SIT1576AI-J1-33E-0200.000000 数据手册
SiT1576
1.2 mm2 µPower, Low-Jitter, 1 Hz – 2.5 MHz Super-TCXO
Features
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Applications
1 Hz to 2.5 MHz ±5 ppm all-inclusive frequency stability
Factory programmable output frequency
World’s smallest TCXO Footprint: 1.2 mm2
▪ 1.5 x 0.8 mm CSP
▪ No external bypass cap required
Improved stability reduces system power with fewer network
timekeeping updates
Ultra-low power: 6 µA (100 kHz)
Supply voltage range: 1.62 V to 3.63 V
Operating temperature ranges: -20°C to +70°C, -40°C to +85°C
Pb-free, RoHS and REACH compliant
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Health and wellness monitors
Smart pens
ULP input devices
Proprietary wireless
Sensor interface
Electrical Specifications
Table 1. Electrical Characteristics
Conditions: Min/Max limits are over temperature, V DD = 1.8 V ±10%, unless otherwise stated. Typicals are at 25°C and VDD = 1.8 V.
Parameter
Symbol
Min.
Typ.
Max.
Unit
Condition
Frequency and Stability
Output Frequency
Total Frequency Stability[1]
Allan Deviation
First Year Frequency Aging
FOUT
F_stab
1
2.5 M
Hz
-5
5
ppm
-20
20
ppm
AD
1e-8
F_aging
±1
4e-8
All inclusive, Stability code: E
All inclusive, Stability code: 1
1 second averaging time
ppm
TA = 25°C, VDD = 1.8V
Jitter Performance
Integrated Phase Jitter
IPJ
2
3.5
nsRMS
Period Jitter
PJ
2.2
4.5
nsRMS
Peak-to-Peak Period Jitter
PJp-p
20
35
nsp-p
Operating Supply Voltage
VDD
FOUT > 1 kHz, Integration bandwidth = 100 Hz to FOUT /2. Inclusive
of 50 mV peak-to-peak sinusoidal noise on VDD. Noise frequency
100 Hz to 20 MHz
Cycles = 10,000, f = 100 kHz. Per JEDEC standard 65B, tested at
100 kHz. See performance plot for other frequencies.
Supply Voltage and Current Consumption
No Load Supply Current
Start-up Time at Power-up
1.62
IDD
t_start
3.63
V
FOUT = 1 Hz
FOUT = 33 kHz
FOUT = 100 kHz
3.65
4.5
6
5
5.5
7
13
33
16
40
FOUT = 1 MHz
FOUT = 2 MHz
150
300
FOUT > 200 Hz.
Measured when supply reaches 90% of final VDD to the first output
pulse and within specified min/max frequency limit.
300 +
2.0 cycles
300 +
2.5 cycles
µA
ms
10 Hz < FOUT ≤ 200 Hz.
Measured when supply reaches 90% of final VDD to the first output
pulse and within specified min/max frequency limit.
1 Hz ≤ FOUT ≤ 10 Hz.
Measured when supply reaches 90% of final VDD to the first output
pulse and within specified min/max frequency limit.
500 +
2.5 Cycles
Operating Temperature Range
Operating Temperature Range
Op_Temp
-20
70
°C
“C” ordering code
-40
85
°C
“I” ordering code
LVCMOS Output
Output Rise/Fall Time
tR, tF
Output Clock Duty Cycle
DC
45
9
Output Voltage High
VOH
90%
Output Voltage Low
VOL
20
ns
55
%
10%
20-80%, 15 pF load, VDD = 1.8V +/-10%
VDD
IOH = -50 µA, 15 pF load
VDD
IOL = 50 µA, 15 pF load
Note:
1. Includes initial tolerance, over temp stability, 2x reflow, VDD range, board-level under fill, and 20% load variation. Tested with Agilent 53132A
frequency counter. Measured with ≥100 ms gate time for accurate frequency measurement.
Rev. 1.31
25 March 2021
www.sitime.com
SiT1576 1.2 mm2 µPower, Low-Jitter, 1 Hz – 2.5 MHz Super-TCXO
Table 2. Pin Configuration
Pin
Symbol
I/O
1
NC
Internal Test
2
CLK Out
OUT
3
Vdd
Power Supply
4
GND
Power Supply Ground
Top View
Functionality
No Connect. Leave floating. Pin 1 is for internal testing and is
designed to be left floating.
CAL/NC
NC
1
4
GND
CLK Out
2
3
Vdd
Oscillator clock output.
Operates from nominal supply voltages between 1.8 V and 3.3 V.
Under normal operating conditions, Vdd does not require external
bypass/decoupling capacitor(s).
SiT1576 includes on-chip Vdd filtering.
Figure 1. Pin Assignment
Connect to ground.
Table 3. Absolute Maximum Ratings
Attempted operation outside the absolute maximum ratings may cause permanent damage to the part.
Actual performance of the IC is only guaranteed within the operational specifications, not at absolute maximum ratings.
Parameters
Test Conditions
Value
Continuous Power Supply Voltage Range (Vdd)
Unit
-0.5 to 4.0
V
105
°C
Continuous Maximum Operating Temperature Range
≤ 30 minutes
125
°C
Human Body Model (HBM) ESD Protection
JESD22-A114
2000
V
Charge-Device Model (CDM) ESD Protection
JESD22-C101
750
V
Machine Model (MM) ESD Protection
JESD22-A115
300
V
g
Short Duration Maximum Operating Temperature Range
Latch-up Tolerance
JESD78 Compliant
Mechanical Shock Resistance
Mil 883, Method 2002
20,000
Mechanical Vibration Resistance
Mil 883, Method 2007
70
g
150
°C
-65 to 150
°C
1508 CSP Junction Temperature
Storage Temperature
System Block Diagram
VDD
GND
Control
NVM
Temp-to-Digital
Prog
Prog
Driver
NC
Figure 2. SiT1576 Block Diagram
Rev. 1.31
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SiT1576 1.2 mm2 µPower, Low-Jitter, 1 Hz – 2.5 MHz Super-TCXO
Description
SiT1576 is an ultra-small and ultra-low power Factory
programmable TCXO with an output frequency range
between 1 Hz to 2.5 MHz. SiTime’s silicon MEMS
technology enables the first 1 Hz – 2.5 MHz TCXO in the
world’s smallest footprint and chip-scale packaging (CSP).
Typical supply current is only 6 µA (100 kHz).
SiTime's MEMS oscillator consists of a MEMS resonator
and a programmable analog circuit. SiT1576 MEMS
resonator is built with SiTime’s unique MEMS First®
process. A key manufacturing step is EpiSeal ® during which
the MEMS resonator is annealed with temperatures over
1000°C. EpiSeal creates an extremely strong, clean,
vacuum chamber that encapsulates the MEMS resonator
and ensures the best performance and reliability. During
EpiSeal, a poly silicon cap is grown on top of the resonator
cavity, which eliminates the need for additional cap wafers
or other exotic packaging. As a result, SiTime’s MEMS
resonator die can be used like any other semiconductor die.
One unique result of SiTime’s MEMS First and EpiSeal
manufacturing processes is the capability to integrate
SiTime’s MEMS die with a SOC, ASIC, microprocessor or
analog die within a package to eliminate external timing
components and provide a highly integrated, smaller,
cheaper solution to the customer.
Dynamic Temperature Frequency
Response
Dynamic Temperature Frequency Response is the rate of
frequency change during temperature ramps. This is an
important performance metric when the oscillator is
mounted near a high power component (e.g. SoC or power
management) that may rapidly change the temperature of
surrounding components.
For moderate temperature ramp rates (5°C/sec), the latency in
the temperature compensation loop contributes a larger
frequency error, which is dependent on the temperature
compensation update rate. This part achieves excellent
performance at 3 Hz update rate. This device family
supports faster update rates for further reducing dynamic
frequency error at the expense of slightly increased current
consumption.
TCXO Frequency Stability
SiT1576 is factory calibrated (trimmed) over multiple
temperature points to guarantee extremely tight stability
over temperature. Unlike quartz crystals that have a classic
tuning fork parabola temperature curve with a 25°C turnover
point with a 0.04 to 0.06 ppm/°C2 temperature coefficient,
the SiT1576 temperature coefficient is calibrated and
corrected over temperature with an active temperature
correction circuit. The result is a 32 kHz TCXO with
extremely tight frequency variation over the -40°C to +85°C
temperature range.
When measuring the output frequency of SiT1576 with a
frequency counter, it is important to make sure the counter's
gate time is >100 ms. Shorter gate times may lead to
inaccurate measurements Similarly, the gate time will need
to increase for frequencies in the 1 Hz to 500 Hz
frequency range.
Rev. 1.31
Page 3 of 10
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SiT1576 1.2 mm2 µPower, Low-Jitter, 1 Hz – 2.5 MHz Super-TCXO
Typical Operating Curves
Frequency Stability (PPM)
(TA = 25°C, Vdd = 1.8 V, supply current plots are no load, unless otherwise stated)
Internal Caps Charging
Logic Start-up
NVM Read
OSC Start-up
Temperature
Compensation (13 µA)
350ms
Steady State
33 kHz
4.5
Temperature (°C)
Figure 3. Frequency Stability over Temperature
Figure 4. Start-up and Steady-State
Current Profile
4.5
FOUT = 33 kHz
4.3
No Vdd bypass
Current (µA)
4.1
VDD = 3.3 V
3.9
3.7
VDD = 1.8 V
10 nF Vdd bypass
3.5
3.3
-40
-20
0
20
40
60
80
100
Temperature (°C)
Figure 6. Supply Current vs Temperature
(FOUT = 1 Hz)
Figure 5. Power Supply Noise Rejection
5
8
4.9
7.75
7.5
4.8
VDD = 3.3 V
7.25
7
VDD = 3.3 V
4.6
Current (µA)
Current (µA)
4.7
4.5
4.4
4.3
VDD = 1.8 V
4.2
6.5
6.25
6
5.75
VDD = 1.8 V
5.5
4.1
5.25
4
5
-40
-20
0
20
40
60
80
100
-40
-20
0
20
40
60
80
100
Temperature (°C)
Temperature (°C)
Figure 7. Supply Current vs Temperature
(FOUT = 100 Hz)
Rev. 1.31
6.75
Figure 8. Supply Current vs Temperature
(FOUT = 100 kHz)
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SiT1576 1.2 mm2 µPower, Low-Jitter, 1 Hz – 2.5 MHz Super-TCXO
Typical Operating Curves (continuous)
(TA = 25°C, Vdd = 1.8 V, supply current plots are no load, unless otherwise stated)
18
32.5
31
17.25
29.5
16.5
VDD = 3.3 V
26.5
15
25
14.25
23.5
Current (µA)
Current (µA)
VDD = 3.3 V
28
15.75
13.5
12.75
22
20.5
19
12
17.5
11.25
16
VDD = 1.8 V
14.5
10.5
VDD = 1.8 V
13
9.75
11.5
10
9
-40
-20
0
20
40
60
80
-40
100
-20
0
20
40
60
80
100
Temperature (°C)
Temperature (°C)
Figure 9. Supply Current vs Temperature
(FOUT = 500 kHz)
Figure 10. Supply Current vs Temperature
(FOUT = 1 MHz)
64
57
61
55
53
58
VDD = 3.3 V
51
VDD = 3.3 V
55
49
52
49
45
Current (µA)
Current (µA)
47
43
41
39
37
43
40
37
35
33
34
31
VDD = 1.8 V
29
VDD = 1.8 V
31
28
27
25
25
-40
-20
0
20
40
60
80
100
-40
Temperature (°C)
-20
0
20
40
60
80
100
Temperature (°C)
Figure 11. Supply Current vs Temperature
(FOUT = 1.85 MHz)
Rev. 1.31
46
Figure 12. Supply Current vs Temperature
(FOUT = 2 MHz)
Page 5 of 10
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SiT1576 1.2 mm2 µPower, Low-Jitter, 1 Hz – 2.5 MHz Super-TCXO
Dynamic Frequency Response for Moderate Temperature Ramps
Frequency accuracy under a moderate temperature ramp up to 2°C/sec is limited by the TCXO’s trimmed accuracy of the frequency
stability over-temperature.
Note:
2. Measured relative to 32.768 kHz.
Rev. 1.31
Page 6 of 10
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SiT1576 1.2 mm2 µPower, Low-Jitter, 1 Hz – 2.5 MHz Super-TCXO
Dynamic Frequency Response for Fast Temperature Ramps
10°C/sec Temp Ramp Frequency Response
5°C/sec Temp Ramp Frequency Response
~10°C/sec
[3]
[3]
~5°C/sec
3 Hz Temp Comp
Refresh Rate
3 Hz Temp Comp
Refresh Rate
For temperature ramps >5°C/sec, the frequency accuracy is limited by the update rate of the temperature compensation path
(see the 5°C/sec and 10°C/sec plots).
Contact SiTime for applications that require improved dynamic performance.
Note:
3. Referenced to 32.768 kHz.
Rev. 1.31
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SiT1576 1.2 mm2 µPower, Low-Jitter, 1 Hz – 2.5 MHz Super-TCXO
Dimensions and Patterns
Package Size – Dimensions (Unit: mm)
Recommended Land Pattern (Unit: mm)
#4
#3
#2
#1
(soldermask openings shown with
dashed line around NSMD pad)
Recommended 4-mil (0.1mm) stencil thickness
Manufacturing Guidelines
1) No Ultrasonic or Megasonic cleaning: Do not subject
SiT1576 to an ultrasonic or megasonic cleaning
environment. Permanent damage or long term
reliability issues may occur.
2) Applying board-level underfill and overmold is
acceptable and will not impact the reliability of
the device.
3) Reflow profile, per JESD22-A113D.
Rev. 1.31
4) The SiT1576 CSP includes a protective, opaque
polymer top-coat. If the SiT1576 will see intense light,
especially in the 1.0-1.2 µm IR spectrum, we
recommend a protective “glob-top” epoxy or other
cover to keep the light from negatively impacting the
frequency stability.
5) For additional manufacturing guidelines and
marking/tape-reel instructions, refer to SiTime
Manufacturing Notes.
Page 8 of 10
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SiT1576 1.2 mm2 µPower, Low-Jitter, 1 Hz – 2.5 MHz Super-TCXO
Ordering Information
SiT1576AI-JE-XXE-XXXX.XXXXXXQ
Part Family
Packaging
“SiT1576”
“S”: 8 mm Tape & Reel, 10 ku reel
“Q”: 8 mm Tape & Reel, 5 ku reel
“D”: 8 mm Tape & Reel, 3 ku reel
“E”: 8 mm Tape & Reel, 1 ku reel
Revision Letter
“A”: is the revision
Samples in cut Tape
Temperature Range
“C”: Extended Commercial, -20 to 70ºC
“I”: lndustrial, -40 to 85ºC
Output Frequency
Package Size
Enter your desired frequency as
shown below:
Continuous frequency options from
1Hz to 2.5 MHz
“J”: 1.5 mm x 0.8 mm CSP
2500.000000 = 2.5 MHz
1850.000000 = 1.85 MHz
0512.288000 = 512.288 kHz
0010.000000 = 10.0 kHz
0004.096000 = 4.0960 kHz
0000.100256 = 100.256 Hz
0000.010000 = 10.0 Hz
0000.001000 = 1.0 Hz
0000.001100 = 1.10 Hz
0000.005123 = 5.123 Hz
All-Inclusive Over Temp Stability
“E”: ±5 ppm
“1”: ±20 ppm
Supply Voltage
XX = 1.8 V – 3.3 V
1.8 V = 18
2.0 V = 20
2.5 V = 25
3.0 V = 30
3.3 V = 33
Rev. 1.31
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SiT1576 1.2 mm2 µPower, Low-Jitter, 1 Hz – 2.5 MHz Super-TCXO
Table 4. Revision History
Version
Release Date
Change Summary
0.25
13-Jan-2016
Initial Release of Advanced datasheet
0.5
10-Mar-2016
Preliminary datasheet initial release
0.9
15-Feb-2017
Updated Package Outline Drawing (POD)
Updated part number ordering information
Updated max programmable frequency
Updated logo and company address, other page layout changes
1.0
9-May-2017
Final Release
Updated supply current vs frequency
Updated start-up time
1.1
12-Jun-2017
Updated max operating frequency to 2.0 MHz
1.2
3-Aug-2017
Added additional typical operating curves
Updated typical No Load Supply Current (Table 1)
1.3
15-Mar-2018
Updated max operating frequency from 2.0MHz to 2.5MHz
1.31
25-Mar-2021
Added Option “D” for 3ku reels to the Ordering Information
Updated hyperlinks, trademarks, date format and layout formatting
SiTime Corporation, 5451 Patrick Henry Drive, Santa Clara, CA 95054, USA | Phone: +1-408-328-4400 | Fax: +1-408-328-4439
© SiTime Corporation 2018-2021. The information contained herein is subject to change at any time without notice. SiTime assumes no responsibility or liabi lity for any loss, damage
or defect of a Product which is caused in whole or in part by (i) use of any circuitry other than circuitry embodied in a SiTime product, (ii) misuse or abuse including static discharge, neglect
or accident, (iii) unauthorized modification or repairs which have been soldered or altered during assembly and are not capable of being tested by SiTime under its normal test conditions, or
(iv) improper installation, storage, handling, warehousing or transportation, or (v) being subjected to unusual physical, thermal, or electrical stress.
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Rev. 1.31
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