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AO4403-MS
Semiconductor
Compiance
Features
SOP-8
● VDS (V) =-30V
1
2
3
4
Source
Source
Source
Gate
5
6
7
8
Drain
Drain
Drain
Drain
● ID =-6 A (VGS =-10V)
● RDS(ON) < 48mΩ (VGS =-10V)
● RDS(ON) < 57mΩ (VGS =-4.5V)
● RDS(ON) < 80mΩ (VGS =-2.5V)
D
G
S
Absolute Maximum Ratings Ta = 25℃
Parameter
Symbol
Rating
Drain-Source Voltage
VDS
-30
Gate-Source Voltage
VGS
±12
Continuous Drain Current
TA=25°C
TA=70°C
Pulsed Drain Current
Avalanche Current
Avalanche energy
Power Dissipation
Thermal Resistance.Junction- to-Ambient
Thermal Resistance.Junction- to-Lead
L=0.1mH
TA=25°C
TA=70°C
t ≤ 10s
Steady-State
ID
-5
-30
IAS,IAR
18
EAS,EAR
16
RthJA
V
-6
IDM
PD
Unit
3.1
2
A
mJ
W
40
75
RthJL
24
Junction Temperature
TJ
150
Junction Storage Temperature Range
Tstg
-55 to 150
℃/W
℃
www.msksemi.com
AO4403-MS
Semiconductor
Compiance
Electrical Characteristics Ta = 25℃
Parameter
Symbol
Test Conditions
Drain-Source Breakdown Voltage
VDSS
Zero Gate Voltage Drain Current
IDSS
Gate-Body leakage current
IGSS
VDS=0V, VGS=±12V
VGS(th)
VDS=VGS ID=-250μA
Gate Threshold Voltage
ID=-250μA, VGS=0V
Min
Typ
-30
On state drain current
RDS(On)
VDS=-30V, VGS=0V
-1
VDS=-30V, VGS=0V, TJ=55℃
-5
ID(ON)
Forward Transconductance
gFS
Input Capacitance
Ciss
Output Capacitance
Coss
Reverse Transfer Capacitance
Crss
Gate resistance
Rg
VGS=-10V, ID=-6A
-0.5
nA
-1.3
V
VGS=-4.5V, ID=-4A
57
VGS=-2.5V, ID=-2A
80
VGS=-4.5V, VDS=-5V
-30
VDS=-5V, ID=-6A
645
VGS=0V, VDS=-15V, f=1MHz
mΩ
A
19
S
780
pF
80
55
VGS=0V, VDS=0V, f=1MHz
4
12
Ω
7
Qg
Qgs
Gate Drain Charge
Qgd
2.5
Turn-On DelayTime
td(on)
6.5
Turn-On Rise Time
tr
Turn-Off DelayTime
td(off)
VGS=-4.5V, VDS=-15V, ID=-6A
VGS=-10V, VDS=-15V, RL=2.5Ω,
RGEN=6Ω
3.5
ns
41
tf
9
Body Diode Reverse Recovery Time
trr
11
Body Diode Reverse Recovery Charge
Qrr
IF=-6A, dI/dt=100A/us
nC
1.5
Turn-Off Fall Time
3.5
IS
VSD
±100
72
TJ=125℃
Gate Source Charge
Maximum Body-Diode Continuous Current
uA
48
Total Gate Charge
Diode Forward Voltage
Unit
V
VGS=-10V, ID=-6A
Static Drain-Source On-Resistance
Max
IS=-1A,VGS=0V
nC
-3.5
A
-1
V
Note : The static characteristics in Figures 1 to 6 are obtained using
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