520C

520C Specifications Model 520C Industrial Transistor Tester IN-CIRCUIT TEST The B+K Precision model 520C Transistor Tester is designed for in-circuit and out-of circuit transistor testing with special features for making additional tests on devices out-of circuit. The instrument is designed for a minimum amount of control manipulation, making for rapid testing of most devices. ■Determines good or bad transistors, FET’s, SCR’s, or diodes. ■Patented limited-energy pulse circuit permits in-circuit testing in the presence of low shunt impedance’s with complete safety for the device under test. ■Easy to operate panel eliminates the need to refer to a reference or operating manual-only three switches, no panel adjustments. ■Six position test switch makes it unnecessary to know the device terminal identification. ■A LED array identifies leakage in both Silicon and Germanium devices. ■Front Panel socket for out-of –circuit transistor testing. Model 510A Portable Transistor Tester 510A models 510A 520C The model 510A performs Good/Bad test for transistors, FET’s, and SCR’s. It also identifies NPN or PNP for transistors, N-channel or Pchannel for FET, FET-gate lead, all leads of transistors in LO drive, base lead in HI drive, and all leads of SCR. It uses a patented limited-energy pulse circuit, which provides highly successful in-circuit testing in the presence of low shunt impedance’s with complete safety for the device under test. The instrument is designed for a minimum amount of control manipulation, allowing for rapid testing of most devices. ■Rapid In-circuit and out-of circuit testing ■Good/Bad test ■NPN or PNP identification for transistors ■N-channel or P-channel identification for FET ■FET-gate and SCR lead identification ■Battery operated (4 x 1.5 AA batteries) GOOD/BAD TEST IDENTIFIES PNP and NPN transistors FET’s, SCR’s NPN or PNP FET as N-channel or P-channel NPN or PNP FET as N-channel or P-channel FET-gate lead, all leads of Silicone or germanium transistors transistors in LO drive, base lead in HI drive all leads of SCR OUT-OF-CIRCUIT TEST GOOD/BAD TEST IDENTIFIES MEASURES PNP and NPN transistors FET’s, SCR’s NPN or PNP FET as N-channel or P-channel Silicone or germanium transistors Reverse leakage from 0.1mA to 9mA PNP and NPN transistors FET’s NPN or PNP FET as N-channel or P-channel Does not apply AUTOMATIC INDICATORS AUDIBLE TONE LED TEST SWITCH METER SCALES GOOD NPN or PNP, Ge or Si Base or Gate for good transistor or FET’s Readable from 0.1µA to 9mA for Ice leakage, calibrated for silicon and germanium power and signal transistor leakage limits Does not apply NPN or PNP, Ge or Si Base or Gate for good transistor or FET’s Does not apply APPLIED TEST CURRENTS BASE DRIVE* COLLECTOR* TEST REPETITION 250mA (HI), 1mA (LO) 125mA 10Hz 5Hz IN-CIRCUIT SHUNT LIMIT FOR VALID GOOD/BAD TEST RESISTANCE CAPACITANCE >10Ω (HI), 1.5kΩ (LO)