RoHS Recast Compliant
USB Flash Drive
UV110-UFD1 Product Specifications
December 27, 2021
Version 1.7
Apacer Technology Inc.
1F, No.32, Zhongcheng Rd., Tucheng Dist., New Taipei City, Taiwan, R.O.C
Tel: +886-2-2267-8000
www.apacer.com
Fax: +886-2-2267-2261
Specifications Overview:
USB 3.1 Gen1 Super Speed compatible,
and backward compatible with USB 2.0 &
USB 1.1 interfaces
–
USB 3.1 Gen1 max. transfer rate: 5 Gb/s
–
Backward compatible with 480Mb/s for
USB 2.0 & 12 Mb/s for USB 1.1
Temperature Range
–
Wide**: -40°C to 85°C
–
Storage: -55°C to 100°C
Supply Voltage
–
16, 32, 64, 128, 256 GB
Performance*
Operating:
Standard: 0°C to 70°C
Capacity
–
5.0 V ± 5%
Power Consumption*
–
Sequential read: Up to 260 MB/sec
–
Active mode: 195 mA
–
Sequential write: Up to 125 MB/sec
–
Idle mode: 80 mA
–
Random read (4K): Up to 2,500 IOPS
–
Random write (4K): Up to 700 IOPS
Supports Non-Removable Setting
Supports Toggle 2.0 mode/ONFI 3.0
OS Support
Flash Management
–
Built-in hardware Low Density ParityCheck (LDPC) ECC
–
Windows: Win7/8/10 later
–
Global Wear Leveling
–
Mac: 10.2.8/10.8 or later
–
Flash bad-block management
–
Linux: 2.4.0/2.4.10 or later
–
Flash Translation Layer: Page Mapping
–
Power Failure Management
–
S.M.A.R.T.
–
Hyper Cache Technology
LED Indicators for Drive Behavior
–
SMART Read RefreshTM
RoHS Recast Compliant
NAND Flash Type: 3D TLC (BiCS3)
MTBF: >3,000,000 hours
Endurance (in drive writes per day: DWPD)
16 GB: 4.07 DWPD
–
32 GB: 4.11 DWPD
–
64 GB: 4.11 DWPD
–
128 GB: 4.11 DWPD
–
256 GB: 4.11 DWPD
Dimensions
–
–
–
46.85 x 17.2 x 7.7, unit: mm
Complies with 2011/65/EU Standard
*Varies from capacities. The values for performances and power consumptions presented are typical and may vary depending
on flash configurations or platform settings. The term idle refers to the standby state of the device.
**Not supported on 16GB
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© 2021 Apacer Technology Inc.
Table of Contents
1. General Descriptions ........................................................................3
2. Functional Block ...............................................................................3
3. Product Specifications ......................................................................4
3.1 Capacity ......................................................................................................................................... 4
3.2 Performance .................................................................................................................................. 4
3.3 Environmental Specifications ........................................................................................................ 5
3.4 Mean Time Between Failures (MTBF) .......................................................................................... 5
3.5 Certification and Compliance......................................................................................................... 5
3.6 Endurance ..................................................................................................................................... 6
3.7 LED Indicator Behavior .................................................................................................................. 6
4. Flash Management ............................................................................7
4.1 Performance-optimized USB Controller ........................................................................................ 7
4.2 Power Saving Implemented........................................................................................................... 7
4.3 Program RAM Architect ................................................................................................................. 7
4.4 Error Correction/Detection (ECC) .................................................................................................. 7
4.5 Global Wear Leveling .................................................................................................................... 7
4.6 S.M.A.R.T. ..................................................................................................................................... 7
4.7 Power Failure Management .......................................................................................................... 8
4.8 Bad Block Management ................................................................................................................ 8
4.9 Flash Translation Layer – Page Mapping...................................................................................... 8
4.10 Hyper Cache Technology ............................................................................................................ 8
4.11 SMART Read RefreshTM ............................................................................................................. 8
5. Electrical Specifications...................................................................9
5.1 Absolute Stress Rating .................................................................................................................. 9
5.2 Absolute Maximum Rating............................................................................................................. 9
5.3 Power Consumption ...................................................................................................................... 9
6. Physical Characteristics .................................................................10
7. Product Ordering Information .........................................................11
7.1 Product Code Designations ......................................................................................................... 11
7.2 Valid Combinations ...................................................................................................................... 12
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© 2021 Apacer Technology Inc.
1. General Descriptions
Apacer’s UV110-UFD1 utilizes 3D NAND for higher capacity up to 256GB and provides more power
efficiency than 2D NAND, with the aim of replacing a conventional IDE hard disk drive. With exquisite
size and robust metal housing, UV110-UFD1 prevents mechanical interference and enhances
environment and ESD protection.
UV110-UFD1 is a new generation USB flash drive compatible with the latest USB specification – USB
3.1 Gen1 Super Speed, with a maximum transfer rate of 5 Gb/s. The connector is backward
compatible with USB 2.0 and USB 1.1 interfaces. With compliance with USB 3.1 specification, this
USB drive can deliver up to 260 MB/s outstanding performance.
Reliability wise, UV110-UFD1 is implemented with LDPC (Low Density Parity Check) ECC engine to
extend SSD endurance and increase data reliability while reading raw data inside a flash chip. In
addition, the drive comes with various implementations including powerful hardware ECC engine,
wear leveling, flash block management, S.M.A.R.T., page mapping etc. This product is well suited for
portable flash storage applications while operating at minimal power consumption.
2. Functional Block
With embedded firmware, Apacer’s UV110-UFD1 contains a controller and flash media with a female
connector. It interfaces with the host system allowing data to be written to and read from the flash
media.
Figure 2-1 Functional Block Diagram
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© 2021 Apacer Technology Inc.
3. Product Specifications
3.1 Capacity
Capacity specifications of UV110-UFD1 are available as shown in Table 3-1.
Table 3-1 Capacity Specifications
Capacity
Total bytes*
Total LBA
16 GB
15,557,361,664
30,385,472
32 GB
31,039,324,160
60,623,680
64 GB
62,018,519,040
121,129,920
128 GB
123,936,440,320
242,063,360
256 GB
248,074,076,160
484,519,680
*Display of total bytes varies from file systems, which means not all of the bytes can be used for storage.
**Notes: 1 GB = 1,000,000,000 bytes; 1 sector = 512 bytes.
LBA count addressed in the table above indicates total user storage capacity and will remain the same throughout the lifespan of
the device. However, the total usable capacity of the SSD is most likely to be less than the total physical capacity because a
small portion of the capacity is reserved for device maintenance usages.
3.2 Performance
Performance of UV110-UFD1 is listed below in Table 3-2.
Table 3-2 Performance Specifications
Capacity
16 GB
32 GB
64 GB
128 GB
256 GB
Sequential Read* (MB/s)
245
250
255
260
255
Sequential Write* (MB/s)
38
44
90
125
125
Random Read IOPS** (4K)
2,400
2,500
2,400
2,400
2,400
Random Write IOPS** (4K)
400
400
600
700
600
Performance
Note:
Results may differ from various flash configurations or host system setting, and the above test results are based on the default
file structure with FAT 32 file system.
*Sequential performance is based on CrystalDiskMark 5.2.1 with file size 1,000MB.
**Random performance measured using IOMeter with Queue Depth 32.
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© 2021 Apacer Technology Inc.
3.3 Environmental Specifications
Environmental specifications of UV110-UFD1 product are shown in Table 3-3.
Table 3-3 Environmental Specifications
Item
Specifications
Operating temp.
0°C to 70°C (Standard); -40°C to 85°C (Wide)
Non-operating temp.
-55°C to 100°C
Operating vibration
7.69 GRMS, 20~2000 Hz/random (compliant with MIL-STD-810G)
Non-operating vibration
4.02 GRMS, 15~2000 Hz/sine (compliant with MIL-STD-810G)
Operating shock
50G, 11ms/half sine (compliant with MIL-STD-202G)
Non-operating shock
1500G, 0.5ms/half sine (compliant with MIL-STD-883K)
Note: This Environmental Specification table indicates the conditions for testing the device. Real world usages may affect the
results.
3.4 Mean Time Between Failures (MTBF)
Mean Time Between Failures (MTBF) is predicted based on reliability data for the individual
components in Apacer’s USB flash drive. Serving as statistical reference, the prediction result for
Apacer’s UV110-UFD1 is more than 3,000,000 hours.
Note: The MTBF is predicated and calculated based on “Telcordia Technologies Special Report, SR332, Issue 3” method.
3.5 Certification and Compliance
UV110-UFD1 complies with the following standards:
CE
FCC
RoHS Recast Compliant
MIL-STD-810
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© 2021 Apacer Technology Inc.
3.6 Endurance
The endurance of a storage device is predicted by Drive Writes Per Day based on several factors
related to usage, such as the amount of data written into the drive, block management conditions, and
daily workload for the drive. Thus, key factors, such as Write Amplifications and the number of P/E
cycles, can influence the lifespan of the drive.
Table 3-4 Endurance Specifications
Capacity
Drive Writes Per Day
16 GB
4.07
32 GB
4.11
64 GB
4.11
128 GB
4.11
256 GB
4.11
Note:
This estimation values are based on sequential write behavior.
(Apacer EDTestTool, test mode – sequential data pattern -100.00% of disk space with 128K)
Flash vendor guaranteed 3D NAND TLC P/E cycle: 3K
WAF may vary from capacity, flash configurations and writing behavior on each platform.
1 Terabyte = 1,024GB
DWPD (Drive Write s Per Day) is calculated based on the number of times that user overwrites
the entire capacity of an SSD per day of its lifetime during the warranty period.
3.7 LED Indicator Behavior
The behavior of the UV110-UFD1 LED indicators is described in Table 3-5.
Table 3-5 LED Behavior
Location
LED Color
Description
As indicated by the
red marker below
Blue
LED blinks when the drive is being accessed such as power on, read
or write. The blink frequency is 50ms switch H to L and loop.
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© 2021 Apacer Technology Inc.
4. Flash Management
4.1 Performance-optimized USB Controller
The heart of UV110-UFD1 is the USB controller, which translates standard USB signals into the data
and controls of the flash media. This proprietary USB controller is specifically designed to attain high
data throughput from host to flash.
4.2 Power Saving Implemented
The internal controller of the USB model is designed with power saving implementations, allowing the
device to operate at low power consumption.
4.3 Program RAM Architect
The internal Program RAM implementation allows the host to upgrade firmware codes anytime when
needed.
4.4 Error Correction/Detection (ECC)
UV110-UFD1 implements a hardware ECC scheme, based on the Low Density Parity Check (LDPC).
LDPC is a class of linear block error correcting code which has apparent coding gain over BCH code
because LDPC code includes both hard decoding and soft decoding algorithms. With the error rate
decreasing, LDPC can extend SSD endurance and increase data reliability while reading raw data
inside a flash chip.
4.5 Global Wear Leveling
Flash memory can be erased a limited number of times, This number is called the erase cycle limit, or
write endurance limit, The erase cycle limit applies to each individual erase block in the flash device.
In a typical application, and especially if a file system is used, specific pages are constantly updated
(e.g., the page that contains the FAT, registry, etc.). Without any special handling, these pages would
wear out more rapidly than other pages, reducing the lifetime of the entire flash.
To overcome this inherent deficiency, Apacer’s UV110-UFD1 uses Global Wear Leveling algorithm.
This algorithm ensures that consecutive writes of a specific sector are not written physically to the
same page in the flash. This spreads flash media usage evenly across all pages, thereby maximizing
flash lifetime.
The Global Wear Leveling mechanism provides write/erase cycles for reliable data storage over an
extended period.
4.6 S.M.A.R.T.
S.M.A.R.T. is an abbreviation for Self-Monitoring, Analysis and Reporting Technology, a selfmonitoring system that provides indicators of drive health as well as potential disk problems. It serves
as a warning for users from unscheduled downtime by monitoring and displaying critical drive
information. Ideally, this should allow taking proactive actions to prevent drive failure and make use of
S.M.A.R.T. information for future product development reference.
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© 2021 Apacer Technology Inc.
4.7 Power Failure Management
Power Failure Management plays a crucial role when power supply becomes unstable. Power
disruption may occur when users are storing data into the SSD, leading to instability in the drive.
However, with Power Failure Management, a firmware protection mechanism will be activated to scan
pages and blocks once power is resumed. Valid data will be transferred to new blocks for merging
and the mapping table will be rebuilt. Therefore, data reliability can be reinforced, preventing damage
to data stored in the NAND Flash.
4.8 Bad Block Management
Current production technology is unable to guarantee total reliability of NAND flash memory array.
When a flash memory device leaves factory, it comes with a minimal number of initial bad blocks
during production or out-of-factory as there is no currently known technology that produce flash chips
free of bad blocks. In addition, bad blocks may develop during program/erase cycles. Since bad
blocks are inevitable, the solution is to keep them in control. Apacer flash devices are programmed
with ECC, page mapping technique and S.M.A.R.T to reduce invalidity or error. Once bad blocks are
detected, data in those blocks will be transferred to free blocks and error will be corrected by
designated algorithms.
4.9 Flash Translation Layer – Page Mapping
Page mapping is an advanced flash management technology whose essence lies in the ability to
gather data, distribute the data into flash pages automatically, and then schedule the data to be
evenly written. Page-level mapping uses one page as the unit of mapping. The most important
characteristic is that each logical page can be mapped to any physical page on the flash memory
device. This mapping algorithm allows different sizes of data to be written to a block as if the data is
written to a data pool and it does not need to take extra operations to process a write command. Thus,
page mapping is adopted to increase random access speed and improve SSD lifespan, reduce block
erase frequency, and achieve optimized performance and lifespan.
4.10 Hyper Cache Technology
Apacer proprietary Hyper Cache technology uses a portion of the available capacity as SLC (1bit-percell) NAND flash memory, called Hyper cache mode. When data is written to SSD, the firmware will
direct the data to Hyper Cache mode, providing excellent performance to handle various scenarios in
industrial use.
4.11 SMART Read RefreshTM
Apacer’s SMART Read Refresh plays a proactive role in avoiding read disturb errors from occurring to
ensure health status of all blocks of NAND flash. Developed for read-intensive applications in
particular, SMART Read Refresh is employed to make sure that during read operations, when the
read operation threshold is reached, the data is refreshed by re-writing it to a different block for
subsequent use.
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© 2021 Apacer Technology Inc.
5. Electrical Specifications
5.1 Absolute Stress Rating
Table 5-1 lists the absolute stress rating for UV110-UFD1.
Caution: Absolute Maximum Stress Ratings – Applied conditions greater than those listed under
“Absolute Maximum Stress Ratings” may cause permanent damage to the device. This is a stress
rating only and functional operation of the device at these conditions or conditions greater than those
defined in the operational sections of this data sheet is not implied. Exposure to absolute maximum
stress rating conditions may affect device reliability.
Table 5-1 Absolute Stress Rating
Item
Range
Required power supply
5V ± 5% (4.75-5.25V)
5.2 Absolute Maximum Rating
Table 5-2 lists the absolute maximum power ratings for UV110-UFD1.
Table 5-2 Absolute Maximum Power Ratings
Parameter
Min
Typ
Max
Unit
Operating Temperature (Commercial)
0
+25
+70
°C
Storage Temperature (Commercial)
-25
+25
+85
°C
Operating Temperature (Industrial)
-40
+25
+85
°C
Storage Temperature (Industrial)
-50
+25
+125
°C
1.1V Regulator Power Supply
1.04
1.12
1.20
V
1.8V Regulator Power Supply
1.76
1.86
2.0
V
3.3V Regulator Power Supply
3.15
3.3
3.45
V
5.0V Regulator Power Supply
3.0
5.0
5.5
V
2.5V Regulator Power Supply
2.35
2.5
2.7
V
1.2V Regulator Power Supply
1.13
1.2
1.3
V
5.3 Power Consumption
Table 5-3 lists the power consumption for UV110-UFD1.
Table 5-3 Power Consumption
Capacity
16 GB
32 GB
64 GB
128 GB
256 GB
Active (mA)
175
170
185
195
190
Idle (mA)
80
75
80
75
80
Mode
Note:
*All values are typical and may vary depending on flash configurations or host system settings.
**Active power is an average power measurement performed using CrystalDiskMark with 128KB sequential read/write transfers.
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© 2021 Apacer Technology Inc.
6. Physical Characteristics
Length
Width
Height
46.85mm
17.2mm
7.7mm
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© 2021 Apacer Technology Inc.
7. Product Ordering Information
7.1 Product Code Designations
1
2
3
A
N
2
4
5
6
7
8
9
10
11
12
13
14
15
16
1
1
2
X
X
G
.
X
X
X
1
8
Code
.
Code 1-3
(Product Line & Form Factor)
Code 5-6
(Model/Solution)
Code 7-8
(Product Capacity)
Code 9
(Flash Type & Product Temp)
Code 10
(Product Spec)
Code 12-14
(Version Number)
Code 15-16
(Firmware Version)
USB+UFD1
UV110-UFD1
2E: 16GB
2F: 32GB
2G: 64GB
2H: 128GB
2J: 256GB
G: 3D TLC Standard temperature
H: 3D TLC Wide temperature
UV110-UFD1 sliver-gray housing
Random numbers generated by system
UFPA3ABA
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© 2021 Apacer Technology Inc.
7.2 Valid Combinations
Capacity
Standard Temperature
Wide Temperature
16GB
AN2.112EGG.00118
N/A
32GB
AN2.112FGG.00118
AN2.112FHG.00118
64GB
AN2.112GGG.00118
AN2.112GHG.00118
128GB
AN2.112HGG.00118
AN2.112HHG.00118
256GB
AN2.112JGG.00118
AN2.112JHG.00118
Note: Valid combinations are those products in mass production or will be in mass production.
Consult your Apacer sales representative to confirm availability of valid combinations and to
determine availability of new combinations.
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© 2021 Apacer Technology Inc.
Revision History
Revision
Description
Date
0.1
Preliminary release
6/26/2019
1.0
Official release
10/14/2019
1.1
Updated total bytes and max LBA at 3.1 Capacity
11/21/2019
- Updated Performance on Specifications Overview page and
3.2 Performance
1.2
- Updated Power Consumption on Specifications Overview page
and 5.3 Power Consumption
2/4/2020
- Updated 7. Product Ordering Information due to FW change
1.3
- Updated storage temperature from -40°C to 100°C to -55°C to
100°C
3/16/2020
- Updated the product photo at 3.7 LED Indicator Behavior
1.4
- Changed MTBF from >1,000,000 hours to >3,000,000 hours
- Updated Table 3-1 by changing max LBA to total LBA
6/3/2020
- Updated Performance, Endurance on Power Consumption on
Specifications Overview page
1.5
- Updated Table 3-4, 4-1 and 5-3
8/24/2020
- Updated the description of 4.8 Bad Block Management
1.6
Updated 7.1 Product Code Designations by changing the
description of code 5-6 to UV110-UFD1
3/19/2021
1.7
Updated Endurance on Specifications Overview page and Table
3-4
12/27/2021
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© 2021 Apacer Technology Inc.
Global Presence
Taiwan (Headquarters)
U.S.A.
Apacer Technology Inc.
1F., No.32, Zhongcheng Rd., Tucheng Dist.,
New Taipei City 236, Taiwan R.O.C.
Tel: 886-2-2267-8000
Fax: 886-2-2267-2261
amtsales@apacer.com
Apacer Memory America, Inc.
46732 Lakeview Blvd., Fremont, CA 94538
Tel: 1-408-518-8699
Fax: 1-510-249-9551
sa@apacerus.com
Japan
Europe
Apacer Technology Corp.
6F, Daiyontamachi Bldg., 2-17-12, Shibaura, Minato-Ku,
Tokyo, 108-0023, Japan
Tel: 81-3-5419-2668
Fax: 81-3-5419-0018
jpservices@apacer.com
Apacer Technology B.V.
Science Park Eindhoven 5051 5692 EB Son,
The Netherlands
Tel: 31-40-267-0000
Fax: 31-40-290-0686
sales@apacer.nl
China
India
Apacer Electronic (Shanghai) Co., Ltd
Room D, 22/FL, No.2, Lane 600, JieyunPlaza,
Tianshan RD, Shanghai, 200051, China
Tel: 86-21-6228-9939
Fax: 86-21-6228-9936
sales@apacer.com.cn
Apacer Technologies Pvt Ltd,
1874, South End C Cross, 9th Block Jayanagar,
Bangalore-560069, India
Tel: 91-80-4152-9061/62
Fax: 91-80-4170-0215
sales_india@apacer.com
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