FQPF13N50CF
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N-Channel 550V (D-S) Power MOSFET
FEATURES
PRODUCT SUMMARY
• Optimal Design
VDS (V)
550
RDS(on) max. at 25 °C ()
Qg max. (nC)
150
Qgs (nC)
- Reduced Capacitive Switching Losses
- High Body Diode Ruggedness
- Avalanche Energy Rated (UIS)
• Optimal Efficiency and Operation
- Low Cost
- Simple Gate Drive Circuitry
- Low Figure-of-Merit (FOM): Ron x Qg
12
Qgd (nC)
25
Configuration
- Low Area Specific On-Resistance
- Low Input Capacitance (Ciss)
0.26
VGS = 10 V
Single
- Fast Switching
APPLICATIONS
D
TO-220 FULLPAK
G
S
G D S
N-Channel MOSFET
• Consumer Electronics
- Displays (LCD or Plasma TV)
• Server and Telecom Power Supplies
- SMPS
• Industrial
- Welding
- Induction Heating
- Motor Drives
• Battery Chargers
• SMPS
- Power Factor Correction (PFC)
Top View
ABSOLUTE MAXIMUM RATINGS (TC = 25 °C, unless otherwise noted)
PARAMETER
Drain-Source Voltage
Gate-Source Voltage
Gate-Source Voltage AC (f > 1 Hz)
Continuous Drain Current (TJ = 150 °C)
LIMIT
VDS
550
± 20
30
18
11
56
2.2
281
60
- 55 to + 150
24
0.36
300c
VGS
VGS at 10 V
TC = 25 °C
TC = 100 °C
Pulsed Drain Currenta
Linear Derating Factor
Single Pulse Avalanche Energyb
Maximum Power Dissipation
Operating Junction and Storage Temperature Range
Drain-Source Voltage Slope
TJ = 125 °C
Reverse Diode dV/dtd
Soldering Recommendations (Peak Temperature)
for 10 s
Notes
a. Repetitive rating; pulse width limited by maximum junction temperature.
b. VDD = 50 V, starting TJ = 25 °C, L = 10 mH, Rg = 25 , IAS = 7.5 A.
c. 1.6 mm from case.
d. ISD ID, starting TJ = 25 °C.
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SYMBOL
ID
IDM
EAS
PD
TJ, Tstg
dV/dt
UNIT
V
A
W/°C
mJ
W
°C
V/ns
°C
1
FQPF13N50CF
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THERMAL RESISTANCE RATINGS
PARAMETER
SYMBOL
TYP.
MAX.
Maximum Junction-to-Ambient
RthJA
-
40
Maximum Junction-to-Case (Drain)
RthJC
-
0.45
UNIT
°C/W
SPECIFICATIONS (TJ = 25 °C, unless otherwise noted)
PARAMETER
SYMBOL
TEST CONDITIONS
MIN.
TYP.
MAX.
UNIT
Static
Drain-Source Breakdown Voltage
VDS Temperature Coefficient
VDS
VGS = 0 V, ID = 250 μA
-
-
V
VDS/TJ
Reference to 25 °C, ID = 250 μA
-
0.56
-
V/°C
550
VGS(th)
VDS = VGS, ID = 250 μA
2
-
4
V
Gate-Source Leakage
IGSS
VGS = ± 20 V
-
-
± 100
nA
Zero Gate Voltage Drain Current
IDSS
VDS = 500 V, VGS = 0 V
-
-
1
VDS = 400 V, VGS = 0 V, TJ = 125 °C
-
-
10
Gate-Source Threshold Voltage (N)
μA
-
0.26
-
gfs
VDS = 50 V, ID = 10 A
-
12
-
S
Input Capacitance
Ciss
3094
-
Coss
-
152
-
Reverse Transfer Capacitance
Crss
VGS = 0 V,
VDS = 100 V,
f = 1 MHz
-
Output Capacitance
-
13
-
Effective output capacitance, energy
relateda
Co(er)
-
131
-
Effective output capacitance, time
relatedb
Co(tr)
-
189
-
-
80
150
-
12
-
25
24
50
Drain-Source On-State Resistance
Forward Transconductance
RDS(on)
VGS = 10 V
ID = 10 A
Dynamic
pF
VGS = 0 V,
VDS = 0 V to 400 V
Total Gate Charge
Qg
Gate-Source Charge
Qgs
Gate-Drain Charge
Qgd
-
Turn-On Delay Time
td(on)
-
Rise Time
Turn-Off Delay Time
tr
td(off)
Fall Time
tf
Gate Input Resistance
Rg
VGS = 10 V
ID = 10 A, VDS = 400 V
VDD = 400 V, ID = 10 A,
VGS = 10 V, Rg = 9.1
f = 1 MHz, open drain
nC
-
31
62
-
117
176
-
56
112
-
1.8
-
-
-
20
-
-
80
-
-
1.2
V
-
437
-
ns
-
5.9
-
μC
-
25
-
A
ns
Drain-Source Body Diode Characteristics
Continuous Source-Drain Diode Current
IS
Pulsed Diode Forward Current
ISM
Diode Forward Voltage
VSD
Reverse Recovery Time
trr
Reverse Recovery Charge
Qrr
Reverse Recovery Current
IRRM
MOSFET symbol
showing the
integral reverse
p - n junction diode
D
A
G
S
TJ = 25 °C, IS = 10 A, VGS = 0 V
TJ = 25 °C, IF = IS = 10 A,
dI/dt = 100 A/μs, VR = 20 V
Notes
a. Coss(er) is a fixed capacitance that gives the same energy as Coss while VDS is rising from 0 % to 80 % VDS.
b. Coss(tr) is a fixed capacitance that gives the same charging time as Coss while VDS is rising from 0 % to 80 % VDS.
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TYPICAL CHARACTERISTICS (25 °C, unless otherwise noted)
80
60
TJ = 25 °C
RDS(on), Drain-to-Source
On Resistance (Normalized)
ID, Drain-to-Source Current (A)
15 V
14 V
13 V
12 V
11
11 V
V
10 V
9V
8V
7V
6V
BOTTOM 5 V
3
TOP
40
20
2.5
2
1.5
1
VGS = 10 V
0.5
0
0
5
10
15
20
25
ID = 10 A
0
- 60 - 40 - 20 0
30
VDS, Drain-to-Source Voltage (V)
20 40 60 80 100 120 140 160
TJ, Junction Temperature (°C)
Fig. 4 - Normalized On-Resistance vs. Temperature
Fig. 1 - Typical Output Characteristics
40
10 000
15 V
14 V
13 V
12 V
11 V
V
11
10 V
9V
8V
7V
6V
BOTTOM 5 V
30
TJ = 150 °C
ġ
Capacitance (pF)
ID, Drain-to-Source Current (A)
TOP
20
Ciss
1000
100
ġ
Coss
10
10
ġ
Crss
1
0
0
5
10
15
20
25
0
30
VDS, Drain-to-Source Voltage (V)
100
200
300
400
500
VDS, Drain-to-Source Voltage (V)
Fig. 2 - Typical Output Characteristics
Fig. 5 - Typical Capacitance vs. Drain-to-Source Voltage
24
VGS, Gate-to-Source Voltage (V)
80
ID, Drain-to-Source Current (A)
VGS = 0 V, f = 1 MHz
Ciss = Cgs + Cgd, Cds Shorted
ġ
Crss = Cgd
ġ
Coss = Cds + Cgd
TJ = 25 °C
60
TJ = 150 °C
40
20
VDS = 400 V
VDS = 250 V
VDS = 100 V
20
16
12
8
4
0
0
0
5
10
15
20
VGS, Gate-to-Source Voltage (V)
Fig. 3 - Typical Transfer Characteristics
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25
0
30
60
90
120
150
180
Qg, Total Gate Charge (nC)
Fig. 6 - Typical Gate Charge vs. Gate-to-Source Voltage
3
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20
ISD, Reverse Drain Current (A)
100
ID, Drain Current (A)
TJ = 150 °C
TJ = 25 °C
10
ġ
ġ
1
16
12
8
4
VGS = 0 V
ġ
0
0.1
0.2
0.4
0.6
0.8
1.0
1.2
1.4
25
1.6
VSD, Source-Drain Voltage (V)
75
100
125
150
TJ, Case Temperature (°C)
Fig. 9 - Maximum Drain Current vs. Case Temperature
Fig. 7 - Typical Source-Drain Diode Forward Voltage
1000
625
Operation in this area
limited by RDS(on)
600
VDS, Drain-to-Source
Brakdown Voltage (V)
ID, Drain Current (A)
50
100
10
100 μs
Limited by RDS(on)*
1 ms
1
TC = 25 °C
TJ = 150 °C
Single Pulse
550
525
500
BVDSS Limited
10 ms
0.1
475
- 60 - 40 - 20 0
10
100
1000
VDS, Drain-to-Source Voltage (V)
* VGS > minimum VGS at which RDS(on) is specified
1
20 40 60 80 100 120 140 160
TJ, Junction Temperature (°C)
Fig. 8 - Maximum Safe Operating Area
Normalized Effective Transient
Thermal Impedance
575
Fig. 10 - Temperature vs. Drain-to-Source Voltage
1
Duty Cycle = 0.5
0.2
0.1
0.1
0.02
0.05
Single Pulse
0.01
0.0001
0.001
0.01
0.1
1
Pulse Time (s)
Fig. 11 - Normalized Thermal Transient Impedance, Junction-to-Case
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RD
VDS
QG
10 V
VGS
D.U.T.
RG
QGS
+
- VDD
QGD
VG
10 V
Pulse width ≤ 1 µs
Duty factor ≤ 0.1 %
Charge
Fig. 12 - Switching Time Test Circuit
Fig. 16 - Basic Gate Charge Waveform
Current regulator
Same type as D.U.T.
VDS
90 %
50 kΩ
12 V
0.2 µF
0.3 µF
+
10 %
VGS
D.U.T.
td(on)
td(off) tf
tr
-
VDS
VGS
3 mA
Fig. 13 - Switching Time Waveforms
IG
ID
Current sampling resistors
Fig. 17 - Gate Charge Test Circuit
L
Vary tp to obtain
required IAS
VDS
D.U.T
RG
+
-
IAS
V DD
10 V
0.01 Ω
tp
Fig. 14 - Unclamped Inductive Test Circuit
VDS
tp
VDD
VDS
IAS
Fig. 15 - Unclamped Inductive Waveforms
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Peak Diode Recovery dV/dt Test Circuit
+
D.U.T.
Circuit layout considerations
• Low stray inductance
• Ground plane
• Low leakage inductance
current transformer
+
-
-
Rg
•
•
•
•
+
dV/dt controlled by Rg
Driver same type as D.U.T.
ISD controlled by duty factor “D”
D.U.T. - device under test
+
-
VDD
Driver gate drive
P.W.
Period
D=
P.W.
Period
VGS = 10 Va
D.U.T. lSD waveform
Reverse
recovery
current
Body diode forward
current
dI/dt
D.U.T. VDS waveform
Diode recovery
dV/dt
Re-applied
voltage
Inductor current
VDD
Body diode forward drop
Ripple ≤ 5 %
ISD
Note
a. VGS = 5 V for logic level devices
Fig. 18 - For N-Channel
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TO-220 FULLPAK (HIGH VOLTAGE)
A
E
A1
ØP
n
d1
d3
D
u
L1
V
L
b3
A2
b2
c
b
e
MILLIMETERS
DIM.
A
A1
A2
b
b2
b3
c
D
d1
d3
E
e
L
L1
n
ØP
u
v
ECN: X09-0126-Rev. B, 26-Oct-09
DWG: 5972
MIN.
4.570
2.570
2.510
0.622
1.229
1.229
0.440
8.650
15.88
12.300
10.360
INCHES
MAX.
4.830
2.830
2.850
0.890
1.400
1.400
0.629
9.800
16.120
12.920
10.630
MIN.
0.180
0.101
0.099
0.024
0.048
0.048
0.017
0.341
0.622
0.484
0.408
13.730
3.500
6.150
3.450
2.500
0.500
0.520
0.122
0.238
0.120
0.094
0.016
2.54 BSC
13.200
3.100
6.050
3.050
2.400
0.400
MAX.
0.190
0.111
0.112
0.035
0.055
0.055
0.025
0.386
0.635
0.509
0.419
0.100 BSC
0.541
0.138
0.242
0.136
0.098
0.020
Notes
1. To be used only for process drawing.
2. These dimensions apply to all TO-220, FULLPAK leadframe versions 3 leads.
3. All critical dimensions should C meet Cpk > 1.33.
4. All dimensions include burrs and plating thickness.
5. No chipping or package damage.
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