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S-80153ANPF-JDETFG

S-80153ANPF-JDETFG

  • 厂商:

    ABLIC(艾普凌科)

  • 封装:

    SMD4

  • 描述:

    IC SUPERVISOR 1 CHANNEL SNT-4A

  • 详情介绍
  • 数据手册
  • 价格&库存
S-80153ANPF-JDETFG 数据手册
S-801 Series www.ablic.com www.ablicinc.com ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) © ABLIC Inc., 2000-2016 Rev.4.2_01 The S-801 Series is a series of high-precision voltage detectors with a built-in delay time generator of fixed time developed using CMOS process. The detection voltage is fixed internally, with an accuracy of 2.0 %. Internal oscillator and counter timer can delay the release signal without external parts. Three delay times 50 ms, 100 ms, and 200 ms are available. Two output forms, Nch open-drain and CMOS output, are available.  Features       1.3 A typ. (at VDD3.5 V) 2.0 % 0.95 V to 10.0 V 60 mV typ. 2.2 V to 6.0 V (0.1 V step) A type 50 ms typ. B type 100 ms typ. C type 200 ms typ.  ON/OFF switching function of delay time (DS pin)  Output forms Nch open-drain output (Active Low) CMOS output (Active Low)  Lead-free, Sn 100%, halogen-free*1 Ultra-low current consumption High-precision detection voltage Operating voltage range Hysteresis characteristics Detection voltage Three delay times *1. Refer to “ Product Name Structure” for details.  Applications  Power monitor for portable equipment such as notebook computers, digital still cameras, PDA, and cellular phones.  Constant voltage power monitor for cameras, video equipment and communication devices.  Power monitor for microcomputers and reset for CPUs.  Packages  SOT-23-5  SNT-4A 1 ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.4.2_01 S-801 Series  Block Diagrams 1. Nch Open-drain Output Products VDD Delay circuit  *1  Oscillator counter timer VREF OUT *1 *1 VSS DS *1. Parasitic diode Figure 1 2. CMOS Output Products VDD  *1  Delay circuit OUT Oscillator counter timer *1 *1 VREF VSS DS *1. Parasitic diode Figure 2 2 *1 ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.4.2_01 S-801 Series  Product Name Structure The detection voltage, delay time, output form and packages for S-801 Series can be selected at the user's request. Refer to the “1. Product name” for the construction of the product name, “2. Packages” regarding the package drawings and “3. Product Name List” for the full product names. 1. Product Name 1-1. SOT-23-5 S-801xx x x MC - xxx T2 x Environmental code U: Lead-free (Sn 100%), halogen-free G: Lead-free (for details, please contact our sales office) IC direction in tape specifications*1 Product code*2 Package code Output form N: Nch open-drain output (Active low) L: CMOS output (Active low) Delay time A: 50 ms typ. B: 100 ms typ. C: 200 ms typ. Detection voltage value 22 to 60 (e.g. When the detection voltage is 2.2 V, it is expressed as 22.) *1. Refer to the tape drawing. *2. Refer to Table 2 in “3. Product name list”. 3 ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.4.2_01 S-801 Series 1-2. SNT-4A S-801xx x x PF - xxx TF U Environmental code U: Lead-free (Sn 100%), halogen-free IC direction in tape specifications*1 Product code*2 Package code Output form N: Nch open-drain output (Active low) L: CMOS output (Active low) Delay time A: 50 ms typ. B: 100 ms typ. C: 200 ms typ. Detection voltage value 22 to 60 (e.g. When the detection voltage is 2.2 V, it is expressed as 22.) *1. Refer to the tape drawing. *2. Refer to Table 2 in “3. Product name list”. 2. Packages Package name SOT-23-5 SNT-4A 4 Package MP005-A-P-SD PF004-A-P-SD Drawing code Tape Reel MP005-A-C-SD MP005-A-R-SD PF004-A-C-SD PF004-A-R-SD Land — PF004-A-L-SD ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.4.2_01 S-801 Series 3. Product Name List 3-1. SOT-23-5 Table 1 (1/3) Detection voltage range 2.2 V 2.0% 2.3 V 2.0% 2.4 V 2.0% 2.5 V 2.0% 2.6 V 2.0% 2.7 V 2.0% 2.8 V 2.0% 2.9 V 2.0% 3.0 V 2.0% 3.1 V 2.0% 3.2 V 2.0% 3.3 V 2.0% 3.4 V 2.0% Delay time 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. Nch open-drain output products S-80122ANMC-JCHT2x S-80122BNMC-JGHT2x S-80122CNMC-JKHT2x S-80123ANMC-JCIT2x S-80123BNMC-JGIT2x S-80123CNMC-JKIT2x S-80124ANMC-JCJT2x S-80124BNMC-JGJT2x S-80124CNMC-JKJT2x S-80125ANMC-JCKT2x S-80125BNMC-JGKT2x S-80125CNMC-JKKT2x S-80126ANMC-JCLT2x S-80126BNMC-JGLT2x S-80126CNMC-JKLT2x S-80127ANMC-JCMT2x S-80127BNMC-JGMT2x S-80127CNMC-JKMT2x S-80128ANMC-JCNT2x S-80128BNMC-JGNT2x S-80128CNMC-JKNT2x S-80129ANMC-JCOT2x S-80129BNMC-JGOT2x S-80129CNMC-JKOT2x S-80130ANMC-JCPT2x S-80130BNMC-JGPT2x S-80130CNMC-JKPT2x S-80131ANMC-JCQT2x S-80131BNMC-JGQT2x S-80131CNMC-JKQT2x S-80132ANMC-JCRT2x S-80132BNMC-JGRT2x S-80132CNMC-JKRT2x S-80133ANMC-JCST2x S-80133BNMC-JGST2x S-80133CNMC-JKST2x S-80134ANMC-JCTT2x S-80134BNMC-JGTT2x S-80134CNMC-JKTT2x CMOS output products S-80122ALMC-JAHT2x S-80122BLMC-JEHT2x S-80122CLMC-JIHT2x S-80123ALMC-JAIT2x S-80123BLMC-JEIT2x S-80123CLMC-JIIT2x S-80124ALMC-JAJT2x S-80124BLMC-JEJT2x S-80124CLMC-JIJT2x S-80125ALMC-JAKT2x S-80125BLMC-JEKT2x S-80125CLMC-JIKT2x S-80126ALMC-JALT2x S-80126BLMC-JELT2x S-80126CLMC-JILT2x S-80127ALMC-JAMT2x S-80127BLMC-JEMT2x S-80127CLMC-JIMT2x S-80128ALMC-JANT2x S-80128BLMC-JENT2x S-80128CLMC-JINT2x S-80129ALMC-JAOT2x S-80129BLMC-JEOT2x S-80129CLMC-JIOT2x S-80130ALMC-JAPT2x S-80130BLMC-JEPT2x S-80130CLMC-JIPT2x S-80131ALMC-JAQT2x S-80131BLMC-JEQT2x S-80131CLMC-JIQT2x S-80132ALMC-JART2x S-80132BLMC-JERT2x S-80132CLMC-JIRT2x S-80133ALMC-JAST2x S-80133BLMC-JEST2x S-80133CLMC-JIST2x S-80134ALMC-JATT2x S-80134BLMC-JETT2x S-80134CLMC-JITT2x 5 ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.4.2_01 S-801 Series Table 1 (2/3) Detection voltage range 3.5 V 2.0% 3.6 V 2.0% 3.7 V 2.0% 3.8 V 2.0% 3.9 V 2.0% 4.0 V 2.0% 4.1 V 2.0% 4.2 V 2.0% 4.3 V 2.0% 4.4 V 2.0% 4.5 V 2.0% 4.6 V 2.0% 4.7 V 2.0% 4.8 V 2.0% 4.9 V 2.0% 6 Delay time 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. Nch open-drain output products S-80135ANMC-JCUT2x S-80135BNMC-JGUT2x S-80135CNMC-JKUT2x S-80136ANMC-JCVT2x S-80136BNMC-JGVT2x S-80136CNMC-JKVT2x S-80137ANMC-JCWT2x S-80137BNMC-JGWT2x S-80137CNMC-JKWT2x S-80138ANMC-JCXT2x S-80138BNMC-JGXT2x S-80138CNMC-JKXT2x S-80139ANMC-JCYT2x S-80139BNMC-JGYT2x S-80139CNMC-JKYT2x S-80140ANMC-JCZT2x S-80140BNMC-JGZT2x S-80140CNMC-JKZT2x S-80141ANMC-JC2T2x S-80141BNMC-JG2T2x S-80141CNMC-JK2T2x S-80142ANMC-JC3T2x S-80142BNMC-JG3T2x S-80142CNMC-JK3T2x S-80143ANMC-JC4T2x S-80143BNMC-JG4T2x S-80143CNMC-JK4T2x S-80144ANMC-JC5T2x S-80144BNMC-JG5T2x S-80144CNMC-JK5T2x S-80145ANMC-JC6T2x S-80145BNMC-JG6T2x S-80145CNMC-JK6T2x S-80146ANMC-JC7T2x S-80146BNMC-JG7T2x S-80146CNMC-JK7T2x S-80147ANMC-JC8T2x S-80147BNMC-JG8T2x S-80147CNMC-JK8T2x S-80148ANMC-JC9T2x S-80148BNMC-JG9T2x S-80148CNMC-JK9T2x S-80149ANMC-JDAT2x S-80149BNMC-JHAT2x S-80149CNMC-JLAT2x CMOS output products S-80135ALMC-JAUT2x S-80135BLMC-JEUT2x S-80135CLMC-JIUT2x S-80136ALMC-JAVT2x S-80136BLMC-JEVT2x S-80136CLMC-JIVT2x S-80137ALMC-JAWT2x S-80137BLMC-JEWT2x S-80137CLMC-JIWT2x S-80138ALMC-JAXT2x S-80138BLMC-JEXT2x S-80138CLMC-JIXT2x S-80139ALMC-JAYT2x S-80139BLMC-JEYT2x S-80139CLMC-JIYT2x S-80140ALMC-JAZT2x S-80140BLMC-JEZT2x S-80140CLMC-JIZT2x S-80141ALMC-JA2T2x S-80141BLMC-JE2T2x S-80141CLMC-JI2T2x S-80142ALMC-JA3T2x S-80142BLMC-JE3T2x S-80142CLMC-JI3T2x S-80143ALMC-JA4T2x S-80143BLMC-JE4T2x S-80143CLMC-JI4T2x S-80144ALMC-JA5T2x S-80144BLMC-JE5T2x S-80144CLMC-JI5T2x S-80145ALMC-JA6T2x S-80145BLMC-JE6T2x S-80145CLMC-JI6T2x S-80146ALMC-JA7T2x S-80146BLMC-JE7T2x S-80146CLMC-JI7T2x S-80147ALMC-JA8T2x S-80147BLMC-JE8T2x S-80147CLMC-JI8T2x S-80148ALMC-JA9T2x S-80148BLMC-JE9T2x S-80148CLMC-JI9T2x S-80149ALMC-JBAT2x S-80149BLMC-JFAT2x S-80149CLMC-JJAT2x ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.4.2_01 S-801 Series Table 1 (3/3) Detection voltage range 5.0 V 2.0% 5.1 V 2.0% 5.2 V 2.0% 5.3 V 2.0% 5.4 V 2.0% 5.5 V 2.0% 5.6 V 2.0% 5.7 V 2.0% 5.8 V 2.0% 5.9 V 2.0% 6.0 V 2.0% Delay time 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. Nch open-drain output products S-80150ANMC-JDBT2x S-80150BNMC-JHBT2x S-80150CNMC-JLBT2x S-80151ANMC-JDCT2x S-80151BNMC-JHCT2x S-80151CNMC-JLCT2x S-80152ANMC-JDDT2x S-80152BNMC-JHDT2x S-80152CNMC-JLDT2x S-80153ANMC-JDET2x S-80153BNMC-JHET2x S-80153CNMC-JLET2x S-80154ANMC-JDFT2x S-80154BNMC-JHFT2x S-80154CNMC-JLFT2x S-80155ANMC-JDGT2x S-80155BNMC-JHGT2x S-80155CNMC-JLGT2x S-80156ANMC-JDHT2x S-80156BNMC-JHHT2x S-80156CNMC-JLHT2x S-80157ANMC-JDIT2x S-80157BNMC-JHIT2x S-80157CNMC-JLIT2x S-80158ANMC-JDJT2x S-80158BNMC-JHJT2x S-80158CNMC-JLJT2x S-80159ANMC-JDKT2x S-80159BNMC-JHKT2x S-80159CNMC-JLKT2x S-80160ANMC-JDLT2x S-80160BNMC-JHLT2x S-80160CNMC-JLLT2x CMOS output products S-80150ALMC-JBBT2x S-80150BLMC-JFBT2x S-80150CLMC-JJBT2x S-80151ALMC-JBCT2x S-80151BLMC-JFCT2x S-80151CLMC-JJCT2x S-80152ALMC-JBDT2x S-80152BLMC-JFDT2x S-80152CLMC-JJDT2x S-80153ALMC-JBET2x S-80153BLMC-JFET2x S-80153CLMC-JJET2x S-80154ALMC-JBFT2x S-80154BLMC-JFFT2x S-80154CLMC-JJFT2x S-80155ALMC-JBGT2x S-80155BLMC-JFGT2x S-80155CLMC-JJGT2x S-80156ALMC-JBHT2x S-80156BLMC-JFHT2x S-80156CLMC-JJHT2x S-80157ALMC-JBIT2x S-80157BLMC-JFIT2x S-80157CLMC-JJIT2x S-80158ALMC-JBJT2x S-80158BLMC-JFJT2x S-80158CLMC-JJJT2x S-80159ALMC-JBKT2x S-80159BLMC-JFKT2x S-80159CLMC-JJKT2x S-80160ALMC-JBLT2x S-80160BLMC-JFLT2x S-80160CLMC-JJLT2x Remark 1. x: G or U 2. Please select products of environmental code = U for Sn 100%, halogen-free products. 7 ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.4.2_01 S-801 Series 3-2. SNT-4A Table 2 (1/3) Detection voltage range 2.2 V 2.0% 2.3 V 2.0% 2.4 V 2.0% 2.5 V 2.0% 2.6 V 2.0% 2.7 V 2.0% 2.8 V 2.0% 2.9 V 2.0% 3.0 V 2.0% 3.1 V 2.0% 3.2 V 2.0% 3.3 V 2.0% 3.4 V 2.0% 3.5 V 2.0% 3.6 V 2.0% 3.7 V 2.0% . 8 Delay time 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. Nch open-drain output products S-80122ANPF-JCHTFU S-80122BNPF-JGHTFU S-80122CNPF-JKHTFU S-80123ANPF-JCITFU S-80123BNPF-JGITFU S-80123CNPF-JKITFU S-80124ANPF-JCJTFU S-80124BNPF-JGJTFU S-80124CNPF-JKJTFU S-80125ANPF-JCKTFU S-80125BNPF-JGKTFU S-80125CNPF-JKKTFU S-80126ANPF-JCLTFU S-80126BNPF-JGLTFU S-80126CNPF-JKLTFU S-80127ANPF-JCMTFU S-80127BNPF-JGMTFU S-80127CNPF-JKMTFU S-80128ANPF-JCNTFU S-80128BNPF-JGNTFU S-80128CNPF-JKNTFU S-80129ANPF-JCOTFU S-80129BNPF-JGOTFU S-80129CNPF-JKOTFU S-80130ANPF-JCPTFU S-80130BNPF-JGPTFU S-80130CNPF-JKPTFU S-80131ANPF-JCQTFU S-80131BNPF-JGQTFU S-80131CNPF-JKQTFU S-80132ANPF-JCRTFU S-80132BNPF-JGRTFU S-80132CNPF-JKRTFU S-80133ANPF-JCSTFU S-80133BNPF-JGSTFU S-80133CNPF-JKSTFU S-80134ANPF-JCTTFU S-80134BNPF-JGTTFU S-80134CNPF-JKTTFU S-80135ANPF-JCUTFU S-80135BNPF-JGUTFU S-80135CNPF-JKUTFU S-80136ANPF-JCVTFU S-80136BNPF-JGVTFU S-80136CNPF-JKVTFU S-80137ANPF-JCWTFU S-80137BNPF-JGWTFU S-80137CNPF-JKWTFU CMOS output products S-80122ALPF-JAHTFU S-80122BLPF-JEHTFU S-80122CLPF-JIHTFU S-80123ALPF-JAITFU S-80123BLPF-JEITFU S-80123CLPF-JIITFU S-80124ALPF-JAJTFU S-80124BLPF-JEJTFU S-80124CLPF-JIJTFU S-80125ALPF-JAKTFU S-80125BLPF-JEKTFU S-80125CLPF-JIKTFU S-80126ALPF-JALTFU S-80126BLPF-JELTFU S-80126CLPF-JILTFU S-80127ALPF-JAMTFU S-80127BLPF-JEMTFU S-80127CLPF-JIMTFU S-80128ALPF-JANTFU S-80128BLPF-JENTFU S-80128CLPF-JINTFU S-80129ALPF-JAOTFU S-80129BLPF-JEOTFU S-80129CLPF-JIOTFU S-80130ALPF-JAPTFU S-80130BLPF-JEPTFU S-80130CLPF-JIPTFU S-80131ALPF-JAQTFU S-80131BLPF-JEQTFU S-80131CLPF-JIQTFU S-80132ALPF-JARTFU S-80132BLPF-JERTFU S-80132CLPF-JIRTFU S-80133ALPF-JASTFU S-80133BLPF-JESTFU S-80133CLPF-JISTFU S-80134ALPF-JATTFU S-80134BLPF-JETTFU S-80134CLPF-JITTFU S-80135ALPF-JAUTFU S-80135BLPF-JEUTFU S-80135CLPF-JIUTFU S-80136ALPF-JAVTFU S-80136BLPF-JEVTFU S-80136CLPF-JIVTFU S-80137ALPF-JAWTFU S-80137BLPF-JEWTFU S-80137CLPF-JIWTFU ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.4.2_01 S-801 Series Table 2 (2/3) Detection voltage range 3.8 V 2.0% 3.9 V 2.0% 4.0 V 2.0% 4.1 V 2.0% 4.2 V 2.0% 4.3 V 2.0% 4.4 V 2.0% 4.5 V 2.0% 4.6 V 2.0% 4.7 V 2.0% 4.8 V 2.0% 4.9 V 2.0% 5.0 V 2.0% 5.1 V 2.0% 5.2 V 2.0% 5.3 V 2.0% Delay time 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. Nch open-drain output products S-80138ANPF-JCXTFU S-80138BNPF-JGXTFU S-80138CNPF-JKXTFU S-80139ANPF-JCYTFU S-80139BNPF-JGYTFU S-80139CNPF-JKYTFU S-80140ANPF-JCZTFU S-80140BNPF-JGZTFU S-80140CNPF-JKZTFU S-80141ANPF-JC2TFU S-80141BNPF-JG2TFU S-80141CNPF-JK2TFU S-80142ANPF-JC3TFU S-80142BNPF-JG3TFU S-80142CNPF-JK3TFU S-80143ANPF-JC4TFU S-80143BNPF-JG4TFU S-80143CNPF-JK4TFU S-80144ANPF-JC5TFU S-80144BNPF-JG5TFU S-80144CNPF-JK5TFU S-80145ANPF-JC6TFU S-80145BNPF-JG6TFU S-80145CNPF-JK6TFU S-80146ANPF-JC7TFU S-80146BNPF-JG7TFU S-80146CNPF-JK7TFU S-80147ANPF-JC8TFU S-80147BNPF-JG8TFU S-80147CNPF-JK8TFU S-80148ANPF-JC9TFU S-80148BNPF-JG9TFU S-80148CNPF-JK9TFU S-80149ANPF-JDATFU S-80149BNPF-JHATFU S-80149CNPF-JLATFU S-80150ANPF-JDBTFU S-80150BNPF-JHBTFU S-80150CNPF-JLBTFU S-80151ANPF-JDCTFU S-80151BNPF-JHCTFU S-80151CNPF-JLCTFU S-80152ANPF-JDDTFU S-80152BNPF-JHDTFU S-80152CNPF-JLDTFU S-80153ANPF-JDETFU S-80153BNPF-JHETFU S-80153CNPF-JLETFU CMOS output products S-80138ALPF-JAXTFU S-80138BLPF-JEXTFU S-80138CLPF-JIXTFU S-80139ALPF-JAYTFU S-80139BLPF-JEYTFU S-80139CLPF-JIYTFU S-80140ALPF-JAZTFU S-80140BLPF-JEZTFU S-80140CLPF-JIZTFU S-80141ALPF-JA2TFU S-80141BLPF-JE2TFU S-80141CLPF-JI2TFU S-80142ALPF-JA3TFU S-80142BLPF-JE3TFU S-80142CLPF-JI3TFU S-80143ALPF-JA4TFU S-80143BLPF-JE4TFU S-80143CLPF-JI4TFU S-80144ALPF-JA5TFU S-80144BLPF-JE5TFU S-80144CLPF-JI5TFU S-80145ALPF-JA6TFU S-80145BLPF-JE6TFU S-80145CLPF-JI6TFU S-80146ALPF-JA7TFU S-80146BLPF-JE7TFU S-80146CLPF-JI7TFU S-80147ALPF-JA8TFU S-80147BLPF-JE8TFU S-80147CLPF-JI8TFU S-80148ALPF-JA9TFU S-80148BLPF-JE9TFU S-80148CLPF-JI9TFU S-80149ALPF-JBATFU S-80149BLPF-JFATFU S-80149CLPF-JJATFU S-80150ALPF-JBBTFU S-80150BLPF-JFBTFU S-80150CLPF-JJBTFU S-80151ALPF-JBCTFU S-80151BLPF-JFCTFU S-80151CLPF-JJCTFU S-80152ALPF-JBDTFU S-80152BLPF-JFDTFU S-80152CLPF-JJDTFU S-80153ALPF-JBETFU S-80153BLPF-JFETFU S-80153CLPF-JJETFU 9 ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.4.2_01 S-801 Series Table 2 (3/3) Detection voltage range 5.4 V 2.0% 5.5 V 2.0% 5.6 V 2.0% 5.7 V 2.0% 5.8 V 2.0% 5.9 V 2.0% 6.0 V 2.0% 10 Delay time 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. Nch open-drain output products S-80154ANPF-JDFTFU S-80154BNPF-JHFTFU S-80154CNPF-JLFTFU S-80155ANPF-JDGTFU S-80155BNPF-JHGTFU S-80155CNPF-JLGTFU S-80156ANPF-JDHTFU S-80156BNPF-JHHTFU S-80156CNPF-JLHTFU S-80157ANPF-JDITFU S-80157BNPF-JHITFU S-80157CNPF-JLITFU S-80158ANPF-JDJTFU S-80158BNPF-JHJTFU S-80158CNPF-JLJTFU S-80159ANPF-JDKTFU S-80159BNPF-JHKTFU S-80159CNPF-JLKTFU S-80160ANPF-JDLTFU S-80160BNPF-JHLTFU S-80160CNPF-JLLTFU CMOS output products S-80154ALPF-JBFTFU S-80154BLPF-JFFTFU S-80154CLPF-JJFTFU S-80155ALPF-JBGTFU S-80155BLPF-JFUTFU S-80155CLPF-JJGTFU S-80156ALPF-JBHTFU S-80156BLPF-JFHTFU S-80156CLPF-JJHTFU S-80157ALPF-JBITFU S-80157BLPF-JFITFU S-80157CLPF-JJITFU S-80158ALPF-JBJTFU S-80158BLPF-JFJTFU S-80158CLPF-JJJTFU S-80159ALPF-JBKTFU S-80159BLPF-JFKTFU S-80159CLPF-JJKTFU S-80160ALPF-JBLTFU S-80160BLPF-JFLTFU S-80160CLPF-JJLTFU ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.4.2_01 S-801 Series  Pin Configurations Table 3 SOT-23-5 Top view 5 1 Pin No. 1 2 3 4 5 4 2 Pin name DS*1 VSS NC*2 OUT VDD Pin description ON/OFF switch for delay time GND pin No connection Voltage detection output pin Voltage input pin 3 Figure 3 *1. Refer to “2. Delay Circuit” in “ Operation” for operation. *2. The NC pin is electrically open. The NC pin can be connected to VDD or VSS. Table 4 SNT-4A Top view 1 4 2 3 Pin No. 1 2 3 4 Pin name VSS DS*1 VDD OUT Pin description GND pin ON/OFF switch for delay time Voltage input pin Voltage detection output pin Figure 4 *1. Refer to “2. Delay Circuit” in “ Operation” for operation. 11 ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.4.2_01 S-801 Series  Absolute Maximum Ratings Table 5 Item Symbol Power supply voltage VDDVSS Output voltage Nch open-drain output products VOUT CMOS output products Output current IOUT Power SOT-23-5 PD dissipation SNT-4A Operating ambient temperature Topr Storage temperature Tstg *1. When mounted on board [Mounted board] (1) Board size: 114.3 mm  76.2 mm  t1.6 mm (2) Board name: JEDEC STANDARD51-7 (Ta25C unless otherwise specified) Absolute maximum ratings Unit 12 V VSS0.3 to VSS12 VSS0.3 to VDD+0.3 50 mA 250 (When not mounted on board) mW 600*1 140 (When not mounted on board) 300*1 40 to +85 C 40 to +125 Power Dissipation (PD) [mW] Caution The absolute maximum ratings are rated values exceeding which the product could suffer physical damage. These values must therefore not be exceeded under any conditions. 700 600 500 SOT-23-5 400 300 200 SNT-4A 100 0 0 100 150 50 Ambient Temperature (Ta) [C] Figure 5 Power Dissipation of Package (When Mounted on Board) 12 ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.4.2_01 S-801 Series  Electrical Characteristics Table 6 Item Symbol Detection voltage*1 VDET Hysteresis width Current consumption VHYS ISS Operating voltage VDD Output current IOUT Leakage current ILEAK Detection voltage temperature coefficient *2 Delay time 1   VDET Ta   VDET tD1 (Ta25 C Unless otherwise specified) Test Condition Min. Typ. Max. Unit circuit VDET(S) VDET(S) VDET(S) — V 1 0.98 1.02 — 30 60 100 mV S-80122 to 26 — 1.3 3.3 VDD3.5 V A S-80127 to 39 — 1.5 3.5 VDD4.5 V S-80140 to 60 — 1.8 4.0 VDD6.5 V — 0.95 — 10.0 V Output transistor, VDD1.2 V 0.75 1.5 — mA 2 S-80122 to 60 Nch, VOUT0.5 V VDD2.4 V 3.0 6.0 — S-80127 to 60 VDD4.8 V Only for CMOS output 1.0 2.0 — S-80122 to 39 products, Output transistor, VDD6.0 V 1.25 2.5 — Pch, VDD–VOUT0.5 V S-80140 to 54 VDD8.4 V 1.5 3.0 — S-80155 to 60 Only for Nch open-drain output products, Output transistor, — — 0.1 A Nch, VDD10.0 V, VOUT10.0 V Ta40 °C to 85 °C VDDVDET1 V, DS pin Low — 120 360 ppm/ °C 1 S-801xxAx S-801xxBx S-801xxCx 32.5 50 72.5 ms 65 100 145 130 200 290 Delay time 2 tD2 110 220 330 3 VDDVDET+1 V, DS pin High s Input voltage VSH 1.0 — — V 4 DS pin, VDD6.0 V VSL — — 0.3 DS pin, VDD6.0 V *1. VDET: Actual detection voltage value, VDET(S): Specified detection voltage value (The center value of the detection voltage range in Table 1 to 2.) *2. Temperature change ratio for the detection voltage [mV/C] is calculated using the following equation. ∆  VDET mV/ C*1   VDET(S) Typ. V *2  ∆  VDET ppm/ C*3  1000 ∆Ta ∆Ta   VDET *1. Temperature change ratio of the detection voltage *2. Specified detection voltage value *3. Detection voltage temperature coefficient 13 ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.4.2_01 S-801 Series  Test Circuits 1. 2. A *1 R 100 k VDD DS VDD DS OUT VSS OUT A VSS V *1. R is unnecessary for CMOS output products. Figure 6 Figure 7 3. 4. A *1 R 100 k VDD DS OUT VSS *1. R is unnecessary for CMOS output products. Figure 8 14 VDD DS V *1 R 100 k OUT VSS V *1. R is unnecessary for CMOS output products. Figure 9 ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.4.2_01 S-801 Series  Operation 1. Basic Operation: CMOS Output (Active Low) 1-1. When the power supply voltage (VDD) is higher than the release voltage (VDET), the Nch transistor is OFF and the Pch transistor is ON to provide VDD (high) at the output. Since the (RB  RC)  VDD . Nch transistor N1 in Figure 10 is OFF, the comparator input voltage is RA  RB  RC 1-2. When the VDD goes below VDET, the output provides the VDD level, as long as VDD remains above the detection voltage (–VDET). When the VDD falls below –VDET (point A in Figure 11), the Nch transistor becomes ON, the Pch transistor becomes OFF, and the VSS level appears at the output. At this time the Nch transistor N1 in Figure 10 becomes ON, the comparator RB  VDD . input voltage is changed to RA  RB 1-3. When the VDD falls below the minimum operating voltage, the output becomes undefined, or goes to VDD when the output is pulled up to VDD. 1-4. The VSS level appears when VDD rises above the minimum operating voltage. The VSS level still appears even when VDD surpasses the –VDET, as long as it does not exceed the release voltage VDET. 1-5. When VDD rises above VDET (point B in Figure 11), the Nch transistor becomes OFF and the Pch transistor becomes ON to provide VDD at the output. The VDD at the OUT pin is delayed for tD due to the delay circuit. VDD *1 RA  Delay circuit  Pch OUT *1 RB VREF Nch RC VSS N1 DS *1. Paracitic diode Figure 10 Operation 1 15 ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.4.2_01 S-801 Series (1) (2) (3) (4) (5) VDD B Hysterisis width (VHYS) Release voltage (VDET) Detection voltage (VDET) A Minimum operating voltage VSS VDD Output from OUT pin VSS tD Figure 11 Operation 2 2. Delay Circuit 2-1. Delay Time The delay circuit delays the output signal from the time at which the power voltage (VDD) exceeds the release voltage (VDET) when VDD is turned on. The output signal is not delayed when the VDD goes below the detection voltage (–VDET). (Refer to Figure 11.) The delay time (tD) is a fixed value that is determined by a built-in oscillation circuit and counter. 2-2. DS Pin (ON/OFF Switch Pin for Delay Time) The DS pin should be connected to Low or High. When the DS pin is High, the output delay time becomes short since the output signal is taken from the middle of counter circuit (Refer to Figure 16). 3. Other Characteristics 3-1. Temperature Characteristics of Detection Voltage The shaded area in Figure 12 shows the temperature characteristics of the detection voltage. –VDET [V] 0.792 mV/C 2.200 –0.792 mV/C –40 25 85 Ta [C] Figure 12 Temperature Characteristics of Detection Voltage (Example for S-80122xxxx) 16 ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.4.2_01 S-801 Series 3-2. Temperature Characteristics of Release Voltage The temperature coefficient coefficient   VDET Ta   VDET of the release voltage is calculated by the temperature Ta   VDET for the detection voltage as follows: Ta  VDET   VDET   Ta  VDET The temperature coefficients for the release voltage and the detection voltage have the same sign consequently. 3-3. Temperature Characteristics of Hysteresis Voltage The temperature characteristics for the hysteresis voltage is expressed as   VDET   VDET  and Ta Ta is calculated as follows:   VDET   VDET VHYS   VDET    Ta Ta  VDET Ta  Standard Circuit *1 VDD DS R 100 k OUT VSS *1. R is unnecessary for CMOS output products. Figure 13 Caution The above connection diagram and constant will not guarantees successful operation. Perform through using the actual application to set the constant. 17 ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.4.2_01 S-801 Series  Technical Terms 1. Detection Voltage (–VDET), Release Voltage (VDET) The detection voltage (–VDET) is a voltage at which the output turns to low. The detection voltage varies slightly among products of the same specification. The variation of detection voltage between the specified minimum (–VDET) Min. and the maximum (–VDET) Max. is called the detection voltage range (Refer to Figure 14). e.g. For the S-80122AN, the detection voltage lies in the range of 2.156  (–VDET)  2.244. This means that some S-80122ANs have 2.156 V for –VDET and some have 2.244 V. The release voltage (VDET) is a voltage at which the output turns to high. The release voltage varies slightly among products of the same specification. The variation of release voltages between the specified minimum (VDET) Min. and the maximum (VDET) Max. is called the release voltage range (Refer to Figure 15). e.g. For the S-80122AN, the release voltage lies in the range of 2.186  (VDET)  2.344. This means that some S-80122ANs have 2.186 V for VDET and some have 2.344 V. VDD VDD Detection voltage Release voltage (VDET) Max. (VDET) Max. Detection voltage range (VDET) Min. OUT (VDET) Min. Release voltage range OUT Delay time Figure 14 Detection Voltage Figure 15 Release Voltage Remark Although the detection voltage and release voltage overlap in the range of 2.186 V to 2.244 V, VDET is always larger than –VDET. 18 ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.4.2_01 S-801 Series 2. Hysteresis Width (VHYS) Hysteresis width is the voltage difference between the detection voltage and the release voltage (The voltage at point BThe voltage at point AVHYS in Figure 11). The existence of the hysteresis width prevents malfunction caused by noise on input signal. 3. Delay Time (tD) Delay time is a time internally measured from the instant at which input voltage to the VDD pin exceeds the release voltage (VDET) to the point at which the output of the OUT pin inverts. The delay time is fixed in each series distinguished by A, B and C. S-801xxAx series: typ. 50 ms S-801xxBx series: typ. 100 ms S-801xxCx series: typ. 200 ms The output of the OUT pin can be inverted in a short delay time (tD2) by setting the DS pin High (Refer to Figure 16). VDD V VDET at DS”H” OUT tD1 tD2 Figure 16 4. Through-type Current The through-type current refers to the current that flows instantaneously at the time of detection and release of a voltage detector. The through-type current flows at a frequency of 20 kHz during release delay time since the internal logic circuit operates. 19 ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.4.2_01 S-801 Series 5. Oscillation In applications where a resistor is connected to the voltage detector input (Figure 17), taking a CMOS active low products for example, the through-type current which is generated when the output goes from low to high (release) causes a voltage drop equal to [through-type current]  [input resistance] across the resistor. When the input voltage drops below the detection voltage (–VDET) as a result, the output voltage goes to low level. In this state, the through-type current stops and its resultant voltage drop disappears, and the output goes from low to high. The through-type current is again generated, a voltage drop appears, and repeating the process finally induces oscillation. VDD RA VIN S-801 OUT RB VSS Figure 17 Example for Bad Implementation of Input Voltage Divider  Precautions  In the S-801 series products, the through-type current flows at a frequency of 20 kHz approximately during the delay time since the internal oscillator circuit and counter timer operate at voltage release. High impedance in the input may cause oscillation by the through-type current. When the input impedance is high, insert a capacitor between VDD pin and VSS pin to prevent oscillation.  Do not apply an electrostatic discharge to this IC that exceeds the performance ratings of the built-in electrostatic protection circuit.  In CMOS output products of the S-801 Series, the through-type current flows at detection and release. If the impedance is high, oscillation may occur due to the voltage drop by the through-type current during releasing.  When designing for mass production using an application circuit described herein, the product deviation and temperature characteristics should be taken into consideration. ABLIC Inc. shall not bear any responsibility for the patents on the circuits described herein.  ABLIC Inc. claims no responsibility for any and all disputes arising out of or in connection with any infringement of the products including this IC upon patents owned a third party. 20 ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.4.2_01 S-801 Series  Typical Characteristics (Typical Data) 1. Detection Voltage (VDET) - Temperature (Ta) S-80122AL S-80160AL 2.4 6.4 VDET [V] VDET [V] VDET () 2.3 2.2 6.2 VDET () 6.0 VDET () VDET () 5.8 2.1 40 20 0 20 40 60 80 40 100 20 0 20 40 60 80 100 60 80 100 Ta [°C)] Ta [°C] 100 100 90 90 80 80 VHYS [mV] VHYS [mV] 2. Hysteresis Voltage Width (VHYS) - Temperature (Ta) S-80122AL S-80160AL 70 60 50 60 50 40 40 30 30 40 20 0 20 40 60 80 40 100 20 0 20 (b) S-80129AL Ta25°C 3.5 3.5 3.0 ISS [A] 2.0 1.5 2.5 2.0 1.5 1.0 1.0 0.5 0.5 0.0 0.0 0 2 3.3 A 3.0 2.9 A 2.5 4 6 8 10 0 2 4 VDD [V] 8 10 (d) S-80160AL Ta25°C 5.0 A 3.5 2.5 2.5 ISS [A] 3.0 2.0 1.5 2.0 1.5 1.0 1.0 0.5 0.5 0.0 0.0 2 4 6 VDD [V] 8 10 Ta25°C 20 A 3.5 3.0 0 6 VDD [V] (c) S-80130AL ISS [A] 40 Ta [°C] Ta [°C] 3. Current Consumption (ISS) - Input Voltage (VDD) (a) S-80122AL Ta25°C ISS [A] 70 0 2 4 6 8 10 VDD [V] 21 ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.4.2_01 S-801 Series 4. Current Consumption (ISS) - Temperature (Ta) (a) S-80122AL VDD3.5 V 5.0 (b) S-80129AL 4.0 ISS [A] ISS [A] 4.0 3.0 2.0 1.0 20 0 20 40 60 80 100 40 Ta [°C] (c) S-80130AL 0 20 40 60 80 100 Ta [°C] VDD6.5 V 5.0 4.0 ISS [A] 4.0 3.0 2.0 3.0 2.0 1.0 1.0 0.0 0.0 40 20 0 20 40 60 80 VDD1 V, 1.2 V 60 40 100 Ta [°C] 5. Nch Transistor Output Current (IOUT) -VOUT S-80160AL Ta25°C 70 30 2.4 V 20 IOUT [mA] 4V 0 20 40 60 80 100 Ta [°C] 6V 50 40 20 6. Pch Transistor Output Current (IOUT) - (VDD-VOUT) S-80122AL Ta25°C 40 5.5 V 30 VDD4 V 4.8 V 10 V 20 8V 10 2V 10 0 6.5 V 0 0 2 4 6 8 10 VOUT [V] 7. Nch Transistor Output Current (IOUT) - Input Voltage (VDD) S-80160AL VDS0.5 V 25 0 IOUT [mA] 15 10 85°C 4 6 8 10 Ta 40°C 4 25°C 5 2 VDD-VOUT [V] 8. Pch transistor Output Current (IOUT) - Input Voltage (VDD) S-80122AL VDS0.5 V 5 Ta 40°C 20 IOUT [mA] 20 (d) S-80160AL VDD4.5 V 5.0 ISS [A] 2.0 0.0 40 IOUT [mA] 3.0 1.0 0.0 3 2 25°C 1 85°C 0 0 0 2 4 6 VDD [V] 22 VDD4.5 V 5.0 8 10 0 2 4 6 VDD [V] 8 10 ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.4.2_01 S-801 Series 9. Minimum Operating Voltage - Input Voltage (VDD) S-80122AN Pull-up, VDD:100 k 0.6 VOUT [V] 0.5 Ta 40°C 0.4 0.3 25°C 0.2 85°C 0.1 0 0 0.5 1 1.5 VDD [V] 0.8 0.6 0.4 1 0.2 0 Ta 40°C 0.8 0.6 25°C 0.4 85°C 0.2 0 40 20 0 20 40 60 80 Delay time [ms] 150 100 50 20 40 8 10 60 80 VDD7.0 V 250 200 150 100 50 0 0 6 300 200 20 4 S-80160CL 250 40 2 VDD [V] VDD3.2 V 300 0 0 100 Ta [°C] 12. Delay Time 1 - Temperature (Ta) S-80122CL Delay time [ms] 11. Threshold Voltage of DS Pin - Input Voltage (VDD) S-80122AL Threshold [V] Threshold [V] 10. Threshold Voltage of DS Pin - Temperature (Ta) S-80122AL VDD6.0 V 1 100 Ta [°C] 40 20 0 20 40 60 80 100 Ta [°C] 13. Delay Time 1 - Input Voltage (VDD) S-80122CL Ta25°C Delay time [ms] 300 250 200 150 100 50 0 2 4 6 8 10 VDD [V] 23 ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.4.2_01 S-801 Series S-80160AL VDD3.2 V 400 350 300 250 200 150 100 50 0 Delay time [s] Delay time [s] 14. Delay Time 2 - Temperature (Ta) S-80122AL 40 20 0 20 40 60 80 VDD7.0 V 400 350 300 250 200 150 100 50 0 40 100 20 0 20 40 60 80 100 Ta [°C] Ta [°C] Delay time [s] 15. Delay Time 2 - Input Voltage (VDD) S-80122AN Ta25°C 400 350 300 250 200 150 100 50 0 2 4 6 8 10 VDD [V] 1s VDD VIH *1 VDD INPUT VOLTAGE VIL DS V S-801 Series VSS R*2 100 k OUT V tD VDD90 % OUTPUT VOLTAGE *1. Set to VDD or VSS. *2. R is not necessary for CMOS output products. VSS VIH10 V, VIL0.95 V Figure 18 Measurment Condition for Delay Time Figure 19 Measurment Circuit for Delay Time Caution The above connection diagram will not guarantees successful operation. Perform through using the actual application to set the constant. 24 ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.4.2_01 S-801 Series 16. Response Time - Load Capacitor (COUT) S-80122AL tPLH (Delay time2) 0.1 0.01 tPHL Ta25°C 100 Response time [ms] 1 Response time [ms] S-80122AN Ta25°C 0.001 10 tPLH (Delay time2) 1 0.1 tPHL 0.01 0.001 0.00001 0.0001 0.001 0.01 0.1 0.00001 0.0001 COUT [F] S-80160AL 0.01 0.1 S-80160AN Ta25°C tPLH (Delay time2) 0.1 0.01 tPHL Ta25°C 100 Response time [ms] 1 Response time [ms] 0.001 COUT [F] 10 tPLH (Delay time2) 1 0.1 tPHL 0.01 0.001 0.001 0.00001 0.0001 0.001 0.01 0.00001 0.1 0.0001 1s 1s VDD INPUT VOLTAGE tPHL VDD 0.01 0.1 VDD VIH VIL 0.001 COUT [F] COUT [F] V DS tPLH VDD  90 % S-801 Series VSS R*1 100 k OUT V OUTPUT VOLTAGE VDD  10 % VIH=10 V, VIL=0.95 V Figure 20 Measurment Condition for Response Time *1. R is not necessary for CMOS output products. Figure 21 Measurment Circuit for Response Time Caution The above connection diagram will not guarantees successful operation. Perform through using the actual application to set the constant. 25 ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.4.2_01 S-801 Series  Application Circuit Examples Microcomputer Reset Circuits If the power supply voltage to a microcomputer falls below the specified level, an unspecified operation may be performed or the contents of the memory register may be lost. When power supply voltage returns to normal, the microcomputer needs to be initialized before normal operations can be done. Reset circuits protect microcomputers in the event of current being momentarily switched off or lowered. Reset circuits shown in Figures 22 to 23 can be easily constructed with the help of the S-801 series that has low operating voltage, a high-precision detection voltage, hysteresis, and a built-in delay circuit. VDD1 VDD2 VDD S801xxAL S801xxAN Microcomputer VSS Microcomputer VSS (Nch open-drain output products only.) Figure 22 Ret Circuit (S-801xxAL) Figure 23 Reset Circuit (S-801xxAN) Caution The above connection diagram will not guarantees successful operation. Perform through using the actual application to set the constant. 26 2.9±0.2 1.9±0.2 4 5 1 2 +0.1 0.16 -0.06 3 0.95±0.1 0.4±0.1 No. MP005-A-P-SD-1.3 TITLE SOT235-A-PKG Dimensions No. MP005-A-P-SD-1.3 ANGLE UNIT mm ABLIC Inc. 4.0±0.1(10 pitches:40.0±0.2) +0.1 ø1.5 -0 +0.2 ø1.0 -0 2.0±0.05 0.25±0.1 4.0±0.1 1.4±0.2 3.2±0.2 3 2 1 4 5 Feed direction No. MP005-A-C-SD-2.1 TITLE SOT235-A-Carrier Tape No. MP005-A-C-SD-2.1 ANGLE UNIT mm ABLIC Inc. 12.5max. 9.0±0.3 Enlarged drawing in the central part ø13±0.2 (60°) (60°) No. MP005-A-R-SD-1.1 SOT235-A-Reel TITLE No. MP005-A-R-SD-1.1 ANGLE QTY. UNIT mm ABLIC Inc. 3,000 1.2±0.04 3 4 +0.05 0.08 -0.02 2 1 0.65 0.48±0.02 0.2±0.05 No. PF004-A-P-SD-6.0 TITLE SNT-4A-A-PKG Dimensions No. PF004-A-P-SD-6.0 ANGLE UNIT mm ABLIC Inc. +0.1 ø1.5 -0 4.0±0.1 2.0±0.05 0.25±0.05 +0.1 1.45±0.1 2 1 3 4 ø0.5 -0 4.0±0.1 0.65±0.05 Feed direction No. PF004-A-C-SD-2.0 TITLE SNT-4A-A-Carrier Tape No. PF004-A-C-SD-2.0 ANGLE UNIT mm ABLIC Inc. 12.5max. 9.0±0.3 Enlarged drawing in the central part ø13±0.2 (60°) (60°) No. PF004-A-R-SD-1.0 TITLE SNT-4A-A-Reel No. PF004-A-R-SD-1.0 QTY. ANGLE UNIT mm ABLIC Inc. 5,000 0.52 1.16 2 0.52 0.35 1. 2. 0.3 1 (0.25 mm min. / 0.30 mm typ.) (1.10 mm ~ 1.20 mm) 0.03 mm 1. Pay attention to the land pattern width (0.25 mm min. / 0.30 mm typ.). 2. Do not widen the land pattern to the center of the package (1.10 mm to 1.20 mm). Caution 1. Do not do silkscreen printing and solder printing under the mold resin of the package. 2. The thickness of the solder resist on the wire pattern under the package should be 0.03 mm or less from the land pattern surface. 3. Match the mask aperture size and aperture position with the land pattern. 4. Refer to "SNT Package User's Guide" for details. 1. 2. (0.25 mm min. / 0.30 mm typ.) (1.10 mm ~ 1.20 mm) TITLE SNT-4A-A -Land Recommendation PF004-A-L-SD-4.1 No. No. PF004-A-L-SD-4.1 ANGLE UNIT mm ABLIC Inc. Disclaimers (Handling Precautions) 1. All the information described herein (product data, specifications, figures, tables, programs, algorithms and application circuit examples, etc.) is current as of publishing date of this document and is subject to change without notice. 2. The circuit examples and the usages described herein are for reference only, and do not guarantee the success of any specific mass-production design. ABLIC Inc. is not responsible for damages caused by the reasons other than the products described herein (hereinafter "the products") or infringement of third-party intellectual property right and any other right due to the use of the information described herein. 3. ABLIC Inc. is not responsible for damages caused by the incorrect information described herein. 4. Be careful to use the products within their specified ranges. Pay special attention to the absolute maximum ratings, operation voltage range and electrical characteristics, etc. ABLIC Inc. is not responsible for damages caused by failures and / or accidents, etc. that occur due to the use of the products outside their specified ranges. 5. When using the products, confirm their applications, and the laws and regulations of the region or country where they are used and verify suitability, safety and other factors for the intended use. 6. When exporting the products, comply with the Foreign Exchange and Foreign Trade Act and all other export-related laws, and follow the required procedures. 7. The products must not be used or provided (exported) for the purposes of the development of weapons of mass destruction or military use. ABLIC Inc. is not responsible for any provision (export) to those whose purpose is to develop, manufacture, use or store nuclear, biological or chemical weapons, missiles, or other military use. 8. The products are not designed to be used as part of any device or equipment that may affect the human body, human life, or assets (such as medical equipment, disaster prevention systems, security systems, combustion control systems, infrastructure control systems, vehicle equipment, traffic systems, in-vehicle equipment, aviation equipment, aerospace equipment, and nuclear-related equipment), excluding when specified for in-vehicle use or other uses. Do not apply the products to the above listed devices and equipments without prior written permission by ABLIC Inc. Especially, the products cannot be used for life support devices, devices implanted in the human body and devices that directly affect human life, etc. Prior consultation with our sales office is required when considering the above uses. ABLIC Inc. is not responsible for damages caused by unauthorized or unspecified use of our products. 9. Semiconductor products may fail or malfunction with some probability. The user of the products should therefore take responsibility to give thorough consideration to safety design including redundancy, fire spread prevention measures, and malfunction prevention to prevent accidents causing injury or death, fires and social damage, etc. that may ensue from the products' failure or malfunction. The entire system must be sufficiently evaluated and applied on customer's own responsibility. 10. The products are not designed to be radiation-proof. The necessary radiation measures should be taken in the product design by the customer depending on the intended use. 11. The products do not affect human health under normal use. However, they contain chemical substances and heavy metals and should therefore not be put in the mouth. The fracture surfaces of wafers and chips may be sharp. Be careful when handling these with the bare hands to prevent injuries, etc. 12. When disposing of the products, comply with the laws and ordinances of the country or region where they are used. 13. The information described herein contains copyright information and know-how of ABLIC Inc. The information described herein does not convey any license under any intellectual property rights or any other rights belonging to ABLIC Inc. or a third party. Reproduction or copying of the information from this document or any part of this document described herein for the purpose of disclosing it to a third-party without the express permission of ABLIC Inc. is strictly prohibited. 14. For more details on the information described herein, contact our sales office. 2.2-2018.06 www.ablic.com
S-80153ANPF-JDETFG
物料型号:S-801系列,由ABLIC公司生产的超小型封装、高精度电压检测器,内置固定延迟时间生成器。

器件简介:S-801系列采用CMOS工艺制造,具有内置振荡器和计数器定时器,可在无需外部元件的情况下延迟释放信号。该系列提供50ms、100ms和200ms三种延迟时间,以及Nch开漏和CMOS输出两种输出形式。

引脚分配: - SOT-23-5封装:1. DS(延迟时间ON/OFF开关),2. VSS(地),3. NC(无连接),4. OUT(电压检测输出),5. VDD(电压输入)。 - SNT-4A封装:1. VSS(地),2. DS(延迟时间ON/OFF开关),3. VDD(电压输入),4. OUT(电压检测输出)。

参数特性: - 超低功耗:典型值1.3μA(在VDD=3.5V时)。 - 高精度检测电压:±2.0%。 - 工作电压范围:0.95V至10.0V。 - 滞后特性:典型值60mV。 - 检测电压:2.2V至6.0V(以0.1V为步进)。

功能详解: - 提供电源监控功能,适用于便携设备、微电脑和CPU重置等。 - 内置延迟电路,可以在电压超过设定阈值时延迟输出信号,提供三种典型的延迟时间。 - 通过DS引脚可以控制延迟时间的开启和关闭。

应用信息: - 用于便携设备(如笔记本电脑、数字相机、PDA和手机)的电源监控。 - 用于摄像头、视频设备和通信设备的恒压电源监控。 - 用于微电脑的电源监控和CPU的重置。

封装信息: - 提供SOT-23-5和SNT-4A两种封装形式。
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