Data Sheet
Rev.1.2
18.11.2010
1GB DDR2 – SDRAM UDIMM
Features:
240 Pin UDIMM
SEU01G64A3BF1SA-25R
1GB PC2-6400 in FBGA Technology
RoHS compliant
Options:
Data Rate / Latency
DDR2 800 MT/s CL6
DDR2 667 MT/s CL5
Module Density
1024MB with 8 dies and 1 rank
Standard Grade
Marking
-25
-30
240-pin 64-bit Dual-In-Line Double Data Rate
Synchronous DRAM Module
Module organization: single rank 128M x 64
VDD = 1.8V ±0.1V, VDDQ 1.8V ±0.1V
1.8V I/O ( SSTL_18 compatible)
Auto Refresh (CBR) and Self Refresh 8k Refresh
every 64ms
Serial Presence Detect with EEPROM
Gold-contact pad
This module is fully pin and functional compatible to
the JEDEC PC2-6400 spec. and JEDEC- Standard
MO-237. (see www.jedec.org)
The pcb and all components are manufactured
according to the RoHS compliance specification
[EU Directive 2002/95/EC Restriction of Hazardous
Substances (RoHS)]
(TA)
(Tc)
0°C to 70°C
0°C to 85°C
Environmental Requirements:
Operating temperature (ambient)
standard Grade
0°C to 70°C
Operating Humidity
10% to 90% relative humidity, noncondensing
Operating Pressure
105 to 69 kPa (up to 10000 ft.)
Storage Temperature
-55°C to 100°C
Storage Humidity
5% to 95% relative humidity, noncondensing
Storage Pressure
1682 PSI (up to 5000 ft.) at 50°C
DDR2 - SDRAM component SAMSUNG
K4T1G084QF DIE Rev. F
128Mx8 DDR2 SDRAM in FBGA-60 package
4-bit prefetch architecture
DLL to align DQ and DQS transitions with CK
Multiple internal device banks for concurrent operation
Programmable CAS latency (CL)
Posted CAS additive latency (AL)
WRITE latency = READ latency – 1 tCK
Programmable burst length: 4 or 8
Adjustable data-output drive strength
On-die termination (ODT)
Figure: mechanical dimensions
1
1
if no tolerances specified ± 0.15mm
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Page 1
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Data Sheet
Rev.1.2
18.11.2010
This Swissbit module is an industry standard 240-pin 8-byte DDR2 SDRAM Dual-In-line Memory Module
(UDIMM) which is organized as x64 high speed CMOS memory arrays. The module uses internally configured
octal-bank DDR2 SDRAM devices. The module uses double data rate architecture to achieve high-speed
operation. DDR2 SDRAM modules operate from a differential clock (CK and CK#). READ and WRITE accesses
to a DDR2 SDRAM module is burst-oriented; accesses start at a selected location and continue for a
programmed number of locations in a programmed sequence. The burst length is either four or eight locations. An
auto precharge function can be enabled to provide a self-timed row precharge that is initiated at the end of a burst
access. The DDR2 SDRAM devices have a multibank architecture which allows a concurrent operation that is
providing a high effective bandwidth. A self refresh mode is provided and a power-saving “power-down” mode. All
inputs and all full drive-strength outputs are SSTL_18 compatible.
The DDR2 SDRAM module uses the optional serial presence detect (SPD) function implemented via serial
2
EEPROM using the standard I C protocol. This nonvolatile storage device contains 256 bytes. The first 128 bytes
are utilized by the DIMM manufacturer (swissbit) to identify the module type, the module’s organization and
several timing parameters. The second 128 bytes are available to the end user.
Module Configuration
Organization
DDR2 SDRAMs used
Row
Addr.
Device Bank
Addr.
Column
Addr.
Refresh
Module
Bank Select
128M x 64bit
8 x 128M x 8bit (1024Mbit)
14
BA0, BA1, BA2
10
8k
S0#
Module Dimensions
in mm
133.35 (long) x 30(high) x 2.70 [max] (thickness)
Timing Parameters
Part Number
SEU01G64A3BF1SA-25R
SEU01G64A3BF1SA-30R
Module Density
1024 MB
1024 MB
Transfer Rate
6.4 GB/s
5.3 GB/s
Clock Cycle/Data bit rate
2.5ns/800MT/s
3.0ns/667MT/s
Latency
6-6-6
5-5-5
Pin Name
A0-9, A11 – A13
Address Inputs
A10/AP
Address Input / Autoprecharge Bit
BA0 – BA2
Bank Address Inputs
DQ0 – DQ63
Data Input / Output
DM0-DM7
Input Data Mask
DQS0 - DQS7
Data Strobe, positive line
DQS0# - DQS7#
Data Strobe, negative line (only used when differential data strobe mode is enabled)
RAS#
Row Address Strobe
CAS#
Column Address Strobe
WE#
Write Enable
CKE0
Clock Enable
S0#
Chip Select
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Page 2
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Data Sheet
Rev.1.2
CK0
Clock Inputs, positive line
CK0#
Clock Inputs, negative line
VDD
Supply Voltage (1.8V± 0.1V)
VREF
Input / Output Reference
VSS
Ground
VDDSPD
Serial EEPROM Positive Power Supply
SCL
Serial Clock for Presence Detect
SDA
Serial Data Out for Presence Detect
SA0 – SA1
Presence Detect Address Inputs
ODT0
On-Die Termination
NC
No Connection
18.11.2010
Pin Configuration
PIN #
Front Side
PIN #
Back Side
PIN #
Front Side
PIN #
Back Side
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
VREF
VSS
DQ0
DQ1
VSS
DQS0#
DQS0
VSS
DQ2
DQ3
VSS
DQ8
DQ9
VSS
DQS1#
DQS1
VSS
NC(RESET#)
NC
VSS
DQ10
DQ11
VSS
DQ16
DQ17
VSS
DQS2#
DQS2
VSS
DQ18
DQ19
VSS
121
122
123
124
125
126
127
128
129
130
131
132
133
134
135
136
137
138
139
140
141
142
143
144
145
146
147
148
149
150
151
152
VSS
DQ4
DQ5
VSS
DM0 (DQS9)
NC (DQS9#)
VSS
DQ6
DQ7
VSS
DQ12
DQ13
VSS
DM1 (DQS10)
NC (DQS10#)
VSS
NC (CK1)
NC (CK1#)
VSS
DQ14
DQ15
VSS
DQ20
DQ21
VSS
DM2 (DQS11)
NC (DQS11#)
VSS
DQ22
DQ23
VSS
DQ28
61
62
63
64
65
66
67
68
69
70
71
72
73
74
75
76
77
78
79
80
81
82
83
84
85
86
87
88
89
90
91
92
A4
VDDQ
A2
VDD
VSS
VSS
VDD
NC (Par_In)
VDD
A10/AP
BA0
VDDQ
WE#
CAS#
VDDQ
NC (S1#)
NC (ODT1)
VDDQ
VSS
DQ32
DQ33
VSS
DQS4#
DQS4
VSS
DQ34
DQ35
VSS
DQ40
DQ41
VSS
DQS5#
181
182
183
184
185
186
187
188
189
190
191
192
193
194
195
196
197
198
199
200
201
202
203
204
205
206
207
208
209
210
211
212
VDDQ
A3
A1
VDD
CK0
CK0#
VDD
A0
VDD
BA1
VDDQ
RAS#
S0#
VDDQ
ODT0
A13
VDD
VSS
DQ36
DQ37
VSS
DM4 (DQS13)
NC (DQS13#)
VSS
DQ38
DQ39
VSS
DQ44
DQ45
VSS
DM5 (DQS14)
NC (DQS14#)
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Page 3
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Data Sheet
Rev.1.2
18.11.2010
PIN #
Front Side
PIN #
Back Side
PIN #
Front Side
PIN #
Back Side
33
34
35
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50
51
52
53
54
55
56
57
58
59
60
DQ24
DQ25
VSS
DQS3#
DQS3
VSS
DQ26
DQ27
VSS
NC (CB0)
NC (CB1)
VSS
NC (DQS8#)
NC (DQS8)
VSS
NC (CB2)
NC (CB3)
VSS
VDD
CKE0
VDD
BA2
NC(Par_Out)
VDDQ
A11
A7
VDD
A5
153
154
155
156
157
158
159
160
161
162
163
164
165
166
167
168
169
170
171
172
173
174
175
176
177
178
179
180
DQ29
VSS
DM3 (DQS12)
NC (DQS12#)
VSS
DQ30
DQ31
VSS
NC (CB4)
NC (CB5)
VSS
NC (DM8,DQS17)
NC (DQS17#)
VSS
NC (CB6)
NC (CB7)
VSS
VDDQ
NC (CKE1)
VDD
NC (A15)
NC (A14)
VDDQ
A12
A9
VDD
A8
A6
93
94
95
96
97
98
99
100
101
102
103
104
105
106
107
108
109
110
111
112
113
114
115
116
117
118
119
120
DQS5
VSS
DQ42
DQ43
VSS
DQ48
DQ49
VSS
SA2
NC (TEST)
VSS
DQS6#
DQS6
VSS
DQ50
DQ51
VSS
DQ56
DQ57
VSS
DQS7#
DQS7
VSS
DQ58
DQ59
VSS
SDA
SCL
213
214
215
216
217
218
219
220
221
222
223
224
225
226
227
228
229
230
231
232
233
234
235
236
237
238
239
240
VSS
DQ46
DQ47
VSS
DQ52
DQ53
VSS
CK2/RFU
CK2#/RFU
VSS
DM6 (DQS15)
NC (DQS15#)
VSS
DQ54
DQ55
VSS
DQ60
DQ61
VSS
DM7 (DQS16)
NC (DQS16#)
VSS
DQ62
DQ63
VSS
VDDSPD
SA0
SA1
(Sig): Signal in brackets may be routed to the socket connector, but is not used on the module
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Page 4
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Data Sheet
Rev.1.2
18.11.2010
FUNCTIONAL BLOCK DIAGRAMM 1024MB DDR2 SDRAM DIMM,
1 RANK AND 8 COMPONENTS
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Page 5
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Data Sheet
Rev.1.2
18.11.2010
MAXIMUM ELECTRICAL DC CHARACTERISTICS
PARAMETER/ CONDITION
Supply Voltage
I/O Supply Voltage
VDDL Supply Voltage
Voltage on any pin relative to VSS
INPUT LEAKAGE CURRENT
SYMBOL
VDD
VDDQ
VDDL
Vin, Vout
Any input 0V ≤ VIN ≤ VDD, VREF pin 0V ≤ VIN ≤ 0.95V
(All other pins not under test = 0V)
MIN
-1.0
-0.5
-0.5
-0.5
MAX
2.3
2.3
2.3
2.3
II
UNITS
V
V
V
V
µA
Command/Address
-40
40
IOZ
-20
-5
-5
20
5
5
µA
IVREF
-16
16
µA
NOM
1.8
1.8
1.8
0.50 x VDDQ
VREF
MAX
1.9
1.9
1.9
0.51x VDDQ
VREF + 0.04
VDDQ + 0.3
VREF – 0.125
UNITS
V
V
V
V
V
V
V
MIN
VREF + 0.25
-
MAX
VREF - 0.25
UNITS
V
V
RAS#, CAS#, WE#, S#, CKE
CK, CK#
DM
OUTPUT LEAKAGE CURRENT
(DQ’s and ODT are disabled; 0V ≤ VOUT ≤ VDDQ)
DQ, DQS, DQS#
VREF LEAKAGE CURRENT ; VREF is on a valid level
DC OPERATING CONDITIONS
PARAMETER/ CONDITION
Supply Voltage
I/O Supply Voltage
VDDL Supply Voltage
I/O Reference Voltage
I/O Termination Voltage (system)
Input High (Logic 1) Voltage
Input Low (Logic 0) Voltage
SYMBOL
VDD
VDDQ
VDDL
VREF
VTT
VIH (DC)
VIL (DC)
MIN
1.7
1.7
1.7
0.49 x VDDQ
VREF – 0.04
VREF + 0.125
-0.3
AC INPUT OPERATING CONDITIONS
PARAMETER/ CONDITION
Input High (Logic 1) Voltage
Input Low (Logic 0) Voltage
SYMBOL
VIH (AC)
VIL (AC)
CAPACITANCE
At DDR2 data rates, it is recommended to simulate the performance of the module to achieve optimum values.
When inductance and delay parameters associated with trace lengths are used in simulations, they are
significantly more accurate and realistic than a gross estimation of module capacitance. Simulations can then
render a considerably more accurate result. JEDEC modules are now designed by using simulations to close
timing budgets.
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Page 6
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Data Sheet
Rev.1.2
18.11.2010
IDD Specifications and Conditions
(0°C ≤ TCASE ≤ + 85°C ; VDDQ = +1.8V ± 0.1V, VDD = +1.8V ± 0.1V)
Parameter
& Test Condition
OPERATING CURRENT *) :
One device bank Active-Precharge;
tRC= tRC (IDD); tCK = tCK (IDD); CKE is HIGH, CS# is
HIGH between valid commands;
DQ inputs changing once per clock cycle; Address
and control inputs changing once every two clock
cycles
OPERATING CURRENT *) :
One device bank; Active-Read-Precharge;
IOUT = 0mA; BL = 4, CL = CL (IDD), AL = 0;
tCK = tCK (IDD), tRC= tRC (IDD), tRAS = tRAS MIN (IDD),
tRCD = tRCD (IDD); CKE is HIGH, CS# is HIGH between
valid commands; Address inputs changing once every
two clock cycles; Data Pattern is same as IDD4W
PRECHARGE POWER-DOWN CURRENT:
All device banks idle; Power-down mode;
tCK = tCK (IDD); CKE is LOW; All Control and Address
bus inputs are not changing; DQ’s are floating at VREF
PRECHARGE QUIET STANDBY CURRENT:
All device banks idle;
tCK = tCK (IDD); CKE is HIGH, CS# is HIGH;
All Control and Address bus inputs are not changing;
DQ’s are floating at VREF
PRECHARGE STANDBY CURRENT:
All device banks idle;
tCK = tCK (IDD); CKE is HIGH, CS# is HIGH;
All other Control and Address bus inputs are changing
once every two clock cycles; DQ inputs changing
once per clock cycle
Fast PDN Exit
ACTIVE POWER-DOWN
MR[12] = 0
CURRENT:
All device banks open; tCK = tCK
Slow PDN Exit
(IDD); CKE is LOW; All Control
MR[12] = 1
and Address bus inputs are not
changing; DQ’s are floating at
VREF
ACTIVE STANDBY CURRENT:
All device banks open; tCK = tCK (IDD),
tRAS = tRAS MAX (IDD), tRP = tRP (IDD);
CKE is HIGH, CS# is HIGH between valid commands;
All other Control and Address bus inputs are changing
once every two clock cycles; DQ inputs changing
once per clock cycle
OPERATING READ CURRENT*) :
All device banks open, Continuous burst reads; One
module rank active; IOUT = 0mA; BL = 4, CL = CL (IDD),
AL = 0; tCK = tCK (IDD), tRAS = tRAS MAX (IDD), tRP = tRP
(IDD); CKE is HIGH, CS# is HIGH between valid
commands; Address bus inputs are changing once
every two clock cycles; DQ inputs changing once per
clock cycle
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Symbol
max.
Unit
6400-666
5300-555
IDD0
360
344
mA
IDD1
408
384
mA
IDD2P
80
80
mA
IDD2Q
160
160
mA
IDD2N
200
192
mA
IDD3P
184
176
mA
120
120
IDD3N
256
240
mA
IDD4R
640
560
mA
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Data Sheet
Parameter
& Test Condition
OPERATING WRITE CURRENT*) :
All device banks open, Continuous burst writes; One
module rank active; BL = 4, CL = CL (IDD), AL = 0;
tCK = tCK (IDD), tRAS = tRAS MAX (IDD), tRP = tRP (IDD);
CKE is HIGH, CS# is HIGH between valid commands;
Address bus inputs are changing once every two
clock cycles; DQ inputs changing once per clock cycle
BURST REFRESH CURRENT:
tCK = tCK (IDD); refresh command at every tRFC (IDD)
interval, CKE is HIGH, CS# is HIGH between valid
commands; All other Control and Address bus inputs
are changing once every two clock cycles; DQ inputs
changing once per clock cycle
SELF REFRESH CURRENT:
CK and CK# at 0V; CKE ≤ 0.2V; All other Control and
Address bus inputs are floating at VREF; DQ’s are
floating at VREF
OPERATING CURRENT*) :
Four device bank interleaving READs, IOUT = 0mA; BL = 4,
CL = CL (IDD), AL = tRCD (IDD) – 1 x tCK (IDD); tCK = tCK
(IDD), tRC = tRC (IDD), tRRD = tRRD (IDD), tRCD = tRCD (IDD);
CKE is HIGH, CS# is HIGH between valid commands;
Address bus inputs are not changing during
DESELECT; DQ inputs changing once per clock cycle
Rev.1.2
18.11.2010
Max.
Symbol
Unit
6400-666
5300-555
IDD4W
536
480
mA
IDD5
840
800
mA
IDD6
80
80
mA
IDD7
1280
1160
mA
*) Value calculated as one module rank in this operating condition, and all other module ranks in IDD2P
(CKE LOW) mode.
TIMING VALUES USED FOR IDD MEASUREMENT
IDD MEASUREMENT CONDITIONS
SYMBOL
6400-666
CL (IDD)
6
tRCD (IDD)
15
tRC (IDD)
60
tRRD (IDD)
7.5
tCK (IDD)
2.5
tRAS MIN (IDD)
45
tRAS MAX
70,000
(IDD)
tRP (IDD)
15
tRFC (IDD)
105
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5
15
60
7.5
3.0
45
Unit
70,000
ns
15
105
ns
ns
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tCK
ns
ns
ns
ns
ns
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Page 8
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Data Sheet
Rev.1.2
18.11.2010
DDR2 SDRAM COMPONENT ELECTRICAL CHARACTERISTICS AND RECOMMENDED
AC OPERATING CONDITIONS
(0°C ≤ TCASE ≤ + 85°C ; VDDQ = +1.8V ± 0.1V, VDD = +1.8V ± 0.1V)
AC CHARACTERISTICS
PARAMETER
Clock cycle time
CL = 6
CL = 5
CL = 4
CL = 3
CK high-level width
CK low-level width
Half clock period
Access window (output) of DQS
from CK/CK#
Data-out high-impedance
window from CK/CK#
Data-out low-impedance window
from CK/CK#
DQ and DM input setup time
relative to DQS
DQ and DM input hold time
relative to DQS
DQ and DM input pulse width
( for each input )
Data hold skew factor
DQ-DQS hold, DQS to first DQ
to go non-valid, per access
Data valid output window
DQS input high pulse width
DQS input low pulse width
DQS falling edge to CK rising
- setup time
DQS falling edge from CK rising
- hold time
DQS –DQ skew, DQS to last DQ
valid, per group, per access
DQS read preamble
DQS read postamble
DQS write preamble
DQS write preamble setup time
DQS write postamble
Positive DQS latching edge to
associated clock edge
Write command to first DQS
latching transition
Address and control input pulse
width ( for each input )
Address and control input setup
time
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SYMBOL
tCK (6)
tCK (5)
tCK (4)
tCK (3)
tCH
tCL
tHP
tAC
6400-666
MIN
MAX
2.5
8.0
3.08.03.75
8.0
0.48
0.52
0.48
0.52
min
(tCH, tCL)
-0.40
tHZ
+0.40
5300-555
MIN
MAX
Unit
ns
ns
ns
ns
tCK
tCK
3.0
3.75
5.0
0.48
0.48
min
(tCH, tCL)
8.0
8.0
8.0
0.52
0.52
-0.45
+0.45
ns
+0.45
ns
tAC max
ps
(= tAC max)
-0.45
+0.45
(= tAC min)
(= tAC max)
tLZ
tAC min
tDS
0.05
0.10
ns
tDH
0.125
0.175
ns
tDIPW
0.35
0.35
tCK
tQHS
tAC max
0.3
0.34
ns
ns
tHP - tQHS
tHP - tQHS
tQH - tDQSQ
tQH - tDQSQ
0.35
0.35
0.35
0.35
ns
tCK
tCK
tDSS
0.2
0.2
tCK
tDSH
0.2
0.2
tCK
tQH
tDVW
tDQSH
tDQSL
tDQSQ
tRPRE
tRPST
tWPRE
tWPRES
tWPST
tDQSS
tIPW
tIS
0.2
ns
0.24
ns
1.1
0.6
0.6
tCK
tCK
tCK
ns
tCK
0.9
0.4
0.35
0
0.4
1.1
0.6
0.6
0.9
0.4
0.35
0
0.4
- 0.25
+ 0.25
- 0.25
+ 0.25
tCK
WLtDQSS
WL+
tDQSS
WLtDQSS
WL+
tDQSS
tCK
0.6
0.6
tCK
0.175
0.2
ns
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Page 9
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Data Sheet
Rev.1.2
18.11.2010
DDR2 SDRAM COMPONENT ELECTRICAL CHARACTERISTICS AND RECOMMENDED
AC OPERATING CONDITIONS (Continued)
(0°C ≤ TCASE ≤ + 85°C ; VDDQ = +1.8V ± 0.1V, VDD = +1.8V ± 0.1V)
AC CHARACTERISTICS
PARAMETER
Address and control input hold
time
CAS# to CAS# command delay
ACTIVE to ACTIVE (same bank)
command period
ACTIVE bank a to ACTIVE bank
b command
ACTIVE to READ or WRITE
delay
Four bank Activate period
ACTIVE to PRECHARGE
command
Internal READ to precharge
command delay
Write recovery time
Auto precharge write recovery +
precharge time
Internal WRITE to READ
command delay
PRECHARGE command period
PRECHARGE ALL command
period
LOAD MODE command cycle
time
CKE low to CK, CK# uncertainty
REFRESH to ACTIVE or
REFRESH to REFRESH
command interval
Average periodic refresh interval
Exit SELF REFRESH to nonREAD command
Exit SELF REFRESH to READ
command
Exit SELF REFRESH timing
reference
ODT turn-on delay
ODT turn-on
SYMBOL
tIH
6400-666
MIN
MAX
0.25
5300-555
MIN
MAX
0.275
Unit
ns
tCCD
tRC
2
60
2
60
tCK
ns
tRRD
7.5
7.5
ns
tRCD
15
15
ns
tFAW
tRAS
37.5
45
tRTP
7.5
7.5
ns
tWR
tDAL
15
tWR + tRP
15
tWR + tRP
ns
ns
tWTR
7.5
7.5
ns
tRP
tRPA
15
tRP + tCK
15
tRP + tCK
ns
ns
tMRD
2
2
tCK
tDELAY
tRFC
tREFI
tXSNR
70,000
tIS + tCK + tIH
105
70,000
37.5
45
70,000
tIS + tCK + tIH
105
70,000
7.8
7.8
ns
ns
tCK
ns
µs
ns
tRFC(min)
+ 10
tRFC(min)
+ 10
tXSRD
200
200
tCK
tISXR
tIS
tIS
ps
tAOND
tAON
2
2
2
2
tAC(min)
tAC(max)
+ 1,000
tAC(min)
tAC(max)
+ 1,000
ODT turn-off delay
ODT turn-off
tAOFD
tAOF
2.5
2.5
2.5
2.5
tAC(min)
tAC(min)
ODT turn-on (power-down
mode)
tAONPD
tAC(min) +
2,000
ODT turn-off (power-down
mode)
tAOFPD
tAC(min) +
2,000
tAC(max)
+ 600
2 x tCK +
tAC(max)
+ 1,000
2.5 x tCK +
tAC(max)
+ 1,000
ODT to power-down entry
latency
tANPD
3
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Industriestrass 4
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tAC(max)
+ 600
tAC(min) + 2 x tCK +
2,000
tAC(max)
+ 1,000
tAC(min) + 2.5 x tCK +
2,000
tAC(max)
+ 1,000
3
tCK
ps
tCK
ps
ps
ps
tCK
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Page 10
of 14
Data Sheet
Rev.1.2
18.11.2010
DDR2 SDRAM COMPONENT ELECTRICAL CHARACTERISTICS AND RECOMMENDED
AC OPERATING CONDITIONS (Continued)
(0°C ≤ TCASE ≤ + 85°C ; VDDQ = +1.8V ± 0.1V, VDD = +1.8V ± 0.1V)
AC CHARACTERISTICS
PARAMETER
ODT power-down exit latency
ODT enable from MRS
command
Exit active power-down to READ
command, MR [bit 12 = 0]
Exit active power-down to READ
command, MR [bit 12 = 1]
Exit precharge power-down to
any non-READ command
CKE minimum high/low time
Swissbit AG
Industriestrass 4
CH-9552 Bronschhofen
SYMBOL
tAXPD
tMOD
6400-666
MIN
MAX
8
12
5300-555
MIN
MAX
8
12
Unit
tCK
ns
tXARD
2
2
tCK
tXARDS
8 – AL
7 - AL
tCK
tXP
2
2
tCK
tCKE
3
3
tCK
Fon: +41 (0) 71 913 03 03
Fax: +41 (0) 71 913 03 15
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Page 11
of 14
Data Sheet
Rev.1.2
18.11.2010
SERIAL PRESENCE-DETECT MATRIX
BYTE
DESCRIPTION
6400-666
5300-555
0
NUMBER OF SPD BYTES USED
0x80
1
2
TOTAL NUMBER OF BYTES IN SPD DEVICE
FUNDAMENTAL MEMORY TYPE
0x08
0x08
3
0x0E
5
NUMBER OF ROW ADDRESSES ON ASSEMBLY
NUMBER OF COLUMN ADDRESSES ON
ASSEMBLY
DIMM HIGHT AND MODULE RANKS
6
7
MODULE DATA WIDTH
MODULE DATA WIDTH (continued)
0x40
0x00
8
MODULE VOLTAGE INTERFACE LEVELS (VDDQ)
SDRAM CYCLE TIME, (tCK ) [max CL]
CAS LATENCY = 6 (6400), CL = 5 (5300)
0x05
4
9
0x0A
0x60
0x25
0x30
0x40
0x45
10
SDRAM ACCESS FROM CLOCK, (tAC) [max CL]
CAS LATENCY = 6 (6400); CL = 5 (5300)
11
12
MODULE CONFIGURATION TYPE
REFRESH RATE / TYPE
0x00
0x82
13
14
SDRAM DEVICE WIDTH (PRIMARY SDRAM)
ERROR- CHECKING SDRAM DATA WIDTH
0x08
0x00
16
MINIMUM CLOCK DELAY, BACK-TO-BACK
RANDOM COLUMN ACCESS
BURST LENGTHS SUPPORTED
17
18
NUMBER OF BANKS ON SDRAM DEVICE
CAS LATENCIES SUPPORTED
19
20
MODULE THICKNESS
DDR2 DIMM TYPE
0x01
0x02
21
SDRAM MODULE ATTRIBUTES
0x00
22
SDRAM DEVICE ATTRIBUTES: Weak Driver and 50
ODT
0x07
15
23
24
25
SDRAM CYCLE TIME, (tCK) [max CL – 1]
CAS LATENCY = 5 (6400), CL = 4 (5300)
SDRAM ACCESS FROM CK, (tAC) [max CL – 1]
CAS LATENCY = 5 (6400), CL = 4 (5300)
SDRAM CYCLE TIME, (tCK) [max CL – 2]
CAS LATENCY = 4 (6400), CL = 3 (5300)
0x00
0x0C
0x08
0x70
0x38
0x30
0x3D
0x45
0x50
0x3D
0x50
0x50
0x60
26
SDRAM ACCESS FROM CK, (tAC) [max CL – 2]
CAS LATENCY = 4 (6400), CL = 3 (5300)
27
28
MINIMUM ROW PRECHARGE TIME, (tRP)
MINIMUM ROW ACTIVE TO ROW ACTIVE, (tRRD)
0x3C
0x1E
29
30
MINIMUM RAS# TO CAS# DELAY, (tRCD)
MINIMUM RAS# PULSE WIDTH, (tRAS)
0x3C
0x2D
31
MODULE BANK DENSITY
0x01
Swissbit AG
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CH-9552 Bronschhofen
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Page 12
of 14
Data Sheet
Rev.1.2
18.11.2010
SERIAL PRESENCE-DTECT MATRIX (continued)
BYTE
DESCRIPTION
6400-666
5300-555
32
ADDRESS AND COMMAND SETUP TIME, (tISb)
0x17
0x20
33
ADDRESS AND COMMAND HOLD TIME, (tIHb)
0x25
0x27
34
DATA / DATA MASK INPUT SETUP TIME, (tDSb)
0x05
0x10
35
DATA / DATA MASK INPUT HOLD TIME, (tDHb)
0x12
36
WRITE RECOVERY TIME, (tWR)
0x3C
37
WRITE to READ Command Delay, (tWTR)
0x1E
38
READ to PRECHARGE Command Delay, (tRTP)
0x1E
39
Mem Analysis Probe
0x00
40
41
Extension for Bytes 41 and 42
MIN ACTIVE AUTO REFRESH TIME, (tRC)
MINIMUM AUTO REFRESH TO ACTIVE /
AUTO REFRESH COMMAND PERIOD, (tRFC)
SDRAM DEVICE MAX CYCLE TIME, (tCKMAX)
0x06
0x3C
42
43
44
45
46
47-61
SPD REVISION
63
CHECKSUM FOR BYTES 0-62
0x18
0x1E
0x22
0x00
0x00
0x13
MANUFACTURER`S JEDEC ID CODE
68-71
MANUFACTURER`S JEDEC ID CODE (continued)
73-90
0x80
0x14
0xE1
64-67
72
0x7F
SDRAM DEVICE MAX DQS-DQ SKEW TIME, (tDQSQ)
SDRAM DEVICE MAX READ DATA HOLD SKEW
FACTOR, (tQHS)
PLL Relock Time
Optional Features, not supported
62
0x17
0x17
0x7F7F7FDA
0x00
MANUFACTURING LOCATION
X
“SEU01G64A3BF1SA-xx”
MODULE PART NUMBER (ASCII)
91
PCB IDENTIFICATION CODE
X
92
IDENTIFICATION CODE (continued)
X
93
YEAR OF MANUFACTURE IN BCD
X
94
WEEK OF MANUFACTURE IN BCD
X
95-98
99-127
MODULE SERIAL NUMBER
MANUFACTURER-SPECIFIC DATA (RSVD)
X
X
128-255
Open for customer use
0xff
Part Number Code
S
E
U
01G
64
A3
B
F
1
SA
1
2
3
4
5
6
7
8
9
10
-
25
*
R
11
12
13
*RoHs compl.
DDR2 800MT/s
Swissbit AG
SDRAM DDR2
240 Pin Unbuffered 1.8V
Depth (1024MB)
Width
PCB-Type (B62URCD)
Chip Vendor (Samsung)
1 Module Rank
Chip Rev. F
Chip organisation x8
* optional / additional information
Swissbit AG
Industriestrass 4
CH-9552 Bronschhofen
Fon: +41 (0) 71 913 03 03
Fax: +41 (0) 71 913 03 15
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Page 13
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Data Sheet
Rev.1.2
18.11.2010
Locations
Swissbit AG
Industriestrasse 4 – 8
CH – 9552 Bronschhofen
Switzerland
Phone:
+41 (0)71 913 03 03
Fax:
+41 (0)71 913 03 15
_____________________________
Swissbit Germany GmbH
Wolfener Strasse 36
D – 12681 Berlin
Germany
Phone:
+49 (0)30 93 69 54 – 0
Fax:
+49 (0)30 93 69 54 – 55
_____________________________
Swissbit NA, Inc.
14 Willett Avenue, Suite 301A
Port Chester, NY 10573
USA
Phone:
+1 914 935 1400
Fax:
+1 914 935 9865
_____________________________
Swissbit NA, Inc.
3913 Todd Lane, Suite – 307
Austin, TX 78744
USA
Phone:
+1 512 302 9001
Fax:
+1 512 302 4808
_____________________________
Swissbit Japan, Inc.
3F Core Koenji,
2-1-24 Koenji-Kita, Suginami-Ku,
Tokyo 166-0002
Japan
Phone: +81 3 5356 3511
Fax:
+81 3 5356 3512
Swissbit AG
Industriestrass 4
CH-9552 Bronschhofen
Fon: +41 (0) 71 913 03 03
Fax: +41 (0) 71 913 03 15
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eMail: info@swissbit.com
Page 14
of 14