Metal thin film chip resistors
(the highest reliability and precision)
■URG series
AEC-Q200 Compliant
Features
・ The tightest resistance tolerance: +/-0.01%
・ The smallest temperature coefficient of resistance: ±1ppm/℃
URG series
Thin film surface mount resistors
・ Long term stability with inorganic passivation
・ Thin film structure enabling low noise and anti-sulfur
Applications
・ Industrial measurement, electrical scales
・ High precision sensors, medical electronics
◆Part numbering system
URG 2012
L - 102 - L - T1
Packaging quantity: T1(1,000pcs),
T05(500pcs), T01(100pcs)
Series code
Size: URG1608, URG2012,
URG3216, URG5025, URG6432
Resistance tolerance
Nominal resistance value (E-24: 3 digit, E-96: 4 digit,
URG3216, URG5025, URG6432: all 4 digit)
Temperature coefficient of resistance
◆Electrical Specification
Type
Power
ratings
Temperature
coefficient
of resistance
Resistance range(Ω) Resistance tolerance
±0.01% (L)
±0.02% (P) ±0.05% (W)
±0.1% (B)
Maximum
voltage
Resistance
value series
Operating
temperature
Packaging
quantity
±0.5% (D)
*1
±1(K)
URG1608
1/16W
±2(L)
*2
250 ≦R ≦7.5K
100≦R≦7.5k
100V
250 ≦R ≦36K
100≦R≦36k
150V
±1(K)*1
URG2012
1/10W
T1
±2
(L) *2
-55℃ ~
*1
±1(K)
URG3216
1/4W
±2
(L)
*2
250 ≦R ≦68K
100≦R≦68k
200V
E24, E96
1/2W
URG6432
3/4W
±2
(L) *2
250 ≦R ≦100K
100≦R≦150k
300V
250 ≦R ≦100K
100≦R≦200k
300V
*1
±1(K)
±2
(L)
*2
*1: Applicable TCR K (±1.0) at temperature range 25℃∼ 65℃
Applicable TCR K (±1.5) at temperature range -20℃∼ 25℃, 65℃~125℃
*2: Applicable TCR L at temperature range -20℃∼ 125℃
*Contact us for requirements not listed in above table.
11
T05
T01
*1
±1(K)
URG5025
155℃
◆Dimensions
L
a
Size
Type
a
W
(inch)
L
W
a
b
t
0603
1.60±0.20
0.80+0.25/−0.20
0.30±0.20
0.30±0.20
0.40+0.15/−0.10
URG2012
0805
2.00±0.20
1.25+0.25/−0.20
0.40±0.20
0.40±0.20
0.40+0.15/−0.10
URG3216
1206
3.20±0.20
1.60±0.25
0.50±0.25
0.50±0.20
0.40+0.15/−0.10
URG5025
2010
5.00±0.20
2.50±0.25
0.60±0.25
0.60±0.25
0.45±0.10
URG6432
2512
6.40+0.20/−0.40
3.20±0.25
0.75±0.25
0.80±0.20
0.45±0.20
t
b
◆Reliability specification
Standard
Test items
Condition (test methods (MIL-PRF-55342/JIS C5201-1)
Short time overload
2.5 x rated voltage, 5seconds
Life (biased)
70℃, rated voltage, 90min on 30min off, 2000hours
High temperature high humidity
85℃, 85%RH, 1/10 of rated power, 90min on 30min off, 1000hours
±0.05%+0.01Ω
Temperature shock
-65℃ (15min) ∼ 150℃ (15min) 100cycles
±0.02%+0.01Ω
High temperature exposure
155℃, no bias, 1000hours
±0.05%+0.01Ω
Resistance to soldering heat
235±5℃, 30 seconds (reflow), (by MIL-PRF-55342)
±0.01%+0.01Ω
*1
*1
±0.02%+0.01Ω
±0.02%+0.01Ω(R≧250Ω)
±0.05%+0.01Ω(R<250Ω)
*1 Rated voltage is given by E=
RxP
E= rated voltage (V), R=nominal resistance value(Ω), P=rated power(W)
If rated voltage exceeds maximum voltage /element, maximum voltage/element is the rated voltage.
12
URG series
(unit:mm)
Thin film surface mount resistors
URG1608
Metal thin film chip resistors
(the highest reliability and precision)
■URG series
◆Reliability test data
○Biased life test
1000
800
URG2012
600
LL70℃_0.25W, n = 20
400
200
0
-200
-400
-600
250Ω
1kΩ
-800
20kΩ
32kΩ
URG series
-1000
10kΩ
Resistance drift (ppm)
Resistance drift (ppm)
Thin film surface mount resistors
1000
800
URG3216
600
LL70℃_0.25W, n = 20
400
200
0
-200
-400
-600
10 100 1000 10000
Test duration(h)
250Ω
-800
-1000
1kΩ
68kΩ
110 100 1000 10000
Test duration(h)
○High temperature high humidity (biased)
500
400
URG2012
300
THB 85 ℃, 85 %, n = 20
200
100
0
-100
-200
-300
250Ω
1kΩ
-400
20kΩ
32kΩ
-500
10kΩ
Resistance drift (ppm)
Resistance drift (ppm)
500
400
URG3216
300
THB 85 ℃, 85 %, n = 20
200
100
0
-100
-200
-300
-500
10 100 1000 10000
Test duration(h)
250Ω
-400
1kΩ
68kΩ
10 100 1000 10000
Test duration(h)
○Temperature shock
150
100
200
URG2012, n = 10
Thermal Shock_-65℃ to +150℃
50
0
-50
-100
-150
-200
250Ω
1kΩ
68kΩ
Resistance drift (ppm)
Resistance drift (ppm)
200
150
100
Thermal Shock_ -65℃ to +150℃
50
0
-50
-100
-150
-200
10 10 100 1000
Number of cycles
URG3216, n = 10
250Ω
1kΩ
68kΩ
10 10 100 1000
Number of cycles
○High temperature exposure
URG2012, n = 20
300
High Temperature Exposure,155℃
200
100
0
-100
-200
-300
-400
-500
13
500
400
250Ω
1kΩ
32kΩ
10 100 1000 10000
Test duration(h)
Resistance drift (ppm)
Resistance drift (ppm)
500
400
URG3216, n = 20
300
High Temperature Exposure,155℃
200
100
0
-100
-200
-300
-400
-500
250Ω
1kΩ
68kΩ
10 100 1000 10000
Test duration(h)
◆Temperature coefficient of Resistance
○URG2012
1000
800
URG2012-1kΩ
No.1
No.2
No.3
No.4
No.5
No.6
No.7
No.8
No.9
No.10
400
200
0
-200
-400
-600
±2ppm / ℃
±5ppm / ℃
-800
Resistance drift (ppm)
600
1000
Variation of resistance with temperature
600
Variation of resistance with temperature
URG2012-32kΩ
200
0
-200
-400
-600
±2ppm / ℃
±5ppm / ℃
-800
-1000
No.1
No.2
No.3
No.4
No.5
No.6
No.7
No.8
No.9
No.10
400
-1000
-75 -50 -25 0
25
50 75 100 125
Ambient temperature (℃)
150 175
-75 -50 -25 0
25
50 75 100 125
Ambient temperature (℃)
150 175
1000
600
1000
Variation of resistance with temperature
800
URG3216-1kΩ
No.1
No.2
No.3
No.4
No.5
No.6
No.7
No.8
No.9
No.10
400
200
0
-200
-400
-600
±2ppm / ℃
±5ppm / ℃
-800
Resistance drift (ppm)
Resistance drift (ppm)
800
URG series
○URG3216
600
Variation of resistance with temperature
URG3216-68kΩ
200
0
-200
-400
±2ppm / ℃
±5ppm / ℃
-800
-1000
No.1
No.2
No.3
No.4
No.5
No.6
No.7
No.8
No.9
No.10
400
-600
-1000
-75 -50 -25 0
25
50 75 100 125
Ambient temperature (℃)
150 175
-75 -50 -25 0
25
50 75 100 125
Ambient temperature (℃)
150 175
Ratio to rated power (%)
◆Derating Curve
100
50
0
-55
Thin film surface mount resistors
Resistance drift (ppm)
800
0 50 70 100 155
Ambient temperature (℃)
14
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