BUK9K25-40RA
Dual N-channel 40 V, 29 mOhm logic level MOSFET in
LFPAK56D using Repetitive Avalanche technology
2 December 2020
Product data sheet
1. General description
Dual, logic level N-channel MOSFET in an LFPAK56D package, using Application Specific
(ASFET) repetitive avalanche silicon technology. This product has been designed and qualified to
AEC-Q101 for use in repetitive avalanche applications.
2. Features and benefits
•
•
•
Fully automotive qualified to AEC-Q101 at 175 °C
Repetitive Avalanche rated to 30 °C Tj rise:
• Tested to 1 Bn avalanche events
LFPAK copper clip package technology:
• High robustness and reliability
• Gull wing leads for high manufacturability and AOI
3. Applications
•
•
•
•
•
12 V, 24 V and 48 V automotive systems
Repetitive avalanche topologies
Engine control
Transmission control
Actuator and auxiliary loads
4. Quick reference data
Table 1. Quick reference data
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
VDS
drain-source voltage
25 °C ≤ Tj ≤ 175 °C
-
-
40
V
ID
drain current
VGS = 5 V; Tmb = 25 °C; Fig. 2
-
-
18.2
A
Ptot
total power dissipation
Tmb = 25 °C; Fig. 1
-
-
32
W
VGS = 5 V; ID = 5 A; Tj = 25 °C; Fig. 14
-
24
29
mΩ
-
2.4
-
nC
Static characteristics FET1 and FET2
RDSon
drain-source on-state
resistance
Dynamic characteristics FET1 and FET2
QGD
gate-drain charge
ID = 5 A; VDS = 32 V; VGS = 5 V;
Tj = 25 °C; Fig. 16; Fig. 17
BUK9K25-40RA
Nexperia
Dual N-channel 40 V, 29 mOhm logic level MOSFET in LFPAK56D using Repetitive Avalanche
technology
5. Pinning information
Table 2. Pinning information
Pin
Symbol
Description
1
S1
source1
2
G1
gate1
3
S2
source2
4
G2
gate2
5
D2
drain2
6
D2
drain2
7
D1
drain1
8
D1
drain1
Simplified outline
8
7
6
Graphic symbol
5
D1 D1
S1
D2 D2
G1
S2
G2
mbk725
1
2
3
4
LFPAK56D; Dual
LFPAK (SOT1205)
6. Ordering information
Table 3. Ordering information
Type number
Package
BUK9K25-40RA
Name
Description
Version
LFPAK56D;
Dual LFPAK
plastic, single ended surface mounted package (LFPAK56D); 8
leads
SOT1205
7. Marking
Table 4. Marking codes
Type number
Marking code
BUK9K25-40RA
92540RA
8. Limiting values
Table 5. Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134).
Symbol
Parameter
Conditions
Min
Max
Unit
VDS
drain-source voltage
25 °C ≤ Tj ≤ 175 °C
-
40
V
VDGR
drain-gate voltage
RGS = 20 kΩ
-
40
V
VGS
gate-source voltage
Pulsed; Tj ≤ 175 °C
-15
15
V
DC; Tj ≤ 175 °C
-10
10
V
[1] [2]
Ptot
total power dissipation
Tmb = 25 °C; Fig. 1
-
32
W
ID
drain current
VGS = 5 V; Tmb = 25 °C; Fig. 2
-
18.2
A
VGS = 5 V; Tmb = 100 °C; Fig. 2
-
16.6
A
pulsed; tp ≤ 10 µs; Tmb = 25 °C; Fig. 3
-
94
A
IDM
peak drain current
Tstg
storage temperature
-55
175
°C
Tj
junction temperature
-55
175
°C
Source-drain diode FET1 and FET2
IS
source current
Tmb = 25 °C
-
18.2
A
ISM
peak source current
pulsed; tp ≤ 10 µs; Tmb = 25 °C
-
94
A
BUK9K25-40RA
Product data sheet
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BUK9K25-40RA
Nexperia
Dual N-channel 40 V, 29 mOhm logic level MOSFET in LFPAK56D using Repetitive Avalanche
technology
Symbol
Parameter
Conditions
Min
Max
Unit
[3] [4]
[5]
-
19
mJ
[6] [7]
-
15
mJ
Avalanche ruggedness
EDS(AL)R
repetitive drain-source
avalanche energy
ID = 0.73 A; Vsup ≤ 40 V; RGS = 10 Ω; VGS
=10 V; Tj(rise) ≤ 30 °C; unclamped; Fig. 4;
Fig. 5; Fig. 6
Avalanche ruggedness FET1 and FET2
EDS(AL)S
[1]
[2]
[3]
[4]
[5]
[6]
[7]
non-repetitive drainID = 18.2 A; Vsup ≤ 40 V; VGS = 10 V;
source avalanche energy Tj(init) = 25 °C; Fig. 7
Accumulated Pulse duration up to 50 hours delivers zero defect ppm.
Significantly longer life times are achieved by lowering Tj and or VGS.
Repetitive avalanche rating is limited by maximum junction temperature of 175 °C and junction rise of 30 °C
Refer to Fig. 5 for the limiting number of avalanche events
Refer to Fig. 6 Rdson at Vgs=5V will increase as a function of repetitive avalanche cycles
Refer to application note AN10273 for further information
Single-pulse avalanche rating limited by maximum junction temperature of 175 °C
03aa16
120
ID
(A)
Pder
(%)
003aak328
30
25
80
20
15
40
10
5
0
0
50
100
150
Tmb (°C)
0
200
Fig. 2.
Fig. 1.
ID
(A)
Normalized total power dissipation as a
function of mounting base temperature
0
25
50
75
100
125
150 175
Tmb (°C)
Continuous drain current as a function of
mounting base temperature
003aak327
103
102
200
Limit RDSon = VDS / ID
tp = 10 us
100 us
10
1
1 ms
DC
10-1
10-1
Fig. 3.
1
10
10 ms
100 ms
VDS (V)
102
Safe operating area; continuous and peak drain current as a function of drain-source voltage
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Product data sheet
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BUK9K25-40RA
Nexperia
Dual N-channel 40 V, 29 mOhm logic level MOSFET in LFPAK56D using Repetitive Avalanche
technology
IAL
(A)
aaa-032797
102
aaa-031643
1010
No. Events
10
109
1
10-1
10-3
10-2
10-1
1
tAL (ms)
108
10-1
10
Tj is limited to 175 °C and Tj(rise) is limited to 30 °C
Repetitive avalanche rating; avalanche current
as a function of avalanche time
% Increase of Rdson at 5V Vgs
Fig. 4.
Fig. 5.
1
10
EDS(AL) Per Event (mJ)
102
Repetitive avalanche rating; maximum number
of avalanche events as a function of avalanche
energy
aaa-032338
50
40
30
20
10
0
Fig. 6.
1
10
% of cycle limit
102
Percentage Rdson at 5V increase as a function of avalanche cycles
IAL
(A)
aaa-032799
102
10
1
10-1
10-3
10-2
10-1
1
tAL (ms)
10
Tj (init) = 25 °C
Fig. 7.
Single pulse avalanche rating; avalanche current as a function of avalanche time
BUK9K25-40RA
Product data sheet
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Nexperia
Dual N-channel 40 V, 29 mOhm logic level MOSFET in LFPAK56D using Repetitive Avalanche
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9. Thermal characteristics
Table 6. Thermal characteristics
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
Rth(j-mb)
thermal resistance from Fig. 8
junction to mounting
base
-
-
4.68
K/W
Rth(j-a)
thermal resistance from Minimum footprint; mounted on a
junction to ambient
printed circuit board
-
95
-
K/W
003aaj557
10
Zth(j-mb)
(K/W)
δ = 0.5
0.2
1
0.1
0.05
0.02
10
P
-1
single shot
δ=
tp
10-2
10-6
Fig. 8.
10-5
10-4
10-3
10-2
tp
T
t
T
10-1
1
tp (s)
Transient thermal impedance from junction to mounting base as a function of pulse duration
10. Characteristics
Table 7. Characteristics
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
Static characteristics FET1 and FET2
V(BR)DSS
drain-source
breakdown voltage
ID = 250 µA; VGS = 0 V; Tj = -55 °C
36
-
-
V
ID = 250 µA; VGS = 0 V; Tj = 25 °C
40
-
-
V
VGS(th)
gate-source threshold
voltage
ID = 1 mA; VDS=VGS; Tj = 25 °C; Fig. 12;
Fig. 13
1.4
1.7
2.1
V
ID = 1 mA; VDS=VGS; Tj = 175 °C;
Fig. 12; Fig. 13
0.5
-
-
V
ID = 1 mA; VDS=VGS; Tj = -55 °C;
Fig. 12; Fig. 13
-
-
2.45
V
VDS = 40 V; VGS = 0 V; Tj = 175 °C
-
-
500
µA
VDS = 40 V; VGS = 0 V; Tj = 25 °C
-
0.02
1
µA
VGS = -10 V; VDS = 0 V; Tj = 25 °C
-
2
100
nA
VGS = 10 V; VDS = 0 V; Tj = 25 °C
-
2
100
nA
VGS = 5 V; ID = 5 A; Tj = 25 °C; Fig. 14
-
24
29
mΩ
VGS = 5 V; ID = 5 A; Tj = 175 °C; Fig. 14;
Fig. 15
-
48.2
58
mΩ
VGS = 10 V; ID = 5 A; Tj = 25 °C; Fig. 14
-
19
24
mΩ
IDSS
drain leakage current
IGSS
gate leakage current
RDSon
drain-source on-state
resistance
BUK9K25-40RA
Product data sheet
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BUK9K25-40RA
Nexperia
Dual N-channel 40 V, 29 mOhm logic level MOSFET in LFPAK56D using Repetitive Avalanche
technology
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
-
6.3
-
nC
-
1.4
-
nC
-
2.4
-
nC
-
528
701
pF
-
95
114
pF
-
56
76
pF
-
6.2
-
ns
-
9.2
-
ns
Dynamic characteristics FET1 and FET2
QG(tot)
total gate charge
QGS
gate-source charge
QGD
gate-drain charge
Ciss
input capacitance
Coss
output capacitance
Crss
reverse transfer
capacitance
td(on)
turn-on delay time
tr
rise time
td(off)
turn-off delay time
-
10.8
-
ns
tf
fall time
-
8.9
-
ns
ID = 5 A; VDS = 32 V; VGS = 5 V;
Tj = 25 °C; Fig. 16; Fig. 17
VDS = 25 V; VGS = 0 V; f = 1 MHz;
Tj = 25 °C; Fig. 18
VDS = 32 V; RL = 6.4 Ω; VGS = 5 V;
RG(ext) = 5 Ω; Tj = 25 °C
Source-drain diode FET1 and FET2
VSD
source-drain voltage
IS = 5 A; VGS = 0 V; Tj = 25 °C; Fig. 19
-
0.83
1.2
V
trr
reverse recovery time
-
15.9
-
ns
Qr
recovered charge
IS = 5 A; dIS/dt = -100 A/µs; VGS = 0 V;
VDS = 20 V; Tj = 25 °C
-
7.6
-
nC
ID
(A)
003aak319
25
20
80
15
60
10
40
5
0
Fig. 9.
175°C
0
0.8
1.6
20
Tj = 25°C
2.4
3.2
VGS (V)
Product data sheet
0
4
Transfer characteristics; drain current as a
function of gate-source voltage; typical values
BUK9K25-40RA
003aak320
100
RDSon
0
4
8
12
VGS (V)
16
Fig. 10. Drain-source on-state resistance as a function
of gate-source voltage; typical values
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Nexperia
Dual N-channel 40 V, 29 mOhm logic level MOSFET in LFPAK56D using Repetitive Avalanche
technology
ID
(A)
003aak321
40
10 V 55VV
4.5 V
32
003aah025
3
VGS(th)
(V)
2.5
max
2
VGS = 3.5 V
24
typ
1.5
16
2.8 V
8
0.5
2.6 V
0
2.4 V
0
1
2
3
VDS (V)
min
1
3V
0
-60
4
0
60
120
Tj (° C)
180
Tj = 25 °C; tp = 300 μs
Fig. 11. Output characteristics; drain current as a
Fig. 12. Gate-source threshold voltage as a function of
function of drain-source voltage; typical values
junction temperature
003aah026
10-1
150
RDSon
2.8 V
ID
(A)
10-2
003aak326
3V
3.5 V
120
min
10-3
typ
max
90
10-4
4.5 V
60
5V
10-5
30
VGS = 10 V
10
-6
0
1
2
V GS (V)
0
3
0
10
20
30
ID (A)
40
Tj = 25 °C; tp = 300 μs
Fig. 13. Sub-threshold drain current as a function of
gate-source voltage
BUK9K25-40RA
Product data sheet
Fig. 14. Drain-source on-state resistance as a function
of drain current; typical values
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Nexperia
Dual N-channel 40 V, 29 mOhm logic level MOSFET in LFPAK56D using Repetitive Avalanche
technology
003aaj814
2.4
VGS
(V)
a
003aak323
10
8
1.6
VDS = 14 V
6
32 V
4
0.8
2
0
-60
0
60
120
Tj ( °C)
0
180
Fig. 15. Normalized drain-source on-state resistance
factor as a function of junction temperature
0
2.5
5
7.5
10
15
Fig. 16. Gate-source voltage as a function of gate
charge; typical values
003aak324
103
C
(pF)
VDS
12.5
QG (nC)
Ciss
ID
VGS(pl)
Coss
102
VGS(th)
Crss
VGS
QGS2
QGS1
QGS
10
10-1
QGD
QG(tot)
Product data sheet
10
VDS (V)
102
003aaa508
Fig. 17. Gate charge waveform definitions
BUK9K25-40RA
1
Fig. 18. Input, output and reverse transfer capacitances
as a function of drain-source voltage; typical
values
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Dual N-channel 40 V, 29 mOhm logic level MOSFET in LFPAK56D using Repetitive Avalanche
technology
IS
(A)
003aak325
40
32
24
16
8
0
Tj = 25°C
175°C
0
0.2
0.4
0.6
0.8
1
VSD (V)
1.2
Fig. 19. Source (diode forward) current as a function of source-drain (diode forward) voltage; typical values
BUK9K25-40RA
Product data sheet
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Dual N-channel 40 V, 29 mOhm logic level MOSFET in LFPAK56D using Repetitive Avalanche
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11. Package outline
Plastic single ended surface mounted package LFPAK56D; 8 leads
E
SOT1205
A
A
b1
c1
L1
mounting
base
D
H
D1
D2
L
1
2
3
e
b
(8x)
4
w
X
c
A
E1
E2
A1
C
θ
Lp
detail X
0
2.5
A
max 1.05
nom
min 1.02
mm
5 mm
scale
Dimensions
Unit
y C
D(1) D1(1)
D2
(ref)
E(1) E1(1)
4.4
0.25 0.30 4.70 4.55
3.5
5.30
1.8
0.85
4.1
0.19 0.24 4.45 4.35
3.4
4.95
1.6
0.60
A1
b
b1
0.1
0.50
0.0
0.35
c
c1
E2
e
1.27
H
L
L1
Lp
6.2
1.3
0.55 0.85
5.9
0.8
0.30 0.40
w
y
0.25
0.1
Note
1. Plastic or metal protrusions of 0.2 mm maximum per side are not included.
Outline
version
References
IEC
JEDEC
JEITA
θ
8°
0°
sot1205_po
European
projection
Issue date
14-08-21
14-10-28
SOT1205
Fig. 20. Package outline LFPAK56D; Dual LFPAK (SOT1205)
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Dual N-channel 40 V, 29 mOhm logic level MOSFET in LFPAK56D using Repetitive Avalanche
technology
12. Soldering
Footprint information for reflow soldering of LFPAK56D package
SOT1205
5.85
0.57
0.025
0.57
0.7
1.97
0.65
1.27
1.9
3.325
3.175
3.2
2.0
1.275
0.8
1.875
2.1
2.7
1.0
3.85
3.975
0.025
1.1
1.15
0.65
1.27
1.1
1.44
solder land
solder land plus solder paste
solder paste deposit
solder resist
occupied area
Dimensions in mm
Issue date
0.7
14-07-28
20-04-20
sot1205_fr
Fig. 21. Reflow soldering footprint for LFPAK56D; Dual LFPAK (SOT1205)
BUK9K25-40RA
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Dual N-channel 40 V, 29 mOhm logic level MOSFET in LFPAK56D using Repetitive Avalanche
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Document status
[1][2]
Product
status [3]
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Quick reference data — The Quick reference data is an extract of the
product data given in the Limiting values and Characteristics sections of this
document, and as such is not complete, exhaustive or legally binding.
Objective [short]
data sheet
Development
This document contains data from
the objective specification for
product development.
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data sheet
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the preliminary specification.
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Product [short]
data sheet
Production
This document contains the product
specification.
[1]
[2]
[3]
Please consult the most recently issued document before initiating or
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BUK9K25-40RA
Product data sheet
All information provided in this document is subject to legal disclaimers.
2 December 2020
©
Nexperia B.V. 2020. All rights reserved
12 / 13
BUK9K25-40RA
Nexperia
Dual N-channel 40 V, 29 mOhm logic level MOSFET in LFPAK56D using Repetitive Avalanche
technology
Contents
1. General description...................................................... 1
2. Features and benefits.................................................. 1
3. Applications.................................................................. 1
4. Quick reference data....................................................1
5. Pinning information......................................................2
6. Ordering information....................................................2
7. Marking.......................................................................... 2
8. Limiting values............................................................. 2
9. Thermal characteristics............................................... 5
10. Characteristics............................................................ 5
11. Package outline........................................................ 10
12. Soldering................................................................... 11
13. Legal information......................................................12
©
Nexperia B.V. 2020. All rights reserved
For more information, please visit: http://www.nexperia.com
For sales office addresses, please send an email to: salesaddresses@nexperia.com
Date of release: 2 December 2020
BUK9K25-40RA
Product data sheet
All information provided in this document is subject to legal disclaimers.
2 December 2020
©
Nexperia B.V. 2020. All rights reserved
13 / 13