOW# to Address Valid Hold t9 20 15 10 10 10 10 10 Read Data Valid to IORDY Active (Min.), if IORDY initially low after tA tRD 0 0 0 0 0 0 0 IORDY Setup Time tA 35 35 35 35 35 Na Na IORDY Pulse Width (Max.) tB 1250 1250 1250 1250 1250 Na Na IORDY Assertion to Release (Max.) tC 5 5 5 5 5 Na Na *All timing intervals are measured in nanoseconds. The maximum load on IOCS16# is 1 LSTTL with a 50 pF (40 pF below 120 nsec cycle time) total load. All time intervals are in nanoseconds. Although minimum time from IORDY high to HIOE# high is 0 nsec, the minimum HIOE# width is still met. Where t0 denotes the minimum total cycle time; t2 represents the minimum command active time; t2i is the minimum command recovery time or command inactive time. Actual cycle time equals to the sum of actual command active time and actual command inactive time. The three timing requirements for t0, t2, and t2i are met. The minimum total cycle time requirement is greater than the sum of t2 and t2i, implying that a host implementation can extend either or both t2 or t2i to ensure that t0 is equal to or greater than the value reported in the device identity data. A CompactFlash card implementation supports any legal host implementation. The delay originates from HIOW# or HIOW# activation until the state of IORDY is first sampled. If IORDY is inactive, the host waits until IORDY is active before the PIO cycle is completed. When the CompactFlash Card is not driving IORDY, which is negated at tA after HIOE# or HIOW# activation, then t5 is met and tRD is inapplicable. When the CompactFlash Card is driving IORDY, which is negated at the time tA after HIOE# or HIOW# activation, then tRD is met and t5 is inapplicable. Both t7 and t8 apply to modes 0, 1, and 2 only. For other modes, the signal is invalid. IORDY is not supported in this mode. 20 © 2013 Apacer Technology Inc. Rev. 1.3 Compact Flash 5 series AP-CFxxxxRXXS-XXXXXXA Device address comprises CE1#, CE2#, and HA[2:0] Data comprises HD[15:0] (16-bit) or HD[7:0] (8-bit) IOCS16# is shown for PIO modes 0, 1, and 2. For other modes, the signal is ignored. The negation of IORDY by the device is used to lengthen the PIO cycle. Whether the cycle is to be extended is determined by the host after tA from the assertion of HIOE# or HIOW#. The assertion and negation of IORDY is described in the following cases. First, the device never negates IORDY, so no wait is generated. Secondly, device drives IORDY low before tA. Thus, wait is generated. The cycle is completed after IORDY is re-asserted. For cycles in which a wait is generated and HIOE# is asserted, the device places read data on D15-D00 for tRD before IORDY is asserted. 21 © 2013 Apacer Technology Inc. Rev. 1.3 Compact Flash 5 series AP-CFxxxxRXXS-XXXXXXA  True IDE Multiword DMA Mode Read/Write Timing Item Symbol Mode 0 Mode 1 Mode 2 Mode 3 Mode 4 Cycle Time (Min.) tO 480 150 120 100 80 HIOE#/HIOW# asserted width (Min.) tD 215 80 70 65 65 HIOE# data access (Max.) tE 150 60 50 50 45 HIOE# data hold (Min.) tF 5 5 5 5 5 HIOE# / HIOW# data setup (Min.) tG 100 30 20 15 10 HIOW# data hold (Min.) tH 20 15 10 5 5 HREG# to HIOE#/HIOW# setup (Min.) tI 0 0 0 0 0 HIOE#/HIOW# to HREG# hold (Min.) tJ 20 5 5 5 5 HIOE# negated width (Min.) tKR 50 50 25 25 20 HIOW# negated width (Min.) tKW 215 50 25 25 20 HIOE# to DMARQ delay (Max.) tLR 120 40 35 35 35 HIOW# to DMARQ delay (Max.) tLW 40 40 35 35 35 CEx# valid to HIOE#/HIOW# tM 50 30 25 10 5 CEx# hold tN 15 10 10 10 10 Note: Where t0 is the minimum total cycle time and tD is minimum command active time, whereas tKR and tKW are minimum command recovery time or command inactive time for input and output cycles, respectively. Actual cycle time equals to the sum of actual command active time and actual command inactive time. The three timing requirements of t0, for instance, tD, tKR, and tKW, must be met. The minimum total cycle time requirement exceeds the sum of tD and tKR or tKW for input and output cycles respectively, implying that a host implementation can extend either or both tD and tKR or tKW as deemed necessary to ensure that t0 equals or exceeds the value reported in the device identify data. A CompactFlash card implementation supports any legal host, appropriate host implementation. If a card cannot sustain continuous, minimum cycle time DMA transfers, it may negate DMARQ during the time from the start of a DMA transfer cycle (to suspend DMA transfers in progress) and re-assertion of the signal at a relatively later time to continue DMA transfer operations. The host may negate this signal to suspend the DMA transfer in progress. 22 © 2013 Apacer Technology Inc. Rev. 1.3 Compact Flash 5 series AP-CFxxxxRXXS-XXXXXXA  Ultra DMA Signal Usage in Each Interface Mode Signal Type Non-UDMA Memory Mode PC Card Memory Mode UDMA PC Card IO Mode UDMA True IDE Mode UDMA DMARQ Output (INPACK#) DMARQ# DMARQ# DMARQ HREG# Input (REG#) DMACK# DMACK DMACK# 1 HIOW# Input (IOWR#) STOP STOP HIOE# Input (IORD#) HDMARDY#(R) HSTROBE(W) IORDY Output (WAIT#) 1,2 STOP HDMARDY#(R) 1,3,4 HSTROBE(W) 1,3 DDMARDY#(W) DSTROBE(R) 1 1,2,4 1,2 1,3,4 1,3 DDMARDY#(W) DSTROBE(R) 1,2,4 1 HDMARDY#(R) HSTROBE(W) 1,3,4 1,3 DDMARDY#(W) DSTROBE(R) HD[15:0] Bidir (D[15:00]) D[15:00] D[15:00] D[15:00] HA[10:0] Input (A[10:00]) A[10:00] A[10:00] A[02:00] CSEL# Input (CESL#) CSEL# CSEL# CSEL# HIRQ Output (READY) READY INTRQ# INTRQ CE1# Input (CE1#) CE1# CE1# CS0# (CE2#) CE2# CE2# CS1# CE2# 1,2 1,2,4 5 1. UDMA interpretation of this signal is valid only during an Ultra DMA data burst. 2. UDMA interpretation of this signal is valid only during an Ultra DMA data burst during a DMA Read command. 3. UDMA interpretation of this signal is valid only during an Ultra DMA data burst during a DMA Write command. 4. HSTROBE and DSTROBE signals are active on both rising and falling edges. 5. Address lines 03-10 are not used in the True IDE mode.  Ultra DMA Data Burst Timing Requirements Parameter UDMA Mode 0 UDMA Mode 1 UDMA Mode 2 UDMA Mode 3 UDMA Mode 4 UDMA Mode 5 Measure Location t2CYCTYP 240 160 120 90 60 40 Sender tCYC 112 73 54 39 25 16.8 See note t2CYC 230 153 115 86 57 38 Sender tDS 15.0 10.0 7.0 7.0 5.0 4.0 Recipient tDH 5.0 5.0 5.0 5.0 5.0 4.6 Recipient tDVS 70.0 48.0 31.0 20.0 6.7 4.8 Sender tDVH 6.2 6.2 6.2 6.2 6.2 4.8 Sender tCS 15.0 10.0 7.0 7.0 5.0 5.0 Device tCH 5.0 5.0 5.0 5.0 5.0 5.0 Device tCVS 70.0 48.0 31.0 20.0 6.7 10.0 Host tCVH 6.2 6.2 6.2 6.2 6.2 10.0 Host tZFS 0 0 0 0 0 35 Device tDZFS 70.0 48.0 31.0 20.0 6.7 25 Sender 23 © 2013 Apacer Technology Inc. Rev. 1.3 Compact Flash 5 series AP-CFxxxxRXXS-XXXXXXA tFS 230 200 170 130 120 90 Device tLI 0 - 150 0 - 150 0 - 150 0 - 100 0 - 100 0 - 75 See note tMLI 20 20 20 20 20 20 Host tUI 0 0 0 0 0 0 Host tAZ 10 10 10 10 10 10 See note tZAH 20 20 20 20 20 20 Host tZAD 0 0 0 0 0 0 Device tENV 20 - 70 20 - 70 20 – 70 20 - 55 20 - 55 20 - 50 Host tRFS 75 70 60 60 60 50 Sender tRP 160 125 100 100 100 85 Recipient tIORDYZ 20 20 20 20 20 20 Device tZIORDY 0 0 0 0 0 0 Device tACK 20 20 20 20 20 20 Host tSS 50 50 50 50 50 50 Sender Notes: All timing are in nanoseconds and all timing measurement switching points (low to high and high to low) are taken at 1.5V. All signal transitions for a timing parameter are determined at the connector specified in the measurement location column. Parameter tCYC is determined at the connector of the recipient farthest from the sender, while parameter tLI is determined at the connector of a sender or recipient responding to an incoming transition from the recipient or sender, respectively. Both incoming signal and outgoing response are determined at the same connector. Parameter tAZ is determined at the connector of a sender or recipient driving the bus, and must release the bus to allow for a bus turnaround.  Ultra DMA Data Burst Timing Descriptions Parameter Description & Comment Note t2CYCTYP Typical sustained average two cycle time tCYC Cycle time allowing for asymmetry and clock variations (from STROBE edge to STROBE edge) t2CYC Two cycle time allowing for clock variations (from rising edge to next rising edge or from falling edge to next falling edge of STROBE) tDS Data setup time at recipient (from data valid until STROBE edge) 2, 5 tDH Data hold time at recipient (from STROBE edge until data may become invalid) 2,5 tDVS Data valid setup at sender (from data valid until STROBE edge) 3 tDVH Data valid hold time at sender (from STROBE edge until data may become invalid) 3 tCS CRC word setup time at device 2 tCH CRC word hold time at device 2 tCVS CRC word valid setup time at host (from CRC valid until DMACK(#) negation) 3 tCVH CRC word valid hold time at sender (from DMACK(#) negation until CRC may become invalid) 3 tZFS Time from STROBE output released-to-driving until the first transition of critical timing 24 © 2013 Apacer Technology Inc. Rev. 1.3 Compact Flash 5 series AP-CFxxxxRXXS-XXXXXXA tDZFS Time from data output released-to-driving until the first transition of critical timing) tFS First STROBE time (for device to first negate DSTROBE from STOP during a data in burst) tLI Limited interlock time 1 tMLI Interlock time with minimum 1 tUI Unlimited interlock time 1 tAZ Maximum time allowed for output drives to release (from asserted or negated) tZAH Minimum delay time required for output tZAD Drivers to assert or negate (from released) tENV Envelope time (from DMACK(#)) to STOP and HDMARDY# during data in burst initiation and from DMACK(#) to STOP during data out burst initiation tRFS Ready-to-final-STROBE time (no STROBE edges shall be sent this long after negation of DMARDY#) tRP Ready-to-pause time (that recipient shall wait to pause after negating DMARDY#) tIORDYZ Maximum time before releasing IORDY 6 tZIORDY Minimum time before driving IORDY 4, 6 tACK Setup and hold times for DMACK(#) (before assertion or negation tSS Time from STROBE edge to negation of DMARQ(#) or assertion of STOP (when sender terminates a burst) Notes: 1. Parameters tUI, tMLI and tLI represent sender-to-recipient or recipient-to-sender interlocks, for instance, one agent (sender or recipient) is waiting for the other agent to respond with a signal before proceeding. Parameter tUI denotes an unlimited interlock that has no maximum time value; tMLI represents a limited time-out that has defined minimum; tLI is a limited time-out that has a defined maximum. 2. The 80-conductor cabling is required to meet setup (tDS, tCS) and hold (tDH, tCH) times in modes exceeding 2. 3. Timing for tDVS, tDVH, tCVS, and tCVH must be met for lumped capacitive loads of 15 and 40 pF at the connector where the data and STROBE signals have the same capacitive load value. 4. Fall all timing modes, parameter tZIORDY may be greater than tENV since the host has a pull up on IORDY giving it a known state when released. 5. Parameters tDS and tDH for mode 5 are defined for a recipient at the end of a cable only in a configuration that has a single device located at the cable end. This configuration can result in tDS, and tDH for mode 5 at the middle connector having minimum values of 3.0 and 3.9 nanoseconds respectively. 6. The parameters are only applied to True IDE mode operation. Ultra DMA Sender & Recipient IC Timing Requirements  Item UDMA UDMA UDMA UDMA UDMA UDMA Mode 0 (ns) Mode 1 (ns) Mode 2 (ns) Mode 3 (ns) Mode 4 (ns) Mode 5 (ns) Min. Min. Min. Max. Max. Min. Max. Max. Min. Max. Min. tDSIC 14.7 9.7 6.8 6.8 4.8 2.3 tDHIC 4.8 4.8 4.8 4.8 4.8 2.8 tDVSIC 72.9 50.9 33.9 22.6 9.5 6.0 tDVHIC 9.0 9.0 9.0 9.0 9.0 6.0 tDSIC Recipient IC data setup time (from data valid until STROBE edge) tDHIC Recipient IC data hold time (from STROBE edge until data may become invalid) Max. 25 © 2013 Apacer Technology Inc. Rev. 1.3 Compact Flash 5 series AP-CFxxxxRXXS-XXXXXXA tDVSIC Sender IC data valid setup time (from data valid until STROBE edge) tDVHIC Sender IC data valid hold time (from STROBE edge until data may become invalid) Note: all timing switching point measurements are taken at 1.5V. The correct data value is captured by the recipient given input data with a slew rate of 0.4 V/ns rising and falling and the input STROBE with a slew rate of 0.4 V/ns rising and falling at tDSIC and tDHIC timing (measured at 1.5V). Parameters tDVSIC and tDVHIC must be met for lumped capacitive loads of 15 and 40 pF at the IC where all signals have the same capacitive load value. Noise that can couple onto the output signals from external sources is not included in these values.  Ultra DMA AC Signal Requirements Item Symbol Min. Max. (V/ns) (V/ns) Rising Edge Slew Rate for any signal SRISE 1.25 Falling Edge Slew Rate for any signal SFALL 1.25 Notes: 1. The sender is tested while driving an 18-inch, 80-conductor cable with PVC insulation. The signal being tested must be cut at a test point such that it has no trace, cable, or recipient loading after the test point. All other signals must remain connected through to the recipient. The test point should be located between a sender’s series termination resistor and within 0.5 inch or less from where the conductor exits the connector. If the test point is on a cable conductor rather than on the PCB, an adjacent ground conductor must also be cut within 0.5 inch or the connector. 2. The test load and test points should be soldered directly to the exposed source side connectors. The test loads consist of a 15 pF or a 40 pF, 5%, 0.08 inch by 0.05 inch surface mount or relatively smaller capacitor connected between the test point and ground. Slew rates are met for both capacitor values. 3. Measurements must be taken at the test point using a 100 Kohm, 1GHz probe and a 500 MHz oscilloscope. The average rate is measured from 20% ~ 80% of the settled VOH level with data transitions at least 120 nanoseconds apart. The settled VOH level must be measured as the average high output level under the defined test conditions from 100 nanoseconds after 80% of a rising edge until 20% of the subsequent falling edge. 26 © 2013 Apacer Technology Inc. Rev. 1.3 Compact Flash 5 series AP-CFxxxxRXXS-XXXXXXA  Ultra DMA Data-in Burst Initiation Timing 27 © 2013 Apacer Technology Inc. Rev. 1.3 Compact Flash 5 series AP-CFxxxxRXXS-XXXXXXA  Sustained Ultra DMA Data-in Burst Timing  Ultra DMA Data-in Burst Host Pause Timing 28 © 2013 Apacer Technology Inc. Rev. 1.3 Compact Flash 5 series AP-CFxxxxRXXS-XXXXXXA  Ultra DMA Data-in Burst Device Termination Timing 29 © 2013 Apacer Technology Inc. Rev. 1.3 Compact Flash 5 series AP-CFxxxxRXXS-XXXXXXA  Ultra DMA Data-in Burst Host Termination Timing 30 © 2013 Apacer Technology Inc. Rev. 1.3 Compact Flash 5 series AP-CFxxxxRXXS-XXXXXXA  Ultra DMA Data-out Burst Initiation Timing 31 © 2013 Apacer Technology Inc. Rev. 1.3 Compact Flash 5 series AP-CFxxxxRXXS-XXXXXXA  Sustained Ultra DMA Data-out Burst Timing  Ultra DMA Data-out Burst Device Pause Timing 32 © 2013 Apacer Technology Inc. Rev. 1.3 Compact Flash 5 series AP-CFxxxxRXXS-XXXXXXA  Ultra DMA Data-out Burst Device Termination Timing 33 © 2013 Apacer Technology Inc. Rev. 1.3 Compact Flash 5 series AP-CFxxxxRXXS-XXXXXXA  Ultra DMA Data-out Burst Host Termination Timing 34 © 2013 Apacer Technology Inc. Rev. 1.3 Compact Flash 5 series AP-CFxxxxRXXS-XXXXXXA  Flash Interface AC Characteristics Parameter Symbol 0 Wait State (Min.) 1 Wait State (Max.) Unit Internal Oscillator Frequency 78 MHz 66 MHz 78 MHz 66 MHz CLE Setup time tCLS 12.8 15.2 12.8 15.2 ns CLE hold time tCLH 12.8 15.2 12.8 15.2 ns ALE setup time tALS 12.8 15.2 12.8 15.2 ns ALE hold time tALH 12.8 15.2 12.8 15.2 ns WE pulse width tWP 12.8 15.2 25.6 30.3 ns Data setup time tDS 12.8 15.2 25.6 30.3 ns Data hold time tDH 12.8 15.2 12.8 15.2 ns Write cycle time tWC 25.6 30.3 38.5 45.5 ns WE high hold time tWH 12.8 15.2 12.8 15.2 ns Read cycle time tRC 12.8 15.2 12.8 15.2 ns RE pulse width tRP 5.0 5.0 5.0 5.0 ns RE high hold time tREH 0.0 0.0 0.0 0.0 ns  Command Latch Cycle 35 © 2013 Apacer Technology Inc. Rev. 1.3 Compact Flash 5 series AP-CFxxxxRXXS-XXXXXXA  Address Latch Cycle  Input Data Latch Cycle 36 © 2013 Apacer Technology Inc. Rev. 1.3 Compact Flash 5 series AP-CFxxxxRXXS-XXXXXXA 7. Mechanical Specifications 7.1 Dimensions FIGURE 7-1: Physical dimension Unit: mm 37 © 2013 Apacer Technology Inc. Rev. 1.3 Compact Flash 5 series AP-CFxxxxRXXS-XXXXXXA 8. Product Ordering Information 8.1 Product Code Designations A P – CF x x x x R X X S – XXXXXX A Firmware version Specification RM: Removable NR: Non-Removable ET: Extended Temperature NDRM: Non-DMA + Removable NDNR: Non-DMA + Non-Removable ETRM: Ext. Temp. + Removable ETNR: Ext. Temp. + Non-Removable ETNDRM: Ext. Temp + Non-DMA + Removable ETNDNR: Ext. Temp + Non-DMA + Non-Removable Halogen Free Compliant Configuration : F Dual Channel N : Standard CTL Type 7: CTL BGA Package 9: CTL TSOP Package CFC Type Capacities: 128M 256M 512M 001G: 002G 004G: 008G 016G 032G 064G 128MB 256MB 512MB 1GB 2GB 4GB 8GB 16GB 32GB 64GB Model Name Apacer Product Code 38 © 2013 Apacer Technology Inc. Rev. 1.3 Compact Flash 5 series AP-CFxxxxRXXS-XXXXXXA 8.2 Valid Combinations 8.2.1 Standard Temperature 8.2.1.1 Non-Removable Capacity AP/N 128MB AP-CF128MR9NS-NRA 256MB AP-CF256MR9NS-NRA 512MB AP-CF512MR9NS-NRA 1GB AP-CF001GR9NS-NRA 2GB AP-CF002GR9NS-NRA 4GB AP-CF004GR9NS-NRA 8GB AP-CF008GR9NS-NRA 16GB AP-CF016GR9FS-NR 32GB AP-CF032GR9FS-NR 64GB AP-CF064GR7FS-NR 8.2.1.2 Removable Capacity AP/N 128MB AP-CF128MR9NS-RMA 256MB AP-CF256MR9NS-RMA 512MB AP-CF512MR9NS-RMA 1GB AP-CF001GR9NS-RMA 2GB AP-CF002GR9NS-RMA 4GB AP-CF004GR9NS-RMA 8GB AP-CF008GR9NS-RMA 16GB AP-CF016GR9FS-RM 32GB AP-CF032GR9FS-RM 64GB AP-CF064GR7FS-RM 39 © 2013 Apacer Technology Inc. Rev. 1.3 Compact Flash 5 series AP-CFxxxxRXXS-XXXXXXA 8.2.1.3 Non-DMA + Removable Capacity AP/N 128MB AP-CF128MR9NS-NDRMA 256MB AP-CF256MR9NS-NDRMA 512MB AP-CF512MR9NS-NDRMA 1GB AP-CF001GR9NS-NDRMA 2GB AP-CF002GR9NS-NDRMA 4GB AP-CF004GR9NS-NDRMA 8GB AP-CF008GR9NS-NDRMA 16GB AP-CF016GR9FS-NDRM 32GB AP-CF032GR9FS-NDRM 64GB AP-CF064GR7FS-NDRM 8.2.1.4 Non-DMA + Non-Removable Capacity AP/N 128MB AP-CF128MR9NS-NDNRA 256MB AP-CF256MR9NS-NDNRA 512MB AP-CF512MR9NS-NDNRA 1GB AP-CF001GR9NS-NDNRA 2GB AP-CF002GR9NS-NDNRA 4GB AP-CF004GR9NS-NDNRA 8GB AP-CF008GR9NS-NDNRA 16GB AP-CF016GR9FS-NDNR 32GB AP-CF032GR9FS-NDNR 64GB AP-CF064GR7FS-NDNR Note: Please consult with Apacer sales representatives for availabilities. 40 © 2013 Apacer Technology Inc. Rev. 1.3 Compact Flash 5 series AP-CFxxxxRXXS-XXXXXXA 8.2.2 Extended Temperature 8.2.2.1 Ext. Temp. + Non-Removable Capacity AP/N 128MB AP-CF128MR9NS-ETNRA 256MB AP-CF256MR9NS-ETNRA 512MB AP-CF512MR9NS-ETNRA 1GB AP-CF001GR9NS-ETNRA 2GB AP-CF002GR9NS-ETNRA 4GB AP-CF004GR9NS-ETNRA 8GB AP-CF008GR9NS-ETNRA 16GB AP-CF016GR9FS-ETNR 32GB AP-CF032GR9FS-ETNR 64GB AP-CF064GR7FS-ETNR 8.2.2.2 Ext. Temp. + Removable Capacity AP/N 128MB AP-CF128MR9NS-ETRMA 256MB AP-CF256MR9NS-ETRMA 512MB AP-CF512MR9NS-ETRMA 1GB AP-CF001GR9NS-ETRMA 2GB AP-CF002GR9NS-ETRMA 4GB AP-CF004GR9NS-ETRMA 8GB AP-CF008GR9NS-ETRMA 16GB AP-CF016GR9FS-ETRM 32GB AP-CF032GR9FS-ETRM 64GB AP-CF064GR7FS-ETRM 41 © 2013 Apacer Technology Inc. Rev. 1.3 Compact Flash 5 series AP-CFxxxxRXXS-XXXXXXA 8.2.2.3 Non-DMA + Removable Capacity AP/N 128MB AP-CF128MR9NS-ETNDRMA 256MB AP-CF256MR9NS-ETNDRMA 512MB AP-CF512MR9NS-ETNDRMA 1GB AP-CF001GR9NS-ETNDRMA 2GB AP-CF002GR9NS-ETNDRMA 4GB AP-CF004GR9NS-ETNDRMA 8GB AP-CF008GR9NS-ETNDRMA 16GB AP-CF016GR9FS-ETNDRM 32GB AP-CF032GR9FS-ETNDRM 64GB AP-CF064GR7FS-ETNDRM 8.2.2.4 Non-DMA + Non-Removable Capacity AP/N 128MB AP-CF128MR9NS-ETNDNRA 256MB AP-CF256MR9NS-ETNDNRA 512MB AP-CF512MR9NS-ETNDNRA 1GB AP-CF001GR9NS-ETNDNRA 2GB AP-CF002GR9NS-ETNDNRA 4GB AP-CF004GR9NS-ETNDNRA 8GB AP-CF008GR9NS-ETNDNRA 16GB AP-CF016GR9FS-ETNDNR 32GB AP-CF032GR9FS-ETNDNR 64GB AP-CF064GR7FS-ETNDNR Note: Please consult with Apacer sales representatives for availabilities. 42 © 2013 Apacer Technology Inc. Rev. 1.3 Compact Flash 5 series AP-CFxxxxRXXS-XXXXXXA Revision History Revision Date Description Remark 1.0 06/19/2012 Official release 1.1 09/07/2012 Revised Product Ordering Information Updated performance and product ordering information due to change in NAND flash use 1.2 08/07/2013 Updated the address of Taiwan headquarter Added endurance (TBW) section Added AC/DC characteristics and timing information 1.3 12/04/2013 Updated command sets Added humidity information in the environmental section 43 © 2013 Apacer Technology Inc. Rev. 1.3 Compact Flash 5 series AP-CFxxxxRXXS-XXXXXXA Global Presence Taiwan (Headquarters) Apacer Technology Inc. Apacer Technology Inc. 1F., No.32, Zhongcheng Rd., Tucheng Dist., New Taipei City 236, Taiwan R.O.C. Tel: 886-2-2267-8000 Fax: 886-2-2267-2261 amtsales@apacer.com U.S.A. Apacer Memory America, Inc. 386 Fairview Way, Suite102, Milpitas, CA 95035 Tel: 1-408-518-8699 Fax: 1-408-935-9611 sa@apacerus.com Japan Apacer Technology Corp. 5F, Matsura Bldg., Shiba, Minato-Ku Tokyo, 105-0014, Japan Tel: 81-3-5419-2668 Fax: 81-3-5419-0018 jpservices@apacer.com Europe Apacer Technology B.V. Science Park Eindhoven 5051 5692 EB Son, The Netherlands Tel: 31-40-267-0000 Fax: 31-40-267-0000#6199 sales@apacer.nl China Apacer Electronic (Shanghai) Co., Ltd 1301, No.251,Xiaomuqiao Road, Shanghai, 200032, China Tel: 86-21-5529-0222 Fax: 86-21-5206-6939 sales@apacer.com.cn India Apacer Technologies Pvt. Ltd. # 535, 1st Floor, 8th cross, JP Nagar 3rd Phase, Bangalore – 560078, India Tel: 91-80-4152-9061 sales_india@apacer.com 44 © 2013 Apacer Technology Inc. Rev. 1.3
AP-CF256MR9NS-NRA 价格&库存

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