SFI Electronics Technology
SEH(0R20) (ESD for High Speed) Series
Approval Sheet
Customer Information
Customer
Part Name
Part No.
Model No.
COMPANY
PURCHASE
R&D
Vendor Information
Name
SFI Electronics Technology Inc.
Part Name
Chip Surge Protection Device (CSPD) Series
Part No.
SEH(0R20) (ESD for High Speed) Series
Lot No.
SFI Electronics Technology Inc.
ADDRESS : No.6, Lane 340, Shan-Ying Road, Guishan, Tao Yuan, Taiwan
TEL : 886-3-3506998
FAX : 886-3-3507689
Quality Control
E-mail : sfi@sfi.com.tw
Document Control
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SFI Electronics Technology
SEH(0R20) (ESD for High Speed) Series
PART NO. SEH(0R20) Series
1.1 Performance Characteristic
Part No.
Working
Voltage
Typical
ESD
Trigger
Voltage
Typical ESD
Clamping
Voltage at
30ns
Leakage
Current
(at Initial
State)
Leakage
Current
(after ESD
Test)
Cap. Value at
1MHz
Symbol
VDC(max.)
Vtrigger(typ.)
VC(typ.)
ILDC
ILDCA
C
Unit
V
V
V
μA
μA
SFI0402EH060-0R20P
6
300
30
< 0.05
< 10
SFI0402EH120-0R20P
12
300
30
< 0.05
< 10
SFI0402EH240-0R20P
24
300
30
< 0.05
< 10
SFI0603EH060-0R20P
6
300
30
< 0.05
< 10
SFI0603EH120-0R20P
12
300
30
< 0.05
< 10
SFI0603EH240-0R20P
24
300
30
< 0.05
< 10
pF
0.20pF
(max. 0.30pF)
0.20pF
(max. 0.30pF)
0.20pF
(max. 0.30pF)
0.20pF
(max. 0.40pF)
0.20pF
(max. 0.40pF)
0.20pF
(max. 0.40pF)
*1 The clamping voltage was measured by IEC61000-4-2 level 4, direct discharge 8KV.
*2 The leakage current was measured at VDC.
*3 The components shall be employed within 1 year, in the nitrogen condition.
1.2 Reference Data
Symbol
Response time
Operation ambient temperature
Storage temperature
Withstanding ESD capability
Body
End termination
Packaging
Complies with standard
Complies with RoHs standard
Lead content
Marking
ESD Wave Form
Trise
<
IEC61000-4-2
<
Value
Unit
0.5
-50~+85
-50~+125
Level 4
Nano special ceramic
Ag/Ni/Sn
Reel
IEC61000-4-2
Yes
1000
None
ns
℃
℃
ppm
IEC61000-4-2 Standards
SEVERITY LEVEL
AIR DIRCHARGE
DIRECT DISCHARGE
1
2KV
2KV
2
4KV
4KV
3
8KV
6KV
4
15KV
8KV
IEC61000-4-2 compliant ESD current pulse waveform
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SFI Electronics Technology
SEH(0R20) (ESD for High Speed) Series
2. ESD Testing Circuit and Testing Results
PC
Oscilloscope
ESD generator
Voltage probe
MLV
Current probe
Fig 2(A) ESD testing circuit
Test with high voltage probe of attenuation factor ×250
Fig 2(B) without ESD protection sample
Part No.
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SFI Electronics Technology
SEH(0R20) (ESD for High Speed) Series
Fig 2(C) with SEH(0R20) sample
Part No.
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SFI Electronics Technology
SEH(0R20) (ESD for High Speed) Series
3. Size
Model
0402(1005)
0603(1608)
Length(L)
1.00±0.10
1.60±0.15
Width(W)
0.50±0.10
0.80±0.10
Thickness(T)
0.60 max.
0.90 max.
Termination(a)
0.25±0.10
0.30±0.10
4. Environment Reliability Test
Characteristic
Test Method and Description
High Temperature
Storage
The specimen shall be subjected to 125±2℃ for 1000±2 hours without load and then
stored at room temperature and normal humidity for one or two hours. The change of
varistor voltage shall be within 10%.
Temperature Cycle
The temperature cycle of specified
temperature shall be repeated five times and
then stored at room temperature and normal
humidity for one or two hours. The change of
varistor voltage shall be within 10% and
mechanical damage shall be examined.
High Temperature
Load
Damp Heat Load/
Humidity Load
Low Temperature
Storage
Part No.
Temperature
Period
1
-40±3℃
30±3min
2
room temperature
1 hour
3
125±3℃
30±3min
4
room temperature
1 hour
After being continuously applied the maximum allowable voltage at 85±2℃ for
1000±2 hours, the specimen shall be stored at room temperature and normal
humidity for one or two hours. The change of varistor voltage shall be within 10%.
The specimen should be subjected to 40±2℃ and 90~95% RH, the maximum
allowable voltage applied for 1000±2 hours and then stored at room temperature and
normal humidity for one or two hours. The change of varistor voltage shall be within
10%.
The specimen should be subjected to -40±2℃ for 1000±2 hours without load and
then stored at room temperature and normal humidity for one or two hours. The
change of varistor voltage shall be within 10%.
SEH(0R20) Series
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SFI Electronics Technology
SEH(0R20) (ESD for High Speed) Series
5. Soldering Recommendations
5.1 Recommended solder pad layout
(Unit : mm)
A
B
C
0402
0.4~0.6
0.6~0.9
0.5~0.7
0603
0.9~1.2
0.9~1.2
0.8~1.0
5.2 The SIR test of the solder paste shall be done (Based on JIS-Z-3284)
5.3 Steel plate and foot distance printing
Foot distance printing (mm)
Steel plate thickness (mm)
≧ 0.65mm
0.18mm
0.50~0.65mm
0.15mm
0.40~0.50mm
0.12mm
≦ 0.40mm
0.10mm
5.4 The IR reflow and temperature of soldering for Pb free process
Temperature ( ℃ )
Peak Temp 260℃(3~10sec)
250
225
Peak Temp 245 ℃
(10~20sec)
200
175
150
125
100
Pre-Heat 175 ℃
(60~120sec)
75
25
01:00:00
02:00:00
03:00:00
04:00:00
Time (min)
☆ IR reflow Pb free process suggestion profile
(1) The solder recommend is Sn96.5/Ag3.5 and thickness recommend as shown in table 5.3
(2) Ramp-up rate (217℃ to peak) +3℃/second max.
(3) Temp. maintain at 175±25℃ 180 seconds max.
(4) Temp. maintain above 217℃ 60~150 seconds
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SEH(0R20) (ESD for High Speed) Series
(5) Peak temperature range 245 +20/-10℃ within 5℃ of actually peak temperature (tp) 10~20 seconds
(6) Ramp down rate -6℃/second max.
※Perform adequate test in advance as the reflow temperature profile will vary according to the conditions
of the manufacturing process and the specification of the reflow furnace.
5.5 Resistance to soldering heat and high temperature resistance : 260℃, 10sec 3 times
5.6 Hand soldering
In hand soldering of the SEH devices, large temperature gradient between preheated the SEH devices and the
tip of soldering iron may cause electrical failures and mechanical damages such as cracking or breaking of the
devices. The soldering shall be carefully controlled and carried out, so that the temperature gradient is kept
minimum with following recommended conditions for hand soldering.
5.6.1 Recommended soldering condition 1 (with preheating)
(1) Solder
0.12~0.18mm thread solder (Sn96.5:Ag3.5) with soldering flux in the core
rosin-based and non-activated flux is recommended.
(2) Preheating
The SEH devices shall be preheated so that temperature gradient between the devices and the tip
of soldering iron is 150℃ or below.
(3) Soldering iron
Rated power of 20W max. with 3mm soldering tip in diameter
Temperature of soldering iron tip 380℃max., 3~5sec (The required amount of solder shall be melted
in advance on the soldering tip.)
(4) Cooling
After soldering, the SEH devices shall be cooled gradually at room ambient temperature.
5.6.2 Recommended soldering condition 2 (without preheating)
(1) Solder iron tip shall not directly touch to ceramic dielectrics.
(2) Solder iron tip shall be fully preheated before soldering while soldering iron tip to the external
electrode of SEH devices.
5.7 Post soldering cleaning
5.7.1 Residues of corrosive soldering fluxes on the PC board after cleaning may greatly have influences on
the electrical characteristic and the reliability (such as humidity resistance) of the SEH devices which
have been mounted on the board. It shall be confirmed that the characteristic and the reliability of the
devices are not affected by the applied cleaning conditions.
5.7.2 When an ultrasonic cleaning is applied to the mounted SEH devices on PC boards. Following conditions
are recommended for preventing failures or damages of the devices due to the large vibration energy
and the resonance conditions caused by the ultrasonic waves.
(1) Frequency 29MHz max.
(2) Radiated power 20W/liter max.
(3) Period 5 minutes max.
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SFI Electronics Technology
SEH(0R20) (ESD for High Speed) Series
6. Packaging Specification
6.1 Carrier tape and transparent cover tape should be heat-sealed to carry the products, and the reel should be
used to reel the carrier tape.
6.2 The adhesion of the heat-sealed cover tape shall be 40 +20/-15 grams.
6.3 Both the head and the end portion of the taping shall be empty for reel package and SMT auto-pickup
machine. And a normal paper tape shall be connected in the head of taping for the operator to handle.
0402
0603
(Unit : mm)
Symbol
A0
±0.05
B0
±0.05
K0
±0.05
D
+0.10
-0.05
P
±0.10
P2
±0.10
P0
±0.10
W
±0.10
E
±0.10
F
±0.05
0402
0.62
1.12
0.60
1.55
2.00
2.00
4.00
8.00
1.75
3.50
0603
1.10
1.90
0.95
1.56
4.00
2.00
4.00
8.00
1.75
3.50
Part No.
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SFI Electronics Technology
SEH(0R20) (ESD for High Speed) Series
7. Reel Dimension
(Unit : mm)
Symbol
A
B
C
D
E
W
W1
0402
178.0±1.0
60.0±0.5
13.0±0.2
21.0±0.2
2.0±0.5
9.0±0.5
1.5±0.1
0603
178.0±1.0
60.0±0.5
13.0±0.2
21.0±0.2
2.0±0.5
9.0±0.5
1.5±0.1
8. Standard Packaging
Size
0402
0603
Pcs
10000
5000
Part No.
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