MEM2301XG-N
P-Channel MOSFET MEM2301XG-N
General Description
Features
MEM2301XG-N Series P-channel enhancement
-20V/-2.8A
mode field-effect transistor , These miniature surface
RDS(ON), Vgs@-1.8V, Ids@-1.1A = 230mΩ
mount MOSFETs utilize High Cell Density process.
RDS(ON), Vgs@-2.5V, Ids@-2.0A = 140mΩ
Low RDS(ON) assures minimal power loss and
RDS(ON), Vgs@-4.5V, Ids@-3.1A = 96mΩ
conserves energy, making this device ideal for use in
High Density Cell Design For Ultra Low On-Resistance
power management circuitry. Typical applications
Fast switching speed
are lower voltage application, power management in
High performance trench technology
portable and battery-powered products such as
Low thermal impedance copper lead frame
computers, printers, and PCMCIA cards, cellular and
Subminiature surface mount package:SOT23
cordless telephones.
Pin Configuration
Typical Application
Power management
Load switch
Battery protection
Absolute Maximum Ratings (TA = 25℃ unless otherwise noted)
Parameter
Symbol
Ratings
Unit
Drain-Source Voltage
VDSS
-20
V
Gate-Source Voltage
VGSS
±12
V
Continuous Drain Current
ID
-2.8
A
Pulsed Drain Current1,2
IDM
-17
A
Total Power Dissipation
TA=25℃
TA=70℃
PD
1.4
0.8
W
Operating Temperature Range
TOpr
-55~150
℃
Storage Temperature Range
Tstg
-55~150
℃
Symbol
MAX.
Unit
RθJA
90
℃/W
Thermal Characteristics
Parameter
3
Thermal Resistance,Junction-to-Ambient
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MEM2301XG-N
Electrical Characteristics
Parameter
Symbol
Test Condition
Min
Type
Max
Unit
Static Characteristics
Drain-Source Breakdown Voltage
V(BR)DSS
VGS=0V, ID=250μA
-20
-23
-
V
Gate Threshold Voltage
VGS(th)
VDS= VGS, ID=250μA
-0.4
-0.72
-1.1
V
Gate-Body Leakage
IGSS
VDS=0V,VGS=12V
-
-
100
nA
VDS=0V,VGS=-12V
-
-
-100
nA
VDS=-20V VGS=0V
TJ=25℃
-
-
-1.0
μA
VDS=-16V VGS=0V
TJ=55℃
-
-
-10
μA
RDS(ON)1
VGS=-1.8V,ID=-1.1A
-
230
260
mΩ
RDS(ON)2
VGS=-2.5V,ID=-2.0A
-
140
170
mΩ
RDS(ON)3
VGS=-4.5V,ID=-2.8A
-
98
130
mΩ
Forward Transconductance
gFS
VDS=-5V,ID=-1A
3
5
-
S
Max. Diode Forward Current
IS
-
-
-2.8
A
Source-drain (diode forward)
voltage
VSD
-
-0.82
-1.2
V
-
320
-
-
60
-
-
35
-
-
11
-
-
5
-
-
22
-
-
8
-
3.2
-
0.6
-
0.9
-
Zero Gate Voltage Drain Current
Static Drain-Source On-Resistance
IDSS
VGS=0V,IS=-2.8A
Dynamic Characteristics
Input Capacitance
Ciss
Output Capacitance
Coss
Reverse Transfer Capacitance
Crss
VDS = -10V,
VGS = 0 V,
f = 1 MHz
pF
Switching Characteristics
Turn-On Delay Time
td(on)
Rise Time
tr
Turn-Off Delay Time
td(off)
Fall-Time
tf
Total Gate Charge
Qg
Gate-Source Charge
Qgs
Gate-Drain Charge
Qgd
VDS = -10 V,
ID= -2.8 A,
VGS = -4.5 V,
Rg = 6 Ω
VDS = -10 V,
VGS = -4.5 V,
ID = -2.0A
-
ns
nc
1、Pulse width limited by maximum junction temperature.
2、Pulse test: PW ≤300 μs duty cycle ≤2%.
3、Surface Mounted on FR4 Board, t ≤ 5 sec.
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MEM2301XG-N
Typical Performance Characteristics
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MEM2301XG-N
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MEM2301XG-N
Package Information
Package Type:SOT23 Unit:mm(inch)
Millimeters
Inches
DIM
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Min
Max
Min
Max
A
2.7
3.1
0.1063
0.122
B
1.7
2.1
0.0669
0.0827
b
0.35
0.5
0.0138
0.0197
C
1.0
1.2
0.0394
0.0472
c
0.1
0.25
0.0039
0.0098
d
0.2
-
0.0079
-
E
2.1
2.64
0.0827
0.1039
e
1.2
1.4
0.0472
0.0551
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MEM2301XG-N
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The information described herein is subject to change without notice.
Nanjing Micro One Electronics Inc is not responsible for any problems caused by circuits or diagrams
described herein whose related industrial properties, patents, or other rights belong to third parties.
The application circuit examples explain typical applications of the products, and do not guarantee the
success of any specific mass-production design.
Use of the information described herein for other purposes and/or reproduction or copying without the
express permission of Nanjing Micro One Electronics Inc is strictly prohibited.
The products described herein cannot be used as part of any device or equipment affecting the human
body, such as exercise equipment, medical equipment, security systems, gas equipment, or any
apparatus installed in airplanes and other vehicles, without prior written permission of Nanjing Micro
One Electronics Inc.
Although Nanjing Micro One Electronics Inc exerts the greatest possible effort to ensure high quality
and reliability, the failure or malfunction of semiconductor products may occur. The user of these
products should therefore give thorough consideration to safety design, including redundancy,
fire-prevention measures, and malfunction prevention, to prevent any accidents, fires, or community
damage that may ensue.
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