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TLK2211RCPR

TLK2211RCPR

  • 厂商:

    ROCHESTER(罗切斯特)

  • 封装:

    VFQFP64_EP

  • 描述:

    ETHERNET TRANSCEIVER, 1-TRNSVR

  • 数据手册
  • 价格&库存
TLK2211RCPR 数据手册
TLK2211 SLLS873D – MAY 2008 – REVISED AUGUST 2011 www.ti.com ETHERNET TRANSCEIVERS Check for Samples: TLK2211 • 2 • • • • • • • • • Advanced 0.25 μm CMOS Technology No External Filter Capacitors Required Comprehensive Suite of Built-In Testability IEEE 1149.1 JTAG Support 3.3 V Supply Voltage for Lowest Power Operation 3.3 V Tolerant on LVTTL Inputs Hot Plug Protection 64 Pin VQFP With Thermally Enhanced Package ( PowerPAD™) APPLICATIONS • • Gigabit Ethernet Switches and Routers Fibre Channel Storage Systems GNDPLL VDD TXP TXN VDDA VDDA GNDA VDDA JTRSTN JTMS RXP VDDA RXN GNDA • 600 mbps to 1.3 Gigabits Per Second (Gbps) Serializer/Deserializer Low Power Consumption 150 mV, LOS = 1, valid input signal If magnitude of RXP–RXN < 150 mV and >50 mV, LOS is undefined If magnitude of RXP–RXN < 50 mV, LOS = 0, loss of signal TEST I (P/D) Loop enable. When LOOPEN is high (active), the internal loop-back path is activated. The transmitted serial data is directly routed to the inputs of the receiver. This provides a self-test capability in conjunction with the protocol device. The TXP and TXN outputs are held in a high-impedance state during the loop-back test. LOOPEN is held low during standard operational state with external serial outputs and inputs active. LOOPEN 19 TCK 49 I JTDI 48 I (P/D) JTDO 27 O JTRSTN 56 I P/U(2) Reset signal. IEEE1149.1 (JTAG) JTMS 55 I P/U(2) Test mode select. IEEE1149.1 (JTAG) ENABLE 28 I P/U(2) When this terminal is low, the device is disabled for Iddq testing. RD0 - RD9, RBCn, TXP, and TXN are high impedance. The pullup and pulldown resistors on any input are disabled. When ENABLE is high, the device operates normally. PRBSEN 16 I P/D(1) PRBS enable. When PRBSEN is high, the PRBS generation circuitry is enabled. The PRBS verification circuit in the receive side is also enabled. A PRBS signal can be fed to the receive inputs and checked for errors, that are reported by the SYNC/PASS terminal indicating low. TESTEN 17 I P/D(1) Manufacturing test terminal 5, 10, 20, 23, 29, 37, 42, 50, 63 Supply Digital logic power. Provides power for all digital circuitry and digital I/O buffers. 53, 57, 59, 60 Supply Analog power. VDDA provides power for the high-speed analog circuits, receiver, and transmitter. 18 Supply PLL power. Provides power for the PLL circuitry. This terminal requires additional filtering. Test clock. IEEE1149.1 (JTAG) Test data input. IEEE1149.1 (JTAG) Test data output. IEEE1149.1 (JTAG) POWER VDD VDDA VDDPLL GROUND GNDA GND GNDPLL (1) (2) 4 15, 51,58 1, 14, 21, 25, 33, 46 64 Ground Analog ground. GNDA provides a ground for the high-speed analog circuits, RX and TX. Ground Digital logic ground. Provides a ground for the logic circuits and digital I/O buffers. Ground PLL ground. Provides a ground for the PLL circuitry. P/D = Internal pulldown P/U = Internal pullup Copyright © 2008–2011, Texas Instruments Incorporated TLK2211 SLLS873D – MAY 2008 – REVISED AUGUST 2011 www.ti.com DETAILED DESCRIPTION DATA TRANSMISSION This device supports the standard 10-bit interface (TBI) parallel bus. In the TBI mode, the transmitter portion registers incoming 10-bit wide data words (8b/10b encoded data, TD0-TD9) on the rising edge of REFCLK. The REFCLK is also used by the serializer, which multiplies the clock by a factor of 10, providing a signal that is fed to the shift register. The 8b/10b encoded data is transmitted sequentially bit 0 through 9 over the differential high-speed I/O channel. TRANSMISSION LATENCY Data transmission latency is defined as the delay from the initial 10-bit word load to the serial transmission of bit 9. The minimum latency in TBI mode is 19 bit times. The maximum latency in TBI mode is 20 bit times. 10 Bit Code TXP, TXN b9 td(Tx latency) 10 Bit Code TD(0−9) REFCLK Figure 1. Transmitter Latency DATA RECEPTION The receiver portion deserializes the differential serial data. The serial data is retimed based on an interpolated clock generated from the reference clock. The serial data is then aligned to the 10-bit word boundaries and presented to the protocol controller along with receive byte clocks (RBC0, RBC1). RECEIVER CLOCK SELECT MODE There is only one mode of operation for the parallel busses that is the 10-bit (TBI) mode. In TBI mode, the supported clock mode is half-rate clocks on RBC0 and RBC1. Table 1. Table 1. Mode Selection RBCMODE MODE FREQUENCY (TLK2211) 0 TBI half-rate 60–130 MHz In this mode, two receive byte clocks (RBC0 and RBC1) are 180 degrees out of phase and operate at one-half the data rate. The clocks are generated by dividing down the recovered clock. The received data is output with respect to the two receive byte clocks (RBC0, RBC1) allowing a protocol device to clock the parallel bytes using the RBC0 and RBC1 rising edges. The outputs to the protocol device, byte 0 of the received data valid on the rising edge of RBC1. See the timing diagram shown in Figure 2. Copyright © 2008–2011, Texas Instruments Incorporated 5 TLK2211 SLLS873D – MAY 2008 – REVISED AUGUST 2011 www.ti.com td(S) RBC0 td(S) RBC1 td(H) SYNC td(H) RD(0−9) K28.5 DXX.X DXX.X DXX.X K28.5 DXX.X Figure 2. Synchronous Timing Characteristics Waveforms (TBI half-rate mode) The receiver clock interpolator can lock to the incoming data without the need for a lock-to-reference preset. The received serial data rate (RXP and RXN) is at the same baud rate as the transmitted data stream, ±0.02% (200 PPM) for proper operation. RECEIVER WORD ALIGNMENT These devices use the IEEE 802.3 Gigabit Ethernet defined 10-bit K28.5 character (comma character) word alignment scheme. The following sections explain how this scheme works and how it realigns itself. Comma Character on Expected Boundary These devices provide 10-bit K28.5 character recognition and word alignment. The 10-bit word alignment is enabled by forcing the SYNCEN terminal high. This enables the function that examines and compares serial input data to the seven bit synchronization pattern. The K28.5 character is defined by the 8-bit/10-bit coding scheme as a pattern consisting of 0011111010 (a negative number beginning with disparity) with the 7 MSBs (0011111), referred to as the comma character. The K28.5 character was implemented specifically for aligning data words. As long as the K28.5 character falls within the expected 10-bit boundary, the received 10-bit data is properly aligned and data realignment is not required. Figure 2 shows the timing characteristics of RBC0, RBC1, SYNC and RD0-RD9 while synchronized. (Note: the K28.5 character is valid on the rising edge of RBC1). Comma Character Not on Expected Boundary If synchronization is enabled and a K28.5 character straddles the expected 10-bit word boundary, then word realignment is necessary. Realignment or shifting the 10-bit word boundary truncates the character following the misaligned K28.5, but the following K28.5 and all subsequent data is aligned properly as shown in Figure 3. The RBC0 and RBC1 pulse widths are stretched or stalled in their current state during realignment. With this design the maximum stretch that occurs is 20 bit times. This occurs during a worst case scenario when the K28.5 is aligned to the falling edge of RBC1 instead of the rising edge. Figure 3 shows the timing characteristics of the data realignment. 6 Copyright © 2008–2011, Texas Instruments Incorporated TLK2211 SLLS873D – MAY 2008 – REVISED AUGUST 2011 www.ti.com 31 Bit Times Max Receive Path Latency INPUT DATA K28.5 DXX.X 30 Bit Times (Max) K28.5 DXX.X DXX.X DXX.X DXX.X K28.5 RBC0 RBC1 Worst Case Misaligned K28.5 RD(0−9) DXX.X DXX.X Misalignment Corrected Corrupt Data K28.5 DXX.X DXX.X K28.5 DXX.X DXX.X DXX.X K28.5 SYNC Figure 3. Word Realignment Timing Characteristics Waveforms Systems that do not require framed data may disable byte alignment by tying SYNCEN low. When a SYNC character is detected, the SYNC signal is brought high and is aligned with the K28.5 character. The duration of the SYNC pulse is equal to the duration of the data when in TBI mode. DATA RECEPTION LATENCY The serial to parallel data latency is the time from when the first bit arrives at the receiver until it is output in the aligned parallel word with RD0 received as first bit. The minimum latency in TBI mode is 21 bit times and the maximum latency is 31 bit times. 10 Bit Code RXP, RXN td(Rx latency) RD(0−9) 10 Bit Code RBC0 RBC1 Figure 4. Receiver Latency – TBI Half-Rate Mode Shown LOSS OF SIGNAL DETECTION These devices have a loss of signal (LOS) detection circuit for conditions where the incoming signal no longer has sufficient voltage level to keep the clock recovery circuit in lock. The LOS is intended to be an indication of gross signal error conditions, such as a detached cable or no signal being transmitted, and not an indication of signal coding health. Under a PRBS serial input pattern, LOS is high for signal amplitudes greater than 150 mV. The LOS is low for all amplitudes below 50 mV. Between 50 mV and 150 mV, LOS is undetermined. Copyright © 2008–2011, Texas Instruments Incorporated 7 TLK2211 SLLS873D – MAY 2008 – REVISED AUGUST 2011 www.ti.com TESTABILITY The loopback function provides for at-speed testing of the transmit/receive portions of the circuitry. The enable function allows for all circuitry to be disabled so that an Iddq test can be performed. The PRBS function also allows for a BIST( built-in self test). The terminal setting, TESTEN high, enables the test mode. The terminal TESTEN has an internal pulldown resistor, so it defaults to normal operation. The TESTEN is only used for factory testing, and is not intended for the end-user. LOOPBACK TESTING The transceiver can provide a self-test function by enabling (LOOPEN to high level) the internal loopback path. Enabling this function causes serial transmitted data to be routed internally to the receiver. The parallel data output can be compared to the parallel input data for functional verification. (The external differential output is held in a high-impedance state during the loopback testing.) ENABLE FUNCTION When held low, ENABLE disables all quiescent power in both the analog and digital circuitry. This allows an ultralow-power idle state when the link is not active. PRBS FUNCTION These devices have a built-in 27-1 PRBS function. When the PRBSEN control bit is set high, the PRBS test is enabled. A PRBS is generated and fed into the 10-bit parallel transmitter input bus. Data from the normal parallel input source is ignored during PRBS test mode. The PRBS pattern is then fed through the transmit circuitry as if it were normal data and sent out to the transmitter. The output can be sent to a bit error rate tester (BERT) or to the receiver of another TLK2211. Since the PRBS is not really random and is really a predetermined sequence of ones and zeros, the data can be captured and checked for errors by a BERT. These devices also have a built-in BERT function on the receiver side that is enabled by PRBSEN. It can receive a PRBS pattern and check for errors, and then reports the errors by forcing the SYNC/PASS terminal low. The PRBS testing supports two modes (normal and latched), which are controlled by the SYNCEN input. When SYNCEN is low, the result of the PRBS bit error rate test is passed to the SYNC/PASS terminal. When SYNCEN is high the result of the PRBS verification is latched on the SYNC/PASS output (i.e., a single failure forces SYNC/PASS to remain low). JTAG The TLK2211 supports an IEEE1149.1 JTAG function while maintaining compatibility with the industry standard 64 pin QFP package footprint. In this way, the TLK2211 installed on a board layout that was designed for the industry standard footprint such as for the TNETE2211. The JTAG pins on the TLK2211 are chosen to either be on the ‘vender-unique’ pins of the industry standard footprint, or are on pins that were previously power or ground. The TRSTN pin has been placed on pin 56, which is a ground on the industry standard footprint. In this way, a TLK2211 installed onto the older footprint has the JTAG tap controller held in reset, and thus disabled. If the JTAG function is desired, then the 5 JTAG pins TRSTN, TMS, TCK, TDI, and TDO can be used in the usual manner for a JTAG function. If the JTAG function is not desired, then connecting TRSTN to ground is recommended. TMS and TDI have internal pullup resistors, and can thus be left unconnected if not used. TDO is an output and should be left unconnected if JTAG is not used. TCK does not have an internal pullup, and can be tied to GND or PWR if not used, but with TRSTN low, this input is not used, and thus can be left unconnected. 8 Copyright © 2008–2011, Texas Instruments Incorporated TLK2211 SLLS873D – MAY 2008 – REVISED AUGUST 2011 www.ti.com ABSOLUTE MAXIMUM RATINGS (1) over operating free-air temperature range (unless otherwise noted) (2) VDD Supply voltage VI Input voltage range at TTL terminals Characterized free-air operating temperature range (1) (2) –0.3 to 3.6 V –0.5 to 4 V V –65 to 150 °C CDM 1 kV HDM 2 kV –40 to 85 °C Storage temperature Electrostatic discharge UNIT –0.3 to VDD +0.3 Input voltage range at any other terminal Tstg VALUE TLK2211 Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. All voltage values, except differential I/O bus voltages, are with respect to network ground terminal. THERMAL CHARACTERISTICS PARAMETER RθJA RθJC Junction-to-free-air thermal resistance Junction-to-case-thermal resistance TEST CONDITIONS TYP Board-mounted, no air flow, high conductivity TI recommended test board, chip soldered or greased to thermal land; Assumes High K Board 21.47 Board-mounted, no air flow, high conductivity TI recommended test board with thermal land but no solder or grease thermal connection to thermal land 42.20 Board-mounted, no air flow, JEDEC test board 75.83 MAX UNIT °C/W Board-mounted, no air flow, high conductivity TI recommended test board, chip soldered or greased to thermal land 0.38 Board-mounted, no air flow, high conductivity TI recommended test board with thermal land but no solder or grease thermal connection to thermal land 0.38 Board-mounted, no air flow, JEDEC test board Copyright © 2008–2011, Texas Instruments Incorporated MIN °C/W 7.8 9 TLK2211 SLLS873D – MAY 2008 – REVISED AUGUST 2011 www.ti.com RECOMMENDED OPERATING CONDITIONS over operating free-air temperature range (unless otherwise noted) MIN VDD, VDD(A) Supply voltage 3 IDD, IDD(A) Total supply current PD Total power dissipation IDD, IDD(A) PLL TA Operating free-air temperature (1) Frequency = 1.25 Gbps, PRBS pattern Frequency = 1.25 Gbps, Worst case pattern (1) Frequency = 1.25 Gbps, PRBS pattern NOM MAX 3.3 3.6 140 230 460 (1) Frequency = 1.25 Gbps, Worst case pattern Total shutdown current Enable = 0, VDD(A) , VDD = 3.6V Startup lock time VDD, VDD(A) = 3.3 V, EN↑ to PLL acquire 850 –40 UNIT V mA mW 75 μA 500 μs 85 °C Worst case pattern is a pattern that creates a maximum transition density on the serial transceiver. TLK2211 REFERENCE CLOCK (REFCLK) TIMING REQUIREMENTS over recommended operating conditions (unless otherwise noted) MAX UNIT Frequency PARAMETER Minimum data rate TEST CONDITIONS TYP–0.01% MIN 60 TYP–0.01% MHz Frequency Maximum data rate TYP–0.01% 130 TYP–0.01% MHz 100 ppm Accuracy –100 Duty cycle 40% Jitter TYP 50% 60% Random plus deterministic 40 ps TTL ELECTRICAL CHARACTERISTICS over recommended operating conditions (unless otherwise noted) PARAMETER TEST CONDITIONS VOH High-level output voltage IOH = –400 μA VOL Low-level output voltage IOL = 1 mA VIH High-level input voltage VIL Low-level input voltage IIH Input high current VDD = 3 V, VIN = 2 V IIL Input low current VDD = 3 V, VIN = 0.4 V CIN Input capacitance 10 MIN TYP VDD –0.2 3.2 GND 0.25 2 MAX UNIT V 0.5 V 3.6 V 0.8 V 40 μA –40 μA 4 pF Copyright © 2008–2011, Texas Instruments Incorporated TLK2211 SLLS873D – MAY 2008 – REVISED AUGUST 2011 www.ti.com TRANSMITTER/RECEIVER CHARACTERISTICS PARAMETER TEST CONDITIONS Vod = |TxP–TxN| V(cm) Transmit common mode voltage range MIN TYP MAX Rt = 50 Ω 1000 1600 2000 Rt = 75 Ω 1300 1900 2800 Rt = 50 Ω 1400 1600 1850 Rt = 75 Ω 1400 1600 1800 Receiver Input voltage requirement, Vid = |RxP - RxN| 200 Receiver common mode voltage range, (RxP + RxN)/2 CI 1400 1590 t(TJ) Serial data total jitter (peak-to-peak) t(DJ) Serial data deterministic jitter (peak-to-peak) Differential output jitter, PRBS pattern, Rω = 125 MHz tr, tf Differential signal rise, fall time (20% to 80%) RL = 50 Ω, CL = 4 pF, See Figure 5 and Figure 6 Serial data jitter tolerance minimum required eye opening, (per IEEE-802.3 specification) Differential input jitter, Random + deterministic, Rω = 125 MHz 80 1785 mV 2 pF 0.24 UI 0.10 UI 305 ps UI Receiver data acquisition lock time from powerup 500 3750 Data relock time from LOOPEN rising edge IDLE Pattern (K28.5, D16.2) mV mV 0.25 Data relock time from loss of synchronization mV 1600 Receiver input capacitance Differential output jitter, Random + deterministic, PRBS pattern, Rω = 125 MHz UNIT μs Bit times 100 ms td(Tx latency) Tx latency TBI modes See Figure 1 19 24 UI td(Rx latency) Rx latency TBI modes See Figure 4 25 35 UI 80% 50% 20% TX+ CL 5 pF ∼V 50 Ω tf tr 80% 50% 20% TX− tf 50 Ω ∼V CL 5 pF ∼V tr ∼ 1V 80% VOD ∼V 20% 0V ∼ −1V Figure 5. Differential and Common-Mode Output Voltage Definitions Figure 6. Transmitter Test Setup 1.4 V CLOCK tr tf 80% 50% 20% DATA tr 2V 0.8 V tf Figure 7. TTL Data I/O Valid Levels for AC Measurement Copyright © 2008–2011, Texas Instruments Incorporated 11 TLK2211 SLLS873D – MAY 2008 – REVISED AUGUST 2011 www.ti.com LVTTL OUTPUT SWITCHING CHARACTERISTICS over recommended operating conditions (unless otherwise noted) PARAMETER TEST CONDITIONS MIN 80% to 20% output voltage, C = 5 pF (see Figure 7) TYP MAX UNIT tr(RBC) Clock rise time 0.3 1.9 tf(RBC) Clock fall time 0.3 1.9 tr Data rise timer 0.3 2.25 tf Data fall time 0.3 2.25 tsu(D3) Data setup time (RD0..RD9) TBI half-rate mode, Rω = 125 MHz (see Figure 2) 2.5 ns th(D3) Data hold time (RD0..RD9) TBI half-rate mode, Rω = 125 MHz (see Figure 2) 1.5 ns ns ns TRANSMITTER TIMING REQUIREMENTS over recommended operating conditions (unless otherwise noted) PARAMETER tsu(D4) Data setup time (TD0..TD9) th(D4) Data hold time (TD0..TD9) tr, tf TD[0,9] Data rise and fall time 12 TEST CONDITIONS TBI modes See Figure 7 MIN TYP MAX 1.6 UNIT ns 1 2 ns Copyright © 2008–2011, Texas Instruments Incorporated TLK2211 SLLS873D – MAY 2008 – REVISED AUGUST 2011 www.ti.com APPLICATION INFORMATION 8B/10B TRANSMISSION CODE The PCS maps GMII signals into ten-bit code groups and vice versa, using an 8b/10b block coding scheme. The PCS uses the transmission code to improve the transmission characteristics of information to be transferred across the link. The encoding defined by the transmission code ensures that sufficient transitions are present in the PHY bit stream to make clock recovery possible in the receiver. Such encoding also greatly increases the likelihood of detecting any single or multiple bit errors that may occur during transmission and reception of information. The 8b/10b transmission code specified for use has a high transition density, is run length limited, and is dc-balanced. The transition density of the 8b/10b symbols ranges from 3 to 8 transitions per symbol. The definition of the 8b/10b transmission code is specified in IEEE 802.3 Gigabit Ethernet and ANSI X3.230-1994 (FC−PH), clause 11. 8b/10b transmission code uses letter notation describing the bits of an unencoded information octet. The bit notation of A,B,C,D,E,F,G,H for an unencoded information octet is used in the description of the 8b/10b transmission code-groups, where A is the LSB. Each valid code group has been given a name using the following convention: /Dx.y/ for the 256 valid data code-groups and /Kx.y/ for the special control code-groups, where y is the decimal value of bits EDCBA and x is the decimal value of bits HGF (noted as K). Thus, an octet value of FE representing a code-group value of K30.7 would be represented in bit notation as 111 11110. VDD TXP 5 kΩ RXP ZO 7.5 kΩ ZO GND + _ VDD ZO 5 kΩ ZO TXN RXN 7.5 kΩ GND Transmitter Media Receiver Figure 8. High-Speed I/O Directly-Coupled Mode VDD TXP ZO 5 kΩ RXP 7.5 kΩ ZO GND + _ VDD ZO 5 kΩ TXN ZO RXN 7.5 kΩ GND Transmitter Media Receiver Figure 9. High-Speed I/O AC-Coupled Mode Copyright © 2008–2011, Texas Instruments Incorporated 13 TLK2211 SLLS873D – MAY 2008 – REVISED AUGUST 2011 www.ti.com 5 Ω at 100 MHz 3.3 V 3.3 V 18 VDD VDDA 0.01 mF VDDPLL GND GNDPLL 64 GNDA TLK2211 17 TESTEN 10 TD0−TD9 22 16 TXP 62 Controlled Impedance Transmission Line 61 Controlled Impedance Transmission Line 54 Controlled Impedance Transmission Line REFCLK PRBSEN 19 LOOPEN 24 Host Protocol Device 47 10 SYNCEN TXN SYNC/PASS RD0−RD9 2 RBC0−RBC1 28 26 ENABLE RXP LOS 32 Rt 50 Ω Rt 50 Ω RBCMODE 49 55 48 JTAG Controller 56 27 TCK JTMS RXN 52 Controlled Impedance Transmission Line JTDI JTRSTN JTDO Figure 10. Typical Application Circuit (AC Mode) DESIGNING WITH PowerPAD The TLK2211 is housed in a high performance, thermally enhanced, 64-pin VQFP (RCP64) PowerPAD package. Use of the PowerPAD package does not require any special considerations except to note that the PowerPAD, which is an exposed die pad on the bottom of the device, is a metallic thermal and electrical conductor. Therefore, if not implementing PowerPAD PCB features, the use of solder masks (or other assembly techniques) may be required to prevent any inadvertent shorting by the exposed PowerPAD of connection etches or vias under the package. It is strongly recommended that the PowerPAD be soldered to the thermal land. The recommended convention, however, is to not run any etches or signal vias under the device, but to have only a grounded thermal land as explained below. Although the actual size of the exposed die pad may vary, the minimum size required for the keep out area for the 64-pin PFP PowerPAD package is 8 mm × 8 mm. It is recommended that there be a thermal land, which is an area of solder-tinned-copper, underneath the PowerPAD package. The thermal land varies in size depending on the PowerPAD package being used, the PCB construction, and the amount of heat that needs to be removed. In addition, the thermal land may or may not contain numerous thermal vias depending on PCB construction. 14 Copyright © 2008–2011, Texas Instruments Incorporated TLK2211 SLLS873D – MAY 2008 – REVISED AUGUST 2011 www.ti.com Other requirements for thermal lands and thermal vias are detailed in the TI application note PowerPAD Thermally Enhanced Package Application Report (SLMA002), available via the TI Web pages beginning at URL: http://www.ti.com. Figure 11. Example of a Thermal Land For the TLK2211, this thermal land must be grounded to the low-impedance ground plane of the device. This improves not only thermal performance but also the electrical grounding of the device. It is also recommended that the device ground pin landing pads be connected directly to the grounded thermal land. The land size must be as large as possible without shorting device signal pins. The thermal land may be soldered to the exposed PowerPAD using standard reflow soldering techniques. While the thermal land may be electrically floated and configured to remove heat to an external heat sink, it is recommended that the thermal land be connected to the low-impedance ground plane for the device. More information may be obtained from the TI application note PHY Layout (SLLA020). Copyright © 2008–2011, Texas Instruments Incorporated 15 TLK2211 SLLS873D – MAY 2008 – REVISED AUGUST 2011 www.ti.com REVISION HISTORY Note: Page numbers of current version may differ from previous versions Changes from Revision C (October 2008) to Revision D Page • Changed VOH spec Typical value from 2.4V to 3.2V (corrected typo error) ....................................................................... 10 • Added spec "Data relock time from LOOPEN rising edge" ................................................................................................ 11 16 Copyright © 2008–2011, Texas Instruments Incorporated PACKAGE OPTION ADDENDUM www.ti.com 12-Aug-2016 PACKAGING INFORMATION Orderable Device Status (1) Package Type Package Pins Package Drawing Qty Eco Plan Lead/Ball Finish MSL Peak Temp (2) (6) (3) Op Temp (°C) Device Marking (4/5) TLK2211RCP LIFEBUY HVQFP RCP 64 160 Green (RoHS & no Sb/Br) CU NIPDAU Level-3-260C-168 HR -40 to 85 TLK2211 TLK2211RCPR LIFEBUY HVQFP RCP 64 1000 Green (RoHS & no Sb/Br) CU NIPDAU Level-3-260C-168 HR -40 to 85 TLK2211 TLK2211RCPRG4 LIFEBUY HVQFP RCP 64 1000 Green (RoHS & no Sb/Br) CU NIPDAU Level-3-260C-168 HR -40 to 85 TLK2211 (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability information and additional product content details. TBD: The Pb-Free/Green conversion plan has not been defined. Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes. Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above. Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material) (3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature. (4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device. (5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation of the previous line and the two combined represent the entire Device Marking for that device. (6) Lead/Ball Finish - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead/Ball Finish values may wrap to two lines if the finish value exceeds the maximum column width. Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and Addendum-Page 1 Samples PACKAGE OPTION ADDENDUM www.ti.com 12-Aug-2016 continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals. TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release. In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis. Addendum-Page 2 PACKAGE MATERIALS INFORMATION www.ti.com 14-Jul-2012 TAPE AND REEL INFORMATION *All dimensions are nominal Device TLK2211RCPR Package Package Pins Type Drawing HVQFP RCP 64 SPQ Reel Reel A0 Diameter Width (mm) (mm) W1 (mm) 1000 330.0 24.4 Pack Materials-Page 1 13.0 B0 (mm) K0 (mm) P1 (mm) W Pin1 (mm) Quadrant 13.0 1.5 16.0 24.0 Q2 PACKAGE MATERIALS INFORMATION www.ti.com 14-Jul-2012 *All dimensions are nominal Device Package Type Package Drawing Pins SPQ Length (mm) Width (mm) Height (mm) TLK2211RCPR HVQFP RCP 64 1000 367.0 367.0 45.0 Pack Materials-Page 2 IMPORTANT NOTICE Texas Instruments Incorporated and its subsidiaries (TI) reserve the right to make corrections, enhancements, improvements and other changes to its semiconductor products and services per JESD46, latest issue, and to discontinue any product or service per JESD48, latest issue. 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