TP65H480G4JSG
650V SuperGaN® GaN FET in PQFN (source tab)
Description
Features
The TP65H480G4JSG 650V, 480mΩ Gallium Nitride (GaN)
FET is a normally-off device using Transphorm’s Gen IV
platform. It combines a state-of-the-art high voltage GaN
HEMT with a low voltage silicon MOSFET to offer superior
reliability and performance.
The Gen IV SuperGaN® platform uses advanced epi and
patented design technologies to simplify manufacturability
while improving efficiency over silicon via lower gate charge,
output capacitance, crossover loss, and reverse recovery
charge.
Related Literature
•
•
•
•
AN0003: Printed Circuit Board Layout and Probing
AN0007: Recommendations for Vapor Phase Reflow
AN0009: Recommended External Circuitry for GaN FETs
AN0012: PQFN Tape and Reel Information
Product Series and Ordering Information
Part Number
Package
Package
Configuration
TP65H480G4JSG-TR*
5x6 PQFN
Source
* “-TR” suffix refers to tape and reel. Refer to AN0012 for details.
TP65H480G4JSG
PQFN
(bottom view)
S
D
G
Pin 1
Cascode Schematic Symbol
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•
•
•
•
Gen IV technology
JEDEC-qualified GaN technology
Dynamic RDS(on)eff production tested
Robust design, defined by
— Wide gate safety margin
— Transient over-voltage capability
• Very low QRR
• Reduced crossover loss
• RoHS compliant and Halogen-free packaging
Benefits
• Achieves increased efficiency in both hard- and softswitched circuits
— Increased power density
— Reduced system size and weight
— Overall lower system cost
• Easy to drive with commonly-used gate drivers
• GSD pin layout improves high speed design
Applications
•
•
•
•
Consumer
Power adapters
Low power SMPS
Lighting
Key Specifications
VDS (V)
650
VDSS(TR)(V)
800
RDS(on) (mΩ) max*
560
QRR (nC) typ
14
QG (nC) typ
9
* Dynamic RDS(on); see Figures 18 and 19
Cascode Device Structure
© 2023 Transphorm Inc. Subject to change without notice.
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TP65H480G4JSG
Absolute Maximum Ratings (Tc=25°C unless otherwise stated.)
Symbol
VDSS
VDSS (TR)
VGSS
PD
ID
IDM
TC
TJ
TS
TSOLD
Parameter
Limit Value
Unit
Drain to source voltage (TJ = -55°C to 150°C)
650
Transient drain to source voltage a
800
Gate to source voltage
±18
Maximum power dissipation @TC=25°C
13.2
W
Continuous drain current @TC=25°C b
3.6
A
Continuous drain current @TC=100°C b
2.3
A
Pulsed drain current (pulse width: 10µs)
17
A
Case
-55 to +150
°C
Junction
-55 to +150
°C
-55 to +150
°C
260
°C
Operating temperature
Storage temperature
Reflow soldering temperature c
V
Notes:
a. In off-state, spike duration < 30s, non-repetitive
b. For increased stability at high current operation, see Circuit Implementation on page 3
c.
Reflow MSL3
VDSS(TR)
VDSS(BL)
Thermal Resistance
Symbol
Parameter
Maximum
Unit
RΘJC
Junction-to-case
9.5
°C/W
RΘJA
Junction-to-ambient d
50
°C/W
Notes:
d. Device on one layer epoxy PCB for drain connection (vertical and without air stream cooling, with 6cm2 copper area and 70µm thickness)
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TP65H480G4JSG
Circuit Implementation
DC Bus
RCDCL
Driver
RG
Driver
VBUS
FB
VO
RG FB
Simplified Half-bridge Schematic
Recommended gate drive: (0V, 8V) with RG(tot) = 30 Ωa
Simplified Single Ended Schematic
Recommended gate drive: (0V, 12V) with RG(ON) = 100 to 300 Ω
RG(OFF) = 0 to 15 Ω
Gate Ferrite Bead (FB1)
Required DC Link RC Snubber (RCDCL) b
240Ω @ 100MHz
4.7-10nF + 5Ω
Notes:
a. For bridge topologies only. RG could be much smaller in single ended topologies.
b. RCDCL should be placed as close as possible to the drain pin.
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TP65H480G4JSG
Electrical Parameters (TJ=25°C unless otherwise stated)
Symbol
Parameter
Min
Typ
Max
Unit
Test Conditions
Forward Device Characteristics
VDSS(BL)
Maximum drain-source voltage
650
—
—
V
VGS(th)
Gate threshold voltage
1.6
2.1
2.8
V
—
-5.8
—
mV/°C
—
480
560
—
1000
—
—
1
10
ΔVGS(th)/TJ
RDS(on)eff
IDSS
Gate threshold voltage temperature
coefficient
Drain-source on-resistance a
Drain-to-source leakage current
5
—
Gate-to-source forward leakage current
—
—
100
Gate-to-source reverse leakage current
—
—
-100
CISS
Input capacitance
—
760
—
COSS
Output capacitance
—
9
—
CRSS
Reverse transfer capacitance
—
1.5
—
CO(er)
Output capacitance, energy related b
—
13
—
CO(tr)
Output capacitance, time related c
—
29
—
QG
Total gate charge
—
9
—
QGS
Gate-source charge
—
2.1
—
QGD
Gate-drain charge
—
2.1
—
QOSS
Output charge
—
13.5
—
tD(on)
Turn-on delay
—
16.6
—
Rise time
—
3.5
—
Turn-off delay
—
53.2
—
Fall time
—
7.6
—
tR
tD(off)
tF
VDS=VGS, ID=0.5mA
VGS=8V, ID=3.4A
VGS=8V, ID=3.4A, TJ=150°C
VDS=650V, VGS=0V
µA
—
IGSS
mΩ
VGS=0V
VDS=650V, VGS=0V, TJ=150°C
nA
VGS=18V
VGS=-18V
pF
VGS=0V, VDS=400V, f=1MHz
pF
VGS=0V, VDS=0V to 400V
nC
VDS=400V, VGS=0V to 8V,
ID=3.4A
nC
VGS=0V, VDS=0V to 400V
ns
VDS=400V, VGS=0V to 8V,
ID=3.4A, RG=30Ω, ZFB=240Ω
at 100MHz (See Figure 14)
Notes:
a. Dynamic RDS(on) value; see Figures 18 and 19 for conditions
b. Equivalent capacitance to give same stored energy from 0V to 400V
c.
Equivalent capacitance to give same charging time from 0V to 400V
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TP65H480G4JSG
Electrical Parameters (TJ=25°C unless otherwise stated)
Symbol
Parameter
Min
Typ
Max
Unit
—
—
2.3
A
—
1.3
—
—
1.8
—
Test Conditions
Reverse Device Characteristics
IS
Reverse current
VSD
Reverse voltage a
V
tRR
Reverse recovery time
—
14.5
—
ns
QRR
Reverse recovery charge
—
14
—
nC
VGS=0V, TC=100°C,
≤25% duty cycle
VGS=0V, IS=1.15A
VGS=0V, IS=2.3A
IS=3.4A, VDD=400V,
di/dt=1000A/us
Notes:
a. Includes dynamic RDS(on) effect
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TP65H480G4JSG
Typical Characteristics (TC=25°C unless otherwise stated)
Figure 1. Typical Output Characteristics TJ=25°C
Figure 2. Typical Output Characteristics TJ=150°C
Parameter: VGS
Parameter: VGS
Figure 3. Typical Transfer Characteristics
Figure 4. Normalized On-resistance
VDS=20V, parameter: TJ
ID=16A, VGS=10V
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TP65H480G4JSG
Typical Characteristics (TC=25°C unless otherwise stated)
Figure 5. Typical Capacitance
VGS=0V, f=1MHz
Figure 6. Typical COSS Stored Energy
Figure 7. Typical QOSS
Figure 8. Typical Gate Charge
IDS=3.4A, VDS=400V
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TP65H480G4JSG
Typical Characteristics (TC=25°C unless otherwise stated)
Figure 9. Power Dissipation
Figure 11. Forward Characteristics of Rev. Diode
IS=f(VSD), parameter: TJ
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Figure 10. Current Derating
Pulse width ≤ 10µs, VGS ≥ 10V
Figure 12. Transient Thermal Resistance
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TP65H480G4JSG
Typical Characteristics (TC=25°C unless otherwise stated)
Figure 13. Safe Operating Area TC=25°C
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TP65H480G4JSG
Test Circuits and Waveforms
Figure 14. Switching Time Test Circuit
(see circuit implementation on page 3
for methods to ensure clean switching)
Figure 15. Switching Time Waveform
Figure 16. Diode Characteristics Test Circuit
Figure 17. Diode Recovery Waveform
Figure 18. Dynamic RDS(ON)eff Test Circuit
Figure 19. Dynamic RDS(ON)eff Waveform
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TP65H480G4JSG
Design Considerations
The fast switching of GaN devices reduces current-voltage crossover losses and enables high frequency operation while
simultaneously achieving high efficiency. However, taking full advantage of the fast switching characteristics of GaN switches
requires adherence to specific PCB layout guidelines and probing techniques.
Before evaluating Transphorm GaN devices, see application note Printed Circuit Board Layout and Probing for GaN Power
Switches. The table below provides some practical rules that should be followed during the evaluation.
When Evaluating Transphorm GaN Devices:
DO
Minimize circuit inductance by keeping traces short, both in
the drive and power loop
Minimize lead length of TO-220 and TO-247 package when
mounting to the PCB
Use shortest sense loop for probing; attach the probe and its
ground connection directly to the test points
DO NOT
Twist the pins of TO-220 or TO-247 to accommodate GDS
board layout
Use long traces in drive circuit, long lead length of the
devices
Use differential mode probe or probe ground clip with long
wire
See AN0003: Printed Circuit Board Layout and Probing
GaN Design Resources
The complete technical library of GaN design tools can be found at transphormusa.com/design:
•
•
•
•
•
Evaluation kits
Application notes
Design guides
Simulation models
Technical papers and presentations
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Mechanical
5x6 PQFN Package
TP65H480G4JSG
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