1206B471K102DC

PART CODE: 1206B471K102DC SPECIFICATION SHEET SPECIFICATION SHEET NO. N1105- 1206B471K102DC DATE Nov. 05, 2021 REVISION A0 DESCRIPITION Multilayer Ceramic Chip Capacitors 1206 (3216 Metric) Series, L3.20*W1.60*H1.60mm, Dielectric X7R, Capacitance 470pF, Tolerance ±10%, Rated Voltage 1000V Operating Temp. Range -55°C ~+125°C Package in Tape/Reel, 3,000pcs/Reel RoHS/RoHS III compliant CUSTOMER CUSTOMER PART NUMBER CROSS REF. PART NUMBER ORIGINAL PART NUMBER Aillen 1206B471K102DC PART CODE 1206B471K102DC VENDOR APPROVE Issued/Checked/Approved DATE: Nov. 05, 2021 CUSTOMER APPROVE DATE: 1 NextGen Components, Inc. sales@NextGenComponent.com www.NextGenComponent.com 1206B471K102DC PART CODE: MULTILAYER CERAMIC CHIP CAPACITORS 1206 SERIES MAIN FEATURE • RoHS III Compliant • Wide Operating Temperature Range -55~+125℃ • High Capacitance in small size • Small size L3.20*W1.60*H1.60mm APPLICATION • General Digital Circuit • Power Supply by pass capacitors • Consumer Electronics • Telecommunication RFQ PART CODE GUIDE Request For Quotation 1206 B 471 K 102 D C 1 2 3 4 5 6 7 1) 1206: Series code for Multilayer Ceramic Chip Capacitors, Dimension L3.20*W1.60*H1.60mm, 1206(3216 Metric) Series 2) B: Dielectric code X7R 3) 471: Capacitance Code, Two significant digits followed by number of Zero, The 3rd digit signifies the multiplying factor, and letter R is decimal point, Example: 471 = 471pF 4) K: Capacitance Tolerance code, B: +/-0.1pF; C: +/-0.25pF; K: +/-10% 5) 102: Rated Voltage Code: Two significant digits followed by number of Zero and letter R is decimal point, 102= 1000 VDC 6) D: Thickness code, 1.60+/-0.20mm 7) C: Tape/Reel code, Packed in Tape/Reel. 3,000pcs/Reel 2 NextGen Components, Inc. sales@NextGenComponent.com www.NextGenComponent.com PART CODE: 1206B471K102DC MULTILAYER CERAMIC CHIP CAPACITORS 1206 SERIES DIMENSION (Unit: mm) Marking: Blank Image for reference 1206 Item Dimension L 3.20±0.30 W 1.60±0.30 T 1.60±0.20 MB 0.60±0.20 0.50±0.25 MLCC construction for Reference 3 NextGen Components, Inc. sales@NextGenComponent.com www.NextGenComponent.com PART CODE: 1206B471K102DC MULTILAYER CERAMIC CHIP CAPACITORS 1206 SERIES GENERAL ELECTRONICAL CHARACTERISTICS Item Unit Symbol Characteristic Size 1206 Dimension L3.20*W1.60*H1.60mm, 1206 (3216 Metric) Series Dielectric B X7R Capacitance Range pF 471 470 Capacitance Tolerance % K ±10 Rated Voltage VDC 102 1000 Operating Temperature ℃ -55 ~+125 Capacitance Characteristic % ±15 Termination Condition N1/Sn (Lead- Free) X7R Table 1 Rated Voltage D.F ≤ 1000V 2.5% Exception of D.F. ≤ ≤3% ≥0.47µF ≤5% ≥ 1.0µF 4 NextGen Components, Inc. sales@NextGenComponent.com www.NextGenComponent.com PART CODE: 1206B471K102DC MULTILAYER CERAMIC CHIP CAPACITORS 1206 SERIES RELIABILITY TEST CONDITIONS AND REQUIREMENTS Item Test Condition Requirements Visual and Mechanical - No remarkable defect. Dimensions to conform to individual specification sheet. Capacitance Class II: (X7R) C≦10μF, 1.0±0.2Vrms 1KHz±10% ** C＞10μF, 0.5±0.2Vrms 120Hz±20% * Shall not exceed the limits given in the detailed spec. Q/D.F. (Dissipation Factor) See Table 1 ** Test condition: 0.5±0.2Vrms,1KHz±10% *Before initial measurement (Class II only): To apply de-aging at 150°C for 1hr for 24±2 hrs at room temp. Dielectric Strength * To apply voltage (≤100V) 250%. * Duration: 1 to 5 sec. * Charge and discharge current less than 50mA. No evidence of damage or flash over during test. Insulation Resistance * Preconditioning for Class II MLCC: Perform a heat treatment at 150±10℃ for 1 hour, then leave in ambient condition for 24±2 hours before measurement. To apply rated voltage for max. 120 sec. Class II (X7R) 10GΩ or RxC≥500Ω-F whichever is smaller. With no electrical load, Operating Temp. -55~125°C at 25°C Operating Temperature tolerance: +/-15% Temperature Coefficient R:1GΩ or RxC≥100Ω-F whichever is Smaller *Before initial measurement (Class II only): To apply de-aging at 150℃ for 1hr then set for 24±2 hrs at room temp. *Measurement voltage for Class II: Capacitance < 10µF: 1.0V 5 NextGen Components, Inc. sales@NextGenComponent.com www.NextGenComponent.com PART CODE: 1206B471K102DC MULTILAYER CERAMIC CHIP CAPACITORS 1206 SERIES RELIABILITY TEST CONDITIONS AND REQUIREMENTS Item Test Condition Requirements Adhesive Strength of Termination * Pressurizing force：10N (>0603) * Test time: 10±1 sec. No remarkable damage or removal of the terminations. Vibration Resistance * Vibration frequency: 10~55 Hz/min. * Total amplitude: 1.5mm * Test time: 6 hrs. (Two hrs each in three mutually perpendicular directions.) *Before initial measurement (Class II only): To apply de-aging at 150°C for 1hr then set for 24±2 hrs at room temp. *Cap./DF(Q) Measurement to be made after de-aging a 150°C for 1hr then set for 24±2 hrs at room temp. * No remarkable damage or removal of the terminations. * No remarkable damage. * Cap change and Q/D.F.: To meet initial spec. Solder ability * Solder temperature: 235±5℃ * Dipping time: 2±0.5 sec. 95% min. coverage of all metalized area. Bending Test * The middle part of substrate shall be pressurized by means of the pressurizing rod at a rate of about 1 mm per second until the deflection becomes 1 mm and then the pressure shall be maintained for 5±1 sec. *Before initial measurement (Class II only): To apply de-aging at 150℃ for 1hr then set for 24±2 hrs at room temp. * Measurement to be made after keeping at room temp. for 24±2 hrs. * No remarkable damage. * Cap change: within ±12.5% (This capacitance change means the change of capacitance under specified flexure of substrate from the capacitance measured before the test.) Resistance to Soldering Heat * Solder temperature: 260±5℃ * Dipping time: 10±1 sec * Preheating: 120 to 150°C for 1 minute before immerse the capacitor in a eutectic solder. *Before initial measurement (Class II only): To apply de-aging at 150℃ for 1hr then set for 24±2 hrs at room temp. *Cap. / DF(Q) / I.R. Measurement to be made after de-aging at 150℃ for 1hr then set for 24±2 hrs at room * No remarkable damage. * Cap change: X7R within ±7.5% * Q/D.F., I.R. and dielectric strength: To meet initial requirements. * 25% max. leaching on each edge. 6 NextGen Components, Inc. sales@NextGenComponent.com www.NextGenComponent.com PART CODE: 1206B471K102DC MULTILAYER CERAMIC CHIP CAPACITORS 1206 SERIES RELIABILITY TEST CONDITIONS AND REQUIREMENTS Item Temperature Cycle Test Condition * Conduct the five cycles according to the temperatures and time. Step 1: Time: 30+/-3 Minutes@+0/-3 ℃ Min. Step 2: Time: 2~3 Minutes@+25 ℃ Step 3: Time: 30+/-3 Minutes@+3/-0 ℃ Max. Step 4: Time: 2~3 Minutes@+25 ℃ Requirements * No remarkable damage. * Cap change: X7R: within ±7.5% * Q/D.F., I.R. and dielectric strength: To meet initial requirements. * Before initial measurement (Class II only): Perform150+0/-10℃ for 1 hr and then set for 24±2 hrs at room temp. * Cap. / DF(Q) / I.R. Measurement to be made after de-aging at 150℃ for 1hr then set for 24±2 hrs at room. Humidity (Damp Heat) Steady State * Test temp.: 40±2°C * Humidity: 90~95% RH * Test time: 500+24/-0hrs. *Before initial measurement (Class II only): Perform 150+0/-10°C for 1 hr and then set for 24±2 hrs at room temp. * Cap. / DF(Q) / I.R. Measurement to be made after de-aging at 150°C for 1hr then set for 24±2 hrs at room temp. Humidity (Damp Heat) Load * No remarkable damage. * Cap change: X7R: ≥10V**, within ±12.5 * Q/D.F. value: X7R: See Table 1 *I.R.: ≥10V, 1GΩ or 50 Ω-F whichever is smaller. Class II (X7R): 100V ≥3.3µF, IR: 1GΩ or RxC ≥ 10 Ω-F whichever is smaller. * Test temp.: 40±2°C * Humidity: 90~95%RH * Test time: 500+24/-0 hrs. * To apply voltage： rated voltage. • Before initial measurement (Class * No remarkable damage. Cap change: X7R: ≥10V**within ±12.5% II only): To apply de-aging at 150°C for 1hr then set for 24±2 hrs at room temp. *I.R.: ≥10V, 500MΩ or 25 Ω-F whichever is smaller. Class II (X7R): 100V ≥3.3µF, * Cap. / DF(Q) / I.R. Measurement to be made after de-aging at 150°C for 1hr.then set for 24±2 hrs at room temp Q/D.F. value: X7R: See Table 1 IR: 1GΩ or RxC ≥ 10 Ω-F whichever is smaller. 7 NextGen Components, Inc. sales@NextGenComponent.com www.NextGenComponent.com PART CODE: 1206B471K102DC MULTILAYER CERAMIC CHIP CAPACITORS 1206 SERIES RELIABILITY TEST CONDITIONS AND REQUIREMENTS Item High Temperature Load (Endurance) Test Condition Requirements *Test temp.： X7R: 125±3℃ *Test time: 1000+24/-0 hrs. *To apply voltage: (1) ≤ 6.3V or C 10≥ μF: 150% of rated voltage. (2) 10V≤ Ur