TPA120R800A
Wuxi Unigroup Microelectronics Company
1200V Super-Junction Power MOSFET
DESCRIPTION
1200V super-junction Power MOSFET
Super-junction power MOSFET is a revolutionary technology for high voltage power MOSFETs,
designed according to the SJ principle. The SJ MOSFET is a price-performance optimized
product enabling to target cost sensitive applications in Consumer and Lighting markets ,
designed by Wuxi Unigroup Microelectronics Company.
FEATURES
APPLICATIONS
Very low FOM RDS(on)×Qg
Switch Mode Power Supply (SMPS)
100% avalanche tested
Uninterruptible Power Supply (UPS)
Power Factor Correction (PFC)
RoHS compliant
Device Marking and Package Information
Device
Package
Marking
TPA120R800A
TO-220F
120R800A
Parameter
Value
Unit
VDS @ Tj,max
1200
V
RDS(on),max
0.8
Ω
ID
12
A
Qg,typ
60
nC
IDM
36
A
Key Performance Parameters
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TPA120R800A
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Absolute Maximum Ratings TC = 25ºC, unless otherwise noted
Parameter
Drain-Source Voltage (VGS = 0V)
Continuous Drain Current
TC = 25ºC
Symbol
Value
Unit
VDSS
1200
V
12
ID
TC = 100ºC
Pulsed Drain Current
A
7.2
(note1)
IDM
36
A
VGSS
±30
V
EAS
180
mJ
Avalanche Current
IAS
6
A
Power Dissipation
PD
34
W
Continuous Body Diode Current
IS
12
ISM
36
MOSFET dv/dt ruggedness, VDS = 0...960V
dv/dt
50
V/ns
Reverse diode dv/dt, VDS = 0…960V, ISD ≤ ID
dv/dt
5
A/us
TJ, Tstg
-55~+150
ºC
Symbol
Value
Unit
Thermal Resistance, Junction-to-Case
RthJC
3.67
Thermal Resistance, Junction-to-Ambient
RthJA
80
Gate-Source Voltage
Single Pulse Avalanche Energy
(note2)
A
Pulsed Diode Forward Current
(note1)
Operating Junction and Storage Temperature Range
Thermal Resistance
Parameter
ºC/W
V1.0
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Specifications TJ = 25ºC, unless otherwise noted
Value
Parameter
Symbol
Test Conditions
Unit
Min.
Typ.
Max.
VGS = 0V, ID = 250µA
1200
--
--
VDS = 1200V, VGS = 0V, TJ = 25ºC
--
--
1
VDS = 1200V, VGS = 0V, TJ = 150ºC
--
--
100
IGSS
VGS = ±30V
--
--
±100
nA
Gate-Source Threshold Voltage
VGS(th)
VDS = VGS, ID = 250µA
2.5
--
4.5
V
Drain-Source On-Resistance
RDS(on)
VGS = 10V, ID = 3A
--
0.62
0.8
Ω
gfs
VDS = 10V, ID = 4A
--
10
--
S
--
2573
--
--
66
--
Static
Drain-Source Breakdown Voltage
V(BR)DSS
Zero Gate Voltage Drain Current
IDSS
Gate-Source Leakage
Forward Transconductance
(Note3)
V
μA
Dynamic
Input Capacitance
Ciss
VGS = 0V,
VDS = 100V,
f = 1.0MHz
Output Capacitance
Coss
Reverse Transfer Capacitance
Crss
--
2.3
--
Total Gate Charge
Qg
--
60
--
Gate-Source Charge
Qgs
--
14
--
Gate-Drain Charge
Qgd
--
22
--
Turn-on Delay Time
td(on)
--
51
--
Turn-on Rise Time
tr
--
71
--
Turn-off Delay Time
td(off)
--
154
--
--
67
--
--
0.9
1.2
V
--
675
--
ns
--
9
--
μC
--
25
--
A
Turn-off Fall Time
VDD = 400V, ID = 4A,
VGS = 10V
VDD = 400V, ID = 4A,
RG = 25Ω
tf
pF
nC
ns
Drain-Source Body Diode Characteristics
Body Diode Voltage
Reverse Recovery Time
VSD
TJ = 25ºC, ISD = 4A, VGS = 0V
trr
Reverse Recovery Charge
Qrr
Peak Reverse Recovery Current
Irrm
VR = 100V, IF = IS,
diF/dt = 100A/μs
Notes
1.
Repetitive Rating: Pulse Width limited by maximum junction temperature
2.
VDD = 50V, RG = 25Ω, Starting TJ = 25°C
3.
Pulse Test: Pulse Width ≤ 300μs, Duty Cycle ≤ 1%
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Typical Characteristics TJ = 25ºC, unless otherwise noted
Figure 1. Output Characteristics
Figure 2. Transfer Characteristics
18
20
15
VDS = 10V
16
20V
10V
8V
7V
6V
5V
ID, Drain Current (A)
ID, Drain Current (A)
25
10
TJ = 25ºC
14
12
10
8
6
TJ = 150ºC
4
5
2
0
0
0
5
10
15
0
20
2
VDS, Drain-to-Source Voltage (V)
Figure 3. On-Resistance vs. Drain Current
Capacitance (pF)
RDS(on), On-Resistance (Ω)
1
0.9
0.8
0.7
107
10
Ciss
106
105
Coss
104
Crss
103
0.6
VGS = 0
f = 1MHz
102
0
3
6
9
12
15
0
200
400
600
800
1000
ID, Drain Current (A)
VDS, Drain-to-Source Voltage (V)
Figure 5. Gate Charge
Figure 6. Body Diode Forward Voltage
12
Is, Source Current (A)
VGS, Gate-to-Source Voltage (V)
8
108
VGS = 10V
TJ = 25ºC
0.5
10
VDD = 400V
8
6
4
101
TJ = 150ºC
TJ = 25ºC
100
2
0
10-1
0
10
20
30
40
50
60
0.2
Qg, Total Gate Charge (nC)
V1.0
6
Figure 4. Capacitance
1.2
1.1
4
VGS, Gate-to-Source Voltage (V)
0.4
0.6
0.8
1
1.2
1.4
VSD, Source-to-Drain Voltage (V)
4
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TPA120R800A
Wuxi Unigroup Microelectronics Company
Typical Characteristics TJ = 25ºC, unless otherwise noted
Figure 8. Breakdown voltage vs.
Junction Temperature
Figure 7. On-Resistance vs.
Junction Temperature
1.3
ID = 250µA
2.5
2
VBR(DSS), (Normalized)
RDS(on), (Normalized)
3
VGS = 10V
ID = 3A
1.5
1
0.5
0
-100
1.2
1.1
1
0.9
0.8
-50
0
50
100
150
200
-30
0
TJ, Junction Temperature (ºC)
90
120
150
Figure 10. Safe operation area for
101
102
ID, Drain Current(A)
ZthJC, Thermal Impedance (K/W)
60
TJ, Junction Temperature (ºC)
Figure 9. Transient Thermal Impedance
100
D = 0.5
D = 0.2
D = 0.1
D = 0.05
D = 0.02
D = 0.01
Single Pulse
10-1
10-2
10-7
10-6
10-5
10-4
10-3
10-2
10-1
100
101
100
10-1
10-3
10-2
100
101
tp = 10us
tp = 100us
tp = 1ms
tp = 10ms
DC
101
102
103
VDS, Drain-Source Voltage(V)
Tp, Pulse Width (s)
V1.0
30
5
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TPA120R800A
Wuxi Unigroup Microelectronics Company
Figure A:Gate Charge Test Circuit and Waveform
Figure B:Resistive Switching Test Circuit and Waveform
Figure C:Unclamped Inductive Switching Test Circuit and Waveform
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TPA120R800A
Wuxi Unigroup Microelectronics Company
TO-220F
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TPA120R800A
Wuxi Unigroup Microelectronics Company
Disclaimer
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any legal liability or responsibility for the accuracy, completeness of any product or technology
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described herein or of any information provided herein to the maximum extent permitted by law. The
product specifications do not expand or otherwise modify Wuxi Unigroup’s terms and conditions of
purchase, including but not limited to the warranty expressed therein, which apply to these products.
Wuxi Unigroup Microelectronics CO., LTD. strives to supply high-quality high-reliability products.
However, any and all semiconductor products fail with some probability. It is possible that these
probabilistic failures could give rise to accidents or events that could endanger human lives that could
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Information (including circuit diagrams and circuit parameters) herein is for example only. It is not
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