ASDM100R520PQ
-100V P-Channel MOSFET
Features
Product Summary
· Advanced Split Gate Trench Technology
· Excellent RDS(ON) and Low Gate
Charge
· Lead free product is acquired
V
DS
-100
V
34
mΩ
- 40
A
R DS(on),Typ@ VGS=-10 V
ID
Application
· Load Switch
· PWM Application
· Power management
DFN5*6-8
P-Channel
Absolute Maximum Ratings (TC=25℃ unless otherwise specified)
Symbol
Parameter
Max.
Units
VDSS
Drain-Source Voltage
-100
V
VGSS
Gate-Source Voltage
±20
V
TC = 25℃
-40
A
TC = 100℃
-16
A
-160
A
81
mJ
54
W
2.3
℃/W
-55 to +150
℃
ID
Continuous Drain Current
IDM
Pulsed Drain Current
note1
EAS
Single Pulsed Avalanche Energy
PD
Power Dissipation
RθJC
TJ, TSTG
note2
TC = 25℃
Thermal Resistance, Junction to Case
Operating and Storage Temperature Range
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ASDM100R520PQ
-100V P-Channel MOSFET
Electrical Characteristics (TJ=25℃ unless otherwise specified)
Symbol
Parameter
Test Condition
Min.
Typ.
Max.
Units
Off Characteristic
V(BR)DSS
Drain-Source Breakdown Voltage
VGS=0V, ID=-250μA
-100
-
-
V
IDSS
Zero Gate Voltage Drain Current
VDS=-100V, VGS=0V,
-
-
-1.0
μA
IGSS
Gate to Body Leakage Current
VDS=0V, VGS= ±20V
-
-
±100
nA
-1.0
-1.4
-2.5
V
On Characteristics
VGS(th)
Gate Threshold Voltage
VDS=VGS, ID=-250μA
RDS(on)
Static Drain-Source on-Resistance
VGS=-10V, ID=-20A
-
34
52
note3
VGS=-4.5V, ID=-10A
-
38
60
-
1458
-
pF
-
133
-
pF
-
8.9
-
pF
-
40
-
nC
-
7.8
-
nC
-
8.6
-
nC
-
13
-
ns
-
39
-
ns
-
100.1
-
ns
-
105.3
-
ns
mΩ
Dynamic Characteristics
Ciss
Input Capacitance
Coss
Output Capacitance
Crss
Reverse Transfer Capacitance
Qg
Total Gate Charge
Qgs
Gate-Source Charge
Qgd
Gate-Drain(“Miller”) Charge
VDS=-50V, VGS=0V,
f=1.0MHz
VDS=-50V, ID=-5A,
VGS=-10V
Switching Characteristics
td(on)
Turn-on Delay Time
tr
Turn-on Rise Time
td(off)
Turn-off Delay Time
tf
VDD=-50V, ID=-5A,
RG=6Ω, VGS=-10V
Turn-off Fall Time
Drain-Source Diode Characteristics and Maximum Ratings
IS
Maximum Continuous Drain to Source Diode Forward
Current
-
-
-40
A
ISM
Maximum Pulsed Drain to Source Diode Forward Current
-
-
-160
A
VSD
Drain to Source Diode Forward
Voltage
-
-
-1.2
V
-
104
-
ns
-
280
-
nC
trr
Body Diode Reverse Recovery Time
Qrr
Body Diode Reverse Recovery
Charge
VGS=0V, IS=-25A
TJ=25℃,
IF=-5A,dI/dt=100A/μs
Notes:1. Repetitive Rating: Pulse Width Limited by Maximum Junction Temperature
2. EAS condition: TJ=25℃, VDD=-50V, VG=-10V, RG=25Ω, L=0.5mH, IAS=-18A
3. Pulse Test: Pulse Width≤300μs, Duty Cycle≤0.5%
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ASDM100R520PQ
-100V P-Channel MOSFET
Typical Performance Characteristics
Figure 2: Typical Transfer Characteristics
Figure1: Output Characteristics
-ID (A)
50
-10V
40
25℃
30
30
20
20
-2V
10
2
4
125℃
10
V GS=-1V
-V DS(V)
0
0
T A=-55℃
40
-3V
-4.5V
6
8
0
10
Figure 3:On-resistance vs. Drain Current
-VGS (V)
0
10
50
0.5
1.0
1.5
2.0
2.5
3.0
3.5
4.0
4.5
Figure 4 : Body Diode Characteristics
RDS(ON) (mΩ)
60
-ID (A)
50
-IS(A)
VGS =-4.5V
TJ =150℃
40
30
T J=-50℃
TJ =-25℃
1
VGS =-10V
20
10
-ID(A)
0
0
5
10
15
20
25
30
0.1
0.0
Figure 5: Gate Charge Characteristics
10
8
0.2
0.4
-VSD (V)
0.6
0.8
1.0
1.2
1.4
Figure 6: Capacitance Characteristics
-V GS(V)
105
VDS=-50V
ID =-5A
C(pF)
104
Ciss
6
103
4
Coss
2
10
2
0
0
Q g(nC)
10
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20
30
3/8
40
50
5
-VDS (V)
0
10
20
30
Crss
40
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60
0755-86970486
ASDM100R520PQ
-100V P-Channel MOSFET
Figure 7: Normalized Breakdown Voltage vs.
Junction Temperature
1.3
-VBR(DSS)
Figure 8: Normalized on Resistance vs.
Junction Temperature
2.5
1.2
RDS(on)
2.0
1.1
1.5
1.0
1.0
0.9
Tj (℃)
0
-100
-50
0
50
100
150
200
-ID(A)
30
Limited by RDS(on)
10
10μs
50
100
150
200
-ID(A)
20
100μs
101
15
1ms
10ms
10
100ms
TC=25℃
Single pulse
10-1
0.1
0
25
2
100
Tj (℃)
-50
Figure 10: Maximum Continuous Drain Current
vs. Case Temperature
Figure 9: Maximum Safe Operating Area
103
0.5
-100
DC
-VDS (V)
10
1
5
100
1000
0
0
25
50
TC (℃)
75
100
125
150
175
Figure.11: Maximum Effective
Transient Thermal Impedance, Junction-to-Case
101
ZthJ-C(℃/W)
100
D=0.5
t1
D=0.2
D=0.1
t2
D=0.05
D=0.02
D=0.01
Notes:
Single pulse 1.Duty factor D=t1/t2
2.Peak TJ=PDM*ZthJC+TC
TP(s)
PDM
10-1
10-2
10-3 -6
10
10-5
10-4
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10-2
4/8
10-1
100
101
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ASDM100R520PQ
-100V P-Channel MOSFET
Test Circuit
Figure1:Gate Charge Test Circuit & Waveform
Figure 2: Resistive Switching Test Circuit & Waveforms
Figure 3:Unclamped Inductive Switching Test Circuit & Waveforms
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ASDM100R520PQ
-100V P-Channel MOSFET
Ordering and Marking Information
Ordering Device No.
Marking
Package
Packing
Quantity
ASDM100R520PQ-R
100R520P
DFN5*6-8
Tape&Reel
4000/Reel
MARKING
PACKAGE
DFN5*6-8
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100R520P
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ASDM100R520PQ
-100V P-Channel MOSFET
DFN5x6_P, 8 Leads
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ASDM100R520PQ
-100V P-Channel MOSFET
IMPORTANT NOTICE
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DOCUMENT, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR
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corrections or other changes without further notice to this document and any product described herein. ShenZhen Ascend Semiconductor
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does ShenZhen Ascend Semiconductor Incorporated convey any license under its patent or trademark rights, nor the rights of others. Any
Customer or user of this document or products described herein in such applications shall assume .
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ShenZhen Ascend Semiconductor Incorporated does not warrant or accept any liability whatsoever in respect of any products purchased
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