FTX30P35G
350V P-Channel Enhancement Mode MOSFET
General Features
Proprietary Advanced Planar Technology
Rugged Polysilicon Gate Cell Structure
Fast Switching Speed
RoHS Compliant
Halogen-free available
BVDSS
RDS(ON) (Max.)
ID
-350V
30 Ω
-200mA
SOT-89
D
Applications
Drain
High Efficiency SMPS
Adaptor/Charger
Active PFC
G
Gate
Drain
Source
S
Ordering Information
Part Number
Package
Marking
Remark
FTX30P35G
SOT-89
P35
Halogen Free
Absolute Maximum Ratings
Symbol
TA=25℃ unless otherwise specified
Parameter
FTX30P35G
Unit
V
VDSS
Drain-to-Source Voltage[1]
-350
ID
Continuous Drain Current
-0.2
[2]
A
IDM
Pulsed Drain Current
-0.6
PD
Power Dissipation
1.0
W
VGS
Gate-to-Source Voltage
±20
V
TL
Soldering Temperature
Distance of 1.6mm from case for 10 seconds
300
TJ and TSTG
Operating and Storage Temperature Range
℃
-55 to 150
Caution: Stresses greater than those listed in the “Absolute Maximum Ratings” may cause permanent damage to the device.
Thermal Characteristics
Symbol
RθJA
Parameter
Thermal Resistance, Junction-to-Ambient
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FTX30P35G
Unit
125
K/W
Rev. 2.0 Jan. 2020
FTX30P35G
Electrical Characteristics
OFF Characteristics
Symbol
TA =25℃ unless otherwise specified
Parameter
BVDSS
Drain-to-Source Breakdown
Voltage
△BVDSS/△TJ
Breakdown Voltage Temperature
Coefficient
IDSS
IGSS
Min.
Typ.
Max.
Unit
Test Conditions
-350
--
--
V
VGS=0V, ID=-250µA
--
-0.35
--
V/℃
Reference to 25℃,
ID=-250µA
--
--
-1
µA
VDS=-350V,VGS= 0V
--
--
-100
µA
--
--
20
--
--
-20
Drain-to-Source Leakage Current
Gate-to-Source Leakage Current
ON Characteristics
Symbol
RDS(ON)
Static Drain-to-Source On-Resistance
VGS(TH)
Gate Threshold Voltage
Max.
Unit
Test Conditions
--
18
30
Ω
VGS=-10V,ID=-200mA [3]
-1
--
-3
V
VGD =0V, ID=-250µA
Parameter
Essentially independent of operating temperature
Min.
Typ.
Max.
Input Capacitance
--
43.39
--
COSS
Oput Capacitance
--
6.94
--
CRSS
Reverse Transfer Capacitance
--
0.84
--
td(ON)
Turn-on Delay Time
--
12
--
Rise Time
--
60
--
Turn-off Delay Time
--
136
--
Fall Time
--
320
--
tfall
Source-Drain Diode Characteristics
Symbol
VSD
VGS=-20V, VDS=0V
Typ.
CISS
td(OFF)
VGS=+20V, VDS=0V
Min.
Dynamic Characteristics
trise
TJ=125℃
TA =25℃ unless otherwise specified
Parameter
Symbol
µA
VDS=-350V,VGS= 0V
Parameter
Diode Forward Voltage
Unit
Test Conditions
pF
VGS=0V
VDS=-25V
f=1.0MHZ
ns
VGS = -10V~0V
VDD = -25V, ID=-80mA
RG = 25Ohm
TA=25℃ unless otherwise specified
Min
Typ.
Max.
Units
Test Conditions
--
--
-1.8
V
ISD =-200 mA, VGS =0 V
NOTE:
[1] TJ=+25℃ to +150℃
[2] Repetitive rating, pulse width limited by maximum junction temperature.
[3] Pulse width≤380µs; duty cycle≤2%.
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FTX30P35G
Typical Characteristics
1.2
Figure 1. Maximum Power Dissipation vs.
Case Temperature
0.00
-0.05
ID, Drain Current (A)
PD, Power Dissipation (W)
1
Figure 2. Maximum Continuous Drain
Current vs Case Temperature
0.8
-0.10
0.6
-0.15
0.4
-0.20
0.2
-0.25
0
25
50
75
100
125
TC, Case Temperature (℃)
25
150
50
75
100
125
TC, Case Temperature (℃)
150
Figure 3. Typical Capacitance vs. Drain-toSource Voltage
100
C, Capacitance(pF)
Ciss
10
1
Coss
Crss
0
-400 -350 -300 -250 -200 -150 -100
-50
0
VDS, Drain Voltage(V)
Switching Waveforms and Test Circuit
RL
VDS
VGS
VDS
D.U.T
RG
90%
VDD
10%
VGS
td(ON) trise
Figure 5. Resistive Switching Waveforms
Figure 4. Resistive Switching Test Circuit
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FTX30P35G
Package Dimensions
SOT-89
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Published by
ARK Microelectronics Co., Ltd.
ADD: 4F, D26, UESTC National Science Park No. 1 Shuangxing Avenue, Gongxing Street,
Shuangliu District, Chengdu, China (Sichuan) Pilot Free Trade Zone.
Tel:+86-28-8523-2215
Email: sales@ark-micro.com http://www.ark-micro.com
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