TYPE-C-2.0-16PIN-SMT-3-OR 数据手册
东莞市皓富电子科技有限公司
DONGGUAN HAOFU ELECTRIONCS TECHNOLOGY CO.,LTD
东莞市皓富电子科技有限公司
制訂日期:17/06/10
产品规格书
文件編號:
文件履历表
No.
Date
Document No.
Prepared
Checked
Approved
Summary
Product specification
产 品 规 格 书
Product Name
Part Number.
Rev.
USB3.1 C TYPE CONNECTOR,
/
A
1/10
产品规格书
东莞市皓富电子科技有限公司
产品规格书
制訂日期:17/06/10
文件編號:
1;SCOPE(适用范围)
2;REFERENCE DOCUMENTS(参考文件)
3;FEATURE & DIMENSIONS (特征及尺寸)
3.1. PRODUCT DIMENSION(产品尺寸)
3.2. PCB/PANEL LAYOUT (印刷电路板布局)
3.3. MATERIAL(材料)
3.4. MECHANICAL & ELECTRICAL CHARACTERISTIC (机械及电气特性)
3.5. PACKAGING(包装)
3.6. TRANSPORTATION(运输)
3.7. STORAGE(存贮)
4. ENVIRONMENTAL(环境要求)
4.1. SOLDERABILITY(可焊性)
4.2. RESISTANCE TO SOLDER HEAT(耐焊接热)
4.2.1. Wave Soldering (波峰焊)
4.2.1.1. Preheat(预热)
4.2.1.2. Soldering(焊接)
4.2.1.3. Cool Down (冷却)
4.2.2. INFRARED REFLOW(红外线回流焊)
4.2.2.1. Preheat(预热)
4.2.2.2. Soldering(焊接)
4.2.2.3. Cool Down (冷却)
4.3. CLEANING (清洗)
5. PERFORMANCE AND TEST DESCRIPTION (性能及测试)
5.1. REQUIREMENT(要求)
5.2. TEST CONDITION(测试条件)
5.3. SAMPLE SELECTION(样品选择)
5.4. TEST SEQUENCE(测试顺序)
6. QUALITY ASSURANCE PROVISIONS (品质保证)
TABLE I:PRODUCT QUALIFICATION TEST SEQUENCE
TABLE II:REFLOW SOLDERING PROFILE
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产品规格书
东莞市皓富电子科技有限公司
产品规格书
制訂日期:17/06/10
文件編號:
1. SCOPE(适用范围)
This product specification specifies the characteristics and test methods of USB 3.1 series "C type"
connectors
本产品规格书规定了 USB 3.1 系列“C 型”连接器产品的特性及测试方法.
2. REFERENCE DOCUMENTS(参考文件)
MIL-STD-1344A Test method for electrical connector (电子连接器测试方法)
MIL-STD-202F Test method for electrical components (电子零件测试方法)
EIA364 Test method for electrical components (电子零件测试方法)
JIS C 0051 Test method for electrical components (电子零件测试方法)
MIL-G-45204C Specification for gold plating (镀金规格)
IEC-512-3 IEC standard for current carrying capacity tests(IEC电流测试标准)
QQ-N-290A Specification for nickel plating (镀镍规格)
MIL-P-81728A Specification for tin/lead plating (镀锡铅规格)
MIL-T-10727B Specification for tin plating (镀锡规格)
UL498 UL standard for safety of attachment plug and receptacle(UL安规要求标准)
EN/ISO5961 Determination of total lead & cadmium content ( 总铅和总镉含量测定)
EN1122 Determination of total lead & cadmium content ( 总铅和总镉含量测定)
EN13346 Determination of heavy metals content ( 重金属含量测定)
EPA3052 Determination of total lead & cadmium content ( 总铅和总镉含量测定)
3. FEATURE & DIMENSIONS (特征及尺寸)
3.1. PRODUCT DIMENSION (产品尺寸)
These connectors shall have the dimensions as shown in customer drawing。
本产品的相关尺寸参见客户图面。
3.2. PCB/PANEL LAYOUT (印刷电路板布局)
The recommended PCB layout is shown in customer drawing。
本产品适用的PCB layout参见客户图面。
3.3. MATERIAL(材料)
The harmful material can follow the requirement of RoHS.
本产品使用的材料符合 RoHS 指令要求。
3.4. MECHANICAL & ELECTRICAL CHARACTERISTIC (机械及电气特性)
The connector shall have the mechanical and electrical performance as described in table I:
本产品的机械及电气特性见附表I。
3.5. PACKAGING (包装)
This product adopts tray or REEL package
本产品采用tray 盘或REEL包装,
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产品规格书
东莞市皓富电子科技有限公司
产品规格书
制訂日期:17/06/10
文件編號:
3.6.TRANSPORTATION (运输)
Any vehicle can be adopted for the transportation, but moisture-proof and no mechanical damage.
可采用任何运输工具运输,勿淋湿及机械性损伤。
3.7.STORAGE (存贮)
Temperature: -25℃~+85℃,Relative humidity: ≤80%,Not to storage in corrosive environments A requalification test shall be conducted immediately while the storage duration exceed 6 months.
温度:-25℃~+85℃;相对湿度:≤80%;勿贮存于腐蚀环境内。贮存期超过6个月后需重新进行品质确
认。
4. ENVIRONMENTAL(环境要求)
4.1. SOLDERABILITY(可焊性)
Connector’s solderability can meet MIL-STD-202F standard. Finish shall be free of contaminants.
产品可焊性符合 MIL-STD-202F 标准规定的相关要求,表面不得有污染物.
4.2. RESISTANCE TO SOLDER HEAT (耐焊接热)
4.2.1. Wave Soldering (波峰焊)
Consists of three consecutive phases. 包括三个连续的阶段完成;
4.2.1.1. Preheat(预热)
Increase in temperature not to exceed 4℃per second. Final preheat temperature will be within 125
℃of solder temperature. 温度增加不超过4℃ /秒,最终预热温度不超过125℃.
4.2.1.2. Soldering(焊接)
Device leads will be exposed to solder wave at 250℃for a maximum of 5 seconds. 设备中的引导
焊接温度最高250℃不超过5秒.
4.2.1.3. Cool Down(冷却)
Cool down in ambient air at approximately 20℃to 25℃. 冷却到周围环境温度20℃~ 25℃.
4.2.2. INFRARED REFLOW (红外线回流焊)
Three cycles. Each cycle consisting of three consecutive phased. 三个周期,每个周期包括三个连
续的阶段完成;
4.2.2.1. Preheat(预热)
Increase in temperature not to exceed 4℃ per second. 温度增加不超过4℃ /秒,
4.2.2.2. Soldering(焊接)
Maximum allowable time above reflow temperature of 183 ℃ is 90 seconds. Maximum
temperature in this interval is 250℃, not to exceed 10 seconds. 回流焊温度183℃以上的时最长不
超过 90秒. 最高温度250℃时间不超过10秒.
4.2.2.3. Cool Down(冷却)
Cool down shall not exceed 6℃ per second. 冷却速度不超过6℃/秒. Note:(注)Device
temperature measurements are referenced from the top-center of the package outer surface. 设备
温度量测时以从顶部中间位置测量为准;
4.3. CLEANING (清洗)
Connectors resist to cleaning process. Aqueous Cleaning: Three cycles; each cycle consisting of a
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产品规格书
东莞市皓富电子科技有限公司
产品规格书
制訂日期:17/06/10
文件編號:
maximum of one minute exposure to 54℃ to 66℃ dematerialized tap water at a maximum pressure of
30 psi; followed by air drying for 60℃to 90 seconds at 93℃ to 121℃.
产品本身可以承受清洗制程。 水洗:包含三个循环,每个循环包括以下:以最大压力30帕,温度 54℃~
66℃,去除矿物质的水,用水龙头冲洗最多一分钟,然后用温度 93℃~121℃的空气吹60到90秒;
5. PERFORMANCE AND TEST DESCRIPTION (性能及测试)
5.1. REQUIREMENT(要求)
Product is designed to meet electrical, mechanical, and environmental performance requirements
specified in Table I.
本产品设计符合附表一所列的机械,电气及环境要求.
5.2. TEST CONDITION (测试条件)
Unless otherwise specified, all tests shall be performed at ambient environmental conditions. 除非特别
注明,所有测试在室温条件下完成;
5.3. SAMPLE SELECTION (样品选择)
Test samples shall be selected at random from current production. No test samples shall be reused.
Samples are pre-conditioned with 10cycles of durability. Each group shall be containing 5 test samples.
测试样品从现生产的产品中随机抽取,所有测试过的样品不得重复使用. 样品已预先插拔10次,每组测试
有5个样品;
6. QUALITY ASSURANCE PROVISIONS (品质保证)
The company is responsible for the quality of all products sent to customers, and the defective batches
are returned or corrected by the supplier
本公司对于出给客户的所有产品品质负责,不良批次的产品退回或由供应商做矫正;
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产品规格书
东莞市皓富电子科技有限公司
制訂日期:17/06/10
产品规格书
TABLE I:
Items
1
Confirmation of
Product 产品确认
文件編號:
PERFORMANCE REQUIREMENTS
Requirements
Test Methods
Product shall be conforming to the
Visually dimensions and functionally
requirements of applicable product
inspected per applicable product
drawing
drawing.
产品必须满足相关文件的规定
目视尺寸及功能依照客户图面检查
Electrical Requirement
Items
2
Requirements
Test
Methods
Low level Contact
1. 40 mΩ (Max) initial for VBUS,
The low level contact resistance
resistance
低电平接触阻抗
GND and all other contacts.
measurement is made from the solder
2. Maximum change (delta) of +10
tail of the receptacle to the soldering
mΩ after environmental stresses.
1.电源 PIN、接地 PIN 及其它 PIN
point of the plug.
脚接触阻抗均为 40mΩ 最大。
circuit at 100mA. Mated test contacts
2.产品阻抗变化值不超过 10mΩ。
must be in a connector housing.
when measured at 20mV Max. open
Test reference standard:EIA-364-23B
接触阻抗测量方式从母头的焊脚处
至公头的焊脚处。
在开路最大电流为 100mA 电压为
20mV 情况下测试胶芯插入时端子
之间接触处的阻抗值。
测试参考标准:EIA 364-23B
3
Insulation Resistance
100 MΩ Min.
Test between adjacent circuits
绝缘阻抗
100 MΩ 最小
Insulation Resistance of unmated and
mated connectors.
Test reference standard:EIA 364-21.
测试对插的连接器两个相邻端子之
间的绝缘阻抗值。
测试参考标准:EIA 364-21
4
Dielectric Strength
No breakdown shall occur.
when 100 Volts AC (RMS) is applied
耐电压
产品不能出现衰竭、损坏现象。
between adjacent contacts of unmated
and mated connectors.
Test reference standard:EIA-364-20.
使用 100V 交流电压测试公母头插
入与拔出时相邻端子之间的承受电
压情况。
测试参考标准:EIA 364-20
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制訂日期:17/06/10
产品规格书
5
Contact current rating
温升
1.A current of 3.0 A shall be applied
collectively to VBUS pins (pins A4,
A9, B4, and B9)
2.1.25 A applied to the VCONN pin
(B5 of the plug connector) with the
return path through the corresponding
GND pins (pins A1, A12, B1, and
B12).
3. A minimum current of 0.25 A shall
also be applied individually to all the
other contacts.
1.VBUS pins 需 通 过 电 流 5.0A(pin
A4, A9, B4, and B9 )。
2. VCONN pin(公头B5 pin)及GND
pins需通过电流1.25A(pins A1, A12,
B1, and B12)。
3.其余pins需通过最小电流0.25A。
文件編號:
When the currents are applied to the
contacts, the temperature rise shall not
exceed 30 °C at any point on the USB
Type-C mated plug and receptacle
under test, when measured at an
ambient temperature of 25 °C.
Test reference standard:
EIA -364-70 method B
在 相 对 温 度 为 25 ℃ , 当 电 流 通 过
USB C type公母头连接器时,测试
连接器中端子任一点温度不超过
+30℃。
测试参考标准:EIA 364-70 方法B
Mechanical Requirement
Items
6
7
8
Insertion Force
插入力
Extraction Force
拔出力
Durability or
Insertion/extraction
Cycles
耐久或插入拔出次数
Requirements
Test
Methods
Measure the force required to mate
connector, At a maximum rate of
The initial connector insertion force
shall be within the range from 5 N to
20 N。
连接器初始插入力需在 5N~20N
范围内。
12.5mm(0.492'') per minute.
The initial connector Extraction force
shall be within the range from 8 N to
20 N。
连接器初始拔出力需在 8N~20N
范围内。
12.5mm(0.492'') per minute.
The durability rating shall be 10,000
cycles minimum.
耐久测试最小 10000 次。
7/10
Test reference standard:EIA-364-13
测试的力必须是相匹配的连接器,
插入速度不超过每分钟 12.5mm。
测试参考标准:EIA 364-13
Measure the force required to mate
connector, At a maximum rate of
Test reference standard:EIA-364-13
测试的力必须是相匹配的连接器,
拔出速度不超过每分钟 12.5mm。
测试参考标准:EIA 364-13
The durability test shall be done
at a maximum rate of 200 cycles per
Hour and no physical damage to any
part of the connector and cable
assembly shall occur.
Test reference standard:EIA-364-09
耐久测试速度不超过每小时 200 个
循环,且测试后的产品及线材本身
任何部位不能出现损坏。
测试参考标准:EIA 364-09
产品规格书
东莞市皓富电子科技有限公司
制訂日期:17/06/10
产品规格书
9
Physical Shock
No breakdown shall occur.
物理冲击
产品不能出现损坏现象。
文件編號:
No discontinuities of 1μs or Longer
duration. when mated USB C type
connectors are subjected to 11ms
duration 30Gs half-sine shock pluses.
Three shocks in each direction applied
along three mutually perpendicular
planes for a total of 18 shocks.
Test reference standard:
EIA 364-27 Test Condition H.
匹配USB C TYPE 连接器,中断不
得大于或等于1μs,30Gs的半波脉
冲承受11ms,从三个正交的方向施
加冲击,总冲击次数为18次。
Environmental Requirements
Items
10
Humidity
恒温恒湿
Requirements
Shall meet visual requirements, show
no physical damage. Contact
Resistance (Low Level) 40 mΩ max.
Dielectric Strength should be OK,
Insulation Resistance should be 100
MΩ min.
产品外观良好,无损坏。接触阻抗:
40 mΩ最大;耐电压测试OK, 绝缘阻
抗100MΩ最小。
11
Thermal shock
冷热冲击
Shall meet visual requirements, show
no physical damage. Contact
Resistance (Low Level) 40 mΩ max.
Dielectric Strength should be OK,
Insulation Resistance should be 100
MΩ min.
Test
Methods
Temperature: 25~65℃, Relative
humidity: 90-95%, Duration:
96Hours, Circulate test: 10 Cycles.
Test reference standard: EIA 364-31
温度:25~65℃,相对湿度:9095% ,持续时间:96 小时,循环测
试:10次
测试参考标准:EIA 364-31。
40 mΩ最大;耐电压测试OK, 绝缘阻
Temperature range from -55°C to
+85°C .Start from -55°C. After 30
min. change to +85°C, change time is
no more than 30 seconds. Total 5
cycles.
Test reference standard: EIA 364-32
温度变化范围:-55°C ~ +85°C,从55°C开始,30分钟后换到+85°C;转换
抗100MΩ最小。
时间不超过30秒;共5 个循环。
产品外观良好,无损坏。接触阻抗:
测试参考标准:EIA 364-32
12
Hot air reflow or IR
reflow for SMT curing
process
SMT 热风回流焊
More than 95% of the dipped
surface shall be wet with solder
超过95%的焊接面积浸到锡。
8/10
Place subjected connector on the PCB
Board and expose them to the reflow
oven and apply the following
condition:
Room 1: preheat temperature 150℃ 170℃ for 100 seconds.
Room 2: preheat temperature 170℃–
200℃ for 100 seconds.
Room 3: reflow temperature 200℃ 产品规格书
东莞市皓富电子科技有限公司
产品规格书
制訂日期:17/06/10
文件編號:
260℃ for 120-60 seconds.
(For 260℃ ONLY 5-10 seconds)
将产品放在PCB板上,然后放入回焊
炉中并用于以下条件:
时间段1:预热温度150℃-170℃
100秒。
时间段2:预热温度170℃ - 200℃
100秒。
时间段3:回焊炉温度200℃ - 260
℃ 100秒。(260℃ 时间仅5~10S)
13
Solderability
可焊性
14
Salt Spray
盐雾测试
The inspected area of each lead must
have 95% solder coverage Minimum.
检测焊接端的锡覆盖率需大于95%
Solder pot temperature: 250±5℃
Soldering time: 3 to 5 Seconds
Test reference standard: EIA 364-52
锡炉温度:250±5°C,焊接时间:
3~5 秒
测试参考标准:EIA 364-52。
Shall meet visual requirements, No
detrimental corrosion allowed in
contact area and base metal exposed.
产品外观良好,端子及外壳金属无
生锈、腐蚀及露底材不良。
Subject mated connectors to 35+/-2 ℃
and 5+/-1% salt condition for 24
hours. After test, rinse the sample with
water and recondition the room
temperature for 1 hour.
Test reference standard:EIA-364-26B.
测试的连接器需放于温度35±
2°C,盐水浓度(重量比)5±1%的容
器中测试24小时。测试后的产品使
用清水冲洗后放入常温下1小时。
测试参考标准:EIA 364-26。
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东莞市皓富电子科技有限公司
制訂日期:17/06/10
产品规格书
文件編號:
TABLE II:
REFLOW SOLDERING PROFILE
Pb-free reflow profile requirements:
Parameter
Reference
Average temperature gradient in
Specification
2.5°C/s
preheating
Soak time
T soak
2-3 minutes
Time above 217°C
t1
60 s
Time above 230°C
t2
50 s
Time above 250°C
t3
5s
T peak
260°C (+/-5°C)
Peak temperature in reflow
Temperature gradient in cooling
Max -5°C/s
This profile is the minimum requirement for evaluating soldering heat resistance of components.
Heat transfer method used for reflow soldering is hot air convection. The actual air temperatures
used to achieve the specified profile is higher and largely dependent on the reflow equipment.
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DONGGUAN HAOFU ELECTRIONCS TECHNOLOGY CO.,LTD
产品可靠实验计划排程表
产品品名
Part name
USB TYPE C 16PIN
FEMALE CONN
产品规格书编号
Specification
/
计划表编号
Schedule No.
201904001
制定日期
Date
2019/4/1
/
规格书版次
Rev:
A0
计划书版次
Rev:
A0
试验人
Tester
刘小燕
产品料号
Part No.
序号
项次
1
Group A
2
Group B
实验项目
进度(4月份)
追踪
1
2
3
4
5
6
7
8
9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31
实验
结果
报告编号
OK
20190418001
OK
20190403004
OK
20190418012
OK
20190418013
OK
20190411003
ECD
外观→焊接性→接触阻抗→寿命→振动
→机械冲击→接触阻抗→外观
ACD
外观→沾锡测试→
盐雾测试→外观
ECD
ACD
ECD
3
Group C
外观→焊接性→耐扭测试→外观
ACD
ECD
4
Group D
外观→焊接性→温升测试→外观
ACD
外观→焊接性→绝缘阻抗耐压测试→冷 ECD
5
Group E 热冲击→温湿度循环→绝缘阻抗→耐压
测试→外观
ACD
ECD
6
Group F
外观→焊接性→接触阻抗温度寿命→接
触阻抗→外观
ACD
OK
20190411004
7
Group G
外观→焊接性→接触阻抗混合气体测试 ECD
→接触阻抗→外观
ACD
OK
20190415006
备注:
ECD为预计完成时间
Andy
核准:
APPROVED:
ACD 为实际完成时间
审查:
CHECKE:
Mark
制定:
Liu XiaoYan
OPERATOR:
备注
DONGGUAN HAOFU ELECTRIONCS TECHNOLOGY CO.,LTD
Group A TESE REPORT
Report No.20190418001
**********************************************************************************************************************************************************
QC Department
Applicant:
Visual inspection→Weldability→CR →Insertion&withdraw → Durability→Insertion&withdraw →
Mechanical shock→Random Vibration→CR→Visual inspection
Test item:
USB TYPE C 16PIN FEMALE CONNECTOR
Product:
Part No.:
5PCS
Quantity:
2019/4/1
Sample Received:
2019-04-01 to 2019-04-17
Testing Period:
Temperature.22+-2℃,
R.H.58+-3%
Measuring Environment:
According to general USB TYPE C16PIN'S product specifications.
Testing conditions:
1.The Connector of The Male And Female to Flug.
2.CR:Contact:U=20mV;I=100mA Initial=40mΩ max
3.Insertion force& Withdrawal force :Mate and un-mate connectors at a rate of 25.4mm/min. recorder after mate
and un-mate 3 times.Mate and un-mate connectors at a rate of 12.5mm/min.The initial connector extraction
force Shall be within the range of 8Nto20N Measured after a preconditioning of Five insertion extraction
cycles,afterAn additional twenty-five insertion /Extraction cycles, Insertion force:5N~20N,Withdrawal Force
:8N~20N.
4.Durability:Mate and un-mating up to 10000 cycles repeatedly at cycle rate of 500±50 cycles per hour by
machine.After durability test: No physical damage Insertion force: 5N~20N Withdrawal force:6N~20N
5.Mechanical shock:Comply with method EIA 364-27 Subjected to 6ms duration 30Gshalf-sine shock pulses
6 axes.Appearance: no damage Discontinuity 1.0 microsecond Max
6.Random Vibration:Comply with method EIA 364-28 test condition V test letter A subjected mated connectors
to 5.35GRMS. 15 minutes in each of three mutually perpendicular planes.Appearance: no damage 6 axes
.Appearance: no damage Discontinuity 1.0 microsecond Max Discontinuity 1.0 microsecond Max
Sample No.:1,2,3,4,5.
Testing Equipment:
Name
Mated&unmated force tester
Micro-Ohmmeter
Model
1220s
TH2512B
Testing Results:
1.Visual inspection
Sample No.:
Specifition
1
2
3
4
5
Judgement
Test Beore
No Damage
OK
OK
OK
OK
OK
OK
Test After
No Damage
OK
OK
OK
OK
OK
OK
2.Low Level Contact Resistance Test (Durability+Mechanical shock+Random VibrationTest Before&Test After)Data: (unit:mΩ)
Sample No. Specifition
PIN No.:
Max.
40mΩ max pin1-pin8
Test
pin9-pin16
Before
18.04
19.34
17.82
18.75
18.94
19.34
17.46
18.56
18.75
20.12
19.19
20.33
20.64
17.14
18.14
19.16
pin1-pin8
17.45
19.33
18.93
18.21
19.49
16.64
18.74
18.59
pin9-pin16
18.54
19.47
17.57
19.64
20.41
19.85
17.87
19.87
40mΩ max pin1-pin8
Test
pin9-pin16
Before
18.75
19.49
16.64
18.74
18.93
18.21
19.49
17.57
18.14
19.19
20.33
20.12
19.19
20.33
19.87
20.14
pin1-pin8
18.74
18.93
18.21
19.33
18.93
18.21
18.98
19.68
pin9-pin16
20.12
19.19
20.33
19.47
17.57
19.64
17.67
17.84
40mΩ max pin1-pin8
Test
pin9-pin16
Before
19.33
18.93
18.21
18.21
19.49
16.64
18.74
18.59
18.54
19.47
17.57
19.64
20.41
19.85
17.87
19.87
pin1-pin8
18.21
19.49
16.64
18.74
18.75
20.12
19.19
19.19
pin9-pin16
20.41
20.64
17.14
18.14
19.19
20.33
20.64
18.93
40mΩ max pin1-pin8
Test
pin9-pin16
Before
18.75
19.49
16.64
18.74
18.93
18.21
19.49
17.57
19.58
20.41
19.85
20.12
19.19
20.33
19.87
20.14
pin1-pin8
19.19
20.33
20.64
19.33
18.93
18.21
18.98
19.68
pin9-pin16
18.93
18.21
19.49
19.47
17.57
19.64
17.67
17.84
40mΩ max pin1-pin8
Test
pin9-pin16
Before
18.75
19.49
16.64
18.74
18.93
18.21
19.49
17.57
19.58
20.41
19.85
17.87
19.19
20.33
19.87
20.14
pin1-pin8
19.19
18.93
18.21
19.49
18.93
18.21
18.98
19.68
pin9-pin16
18.93
18.21
19.49
19.47
17.57
19.64
17.67
17.84
Min.
Avg
Judgement
20.64
17.14
18.86
OK
20.41
16.64
18.79
OK
20.33
16.64
19.07
OK
20.33
17.57
18.93
OK
20.41
16.64
18.84
OK
20.64
16.64
19.11
OK
20.41
16.64
19.21
OK
20.64
17.57
19.01
OK
20.41
16.64
19.07
OK
19.68
17.57
18.78
OK
1
40mΩ max
Test After
2
40mΩ max
Test After
3
40mΩ max
Test After
4
40mΩ max
Test After
5
40mΩ max
Test After
3.Insertion and Withdrawal force:(Unit:N)
Sample No.:
Specifition
1
2
3
4
5
Test Before
Insertion force:5N~20N
9.25
9.87
11.41
10.15
9.87
Judgement
OK
Test After
Insertion force:5N~20N
9.37
9.97
10.40
8.45
11.42
OK
TestBefore 6times
Withdrawal Force:8N~20N.
12.01
13.72
14.94
14.54
12.01
OK
TestBefore 32times
Withdrawal Force:8N~20N.
12.67
14.61
14.92
14.85
13.66
OK
Test After
Withdrawal Force:6N~20N.
12.04
12.31
11.88
8.04
12.78
OK
4. Electrical discontinuity greater then 1 μsec(Mechanical shock+Random VibrationTest After)
Specifition
Sample No.:
Electrical disc ontinuity