SGV02G72A1BD1MT-CCRT 数据手册
Data Sheet
Rev.1.0
20.06.2011
2048MB DDR3 – SDRAM ECC XR-DIMMTM
240 Pin ECC XR-DIMMTM
Features:
SGV02G72A1BC1SA-xxRT
2GB in FBGA Technology
RoHS compliant
Options:
Data Rate / Latency
DDR3 1066 MT/s CL7
DDR3 1333 MT/s CL9
Module density
2048MB with 9 dies and 1 rank
Standard Grade
Marking
-BB
-CC
(TA)
(TC)
(TA)
(TC)
0°C to 70°C
0°C to 85°C
-40°C to 85°C
-40°C to 95°C
Environmental Requirements:
Grade W
Operating temperature (ambient)
Standard Grade
0°C to 70°C
Grade W
-40°C to 85°C
Operating Humidity
10% to 90% relative humidity, noncondensing
Operating Pressure
105 to 69 kPa (up to 10000 ft.)
Storage Temperature
-55°C to 100°C
Storage Humidity
5% to 95% relative humidity, noncondensing
Storage Pressure
1682 PSI (up to 5000 ft.) at 50°C
eXtreme Rugged 240-pin 72-bit DDR3 Small Outline
Double Data Rate synchronous DRAM Module
67.5 mm x 38 mm module that stacks 7.36mm above
CPU board
Samtec BSH-120-01-X-D-A connector
Socket ANSI/VITA 47-2005 shock and vibration compliant
Module organization: single rank 256M x 72
VDD = 1.5V ±0.075V, VDDQ 1.5V ±0.075V
1.5V I/O ( SSTL_15 compatible)
Fly-by-bus with termination for C/A & CLK bus
On-board I2C temperature sensor with integrated serial
presence-detect (SPD) EEPROM
Compatible to XR-DIMM™ 2.0 specification of SFF-SIG
(see www.sff-sig.org)
The pcb and all components are manufactured according
to the RoHS compliance specification
[EU Directive 2002/95/EC Restriction of Hazardous
Substances (RoHS)]
DDR3 - SDRAM component Samsung K4B2G0846C
256Mx8 DDR3 SDRAM in PG-TFBGA-78 package
8-bit prefetch architecture
Programmable CAS Latency, CAS Write Latency, Additive
Latency, Burst Length and Burst Type.
On-Die-Termination (ODT) and Dynamic ODT for
improved signal integrity.
Refresh, Self Refresh and Power Down Modes.
Figure: mechanical dimensions
1
1
if no tolerances specified ± 0.15mm
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Page 1
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Data Sheet
Rev.1.0
20.06.2011
This Swissbit module is a highly ruggedized 240-pin 72bit DDR3 SDRAM ECC Small Outline module which is
organized as 256Mx72 high speed CMOS memory arrays. Enhanced ruggedness is obtained through the use of
a high-performance, 240-pin socket connector system and the use of standoffs with screw attachment firmly
holding the CPU and memory module together. The module uses internally configured octal-bank DDR3 SDRAM
devices. The module uses double data rate architecture to achieve high-speed operation. DDR3 SDRAM
modules operate from a differential clock (CK and CK#). READ and WRITE accesses to a DDR3 SDRAM module
is burst-oriented; accesses start at a selected location and continue for a programmed number of locations in a
programmed sequence. The burst length is either four or eight locations. An auto precharge function can be
enabled to provide a self-timed row precharge that is initiated at the end of a burst access. The DDR3 SDRAM
devices have a multibank architecture which allows a concurrent operation that is providing a high effective
bandwidth. A self refresh mode is provided and a power-saving ―power-down‖ mode. All inputs and all full drivestrength outputs are SSTL_15 compatible.
The DDR3 SDRAM module uses the serial presence detect (SPD) function implemented via serial EEPROM
2
using the standard I C protocol. This nonvolatile storage device contains 256 bytes. The first 128 bytes are
utilized by the XR-DIMM manufacturer (Swissbit) to identify the module type, the module’s organization and
several timing parameters. The second 128 bytes are available to the end user.
Module Configuration
Organization
DDR3 SDRAMs used
Row
Addr.
Device Bank
Addr.
256M x 72bit
9 x 256M x 8bit (2048Mbit)
15
BA0, BA1, BA2
Column
Refresh
Addr.
10
8k
Module
Bank Select
S0#
Module Dimensions
in mm
67.5mm (long) x 38mm(high) x 7.36mm(standoff from CPU board)
Timing Parameters
Part Number
Module Density
Transfer Rate
Clock Cycle/Data bit rate
Latency
SGV02G72A1BC1SA-BB[W]RT
2048 MB
8.5 GB/s
1.87ns/1066MT/s
7-7-7
SGV02G72A1BC1SA-CC[W]RT
2048 MB
10.6 GB/s
1.5ns/1333MT/s
9-9-9
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Page 2
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Data Sheet
Rev.1.0
20.06.2011
Pin Name
Symbol
Type
A0–A14
IN
BA0–BA2
Polarity
Function
—
During a Bank Activate command cycle, address input defines the row address (RA0–
RA14).
During a Read or Write command cycle, address input defines the column address. In
addition to the column address, AP is used to invoke autoprecharge operation at the end
of the burst read or write cycle. If AP is high, autoprecharge is selected and BA0, BA1,
BA2 defines the bank to be precharged. If AP is low, autoprecharge is disabled. During a
Precharge command cycle, AP is used in conjunction with BA0, BA1, BA2 to control
which bank(s) to precharge. If AP is high, all banks will be precharged regardless of the
state of BA0, BA1 or BA2. If AP is low, BA0, BA1 and BA2 are used to define which
bank to precharge.
A12(BC_n) is sampled during READ and WRITE commands to determine if burst chop
(on-the-fly) will be performed (HIGH, no burst chop; LOW, burst chopped).
Selects which SDRAM bank of eight is activated.
IN
—
CK0_t–CK1_t
CK0_c–CK1_c
IN
Differential
crossing
CK_t and CK_c are differential clock inputs. All the DDR3 SDRAM addr/cntl inputs are
sampled on the crossing of positive edge of CK_t and negative edge of CK_c. Output
(read) data is referenced to the crossing of CK_t and CK_c (Both directions of crossing).
CKE0
IN
Active High
Activates the SDRAM CK signal when high and deactivates the CK signal when low. By
deactivating the clocks, CKE low initiates the Power Down mode, or the Self Refresh
mode.
DM0–DM8
IN
Active High
DM is an input mask signal for write data. Input data is masked when DM is sampled
High coincident with that input data during a write access. DM is sampled on both edges
of DQS. Although DM pins are input only, the DM loading matches the DQ and DQS
loading.
DQ0–DQ63,
CB0–CB7
I/0
—
DQS0_t–DQS8_t
DQS0_c–DQS8_c
I/O
Differential
crossing
Data strobe for input and output data. For raw cards using x16 organized DRAMs, Pins
DQ0–DQ7 are associated with the LDQS_t and LDQS_c pins and Pins DQ8–DQ15 are
associated with UDQS_t and UDQS_c pins.
ODT0
IN
Active High
When high, termination resistance is enabled for all DQ, DQS_t, DQS_c and DM pins,
assuming this function is enabled on the DRAM.
RAS_n, CAS_n,
WE_n
IN
Active Low
RAS_n, CAS_n, and WE_n (along with S_n) define the command being entered.
RESET_n
IN
Active Low
The RESET_n pin is connected to the RESET_n pin on each DRAM. When low, all
DRAMs are set to a known state.
S0_n
IN
Active Low
Enables the associated SDRAM command decoder when low and disables the command
decoder when high. When the command decoder is disabled, new commands are
ignored but previous operations continue. This signal provides for external rank selection
on systems with multiple ranks.
VDD, VSS
Supply
Power and ground for the DDR3 SDRAM input buffers, and core logic. VDD and VDDQ
pins are tied to VDD/VDDQ planes on these modules.
VDDQ
Supply
Power supply for the DDR3 SDRAM output buffers to provide improved noise immunity.
For the DDR3 XR-DIMM designs, VDDQ shares the same power plane as VDD pins.
VTT
Supply
Termination voltage for C/A & Control bus, by default at VDD/2
VDDSPD
Supply
Power supply for SPD EEPROM. This supply is separate from the VDD/VDDQ power
plane. EEPROM supply is operable from 3.0V to 3.6V.
VREFDQ
Supply
Reference voltage for I/O inputs, by default at VDD/2
VREFCA
Supply
Reference voltage for command/address/control inputs, by default at VDD/2
SA0–SA2
IN
—
These signals are tied at the system planar to either VSS or VDDSPD to configure the
serial SPD EEPROM address range.
SDA
I/O
—
This bidirectional pin is used to transfer data into or out of the SPD EEPROM. An
external resistor may be connected from the SDA bus line to VDDSPD to act as a pullup
on the system board.
SCL
IN
—
This signal is used to clock data into and out of the SPD EEPROM. An external resistor
may be connected from the SCL bus time to VDDSPD to act as a pullup on the system
board.
EVENT_n
Output
(Open Drain)
Active Low
NC(TEST)
NC
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Data and Check Bit Input/Output pins.
This signal indicates that a thermal event has been detected in the thermal sensing
device. The system should guarantee the electrical level requirement is met for the
EVENT_n pin on the TS/SPD part.
Used by memory bus analysis tools (unused (NC) on memory module)
Not connected
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Page 3
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Data Sheet
Rev.1.0
20.06.2011
Pin Configuration
Pin#
Symbol
Pin#
Symbol
Pin#
1
3
5
7
9
11
13
15
17
19
21
23
25
27
29
31
33
35
37
39
41
43
45
47
VSS
VSS
DQ0
DQ1
VSS
DQS0_c
DQS0_t
VSS
DQ2
DQ3
VSS
DQ8
DQ9
VSS
DQS1_c
DQS1_t
VSS
DQ10
DQ11
VSS
DQ16
DQ17
VSS
DQS2_c
49
51
53
55
57
59
61
63
65
67
69
71
73
75
77
79
81
83
85
87
89
91
93
95
DQS2_t
VSS
DQ18
DQ19
VSS
DQ24
DQ25
VSS
DQS3_c
DQS3_t
VSS
DQ26
DQ27
VSS
CB0
CB1
VSS
DQS8_c
DQS8_t
VSS
CB2
CB3
VSS
VTT
97
99
101
103
105
107
109
111
113
115
117
119
121
123
125
127
129
131
133
135
137
139
141
143
Pin#
Symbol
Pin#
Symbol
2
4
6
8
10
12
14
16
18
20
22
24
26
28
30
32
34
36
38
40
42
44
46
48
VSS
VSS
DQ4
DQ5
VSS
DM0
VSS
DQ6
DQ7
VSS
DQ12
DQ13
VSS
DM1
VSS
DQ14
DQ15
VSS
DQ20
DQ21
VSS
VREFDQ
NC (TEST)
VSS
50
52
54
56
58
60
62
64
66
68
70
72
74
76
78
80
82
84
86
88
90
92
94
96
DM2
VSS
DQ22
DQ23
VSS
DQ28
DQ29
VSS
DM3
VSS
DQ30
DQ31
VSS
CB4
CB5
VSS
DM8
VSS
CB6
CB7
VSS
RESET_n
NC (ERR_OUT_n)
VTT
Odd Row
Symbol
CKE0
VDD
BA2
VDD
A11
A7
VDD
A5
A4
VDD
A2
VDD
CK1_t
CK1_n
VDD
VREFCA
NC (PAR_IN)
VDD
A10/AP
BA0
VDD
WE_n
CAS_n
VDD
Even Row
Pin#
Symbol
98
100
102
104
106
108
110
112
114
116
118
120
122
124
126
128
130
132
134
136
138
140
142
144
NC (CKE1)
VDD
NC (A15)
A14
VDD
A12/BC
A9
VDD
A8
A6
VDD
A3
A1
VDD
CK0_t
CK0_c
VDD
EVENT_n
A0
VDD
BA1
VDD
RAS_n
S0_n
Pin#
Symbol
Pin#
Symbol
145
147
149
151
153
155
157
159
161
163
165
167
169
171
173
175
177
179
181
183
185
187
189
191
NC (S1_n)
NC (ODT1)
VDD
NC (S3_n)
VSS
DQ32
DQ33
VSS
DQS4_c
DQS4_t
VSS
DQ34
DQ35
VSS
DQ40
DQ41
VSS
DQS5_c
DQS5_t
VSS
DQ42
DQ43
VSS
DQ48
193
195
197
199
201
203
205
207
209
211
213
215
217
219
221
223
225
227
229
231
233
235
237
239
DQ49
VSS
DQS6_c
DQS6_t
VSS
DQ50
DQ51
VSS
DQ56
DQ57
VSS
DQS7_c
DQS7_t
VSS
DQ58
DQ59
VSS
SA2
VSS
NC (SATA_RX_p)
NC (SATA_RX_n)
VSS
VTT
VTT
Pin#
Symbol
Pin#
Symbol
146
148
150
152
154
156
158
160
162
164
166
168
170
172
174
176
178
180
182
184
186
188
190
192
VDD
ODT0
A13
VDD
NC (S2_n)
VSS
DQ36
DQ37
VSS
DM4
VSS
DQ38
DQ39
VSS
DQ44
DQ45
VSS
DM5
VSS
DQ46
DQ47
VSS
DQ52
DQ53
194
196
198
200
202
204
206
208
210
212
214
216
218
220
222
224
226
228
230
232
234
236
238
240
VSS
DM6
VSS
DQ54
DQ55
VSS
DQ60
DQ61
VSS
DM7
VSS
DQ62
DQ63
VSS
VDDSPD
SA0
SA1
SCL
SDA
VSS
NC (SATA_TX_n)
NC (SATA_TX_p)
VSS
VTT
(Sig): Signal in brackets may be routed to the socket connector, but is not used on the module
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Page 4
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Data Sheet
Rev.1.0
20.06.2011
Mechanical Specifications
Connector on Memory Module (BSH-120-01-X-D-A)
Top view:
Bottom view:
Front view:
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Page 5
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Data Sheet
Rev.1.0
20.06.2011
FUNCTIONAL BLOCK DIAGRAMM 2048MB DDR3 SDRAM XR-DIMM,
1 RANK AND 9 COMPONENTS
S0
DQS4
DQS4
DM4
DQS0
DQS0
DM0
DM
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
I/O 0
I/O 1
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
CS
DM
DQS DQS
D0
ZQ
DQ32
DQ33
DQ34
I/O 0
I/O 1
I/O 2
DQ35
DQ36
DQ37
DQ38
DQ39
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
DQ40
DQ41
DQ42
I/O 0
I/O 1
I/O 2
DQ43
DQ44
DQ45
DQ46
DQ47
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
DQ48
DQ49
DQ50
I/O 0
I/O 1
I/O 2
DQ51
DQ52
DQ53
DQ54
DQ55
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
DQ56
DQ57
DQ58
I/O 0
I/O 1
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
CS
DQS DQS
D4
ZQ
DQS5
DQS5
DM5
DQS1
DQS1
DM1
DM
DQ8
DQ9
DQ10
I/O 0
I/O 1
I/O 2
DQ11
DQ12
DQ13
DQ14
DQ15
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
CS
DM
DQS DQS
D1
ZQ
CS
DQS DQS
D5
ZQ
DQS6
DQS6
DM6
DQS2
DQS2
DM2
DM
DQ16
DQ17
DQ18
I/O 0
I/O 1
I/O 2
DQ19
DQ20
DQ21
DQ22
DQ23
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
CS
DM
DQS DQS
D2
ZQ
CS
DQS DQS
D6
ZQ
DQS7
DQS7
DM7
DQS3
DQS3
DM3
DM
DQ24
DQ25
DQ26
I/O 0
I/O 1
I/O 2
DQ27
DQ28
DQ29
DQ30
DQ31
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
CB0
CB1
CB2
I/O 0
I/O 1
I/O 2
CB3
CB4
CB5
CB6
CB7
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
CS
DM
DQS DQS
D3
ZQ
DQ59
DQ60
DQ61
DQ62
DQ63
CS
DQS DQS
D7
ZQ
DQS8
DQS8
DM8
DM
BA0-BA2
A0-A14
RAS
CAS
WE
ODT0
CKE0
CK0
CK0
RESET
CS
DQS DQS
D8
ZQ
SPD
D0-D8
VREFDQ
D0-D8
VREFCA
D0-D8
VSS
D0-D8
Notes:
1. DQ-to-I/O wiring is shown as recommended but may
be changed.
2. DQ/DQS/DQS/ODT/DM/CKE/S relationship must be
maintained as shown.
3. DQ, DM, DQS/DQS resistors: Refer to associated
topology diagram.
4. Refer to the appropriate clock wiring topology under
the DIMM wiring details section of the JEDED document.
5. For each DRAM, a unique ZQ resistor is connected to
GND. The ZQ resistor is 240O±1%.
6. Refer to associated figure for SPD details.
BA0-BA2: SDRAM D0-D8
A0-A14: SDRAM D0-D8
RAS: SDRAM D0-D8
CAS: SDRAM D0-D8
WE: SDRAM D0-D8
ODT: SDRAM D0-D8
CKE: SDRAM D0-D8
CK: SDRAM D0-D8
CK: SDRAM D0-D8
RESET: SDRAM D0-D8
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Page 6
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Data Sheet
Rev.1.0
20.06.2011
MAXIMUM ELECTRICAL DC CHARACTERISTICS
PARAMETER/ CONDITION
Supply Voltage
I/O Supply Voltage
VDDL Supply Voltage
Voltage on any pin relative to VSS
INPUT LEAKAGE CURRENT
SYMBOL
VDD
VDDQ
VDDL
VIN, VOUT
Any input 0V ≤ VIN ≤ VDD, VREF pin 0V ≤ VIN ≤ 0.95V
(All other pins not under test = 0V)
MIN
-0.4
-0.4
-0.4
-0.4
MAX
1.975
1.975
1.975
1.975
II
UNITS
V
V
V
V
µA
Command/Address
-16
16
IOZ
-16
-2
-5
16
2
5
µA
IVREF
-8
8
µA
RAS#, CAS#, WE#, S#, CKE
CK, CK#
DM
OUTPUT LEAKAGE CURRENT
(DQ’s and ODT are disabled; 0V ≤ VOUT ≤ VDDQ)
DQ, DQS, DQS#
VREF LEAKAGE CURRENT ; VREF is on a valid level
DC OPERATING CONDITIONS
PARAMETER/ CONDITION
Supply Voltage
I/O Supply Voltage
VDDL Supply Voltage
I/O Reference Voltage
I/O Termination Voltage (system)
Input High (Logic 1) Voltage
Input Low (Logic 0) Voltage
SYMBOL
MIN
VDD
1.425
VDDQ
1.425
VDDL
1.425
VREF
0.49 x VDDQ
VTT
0.49 x VDDQ-20mV
VIH (DC)
VREF + 0.1
VIL (DC)
-0.3
NOM
1.5
1.5
1.5
0.50 x VDDQ
0.50 x VDDQ
MAX
1.575
1.575
1.575
0.51x VDDQ
0.51x VDDQ+20mV
VDDQ + 0.3
VREF – 0.1
UNITS
V
V
V
V
V
V
V
AC INPUT OPERATING CONDITIONS
PARAMETER/ CONDITION
Input High (Logic 1) Voltage
Input Low (Logic 0) Voltage
SYMBOL
VIH (AC)
VIL (AC)
MIN
VREF + 0.175
-
MAX
VREF - 0.175
UNITS
V
V
CAPACITANCE
At DDR3 data rates, it is recommended to simulate the performance of the module to achieve optimum values.
When inductance and delay parameters associated with trace lengths are used in simulations, they are
significantly more accurate and realistic than a gross estimation of module capacitance. Simulations can then
render a considerably more accurate result. DDR3 modules are now designed by using simulations to close
timing budgets.
Swissbit AG
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Page 7
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Data Sheet
Rev.1.0
20.06.2011
IDD Specifications and Conditions
(0°C ≤ TCASE ≤ + 85°C; VDDQ = +1.5V ± 0.075V, VDD = +1.5V ± 0.075V)
Parameter
& Test Condition
Symbol
OPERATING CURRENT *) :
One device bank Active-Precharge;
tRC= tRC (IDD); tCK = tCK (IDD); CKE is HIGH, CS# is HIGH
between valid commands;
DQ inputs changing once per clock cycle; Address and
control inputs changing once every two clock cycles
OPERATING CURRENT *) :
One device bank; Active-Read-Precharge;
IOUT = 0mA; BL = 4, CL = CL (IDD), AL = 0;
tCK = tCK (IDD), tRC= tRC (IDD), tRAS = tRAS MIN (IDD),
tRCD = tRCD (IDD); CKE is HIGH, CS# is HIGH between
valid commands; Address inputs changing once every
two clock cycles; Data Pattern is same as IDD4W
Fast Exit
PRECHARGE POWER-DOWN
CURRENT:
All device banks idle; Power-down mode;
tCK = tCK (IDD); CKE is LOW; All Control and Slow Exit
Address bus inputs are not changing; DQ’s
are floating at VREF
PRECHARGE QUIET STANDBY CURRENT:
All device banks idle;
tCK = tCK (IDD); CKE is HIGH, CS# is HIGH;
All Control and Address bus inputs are not changing;
DQ’s are floating at VREF
PRECHARGE STANDBY CURRENT:
All device banks idle;
tCK = tCK (IDD); CKE is HIGH, CS# is HIGH;
All other Control and Address bus inputs are changing
once every two clock cycles; DQ inputs changing once
per clock cycle
ACTIVE POWER-DOWN CURRENT:
All device banks open; tCK = tCK (IDD); CKE is LOW; All
Control and Address bus inputs are not changing; DQ’s
are floating at VREF (always fast exit)
ACTIVE STANDBY CURRENT:
All device banks open; tCK = tCK (IDD),
tRAS = tRAS MAX (IDD), tRP = tRP (IDD);
CKE is HIGH, CS# is HIGH between valid commands;
All other Control and Address bus inputs are changing
once every two clock cycles; DQ inputs changing once
per clock cycle
OPERATING READ CURRENT:
All device banks open, Continuous burst reads; One
module rank active; IOUT = 0mA; BL = 4, CL = CL (IDD),
AL = 0; tCK = tCK (IDD), tRAS = tRAS MAX (IDD), tRP = tRP
(IDD); CKE is HIGH, CS# is HIGH between valid
commands; Address bus inputs are changing once
every two clock cycles; DQ inputs changing once per
clock cycle
Swissbit AG
Industriestrasse 4
CH – 9552 Bronschhofen
Fon: +41 (0) 71 913 03 03
Fax: +41 (0) 71 913 03 15
max.
Unit
10600-999
8500-777
IDD0
540
495
mA
IDD1
675
630
mA
IDD2P
180
180
mA
108
108
IDD2Q
270
270
mA
IDD2N
315
270
mA
IDD3P
270
270
mA
IDD3N
495
450
mA
IDD4R
1035
900
mA
www.swissbit.com
eMail: info@swissbit.com
Page 8
of 16
Data Sheet
Parameter
& Test Condition
Rev.1.0
Symbol
OPERATING WRITE CURRENT:
All device banks open, Continuous burst writes; One
module rank active; BL = 4, CL = CL (IDD), AL = 0;
tCK = tCK (IDD), tRAS = tRAS MAX (IDD), tRP = tRP (IDD);
CKE is HIGH, CS# is HIGH between valid commands;
Address bus inputs are changing once every two clock
cycles; DQ inputs changing once per clock cycle
BURST REFRESH CURRENT:
tCK = tCK (IDD); refresh command at every tRFC (IDD)
interval, CKE is HIGH, CS# is HIGH between valid
commands; All other Control and Address bus inputs
are changing once every two clock cycles; DQ inputs
changing once per clock cycle
SELF REFRESH CURRENT:
CK and CK# at 0V; CKE ≤ 0.2V; All other Control and
Address bus inputs are floating at VREF; DQ’s are
floating at VREF
OPERATING CURRENT *) :
Four device bank interleaving READs, IOUT = 0mA; BL = 4,
CL = CL (IDD), AL = tRCD (IDD) – 1 x tCK (IDD); tCK = tCK
(IDD), tRC = tRC (IDD), tRRD = tRRD (IDD), tRCD = tRCD (IDD);
CKE is HIGH, CS# is HIGH between valid commands;
Address bus inputs are not changing during
DESELECT; DQ inputs changing once per clock cycle
20.06.2011
max.
Unit
10600-999
8500-777
IDD4W
1260
1035
mA
IDD5
1530
1530
mA
IDD6
108
108
mA
IDD7
1890
1530
mA
*) Value calculated as one module rank in this operating condition, and all other module ranks in IDD2P (CKE LOW)
mode.
TIMING VALUES USED FOR IDD MEASUREMENT
IDD MEASUREMENT CONDITIONS
SYMBOL
10600-999
8500-777
9
7
CL (IDD)
13.5
13.125
tRCD (IDD)
49.5
50.625
tRC (IDD)
6
7.5
tRRD (IDD)
1.5
1.87
tCK (IDD)
36
37.5
tRAS MIN (IDD)
70’200
70’200
tRAS MAX (IDD)
13.5
13.125
tRP (IDD)
160
160
tRFC (IDD)
Swissbit AG
Industriestrasse 4
CH – 9552 Bronschhofen
Unit
tCK
ns
ns
ns
ns
ns
ns
ns
ns
Fon: +41 (0) 71 913 03 03
Fax: +41 (0) 71 913 03 15
www.swissbit.com
eMail: info@swissbit.com
Page 9
of 16
Data Sheet
Rev.1.0
20.06.2011
DDR3 SDRAM COMPONENT ELECTRICAL CHARACTERISTICS AND RECOMMENDED
AC OPERATING CONDITIONS
(0°C ≤ TCASE ≤ + 85°C; VDDQ = +1.5V ± 0.075V, VDD = +1.5V ± 0.075V)
AC CHARACTERISTICS
PARAMETER
Clock cycle time
CL = 10
CL = 9
CL = 8
CL = 7
CL = 6
CK high-level width
CK low-level width
Data-out high-impedance
window from CK/CK#
Data-out low-impedance window
from CK/CK#
DQ and DM input setup time
relative to DQS
tCK (10)
tCK (9)
tCK (8)
tCK (7)
tCK (6)
tCH (avg)
tCL (avg)
tHZ
10600-999
MIN
MAX
1.5