83026000301

JIANGSU HD-CRYSTAL TECHNOLOGY CO., LTD SMD3225-4 Crystal Oscillator 83026000301 1. Scope: 1.1 This specification applies to the RoHS crystal oscillator with a frequency of 26.000MHz which will be used in electronic equipment. 2. Construction: 2.1 Oscillators series: SMD 3.2×2.5 XO 2.2 Package: SMD3.2×2.5 3. Electrical Characteristics 3.1 Nominal Frequency: 26.000MHz 3.2 Frequency Stability: ±50ppm (incl. 25°C tolerance, tolerance over operating temperature range, input voltage change, load change, 1 year aging) ±3ppm/year 3.3 3.4 Aging: Operating Temperature Range: -40 to + 85°C 3.5 Storage Temperature Range: -55 to + 125°C 3.6 Input Voltage (VDD): +3.3Vdc±10% 3.7 Input Current (IDD): 10mA max 3.8 Output Waveform: CMOS 3.9 Output Symmetry: 50±10% 3.10 Rise/Fall Time: 8ns max 3.11 Output Voltage VOL: 10%VDD VOH: 3.12 Output Load: 90%VDD 15pF 3.13 Output State Control: Enable/disable 510ms max 3.14 Start-up Time: 3.15 Standby current: 10µA max 3.16 Phase Jitter (rms): 1ps rms max 12kHz to 20MHz max  3.17 Oscillation mode: Fundmental   3.18 Others: Not recommended for safety applications  www. hd- crystal. com 1 Rev . 1. 1 Reliability Specification ITEM NO. 4.1 4.2 4.3  SPECIFICATION TEST METHOD Temperature Cycle (GB/T Frequency change after test≤± 2423.22-2002, Method Nb) 5ppm. 10 cycles from -55°C to 125°C. Measurement taken after DUT being left at room temperature for 24±2 hours. Low Temperature Storage (GB/T 2423.1-2001, Method Aa) High Temperature Storage (GB/T 2423.2-2001, Method Ba) Spending 72 hrs at -55°C±3°C constant temperature. Measurement taken after DUT being left at room temperature for 24±2 hours. Spending 72 hrs at 125°C±3°C constant temperature. Measurement taken after DUT being left at room temperature for 24±2 hours. Spending 96 hrs at 40 °C ± 3 °C, with 90± 3% R.H. Measurement taken after DUT being left at room temperature for 24±2 hours. Apply 0.75mm vibration at sweep frequency 10～500 Hz, for 2h. 10 cycles in each direction of 3 axis. Measurement taken after 1 hour. Frequency change after test≤± 5ppm. Frequency change after test≤± 5ppm. 4.4 Humidity (GB/T 2423.32006, Method Cab) Frequency change after test≤± 5ppm. 4.5 Vibration (GB/T 2423.101995, Method Fc) Frequency change after test≤± 5ppm. 4.6 Shock (GB/T 2423.5-1995, Frequency change after test≤± Method Ea) 5ppm. No visible damages. Peak 1000m/s2, normal width 6ms half sine wave form, 3.7m/s, 3 perpendicular axis of samples, 3 cycles / direction, total 18 cycles. Measurement taken after 1 hour. 4.7 Drop (GB/T 2423.8-1995, Method Ed) Frequency change after test≤± 5ppm. No visible damages. Free drop to the wooden plate from 1.0 m heights for 3 times. 4.8 Solderability (GB/T 2423.28-2005, Method Tc) Terminals shall be covered more then 95% with solder. In 245 ± 5℃ solder bath for 2 ± 0.5 seconds. There is no need to do functioned test. 8-12X magnifier. 4.9 Terminal Strength (JIS-C6429 Method 1 & 2 ) No visible damage Mount on a glass-epoxy board (100x50x1.6mm), then bend to 2mm displacement (velocity 1mm/sec) and keep for 5 seconds. or pulling force 0.5 kg for at least 60 seconds. 4.10 Resistance to Soldering Frequency change after test≤± Heat (GB/T 2423.28-2005, 5ppm. Test Tb Method 1B) 4.11 OTHERS Passed through the re-flow oven under the following condition. Preheat to 150°C±5°C for 60 to 120sec,and peak 265°C±5°C for 10s±3sec.Measurement taken after DUT being left at room temperature for at 24±2 hours.  www. hd- crystal. com 2  Rev . 1. 1 2.5±0.2 3DFNDJH2XWOLQH'LPHQVLRQV Features   www. hd- crystal. com 3  Rev . 1. 1 Packing Specificatio Qty:3000Pcs   www. hd- crystal. com 4  Rev . 1. 1