RoHS Recast Compliant
USB Flash Drive
UV110-UFD7 BiCS5 Product Specifications
December 8, 2022
Version 1.1
Apacer Technology Inc.
1F, No.32, Zhongcheng Rd., Tucheng Dist., New Taipei City, Taiwan, R.O.C
Tel: +886-2-2267-8000
www.apacer.com
Fax: +886-2-2267-2261
Specifications Overview:
USB 3.2 Gen1 Super Speed compatible,
and backward compatible with USB 2.0 &
USB 1.1 interfaces
–
USB 3.2 Gen1 max. transfer rate: 5 Gb/s
–
Backward compatible with 480Mb/s for
USB 2.0 & 12 Mb/s for USB 1.1
Temperature Range
–
Wide: -40°C to 85°C
–
Storage: -55°C to 100°C
Supply Voltage
–
128, 256 GB
Performance1
Operating:
Standard: 0°C to 70°C
Capacity
–
5.0 V ± 5%
Power Consumption1
–
Sequential read: Up to 270 MB/sec
–
Active mode (Max.): 215 mA
–
Sequential write: Up to 190 MB/sec
–
Idle mode: 85 mA
–
Random read (4K): Up to 2,800 IOPS
–
Random write (4K): Up to 1,000 IOPS
Supports Non-Removable Setting
Supports Toggle 2.0 mode/ONFI 3.0
OS Support
Flash Management
–
Built-in hardware Low Density ParityCheck (LDPC) ECC
–
Windows: Win7/8/10 later
–
Global Wear Leveling
–
Mac: 10.2.8/10.8 or later
–
Flash bad-block management
–
Linux: 2.4.0/2.4.10 or later
–
Flash Translation Layer: Page Mapping
–
Power Failure Management
–
S.M.A.R.T.
–
SMART Read RefreshTM
–
NAND Flash Type: 3D TLC (BiCS5)
MTBF: >3,000,000 hours
Endurance (in drive writes per day: DWPD)
–
128 GB: 2.74 DWPD
–
256 GB: 2.74 DWPD
Connector
Type-C
Dimensions
–
43.00 x 18.90 x 7.90, unit: mm
–
Net weight: 5.3g ± 5%
RoHS Recast Compliant
–
Complies with 2011/65/EU Standard
Note:
1. Varies from capacities. The values for performances and power consumptions presented are typical and may vary
depending on flash configurations or platform settings. The term idle refers to the standby state of the device.
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© 2022 Apacer Technology Inc.
Table of Contents
1. General Description ..........................................................................3
2. Functional Block ...............................................................................3
3. Product Specifications ......................................................................4
3.1 Capacity ......................................................................................................................................... 4
3.2 Performance .................................................................................................................................. 4
3.3 Environmental Specifications ........................................................................................................ 4
3.4 Mean Time Between Failures (MTBF) .......................................................................................... 5
3.5 Certification and Compliance......................................................................................................... 5
3.6 Endurance ..................................................................................................................................... 5
4. Flash Management ............................................................................6
4.1 Performance-optimized USB Controller ........................................................................................ 6
4.2 Power Saving Implemented........................................................................................................... 6
4.3 Program RAM Architect ................................................................................................................. 6
4.4 Error Correction/Detection (ECC) .................................................................................................. 6
4.5 Global Wear Leveling .................................................................................................................... 6
4.6 S.M.A.R.T. ..................................................................................................................................... 7
4.7 Power Failure Management .......................................................................................................... 7
4.8 Bad Block Management ................................................................................................................ 7
4.9 Flash Translation Layer – Page Mapping...................................................................................... 7
4.10 SMART Read RefreshTM ............................................................................................................. 8
5. Electrical Specifications...................................................................9
5.1 Absolute Stress Rating .................................................................................................................. 9
5.2 Absolute Maximum Rating............................................................................................................. 9
5.3 Power Consumption ...................................................................................................................... 9
6. Mechanical Specifications..............................................................10
6.1 Dimensions .................................................................................................................................. 10
6.2 Net Weight ................................................................................................................................... 10
7. Product Ordering Information .........................................................11
7.1 Product Code Designations ......................................................................................................... 11
7.2 Valid Combinations ...................................................................................................................... 12
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© 2022 Apacer Technology Inc.
1. General Description
Apacer UV110-UFD7 is a new USB flash drive with Type-C connector applied for industry. It is
compatible with the latest USB specification – USB 3.2 Gen1 Super Speed, with a maximum transfer
rate of 5 Gb/s. The connector is backward compatible with USB 2.0 and USB 1.1 interfaces. With
compliance with USB 3.2 specification, this USB drive can deliver up to 270 MB/s outstanding
performance and operate at minimal power consumption.
Utilizing 3D NAND for higher capacity up to 256GB and providing more power efficiency than 2D
NAND, UV110-UFD7 is designed to replace a conventional IDE hard disk drive. The USB is
implemented with LDPC (Low Density Parity Check) ECC engine to extend SSD endurance and
increase data reliability. In addition, the USB adopts the latest page mapping file translation layer and
comes with various implementations including powerful hardware ECC engine, wear leveling, flash
block management, S.M.A.R.T., power failure management and SMART Read RefreshTM.
With compact size, slim and sleek Type-C connector tailored to fit mobile device designs, UV110UFD7 is well suited for a wide variety of new generation products with USB-C connector. It has also
been put through all rigorous tests to prove that it is a perfect match for industrial-grade products.
2. Functional Block
With embedded firmware, Apacer’s UV110-UFD7 contains a controller and flash media with a female
connector. It interfaces with the host system allowing data to be written to and read from the flash
media.
Figure 2-1 Functional Block Diagram
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3. Product Specifications
3.1 Capacity
Capacity specifications of UV110-UFD7 are available as shown in Table 3-1.
Table 3-1 Capacity Specifications
Capacity
Total bytes
Total LBA
128 GB
123,924,905,984
242,040,832
256 GB
247,895,949,312
484,171,776
Notes:
Display of total bytes varies from operating systems.
1 GB = 1,000,000,000 bytes; 1 sector = 512 bytes.
LBA count addressed in the table above indicates total user storage capacity and will remain the same throughout the
lifespan of the device. However, the total usable capacity of the SSD is most likely to be less than the total physical
capacity because a small portion of the capacity is reserved for device maintenance usages.
3.2 Performance
Performance of UV110-UFD7 is listed below in Table 3-2.
Table 3-2 Performance Specifications
Capacity
128 GB
256 GB
Sequential Read (MB/s)
260
270
Sequential Write (MB/s)
155
190
Random Read IOPS (4K)
2,700
2,800
Random Write IOPS (4K)
700
1,000
Performance
Notes:
Results may differ from various flash configurations or host system setting, and the above test results are based on the
default file structure with FAT 32 file system.
Sequential read/write is based on CrystalDiskMark 8.0.4 with file size 1,000MB.
Random read/write is measured using IOMeter with Queue Depth 32.
3.3 Environmental Specifications
Environmental specifications of UV110-UFD7 product are shown in Table 3-3.
Table 3-3 Environmental Specifications
Item
Specifications
Operating temp.
0°C to 70°C (Standard); -40°C to 85°C (Wide)
Non-operating temp.
-55°C to 100°C
Operating vibration
7.69 GRMS, 20~2000 Hz/random (compliant with MIL-STD-810G)
Non-operating vibration
4.02 GRMS, 15~2000 Hz/sine (compliant with MIL-STD-810G)
Operating shock
50G, 11ms/half sine (compliant with MIL-STD-202G)
Non-operating shock
1500G, 0.5ms/half sine (compliant with MIL-STD-883K)
Note: This Environmental Specification table indicates the conditions for testing the device. Real world usages may affect the
results.
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© 2022 Apacer Technology Inc.
3.4 Mean Time Between Failures (MTBF)
Mean Time Between Failures (MTBF) is predicted based on reliability data for the individual
components in Apacer’s USB flash drive. Serving as statistical reference, the prediction result for
Apacer’s UV110-UFD7 is more than 3,000,000 hours.
Note: The MTBF is predicated and calculated based on “Telcordia Technologies Special Report, SR-332, Issue
3” method.
3.5 Certification and Compliance
UV110-UFD7 complies with the following standards:
CE
UKCA
FCC
RoHS Recast Compliant
MIL-STD-810G
3.6 Endurance
The endurance of a storage device is predicted by Drive Writes Per Day based on several factors
related to usage, such as the amount of data written into the drive, block management conditions, and
daily workload for the drive. Thus, key factors, such as Write Amplifications and the number of P/E
cycles, can influence the lifespan of the drive.
Table 3-4 Endurance Specifications
Capacity
Drive Writes Per Day
128 GB
2.74
256 GB
2.74
Notes:
This estimation values are based on sequential write behavior.
(Apacer EDTestTool, test mode –sequential data pattern -100.00% of disk space with 128K)
Flash vendor guaranteed 3D NAND TLC P/E cycle: 3K
WAF may vary from capacity, flash configurations and writing behavior on each platform.
1 Terabyte = 1,024GB
DWPD (Drive Write s Per Day) is calculated based on the number of times that user overwrites the entire capacity of an
SSD per day of its lifetime during the warranty period. (3D NAND TLC warranty: 3 years)
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© 2022 Apacer Technology Inc.
4. Flash Management
4.1 Performance-optimized USB Controller
The heart of UV110-UFD7 is the USB controller, which translates standard USB signals into the data
and controls of the flash media. This proprietary USB controller is specifically designed to attain high
data throughput from host to flash.
4.2 Power Saving Implemented
The internal controller of the USB model is designed with power saving implementations, allowing the
device to operate at low power consumption.
4.3 Program RAM Architect
The internal Program RAM implementation allows the host to upgrade firmware codes anytime when
needed.
4.4 Error Correction/Detection (ECC)
UV110-UFD7 implements a hardware ECC scheme, based on the Low Density Parity Check (LDPC).
LDPC is a class of linear block error correcting code which has apparent coding gain over BCH code
because LDPC code includes both hard decoding and soft decoding algorithms. With the error rate
decreasing, LDPC can extend SSD endurance and increase data reliability while reading raw data
inside a flash chip.
4.5 Global Wear Leveling
Flash memory can be erased a limited number of times, This number is called the erase cycle limit, or
write endurance limit, The erase cycle limit applies to each individual erase block in the flash device.
In a typical application, and especially if a file system is used, specific pages are constantly updated
(e.g., the page that contains the FAT, registry, etc.). Without any special handling, these pages would
wear out more rapidly than other pages, reducing the lifetime of the entire flash.
To overcome this inherent deficiency, Apacer’s UV110-UFD7 uses Global Wear Leveling algorithm.
This algorithm ensures that consecutive writes of a specific sector are not written physically to the
same page in the flash. This spreads flash media usage evenly across all pages, thereby maximizing
flash lifetime.
The Global Wear Leveling mechanism provides write/erase cycles for reliable data storage over an
extended period.
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© 2022 Apacer Technology Inc.
4.6 S.M.A.R.T.
S.M.A.R.T. is an abbreviation for Self-Monitoring, Analysis and Reporting Technology, a selfmonitoring system that provides indicators of drive health as well as potential disk problems. It serves
as a warning for users from unscheduled downtime by monitoring and displaying critical drive
information. Ideally, this should allow taking proactive actions to prevent drive failure and make use of
S.M.A.R.T. information for future product development reference.
Table 4-1 SMART Attribute ID List
ID (Hex)
Attribute Name
162 (0xA2)
Spare Block Count
163 (0xA3)
Maximum Erase Count
164 (0xA4)
Average Erase Count
166 (0xA6)
Total Later Bad Block Count
167 (0xA7)
Protect Mode
4.7 Power Failure Management
Power Failure Management plays a crucial role when power supply becomes unstable. Power
disruption may occur when users are storing data into the SSD, leading to instability in the drive.
However, with Power Failure Management, a firmware protection mechanism will be activated to scan
pages and blocks once power is resumed. Valid data will be transferred to new blocks for merging
and the mapping table will be rebuilt. Therefore, data reliability can be reinforced, preventing damage
to data stored in the NAND Flash.
4.8 Bad Block Management
Current production technology is unable to guarantee total reliability of NAND flash memory array.
When a flash memory device leaves factory, it comes with a minimal number of initial bad blocks
during production or out-of-factory as there is no currently known technology that produce flash chips
free of bad blocks. In addition, bad blocks may develop during program/erase cycles. Since bad
blocks are inevitable, the solution is to keep them in control. Apacer flash devices are programmed
with ECC, page mapping technique and S.M.A.R.T to reduce invalidity or error. Once bad blocks are
detected, data in those blocks will be transferred to free blocks and error will be corrected by
designated algorithms.
4.9 Flash Translation Layer – Page Mapping
Page mapping is an advanced flash management technology whose essence lies in the ability to
gather data, distribute the data into flash pages automatically, and then schedule the data to be
evenly written. Page-level mapping uses one page as the unit of mapping. The most important
characteristic is that each logical page can be mapped to any physical page on the flash memory
device. This mapping algorithm allows different sizes of data to be written to a block as if the data is
written to a data pool and it does not need to take extra operations to process a write command. Thus,
page mapping is adopted to increase random access speed and improve SSD lifespan, reduce block
erase frequency, and achieve optimized performance and lifespan.
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© 2022 Apacer Technology Inc.
4.10 SMART Read RefreshTM
Apacer’s SMART Read Refresh plays a proactive role in avoiding read disturb errors from occurring to
ensure health status of all blocks of NAND flash. Developed for read-intensive applications in
particular, SMART Read Refresh is employed to make sure that during read operations, when the
read operation threshold is reached, the data is refreshed by re-writing it to a different block for
subsequent use.
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© 2022 Apacer Technology Inc.
5. Electrical Specifications
5.1 Absolute Stress Rating
Table 5-1 lists the absolute stress rating for UV110-UFD7.
Caution: Absolute Maximum Stress Ratings – Applied conditions greater than those listed under
“Absolute Maximum Stress Ratings” may cause permanent damage to the device. This is a stress
rating only and functional operation of the device at these conditions or conditions greater than those
defined in the operational sections of this data sheet is not implied. Exposure to absolute maximum
stress rating conditions may affect device reliability.
Table 5-1 Absolute Stress Rating
Item
Range
Required power supply
5V ± 5% (4.75-5.25V)
5.2 Absolute Maximum Rating
Table 5-2 lists the absolute maximum power ratings for UV110-UFD7.
Table 5-2 Absolute Maximum Power Ratings
Parameter
Min
Typ
Max
Unit
Operating Temperature (Commercial)
0
+25
+70
°C
Storage Temperature (Commercial)
-25
+25
+85
°C
Operating Temperature (Industrial)
-40
+25
+85
°C
Storage Temperature (Industrial)
-50
+25
+125
°C
1.1V Regulator Power Supply
1.04
1.12
1.20
V
1.8V Regulator Power Supply
1.76
1.86
2.0
V
3.3V Regulator Power Supply
3.15
3.3
3.45
V
5.0V Regulator Power Supply
3.0
5.0
5.5
V
2.5V Regulator Power Supply
2.35
2.5
2.7
V
1.2V Regulator Power Supply
1.13
1.2
1.3
V
5.3 Power Consumption
Table 5-3 lists the power consumption for UV110-UFD7.
Table 5-3 Power Consumption (Unit: mA)
Capacity
128 GB
256 GB
Active (Max.)
190
215
Idle
85
85
Mode
Notes:
All values are typical and may vary depending on flash configurations or host system settings.
Power consumption is measured using CrystalDiskMark 8.0.4.
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© 2022 Apacer Technology Inc.
6. Mechanical Specifications
6.1 Dimensions
Table 6-1 Dimensions
Length
Width
Height
43.00mm
18.90mm
7.90mm
Figure 6-1 Physical Dimensions
6.2 Net Weight
Table 6-2 Net Weight
Capacity
Net Weight (g ± 5%)
128GB
5.3
256GB
5.3
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© 2022 Apacer Technology Inc.
7. Product Ordering Information
7.1 Product Code Designations
Apacer’s UV110-UFD7 USB is available in different configurations and densities. See the chart below
for a comprehensive list of options for the UV110-UFD7 series devices.
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
A
N
2
.
1
1
2
X
X
U
.
X
X
X
2
2
Code
Code 1-3
(Product Line & Form Factor)
Code 5-6
(Model/Solution)
Code 7-8
(Product Capacity)
USB+UFD7
UV110-UFD7
2H: 128GB
2J: 256GB
Code 9
(Flash Type & Product Temp)
Code 10
(Product Spec)
Code 12-14
(Version Number)
Code 15-16
(Firmware Version)
G: 3D TLC Standard temperature
H: 3D TLC Wide temperature
UV110-UFD7 black housing
Random numbers generated by system
UFPA3ADA
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© 2022 Apacer Technology Inc.
7.2 Valid Combinations
The following table lists the available models of the UV110-UFD7 series which are in mass production
or will be in mass production. Consult your Apacer sales representative to confirm availability of valid
combinations and to determine availability of new combinations.
Capacity
Standard Temperature
Wide Temperature
128GB
AN2.112HGU.00122
AN2.112HHU.00122
256GB
AN2.112JGU.00122
AN2.112JHU.00122
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© 2022 Apacer Technology Inc.
Revision History
Revision
Description
Date
1.0
Initial release
11/3/2022
1.1
Added UKCA to 3.5 Certification and Compliance
12/8/2022
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© 2022 Apacer Technology Inc.
Global Presence
Taiwan (Headquarters)
U.S.A.
Apacer Technology Inc.
1F., No.32, Zhongcheng Rd., Tucheng Dist.,
New Taipei City 236, Taiwan R.O.C.
Tel: 886-2-2267-8000
Fax: 886-2-2267-2261
amtsales@apacer.com
Apacer Memory America, Inc.
46732 Lakeview Blvd., Fremont, CA 94538
Tel: 1-408-518-8699
Fax: 1-510-249-9551
sa@apacerus.com
Japan
Europe
Apacer Technology Corp.
6F, Daiyontamachi Bldg., 2-17-12, Shibaura, Minato-Ku,
Tokyo, 108-0023, Japan
Tel: 81-3-5419-2668
Fax: 81-3-5419-0018
jpservices@apacer.com
Apacer Technology B.V.
Science Park Eindhoven 5051 5692 EB Son,
The Netherlands
Tel: 31-40-267-0000
Fax: 31-40-290-0686
sales@apacer.nl
China
India
Apacer Electronic (Shanghai) Co., Ltd
Room D, 22/FL, No.2, Lane 600, JieyunPlaza,
Tianshan RD, Shanghai, 200051, China
Tel: 86-21-6228-9939
Fax: 86-21-6228-9936
sales@apacer.com.cn
Apacer Technologies Pvt Ltd,
1874, South End C Cross, 9th Block Jayanagar,
Bangalore-560069, India
Tel: 91-80-4152-9061/62
Fax: 91-80-4170-0215
sales_india@apacer.com
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