ASDM40R022NQ
40V N-Channel MOSFET
Features
Product Summary
Advanced Split Gate Trench Technology
Excellent RDS(ON) and Low Gate Charge
Lead free product is acquired
Application
V
DS
R
DS(on),Max
I
@ VGS=10 V
D
40
V
2.2
mΩ
140
A
Load Switch
PWM Application
DFN5*6-8
N-Channel
Absolute Maximum Ratings (TC=25℃ unless otherwise specified)
Symbol
Parameter
Max.
Units
VDSS
Drain-Source Voltage
40
V
VGSS
Gate-Source Voltage
±20
V
TC = 25℃
140
A
TC = 100℃
91
A
560
A
125
mJ
83
W
ID
Continuous Drain Current
IDM
Pulsed Drain Current note1
EAS
Single Pulsed Avalanche Energy
PD
Power Dissipation
note2
TC = 25℃
RθJC
Thermal Resistance, Junction to Case
1.7
℃/W
RθJA
Thermal Resistance, Junction to Ambient
55
℃/W
-55 to +150
℃
TJ, TSTG
Operating and Storage Temperature Range
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ASDM40R022NQ
40V N-Channel MOSFET
Electrical Characteristics (TJ=25℃ unless otherwise specified)
Symbol
Parameter
Test Condition
Min.
Typ.
Max.
Units
Off Characteristic
V(BR)DSS
Drain-Source Breakdown Voltage
VGS=0V, ID=250μA
40
-
-
V
IDSS
Zero Gate Voltage Drain Current
VDS=40V, VGS=0V,
-
-
1.0
μA
IGSS
Gate to Body Leakage Current
VDS=0V, VGS= ±20V
-
-
±100
nA
Gate Threshold Voltage
VDS=VGS, ID=250μA
1.0
-
2.5
V
Static Drain-Source on-Resistance
VGS=10V, ID=30A
-
-
2.2
note3
VGS=4.5V, ID=20A
-
2.7
4.8
-
3162
-
pF
-
1099
-
pF
-
157
-
pF
-
95
-
nC
-
15
-
nC
-
11
-
nC
-
12.5
-
ns
-
7
-
ns
-
50
-
ns
-
8.5
-
ns
On Characteristics
VGS(th)
RDS(on)
mΩ
Dynamic Characteristics
Ciss
Input Capacitance
Coss
Output Capacitance
Crss
Reverse Transfer Capacitance
Qg
Total Gate Charge
Qgs
Gate-Source Charge
Qgd
Gate-Drain(“Miller”) Charge
VDS=20V, VGS=0V,
f=1.0MHz
VDS=20V, ID=75A,
VGS=10V
Switching Characteristics
td(on)
Turn-on Delay Time
tr
Turn-on Rise Time
td(off)
Turn-off Delay Time
tf
V DD=20V, ID=75A,
RG=1.6Ω, VGS=10V
Turn-off Fall Time
Drain-Source Diode Characteristics and Maximum Ratings
IS
Maximum Continuous Drain to Source Diode Forward
Current
-
-
140
A
ISM
Maximum Pulsed Drain to Source Diode Forward Current
-
-
560
A
VSD
Drain to Source Diode Forward
Voltage
-
-
1.2
V
-
31
-
ns
-
110
-
nC
trr
Body Diode Reverse Recovery Time
Qrr
Body Diode Reverse Recovery
Charge
VGS=0V, IS=30A
TJ=25℃,
IF=IS,dI/dt=100A/μs
Notes:1. Repetitive Rating: Pulse Width Limited by Maximum Junction Temperature
2. EAS condition: TJ=25℃, VDD=20V, VG=10V, RG=25Ω, L=0.5mH, IAS=22.4A
3. Pulse Test: Pulse Width≤300μs, Duty Cycle≤0.5%
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ASDM40R022NQ
40V N-Channel MOSFET
Typical Performance Characteristics
Figure 2: Typical Transfer Characteristics
Figure1: Output Characteristics
200
ID (A)
10V
200
4.5V
ID (A)
160
160
4V
120
120
80
VGS=2.5V
TJ=125℃
80
25℃
40
40
VDS(V)
0
0
1
2
3
4
5
0
0
RDS(ON) (mΩ)
1.0E+01
3.0
125℃
VGS=10V
1.0E-03
1.0
1.0E-04
ID(A)
0.5
0
10
20
30
40
1.0E-05
0.0
Figure 5: Gate Charge Characteristics
0.2
0.4
VSD(V)
0.6
0.8
1.0
Figure 6: Capacitance Characteristics
VGS(V)
105
VDS=20V
ID=75A
C(pF)
104
Ciss
6
103
Coss
102
Crss
4
2
Qg(nC)
0
5.0
TJ=25℃
1.0E-02
1.5
0
4.0
IS(A)
1.0E-01
VGS=4.5V
2.0
8
VGS(V)
3.0
1.0E+00
2.5
10
2.0
Figure 4: Body Diode Characteristics
Figure 3:On-resistance vs. Drain Current
3.5
1.0
20
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40
60
3/8
80
100
VDS(V)
101
0
8
16
24
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40
0755-86970486
ASDM40R022NQ
40V N-Channel MOSFET
Figure 7: Normalized Breakdown Voltage vs.
Junction Temperature
VBR(DSS)
1.3
Figure 8: Normalized on Resistance vs.
Junction Temperature
2.5
1.2
RDS(on)
2.0
1.1
1.5
1.0
1.0
0.9
Tj (℃)
0
-100
-50
0
50
100
150
200
Figure 9: Maximum Safe Operating Area
Tj (℃)
-50
0
50
100
150
200
Figure 10: Maximum Continuous Drain Current
vs. Case Temperature
ID(A)
200
Limited by RDS(on)
103
0.5
-100
ID(A)
150
10μs
120
100μs
1ms
102
90
10ms
101
0.1
1
60
100ms
TC=25℃
Single pulse
30
DC
VDS (V)
10
0
100
0
25
50
Tc (℃)
75
100
125
150
175
Figure.11: Maximum Effective
Transient Thermal Impedance, Junction-to-Case
101
ZthJ-C(℃/W)
100
D=0.5
D=0.2
D=0.1
D=0.05
D=0.02
D=0.01
Single pulse
10-2
10-3 -6
10
10-5
10-4
NOV 2020 Version1.0
TP(s)
10-3
10-2
4/8
t1
PDM
10-1
t2
Notes:
1.Duty factor D=t1/t2
2.Peak T J=PDM*ZthJC+TC
10-1
100
101
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ASDM40R022NQ
40V N-Channel MOSFET
Test Circuit
Figure1:Gate Charge Test Circuit & Waveform
Figure 2: Resistive Switching Test Circuit & Waveforms
Figure 3:Unclamped Inductive Switching Test Circuit & Waveforms
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ASDM40R022NQ
40V N-Channel MOSFET
Ordering and Marking Information
Ordering Device No.
Marking
Package
Packing
Quantity
ASDM40R022NQ-R
40R022N
DFN5*6-8
Tape&Reel
4000/Reel
MARKING
PACKAGE
DFN5*6-8
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40R022N
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ASDM40R022NQ
40V N-Channel MOSFET
DFN5x6_P, 8 Leads
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ASDM40R022NQ
40V N-Channel MOSFET
IMPORTANT NOTICE
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DOCUMENT, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR
PURPOSE (AND THEIR EQUIVALENTS UNDER THE LAWS OF ANY JURISDICTION).
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corrections or other changes without further notice to this document and any product described herein. ShenZhen Ascend Semiconductor
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does ShenZhen Ascend Semiconductor Incorporated convey any license under its patent or trademark rights, nor the rights of others. Any
Customer or user of this document or products described herein in such applications shall assume .
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