RG3216P-3304-B-T1

Metal thin film chip resistors (the highest precision) ■RG series AEC-Q200 Compliant Features ・ Long term stability with inorganic passivation ・ Less than ±0.1% drift after 10000 hours of reliability test Thin film surface mount resistors ・ High precision resistance tolerance: ±0.05%, very small TCR: ±5ppm/℃ ・ Thin film structure enabling low noise and anti-sulfur Applications ・ Automotive electronics ・ Industrial measurement instrumentation, industrial machines RG series ・ Various sensors, medical electronics ◆Part numbering system RG 1608 N - 102 - B - T5 Series code Packaging quantity: T5(5,000pcs), T10(10,000pcs) Size: RG0603, RG1005, RG1608, RG2012, RG3216 Resistance tolerance Temperature coefficient of resistance Nominal resistance value (E-24: 3 digit, E-96: 4 digit, RG3216: all 4 digit) ◆Electrical Specification Type Temperature coefficient of resistance Power ratings Low Regular (ppm/°C） High Resistance range（Ω）Resistance tolerance（%） ±0.05% (W) ±0.1% (B) ±10（N） RG0603 ±25（P） 1/20W 1/16W ー ±50（Q） 1/32W 1/16W 1/8W 1/16W 1/10W ±10（N） 47≦R≦100k ー 1/10W 1/8W 47≦R≦274k ±50（Q） ー 1/8W 1/4W ー 47≦R≦475k ±50（Q） ー 10≦R＜47 ー 100≦R≦33.2k 47≦R≦1M ±25（P） ー ◆Dimensions Type a t T5 150V 47≦R≦2.7M 47≦R≦5.1M W E-24, E-96 -55℃ ~ 155℃ 10≦R＜47 ー ±10（N） L 100V 47≦R≦1M 47≦R≦475k ±25（P） ±50（Q） T10 10≦R＜47 ー 100≦R＜10.2k ±5（V） RG３２１６ T10 30V T5 47≦R≦274k ±25（P） ±10（N） 1/4W Pakaging quantity 100≦R＜5.1k ±10（N） ±5（V） RG２０１２ Operating temperature 75V 47≦R≦150k ±25（P） 1/6W Resistance value series 10≦R＜47 100≦R＜3k ±5（V） RG１６０８ 47≦R≦56k ー ±5（V） ±100（R） Maximum voltage 100≦R＜22k ー ±100（R） RG１００５ ±0.5%(D) 10≦R＜47 ー Size (inch) 200V L W a b t RG0603 0201 0.60±0.05 0.30±0.05 0.13±0.05 0.15±0.05 0.23±0.03 RG1005 0402 1.0±0.05 0.50±0.05 0.20±0.10 0.25±0.05 0.35±0.05 RG1608 0603 1.60±0.20 0.80±0.20 0.30±0.20 0.30±0.20 0.40±0.10 RG2012 0805 2.00±0.20 1.25±0.20 0.40±0.20 0.40±0.20 0.40±0.10 RG3216 1206 3.20±0.20 1.60±0.20 0.50±0.25 0.50±0.20 0.40±0.10 （unit：mm） 15 b ◆Reliability specification Test Items Low Condition (test methods) ≦47Ω *1 Short time overload 2.5 x rated voltage, 5 seconds Regular ≦47Ω ≧47Ω High ≧47Ω ±0.05％＋0.01Ω ±0.05％＋0.01Ω ±0.05％＋0.01Ω ±0.05％＋0.01Ω *1 70℃, rated voltage, 90min on 30min off, 1000hours ≦47Ω ー Typical ≧47Ω Low ±0.05％＋0.01Ω ±0.05％＋0.01Ω ±0.25% ±0.10% ±0.50% ±0.25% ー ±0.50% ±(0.01%) ±0.25% ±0.10% ±0.50% ±0.25% ー ±0.50% ±(0.05%) Temperature shock -55℃ (30min) ∼ 125℃ (30min) 1000cycles ±0.25% ±0.10% ±0.25% ±0.10% ー ±0.10% ±(0.01%) High temperature exposure 155℃, no bias, 1000hours ±0.25% ±0.10% ±0.25% ±0.10% ー ±0.10% ±(0.01%) Resistance to soldering heat 260±5℃, 10 seconds (reflow) Life (biased) High temperature high humidity 85℃, 85%RH, 1/10 of rated power, 90min on 30min off, 1000hours ー ±0.05％＋0.01Ω ±0.05％＋0.01Ω *1 Rated voltage is given by E= RxP E= rated voltage (V), R=nominal resistance value(Ω), P=rated power(W) If rated voltage exceeds maximum voltage /element, maximum voltage/element is the rated voltage. ◆10000 hour reliability test data 0.50 0.20 0.10 Resistance drift（%） 0.30 0.00 −0.10 −0.20 1kΩ 10kΩ 56kΩ −0.30 −0.40 −0.50 100 10 Test duration(h) 1000 100kΩ 330kΩ 3000 0.10 0.00 −0.10 −0.20 −0.50 10000 0.20 0.00 −0.10 −0.20 −0.30 Test duration(h) 1000 3000 100kΩ 330kΩ 10000 High temperature exposure(155℃) −0.40 Number of cycles 1000 Sample : RG1608series Test Temperature155℃ conditions: n=100 0.40 0.30 0.20 0.10 0.00 −0.10 −0.20 1kΩ 10kΩ 56kΩ −0.30 56kΩ 100kΩ 100 100 10 0.50 0.10 10 1kΩ 10kΩ 56kΩ ○High temperature exposure Resistance drift（%） Resistance drift（%） 0.20 −0.40 Sample : RG1608series Test -55℃ （30min） →room temp （. 3min） → conditions: ＋125℃ （30min） →room temp （. 3min） n=50 0.30 −0.50 0.30 Temperature shock 0.40 Sample : RG1608series Test Temperature85℃ Humidity85％RH conditions: 1/10 rated power 90min.on/30min. off Rated power=0.1W n=100 0.40 −0.30 ○Temperature shock 0.50 High temperature high humidity bias (THB 85℃ 85％） 0.50 Sample : RG1608series Test Temperature85℃ conditions: Rated voltage 90 min. on/30min. off Rated power=0.1W n=100 0.40 Resistance drift（%） ○High temperature high humidity (biased) High temoperature life test (85℃) RG series ○Biased life test −0.40 −0.50 10000 10 100 Test duration(h) 1000 3000 100kΩ 330kΩ 10000 Ratio to rated power (％) ◆Derating Curve High power application Regular power application High precision 100 50 0 -55 0 50 155 70 85 100 Ambient temperature (℃) ◆Maximum pulse power limit Maximum pulse power limit（W） 100 Test procedure Voltage pulse is applied to the test samples mounted 10 1 0.1 0.0001 on the test board. 1005 1608 2012 3216 After each pulse, resistance drift is measured. Pulse type type type type 0.001 voltage is increased until the drift exceeds +/-0.5%. The power at that voltage is defined as the 0.01 0.1 Pulse duration (seconds) 1 10 Thin film surface mount resistors ±0.05％＋0.01Ω ±0.05％＋0.01Ω ±0.05％＋0.01Ω ±0.05％＋0.01Ω maximum pulse power. 16